Relevant bibliographies by topics / Energy dispersive spectrometry

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Academic literature on the topic 'Energy dispersive spectrometry'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Energy dispersive spectrometry"

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Lund, Mark W. "More Than One Ever Wanted To Know About X-ray Detectors Part V: Wavelength - The "Other" Spectroscopy." Microscopy Today 3, no. 4 (May 1995): 8–9. http://dx.doi.org/10.1017/s1551929500063537.

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The use of x-ray spectrometry in electron microscopy has been a powerful market driver not only for electron microscopes but also for x-ray spectrometers. More x-ray spectrometers are sold with electron microscopes than in any other configuration. A general name for the combination is AEM, or analytical electron microscope, though in modern times AEM can include other instrumentation such as electron energy loss spectroscopy and visible light spectroscopy. In previous articies I have discussed energy dispersive spectrometers (EDS). These use semiconductor crystals to detect the x-rays and measure the energy deposited in the crystal. A second type of x-ray spectrometer measures the wavelength of the x-rays, and so is called "wavelength dispersive spectrometry" (WDS).
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Michael, J. R. "Energy Dispersive Spectrometry in the AEM." Microscopy and Microanalysis 4, S2 (July 1998): 186–87. http://dx.doi.org/10.1017/s143192760002105x.

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Energy-dispersive x-ray spectrometry (EDS) with a SiLi detector has become a standard technique in the analytical electron microscope (AEM). There have been many difficulties to overcome involving both the interfacing of the spectrometer to the microscope and in developing robust techniques for quantitative analysis of thin specimens. The AEM is a difficult environment for EDS due to the high accelerating voltages (100-400 kV) typically used and due to constraints on detector placement relative to the specimen as a result of the confined space within the specimen region of the AEM. The first published account of the installation of SiLi EDS on a transmission electron microscope (TEM) occurred in 1969. In this paper and subsequent publications, these authors described many of the difficulties that still haunt EDS in the AEM.The initial attempts at interfacing EDS to a TEM column demonstrated that the. specimen stage of a TEM was not ideal for this purpose.
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Ritchie, N., J. Davis, and D. Newbury. "Energy Dispersive Spectrometry at Wavelength Precision." Microscopy and Microanalysis 17, S2 (July 2011): 556–57. http://dx.doi.org/10.1017/s1431927611003655.

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Steel, E. B., R. B. Marinenko, and R. L. Myklebust. "Quality Assurance of Energy Dispersive Spectrometry Systems." Microscopy and Microanalysis 3, S2 (August 1997): 903–4. http://dx.doi.org/10.1017/s1431927600011405.

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Monitoring the performance capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for determining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. In addition, there is a growing popularity of quality systems through laboratory accreditation and ISO 9000 related programs that require set quality control procedures for analytical instrumentation. Having similar standard procedures amongst labs would allow direct intercomparison of results. This intercomparison would help labs and manufacturers determine what are normal versus abnormal results and lead to higher quality instruments and analyses. We have been developing a standard operating procedure for the characterization of EDS x-ray analysis systems on electron beam instruments.We are designing the procedure to maximize the efficiency of each quality control (QC) measurement so that we spend as little time monitoring the analysis system as is possible. We first chose useful QC specimens and then designed data collection methods.
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Steel, E. B., and R. B. Marinenko. "Quality Assurance of Energy Dispersive Spectrometry Systems." Microscopy and Microanalysis 4, S2 (July 1998): 214–15. http://dx.doi.org/10.1017/s143192760002119x.

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Monitoring the performance and capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for maintaining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. There is growing demand for quality systems through laboratory accreditation, ISO 9000, ISO Guide 25 and related programs that require set quality control procedures for analytical instrumentation. In such cases it is frequently more useful to have one national/international standard. This approach is not only more efficient than having each analyst devise their own system, but the use of the same standard procedures among labs would allow direct intercomparison of results. This intercomparison can help labs and manufacturers determine what are normal versus abnormal results and lead to higher quality instruments and analyses.We are designing a standard procedure to maximize the efficiency of each quality control (QC) measurement so that we spend as little time monitoring the analysis system as is possible.
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Yao, Min, Dongyue Wang, and Min Zhao. "Element Analysis Based on Energy-Dispersive X-Ray Fluorescence." Advances in Materials Science and Engineering 2015 (2015): 1–7. http://dx.doi.org/10.1155/2015/290593.

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Energy-dispersive X-ray fluorescence (EDXRF) spectrometry is a nondestructive, rapid, multielement, highly accurate, and environment friendly analysis compared with other elemental detection methods. Thus, EDXRF spectrometry is applicable for production quality control, ecological environment monitoring, geological surveying, food inspection, and heritage analysis, among others. A hardware platform for the EDXRF spectrometer is designed in this study based on the theoretical analysis of energy-dispersive X-ray. The platform includes a power supply subsystem, an optical subsystem, a control subsystem, and a personal computer. A fluorescence spectrum analytical method is then developed to obtain the category and content of elements in a sample. This method includes qualitative and quantitative analyses. Finally, a series of experiments is performed. Results show that the precision of the proposed measurement method is below 8%, whereas its repeatability is below 2%.
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Vartuli, C. B., F. A. Stevie, B. M. Purcell, A. Scwhitter, B. Rossie, S. Brown, T. L. Shofner, S. D. Anderson, J. M. McKinley, and R. B. Irwin. "Energy Dispersive Spectrometry Calibration of Fe and Co." Microscopy and Microanalysis 7, S2 (August 2001): 200–201. http://dx.doi.org/10.1017/s1431927600027070.

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Energy Dispersive Spectrometry (EDS) is an ubiquitous method of elemental analysis for SEM, TEM, and STEM applications. The elements of interest are generally quantified without standards using theoretical calculations or by using standards that are high purity specimens of the elements measured. However, EDS is often used to determine a small percentage of an element in a matrix. The accuracy and limit of detection of these low concentration measurements has not been established. An earlier report proved the concept that a cross section high dose BF2 implanted specimen could provide a standard for EDS measurement of F. This study extends this quantification approach to transition elements of importance to the semiconductor industry.The Fe and Co standards were created by high dose ion implantation. For ions implanted into silicon, a dose of lxl016 atoms/cm2 results in a peak concentration of approximately lxl021 atoms/cm3 or 2% atomic. The exact concentration can be determined using methods such as Rutherford Backscattering Spectrometry (RBS) and Secondary Ion Mass Spectrometry (SIMS).
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Ritchie, Nicholas W. M., and Dale E. Newbury. "Uncertainty Propagation for Energy Dispersive X-ray Spectrometry." Microscopy and Microanalysis 24, S1 (August 2018): 708–9. http://dx.doi.org/10.1017/s1431927618004038.

