Journal articles: 'Hardware testing'

1

Krauβ, Stefan. "Hardware for ECU testing." ATZelektronik worldwide 3, no. 1 (February 2008): 52–55. http://dx.doi.org/10.1007/bf03242156.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

Zhi-hong, Liang, Luo Jian-zhen, and Liang Zhi-qiang. "System Recovery Testing of Hardware Firewall." Procedia Engineering 15 (2011): 4574–78. http://dx.doi.org/10.1016/j.proeng.2011.08.859.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Torku, Kofi E., and Dave A. Kiesling. "Noise Problems in Testing VLSI Hardware." IEEE Design & Test of Computers 2, no. 6 (December 1985): 36–43. http://dx.doi.org/10.1109/mdt.1985.294795.

Full text

APA, Harvard, Vancouver, ISO, and other styles

4

Rajski, J., and J. Tyszer. "Testing of telecommunications hardware [Guest Editorial]." IEEE Communications Magazine 37, no. 6 (June 1999): 60–62. http://dx.doi.org/10.1109/mcom.1999.769275.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Rajsuman, Rochit. "Special Issue on Digital Hardware Testing." VLSI Design 1, no. 4 (January 1, 1994): i. http://dx.doi.org/10.1155/1994/24312.

Full text

APA, Harvard, Vancouver, ISO, and other styles

6

Kundel, Ralf, Fridolin Siegmund, Rhaban Hark, Amr Rizk, and Boris Koldehofe. "Network Testing Utilizing Programmable Network Hardware." IEEE Communications Magazine 60, no. 2 (February 2022): 12–17. http://dx.doi.org/10.1109/mcom.001.2100191.

Full text

APA, Harvard, Vancouver, ISO, and other styles

7

Gouache, Thibault P., Christopher Brunskill, Gregory P. Scott, Yang Gao, Pierre Coste, and Yves Gourinat. "Regolith simulant preparation methods for hardware testing." Planetary and Space Science 58, no. 14-15 (December 2010): 1977–84. http://dx.doi.org/10.1016/j.pss.2010.09.021.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Bazzazi, Amin, Mohammad Taghi Manzuri Shalmani, and Ali Mohammad Afshin Hemmatyar. "Hardware Trojan Detection Based on Logical Testing." Journal of Electronic Testing 33, no. 4 (June 22, 2017): 381–95. http://dx.doi.org/10.1007/s10836-017-5670-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Kilaru, Chaitanya, Dr JKR Sastry, and Dr K RajaSekhara Rao. "Testing distributed embedded systems through logic analyzer." International Journal of Engineering & Technology 7, no. 2.7 (March 18, 2018): 297. http://dx.doi.org/10.14419/ijet.v7i2.7.10601.

Full text

Abstract:

Testing distributed embedded systems is complex as the individual systems connected on to the network are heterogeneous in nature.The communication system that is used for establishing the networking also varies greatly leading to different testing requirements. Testing of embedded systems can be carried using different methods that include Scaffolding, assert macros, instruction set simulators. In-circuit emulators, logic analyzers each requiring establishment of different testing environment required for undertaking actual testing. Testing of any embedded systems involves testing hardware, testing hardware dependent code, and testing hardware independent code. Logic analyzers are generally used for testing proper working of the Hardware.In this paper, a framework is presented using which testing of hardware distributed across the distributed embedded system using logic analyzer is presented.

APA, Harvard, Vancouver, ISO, and other styles

10

Karasyov, A. V., and I. A. Pustyl’nyak. "Hardware-software complex for testing digital control systems." Russian Electrical Engineering 79, no. 3 (March 2008): 127–29. http://dx.doi.org/10.3103/s1068371208030036.

Full text

APA, Harvard, Vancouver, ISO, and other styles

11

Virkki, Johanna, Liquan Chen, Yao Zhu, and Yuewei Meng. "Challenges in Qualitative Accelerated Testing of WSN Hardware." Engineering 03, no. 12 (2011): 1234–39. http://dx.doi.org/10.4236/eng.2011.312153.

