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Books on the topic 'Failure analysis of medical devices'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

1941-, Mitchell M. R., Jerina Kenneth L, and ASTM International, eds. Fatigue and fracture of medical metallic materials and devices. ASTM International, 2007.

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2

Reliable design of medical devices. 3rd ed. CRC Press, 2013.

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3

Safety evaluation of medical devices. Marcel Dekker, 1997.

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4

Safety evaluation of medical devices. 2nd ed. M. Dekker, 2002.

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5

Reliable design of medical devices. 2nd ed. Taylor&Francis, 2005.

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6

Reliable design of medical devices. Marcel Dekker, 1997.

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7

Fries, Richard C. Reliable design of medical devices. 2nd ed. Taylor & Francis, 2006.

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8

Fries, Richard C. Reliable design of medical devices. 2nd ed. CRC/Taylor & Francis, 2004.

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9

A, Sheff Richard, ed. The step-by-step guide to failure modes and effects analysis. Opus Communications, 2002.

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10

International, ASTM, ed. Mobile bearing total knee replacement devices. ASTM International, 2012.

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11

Elandt-Johnson, Regina C. Survival models and data analysis. Wiley, 1999.

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12

Mitchell, M. R. (Michael R.), 1941- editor of compilation, Smith, Stephen W. (Stephen William), 1965- editor of compilation, Woods, Terry, 1960- editor of compilation, Berg, Brian, 1958- editor of compilation, and ASTM International, eds. Fatigue and fracture of medical metallic materials and devices. ASTM International, 2014.

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13

Joel, Morganroth, and Moore E. Neil, eds. Congestive heart failure: Proceedings of the Symposium on New Drugs and Devices, October 30-31, 1986, Philadelphia, Pennsylvania. Nijhoff, 1987.

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14

Gad, Shayne C. Safety evaluation in the development of medical devices and combination products. Informa Healthcare USA, 2008.

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15

Kurtz, Steven M., 1968- editor of compilation, Greenwald, A. Seth., editor of compilation, Mihalko, William M., editor of compilation, Lemons, Jack E., editor of compilation, and ASTM International, eds. Metal-on-metal total hip replacement devices. ASTM International, 2013.

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16

Modelling survival data in medical research. Chapman & Hall, 1994.

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17

Modelling survival data in medical research. 2nd ed. Chapman & Hall/CRC, 2003.

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18

LeBlanc, Michael R. Step-function covariate effects in the proportional hazards model. University of Toronto, Department of Statistics, 1993.

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19

European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis (7th 1996 Enschede, The Netherlands). Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics, and Analysis: 8-11 October 1996, Enschede, The Netherlands. Pergamon, 1996.

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20

Interval-censored time-to-event data: Methods and applications. Chapman and Hall/CRC, 2012.

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21

Evans, Roger W. Cost and outcome analysis of kidney transplantation: The implications of initial immunosuppressive protocol and diabetes : final report. Battelle Human Affairs Research Centers, Health and Population Research Center, 1989.

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22

Virginia. Department of Medical Assistance Services. Estimated glomerular filtration rate reporting among clinical laboratory providers: Report of the Virginia Department of Medical Assistance Services to the Governor and the General Assembly of Virginia. Commonwealth of Virginia, 2007.

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23

Cristiano, Paggetti, Nugent Chris, Mokhtari Mounir, and SpringerLink (Online service), eds. Impact Analysis of Solutions for Chronic Disease Prevention and Management: 10th International Conference on Smart Homes and Health Telematics, ICOST 2012, Artiminio, Italy, June 12-15, 2012. Proceedings. Springer Berlin Heidelberg, 2012.

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24

ASM Failure Analysis Case Histories: Medical and Biomedical Devices. ASM International, 2019. http://dx.doi.org/10.31399/asm.fach.med.9781627082266.

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25

Press, Dyadem, ed. Guidelines for failure modes and effects analysis for medical devices. CRC Press, 2003.