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Wollman, D. A., Dale E. Newbury, G. C. Hilton, K. D. Irwin, D. A. Rudman, L. L. Dulcie, N. F. Bergren, and John M. Martinis. "Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM." Microscopy and Microanalysis 5, S2 (August 1999): 304–5. http://dx.doi.org/10.1017/s1431927600014847.

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Microanalysis performed at low electron beam energies (≤ 5 keV) is limited by the physics of x-ray generation and the performance of existing semiconductor energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS). Low beam energy restricts the atomic shells that can be excited for elements of intermediate and high atomic number, forcing the analyst to consider using unconventional M- and N-shells for elements such as Sn and Au. Unfortunately, these shells have very low fluorescent yield, which results in inherently low spectral peak-to-background ratios. The modest energy resolution of semiconductor EDS leads to poor limits of detection for these weakly emitted photons. The situation is further complicated by the inevitable interferences with the much more strongly excited K-shell x-rays of the light elements, particularly carbon and oxygen. WDS has the spectral resolution to overcome the resolution limitations of semiconductor EDS. However, WDS has a low geometric efficiency, and because of its narrow instantaneous spectral transmission, spectral scanning is required to detect and analyze x-ray peaks. Moreover, the high resolution field-emission-gun scanning electron microscope (FEG-SEM) provides only a few nanoamperes of beam current.
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Lifshin, Eric, Necip Doganaksoy, Jane Sirois, and Raynald Gauvin. "Statistical Considerations in Microanalysis by Energy-Dispersive Spectrometry." Microscopy and Microanalysis 4, no. 6 (December 1998): 598–604. http://dx.doi.org/10.1017/s1431927698980576.

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X-ray counting statistics plays a key role in establishing confidence limits in composition determination by X-ray microanalysis. The process starts with measurements of intensity on one or more samples and standards as well as related background determinations. Since each individual measurement is subject to variability associated with counting statistics, it is necessary to combine all of the counting variability according to established mathematical procedures. The next step is to apply propagation of error calculations to equations for quantitative analysis and determine confidence limits in reported composition. Similar concepts can also be applied to trace element determination. This approach can then be combined with spectral simulation modeling, making it possible to predict detectability limits without additional measurements.
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Dissertations / Theses on the topic "Energy dispersive spectrometry"

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Kasemodel, Carlos A. "Quantitative energy dispersive x-ray spectrometry using an Emispec Vision system." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1999. http://handle.dtic.mil/100.2/ADA374498.

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Thesis (M.S. in Applied Physics) Naval Postgraduate School, December 1999.
"December 1999". Thesis advisor(s): Alan G. Fox, James Luscombe. Includes bibliographical references (p. 69-70). Also available online.
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Menendez-Alonso, Elena. "Trace metal and speciation analysis using ion-exchange and energy dispersive X-ray fluorescence spectrometry." Thesis, University of Plymouth, 2000. http://hdl.handle.net/10026.1/896.

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Studies have been carried out on specific ion-exchange (Dowex 50W-X8 and Dowex 1-X8) and chelation (Chelex-100) resins, in order to determine their physical and chemical characteristics, to understand and explain their limits of function and to optimise their use as substrates in trace metal and speciation measurement by EDXRF. Structural information was obtained by scanning electron microscopy and x-ray microanalysis showing a homogeneous distribution of functional groups and retained ions on both sectioned and whole resins. Particle size experiments performed on Dowex 50W-X8 (38 - 840 µm) showed that this parameter has no effect on the relationship between intensity of fluorescence and concentration or mass of resin. Inter-element effects were not observed in the analysis of multielemental specimens prepared on ion-exchange / chelation media by EDXRF. This indicates that the proposed method has a significant advantage when compared with other methodologies. A theoretical ‘model’, based on the formation of thin films on the surface of the resin beads, has been proposed in order to link and explain the effects observed in these experiments. The use of a batch retention system has shown distinct advantages over using columns in terms of linearity, accuracy, precision, rapidity and simplicity. Parameters such as pH and ionic strength of the solution, concentration of competing ions and volume of the sample have been proven to be critical. The maximum retention capacity has been determined as 3.2, 1.1 and 0.67 mEq/g for Dowex 50W-X8, Dowex 1-X8 and Chelex-100 respectively. The optimum mass of resin for XRF analysis was found to be 0.5 g, for all resins tested. The linear range covered 4 to 5 orders of magnitude. These findings show the potential of the investigated media to overcome instrumental and sample limitations. Based on the physico-chemical information found, methodologies for three different applications of the resins to EDXRF determinations have been developed and their analytical possibilities explored. The multi-elemental determination of metals in sewage sludge digests was achieved by retaining the metals on Dowex 50W-X8 at pH 2 and Chelex-100 at pH 4. Chelex-100 allows quantitative recoveries for Cu and Zn. A wider range of elements was determined on Dowex 50W-X8, although with poorer recoveries (60 - 90%). The limits of detection were 10 - 21 µg when Dowex 50W-X8 was used and 8 - 49 µg for Chelex-100. The method was validated by the analysis of a certified material. The determination of Kβ/Kα intensity ratios for Cr and Mn species and its potential as a tool for direct elemental speciation has also been studied. A difference in Kβ/Kα between the oxidation states of the analytes was only observed during the analysis of solutions of the metal species by EDXRF at the 98% level of confidence. Finally, the speciation and preconcentration of Cr(III) and Cr(VI) in waters has been performed by retention on Dowex 50W-X8 and Dowex 1-X8 followed by EDXRF determination. Efficient recoveries and preconcentration factors of up to 500 were achieved, leading to limits of detection of 30 µg/L for Cr(VI) and 40 µg/L for Cr(III). This method is simple, fast and inexpensive, allowing quantitative recoveries in the speciation of chromium in waste waters.
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PEÑAFIEL, MARLIN JEANNETTE PEDROZO. "DETERMINATION OF SILICON AND ALUMINUM IN CRUDE OIL USING ENERGY DISPERSIVE X-RAY FLUORESCENCE SPECTROMETRY." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2016. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=33880@1.