Full text

APA, Harvard, Vancouver, ISO, and other styles

12

Nejadmoghadam, Fahimeh, Ali Mahani, and Yousef S. Kavian. "A New Testing Method for Hardware Trojan Detection." Procedia Technology 17 (2014): 713–19. http://dx.doi.org/10.1016/j.protcy.2014.10.197.

Full text

APA, Harvard, Vancouver, ISO, and other styles

13

Gehlen, Manuel, Vartan Kurtcuoglu, and Marianne Daners. "Hardware-in-the-loop testing of CSF shunts." Fluids and Barriers of the CNS 12, Suppl 1 (2015): O2. http://dx.doi.org/10.1186/2045-8118-12-s1-o2.

Full text

APA, Harvard, Vancouver, ISO, and other styles

14

Caraceni, A., G. Di Mare, F. Ferrara, S. Scala, and E. Sepe. "HARDWARE IN THE LOOP TESTING OF EOBD STRATEGIES." IFAC Proceedings Volumes 35, no. 1 (2002): 199–204. http://dx.doi.org/10.3182/20020721-6-es-1901.01501.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

Loganchuk, S. M., L. Touel, S. N. Chebotarev, L. M. Goncharova, A. V. Varnavskaya, S. Touel, and A. A. A. Mohamed. "Wireless software-hardware complex for testing semiconductor structures." Journal of Physics: Conference Series 1410 (December 2019): 012202. http://dx.doi.org/10.1088/1742-6596/1410/1/012202.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Collaboration), Duncan A. Brown (for the LIGO Scient. "Testing the LIGO inspiral analysis with hardware injections." Classical and Quantum Gravity 21, no. 5 (February 10, 2004): S797—S800. http://dx.doi.org/10.1088/0264-9381/21/5/060.

Full text

APA, Harvard, Vancouver, ISO, and other styles

17

Audley, H., K. Danzmann, A. García Marín, G. Heinzel, A. Monsky, M. Nofrarias, F. Steier, et al. "The LISA Pathfinder interferometry—hardware and system testing." Classical and Quantum Gravity 28, no. 9 (April 19, 2011): 094003. http://dx.doi.org/10.1088/0264-9381/28/9/094003.

Full text

APA, Harvard, Vancouver, ISO, and other styles

18

Lyle, James R. "A strategy for testing hardware write block devices." Digital Investigation 3 (September 2006): 3–9. http://dx.doi.org/10.1016/j.diin.2006.06.001.

Full text

APA, Harvard, Vancouver, ISO, and other styles

19

Tran, Trang Thi Thu, Phuoc-Loc Diep, Vu-Huynh-Tuan Phan, Tien-Loc Nguyen, Trung-Khanh Le, Quoc-Hung Huynh, and Duc-Hung Le. "Automatic chip testing system." Science and Technology Development Journal - Natural Sciences 3, no. 3 (February 17, 2020): 235–43. http://dx.doi.org/10.32508/stdjns.v3i3.605.

Full text

Abstract:

In this paper, we implement an automatic chip testing system which can be applied on various types of chip packages. The conventional systems, such as manual chip testing systems, often repeat the same steps for input conditions; or high-cost testing systems are designed to be highly optimized, but the installation and operating costs are very expensive. This makes these systems difficult to be applied in education, research or small companies. The automatic chip testing system overcomes the above two weaknesses. The proposed system not only meets the requirement of a basic chip testing process, but also operates automatically and reduces the cost. Users only need to provide input data via a Graphical User Interface (GUI) which is built using C# programming language, then the system will automatically operate and return the corresponding output data to the software to synthesize and compare with the user’s expected data. The hardware is built on the TR4 FPGA Development Kit which helps save the cost of hardware design and its resources. The software and hardware withcommunicate to each other via Universal Asynchronous Receiver-Transmitter (UART) protocol. The proposed system is automatic, optimized and low-cost so that it can be applied both in IC design education and industry.

