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Books on the topic 'High-k material'

Author: Grafiati
Published: 4 June 2021
Last updated: 10 March 2023

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1

Tayal, Shubham, Parveen Singla, and J. Paulo Davim. High-k Materials in Multi-Gate FET Devices. Boca Raton: CRC Press, 2021. http://dx.doi.org/10.1201/9781003121589.

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2

Michel, Houssa, ed. High-K gate dielectrics. Bristol: Institute of Physics, 2004.

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3

Frank, Blackwell, Hohmann Charles 1945-, Maehr Jane, and High/Scope Educational Research Foundation, eds. High/Scope K-3 curriculum series. Ypsilanti, Mich: High/Scope Press, 1991.

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4

International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues (1st 2003 Salt Lake City, Utah). Physics and technology of high-k gate dielectrics I : proceedings of the International Symposium on High Dielectric Constant Materials : Materials Science, Processing, Reliability, and Manufacturing Issues, held in Salt Lake City, Utah, October 20-24, 2002. Edited by Kar S. 1942-, Electrochemical Society. Dielectric Science and Technology Division., and Electrochemical Society Electronics Division. Pennington, NJ: Electrochemical Society, 2003.

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5

High-K Gate Dielectric Materials. Taylor & Francis Group, 2020.

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6

Maity, Niladri Pratap, Reshmi Maity, and Srimanta Baishya. High-K Gate Dielectric Materials. Taylor & Francis Group, 2022.

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7

High-K Materials in Multi-Gate FET Devices. Taylor & Francis Group, 2021.

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8

Davim, J. Paulo, Shubham Tayal, and Parveen Singla. High-K Materials in Multi-Gate FET Devices. Taylor & Francis Group, 2021.

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9

Tayal, Shubham. High-K Materials in Multi-gate Fet Devices. Taylor & Francis Group, 2021.

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10

Davim, J. Paulo, Shubham Tayal, and Parveen Singla. High-K Materials in Multi-Gate FET Devices. Taylor & Francis Group, 2021.

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11

Houssa, Michael. High k Gate Dielectrics (Materials Science and Engineering). Taylor & Francis, 2003.

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12

Houssa, Michel. High K Gate Dielectrics. Taylor & Francis Group, 2003.

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13

Houssa, Michel, and M. Houssa. High K Gate Dielectrics. Taylor & Francis Group, 2010.

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14

Houssa, Michel. High K Gate Dielectrics. Taylor & Francis Group, 2003.

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15

Houssa, Michel. High K Gate Dielectrics. Taylor & Francis Group, 2003.

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16

Houssa, Michel. High K Gate Dielectrics. Taylor & Francis Group, 2003.

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17

Blackwell, Frank F., and Charles Hohmann. Science: Field Test Edition (High/Scope K-3 Curriculum Series). High/Scope Press, 1991.

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18

Maity, Niladri Pratap, Reshmi Maity, and Srimanta Baishya. High-K Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors. Apple Academic Press, Incorporated, 2020.

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19

Maity, Niladri Pratap, Reshmi Maity, and Srimanta Baishya. High-K Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors. Apple Academic Press, Incorporated, 2020.

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20

Maity, Niladri Pratap, Reshmi Maity, and Srimanta Baishya. High-K Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors. Apple Academic Press, Incorporated, 2020.

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21

Maity, Niladri Pratap, Reshmi Maity, and Srimanta Baishya. High-K Gate Dielectric Materials: Applications with Advanced Metal Oxide Semiconductor Field Effect Transistors. Apple Academic Press, Incorporated, 2020.

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22

Kim Young-Hee and Jack C. Lee. Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices). Morgan & Claypool Publishers, 2005.

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23

(Editor), H. R. Huff, C. A. Richter (Editor), M. L. Green (Editor), G. Lucovsky (Editor), and T. Hattori (Editor), eds. Ultrathin Sio2 and High-K Materials for Ulsi Gate Dielectrics: Symposium Held April 5-8, 1999 San Francisco, California, U.S.A. (Materials Research Society Symposium Proceedings). Materials Research Society, 1999.

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24

Water Works: A Physical Science Unit for High-Ability Learners in Grades K-1. Taylor & Francis Group, 2021.