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PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO
A determinação de diferentes níveis de silício e alumínio em petróleo é importante porque pequenas quantidades destes elementos podem produzir efeitos adversos nas refinarias devido à corrosão de equipamento ou afetar a qualidade dos produtos refinados. A espectrometria de fluorescência de raios-X por dispersão de energia (EDXRF) foi utilizada para desenvolver um método para a determinação de Si e Al em petróleo, onde estes elementos se encontram principalmente sob a forma de partículas sólidas de aluminossilicatos dispersas na amostra. Uma vez que os analitos não puderam ser determinados sem interferência diretamente no óleo, a fusão das amostras de petróleo foi realizada utilizando tetraborato de lítio. Em seguida, as amostras fundidas foram colocadas no centro de papéis de filtro de 10 mm de diâmetro, que foi colocado entre duas folhas de filme de polipropileno, para então ser fixado à cubeta para as medições no instrumento. A quantificação foi feita por meio de curvas analíticas no intervalo de concentração de 0 a 40 mg kg(-1) (para ambos os elementos) no material fundido final. O método desenvolvido, não sofreu interferência matriz uma vez que as amostras foram completamente decompostas e, posteriormente secas no substrato. Os resultados para os elementos foram estatisticamente comparáveis com os obtidos por espectrometria de absorção atômica com chama (FAAS). Além disso, os resultados concordaram com os obtidos nas amostras de programas de proficiência da ASTM. Amostras reais de petróleo, fornecidas pela Petrobras, também foram analisadas. As recuperações alcançadas se encontram entre 71 e 100 por cento para as diferentes amostras, o qual pode ser considerado satisfatório devido à dificuldade em se determinar esses elementos. Os limites de quantificação (10 vezes o desvio-padrão, n=10) encontrados para o Si e Al no petróleo foram de 0,7 e 1,1 mg kg(-1), respectivamente, mostrando o potencial do método proposto para a determinação de amostras com valores mais elevados destes elementos.
It is important to determine silicon and aluminum at different levels in crude oils because of trace amounts of these elements may produce adverse effects in oil refining either by causing corrosion or by contaminating and affecting the quality of the refined products. Energy dispersive X-ray fluorescence spectrometry (EDXRF) was used to enable a reliable method for determination of Si and Al in crude oil, where these elements are found mainly in the form of solid aluminosilicate particles dispersed in the sample. Since the analytes could not be determined directly in the oil without interference, the fusing the crude oil samples was made using lithium tetraborate. Then, the fused samples were placed in the center of 10 mm diameter filter paper that were sandwiched between two polypropylene film foils and attached to the instrument cell for measurements. Quantification was made by using analytical curves in the concentration range from 0 to 40 mg kg (-1) (for both elements) in the final fused material. The method developed did not suffer from matrix effect once the sample matrix was completely decomposed and the sample solution dried in the substrate before measurements. The results for the elements were statistically comparable to the ones obtained by flame atomic absorption spectrometry (FAAS). In addition, for proficiency test samples, the results were in accordance to the ones reported by ASTM proficiency programs. Real samples of oil provided by Petrobras Company also were analyzed. Recoveries were achieved between 71 and 100 percent for different samples, which can be considerable satisfactory because of the difficulty in determine those elements. The limits of quantification (10 times the standard deviation. N = 10) found for silicon and aluminum in the oil were of 0.7 and 1.1 mg kg (-1), respectively, showing the potential of the proposed method to screen for samples with higher amounts of these elements.
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Van, Loggerenberg Daniël Elhardus. "Important trace element concentrations in ovine liver as determined by energy dispersive handheld X-ray fluorescence spectrometry." Diss., University of Pretoria, 2016. http://hdl.handle.net/2263/65518.

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Trace elements are involved in a variety of biochemical processes essential to life and are required in minute amounts. There are no data available on the use of handheld X-ray fluorescence (XRF) spectrometry to determine concentrations of important trace elements in ovine livers. The aim of this study was to ascertain if the handheld X-ray fluorescence spectrometer will provide reliable concentrations of certain essential trace elements in the livers of sheep. Sheep livers (n=30) were obtained from abattoirs. Wet liver samples taken from 30 liver specimens were blended until homogeneity was achieved. An aliquot of the homogenised liver samples were oven dried at 50°C until a constant mass and were then pulverised using a mortar and pestle to obtain a fine powder. In addition, homogenised liver samples (n = 30) were also submitted for dry ashing. All the prepared liver samples (i.e. wet blended, oven dried and dry ashed) were then analysed using a handheld X-ray fluorescence spectrometer to determine concentrations of copper (Cu), iron (Fe), manganese (Mn), molybdenum (Mo), selenium (Se) and zinc (Zn). A reference laboratory analysed the same liver samples using ICP-MS to determine the concentrations of the above mentioned trace elements (control). The means (mg/kg) of the ICP-MS results on a dry matter basis were: Cu (505), Fe (351), Mn (12.3), Mo (3.8), Se (1.8) and Zn (168). The means (mg/kg) of the XRF oven-dried results were: Cu (502), Fe (289), Mn (11.7), Mo (1.6) and Zn (141.9). Selenium could not be detected in oven-dried samples when using the XRF. The intra-sample coefficients of variation were similar between ICP-MS and XRF for oven dried samples for Cu, Fe and Zn and are within the same order of magnitude for all elements in dry ashed samples when comparing ICP-MS to XRF. However, the intra-sample coefficients of variation for Mn and Mo were approximately an order of magnitude larger using XRF. Although the precision for Se appears to be good when using XRF on dry ashed samples, Se was only detected in a few samples, so this value is not representative of the overall precision of XRF using the dry ashed preparation procedure for Se determination. Selenium was not detectable using XRF on wet blended and oven dried samples. The intra-sample coefficient of variation for Se was relatively high using ICP-MS, suggesting that even the current ‘gold standard’ in detecting trace-elements may be imprecise in measuring Se. Overall, this suggests that the precision of sampling using XRF is relatively good for only Cu, Fe and Zn and relatively poor for Mn and Mo. Furthermore, XRF cannot be reliably used for measuring Se. Bayesian correlation were used to determine the best correlation between XRF and ICP-MS data. Bayesian correlation results are summarised by the median sample Pearson product-moment correlation coefficient (r), the 95% lower (LHPDI) and upper (UHPDI) highest posterior density intervals, the square of the sample correlation coefficient (r2), and the probability that the correlation coefficient is positive. Overall, the oven-dried preparation procedure for XRF appeared to provide the best correlation with the ICP-MS data. For Cu and Zn these correlations were strong and the XRF method may represent a suitable substitute for ICP-MS. For Mn and Fe the correlations were moderately strong and the XRF method may be suitable depending upon the intended application. For Mo the correlation was moderate and XRF cannot be recommended. For Se no XRF method was suitable. The advantage of handheld X-ray spectrometry is that the turnaround time of samples is reduced a great deal. Instead of submitting samples to a laboratory and waiting for results, samples can be analysed more rapidly with the use of a handheld X-ray fluorescence spectrometer.
Dissertation (MSc)--University of Pretoria, 2016.
Paraclinical Sciences
MSc
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CRUZ, ALEX RUBEN HUAMAN DE LA. "DETERMINATION OF IRON IN IRON ORE BY ENERGY DISPERSIVE X‐RAY FLUORESCENCE SPECTROMETRY: A COMPARATIVE STUDY OF METROLOGICAL PERFORMANCE AND ECONOMIC IMPACT." PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO, 2013. http://www.maxwell.vrac.puc-rio.br/Busca_etds.php?strSecao=resultado&nrSeq=22183@1.