APA, Harvard, Vancouver, ISO, and other styles

20

Olsen, Robert G., Monty W. Tuominen, and Jon T. Leman. "On Corona Testing of High-Voltage Hardware Using Laboratory Testing and/or Simulation." IEEE Transactions on Power Delivery 33, no. 4 (August 2018): 1707–15. http://dx.doi.org/10.1109/tpwrd.2017.2720198.

Full text

APA, Harvard, Vancouver, ISO, and other styles

21

Guo, Jing, Zhong Wen Zhao, Chao Yang, and Ya Shuai Lv. "Research on the Integration Testing of Foundational Software and Hardware." Applied Mechanics and Materials 543-547 (March 2014): 3348–51. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.3348.

Full text

Abstract:

Whereas it plays the more and more important role in modern living, the level of integration testing on foundational SW&HW(software and hardware) was advanced. On the basis of integration testing content analysis, the basis flow of integration testing was advanced. The environment of integration testing was designed, especially the frame of testing environment on performance. The above research provided reference for standardization of integration testing.

APA, Harvard, Vancouver, ISO, and other styles

22

Kikusato, Hiroshi, Taha Selim Ustun, Masaichi Suzuki, Shuichi Sugahara, Jun Hashimoto, Kenji Otani, Kenji Shirakawa, Rina Yabuki, Ken Watanabe, and Tatsuaki Shimizu. "Microgrid Controller Testing Using Power Hardware-in-the-Loop." Energies 13, no. 8 (April 20, 2020): 2044. http://dx.doi.org/10.3390/en13082044.

Full text

Abstract:

Required functions of a microgrid become divers because there are many possible configurations that depend on the location. In order to effectively implement the microgrid system, which consists of a microgrid controller and components with distributed energy resources (DERs), thorough tests should be run to validate controller operation for possible operating conditions. Power-hardware-in-the-loop (PHIL) simulation is a validation method that allows different configurations and yields reliable results. However, PHIL configuration for testing the microgrid controller that can evaluate the communication between a microgrid controller and components as well as the power interaction among microgrid components has not been discussed. Additionally, the difference of the power rating of microgrid components between the deployment site and the test lab needs to be adjusted. In this paper, we configured the PHIL environment, which integrates various equipment in the laboratory with a digital real-time simulation (DRTS), to address these two issues of microgrid controller testing. The test in the configured PHIL environment validated two main functions of the microgrid controller, which supports the diesel generator set operations by controlling the DER, regarding single function and simultaneously activated multiple functions.

APA, Harvard, Vancouver, ISO, and other styles

23

Wu, Wei Bin, Tian Sheng Hong, Chileshe Joseph Mwape, and Hao Biao Li. "Design of Environmental Hardware in Car Alternator Testing System." Advanced Materials Research 199-200 (February 2011): 505–8. http://dx.doi.org/10.4028/www.scientific.net/amr.199-200.505.

Full text

Abstract:

In an automobile, a stable and durable alternator is extremely important. Based on the basic characteristics of the alternators now on the mainstream market, the hardware simulation method was used to build a simulated “car engine-alternator-auto load-the external environment hardware environment” system. High and low temperature humidity test chamber simulates the vehicle internal environment and the inverter driving power frequency conversion is used to simulate motor car engine power system. It uses fixtures, belts, and pulleys to simulate the connection of the engine to the alternator. In addition it uses electronic load cases to simulate automobile electric power consumption with all kinds of current, voltage, speed signal components to provide feedback signals based on the testing system of alternator to make comparisons. The testing system is designed by analyzing and optimizing the structural mechanics of the whole system according to the requirement of the hardware system layout. For each part of the system factors of design were considered included shape, size, material selection process and heat treatment. Parts and detailed drawings were prepared and later sent for fabrication. The tests indicate that hardware alternator testing system has no major defects that can prevent it from being developed for commercial use.