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25

Physics and technology of high-k gate dielectrics II: Proceedings of the Second International Symposium on High Dielectric Constant Materials: Materials Science, Processing, Reliability, and Manufacturing Issues : held in Orlando, Florida, October 12-16, 2003. Pennington, N.J: Electrochemical Society, 2004.

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26

(Editor), Annette Bussmann-Holder, and Hugo Keller (Editor), eds. High Tc Superconductors and Related Transition Metal Oxides: Special Contributions in Honor of K. Alex Müller on the Occasion of his 80th Birthday. Springer, 2007.

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27

Bianconi, Antonio, Annette Bussmann-Holder, and Hugo Keller. High-Tc Copper Oxide Superconductors and Related Novel Materials: Dedicated to Prof. K. A. Müller on the Occasion of his 90th Birthday. Springer, 2017.

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28

Bianconi, Antonio, Annette Bussmann-Holder, and Hugo Keller. High-Tc Copper Oxide Superconductors and Related Novel Materials: Dedicated to Prof. K. A. Müller on the Occasion of his 90th Birthday. Springer, 2018.

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29

How States Are Creating Conditions for Use of High-Quality Instructional Materials in K–12 Classrooms: Findings from the 2021 American Instructional Resources Survey. RAND Corporation, 2022. http://dx.doi.org/10.7249/rra134-13.

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30

Skupio, Rafał. Zastosowanie nieinwazyjnych pomiarów rdzeni wiertniczych do zwiększenia informacji na temat parametrów skał zbiornikowych. Instytut Nafty i Gazu - Państwowy Instytut Badawczy, 2022. http://dx.doi.org/10.18668/pn2022.237.

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Abstract:
The research carried out in the monograph aimed to create a measurement and interpretation system which is to obtain reliable results of well logging with the accuracy of laboratory measurements. Continuous core measurements allow for the generation of logging results without the impact of the borehole and facilitate the depth matching of the core to well log data. Four main chapters can be distinguished in this work: research methodology with a description of the devices used; partial results of core measurements made on various types of rocks; a proposal for a research system, and comprehensive data interpretation for selected boreholes. The methodological part concerned the description of the equipment for continuous measurements of cores in the field of natural gamma radioactivity (K, U, Th) with the application for bulk density measurements using the gamma-gamma method, X-ray fl uorescence spectrometers (XRF) for measuring the chemical composition of rocks and computed tomography (CT) for imaging of the core structure as well as determination of radiological density in Hounsfi eld units (HU). Rock studies were carried out on material representing formations of diff erent lithologies, such as shales, sandstones, limestones, dolomites, anhydrite, siltstones and heterolithic sandstone-siltstone-claystone complexes. The results of measurements made using individual methods have been described in detail and compared with the results of laboratory measurements and well logging data. Test measurements with data processing and interpretation were made on the cores from five boreholes (T-1, O-4, Pt-1, L-7, P-5H), whereas a comprehensive interpretation of the results was carried out for three other boreholes (J-1, P-4, T-2). The new methodology of spectral gamma measurements made it possible to obtain precise concentrations of potassium, uranium and thorium in rocks with high and low radioactivity. The results made it possible to standardise the archival gamma-ray logs made with the Russian-type probes from imp/min to API standard units and to obtain data on the content of K, U, and Th in the core intervals. Using the Cs-137 source in the device for the gamma equipment made it possible to carry out measurements of the bulk density in g/cm3 units. The lithological interpretation based on XRF measurements and mineralogical-chemical models allowed to obtain logs with increased resolution and a more signifi cant number of minerals than was the case with the interpretation of the well logging. In addition, it has been shown that the XRF measurement methodology can be used during the geosteering procedure. The results of the core tests using the CT computed tomography method were presented in combined images and continuous curves of density in HU units. The experience and the presentation of the full scope of measurement and interpretation workflow allowed to propose a procedure for conducting a full range of analyses, considering various types of material provided for research. The procedure considers the full range of analyses as well as the measurements of selected parameters depending on the client’s needs. Keywords: petrophysics, core analyses, XRF spectrometry, computed tomography, gamma profiling, lithological interpretation
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31

Advanced Technologies for Next Generation Integrated Circuits. Institution of Engineering & Technology, 2020.

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