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Journal articles on the topic 'Energy dispersive X-ray spectra'

Author: Grafiati

Published: 4 June 2025

Last updated: 1 August 2025

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1

Rémond, Guy. "Spectral Deconvolution of Wavelength Dispersive X-RAY Spectra." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 112–13. http://dx.doi.org/10.1017/s0424820100134156.

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X-ray peaks frequently exhibit asymmetrical shape which may result either from the mechanisms of generation of X-ray photons or from instrumental spectral distortions. As a result a non-proportionality may occur between the observed and the true intensities of the analyzed emissions. An analytical description of the shape of an X-ray line must be used in a least-squares fitting procedure in order to derive the relative intensities from experimental spectra. The available models will be discussed taking into account the analyzed energy domain and the energy resolution of the spectrometer respec

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2

Yager, D. B., and J. E. Quick. "SUPERXAP- A Personal-Computer-Based Program for Energy-Dispersive X-Ray Spectra Analysis." Advances in X-ray Analysis 36 (1992): 17–25. http://dx.doi.org/10.1154/s0376030800018590.

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AbstractSUPERXAP (Super X-ray Analysis Program) enables IBM-compatible personal computers to analyze energy-dispersive spectra using least-squares spectral deconvolution. The program corrects for instrument drift, background, peak overlap, and matrix effects. Pull down menus provide 24 subroutines and functions, that allow spectra to be transferred, stored, viewed, manipulated, and analyzed. Spectral peaks can be identified manually or automatically with color-coded K, L or M lines. Working curves are developed using an interactive routine that creates standard files by least-squares fitting o

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3

Aiginger, H., M. Benedikt, and R. Görgl. "Energy Dispersive Measurement of X-Ray Tube Spectra." Advances in X-ray Analysis 39 (1995): 137–47. http://dx.doi.org/10.1154/s0376030800022540.

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A method for measuring spectral distributions of x-ray tubes directly with a solid-state detector is presented. Different anode materials (chromium, molybdenum, rhodium and tungsten) have been measured. Results for various applied voltages and take-off angles have been obtained.

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4

Wollman, D. A., Dale E. Newbury, G. C. Hilton, et al. "Microcalorimeter EDS Measurements of Chemical Shifts in Fe Compounds." Microscopy and Microanalysis 4, S2 (1998): 196–97. http://dx.doi.org/10.1017/s1431927600021103.

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We report measurements of chemical shifts in the Fe-L x-ray lines of different Fe compounds from xray emission spectra acquired using a microcalorimeter energy dispersive spectrometer (EDS). The observed changes in peak position and relative intensity of the Fe-L x-ray lines are in agreement with measurements obtained using a wavelength dispersive spectrometer (WDS), demonstrating the usefulness of microcalorimeter EDS for high-energy-resolution x-ray microanalysis.Chemical shifts result from changes in electron binding energies with the chemical environment of atoms. In x-ray spectra, chemica

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5

Saunders, M., E. S. K. Menon, D. J. Chisholm, and A. G. Fox. "Extracting Chemical Information From Energy-Dispersive X-Ray Spectra by Multivariate Statistical Analysis (MSA)." Microscopy and Microanalysis 4, S2 (1998): 204–5. http://dx.doi.org/10.1017/s1431927600021140.

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The introduction of Multivariate Statistical Analysis techniques such as Principal Component Analysis (PCA) to the study of EDS and EELS spectra has opened up new possibilities for processing spectral data. In conventional EDS analysis each spectrum provides information about the elemental composition of the sample at a specific probe position. Where the signal arises from a single phase this elemental composition corresponds to the chemical composition of the phase. However, where the probe is incident on a multiphase region of the sample it is impossible to make a direct identification of th

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6

Ritchie, N., D. Newbury, and A. Lindstrom. "Compton Scattering in Electron Excited Energy Dispersive X-ray Spectra." Microscopy and Microanalysis 16, S2 (2010): 1310–11. http://dx.doi.org/10.1017/s1431927610060137.

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7

Newbury, Dale E., and Robert L. Myklebust. "Determining Limits of Detection from Energy Dispersive X-ray Spectra." Microscopy and Microanalysis 9, S02 (2003): 28–29. http://dx.doi.org/10.1017/s1431927603440105.

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8

Fernández, J. E., and M. Sumini. "SHAPE: A computer simulation of energy-dispersive x-ray spectra." X-Ray Spectrometry 20, no. 6 (1991): 315–19. http://dx.doi.org/10.1002/xrs.1300200612.

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9

GERASIMOV, S. A. "A METHOD FOR IDENTIFICATION OF PEAKS IN ENERGY-DISPERSIVE X-RAY SPECTRA." International Journal of PIXE 04, no. 04 (1994): 259–62. http://dx.doi.org/10.1142/s0129083594000283.

