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Journal articles on the topic 'Energy dispersive spectrometry'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Lund, Mark W. "More Than One Ever Wanted To Know About X-ray Detectors Part V: Wavelength - The "Other" Spectroscopy." Microscopy Today 3, no. 4 (May 1995): 8–9. http://dx.doi.org/10.1017/s1551929500063537.

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The use of x-ray spectrometry in electron microscopy has been a powerful market driver not only for electron microscopes but also for x-ray spectrometers. More x-ray spectrometers are sold with electron microscopes than in any other configuration. A general name for the combination is AEM, or analytical electron microscope, though in modern times AEM can include other instrumentation such as electron energy loss spectroscopy and visible light spectroscopy. In previous articies I have discussed energy dispersive spectrometers (EDS). These use semiconductor crystals to detect the x-rays and measure the energy deposited in the crystal. A second type of x-ray spectrometer measures the wavelength of the x-rays, and so is called "wavelength dispersive spectrometry" (WDS).

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2

Michael, J. R. "Energy Dispersive Spectrometry in the AEM." Microscopy and Microanalysis 4, S2 (July 1998): 186–87. http://dx.doi.org/10.1017/s143192760002105x.

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Energy-dispersive x-ray spectrometry (EDS) with a SiLi detector has become a standard technique in the analytical electron microscope (AEM). There have been many difficulties to overcome involving both the interfacing of the spectrometer to the microscope and in developing robust techniques for quantitative analysis of thin specimens. The AEM is a difficult environment for EDS due to the high accelerating voltages (100-400 kV) typically used and due to constraints on detector placement relative to the specimen as a result of the confined space within the specimen region of the AEM. The first published account of the installation of SiLi EDS on a transmission electron microscope (TEM) occurred in 1969. In this paper and subsequent publications, these authors described many of the difficulties that still haunt EDS in the AEM.The initial attempts at interfacing EDS to a TEM column demonstrated that the. specimen stage of a TEM was not ideal for this purpose.

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3

Ritchie, N., J. Davis, and D. Newbury. "Energy Dispersive Spectrometry at Wavelength Precision." Microscopy and Microanalysis 17, S2 (July 2011): 556–57. http://dx.doi.org/10.1017/s1431927611003655.

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4

Steel, E. B., R. B. Marinenko, and R. L. Myklebust. "Quality Assurance of Energy Dispersive Spectrometry Systems." Microscopy and Microanalysis 3, S2 (August 1997): 903–4. http://dx.doi.org/10.1017/s1431927600011405.

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Monitoring the performance capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for determining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. In addition, there is a growing popularity of quality systems through laboratory accreditation and ISO 9000 related programs that require set quality control procedures for analytical instrumentation. Having similar standard procedures amongst labs would allow direct intercomparison of results. This intercomparison would help labs and manufacturers determine what are normal versus abnormal results and lead to higher quality instruments and analyses. We have been developing a standard operating procedure for the characterization of EDS x-ray analysis systems on electron beam instruments.We are designing the procedure to maximize the efficiency of each quality control (QC) measurement so that we spend as little time monitoring the analysis system as is possible. We first chose useful QC specimens and then designed data collection methods.

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5

Steel, E. B., and R. B. Marinenko. "Quality Assurance of Energy Dispersive Spectrometry Systems." Microscopy and Microanalysis 4, S2 (July 1998): 214–15. http://dx.doi.org/10.1017/s143192760002119x.

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Monitoring the performance and capabilities of energy dispersive X-ray spectrometers (EDS) and related x-ray analysis electronics and software is important for maintaining and improving the reliability, sensitivity, and accuracy of the x-ray analysis system. There is growing demand for quality systems through laboratory accreditation, ISO 9000, ISO Guide 25 and related programs that require set quality control procedures for analytical instrumentation. In such cases it is frequently more useful to have one national/international standard. This approach is not only more efficient than having each analyst devise their own system, but the use of the same standard procedures among labs would allow direct intercomparison of results. This intercomparison can help labs and manufacturers determine what are normal versus abnormal results and lead to higher quality instruments and analyses.We are designing a standard procedure to maximize the efficiency of each quality control (QC) measurement so that we spend as little time monitoring the analysis system as is possible.

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6

Yao, Min, Dongyue Wang, and Min Zhao. "Element Analysis Based on Energy-Dispersive X-Ray Fluorescence." Advances in Materials Science and Engineering 2015 (2015): 1–7. http://dx.doi.org/10.1155/2015/290593.