APA, Harvard, Vancouver, ISO, and other styles

24

Skjetne, Roger, and Olav Egeland. "Hardware-in-the-loop testing of marine control system." Modeling, Identification and Control: A Norwegian Research Bulletin 27, no. 4 (2006): 239–58. http://dx.doi.org/10.4173/mic.2006.4.3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

25

Ben Ahmed, Asma, Olfa Mosbahi, Mohamed Khalgui, and Zhiwu Li. "Boundary Scan Extension for Testing Distributed Reconfigurable Hardware Systems." IEEE Transactions on Circuits and Systems I: Regular Papers 66, no. 7 (July 2019): 2699–708. http://dx.doi.org/10.1109/tcsi.2019.2894441.

Full text

APA, Harvard, Vancouver, ISO, and other styles

26

Köhl, Susanne, Daniel Lemp, and Markus Plöger. "ECU network testing by hardware-in-the-loop simulation." ATZ worldwide 105, no. 10 (October 2003): 10–12. http://dx.doi.org/10.1007/bf03224632.

Full text

APA, Harvard, Vancouver, ISO, and other styles

27

Wältermann, Peter, Herbert Schütte, and Klaus Diekstall. "Hardware-in-the-loop testing of Distributed Electronic Systems." ATZ worldwide 106, no. 5 (May 2004): 6–10. http://dx.doi.org/10.1007/bf03224664.

Full text

APA, Harvard, Vancouver, ISO, and other styles

28

Silva, Raul Schmidlin Fajardo, Jürgen Hesser, and Reinhard Manner. "Contract Specification for Hardware Interoperability Testing and Fault Analysis." IEEE Transactions on Reliability 60, no. 1 (March 2011): 351–62. http://dx.doi.org/10.1109/tr.2011.2104472.

Full text

APA, Harvard, Vancouver, ISO, and other styles

29

Kamhoua, Charles A., Hong Zhao, Manuel Rodriguez, and Kevin A. Kwiat. "A Game-Theoretic Approach for Testing for Hardware Trojans." IEEE Transactions on Multi-Scale Computing Systems 2, no. 3 (July 1, 2016): 199–210. http://dx.doi.org/10.1109/tmscs.2016.2564963.

Full text

APA, Harvard, Vancouver, ISO, and other styles

30

Jashnani, S., T. R. Nada, M. Ishfaq, A. Khamker, and P. Shaholia. "Sizing and preliminary hardware testing of solar powered UAV." Egyptian Journal of Remote Sensing and Space Science 16, no. 2 (December 2013): 189–98. http://dx.doi.org/10.1016/j.ejrs.2013.05.002.

Full text

APA, Harvard, Vancouver, ISO, and other styles

31

Mohamed, Mofreh, and Aida El-Gwad. "Hardware Algorithm for Static and Dynamic Rams Testing.(Dept.E)." MEJ. Mansoura Engineering Journal 15, no. 2 (May 22, 2021): 9–15. http://dx.doi.org/10.21608/bfemu.2021.171221.

Full text

APA, Harvard, Vancouver, ISO, and other styles

32

Puschmann, Frank. "Safe Testing through Power Hardware-in-the-Loop Systems." ATZelectronics worldwide 16, no. 7-8 (July 2021): 50–53. http://dx.doi.org/10.1007/s38314-021-0649-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

33

Kampel, Ludwig, Paris Kitsos, and Dimitris E. Simos. "Locating Hardware Trojans Using Combinatorial Testing for Cryptographic Circuits." IEEE Access 10 (2022): 18787–806. http://dx.doi.org/10.1109/access.2022.3151378.

Full text

APA, Harvard, Vancouver, ISO, and other styles

34

Song, Xian Chen, and Qing Hua Zhou. "Embedded Machine Tool CNC System Based on the ARM and MCX314." Advanced Materials Research 308-310 (August 2011): 1401–4. http://dx.doi.org/10.4028/www.scientific.net/amr.308-310.1401.