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It is found that the ratio of X-ray energies of Kα and K β lines is approximately equal to the ratio of its peak positions in the spectrum. This result can be used for identificaion of peaks in experimental energy-dispersive X-ray spectra.

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10

Lu, Yun, and Joy David C. "Evaluation of particle effects in bremsstrahlung and in quantitative energy-dispersive x-ray microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (1992): 1678–79. http://dx.doi.org/10.1017/s0424820100133023.

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The magnitude and the spectral form of bremsstrahlung signal contains much information about the target and is significantly influenced by the surface irregularities. By computer modelling, it is possible to extract the information to perform more accurate quantitative x-ray microanalysis for specimens with special geometries. In this research, bremsstrahlung spectra obtained from electron beams striking at selected locations of spherical particles were investigated by Monte Carlo simulations and experimental observations. The effects of surface geometries and the x-ray path lengths in the spe

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11

Ritchie, Nicholas W. M. "Using DTSA-II to Simulate and Interpret Energy Dispersive Spectra from Particles." Microscopy and Microanalysis 16, no. 3 (2010): 248–58. http://dx.doi.org/10.1017/s1431927610000243.

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AbstractA high quality X-ray spectrum image of a 3.3 μm diameter sphere of K411 glass resting on a copper substrate was collected at 25 keV. The same sample configuration was modeled using the NISTMonte Monte Carlo simulation of electron and X-ray transport as is integrated into the quantitative X-ray microanalysis software package DTSA-II. The distribution of measured and simulated X-ray intensity compare favorably for all the major lines present in the spectra. The simulation is further examined to investigate the influence of angle-of-incidence, sample thickness, and sample diameter on the

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12

Dong, Yu-Hui, Jing Liu, Yan-Chun Li, and Xiao-Dong Li. "A full-pattern fitting algorithm for energy-dispersive X-ray diffraction." Journal of Applied Crystallography 36, no. 5 (2003): 1123–27. http://dx.doi.org/10.1107/s0021889803012597.

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A full-pattern fitting algorithm for energy-dispersive X-ray diffraction is proposed, especially for high-pressure X-ray diffraction studies. The algorithm takes into account the errors in measuring the energy and the diffraction angle. A lognormal function is introduced to represent the background. All the peaks that are detectable in the diffraction spectra, including fluorescence and diffraction peaks, are considered together. Because all the data points in the spectra are used, the accuracy of the cell parameters obtained by this method is very high. This is very helpful in the analysis of

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13

N., Kalaiselvi, and Madhu K.U. "Synthesis, Morphological, and Elemental Analysis of Pure and Tin Doped Chromium Oxide Nanoparticles." Indian Journal of Science and Technology 13, no. 6 (2020): 674–85. https://doi.org/10.17485/ijst/2020/v13i06/149428.

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Abstract <strong>Objectives:</strong> To synthesize the pure and tin doped chromium oxide nanoparticles and analyzing the structural, morphological, and elemental composition of the prepared samples. Methods: Sn<sup>2+</sup> doped chromium oxide (Cr<sub>2</sub>O<sub>3</sub>) nanoparticles are synthesized by microwave-assisted solvothermal method which is simple and cost effective. The pure as prepared sample was subjected to TG/DTA analysis. The impact of the added dopant (Sn<sup>2+</sup>) on the Cr<sub>2</sub>O<sub>3</sub> nanoparticles was investigated by X-ray diffraction pat

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Abe, Hiroshi, Hiroyuki Saitoh, Hironori Nakao, Kazuki Ito, and Ken-ichi Ohshima. "Energy spectrometer on a diffractometer using a charge-coupled device X-ray detector." Journal of Applied Crystallography 39, no. 5 (2006): 767–70. http://dx.doi.org/10.1107/s0021889806023144.

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A charge-coupled device (CCD) X-ray detector for inelastic X-ray scattering was installed at beamline BL-4C of the Photon Factory at the High Energy Accelerator Research Organization in Japan. A wavelength-dispersive X-ray spectrometer was mounted on a six-circle diffractometer. Energy spectra were obtained by the CCD X-ray detector and a curved highly oriented pyrolytic graphite analyser. By the combination of energy spectroscopy and diffraction, simultaneous real-time data acquisition of both the momentum and the energy transfer was performed.

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15

Myklebust, Robert L., and Dale E. Newbury. "Extracting Low Energy X-Ray Peaks From EDS and WDS Spectra." Microscopy and Microanalysis 4, S2 (1998): 218–19. http://dx.doi.org/10.1017/s1431927600021218.