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Energy-dispersive X-ray fluorescence (EDXRF) spectrometry is a nondestructive, rapid, multielement, highly accurate, and environment friendly analysis compared with other elemental detection methods. Thus, EDXRF spectrometry is applicable for production quality control, ecological environment monitoring, geological surveying, food inspection, and heritage analysis, among others. A hardware platform for the EDXRF spectrometer is designed in this study based on the theoretical analysis of energy-dispersive X-ray. The platform includes a power supply subsystem, an optical subsystem, a control subsystem, and a personal computer. A fluorescence spectrum analytical method is then developed to obtain the category and content of elements in a sample. This method includes qualitative and quantitative analyses. Finally, a series of experiments is performed. Results show that the precision of the proposed measurement method is below 8%, whereas its repeatability is below 2%.

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7

Vartuli, C. B., F. A. Stevie, B. M. Purcell, A. Scwhitter, B. Rossie, S. Brown, T. L. Shofner, S. D. Anderson, J. M. McKinley, and R. B. Irwin. "Energy Dispersive Spectrometry Calibration of Fe and Co." Microscopy and Microanalysis 7, S2 (August 2001): 200–201. http://dx.doi.org/10.1017/s1431927600027070.

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Energy Dispersive Spectrometry (EDS) is an ubiquitous method of elemental analysis for SEM, TEM, and STEM applications. The elements of interest are generally quantified without standards using theoretical calculations or by using standards that are high purity specimens of the elements measured. However, EDS is often used to determine a small percentage of an element in a matrix. The accuracy and limit of detection of these low concentration measurements has not been established. An earlier report proved the concept that a cross section high dose BF2 implanted specimen could provide a standard for EDS measurement of F. This study extends this quantification approach to transition elements of importance to the semiconductor industry.The Fe and Co standards were created by high dose ion implantation. For ions implanted into silicon, a dose of lxl016 atoms/cm2 results in a peak concentration of approximately lxl021 atoms/cm3 or 2% atomic. The exact concentration can be determined using methods such as Rutherford Backscattering Spectrometry (RBS) and Secondary Ion Mass Spectrometry (SIMS).

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8

Ritchie, Nicholas W. M., and Dale E. Newbury. "Uncertainty Propagation for Energy Dispersive X-ray Spectrometry." Microscopy and Microanalysis 24, S1 (August 2018): 708–9. http://dx.doi.org/10.1017/s1431927618004038.

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9

Wollman, D. A., Dale E. Newbury, G. C. Hilton, K. D. Irwin, D. A. Rudman, L. L. Dulcie, N. F. Bergren, and John M. Martinis. "Microcalorimeter Energy Dispersive Spectrometry for Low Voltage SEM." Microscopy and Microanalysis 5, S2 (August 1999): 304–5. http://dx.doi.org/10.1017/s1431927600014847.

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Microanalysis performed at low electron beam energies (≤ 5 keV) is limited by the physics of x-ray generation and the performance of existing semiconductor energy dispersive spectrometry (EDS) and wavelength dispersive spectrometry (WDS). Low beam energy restricts the atomic shells that can be excited for elements of intermediate and high atomic number, forcing the analyst to consider using unconventional M- and N-shells for elements such as Sn and Au. Unfortunately, these shells have very low fluorescent yield, which results in inherently low spectral peak-to-background ratios. The modest energy resolution of semiconductor EDS leads to poor limits of detection for these weakly emitted photons. The situation is further complicated by the inevitable interferences with the much more strongly excited K-shell x-rays of the light elements, particularly carbon and oxygen. WDS has the spectral resolution to overcome the resolution limitations of semiconductor EDS. However, WDS has a low geometric efficiency, and because of its narrow instantaneous spectral transmission, spectral scanning is required to detect and analyze x-ray peaks. Moreover, the high resolution field-emission-gun scanning electron microscope (FEG-SEM) provides only a few nanoamperes of beam current.

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10

Lifshin, Eric, Necip Doganaksoy, Jane Sirois, and Raynald Gauvin. "Statistical Considerations in Microanalysis by Energy-Dispersive Spectrometry." Microscopy and Microanalysis 4, no. 6 (December 1998): 598–604. http://dx.doi.org/10.1017/s1431927698980576.