Full text

Abstract:

CNC(Computer Numerical Control) machine tool is the foundation and core of modern manufacturing systems, advanced CNC technology is the key to sustainable development of machine tool manufacturing industry. This thesis presents ARM as the main chip, motion control chip MCX314, the operating system using μC / OS-II, to build a CNC system development hardware platform and software platform, to explore the new ways for numerical control system development and design. This thesis can be divided into: CNC system hardware platform structures, including ARM and external hardware selection, hardware interface design and testing; MCX314 hardware platform design and testing; Software Platform, including the use of real-time operating system μC / OS-II to achieve the mission of the NC system, scheduling, management, μC / OS-II transplantation on ARM; MCX314 hardware platform building and testing; application framework built , program design and testing. Test results showed that: ARM as the main chip, MCX314 as a motion controller of the CNC system is feasible, its motion performance can meet the design requirements.

APA, Harvard, Vancouver, ISO, and other styles

35

Yang, Xiao Qiang, Ya Ming Gao, Ying Liu, and Jun Han. "Study on Universal Testing Platform of Engineering Machinery." Applied Mechanics and Materials 33 (October 2010): 544–48. http://dx.doi.org/10.4028/www.scientific.net/amm.33.544.

Full text

Abstract:

Due to the multiple types and complexity of fault diagnosis, the general-purpose testing platform of engineering machinery’s hydraulic system is developed for the maintenance of military equipment. The general function and structure of the testing platform is presented. The hardware system consists of modular circuit, integrates control computer of embedded controller with PXI-interfaced modular instrument, program-controlled device, connector and adapter hardware. And the software program comprises data management module, fault diagnosis module coupled to the data acquisition module, signal processing module, experiment condition control module, database access module, system configuration and self-test as well as help module. Further, the hardware characteristics are showed and the principle of hydraulic testing platform is presented. The universal testing platform offers enormous benefits for fault diagnosis and condition monitoring of military equipment and machinery.

APA, Harvard, Vancouver, ISO, and other styles

36

Feng, Wei Dong, Ji Hui Pan, and Wen Xu. "Hardware System for Automotive Wiring Harness Testing Based on DAQ Instrument." Advanced Materials Research 791-793 (September 2013): 971–74. http://dx.doi.org/10.4028/www.scientific.net/amr.791-793.971.

Full text

Abstract:

With the development platform based on Advantech DAQ board, we have completed the design of multi-channel analog switch, decoding circuit and impedance testing circuit and built a good hardware platform for the automotive wiring harness testing system. Testing software is used to import different values into the digital I/O of data acquisition card of the hardware of to choose the tested points and then the voltage signal is read from every loop and the voltage signal is sent into the computer. Analyzing, processing, displaying is done by the testing software so that the hardware system becomes the development platform for Lab-VIEW software application.

APA, Harvard, Vancouver, ISO, and other styles

37

Зотин, Виталий, Vitaliy Zotin, Александр Власов, Aleksandr Vlasov, Леонид Потапов, and Leonid Potapov. "Automation of testing analog chips." Bulletin of Bryansk state technical university 2015, no. 3 (September 30, 2015): 19–23. http://dx.doi.org/10.12737/22947.

Full text

Abstract:

Possible options for automated testing of analog chips with universal testers «Formula 2K» and PXI hardware company «National Instruments», as well as through a dedicated tester TR9574 Hungarian company «EMG». Described by authors developed automated testers: ATIKOU (test chip comparators and operational amplifiers) and ATIAUDIO (test chip audio amplifiers).

APA, Harvard, Vancouver, ISO, and other styles

38

Samano-Ortega, Víctor, Alfredo Padilla-Medina, Micael Bravo-Sanchez, Elías Rodriguez-Segura, Alonso Jimenez-Garibay, and Juan Martinez-Nolasco. "Hardware in the Loop Platform for Testing Photovoltaic System Control." Applied Sciences 10, no. 23 (December 4, 2020): 8690. http://dx.doi.org/10.3390/app10238690.

