Journal articles on the topic 'Four probe method'
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HASEGAWA, SHUJI, ICHIRO SHIRAKI, FUHITO TANABE, REI HOBARA, TAIZO KANAGAWA, TAKEHIRO TANIKAWA, IWAO MATSUDA, et al. "ELECTRICAL CONDUCTION THROUGH SURFACE SUPERSTRUCTURES MEASURED BY MICROSCOPIC FOUR-POINT PROBES." Surface Review and Letters 10, no. 06 (December 2003): 963–80. http://dx.doi.org/10.1142/s0218625x03005736.
Full textIshikawa, Makoto, Masamichi Yoshimura, and Kazuyuki Ueda. "Null method for four-point probe measurement using high resistance probes." e-Journal of Surface Science and Nanotechnology 4 (2006): 115–17. http://dx.doi.org/10.1380/ejssnt.2006.115.
Full textMa, D., Y. Sun, M. Wang, and Y. Gao. "Three-dimensional numerical modeling of a four-pin probe for soil water content." Soil Research 44, no. 2 (2006): 183. http://dx.doi.org/10.1071/sr05116.
Full textYamashita, Masato, Toshifumi Nishii, and Hiroya Mizutani. "Resistivity Measurement by Dual-Configuration Four-Probe Method." Japanese Journal of Applied Physics 42, Part 1, No. 2A (February 15, 2003): 695–99. http://dx.doi.org/10.1143/jjap.42.695.
Full textPetersen, Dirch H., Ole Hansen, Rong Lin, and Peter F. Nielsen. "Micro-four-point probe Hall effect measurement method." Journal of Applied Physics 104, no. 1 (July 2008): 013710. http://dx.doi.org/10.1063/1.2949401.
Full textYamashita, M. "Resistivity correction factor for the four-probe method." Journal of Physics E: Scientific Instruments 20, no. 12 (December 1987): 1454–56. http://dx.doi.org/10.1088/0022-3735/20/12/003.
Full textYamashita, M. "Resistivity correction factor for the four-probe method." Journal of Physics E: Scientific Instruments 21, no. 5 (May 1988): 508. http://dx.doi.org/10.1088/0022-3735/21/5/520.
Full textChen, Xi, Changku Sun, Changjie Liu, and Luhua Fu. "A Four-Probe Method Using Different Probe Spacings for Measurement and Exact Reconstruction of Parallel Profiles." Applied Sciences 9, no. 23 (November 30, 2019): 5216. http://dx.doi.org/10.3390/app9235216.
Full textHu, Ying, Li Bai, Linna Zhao, Lingling Wu, Hong Lv, Qiongqiong Li, Xinpeng Li, et al. "Standardized Shiga-Toxin Encoding Genes Real-Time PCR Screening Methods Comparison and Development of an Internally Controlled Assay for Pan-stx2 Detection." Journal of AOAC INTERNATIONAL 104, no. 4 (March 16, 2021): 1065–71. http://dx.doi.org/10.1093/jaoacint/qsab030.
Full textYu, Kwang Min, Jeon Hong Kang, Han Jun Kim, Kwon Soo Han, and Je Cheon Ryu. "Uncertainty Improvements of Metallic Resistivity Measurements by the Four-Point Probe Method." Key Engineering Materials 321-323 (October 2006): 1470–74. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1470.
Full textKim, Jaehyun, Eric Ou, Daniel P. Sellan, and Li Shi. "A four-probe thermal transport measurement method for nanostructures." Review of Scientific Instruments 86, no. 4 (April 2015): 044901. http://dx.doi.org/10.1063/1.4916547.
Full textYamashita, Masato, Toshifumi Nishii, Atsushi Iwata, Hiroshi Kurihara, and Nobuo Tanaka. "Resistivity Correction Factor for the Four-Ring Probe Method." Japanese Journal of Applied Physics 32, Part 1, No. 1A (January 15, 1993): 246–51. http://dx.doi.org/10.1143/jjap.32.246.
Full textYamashita, Masato, and Hideo Enjoji. "Resistivity Correction Factor for the Four-Circular-Probe Method." Japanese Journal of Applied Physics 28, Part 1, No. 2 (February 20, 1989): 258–62. http://dx.doi.org/10.1143/jjap.28.258.