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X-ray counting statistics plays a key role in establishing confidence limits in composition determination by X-ray microanalysis. The process starts with measurements of intensity on one or more samples and standards as well as related background determinations. Since each individual measurement is subject to variability associated with counting statistics, it is necessary to combine all of the counting variability according to established mathematical procedures. The next step is to apply propagation of error calculations to equations for quantitative analysis and determine confidence limits in reported composition. Similar concepts can also be applied to trace element determination. This approach can then be combined with spectral simulation modeling, making it possible to predict detectability limits without additional measurements.

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11

Bullock, Emma S. "Combined Energy Dispersive Spectrometry/W avelength Dispersive Spectrometry Analysis of Geological Materials Using an Electron Probe Microanalyzer." Microscopy and Microanalysis 24, S1 (August 2018): 792–93. http://dx.doi.org/10.1017/s1431927618004452.

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12

Myklebust, Robert L., and Dale E. Newbury. "Extracting Low Energy X-Ray Peaks From EDS and WDS Spectra." Microscopy and Microanalysis 4, S2 (July 1998): 218–19. http://dx.doi.org/10.1017/s1431927600021218.

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Interest in electron beam x-ray microanalysis with low incident beam energies, defined arbitrarily as 5 keV and below, has been greatly stimulated in recent years by the development of the high performance field emission gun scanning electron microscope (FEG-SEM), which can produce a nanometer-scale probe with sufficient current to operate with both energy dispersive (EDS) and wavelength dispersive (WDS) spectrometers. Microanalysis in this regime requires the analyst to confront new spectrometry problems that are not typically encountered, or that can be safely ignored, when operating with conventional beam energies, 10 keV or greater. With low energy operation, the choice of atomic shells that can be accessed is restricted, forcing the analyst to make use of shells that have low fluorescence yields for intermediate and high atomic number elements, and possibly strong chemical effects, which are evident with high resolution x-ray spectrometry.

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13

Saeidi, Kamran, Lenka Kvetková, František Lofaj, and Zhijian Shen. "Austenitic stainless steel strengthened by the in situ formation of oxide nanoinclusions." RSC Advances 5, no. 27 (2015): 20747–50. http://dx.doi.org/10.1039/c4ra16721j.

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Austenitic stainless steel was prepared by laser melting. High resolution transmission electron microscopy with energy dispersive spectrometry confirmed homogeneous dispersion of the in situ formed oxide nanoinclusions with average size less than 50 nm in the steel matrix.

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14

Terborg, Ralf, and Thomas Schwager. "Definition of the Detection Limit in Energy-dispersive Spectrometry." Microscopy and Microanalysis 26, S2 (July 30, 2020): 2188–89. http://dx.doi.org/10.1017/s1431927620020747.

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15

McCarthy, Jon J. "Thirty Years of Energy-Dispersive Spectrometry in Microanalysis: Introduction." Microscopy and Microanalysis 4, no. 6 (December 1998): 551. http://dx.doi.org/10.1017/s1431927698980515.

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This issue of Microscopy and Microanalysis contains a selection of invited papers from the topical symposium, Thirty Years of Energy-Dispersive Spectrometry in Microanalysis, sponsored by the Microbeam Analysis Society (MAS) at the Microscopy & Microanalysis (M&M) '98 meeting, held July 12-16 in Atlanta, Georgia. This was the second MAS topical symposium held in conjunction with the annual M&M meetings, the first being at the meeting in Minneapolis, Minnesota, in 1996. The MAS topical symposia are part of an initiative to provide venues for in-depth study of topics of special interest to the microbeam analysis community. The next MAS topical symposium is planned as part of M&M '99 and will celebrate Fifty Years of the Electron Microprobe.

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16

Williams, David B. "Impact of Energy-Dispersive Spectrometry in Materials Science Microanalysis." Microscopy and Microanalysis 4, no. 6 (December 1998): 567–75. http://dx.doi.org/10.1017/s1431927698980540.

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X-ray microanalysis of materials using energy-dispersive spectrometry (EDS) has made the greatest impact in studies of compositional changes at atomic-level interfaces. The small physical dimensions of the silicon detector make EDS the X-ray analyzer of choice for analytical transmission electron microscopy (AEM). X-ray analysis of thin foils in the AEM has contributed to our understanding of elemental segregation to interphase interfaces and grain boundaries, as well as other planar defects. Measurement of atomic diffusion on a small scale close to interphase interfaces has permitted determination of substitutional atomic diffusivities several orders of magnitude smaller than previously possible and has also led to the determination of low-temperature equilibrium phase diagrams through the measurement of local interface compositions. Elemental segregation to grain boundaries is responsible for such deleterious behavior as temper embrittlement, stress-corrosion cracking, and other forms of intergranular failure. On the other hand, segregation can bring about improvement in behavior: sintering aids in ceramics and de-embrittlement of intermetallics. EDS in the AEM has been responsible for quantitative analysis of all aspects of the segregation process and, more recently, in combination with electron energy-loss spectrometry (EELS) has given insight into why boundary segregation results in such significant macroscopic changes in properties.