Full text

Abstract:

The hardware in the loop (HIL) technique allows you to reproduce the behavior of a dynamic system or part of it in real time. This quality makes HIL a useful tool in the controller validation process and is widely used in multiple areas including photovoltaic systems (PVSs). This study presents the development of an HIL system to emulate the behavior of a PVS that includes a photovoltaic panel (PVP) and a DC-DC boost converter connected in series. The emulator was embedded into an NI-myRIO development board that operates with an integration time of 10 µs and reproduces the behavior of the real system with a mean percent error of 2.0478%, compared to simulation results. The implemented emulator is proposed as a platform for the validation of control systems. With it, the experimental stage is carried out on two controllers connected to the PVS without having the real system and allowing to emulate different operating conditions. The first controller is based on the Hill Climbing algorithm for the maximum power point tracking (MPPT), the second is a proportional integral (PI) controller for voltage control. Both controllers generate settling times of less than 3 s; the MPPT controller generates variations in the output in steady state inherent to the algorithm used. For both cases, the comparison of the experimental results with those obtained through software simulation show that the platform fulfills its usefulness when evaluating control systems.

APA, Harvard, Vancouver, ISO, and other styles

39

Hibbard, Michael, Seyedali Moayedi, Haleh Hadavand, and Ali Davoudi. "ATLAS TileCal low voltage power supply upgrade hardware and testing." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 936 (August 2019): 112–14. http://dx.doi.org/10.1016/j.nima.2018.10.198.

Full text

APA, Harvard, Vancouver, ISO, and other styles

40

Vath, Andreas, Zijad Lemĕs, Hubert Mäncher, Matthias Söhn, Norbert Nicoloso, and Thomas Hartkopf. "Dynamic modelling and hardware-in-the-loop testing of PEMFC." Journal of Power Sources 157, no. 2 (July 2006): 816–27. http://dx.doi.org/10.1016/j.jpowsour.2006.02.102.

Full text

APA, Harvard, Vancouver, ISO, and other styles

41

Khan, O., and S. Kundu. "Hardware/Software Codesign Architecture for Online Testing in Chip Multiprocessors." IEEE Transactions on Dependable and Secure Computing 8, no. 5 (September 2011): 714–27. http://dx.doi.org/10.1109/tdsc.2011.19.

Full text

APA, Harvard, Vancouver, ISO, and other styles

42

Nentwig, Mirko, Reinhard Schieber, and Maximilian Miegler. "Hardware-in-the-Loop Testing of Advanced Driver Assistance Systems." ATZelektronik worldwide 6, no. 4 (August 2011): 10–15. http://dx.doi.org/10.1365/s38314-011-0034-5.

Full text

APA, Harvard, Vancouver, ISO, and other styles

43

Monti, Antonello, Ferdinanda Ponci, Zhenhua Jiang, and Roger A. Dougal. "Hardware-in-the-Loop testing platform for distributed generation systems." International Journal of Energy Technology and Policy 5, no. 2 (2007): 241. http://dx.doi.org/10.1504/ijetp.2007.013034.

Full text

APA, Harvard, Vancouver, ISO, and other styles

44

Talanov, M. V., and V. M. Talanov. "Software and hardware solution for digital signal processing algorithms testing." E3S Web of Conferences 124 (2019): 03006. http://dx.doi.org/10.1051/e3sconf/201912403006.

Full text

Abstract:

The article describes the microprocessor system for various digital signal processing algorithms testing. The development of electric drive control systems is carried out with the usage of modeling systems such as, MATLAB/Simulink. Modern digital control systems are based on specialized digital signal microcontrollers. The present market offers evaluation boards, for example STM32F4DISCOVERY, which enables to connect a microcontroller to a personal computer. It makes possible to use the microcontroller as a part of the mathematical model of the control system. However, the designing of the control system simulation model and the program for the microprocessor is carried out in different programming environments. Thus, the software and hardware solution for testing programs for the microprocessor, which is a part of the control system, is relevant. This article deals with the designing of the modeling method in which the prototype program for the microprocessor is debugged as a part of the electric drive control system simulation model.