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Interest in electron beam x-ray microanalysis with low incident beam energies, defined arbitrarily as 5 keV and below, has been greatly stimulated in recent years by the development of the high performance field emission gun scanning electron microscope (FEG-SEM), which can produce a nanometer-scale probe with sufficient current to operate with both energy dispersive (EDS) and wavelength dispersive (WDS) spectrometers. Microanalysis in this regime requires the analyst to confront new spectrometry problems that are not typically encountered, or that can be safely ignored, when operating with co

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16

Thomsen, Karsten Normann, Jette Nørgaard Pedersen, and Niels Pind. "Procedure for background estimation in energy-dispersive X-ray fluorescence spectra." Analytica Chimica Acta 184 (1986): 133–42. http://dx.doi.org/10.1016/s0003-2670(00)86476-4.

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17

Van Gysel, M., P. Lemberge, and P. Van Espen. "Description of Compton peaks in energy-dispersive x-ray fluorescence spectra." X-Ray Spectrometry 32, no. 2 (2003): 139–47. http://dx.doi.org/10.1002/xrs.628.

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18

Wiss, Thierry, Hartmut Thiele, Bert Cremer, and Ian Ray. "Internal Conversion in Energy Dispersive X-ray Analysis of Actinide-Containing Materials." Microscopy and Microanalysis 13, no. 3 (2007): 196–203. http://dx.doi.org/10.1017/s1431927607070365.

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The use of X-ray elemental analysis tools like energy dispersive X-ray (EDS) is described in the context of the investigation of nuclear materials. These materials contain radioactive elements, particularly alpha-decaying actinides that affect the quantitative EDS measurement by producing interferences in the X-ray spectra. These interferences originating from X-ray emission are the result of internal conversion by the daughter atoms from the alpha-decaying actinides. The strong interferences affect primarily the L X-ray lines from the actinides (in the typical energy range used for EDS analys

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19

AMARSINGH BHABU, K., J. DHIVYA SARANYA, and T. R. RAJASEKARAN. "PREPARATION AND CHARACTERIZATION OF Ce0.8Y0.2O2 NANOPOWDERS USING SOL-GEL METHOD." International Journal of Modern Physics: Conference Series 22 (January 2013): 533–44. http://dx.doi.org/10.1142/s2010194513010635.

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Nanopowders of Ce0.8Y0.2O2 were prepared by sol-gel via hydrolysis method for different hours. The prepared powders are characterized by powder X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), Scanning electron microscope (SEM) and analyzed by UV-visible spectroscopy, Photoluminescence (PL) and Energy dispersive X-ray analysis (EDAX). Cubic fluorite structure of the prepared samples was confirmed by powder X-ray diffraction and the grain size of the prepared samples in the range of 12 to 33 nm. The functional groups of the prepared nanopowders are identified by FTIR spe

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20

Chin, D. A., P. M. Nilson, D. Mastrosimone, et al. "High-resolution x-ray spectrometer for x-ray absorption fine structure spectroscopy." Review of Scientific Instruments 94, no. 1 (2023): 013101. http://dx.doi.org/10.1063/5.0125712.

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Two extended x-ray absorption fine structure flat crystal x-ray spectrometers (EFX’s) were designed and built for high-resolution x-ray spectroscopy over a large energy range with flexible, on-shot energy dispersion calibration capabilities. The EFX uses a flat silicon [111] crystal in the reflection geometry as the energy dispersive optic covering the energy range of 6.3–11.4 keV and achieving a spectral resolution of 4.5 eV with a source size of 50 μm at 7.2 keV. A shot-to-shot configurable calibration filter pack and Bayesian inference routine were used to constrain the energy dispersion re

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21

Wang, C. C., B. Y. Man, M. Liu, et al. "The Intrinsic Room-Temperature Ferromagnetism in ZnO:Co Thin Films Deposited by PLD." Advances in Condensed Matter Physics 2012 (2012): 1–5. http://dx.doi.org/10.1155/2012/363981.

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c-axis preferential orientated ZnO:Co thin films were synthesized onc-plane sapphire substrates by using pulsed laser deposition (PLD) technique in an oxygen-deficient ambient. X-ray diffraction spectra, scanning electron microscopy, X-ray photoelectron spectroscopy, energy dispersive spectroscopy, UV-vis transmittance spectra, and Raman spectra were used for characterization. Ferromagnetic behavior was clearly observed at room temperature and verified to be the intrinsic property of the material. The presence of second phase was ruled out.

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22

Markert, T. H. "Dispersive Spectroscopy on AXAF." International Astronomical Union Colloquium 115 (1990): 339–45. http://dx.doi.org/10.1017/s0252921100012550.