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17

Vartuli, C. B., F. A. Stevie, B. B. Rossie, S. D. Anderson, M. M. Jamison, M. A. Decker, J. M. McKinley, C. S. Darling, and R. B. Irwin. "Energy Dispersive Spectrometry Calibration For The HD -2000 STEM." Microscopy and Microanalysis 8, S02 (August 2002): 1192–93. http://dx.doi.org/10.1017/s1431927602107835.

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18

Rakovan, John. "A Word to the Wise: Energy Dispersive Spectrometry (EDS)." Rocks & Minerals 79, no. 3 (June 2004): 194–95. http://dx.doi.org/10.1080/00357529.2004.9925707.

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19

Van Grieken, R., A. Markowicz, and Sz Török. "Energy-dispersive X-ray spectrometry: present state and trends." Fresenius' Zeitschrift für analytische Chemie 324, no. 8 (January 1986): 825–31. http://dx.doi.org/10.1007/bf00473177.

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20

Ottmar, H., H. Eberle, P. Matussek, and I. Michel-Piper. "Energy-Dispersive X-Ray Techniques for Accurate Heavy Element Assay." Advances in X-ray Analysis 30 (1986): 285–92. http://dx.doi.org/10.1154/s0376030800021406.

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Energy-dispersive X-ray techniques can be employed in two different ways for the accurate determination of element concentrations in specimens: (1) spectrometry of fluoresced characteristic X-rays as widely applied in the various modes of the traditional XRF analysis technique, and (2) spectrometry of the energy-differential transmittance of an X-ray continuum at the element-specific absorption-edge energies.

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21

Ware, N. G. "Energy-dispersive x-ray microanalysis in the earth sciences." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1740–41. http://dx.doi.org/10.1017/s0424820100133333.

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The electron microprobe analyser (EMPA) is used extensively for the analysis of the constituent minerals in rocks and the samples generated by experimental petrology apparatus. These analyses, combined with the results of field observations and data from other analytical techniques, are used in petrogenetic studies and hence in the determination of planetary formation and evolution. In turn, this knowledge helps the mining industry in their mineral exploration programs.In the 1960s almost all geological usage of the EMPA was confined to the x-ray spectrometry of L3-K lines of elements of atomic number 11 through 30 (Na through Zn). By the end of this decade semi conductor technology had advanced so that these x-ray lines could be resolved using a lithium-drifted silicon detector working as an energy dispersive spectrometer (EDS). Quantitative EDS software was developed in the early 1970s and it became possible to perform major element analyses of silicates, oxides, carbonates and sulphides using a scanning electron microscope (SEM) fitted with an EDS.

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22

Parker, Jim, and Wayne Watson. "Analysis of Refractory Materials by Energy Dispersive X-Ray Spectrometry." Advances in X-ray Analysis 29 (1985): 557–64. http://dx.doi.org/10.1154/s0376030800010715.

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Silica-alumina refractory materials are used as insulation materials in high temperature applications. Such materials are amenable to x-ray analysis (1). Wavelength dispersive x-ray spectrometry is used in our laboratory for the analysis of a variety of refractory materials. An analysis procedure was needed for a quality control project that would provide major and minor element determinations in silica-alumina refractory materials. The requirements for the analysis scheme were relative accuracy and precision to be better than one percent. The method had to be rapid, simple to use, and inexpensive. Energy dispersive x-ray spectrometry and a borate fusion technique were chosen as the method of choice for this application. Described in this paper are the sample and standard preparation procedures, data reduction methods, and analytical results.

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23

Xu, Yan-Yan, Lai-Jiu Zheng, Fang Ye, Yong-Fang Qian, Jun Yan, and Xiao-Qing Xiong. "Water/oil repellent property of polyester fabrics after supercritical carbon dioxide finishing." Thermal Science 19, no. 4 (2015): 1273–77. http://dx.doi.org/10.2298/tsci1504273x.