Full textSitaram, N., and A. L. Treaster. "A Simplified Method of Using Four-Hole Probes to Measure Three-Dimensional Flow Fields." Journal of Fluids Engineering 107, no. 1 (March 1, 1985): 31–35. http://dx.doi.org/10.1115/1.3242436.
Full textChung, Hye Yoon, Miyoung Kim, Cha Ja See, Hyun Jung Min, Sung-Soo Yoon, Han Ik Cho, and Dong Soon Lee. "FISH Analysis of IgH Rearrangement by 4 Kinds of Probes Involving IgH Genes in Multiple Myeloma: Improved Sensitivity for the Detection by Use of IGH Break-Apart Probe." Blood 110, no. 11 (November 16, 2007): 4134. http://dx.doi.org/10.1182/blood.v110.11.4134.4134.
Full textYamashita, Masato, Shoji Yamaguchi, and Hideo Enjoji. "Resistivity Correction Factor for the Four-Probe Method: Experiment I." Japanese Journal of Applied Physics 27, Part 1, No. 5 (May 20, 1988): 869–70. http://dx.doi.org/10.1143/jjap.27.869.
Full textYamashita, Masato, Shoji Yamaguchi, Toshifumi Nishii, Hiroshi Kurihara, and Hideo Enjoji. "Resistivity Correction Factor for the Four-Probe Method: Experiment II." Japanese Journal of Applied Physics 28, Part 1, No. 5 (May 20, 1989): 949–50. http://dx.doi.org/10.1143/jjap.28.949.
Full textWaremra, Richard S., and Philipus Betaubun. "Analysis of Electrical Properties Using the four point Probe Method." E3S Web of Conferences 73 (2018): 13019. http://dx.doi.org/10.1051/e3sconf/20187313019.
Full textYamashita, Masato, Toshifumi Nishi, Hiroshi Kurihara, Hideo Enjoji, and Atsushi Iwata. "Resistivity Correction Factor for the Four-Probe Method: Experiment III." Japanese Journal of Applied Physics 29, Part 1, No. 4 (April 20, 1990): 776–78. http://dx.doi.org/10.1143/jjap.29.776.
Full textShen, Xiuzhong, and Hideo Nakamura. "Local interfacial velocity measurement method using a four-sensor probe." International Journal of Heat and Mass Transfer 67 (December 2013): 843–52. http://dx.doi.org/10.1016/j.ijheatmasstransfer.2013.08.064.
Full textAn, Dong, Qian Zhang, Yanhao Liu, Ying Xu, Meng Shao, Sainan Wang, and Peng Zhou. "Shaft system profile reconstruction method based on L-shaped axial four-probe method." Measurement Science and Technology 32, no. 11 (August 20, 2021): 115030. http://dx.doi.org/10.1088/1361-6501/ac1614.
Full textLiu, Xin Fu, and Zhi Hui Zhu. "Influence Study of Sheet Resistance Measurement Errors by Square Four Probes." Applied Mechanics and Materials 734 (February 2015): 125–28. http://dx.doi.org/10.4028/www.scientific.net/amm.734.125.
Full textKang, Jeon-Hong, Kwang-Min Yu, Kung-Wan Koo, and Sang-Ok Han. "Precision Measurement of Silicon Wafer Resistivity Using Single-Configuration Four-Point Probe Method." Transactions of The Korean Institute of Electrical Engineers 60, no. 7 (July 1, 2011): 1434–37. http://dx.doi.org/10.5370/kiee.2011.60.7.1434.
Full textBaek, Sang-Woo, Nahm-Gyoo Cho, and Min-Han Bae. "On-machine Measurement of Precision Cylindrical Parts Using Four Probe Method." Journal of the Korean Society of Manufacturing Technology Engineers 29, no. 3 (June 15, 2020): 155–62. http://dx.doi.org/10.7735/ksmte.2020.29.3.155.
Full textYamashita, Masato. "Resistivity Correction Factor for Four-Probe Method on Circular Semiconductors II." Japanese Journal of Applied Physics 27, Part 1, No. 7 (July 20, 1988): 1317–21. http://dx.doi.org/10.1143/jjap.27.1317.
Full textYamashita, Masato. "Resistivity Correction Factor for Four-Probe Method on Circular Semiconductors I." Japanese Journal of Applied Physics 26, Part 1, No. 9 (September 20, 1987): 1550–54. http://dx.doi.org/10.1143/jjap.26.1550.
Full textVANDAMME, L. K. J., and G. LEROY. "ANALYTICAL EXPRESSIONS FOR CORRECTION FACTORS FOR NOISE MEASUREMENTS WITH A FOUR-POINT PROBE." Fluctuation and Noise Letters 06, no. 02 (June 2006): L161—L178. http://dx.doi.org/10.1142/s0219477506003264.
Full textPark, Douglas L., Thomas B. Whitaker, Francis G. Giesbrecht, and Henry Njapau. "Performance of Three Pneumatic Probe Samplers and Four Analytical Methods Used to Estimate Aflatoxins in Bulk Cottonseed." Journal of AOAC INTERNATIONAL 83, no. 5 (September 1, 2000): 1247–51. http://dx.doi.org/10.1093/jaoac/83.5.1247.
Full textKovác, P., V. Cambel, and P. Bukva. "Measuring the homogeneity of Bi(2223)/Ag tapes by four-probe method and a Hall probe array." Superconductor Science and Technology 12, no. 7 (January 1, 1999): 465–71. http://dx.doi.org/10.1088/0953-2048/12/7/401.
Full textCousins, Debby, Suzette Williams, Ernesto Liébana, Alicia Aranaz, Annelies Bunschoten, Jan Van Embden, and Trevor Ellis. "Evaluation of Four DNA Typing Techniques in Epidemiological Investigations of Bovine Tuberculosis." Journal of Clinical Microbiology 36, no. 1 (1998): 168–78. http://dx.doi.org/10.1128/jcm.36.1.168-178.1998.
Full textZainal, Farah Farhana, Kamarudin Hussin, Azmi Rahmat, Mohd Mustafa Al Bakri Abdullah, Shaiful Rizam, Mohammad Tamizi Selimin, and Andrei Victor Sandu. "The Electrical Resistivity of Geopolymer Paste by Using Wenner Four Probe Method." Key Engineering Materials 660 (August 2015): 28–33. http://dx.doi.org/10.4028/www.scientific.net/kem.660.28.
Full textHasegawa, Shuji, Ichiro Shiraki, Takehiro Tanikawa, Christian L. Petersen, Torben M. Hansen, Peter Boggild, and Francois Grey. "Direct measurement of surface-state conductance by microscopic four-point probe method." Journal of Physics: Condensed Matter 14, no. 35 (August 22, 2002): 8379–92. http://dx.doi.org/10.1088/0953-8984/14/35/309.
Full textYamashita, Masato, Toshifumi Nishii, and Hiroshi Kurihara. "Resistivity Correction Factor for the Four-Point Probe Method on Cylindrical Materials." Japanese Journal of Applied Physics 35, Part 1, No. 3 (March 15, 1996): 1948–53. http://dx.doi.org/10.1143/jjap.35.1948.
Full textFu, Xudong, Zhangxun Xia, Qingting Liu, Suli Wang, and Gongquan Sun. "A Modified Four‐Probe Method to Separate Ionic Conductance from Composite Conductors." ChemElectroChem 7, no. 16 (August 17, 2020): 3535–38. http://dx.doi.org/10.1002/celc.202000903.
Full textDing, Fei, Xichun Luo, Wenlong Chang, and Zhengjian Wang. "In Situ Measurement of Spindle Radial and Tilt Error Motions by Complementary Multi-probe Method." Nanomanufacturing and Metrology 2, no. 4 (November 11, 2019): 225–34. http://dx.doi.org/10.1007/s41871-019-00051-5.
Full textMunivenkatareddy, Suresh, and Nekkanti Sitaram. "Extended Calibration Technique of a Four-Hole Probe for Three-Dimensional Flow Measurements." International Journal of Rotating Machinery 2016 (2016): 1–12. http://dx.doi.org/10.1155/2016/5327297.
Full textPanta, GP, and DP Subedi. "Electrical characterization of aluminum (Al) thin films measured by using four- point probe method." Kathmandu University Journal of Science, Engineering and Technology 8, no. 2 (January 3, 2013): 31–36. http://dx.doi.org/10.3126/kuset.v8i2.7322.
Full textPan, Wugen, Kozo Fujiwara, and Satoshi Uda. "Evaluation of crystalline silicon solar cells by current-modulating four-point-probe method." Applied Physics Letters 103, no. 4 (July 22, 2013): 043903. http://dx.doi.org/10.1063/1.4816783.