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PONTIFÍCIA UNIVERSIDADE CATÓLICA DO RIO DE JANEIRO
COORDENAÇÃO DE APERFEIÇOAMENTO DO PESSOAL DE ENSINO SUPERIOR
PROGRAMA DE SUPORTE À PÓS-GRADUAÇÃO DE INSTS. DE ENSINO
O ferro é extraído sob a forma de minério de ferro, sendo 99 por cento utilizado na indústria siderúrgica. Os documentos normativos existentes indicam a volumetria como à técnica analítica para quantificar o teor de ferro em minério de ferro, com exceção da ISO 9516-1: 2003, que, recomenda a espectrometria de fluorescência de raios-X por comprimento de onda (WDXRF). Na literatura são descritos estudos utilizando a espectrometria de fluorescência de raios-X por dispersão de energia (EDXRF) para quantificar ferro em minério de ferro, mas em nenhuma destas publicações é caracterizada a confiabilidade metrológica e a incerteza de medição, sendo outros aspectos importantes na seleção de um método analítico o impacto económico e tempo de análise. No presente trabalho realizou-se um estudo comparativo de impacto económico, tempo de análise e desempenho metrológico na quantificação de ferro em minério de ferro por meio da técnica de EDXRF, comparando-o com a espectrofotometria de absorção molecular e volumetria (titulação com dicromato de potássio), abrangendo a incerteza de medição e a avaliação de parâmetros de validação para EDXRF. A análise volumétrica foi realizado baseado nas normas ANBT NBR 8577:2011 e ASTM E246:2010. Na espectrofotometria de absorção molecular, adaptou-se o método da ortofenantrolina descrito na norma ABNT NBR 13934:1997. Nas outras técnicas precisam-se da abertura da amostra, na EDXRF, as amostras foram preparadas na forma de pastilha (pó de minério prensado). Os métodos avaliados apresentaram desempenhos metrológicos equivalentes, os melhores indicadores de custo e tempo em longo prazo foram observados para o método por EDXRF na quantificação do teor de ferro em minério.
After its extraction in the form of iron ore, 99 per cent of the iron is employed in the steel industry. The normative documents existents recommend to volumetry as the technical analytic for quantification of iron in iron ore, with the exception of ISO 9516-1: 2003, which recommends the fluorescence spectrometry X-ray wavelength (WDXRF). In literature, there are studies using energy dispersive Xray fluorescence spectrometry (EDXRF) to quantify iron in iron ore, but none of these is characterized by complete validation and measurement uncertainty. Other aspects to be considered when selecting an analytical method are the financial cost and the time for analysis. In this work it is carried out a comparative study of financial cost, time analysis and metrological performance on quantification of iron ore through the EDXRF technique, in comparison with the results obtained by molecular absorption spectrophotometry and volumetry (titration with potassium dichromate), including measurement uncertainty evaluation and some parameter of validation for EDXRF. The molecular absorption spectrophotometry measurements were performed by colorimetric orthophenanthroline method. Unlike the other approaches that require sample preparation with acid, for EDXRF measurements, samples were prepared in tablet form (pressed iron ore powder). The evaluated methods presented equivalent metrological performances on determining iron in ore, but the best long-term outcome for cost was observed in the results obtained by EDXRF method.
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Mhiri, Akram. "Elaborations, caractérisations et études spectroscopiques des composés hybrides organiques-inorganiques R2SnBr6 avec R=N(CH3)4 et R=N(CH3-CH2)4." Thesis, Le Mans, 2020. http://www.theses.fr/2020LEMA1032.