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The strong permeability and driving force of supercritical carbon dioxide renders it an ideal medium for fabrics finishing. This paper is to use supercritical carbon dioxide medium with a solution of organic fluorine to fabricate water/oil repellent polyester fabrics. A series of characterization methods including Fourier transform infrared spectrometry, energy dispersive spectrometry, and scanning electron microscopy were carried out to evaluate the fabrics finishing. Fourier transform infrared spectrometry showed that the transmittance peak appeared at 1202.4 and 1147.4 cm-1, indicating the presence of -CF2- group on the surface of polyester fabrics. The results of energy dispersive spectrometer and scanning electron microscopy showed that the fluorine was evenly distributed on the fibers surface. In addition, a series of physical properties were detected, including contact angel, air permeability, breaking strength, and wearing resistance. The average water and hexadecane contact angles were 147.58? and 143.78?, respectively. Compared with the initial fabrics, the treated one has little change in air permeability, while its strength increased greatly. The treated fabrics gained good water/oil repellent properties while keeping good air permeability and improving mechanical property.

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24

Newbury, Dale E., and Richard D. Leapman. "Detection limits for Analytical Electron Microscopy with Electron Energy Loss Spectrometry and energy-dispersive x-ray spectrometry." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 594–95. http://dx.doi.org/10.1017/s0424820100148800.

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The measurement of trace level constituents, arbitrarily defined for this study as concentration levels below 1 atom percent, has always been considered problematic for analytical electron microscopy (AEM) with energy dispersive x-ray spectrometry (EDS) and electron energy loss spectrometry (EELS). In a landmark study of various microanalysis techniques, Wittry evaluated the influence of various instrumental factors (source brightness, detection efficiency, accumulation time) and physical factors (cross section, peak-to-background) upon detection limits. Although the ionization cross section, fluorescence yield, and collection efficiency favor EELS over EDS, the peak-to-background ratio of EELS spectra is much lower than that of EDS spectra, leading Wittry to suggest that the limit of detection should be 0.1 percent for EDS and 1 percent for EELS for practical measurement conditions. Recent developments in parallel detection EELS (PEELS) indicate that a re-evaluation of the situation for trace constituent determination is needed for those elements characterized by "white line" resonance structures at the ionization edge.

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25

Newbury, Dale E. "Energy Dispersive X-ray Spectrometry in the Scanning Electron Microscope." Microscopy and Microanalysis 10, S02 (August 2004): 126–27. http://dx.doi.org/10.1017/s1431927604880644.

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26

Christensen, Leif Højslet, and Iver Drabaek. "Energy-dispersive x-ray fluorescence spectrometry of industrial paint samples." Analytica Chimica Acta 188 (1986): 15–24. http://dx.doi.org/10.1016/s0003-2670(00)86025-0.

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27

J.Höhne, M. Altmann, G. Angloher, M. Bühler, F. v. Feilitzsch, T. Frank, P. Hettl, et al. "Cryogenic Microcalorimeters for High Resolution Energy Dispersive X-Ray Spectrometry." Microscopy and Microanalysis 5, S2 (August 1999): 604–5. http://dx.doi.org/10.1017/s1431927600016342.

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AbstractCryogenic detectors with excellent energy resolution and low energy threshold far beyond the level of semiconducting detectors open a variety of new. applications in physics including search for Dark Matter in the universe [2], neutrino physics [3], and IR-, UV- and X-ray astrophysics [4, 9]. Interdisciplinary fields where cryogenic detectors have already shown promising results are the detection of biomolecules [5] and X-ray spectroscopy at synchrotron beam lines [6] and in scanning electron microscopes (SEMs) [7]. For both, astrophysical and analytical use, the development of high resolution microcalorimeters based on iridium/gold phase transition thermometers and aluminum tunnel junctions for use in a compact and universal detector system was initiated.Our cryogenic microcalorimeters consist of an absorber, a temperature sensor and a weak coupling to a heat sink. An X-ray photon interacts with the absorber and raises its temperature. The sensor measures the temperature increase and the system then, mediated by the coupling, relaxes back to its operating temperature.

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28

Yu, K. N. "Identification of Rubies by Energy-Dispersive X-Ray Fluorescence Spectrometry." Applied Spectroscopy 48, no. 5 (May 1994): 641–43. http://dx.doi.org/10.1366/0003702944924862.

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29

Newbury, Dale, David Wollman, Sae Woo Nam, Gene Hilton, Kent Irwin, John Small, and John Martinis. "Energy Dispersive X-Ray Spectrometry by Microcalorimetry for the SEM." Microchimica Acta 138, no. 3-4 (May 1, 2002): 265–74. http://dx.doi.org/10.1007/s006040200030.