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26

Donovan, Chester D. Medical Devices and Equipment: Standards, Design, Failure and Safety : Medical Subject Analysis and Research Index With Bibliography. Abbe Pub Assn of Washington Dc, 1985.

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27

Davis, Erin, Michael E. Wiklund, and Andrea M. Dwyer. Medical Device Use Error: Root Cause Analysis. Taylor & Francis Group, 2015.

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28

(Editor), S. Lori Brown, Roselie A. Bright (Editor), and Dale R. Tavris (Editor), eds. Medical Device Epidemiology and Surveillance. Wiley, 2007.

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29

Lori, Brown S., Bright Roselie A, and Tavris Dale R, eds. Medical device epidemiology and surveillance. John Wiley & Sons, 2007.

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30

Miller, Brett A., Roch J. Shipley, Ronald J. Parrington, and Daniel P. Dennies, eds. Analysis and Prevention of Component and Equipment Failures. ASM International, 2021. http://dx.doi.org/10.31399/asm.hb.v11a.9781627083294.

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Abstract:

Volume 11A provides information and insights on the factors that determine the useful service life of engineering components and the likely timing and mode of failure. It addresses nearly every stage of the product lifecycle from materials selection and design to manufacturing, operation, maintenance, and repair. It explains how to use life assessment methods to evaluate the effect of corrosion, fatigue, brittle fracture, elevated temperature, and other forms of damage. It also includes a section that examines the effects of casting, forming, welding, heat treating, and other manufacturing pro

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31

C, Portnoy Robert, ed. Medical plastics: Degradation resistance & failure analysis. Plastic Design Library, 1998.

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32

Gad, Shayne C. Safety Evaluation of Medical Devices. 2nd ed. CRC, 2001.

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33

Blass, Colin R. Polymers in Disposable Medical Devices (Rapra Industry Analysis Report). Rapra Technology Ltd, 1999.

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34

New Approaches To Image Processing Based Failure Analysis Of Nanoscale Ulsi Devices. Elsevier - Health Sciences Division, 2013.

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35

Portnoy, Robert C. Medical Plastics: Degradation Resistance and Failure Analysis (SPE/ PDL Series). Plastics Design Library, 1998.

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36

1996 European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (Esref. Ieee, 1997.

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37

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices. Elsevier, 2014. http://dx.doi.org/10.1016/c2013-0-06953-8.

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38

United States. National Aeronautics and Space Administration., ed. Mechanical system reliability and cost integration using a sequential linear approximation method. National Aeronautics and Space Administration, 1997.

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39

United States. National Aeronautics and Space Administration., ed. Mechanical system reliability and cost integration using a sequential linear approximation method. National Aeronautics and Space Administration, 1997.

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40

United States. National Aeronautics and Space Administration., ed. Mechanical system reliability and cost integration using a sequential linear approximation method. National Aeronautics and Space Administration, 1997.

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41

United States. Congress. Office of Technology Assessment. Health Program., ed. Inventors' vignettes: Success and failure in the development of medical devices : contractor documents. Health Program, Office of Technology Assessment, U.S. Congress, 1986.

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42

P, Bovens M. A., Hart Paul 't, and Peters B. Guy, eds. Success and failure in public governance: A comparative analysis. Edward Elgar, 2001.

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43

Failure Modes and Effect Analysis: Templates and Tools to Improve Patient Safety. HCPro Inc., 2007.

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44

Fantini, F., and M. Vanzi. Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. Pergamon, 2002.

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45

Balk, L. J., and E. Wolfgang. Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. PERGAMON PRESS, 2000.

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46

Fantini, F., and M. Vanzi. Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. Pergamon, 2002.

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47

Proceedings of the 13th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. Pergamon Pr, 2002.

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48

Balk, L. J., E. Wolfgang, and W. H. Gerling. Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. Pergamon, 2000.

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49

Balk, L. J. Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis. Edited by L. J. Balk. PERGAMON PRESS, 2000.

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50

(Editor), N. Labat, and A. Touboul (Editor), eds. Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF'99). Pergamon Pr, 1999.

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