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Ce travail s'est inscrit dans le cadre d’un projet de recherche qui vise à synthétiser et caractériser de nouveaux matériaux hybrides organiques-inorganiques pouvant être utilisés dans la fabrication de cellules photovoltaïques, mais avec des éléments moins polluants que les composés actuellement proposés. Pour cela nous avons élaboré et étudié deux nouveaux composés à base d'étain : le bis tétraméthylammonium hexabromostannate ([N(CH₃)₄]₂SnBr₆), et le bis-tétraéthylammonium hexabromostannate ([CH₃-CH₂]₄SnBr₆). Les études expérimentales sont basées sur des analyses thermiques (ATD, DSC, ATG), la spectrométrie par dispersion en énergie (EDX), la diffraction de rayons X sur poudre et sur monocristal, les spectrométries vibrationnelles (infrarouge et Raman), la spectrométrie d’impédance complexe et la spectrométrie UV-Visible.Il est apparu que [N(CH₃)₄]₂SnBr₆ est de symétrie cubique du type K₂PtCl₆. Il est constitué d'octaèdres SnBr₆²- non connectés entre eux, séparés par des tétraméthylammoniums, pouvant être considéré comme dérivé d'une structure pérovskite dans laquelle la moitié des sites de symétrie octaédriques sont occupés par des SnBr₆²- et la moitié par des lacunes (structure pérovskite 0D). Cet arrangement laisse ainsi de très larges volumes libres de tout atome, et nous avons même montré qu'il présente des canaux ouverts infinis de large section (0,5 nm de diamètre), pouvant ainsi être considéré comme poreux. Les analyses vibrationnelles couplées à des calculs ab-initio sur l'octaèdre SnBr₆²- et l'ion tétraméthylammonium (TMA+) ont permis d'expliquer sans ambiguïté les spectres et de conclure à l'existence de désordre local. Les signaux infrarouges, Raman et EDX suggèrent aussi la présence d’OH- ou d’'eau, probablement en relation avec la structure lacunaire. Il a été montré que le composé subit une transition de phase réversible à plus haute température (vers 100°C). Les études vibrationnelles confirment la transition de phase, de même que les études des propriétés diélectriques. Le gap (2,31 eV) est proche de la largeur de la bande interdite 2,7 eV du semi-conducteur Cs₂SnBr₆ utilisé dans les cellules solaires.Le bis-tétraéthylammonium hexabromostannate [CH₃-CH₂]₄SnBr₆ à température ambiante présente une structure (rhomboédrique) composée également d'octaèdres SnBr₆²- non connectés, mais d'arrangement structural compact, contrairement au composé au TMA. Son étude en température révèle deux transitions réversibles mais avec fortes hystérésis à 262K/239K et à 362K/307K (chauffage/refroidissement). Son énergie de gap est égale à 2,51 eV
This work is part of a research project that aims to synthesize and characterize new organic-inorganic hybrid materials that can be used in the manufacture of photovoltaic cells, but with less polluting elements than the compounds currently proposed. For this we have developed and studied two new compounds based on tin : bis tetramethylammonium hexabromostannate ([N(CH₃)₄]₂SnBr₆), and bis-tetraethylammonium hexabromostannate ([CH₃-CH₂]₄SnBr₆). The experimental studies are based on thermal measurements (ATD, DSC, ATG), energy dispersion spectrometry (EDX), powder and single crystal X-ray diffraction, vibrational spectrometries (infrared and Raman), complex impedance spectrometry, and UV-Visible spectrometry.It appeared that [N(CH₃)₄]₂SnBr₆ is of cubic symmetry of the K₂PtCl₆ type. It consists of unconnected SnBr₆²- octahedra, separated by tetramethylammoniums, which can be considered to be derived from a perovskite structure in which half of the sites of octahedral symmetry are occupied by SnBr₆²- and half by vacancies (perovskite structure 0D). This arrangement thus leaves very large volumes free of any atom, and we have even shown that it has infinite open channels of large section (0,5 nm in diameter) ; it can thus be considered as a porous material. The vibrational analyzes coupled with ab-initio calculations on the SnBr₆²- octahedron and the tetramethylammonium ion (TMA+) made it possible to unambiguously explain the spectra and to conclude to the existence of local disorder. Infrared, Raman and EDX signals also suggest the presence of OH- or water, probably related to the porous structure. It has been shown that the compound undergoes a reversible phase transition at a higher temperature (around 100°C). Vibrational studies confirm the phase transition, as do studies of dielectric properties. The gap (2,31 eV) is close to the width of the 2,7 eV forbidden band of the Cs₂SnBr₆ semiconductor used in solar cells.Bis-tetraethylammonium hexabromostannate [CH₃-CH₂]₄SnBr₆ at room temperature exhibits a (rhombohedral) structure also composed of non-connected SnBr₆²- octahedra, but of compact structural arrangement, unlike the compound with TMA. Its temperature study reveals two reversible transitions but with strong hysteresis at 262K / 239K and at 362K / 307K (heating / cooling). Its gap energy is equal to 2,51 eV
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Krummenauer, Alex. "Desenvolvimento e validação de metodologia analítica para análise de aços por espectrometria de fluorescência de raios X por dispersão de energia (EDXRF)." reponame:Biblioteca Digital de Teses e Dissertações da UFRGS, 2017. http://hdl.handle.net/10183/178232.

