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1

Hoffman, Alan Donald. A soft-wall permeameter for online characterization of grinding circuits. [s.l: s.n.], 1989.

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2

International Symposium on Chemical Mechanical Planarization in Integrated Circuit Device Manufacturing (4th 2000 Phoenix, Ariz.). Chemical mechanical planarization IV: Proceedings of the International Symposium. Edited by Opila R. L, Electrochemical Society. Dielectric Science and Technology Division., Electrochemical Society Electronics Division, and Electrochemical Society Meeting. Pennington, NJ: Electrochemical Society, Inc., 2001.

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3

International Symposium on Chemical Mechanical Planarization in Integrated Circuit Device Manufacturing (6th 2003 Orlando, Fla.). Chemical mechanical planarization VI: Proceedings of the international symposium. Edited by Seal S, Electrochemical Society Electronics Division, and Electrochemical Society Meeting. Pennington, NJ: Electrochemical Society, 2003.

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4

International, Symposium on Chemical Mechanical Planarization in Integrated Circuit Device Manufacturing (5th 2002 Philadelphia Pa ). Chemical mechanical planarization V: Proceedings of the International Symposium. Pennington, NJ: Electrochemical Society, Inc., 2002.

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5

Rajamani, Kuppuswamy. Optimal control of closed circuit ball mill grinding. Ann Arbor, MI: UMI Dissertation Services, 1990.

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6

Lachapelle, Daniel J. Grinding circuit simulation of St Andrew Goldfields Stock Mill. Sudbury, Ont: Laurentian University, School of Engineering, 2000.

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7

Xiao, Zhixian. Developing simple regression for predicting gold gravity recovery in grinding circuit. Montreal, QC: McGill University, Dept. of Mining, Metals and Materials Engineering, 2001.

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8

Canada Centre for Mineral and Energy Technology. Spoc Simulated Processing of Ore and Coal: Chapter 2.2 Grinding Circuit Sampling. S.l: s.n, 1985.

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9

Borst, Christopher L. Chemical-mechanical polishing of low dielectric constant polymers and organosilicate glasses: Fundamental mechanisms and application to IC interconnect technology. Boston: Kluwer Academic Publishers, 2002.

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10

Lounsbury, David Michael. Optimization of the Kidd Creek Mine primary grinding circuit and subsequent model development. Sudbury, Ont: Laurentian University, School of Engineering, 1995.

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11

International Symposium on Chemical Mechanical Planarization (2nd 1998 San Diego, Calif.). Proceedings of the Second International Symposium on Chemical Mechanical Planariarization [sic] in Integrated Circuit Device Manufacturing. Edited by Raghavan S, Opila Robert Leon 1953-, Zhang L, Electrochemical Society Electronics Division, Electrochemical Society. Dielectric Science and Technology Division., and Electrochemical Society Meeting. Pennington, New Jersey: Electrochemical Society, 1998.

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12

Dresler, Amos Robert. Metallurgical pre-feasibility assessment of a cyanide based grinding circuit and of a carbon-in-column gold recovery system for Placer Dome Ltd., Musselwhite mine. Sudbury, Ont: Laurentian University, School of Engineering, 1998.

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13

Cheng, Jie. Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect. Springer, 2019.

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14

Cheng, Jie. Research on Chemical Mechanical Polishing Mechanism of Novel Diffusion Barrier Ru for Cu Interconnect. Springer, 2017.

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15

Li, Yuzhuo. Microelectronic Applications of Chemical Mechanical Planarization. Wiley-Interscience, 2007.

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16

Li, Yuzhuo. Microelectronic Applications of Chemical Mechanical Planarization. Wiley & Sons, Incorporated, John, 2007.

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17

Gill, William N., Ronald J. Gutmann, and Christopher Lyle Borst. Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses: Fundamental Mechanisms and Application to IC Interconnect Technology. Springer, 2002.

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18

Gill, William N., Ronald J. Gutmann, and Christopher Lyle Borst. Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses: Fundamental Mechanisms And Application To Ic Interconnect Technology. Springer, 2014.

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19

Gill, William N., Ronald J. Gutmann, and Christopher Lyle Borst. Chemical-Mechanical Polishing of Low Dielectric Constant Polymers and Organosilicate Glasses: Fundamental Mechanisms and Application to IC Interconnect Technology. Springer London, Limited, 2013.

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20

S, Boning Duane, Materials research Society Meeting, and Symposium on Chemical-Mechanical Planarization (2003 : San Francisco, Calif.), eds. Chemical-mechanical planarization: Symposium held April 22-24, 2003, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 2003.

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21

Vos, Ingrid, Michael R. Oliver, Duane S. Boning, Katia Devriendt, and David J. Stein. Chemical-Mechanical Planarization: Volume 767. University of Cambridge ESOL Examinations, 2014.

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