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Toribara, Taft Y. "Applications For X-Ray Fluorescence Scans of Single Strands of Hair: Actual and Potential." Advances in X-ray Analysis 30 (1986): 293–302. http://dx.doi.org/10.1154/s0376030800021418.

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Quantitative utilization of energy dispersive X-ray fluorescence spectrometry has been made for many years, and the development of instruments for this purpose have arisen from needs which can be met by the sensitivity of the technique. In a need to get information which could be obtained only by scanning single strands of hair to obtain the profile of the mercury levels along the hair, a unique X-ray fluorescence energy dispersive spectrometer was built. The prototype of this instrument was described at the Denver Conference of 1977, and published in the subsequent publication (1). The present instrument is described in a later publication (2).

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31

Wu, Ying, Dimitri Klyachko, Scott Davilla, James Spallas, Scott Indermuehle, and Lawrence P. Muray. "High-voltage energy dispersive x-ray spectrometry using a low-energy primary beam." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 32, no. 6 (November 2014): 06FC05. http://dx.doi.org/10.1116/1.4901883.

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Goppelt, P., B. Gebauer, D. Fink, M. Wilpert, Th Wilpert, and W. Bohne. "High energy ERDA with very heavy ions using mass and energy dispersive spectrometry." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 68, no. 1-4 (May 1992): 235–40. http://dx.doi.org/10.1016/0168-583x(92)96083-b.

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33

Newbury, Dale E. "Basic literacy in electron-probe x-ray microanalysis with energy-dispersive x-ray spectrometry: Qualitative and quantitative analysis." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 384–85. http://dx.doi.org/10.1017/s0424820100169651.

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Rigorous electron probe x-ray microanalysis (EPMA) with energy dispersive x-ray spectrometry (EDS) takes place in two sequential steps: qualitative analysis followed by quantitative analysis.Qualitative analysis: Qualitative analysis involves the assignment of the peaks found in the x-ray spectrum to specific elements. One of the most important attributes of energy dispersive x-ray spectrometry (EDS) for qualitative analysis is that we can always view the complete x-ray spectrum. The EDS photon detection process effectively provides parallel detection in energy. Depending on the detector window and spectrometer characteristics, the entire energy range from Be K radiation (0.106 keV) to the incident beam energy can be available for analysis. With an incident beam energy of 15 keV, at least one family of x-ray lines (K, L, or M shell) will be excited for each element in the Periodic Table with atomic number ≥ 4. We ignore at our peril this capability to do a complete qualitative analysis at all specimen locations that we choose to measure. Quantitative analysis is meaningless if qualitative analysis has not been properly perfonned first. The bases for qualitative analysis include the exact energy of the peak(s), which places a premium on spectrometer calibration, the recognition of all members of each x-ray family and the possibility of two (or more) families being excited, the relative intensities ("weights of lines") within a family, and the artifacts associated with each high intensity peak, particularly the escape peak(s) and sum peak(s).

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34

Pytlakowska, Katarzyna, Ewa Malicka, Ewa Talik, and Anna Gągor. "Correction: Nano-bismuth sulfide based dispersive micro-solid phase extraction combined with energy dispersive X-ray fluorescence spectrometry for determination of mercury ions in waters." Journal of Analytical Atomic Spectrometry 36, no. 9 (2021): 2017. http://dx.doi.org/10.1039/d1ja90042k.

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Correction for ‘Nano-bismuth sulfide based dispersive micro-solid phase extraction combined with energy dispersive X-ray fluorescence spectrometry for determination of mercury ions in waters’ by Katarzyna Pytlakowska et al., J. Anal. At. Spectrom., 2021, 36, 786–795, DOI: 10.1039/D0JA00477D.

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35

Friel, John J., and Richard B. Mott. "Energy-Dispersive Spectrometry from Then until Now: A Chronology of Innovation." Microscopy and Microanalysis 4, no. 6 (December 1998): 559–66. http://dx.doi.org/10.1017/s1431927698980539.

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As part of the Microbeam Analysis Society (MAS) symposium marking 30 years of energy-dispersive spectrometry (EDS), this article reviews many innovations in the field over those years. Innovations that added a capability previously not available to the microanalyst are chosen for further description. Included are innovations in both X-ray microanalysis and digital imaging using the EDS analyzer.