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O desenvolvimento e validação de métodos analíticos é um procedimento necessário quando um método não normalizado é utilizado por um laboratório de ensaios. A validação de métodos também é um requisito específico da norma ABNT NBR ISO/IEC 17025, que determina os requisitos gerais para a competência dos laboratórios de ensaio e calibração. O objetivo da validação é demonstrar que o método analítico, nas condições em que é executado, produz resultados com a exatidão requerida. O Laboratório de Corrosão, Proteção e Reciclagem de Materiais (LACOR), da UFRGS, tem o ensaio de determinação de metais por fluorescência de raios X, acreditado pelo CGCRE/INMETRO, conforme ABNT NBR ISO/IEC 17025. O ensaio é feito usando o método de espectrometria de fluorescência de raios X por dispersão de energia (EDXRF). Este método, contudo, não é normalizado e, portanto, o mesmo foi validado, neste trabalho de pesquisa, para atender a este requisito. A validação foi feita com base no documento orientativo DOQ-CGCRE-08 e no guia EURACHEM. Os parâmetros de validação, para o ensaio quantitativo por EDXRF, que foram calculados neste trabalho são: seletividade; limite de detecção (LD) e limite de quantificação (LQ); linearidade e faixa de trabalho; veracidade de medição (tendência, erro normalizado, Z-score e comparação com método de referência) e precisão (repetibilidade, precisão intermediária e reprodutibilidade). Além disso, foi desenvolvida uma metodologia de cálculo de incerteza de medição para o ensaio por EDXRF Os resultados obtidos neste estudo demonstram que o método EDXRF, usado na determinação de metais em aços, é um método não normalizado validado e compatível com os resultados obtidos com os métodos de referência: espectrometria de fluorescência de raios X por dispersão de comprimento de onda (WDXRF), fotométricos e espectrometria de absorção atômica (AAS). Inclusive, o WDXRF é um método de referência usado em muitas normas internacionais, que descrevem métodos de análise de aços por fluorescência de raios X, como ASTM E572 ou ASTM E1085. O estudo desenvolvido nesta dissertação permitiu que o LACOR mantivesse sua acreditação no ensaio de determinação de metais por fluorescência de raios X, na avaliação do CGCRE/INMETRO, no presente ano. Outros frutos deste trabalho foram a confecção das curvas de calibração do espectrômetro NITON XL3t GOLDD+ e a revisão do procedimento de ensaio, onde esses novos conhecimentos sobre a técnica EDXRF foram aplicados. Futuramente, este trabalho pode ser usado por outros pesquisadores para desenvolver estudos em outras matrizes metálicas, como cobre, alumínio, titânio ou níquel, e, também, em outras áreas de aplicação como jóias, reciclagem de materiais metálicos ou, até mesmo, para análise elementar de resíduos retidos em membranas de troca iônica.
The development and validation of analytical methods is a required procedure when a non-standard method is used by a testing laboratory. Method validation is also a specific requirement of the ABNT NBR ISO / IEC 17025, which determines the general requirements for the competence of testing and calibration laboratories. The purpose of validation is to demonstrate that the analytical method, under the conditions in which it is performed, produces results with the required accuracy. The Corrosion, Protection and Recycling Materials Laboratory (LACOR), at UFRGS, has the X-ray fluorescence metal analysis, accredited by CGCRE / INMETRO, according to ABNT NBR ISO / IEC 17025. The test is performed using Energy Dispersive X-Ray Fluorescence spectrometry, EDXRF method. This method, however, is not standardized; therefore, it was validated in this research to meet this requirement. The validation was based on the DOQ-CGCRE-08 document and the EURACHEM guide. The method performance calculated in this study for quantitative testing by EDXRF are: selectivity; limit of detection (LOD) and limit of quantification (LOQ); linearity and working range; trueness (bias, normalized error, Z-score and comparison with reference method) and precision (repeatability, intermediate precision and reproducibility). In addition, a measurement uncertainty calculation methodology was developed for the EDXRF testing The results obtained in this study demonstrate that the EDXRF method, used in the determination in the chemical analysis of steels, is a validated non-standard method and compatible with the results obtained with the reference methods: Wavelength Dispersive X-Ray Fluorescence spectrometry (WDXRF), photometric and atomic absorption spectrometry (AAS). In addition, WDXRF is a reference method used in many international standards, which describes analysis of steels by X-ray fluorescence spectrometry such ASTM E572 or ASTM E1085. The study developed in this dissertation allowed LACOR to maintain its accreditation in the test of metal by X-ray fluorescence analysis, in the CGCRE / INMETRO audit, this year. Other fruits of this work were the preparation of calibration curves of NITON XL3t GOLDD + spectrometer and complete revision of testing procedure, where this new knowledge about the EDXRF technique was applied. In the future, this work can be used by other researchers to develop studies in other base metals such as copper, aluminum, titanium or nickel, and also in other areas of application such as jewelry, recycling of metallic materials or even for analysis elemental residues retained in ion exchange membranes.
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Wasserbauer, Jaromír. "Mechanické vlastnosti mikrostrukturních komponent anorganických materiálů." Doctoral thesis, Vysoké učení technické v Brně. Fakulta chemická, 2013. http://www.nusl.cz/ntk/nusl-233368.

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Disertační práce se zabývá studiem strukturních a mechanických vlastností anorganických materiálů. Cílem je nalezení jednotlivých fází ve zkoumaném materiálu a hlavně lokalizace (mechanicky) nejslabšího místa, jeho ovlivnění a následně výroba materiálu o lepších mechanických vlastnostech. Z důvodu velkého množství použitých metod je základní teorie vložena vždy na začátku příslušné kapitoly. Taktéž z důvodu značného množství výsledků jsou na konci kapitol uvedeny dílčí závěry. Práce je rozdělena na tři části, kdy první se zabývá seznámením s možnostmi modelování mikro-mechanických vlastností a provedením experimentů umožňujících posouzení rozsahu platnosti některého modelu. V druhé části je provedeno shrnutí současných možností indentačních zkoušek pro měření mechanických vlastností strukturních složek betonu a praktické zvládnutí metodiky vhodné k užití pro výzkum materiálů zkoumaných domovským pracovištěm. V třetí části je navržena metoda identifikace nejslabších článků struktury anorganických pojiv a její ověření na konkrétním materiálu zkoumaném na domovském pracovišti. V této dizertační práci jsou použity tyto metody: kalorimetrie, ultrazvukové testování, jednoosá pevnost v tlaku, nanoindentace, korelativní mikroskopie a rastrovací elektronová mikroskopie s energiově disperzním spektrometrem. Dílčími výsledky jsou kompletní charakterizace cementových materiálů, upřesnění stávajících poznatků a nalezení optimálního postupu pro charakterizaci. Hlavním výsledkem je inovativní přístup vedoucí k pozitivnímu ovlivnění materiálu.
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Kosár, Petr. "Modifikace povrchu pokročilých hořčíkových slitin povlaky na bázi Ni-P." Doctoral thesis, Vysoké učení technické v Brně. Fakulta chemická, 2017. http://www.nusl.cz/ntk/nusl-367534.

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The dissertation thesis deals with the modification of the surface of advanced magnesium alloys with Ni-P based coatings. At the beginning of the theoretical part, the structures of the used magnesium alloys and the influence of individual alloying elements on their properties are characterized. In the following part of the thesis the current knowledge in the field of electroless deposition on metal substrates is summarized. The theoretical part of the thesis is closed with contemporary research study in the field of clarification and determination of possible mechanism of electroless deposition. For the subsequent investigation of the mechanism of electroless deposition on magnesium alloys, it was necessary to characterize the microstructure and composition of individual magnesium alloys in the first phase of the experimental part. The exact composition of elements was determined using glow discharge optical emission spectroscopy and scanning electron microscopy with EDS was used for composition of phases of magnesium alloys. Using scanning electron microscopy and detailed elemental analysis of the coated magnesium substrate, it was found that for optimal Ni-P coating deposition on magnesium alloys, acid pickling prior coating is required in a mixture of acetic acid and sodium nitrate. Using the XPS method, it was found that the phosphorus atom in the sodium dihydride-diphosphate reducing agent has a + V charge. 4 At the end of the experimental part scanning electron microscopy and detailed elemental analyses were used for monitoring of the Ni-P particles nucleation and growth in the first 120 seconds of the coating process.
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Demers, Hendrix. "Two facets of the x-ray microanalysis at low voltage: the secondary fluorescence x-rays emission and the microcalorimeter energy-dispersive spectrometer." Thesis, McGill University, 2008. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=21993.