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AbstractThere are two transmission grating spectrometers and one Bragg crystal spectrometer being developed for the Advanced X-ray Astrophysics Facility (MIT is building the crystal spectrometer and one of the grating spectrometers; the Laboratory for Space Research in Utrecht is responsible for the other grating spectrometer). The gratings divide the AXAF energy band (80 eV – 10 keV) into three regions (the MIT instrument contains gratings with two different periods) and attain resolving powers for point sources between 100 and 1800. The gratings are composed of arrays of small facets mounted

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23

Hagelstein, Michael, Ulrich Lienert, Thorsten Ressler, et al. "A scattering filter for energy-dispersive optics." Journal of Synchrotron Radiation 5, no. 3 (1998): 753–55. http://dx.doi.org/10.1107/s0909049597015252.

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A filtering technique to remove parasitic scattering from X-ray absorption spectra that are acquired in energy-dispersive mode has been developed and tested at the European Synchrotron Radiation Facility. The improved set-up removes small-angle scattering of the sample or the windows of sample cells which may spoil the energy resolution or reduce the intensity of prominent features in the absorption spectrum, such as the white line at the Pt L III edge. The sample is placed behind the curved monochromator and between two plane perfect crystals in the Bonse–Hart configuration. The dispersion of

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24

Newbury, Dale E. "Electron probe x-ray microanalysis with energy-dispersive x-ray spectrometry: The basics of x-ray spectrum interpretation." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 376–77. http://dx.doi.org/10.1017/s0424820100169614.

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Electron probe x-ray microanalysis (EPMA) with energy dispersive x-ray spectrometry (EDS) provides the capability for detecting elements with atomic number ≥ 4 (beryllium) from an excited specimen volume with linear dimensions of micrometers and a mass in the picogram range. To maximize the utility of EPMA/EDS, the analyst needs to understand the rich source of information that is potentially available in the x-ray spectrum. At its most basic level, interpretation of the spectrum consists of recognizing and identifying the various components of the spectrum as recorded by the EDS system: chara

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25

Du, Zhen Ni, Yong Cai Zhang, Zhi You Xu, and Ming Zhang. "Hydrothermal Synthesis of Hexagonal Phase Zn_1-XMn_xS (x = 0–0.05) Nanorods Using Single-Source Precursors." Materials Science Forum 663-665 (November 2010): 100–103. http://dx.doi.org/10.4028/www.scientific.net/msf.663-665.100.

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The synthesis of hexagonal phase Zn1-xMnxS (x = 0–0.05) nanorods was achieved by hydrothermal treatment of zinc manganese diethyldithiocarbamates (Zn1-xMnx-(DDTC)2, x=0–0.05) in 40 mass % hydrate hydrazine aqueous solution at 180 °C for 12 h. The structure, composition and optical property of the obtained products were characterized by X-ray diffraction, energy dispersive X-ray spectroscopy, transmission electron microscopy and UV-vis diffuse reflectance spectra.

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TAMILSELVI, D., N. VELMANI, and K. RATHIDEVI. "EFFECT OF Ni-DOPING ON THE STRUCTURAL AND OPTICAL PROPERTIES OF ZnO NANOPARTICLES PREPARED BY CHEMICAL PRECIPITATION METHOD." Journal of Ovonic Research 16, no. 2 (2020): 123–30. http://dx.doi.org/10.15251/jor.2020.162.123.

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Undoped ZnO nano particles and Ni doped ZnO nanoparticles prepared by chemical precipitation method and assessed for their structural, morphological and optical properties. The prepared undoped and Ni doped ZnO nanoparticles were characterized by using X-ray diffraction (XRD), Fourier transform infrared spectral (FTIR), UV-Visible spectrophotometer, Scanning electron microscopy (SEM) and Energy Dispersive X-ray analysis (EDAX), Photoluminescence spectra (PL). XRD pattern shows the purity of prepared undoped and Ni doped ZnO nanoparticles size. Scanning electron microscopy (SEM) observations re

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TAMILSELVI, D., N. VELMANI, and K. RATHIDEVI. "EFFECT OF Ni-DOPING ON THE STRUCTURAL AND OPTICAL PROPERTIES OF ZnO NANOPARTICLES PREPARED BY CHEMICAL PRECIPITATION METHOD." Journal of Ovonic Research 16, no. 2 (2020): 123–30. http://dx.doi.org/10.15251/jor.2020.161.123.