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36

Bo Jensen, Bjarne, and Niels Pind. "Measurement of peak areas in energy-dispersive x-ray fluorescence spectrometry." Analytica Chimica Acta 171 (May 1985): 101–10. http://dx.doi.org/10.1016/s0003-2670(00)84187-2.

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37

Polat, Recep, Ali Gürol, Neslihan Ekinci, Celal Çak|r, Arif Bastug, Gökhan Budak, and Abdulhalik Karabulut. "Determination of Ore Concentrates by Energy Dispersive X-Ray Fluorescence Spectrometry." Journal of Trace and Microprobe Techniques 21, no. 1 (January 2, 2003): 63–71. http://dx.doi.org/10.1081/tma-120017892.

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Kasrai, M., L. Fozoonmayeh, and H. Payrovan. "Quantitative determination of gold in ore using energy-dispersive XRF spectrometry." X-Ray Spectrometry 17, no. 6 (December 1988): 219–22. http://dx.doi.org/10.1002/xrs.1300170605.

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Markowicz, A., N. Haselberger, and P. Mulenga. "Accuracy of calibration procedure for energy-dispersive x-ray fluorescence spectrometry." X-Ray Spectrometry 21, no. 6 (November 1992): 271–76. http://dx.doi.org/10.1002/xrs.1300210604.

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Lorber, Karl E. "Monitoring of Heavy Metals By Energy Dispersive X-Ray Fluorescence Spectrometry." Waste Management & Research 4, no. 1 (January 1986): 3–13. http://dx.doi.org/10.1177/0734242x8600400102.

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Wollman, D. A., S. W. Nam, G. C. Hilton, K. D. Irwin, N. F. Bergren, D. A. Rudman, J. M. Martinis, and D. E. Newbury. "Microcalorimeter energy-dispersive spectrometry using a low voltage scanning electron microscope." Journal of Microscopy 199, no. 1 (July 2000): 37–44. http://dx.doi.org/10.1046/j.1365-2818.2000.00705.x.

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Walker, S. R., P. N. Johnston, I. F. Bubb, W. B. Stannard, D. D. Cohen, N. Dytlewski, M. Hult, et al. "Mass and energy dispersive recoil spectrometry of MOCVD grown AlxGa1−xAs." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 353, no. 1-3 (December 1994): 563–67. http://dx.doi.org/10.1016/0168-9002(94)91724-8.

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Newbury, Dale E. "“Standardless” Quantitative Analysis by Electron-Excited Energy Dispersive X-Ray Spectrometry: What is its Proper Role?" Microscopy and Microanalysis 4, S2 (July 1998): 194–95. http://dx.doi.org/10.1017/s1431927600021097.

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The development of energy dispersive x-ray spectrometry (EDS) has had a profound impact on the methodology of quantitative x-ray microanalysis of thick specimens (i.e., thickness≫ electron range) as performed in electron beam instruments. By equipping the scanning electron microscope (SEM) with EDS, quantitative x-ray microanalysis has become commonly available to a wide range of users, at least some of whom have only a modest background in analytical science. An important aspect of the development of quantitative analysis by EDS has been the extensive analytical experience gained during the development of the electron probe microanalyzer (EPMA) equipped with wavelength dispersive x-ray spectrometers (WDS). The critical measurement step for quantitative WDS analysis was recognized to be the determination of the “k-value”:k = Iunk / Istd (1)where I is the measured characteristic intensity of a specific x-ray peak, corrected for background and peak overlaps, for both the unknown and the standard.

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Tarolli, Jay G., Benjamin E. Naes, Benjamin J. Garcia, Ashley E. Fischer, and David Willingham. "High resolution isotopic analysis of U-bearing particles via fusion of SIMS and EDS images." Journal of Analytical Atomic Spectrometry 31, no. 7 (2016): 1472–79. http://dx.doi.org/10.1039/c6ja00149a.

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Rémond, Guy. "Spectral Deconvolution of Wavelength Dispersive X-RAY Spectra." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 112–13. http://dx.doi.org/10.1017/s0424820100134156.

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X-ray peaks frequently exhibit asymmetrical shape which may result either from the mechanisms of generation of X-ray photons or from instrumental spectral distortions. As a result a non-proportionality may occur between the observed and the true intensities of the analyzed emissions. An analytical description of the shape of an X-ray line must be used in a least-squares fitting procedure in order to derive the relative intensities from experimental spectra. The available models will be discussed taking into account the analyzed energy domain and the energy resolution of the spectrometer respectively.For the case of wavelength dispersive X-ray spectrometry, Remond et al. (1) showed that the shape of an L emission peak P(λ), analyzed by means of a LiF (200) monochromator (≈ 0.1nm < λ < ≈ 0.3nm) was correctly described by the use of equation [1].[1]where P1(λ) and P2(λ) are a Gaussian and a Lorentzian distribution respectively, centered at the same wavelength, with the same amplitude and half-width at half-maximum Γ, (HWHM) and in relative proportion k.

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Chen, Chiing Chang, Yu Rou Jiang, and Ken Hao Chang. "The Hydrothermal Synthesis of β-ZnMoO₄ for UV or Visible-Light-Responsive Photocatalytic Dedradation of Victoria Blue R." Advanced Materials Research 557-559 (July 2012): 761–66. http://dx.doi.org/10.4028/www.scientific.net/amr.557-559.761.

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In this study, hydrothermal reaction with Na2MoO4 and Zn(NO3)2as a precursor were investigated for the synthesis of β-ZnMoO4. The β-ZnMoO4were characterized by the X-ray diffractometer (XRD), electron microscopy with the field emission scanning electron microscopy with energy dispersive X-ray spectrometer (FE-SEM-EDS), high resolution X-ray photoelectron spectrometry (HR-XPS), UV-vis diffuse reflectance spectrometry (UV-DRS), and Fourier transform infrared spectrometry (FT-IR). Diffuse UV-vis spectra show the β-ZnMoO4materials to be indirect semiconductors with an optical bandgap of 2.48-2.64 eV. The photocatalytic efficiencies of powder suspensions were evaluated by measuring the Victoria Blue R (VBR) concentration. This is the first reveal that excellent activities of β-ZnMoO4are a promising visible-light-responsive photocatalyst.

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Taguchi, Shigeru, Miyabi Asaoka, Eiko Hirokami, Noriko Hata, Hideki Kuramitz, Takanori Kawakami, and Ryuta Miyatake. "A simple and rapid method for simultaneous pre-concentration of eight trace-heavy-metals in water using 1-(2-pyridylazo)-2-naphthol and yttrium for X-ray fluorescence spectrometry." Analytical Methods 7, no. 16 (2015): 6545–51. http://dx.doi.org/10.1039/c5ay00657k.

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Maj, Kamila, and Ireneusz Kocemba. "Nanostructured forms of carbon deposit obtained during cracking of methane reaction over nanocrystalline iron catalysts." Adsorption Science & Technology 36, no. 1-2 (April 25, 2017): 493–507. http://dx.doi.org/10.1177/0263617417705471.

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During catalytic cracking of methane reaction, different carbon nanostructures can be formed. This paper shows the results of a characteristic nanostructured carbon deposit obtained during cracking of methane reaction over nanocrystalline iron catalysts with or without cobalt addition. The properties of the carbon deposit were determined by X-ray diffraction, scanning electron microscope with energy dispersive spectrometer equipment, thermogravimetry-differential thermal analysis coupled with mass spectrometry, time-of-flight secondary ion mass spectrometry analysis and surface area analysis (Brunauer-Emmett-Teller isotherm [BET]). Significant differences in the morphology and properties of the obtained carbon were found. The mechanism of the formation of carbon nanostructures for both iron catalysts is proposed.

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NAGASHIMA, Hitoshi, Shigeomi SATO, Mitsuharu OKANO, Tadashi MOCHIZUKI, Yutaka YOSHIOKA, and Manabu TANO. "Rapid Analysis of Steelmaking Slag by Energy-dispersive X-ray Fluorescence Spectrometry." Tetsu-to-Hagane 85, no. 2 (1999): 85–90. http://dx.doi.org/10.2355/tetsutohagane1955.85.2_85.

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Zaluzec, Nestor J. "Detector Solid Angle Formulas for Use in X-Ray Energy Dispersive Spectrometry." Microscopy and Microanalysis 15, no. 2 (March 16, 2009): 93–98. http://dx.doi.org/10.1017/s1431927609090217.

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AbstractWith the advent of silicon drift X-ray detectors, a range of new geometries has become possible in electron optical columns. Because of their compact size, these detectors can potentially achieve high geometrical collection efficiencies; however, using traditional approximations detector solid angle calculations rapidly break down and at times can yield nonphysical values. In this article we present generalized formulas that can be used to calculate the variation in detection solid angle for contemporary Si(Li) as well as new silicon drift configurations.

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