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The best spatial resolution, for a microanalysis with a scanning electron microscope (SEM), is achieved by using a low voltage electron beam. But the x-ray microanalysis was developed for high electron beam energy (greater than 10 keV). Also, the specimen will often contain light and medium elements and the analyst will have to use a mixture of K, L, and sometime M x-ray peaks for the x-ray microanalysis. With a mixture of family lines, it will be common to have secondary fluorescence x-rays emission by K-L and L-K interactions. The accuracy of the fluorescence correction models presently used by the analyst are not well known for these interactions. This work shows that the modified secondary fluorescence x-rays emission correction models can improve the accuracy of the microanalysis for K-L and L-K interactions. The general equation derived in this work allows the identification of three factors which influence the secondary fluorescence x-rays emission. The fluorescence production factor can be used to predict the importance of the secondary fluorescence x-rays emission. A large value of the fluorescence production factor indicates that a fluorescence correction is needed. Another disadvantage of using a low voltage is that there are more frequent occurrences of x-ray peaks overlap. A new microanalysis instruments that combines the high-spatial resolution and high-energy resolution for x-ray detection is needed. The microcalorimeter energy-dispersive spectrometer (uEDS) should improve the low voltage microanalysis, but the maturity of this technology has to be evaluated first. One of the first commercial uEDS for x-ray microanalysis in a SEM is studied and analyzed in this work. This commercial uEDS has an excellent energy resolution (15 eV) and can detect x-rays of low energy. This x-ray detector can be used as a high-spatial resolution and high-energy resolution microanalysis instrument. There are still hurdles that this technology must overcome before i
Pour la microanalyse par rayons X avec un microscope électronique à balayage (MEB), la meilleure résolution spatiale est obtenue à bas voltage. Cependant, la microanalyse par rayons X a été développée pour des grandes énergies du faisceau d'électrons (plus grandes que 10 keV). De plus, les échantillons analysés contiennent souvent des éléments légers et moyens. L'analyste va devoir utiliser un mélange de pics de rayons X K, L et parfois M pour la microanalyse par rayons X. Avec un aussi grand nombre de pics, l'émission de fluorescence secondaire de rayons X par des interactions K-L et L-K est inévitable. La précision des modèles de correction de la fluorescence utilisés présentement n'est pas bien quantifiée pour ces types d'interactions. Les modifications apportées, dans le cadre de ce travail, aux modèles de correction de la fluorescence améliorent la précision des résultats de la microanalyse pour les interactions K-L et L-K. L'équation générale dérivée dans ce travail permet l'identification de trois facteurs qui influencent l'émission de fluorescence secondaire de rayons X. Le facteur de production de fluorescence est utilisé pour prédire l'importance de l'émission de fluorescence de rayons X. Une grande valeur de ce facteur indique que la correction de fluorescence est nécessaire. Un autre désavantage d'utiliser une basse tension est le chevauchement des pics de rayons X qui se produit plus fréquemment. Un nouvel instrument de microanalyse qui combine une grande résolution spatiale et une grande résolution en énergie pour la détection des rayons X est nécessaire. Un spectromètre microcalorimétrique à dispersion d'énergie des rayons X (uEDS) devrait améliorer la microanalyse à basse tension, mais la maturité de cette technologie doit être évaluée. L'un des premiers spectromètre uEDS commercial pour la microanalyse par rayons X dans un MEB est étudié et analysé dans ce travail. Cet uEDS commercial$
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Books on the topic "Energy dispersive spectrometry"

1

Kasemodel, Carlos A. Quantitative energy dispersive x-ray spectrometry using an Emispec Vision system. Monterey, Calif: Naval Postgraduate School, 1999.

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Italy) European Conference on Energy Dispersive X-Ray Spectrometry (1998 Bologna. Proceedings of the European Conference on Energy Dispersive X-Ray Spectrometry 1998: EDXRS-98 : San Giovanni in Monte, Bologna, Italy, 7-12 June 1998. Bologna: Compositori, 1999.

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Severin, Kenneth P. Energy Dispersive Spectrometry of Common Rock Forming Minerals. Springer, 2013.

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Energy Dispersive Spectrometry of Common Rock Forming Minerals. Dordrecht: Springer Netherlands, 2004. http://dx.doi.org/10.1007/978-1-4020-2841-0.

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Quantitative Energy Dispersive X-Ray Spectrometry Using an Emispec Vision System. Storming Media, 1999.

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Book chapters on the topic "Energy dispersive spectrometry"

1

Potts, P. J. "Energy dispersive x-ray spectrometry." In A Handbook of Silicate Rock Analysis, 286–325. Boston, MA: Springer US, 1987. http://dx.doi.org/10.1007/978-1-4615-3270-5_9.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Spectrometry." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 207–12. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_34.

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Lyman, Charles E., Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, et al. "Energy-Dispersive X-Ray Spectrometry." In Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy, 27–32. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0635-1_5.

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Potts, P. J. "Energy dispersive x-ray spectrometry." In A Handbook of Silicate Rock Analysis, 286–325. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-015-3988-3_9.

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Joy, D. C. "Modeling the Energy Dispersive X-Ray Detector." In X-Ray Spectrometry in Electron Beam Instruments, 53–65. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-1825-9_5.

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Morita, Masaki. "Scanning Electron Microscope Energy Dispersive X-Ray Spectrometry." In Compendium of Surface and Interface Analysis, 557–61. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_90.

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Heinrich, K. F. J. "The Development of Energy Dispersive Electron Probe Analysis." In X-Ray Spectrometry in Electron Beam Instruments, 1–6. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-1825-9_1.

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Rickerby, David G. "Barriers to Energy Dispersive Spectrometry with Low Energy X-Rays." In Microbeam and Nanobeam Analysis, 493–500. Vienna: Springer Vienna, 1996. http://dx.doi.org/10.1007/978-3-7091-6555-3_43.