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Undoped ZnO nano particles and Ni doped ZnO nanoparticles prepared by chemical precipitation method and assessed for their structural, morphological and optical properties. The prepared undoped and Ni doped ZnO nanoparticles were characterized by using X-ray diffraction (XRD), Fourier transform infrared spectral (FTIR), UV-Visible spectrophotometer, Scanning electron microscopy (SEM) and Energy Dispersive X-ray analysis (EDAX), Photoluminescence spectra (PL). XRD pattern shows the purity of prepared undoped and Ni doped ZnO nanoparticles size. Scanning electron microscopy (SEM) observations re

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Yang, Lin Lin, Yong Gang Wang, Xiao Feng Wang, Yu Jiang Wang, and Gao Rong Han. "Hydrothermal Synthesis and Characterization of PbTiO₃ Microrods." Advanced Materials Research 148-149 (October 2010): 903–6. http://dx.doi.org/10.4028/www.scientific.net/amr.148-149.903.

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PbTiO3 microrods were successfully synthesized via a surfactants-free hydrothermal method. The powders were characterized by X-ray powder diffraction (XRD), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), and photoluminescent spectra techniques (PL). It was found that the precursor played a key role in the formation of PbTiO3 microrods.

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29

Bruley, J., and P. Flaitz. "Energy Dispersive X-Ray (EDX) and Electron Energy-Loss (EELS) Spectroscopic Mapping of Microelectronic Devices." Microscopy and Microanalysis 6, S2 (2000): 1050–51. http://dx.doi.org/10.1017/s1431927600037740.

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Many crucial measurements in the semiconductor industry involve determining the root cause of an electrical failure, often requiring the capability of extracting microstructural and chemical information with nanometer resolution [1]. The microanalysis is achieved by stepping the focused probe over the region of interest in STEM mode and recording an EDX and EELS spectrum at each pixel. Even for relatively modest image sizes, the resultant spectrum-image may consist of more than 10,000 spectra. With such large data sets, the prospect of manually inspecting and quantifying each spectrum in real-

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Kantor, Innokenty, Jean-Claude Labiche, Emmanuel Collet, et al. "A new detector for sub-millisecond EXAFS spectroscopy at the European Synchrotron Radiation Facility." Journal of Synchrotron Radiation 21, no. 6 (2014): 1240–46. http://dx.doi.org/10.1107/s1600577514014805.

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A new FReLoN (Fast-Readout Low-Noise) high-frame-rate detector adopted for the fast continuous collection of X-ray absorption spectra is presented. The detector is installed on the energy-dispersive X-ray absorption beamline ID24 at the ESRF and is capable of full time-resolved EXAFS spectra collection with over 4 kHz repetition rate and 0.2 ms exposure time. An example of thein situkinetic study of the high-temperature oxidation of metallic iron is presented.

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Ageev, Evgeny V., Oxana G. Loktionova, Sergey V. Pikalov, and Valeryi I. Kolmykov. "X-ray spectral microanalysis of W-Ni-Fe pseudoalloy obtained from electroerosive powders." MATEC Web of Conferences 344 (2021): 01001. http://dx.doi.org/10.1051/matecconf/202134401001.

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The results of X-ray spectral microanalysis of W-Ni-Fe pseudo-alloy, obtained from electroerosive powders, are presented. Consolidation of the obtained electroerosive powders was carried out by the method of spark plasma sintering using the SPS 25-10 spark plasma sintering system. Using an EDAX energy-dispersive X-ray analyzer built into a Quanta 600 FEG scanning electron microscope, characteristic X-ray spectra were obtained at various points on the sample surface and along a transverse section. As a result of the study, it was found that on the surface of the investigated sintered sample, tu

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McCarthy, Jon J., and David J. McMillan. "Application of X-ray Optics to Energy-Dispersive Spectroscopy." Microscopy and Microanalysis 4, no. 6 (1998): 632–41. http://dx.doi.org/10.1017/s1431927698980618.

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X-ray optics have been used in X-ray analytical instruments for several years. Applications of X-ray optics have been reported in X-ray diffraction, X-ray fluorescence, and wavelength dispersive spectroscopy. X-ray optics have been used to increase the X-ray flux incident on the sample or to direct and focus emitted X-rays from a sample. We report here the use of a grazing incidence optic (GIO) as a flux-enhancing collimator for use with an energy-dispersive (ED) detector used to perform electron beam microanalysis. We found that the GIO in combination with an ED spectrometer (EDS) provides su

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Anderson, I. M. "Edx Spectrum Imaging of Bulk Specimens: Its Role in Quantitative X-Ray Microanalysis." Microscopy and Microanalysis 7, S2 (2001): 704–5. http://dx.doi.org/10.1017/s1431927600029597.

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Energy-dispersive X-ray (EDX) spectrum imaging, where a full spectrum is acquired at each pixel in a rastered image, combines the advantages of imaging and analysis for quantitative compositional mapping. This method has great advantages for the analysis of compositional variations, because the contrast inherent in EDX spectrum images arises from the distinctiveness of the characteristic X-ray spectra in various regions of the surveyed microstructure. EDX spectrum imaging provides for simultaneous spatial, spectral and temporal resolution of the X-rays emitted from the specimen. Many EDX manuf

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Newbury, Dale E. "Basic literacy in electron-excited x-ray microanalysis." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 502–3. http://dx.doi.org/10.1017/s0424820100148344.

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Electron beam x-ray microanalysis with energy dispersive x-ray spectrometry (EDS), as performed in electron probe microanalyzers (EPMA)/scanning electron microscopes (SEM) for thick specimens and analytical electron microscopes (AEM) for thin sections, is a powerful technique with wide applicability in the physical and biological sciences and technology communities. The operation of an EDS x-ray microanalysis system has been automated to the point that many users now consider EDS to be a routine tool where the results reported by the automation system are always correct Unfortunately, there ar

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Toyama, S., S. Matsuyama, K. Ishii та ін. "Development of a WDX-μ-PIXE system for chemical state mapping". International Journal of PIXE 24, № 03n04 (2014): 111–20. http://dx.doi.org/10.1142/s012908351440004x.

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In this paper, we have developed a wavelength dispersive X-ray spectrometer microparticle-induced X-ray emission (WDX-[Formula: see text]-PIXE) system combining a microbeam system with high spatial resolution and wavelength dispersive X-ray (WDX) spectrometry with high-energy resolution for chemical state mapping. A Von Hamos geometry was used for the WDX system to achieve higher detection efficiency and energy resolution. The system consists of a curved crystal and a CCD camera. The WDX system was installed in a newly developed microbeam system. The energy resolution of the WDX system was 0.6

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Preeti, Rao, and Mittal Raj. "Nutrient X-Ray Energy Shift Studies in Wheat Plants and Soils." Asian Journal of Physical and Chemical Sciences 2, no. 2 (2017): 1–11. https://doi.org/10.9734/AJOPACS/2017/33674.

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<strong>Aims: </strong>To check the effect of soil environment on chemistry of potassium and calcium nutrients in wheat plants with varying soil conditions. <strong>Study Design:</strong> Energy Dispersive X-ray Fluorescence (EDXRF) measurements on plant/soil samples. Study of fluorescent X-ray spectra and data processing to calculate shift in photo peak energies of nutrients. <strong>Place and Duration of Study:</strong> XRF laboratory, Nuclear science laboratories, Physics Department, Punjabi University, Patiala during December 2013-March 2014. <strong>Methodology:</strong> A pot experiment

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OYEYINKA, Barnabas O., and Anthony J. AFOLAYAN. "Ultrastructure and energy dispersive spectroscopy-based elemental analysis of the fruit exocarps of Musa sinensis L. (Banana) and Musa paradisiaca L. (Plantain) (Musaceae)." Notulae Botanicae Horti Agrobotanici Cluj-Napoca 49, no. 3 (2021): 12262. http://dx.doi.org/10.15835/nbha49312262.

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Ultrastructural investigation and analysis of the elemental spectra composition of Musa sinensis L. and Musa paradisiaca L. exocarp (peels) was carried out using the Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray (EDX) respectively. Microstructures such as interlocked, polyhedral epidermal cells, ellipsoid-shaped stomata, guard cells, intercellular space, anticlinal-patterned walls and subsidiary cells were observed, with direct and indirect implications in the deposition of important primary and secondary metabolites, thus connoting some medicinal significance. Furthermore, th

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Anderson, Ian M., and John A. Small. "Multivariate Statistical Analysis of Particle X-ray Spectra." Microscopy and Microanalysis 4, S2 (1998): 202–3. http://dx.doi.org/10.1017/s1431927600021139.

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Multivariate statistical analysis (MSA) is a powerful tool for the analysis of series of spectra. This paper explores an application of MSA to a series of energy dispersive X-ray (EDX) spectra acquired in the scanning electron microscope (SEM) from a series of particles. The raw data were series of spectra previously acquired to test analytical procedures for trace element detection. This paper explores the possibility of performing the trace element detection with MSA components that have been extracted from the raw data without any a priori assumptions about the information content of the pa

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Nayak, Chandrani, D. Bhattacharyya, K. Bhattacharyya, et al. "Insight into growth of Au–Pt bimetallic nanoparticles: anin situXAS study." Journal of Synchrotron Radiation 24, no. 4 (2017): 825–35. http://dx.doi.org/10.1107/s1600577517006257.