APA, Harvard, Vancouver, ISO, and other styles

45

Weng, Fang-Bor, Ay Su, Yur-Tsai Lin, Guo-Bin Jung, and Yen-Ming Chen. "Novel Testing Method for Fuel Cell Hardware Design and Assembly." Journal of Fuel Cell Science and Technology 2, no. 3 (January 31, 2005): 197–201. http://dx.doi.org/10.1115/1.1928929.

Full text

Abstract:

A simple, low-cost testing method is proposed for fuel cell hardware development. A perforated aluminum foil with an array of small holes covered with carbon paper or cloth replaces the membrane electrode assemblies to test the contact resistance and gas permeability of the carbon paper. Practical fuel cells of 50cm2 reaction area with different gasket thicknesses and compressed pressures are tested for performance. The results of ohmic resistance and permeability of compressed carbon paper indicate strong relevance to cell performance, demonstrating that this novel testing method is valuable for fuel cell hardware development. Also, the compression mechanism of the diffusion layer is discussed along with a proposal for a strategy for improving cell performance. After that, an advanced design of a 25cm2 single cell is developed. The results of cell performance of the advanced cell are acceptable and competitive with the performance data of commercial products.

APA, Harvard, Vancouver, ISO, and other styles

46

RAKOWSKY, U. K., and C. KURPANIK. "Hardware failure generation and injection for testing safety relevant wirings." Risk, Decision and Policy 8, no. 2-3 (May 2003): 151–60. http://dx.doi.org/10.1080/713926644.

Full text

APA, Harvard, Vancouver, ISO, and other styles

47

Wagner, J., R. Bruntsy, K. Kastery, D. Eagany, and D. Anthony. "A vision for automotive electronics hardware-in-the-loop testing." International Journal of Vehicle Design 22, no. 1/2 (1999): 14. http://dx.doi.org/10.1504/ijvd.1999.001857.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Pomeranz, I., and S. M. Reddy. "Testing of fault-tolerant hardware through partial control of inputs." IEEE Transactions on Computers 42, no. 10 (1993): 1267–71. http://dx.doi.org/10.1109/12.257713.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

Mamala, Jarosław, Sebastian Brol, and Mariusz Graba. "Engine Control Unit Testing by Hardware-in-the-Loop Simulation." Solid State Phenomena 214 (February 2014): 67–74. http://dx.doi.org/10.4028/www.scientific.net/ssp.214.67.

Full text

Abstract:

The article presents simulator of injection-ignition system of internal combustion engine with spark ignition developed at the Technical University of Opole. This system is based on Bosch series engine ECU with software 7.5. It allows to analyze of motor parameters using both on-board diagnostic system, and data network CAN BUS under different operating conditions of the system. For this purpose, the simulator is equipped with a number of additional devices enable to generate repetitive input signals for the ECU, allowing to open the actual working conditions. Crucial for the simulator was to generate the signals informing ECU about the instantaneous position of the crankshaft and camshaft. For this purpose, the module Arduino was used. This type of solution allows, to recreate momentary engine operating conditions. This article also presents the concept of development with new features and sentences feasible for this type of device and simulation mode.

APA, Harvard, Vancouver, ISO, and other styles

50

Schmid, Hermann, Edgar Müller, and Rainer König. "Using hardware-in-the-loop technology for testing telematics components." ATZelektronik worldwide 3, no. 2 (April 2008): 28–31. http://dx.doi.org/10.1007/bf03242164.

Full text

APA, Harvard, Vancouver, ISO, and other styles

Journal articles on the topic 'Hardware testing'

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles