Journal articles on the topic 'Gallium industry'
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Chen, Wei-Sheng, Li-Lin Hsu, and Li-Pang Wang. "Recycling the GaN Waste from LED Industry by Pressurized Leaching Method." Metals 8, no. 10 (October 22, 2018): 861. http://dx.doi.org/10.3390/met8100861.
Full textMoskalyk, R. R. "Gallium: the backbone of the electronics industry." Minerals Engineering 16, no. 10 (October 2003): 921–29. http://dx.doi.org/10.1016/j.mineng.2003.08.003.
Full textCARVALHO, MARCELO S., KÁTIA CRISTINA M. NETO, ARMI W. NOBREGA, and JOÃO A. MEDEIROS. "Recovery of Gallium from Aluminum Industry Residues." Separation Science and Technology 35, no. 1 (January 2000): 57–67. http://dx.doi.org/10.1081/ss-100100143.
Full textChen, Wei-Ting, Lung-Chang Tsai, Fang-Chang Tsai, and Chi-Min Shu. "Recovery of Gallium and Arsenic from Gallium Arsenide Waste in the Electronics Industry." CLEAN - Soil, Air, Water 40, no. 5 (January 23, 2012): 531–37. http://dx.doi.org/10.1002/clen.201100216.
Full textZhao, Cunliang, Shenjun Qin, Yinchao Yang, Yanheng Li, and Mingyue Lin. "Concentration of Gallium in the Permo-Carboniferous Coals of China." Energy Exploration & Exploitation 27, no. 5 (October 2009): 333–43. http://dx.doi.org/10.1260/0144-5987.27.5.333.
Full textSwami, Monika, and Kinjal Patel. "Need of Gallium Recovery from Waste Samples: A Review." Journal of Ravishankar University (PART-B) 34, no. 1 (May 24, 2021): 09–18. http://dx.doi.org/10.52228/jrub.2021-34-1-2.
Full textYuanlong, Chen. "The Optimizations of MOSFET Contents in EE Undergraduate Course by using the Third Generation Semiconductor (Gallium Nitride)." E3S Web of Conferences 198 (2020): 01025. http://dx.doi.org/10.1051/e3sconf/202019801025.
Full textAlliata, D., N. Anderson, M. Durand de Gevigney, I. Bergoend, and P. Gastaldo. "How to secure the fabrication of Gallium Nitride on Si wafers." International Symposium on Microelectronics 2019, no. 1 (October 1, 2019): 000444–49. http://dx.doi.org/10.4071/2380-4505-2019.1.000444.
Full textPan, Kefeng, Ying Li, Jiawei Zhang, and Qing Zhao. "A Facile and Low-Cost Method to Produce Ultrapure 99.99999% Gallium." Materials 11, no. 11 (November 17, 2018): 2308. http://dx.doi.org/10.3390/ma11112308.
Full textLécuyer, Christophe, and Takahiro Ueyama. "The Logics of Materials Innovation." Historical Studies in the Natural Sciences 43, no. 3 (November 2012): 243–80. http://dx.doi.org/10.1525/hsns.2013.43.3.243.
Full textHuang, Chi-Yo, Pei-Han Chung, Joseph Shyu, Yao-Hua Ho, Chao-Hsin Wu, Ming-Che Lee, and Ming-Jenn Wu. "Evaluation and Selection of Materials for Particulate Matter MEMS Sensors by Using Hybrid MCDM Methods." Sustainability 10, no. 10 (September 27, 2018): 3451. http://dx.doi.org/10.3390/su10103451.
Full textGaniev, I. N., F. A. Aliev, H. O. Odinazoda, A. M. Safarov, and J. H. Jayloev. "Heat capacity and thermodynamic functions of aluminum conductive alloy E-AlMgSi (Aldrey) doped with gallium." Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 22, no. 3 (January 19, 2020): 219–27. http://dx.doi.org/10.17073/1609-3577-2019-3-219-227.
Full textChen, Hong Wen. "Exposure and Health Risk of Gallium, Indium, and Arsenic from Semiconductor Manufacturing Industry Workers." Bulletin of Environmental Contamination and Toxicology 78, no. 1 (March 13, 2007): 5–9. http://dx.doi.org/10.1007/s00128-007-9037-6.
Full textChen, H. W. "Exposure and Health Risk of Gallium, Indium, and Arsenic from Semiconductor Manufacturing Industry Workers." Bulletin of Environmental Contamination and Toxicology 78, no. 2 (April 6, 2007): 123–27. http://dx.doi.org/10.1007/s00128-007-9079-9.
Full textGaniev, Izatullo N., Firdavs A. Aliev, Haydar O. Odinazoda, Ahror M. Safarov, and Jamshed H. Jayloev. "Heat capacity and thermodynamic functions of E-AlMgSi (Aldrey) aluminum conductor alloy doped with gallium." Modern Electronic Materials 6, no. 1 (March 30, 2020): 25–30. http://dx.doi.org/10.3897/j.moem.6.1.55277.
Full textLiao, Y. H., H. S. Yu, C. K. Ho, M. T. Wu, C. Y. Yang, J. R. Chen, and C. C. Chang. "Biological Monitoring of Exposures to Aluminium, Gallium, Indium, Arsenic, and Antimony in Optoelectronic Industry Workers." Journal of Occupational and Environmental Medicine 46, no. 9 (September 2004): 931–36. http://dx.doi.org/10.1097/01.jom.0000137718.93558.b8.
Full textIov, Tatiana, Mihnea Costescu, Madalina Diac, Daniel Tabian, Sofia Mihaela David, Anton Knieling, and Simona Irina Damian. "Dangerous Chemical Agents: General and Odonto-Stomatological Aspects with Importance in Forensic Toxicology." Revista de Chimie 70, no. 5 (June 15, 2019): 1829–34. http://dx.doi.org/10.37358/rc.19.5.7225.
Full textYang, Yin Dong, Paul Wu, Jason Deng, Mansoor Barati, and Alex McLean. "Developments of Solar Cell Materials and Fabrication Technology and their Effects on Energy Conversion Efficiency." Applied Mechanics and Materials 378 (August 2013): 293–301. http://dx.doi.org/10.4028/www.scientific.net/amm.378.293.
Full textKim, Jihyun, F. Ren, and S. J. Pearton. "Will surface effects dominate in quasi-two-dimensional gallium oxide for electronic and photonic devices?" Nanoscale Horizons 4, no. 6 (2019): 1251–55. http://dx.doi.org/10.1039/c9nh00273a.
Full textLiao, Yen-Hsiung, Long-Chih Hwang, Jing-Shwu Kao, Shuenn-Jiun Yiin, Shu-Fang Lin, Chia-Hong Lin, Yu-Cheng Lin, and Tar-Ching Aw. "Lipid Peroxidation in Workers Exposed to Aluminium, Gallium, Indium, Arsenic, and Antimony in the Optoelectronic Industry." Journal of Occupational and Environmental Medicine 48, no. 8 (August 2006): 789–93. http://dx.doi.org/10.1097/01.jom.0000229782.71756.8e.
Full textNagarani, S., M. Jayachandran, and C. Sanjeeviraja. "Review on Gallium Zinc Oxide Films: Material Properties and Preparation Techniques." Materials Science Forum 671 (January 2011): 47–68. http://dx.doi.org/10.4028/www.scientific.net/msf.671.47.
Full textLee, Ching-Hwa, Hang-Yi Lin, Elon I. Cadogan, Srinivasa R. Popuri, and Chia-Yuan Chang. "Biosorption Performance of Biodegradable Polymer Powders for the Removal of Gallium(III) ions from Aqueous Solution." Polish Journal of Chemical Technology 17, no. 3 (September 1, 2015): 124–32. http://dx.doi.org/10.1515/pjct-2015-0060.
Full textFeng, Zhe, Xin Liu, Yu Wang, and Changgong Meng. "Recent Advances on Gallium-Modified ZSM-5 for Conversion of Light Hydrocarbons." Molecules 26, no. 8 (April 13, 2021): 2234. http://dx.doi.org/10.3390/molecules26082234.
Full textJain, Rohan, Siyuan Fan, Peter Kaden, Satoru Tsushima, Harald Foerstendorf, Robert Barthen, Falk Lehmann, and Katrin Pollmann. "Recovery of gallium from wafer fabrication industry wastewaters by Desferrioxamine B and E using reversed-phase chromatography approach." Water Research 158 (July 2019): 203–12. http://dx.doi.org/10.1016/j.watres.2019.04.005.
Full textSturgill, J. A., J. T. Swartzbaugh, and P. M. Randall. "Pollution prevention in the semiconductor industry through recovery and recycling of gallium and arsenic from gaas solid wastes." Clean Technologies and Environmental Policy 1, no. 4 (December 2, 1999): 248–56. http://dx.doi.org/10.1007/s100980050038.
Full textSturgill, J. A., J. T. Swartzbaugh, and P. M. Randall. "Pollution prevention in the semiconductor industry through recovery and recycling of gallium and arsenic from GaAs polishing wastes." Clean Products and Processes 2, no. 1 (May 4, 2000): 0018–27. http://dx.doi.org/10.1007/s100980050047.
Full textVambol, S., V. Vambol, Y. Suchikova, I. Bogdanov, and O. Kondratenko. "Investigation of the porous GaP layers' chemical composition and the quality of the tests carried out." Journal of Achievements in Materials and Manufacturing Engineering 2, no. 86 (February 1, 2018): 49–60. http://dx.doi.org/10.5604/01.3001.0011.8236.
Full textKulchitsky, Nikolay A., Arkady V. Naumov, and Vadim V. Startsev. "Photonic and Terahertz applications as the next gallium arsenide market driver." Modern Electronic Materials 6, no. 3 (September 30, 2020): 77–84. http://dx.doi.org/10.3897/j.moem.6.3.63224.
Full textKulchitskiy, N. A., A. V. Naumov, and V. V. Startsev. "Photonic and terahertz applications as a next driver of gallium arsenide market." Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering 23, no. 3 (November 10, 2020): 167–76. http://dx.doi.org/10.17073/1609-3577-2020-3-167-176.
Full textBaek, Seung Yub, Jin Ho Chu, and Sung Taek Jung. "A Study on Fabrication of Ultra-Precision Diamond Tool and Length Optimization for Improving the Stability." Key Engineering Materials 777 (August 2018): 289–93. http://dx.doi.org/10.4028/www.scientific.net/kem.777.289.
Full textJain, Rohan, Francesca Cirina, Peter Kaden, and Katrin Pollmann. "Investigation of the Ga Complexation Behaviour of the Siderophore Desferrioxamine B." Solid State Phenomena 262 (August 2017): 643–46. http://dx.doi.org/10.4028/www.scientific.net/ssp.262.643.
Full textSwain, Basudev, Chinmayee Mishra, Leeseung Kang, Kyung-Soo Park, Chan Gi Lee, and Hyun Seon Hong. "Recycling process for recovery of gallium from GaN an e-waste of LED industry through ball milling, annealing and leaching." Environmental Research 138 (April 2015): 401–8. http://dx.doi.org/10.1016/j.envres.2015.02.027.
Full textKostjuk, Sergei V. "Complexes of aluminum, iron(III), and gallium(III) chlorides with ethers in synthesis of highly reactive polyisobutylene." Journal of the Belarusian State University. Chemistry, no. 2 (August 23, 2020): 50–62. http://dx.doi.org/10.33581/2520-257x-2020-2-50-62.
Full textCairney, Julie M., and Paul R. Munroe. "Redeposition Effects in TEM Sample Preparation of Feal-Based Metal Matrix Composites using the Focused Ion Beam Miller." Microscopy and Microanalysis 6, S2 (August 2000): 514–15. http://dx.doi.org/10.1017/s1431927600035066.
Full textKaessner, S., M. G. Scheibel, S. Behrendt, B. Boettge, and K. G. Nickel. "Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging." International Symposium on Microelectronics 2018, no. 1 (October 1, 2018): 000425–33. http://dx.doi.org/10.4071/2380-4505-2018.1.000425.
Full textKaessner, Stefan, Markus G. Scheibel, Stefan Behrendt, Bianca Boettge, Christoph Berthold, and Klaus G. Nickel. "Reliability of Novel Ceramic Encapsulation Materials for Electronic Packaging." Journal of Microelectronics and Electronic Packaging 15, no. 3 (July 1, 2018): 132–39. http://dx.doi.org/10.4071/imaps.661015.
Full textCairney, J. M., R. D. Smith, and P. R. Munroe. "Transmission Electron Microscope Specimen Preparation of Metal Matrix Composites Using the Focused Ion Beam Miller." Microscopy and Microanalysis 5, S2 (August 1999): 892–93. http://dx.doi.org/10.1017/s1431927600017785.
Full textHing, H. L., C. Burkhardt, P. Gnauck, S. Sally, H. Gelderbloms, Y. Muranaka, M. A. Kaswandi, A. H. A. Azizl, and A. Z. Sahalan. "Applications of Focused Ion Beam (FIB) on Yeast Cell & SARS Virus." Microscopy Today 15, no. 5 (September 2007): 42–43. http://dx.doi.org/10.1017/s1551929500061241.
Full textLi, Ming, Hisham Mohamed Cassim Mohamed Anver, Yuxin Zhang, Shi-Yang Tang, and Weihua Li. "Automatic Morphology Control of Liquid Metal using a Combined Electrochemical and Feedback Control Approach." Micromachines 10, no. 3 (March 26, 2019): 209. http://dx.doi.org/10.3390/mi10030209.
Full textLiu, Shiqian, Keith Sweatman, Stuart McDonald, and Kazuhiro Nogita. "Ga-Based Alloys in Microelectronic Interconnects: A Review." Materials 11, no. 8 (August 8, 2018): 1384. http://dx.doi.org/10.3390/ma11081384.
Full textVolcheck, V. S., and V. R. Stempitsky. "Numerical simulation of the sensor for toxic nanoparticles based on the heterostructure field effect transistor." Doklady BGUIR 18, no. 8 (December 27, 2020): 62–68. http://dx.doi.org/10.35596/1729-7648-2020-18-8-62-68.
Full textGriffiths, A. D., J. Herrnsdorf, J. J. D. McKendry, M. J. Strain, and M. D. Dawson. "Gallium nitride micro-light-emitting diode structured light sources for multi-modal optical wireless communications systems." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 378, no. 2169 (March 2, 2020): 20190185. http://dx.doi.org/10.1098/rsta.2019.0185.
Full textPołedniok, Justyna, Andrzej Kita, and Piotr Zerzucha. "Spectrophotometric and Inductively Coupled Plasma–Optical Emission Spectroscopy Determination of Gallium in Natural Soils and Soils Polluted by Industry: Relationships between Elements." Communications in Soil Science and Plant Analysis 43, no. 8 (April 15, 2012): 1121–35. http://dx.doi.org/10.1080/00103624.2012.662561.
Full textXiong, Fangzhu, Weiling Guo, Shiwei Feng, Xuan Li, Zaifa Du, Le Wang, Jun Deng, and Jie Sun. "Transfer-Free Graphene-Like Thin Films on GaN LED Epiwafers Grown by PECVD Using an Ultrathin Pt Catalyst for Transparent Electrode Applications." Materials 12, no. 21 (October 28, 2019): 3533. http://dx.doi.org/10.3390/ma12213533.
Full textXi, Rui, Shao-Hui Zhang, Long Zhang, Chao Wang, Lu-Jia Wang, Jing-Hui Yan, and Ge-Bo Pan. "Electrodeposition of Pd-Pt Nanocomposites on Porous GaN for Electrochemical Nitrite Sensing." Sensors 19, no. 3 (January 31, 2019): 606. http://dx.doi.org/10.3390/s19030606.
Full textSalem, Jebreel M., and Dong Sam Ha. "A High Temperature Passive GaN-HEMT Mixer for Downhole Communications." Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2016, HiTEC (January 1, 2016): 000272–77. http://dx.doi.org/10.4071/2016-hitec-272.
Full textRoman, Barbara, Monika Retajczyk, Łukasz Sałaciński, and Robert Pełech. "Curcumin - Properties, Applications and Modification of Structure." Mini-Reviews in Organic Chemistry 17, no. 5 (August 11, 2020): 486–95. http://dx.doi.org/10.2174/1570193x16666190621110247.
Full textAnnaniah, Luruthudass, and Mutharasu Devarajan. "Impact of severe cracked germanium (111) substrate on aluminum indium gallium phosphate light-emitting-diode’s electro-optical performance." Open Physics 14, no. 1 (January 1, 2016): 253–60. http://dx.doi.org/10.1515/phys-2016-0024.
Full textPoudel, Deewakar, Shankar Karki, Benjamin Belfore, Grace Rajan, Sushma Swaraj Atluri, Sina Soltanmohammad, Angus Rockett, and Sylvain Marsillac. "Degradation Mechanism Due to Water Ingress Effect on the Top Contact of Cu(In,Ga)Se2 Solar Cells." Energies 13, no. 17 (September 2, 2020): 4545. http://dx.doi.org/10.3390/en13174545.
Full textLuo, Peng, Frank Schnieder, Olof Bengtsson, Valeria Vadalà, Antonio Raffo, Wolfgang Heinrich, and Matthias Rudolph. "A streamlined drain-lag model for GaN HEMTs based on pulsed S-parameter measurements." International Journal of Microwave and Wireless Technologies 11, no. 2 (February 22, 2019): 121–29. http://dx.doi.org/10.1017/s1759078719000060.
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