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Au–Pt bimetallic nanoparticles have been synthesized through a one-pot synthesis route from their respective chloride precursors using block copolymer as a stabilizer. Growth of the nanoparticles has been studied by simultaneousin situmeasurement of X-ray absorption spectroscopy (XAS) and UV–Vis spectroscopy at the energy-dispersive EXAFS beamline (BL-08) at Indus-2 SRS at RRCAT, Indore, India.In situXAS spectra, comprising both X-ray near-edge structure (XANES) and extended X-ray absorption fine-structure (EXAFS) parts, have been measured simultaneously at the Au and PtL3-edges. While the XAN

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Cesareo, Roberto, and Antonio Brunetti. "Metal sheets thickness determined by energy-dispersive X-ray fluorescence analysis." Journal of X-Ray Science and Technology: Clinical Applications of Diagnosis and Therapeutics 16, no. 2 (2008): 119–30. http://dx.doi.org/10.3233/xst-2008-00196.

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A portable EDXRF equipment was employed to analyze pre-Columbian metals (gold, silver and copper objects) and to determine the thickness of gold in the case of gildings. To this aim, the EDXRF equipment was optimized to detect Cu, Au and Ag, and various methods were developed to determine from X-ray spectra (K-lines ratio) the thickness of the gildings. These methods were first tested to measure gilding compositions and thicknesses of pens and decorative objects. Then pre-Columbian metals were analyzed, such as gold, silver, copper, gilded copper and gilded silver objects from the Royal Tomb o

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Shyu, Yow-Chyun, Min Han Lin, Shang-Ren Lin, et al. "Fabrication of ZnO Nanorods on Silicon Substrates by Sol-gel Hyrdothermal Methods." Journal of New Materials for Electrochemical Systems 18, no. 2 (2015): 083–86. http://dx.doi.org/10.14447/jnmes.v18i2.373.

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ZnO nanorods were deposited on silicon substrate using sol-gel hydrothermal methods. The seed layer was first grown by sol-gel methods and then annealed at temperatures of 300ºC, 400ºC, 500ºC and 600ºC. Multiple material and optical analyses including field-emission scanning electron microscope, energy dispersive X-ray spectroscopy, X-ray diffraction, photoluminescence spectra, and Raman spectra were conducted to examine the growth orientation and material properties. Results indicate that the ZnO nanorods annealed at a proper temperature of 400ºC could enhance orientation and material quality

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Tamilselvi, R., and A. Thirumoorthi. "Antifungal and visible light driven photocatalytic degradation of Brilliant green dye by Ceria–Zirconia Nanocomposites." Journal of Optoelectronic and Biomedical Materials 16, no. 2 (2024): 99–113. http://dx.doi.org/10.15251/jobm.2024.162.99.

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Green synthesis is a simple, eco-friendly and emerging approach of synthesizing CeriaZirconia nanocomposites (CZ NCs) and evaluates its performance for the photocatalytic treatment of industrial waste water. Ceria-Zirconia NCs were synthesized using leaf extracts of Jatropha gossypiifolia L. for the application towards photocatalytic degradation of Brilliant Green (BG) dye under visible light irradiation. The Ceria-Zirconia NCs were characterized by Fourier Transform Infrared (FT-IR) spectrometer, UV-Visible spectrophotometer, X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM) equippe

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Elam, W. T., Bob Shen, Bruce Scruggs, and Joseph Nicolosi. "Full spectrum calculations of EDXRF spectra." Powder Diffraction 21, no. 2 (2006): 152–55. http://dx.doi.org/10.1154/1.2204066.

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Rapid and accurate methods are becoming available to calculate all of the relevant physical effects that contribute to an energy-dispersive X-ray fluorescence (EDXRF) spectrum, rather than just the characteristic line intensities given by the traditional fundamental parameters method. To evaluate the utility of such methods, we have calculated the full spectra of several compounds covering a wide range of compositions. The calculated spectra are compared directly with measured spectra. They include scattering of the X-ray tube lines and continuum, the Compton profile, and the detector response

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Seely, John F. "Hard x-ray spectrometer calibrations using a portable 120 kV x-ray source." Review of Scientific Instruments 93, no. 9 (2022): 093529. http://dx.doi.org/10.1063/5.0099178.

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A Cauchois transmission-crystal hard x-ray spectrometer was calibrated by using a portable, compact, battery-powered tungsten x-ray source having 120 peak kilovoltage. The source emission region was characterized by recording high-resolution 2D x-ray images and was found to be composed of three emission regions having a 400 µm overall extent. The absolutely calibrated source fluence was measured by using a calibrated silicon drift detector and was in good agreement with the spectrum calculated by the SpekPy code. High-resolution spectra of the W Kα and Kβ lines in the 57–70 keV energy range we

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Lane, David W., Antony Nyombi, and James Shackel. "Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system." Journal of Applied Crystallography 47, no. 2 (2014): 488–94. http://dx.doi.org/10.1107/s1600576714000314.