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Brydson, Rik, and Nicole Hondow. "Electron Energy Loss Spectrometry and Energy Dispersive X-ray Analysis." In Aberration-Corrected Analytical Transmission Electron Microscopy, 163–210. Chichester, UK: John Wiley & Sons, Ltd, 2011. http://dx.doi.org/10.1002/9781119978848.ch7.

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Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. "Qualitative Elemental Analysis by Energy Dispersive X-Ray Spectrometry." In Scanning Electron Microscopy and X-Ray Microanalysis, 265–87. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6676-9_18.

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Conference papers on the topic "Energy dispersive spectrometry"

1

Angloher, Godehard, Michael Altmann, Matthias Buehler, Franz von Feilitzsch, Theo Hertrich, Paul Hettl, Jens Hoehne, et al. "Cryogenic microcalorimeters for high-resolution energy-dispersive x-ray spectrometry." In SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, edited by Oswald H. W. Siegmund and Kathryn A. Flanagan. SPIE, 1999. http://dx.doi.org/10.1117/12.366543.

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Demarest, James, Chris Deeb, Thomas Murray, and Hong-Ying Zhai. "Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms." In ISTFA 2010. ASM International, 2010. http://dx.doi.org/10.31399/asm.cp.istfa2010p0301.

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Abstract Energy-dispersive X-ray spectrometry (EDS) is a key analytical tool aiding root cause determination in the failure analysis (FA) process. This paper looks at a number of analytical TEM microscopes currently in use in various facilities: microscope A, a STEM operated at 200kV; microscope B, a 300kV TEM; and microscopes C and D, both 200kV TEMs. EDS counts per unit time from multiple microscope platforms were examined. Microscope D demonstrated two orders of magnitude higher counts per unit time than the other three microscopes. Microscope D represents the state-of-the-art EDS analytical TEM configuration and has achieved this through a novel windowless EDS configuration which significantly increases the detector area (by about a factor of three) that receives X-rays generated from the sample.
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Soares, Luís Eduardo Silva, Sídnei Nahorny, Fernanda Roberta Marciano, Hudson Zanin, and Anderson de Oliveira Lobo. "Micro energy-dispersive x-ray fluorescence spectrometry study of dentin coating with nanobiomaterials." In SPIE Biophotonics South America, edited by Cristina Kurachi, Katarina Svanberg, Bruce J. Tromberg, and Vanderlei S. Bagnato. SPIE, 2015. http://dx.doi.org/10.1117/12.2180965.

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Song, JunLei, ZhiHeng Yang, Jing Cai, XiaoYong Ni, DianHong Wang, Xing Jin, WenQin Mo, KaiFeng Dong, and Fang Jin. "Qualitative Elemental Analysis of Minerals Based on Energy Dispersive X - ray Fluorescence Spectrometry." In 2018 37th Chinese Control Conference (CCC). IEEE, 2018. http://dx.doi.org/10.23919/chicc.2018.8483065.

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Hoehne, Jens, Michael Altmann, Godehard Angloher, Matthias Buehler, Franz v. Feilitzsch, Torsten Frank, Paul Hettl, et al. "Cryogenic microcalorimeters and tunnel junctions for high-resolution energy dispersive x-ray spectrometry." In Microelectronic Manufacturing Technologies, edited by Kostas Amberiadis, Gudrun Kissinger, Katsuya Okumura, Seshu Pabbisetty, and Larg H. Weiland. SPIE, 1999. http://dx.doi.org/10.1117/12.346911.

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Mohsen, H. T., N. F. Zahran, and A. I. Helal. "Quantitative Elemental Analysis of Biological Samples by Energy Dispersive X-ray Fluorescence Spectrometry." In MODERN TRENDS IN PHYSICS RESEARCH: Second International Conference on Modern Trends in Physics Research MTPR-06. AIP, 2007. http://dx.doi.org/10.1063/1.2711132.

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Newbury, Dale E., and Nicholas W. M. Ritchie. "Faults and foibles of quantitative scanning electron microscopy/energy dispersive x-ray spectrometry (SEM/EDS)." In SPIE Defense, Security, and Sensing. SPIE, 2012. http://dx.doi.org/10.1117/12.912770.

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Hughes, Louise. "Energy dispersive x-ray spectrometry identifies wear particles and reveals protein accumulation in tissue-biomaterial interactions." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.165.

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Bogani, Federica, and Priyanka Dobriyal. "Development of Small Spot Thickness Capability on a Conventional Energy Dispersive X-Ray Fluorescence Spectrometer." In ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0378.

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Abstract The metal thickness of surface finish is an important consideration when plating on microelectronics. Metal finish thickness should comply with specification requirements to prevent serious reliability concerns. The thickness of metallic coatings is routinely determined by X-ray fluorescence (XRF) spectrometry. For conventional XRF instrumentation, typical focal spot sizes at the sample surface range in diameter from several hundred micrometers up to several millimeters. Micro- XRF focuses or collimates the X-ray beam to significantly smaller spot sizes, ranging from ~30 µm to 2 mm, thus obtaining a representative average of layer properties both at the surface and in-depth layers. This is a critical property for application in semiconductor industry where feature size is becoming progressively smaller. This work describes how a mid-range cost conventional XRF tool can be utilized for small spot size thickness measurement with the addition of a 0.25 mm diameter collimator.
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"Determination of barium content in pyrotechnics used for fireworks and firecrackers based on Energy Dispersive X-ray Fluorescence Spectrometry (EDXRF）." In 2017 International Conference on Materials, Energy, Civil Engineering and Computer. Francis Academic Press, 2017. http://dx.doi.org/10.25236/matecc.2017.01.

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Reports on the topic "Energy dispersive spectrometry"

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Zuccarelli, N., C. M. Lesher, M. G. Houlé, and S. J. Barnes. Variations in the textural facies of sulphide minerals in the Eagle's Nest Ni-Cu-(PGE) deposit, McFaulds Lake greenstone belt, Superior Province, Ontario: insights from microbeam scanning energy-dispersive X-ray fluorescence spectrometry. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 2020. http://dx.doi.org/10.4095/326895.

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Pringle, G. J. Eddi: a Fortran Computer Program To Produce Corrected Microprobe Analyses of minerals using An Energy Dispersive X-ray Spectrometer. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1989. http://dx.doi.org/10.4095/130786.

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