Full textRouget, G., B. Majidi, D. Picard, G. Gauvin, D. Ziegler, J. Mashreghi, and H. Alamdari. "Electrical Resistivity Measurement of Petroleum Coke Powder by Means of Four-Probe Method." Metallurgical and Materials Transactions B 48, no. 5 (July 6, 2017): 2543–50. http://dx.doi.org/10.1007/s11663-017-1022-9.
Full textKang, Jeon Hong, Kwang Min Yu, Han Jun Kim, Je Cheon Ryu, and Sang Ok Han. "Comparisons of Precision Measurement Methods for Metallic Resistivities." Key Engineering Materials 321-323 (October 2006): 1465–69. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1465.
Full textBaek, Sang-Woo, Min-Gyu Kim, Dong-Hyeok Lee, and Nahm-Gyoo Cho. "Multi-probe system design for measuring the roundness and rotation error motion of a spindle using an error separation technique." Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 233, no. 5 (June 22, 2018): 1547–60. http://dx.doi.org/10.1177/0954405418782281.
Full textJangir, Ravirai, Nekkanti Sitaram, and Ct Gajanan. "A Miniature Four-Hole Probe for Measurement of Three-Dimensional Flow with Large Gradients." International Journal of Rotating Machinery 2014 (2014): 1–12. http://dx.doi.org/10.1155/2014/297861.
Full textBhattarai, Rikesh. "Construction of Sheet Resistance Measurement Setup for Tin Dioxide Film Using Four Probe Method." American Journal of Physics and Applications 5, no. 5 (2017): 60. http://dx.doi.org/10.11648/j.ajpa.20170505.11.
Full textYamashita, Masato. "Geometrical Correction Factor for Resistivity of Semiconductors by the Square Four-Point Probe Method." Japanese Journal of Applied Physics 25, Part 1, No. 4 (April 20, 1986): 563–67. http://dx.doi.org/10.1143/jjap.25.563.
Full textChen, Changdong, Sujuan Hu, Zihao Chen, Yue Shen, Chenning Liu, Qian Wu, Tengzhou Yang, and Chuan Liu. "Generalized Gated Four-Probe Method for Intrinsic Mobility Extraction With Van Der Pauw Structure." IEEE Electron Device Letters 41, no. 2 (February 2020): 244–47. http://dx.doi.org/10.1109/led.2019.2959832.
Full textYun, Yong Ju, Han Young Yu, and Dong Han Ha. "Measurement of electrical transport along stretched λ-DNA molecules using the four-probe method." Current Applied Physics 11, no. 5 (September 2011): 1197–200. http://dx.doi.org/10.1016/j.cap.2011.02.019.
Full textKang, Jeon-Hong, Sang-Hwa Lee, Hyun Ruh, and Kwang-Min Yu. "Development of a Thickness Meter for Conductive Thin Films Using Four-Point Probe Method." Journal of Electrical Engineering & Technology 16, no. 4 (March 29, 2021): 2265–73. http://dx.doi.org/10.1007/s42835-021-00725-5.
Full textWitthøft, Maria-Louise, Frederik W. Østerberg, Janusz Bogdanowicz, Rong Lin, Henrik H. Henrichsen, Ole Hansen, and Dirch H. Petersen. "A variable probe pitch micro-Hall effect method." Beilstein Journal of Nanotechnology 9 (July 20, 2018): 2032–39. http://dx.doi.org/10.3762/bjnano.9.192.
Full textHEISICK, JUDY E., FANNIE M. HARRELL, EUGENE H. PETERSON, SALLIE MCLAUGHLIN, DEAN E. WAGNER, IRENE V. WESLEY, and JOHN BRYNER. "Comparison of Four Procedures to Detect Listeria spp. in Foods." Journal of Food Protection 52, no. 3 (March 1, 1989): 154–57. http://dx.doi.org/10.4315/0362-028x-52.3.154.
Full textChinnappan, Amutha, Jeremy Kong Yoong Lee, W. A. D. M. Jayathilaka, and Seeram Ramakrishna. "Fabrication of MWCNT/Cu nanofibers via electrospinning method and analysis of their electrical conductivity by four-probe method." International Journal of Hydrogen Energy 43, no. 2 (January 2018): 721–29. http://dx.doi.org/10.1016/j.ijhydene.2017.11.028.
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