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A method for energy-dispersive X-ray diffraction mapping is presented, using a conventional low-power benchtop X-ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X-ray maps with a 10 µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X-rays. The maps showed that the crystallites in the Bi pellet were larger th

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Kotula, Paul G., Michael R. Keenan, and Joseph R. Michael. "Automated Analysis of SEM X-Ray Spectral Images: A Powerful New Microanalysis Tool." Microscopy and Microanalysis 9, no. 1 (2003): 1–17. http://dx.doi.org/10.1017/s1431927603030058.

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Spectral imaging in the scanning electron microscope (SEM) equipped with an energy-dispersive X-ray (EDX) analyzer has the potential to be a powerful tool for chemical phase identification, but the large data sets have, in the past, proved too large to efficiently analyze. In the present work, we describe the application of a new automated, unbiased, multivariate statistical analysis technique to very large X-ray spectral image data sets. The method, based in part on principal components analysis, returns physically accurate (all positive) component spectra and images in a few minutes on a sta

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Alvisi, Marco, Markus Blome, Michael Griepentrog, et al. "The Determination of the Efficiency of Energy Dispersive X-Ray Spectrometers by a New Reference Material." Microscopy and Microanalysis 12, no. 5 (2006): 406–15. http://dx.doi.org/10.1017/s1431927606060557.

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A calibration procedure for the detection efficiency of energy dispersive X-ray spectrometers (EDS) used in combination with scanning electron microscopy (SEM) for standardless electron probe microanalysis (EPMA) is presented. The procedure is based on the comparison of X-ray spectra from a reference material (RM) measured with the EDS to be calibrated and a reference EDS. The RM is certified by the line intensities in the X-ray spectrum recorded with a reference EDS and by its composition. The calibration of the reference EDS is performed using synchrotron radiation at the radiometry laborato

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Jeremic, Dejan, Ljubica Andjelkovic, Milica Milenkovic, et al. "One-pot combustion synthesis of nickel oxide and hematite: From simple coordination compounds to high purity metal oxide nanoparticles." Science of Sintering 52, no. 4 (2020): 481–90. http://dx.doi.org/10.2298/sos2004481j.

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This work is the first report of a very simple and fast one-pot synthesis of nickel oxide (NiO) and hematite (?-Fe2O3) nanoparticles by thermal decomposition of transition metal aqua complexes with camphor sulfonate anions. Obtained nanopowders were characterized by X-ray powder diffraction, Fourier transform IR analysis, scanning electron microscopy, and Energy-dispersive X-ray spectroscopy. X-ray powder diffraction confirmed the formation of high purity NiO and ?-Fe2O3 crystal phases. In the case of ?-Fe2O3, about five times larger average crystallite size was obtained. Fourier transform IR

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Rao, J. C., M. Song, K. Mitsuishi, M. Takeguchi, and K. Furuya. "Electric field influence on emission of characteristic X-ray from Al2O3 targets bombarded by slow Xe+ ions." Powder Diffraction 21, no. 2 (2006): 156–57. http://dx.doi.org/10.1154/1.2204957.

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Low energy characteristic X-ray emission from Al2O3 monocrystalline specimens is measured under bombardment of 100 keV Xe+ ions. The electric field influence on emission of the X-rays of constitute elements in the specimens was investigated. The energy dispersive X-ray spectroscopy spectra show that the characteristic X-ray of Al-Kα seems to be depressed by the applied dc voltages, while the peak intensity of O-Kα was not notably influenced. The O-Kα peaks were broadened and the total counts increased as a higher dc bias was applied. It is possible that a dc electric field parallel to the targ

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Rathi, Monika, S. P. Ahrenkiel, J. J. Carapella, and M. W. Wanlass. "A Standards-Based Method for Compositional Analysis by Energy Dispersive X-Ray Spectrometry Using Multivariate Statistical Analysis: Application to Multicomponent Alloys." Microscopy and Microanalysis 19, no. 1 (2013): 66–72. http://dx.doi.org/10.1017/s1431927612013761.

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AbstractGiven an unknown multicomponent alloy, and a set of standard compounds or alloys of known composition, can one improve upon popular standards-based methods for energy dispersive X-ray (EDX) spectrometry to quantify the elemental composition of the unknown specimen? A method is presented here for determining elemental composition of alloys using transmission electron microscopy–based EDX with appropriate standards. The method begins with a discrete set of related reference standards of known composition, applies multivariate statistical analysis to those spectra, and evaluates the compo

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