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1
Anchordoguy, Marie. "Chandler and Business History in Japan." Business History Review 82, no. 2 (2008): 301–8. http://dx.doi.org/10.1017/s0007680500062796.
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The work and ideas of Alfred D.Chandler Jr. have enriched the field of Japanese business history and our understanding of that nation's industrial development. Chandler's studies about the rise of the large, professionally managed, multidivisional firm in the United States highlight factors critical not only to the United States' capitalist system but also to Japan's. Indeed, large firms played a dominant role in Japan's economic takeoff in the late 1800s. As these companies grew, they were transformed into professionally managed corporations. Managers, operating in a clear hierarchical chain of command, built up huge companies, such as Nihon Denki (NEC), Toshiba, Mitsubishi Electric, Hitachi, Nippon Steel, Matsushita, and Toyota. In Japanese as in U.S. firms, the visible hand of management was critical to controlling the flow of work, from the input of raw materials to the production of finished goods.
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Aldrich, Henry C., and Donna S. Williams. "Inexpensive Digitization of an SEM." Microscopy Today 13, no. 2 (March 2005): 46–47. http://dx.doi.org/10.1017/s1551929500051506.
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Because of the high cost of Polaroid film, many years ago we fitted our Hitachi S-450 scanning electron microscope with a 35 mm camera. At that time, we used a Pentax ME Super, which was totally manual and had to have the film advanced by a hand lever. This was an annoyance, but when we set up the system, Polaroid Type 55 film was about $2.00 per photo, and the cost of 35 mm spooled in our lab ran about $.10 per photo.When we traded the Hitachi S-450 for the later Hitachi S-570, we moved the 35 mm system to this microscope. About 1999, when the Pentax ZX-50 with motorized film advance became available, we adapted it to the S-570, using the Pentax electric shutter release. The lens used with both of these cameras was an elderly 50 mm screw-mount Pentax Macro lens that focused well on the CRT of the SEM.
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Savage, T. S., R. Ai, and L. D. Marks. "UHV-TEM imaging of surface reconstructions in B-doped Si<111>." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 618–19. http://dx.doi.org/10.1017/s0424820100087409.
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A variety of techniques including LEED, STM and RHEED have been used to study surface reconstructions on the silicon <111> surface. Additionally, ultra high vacuum-transmission electron microscopy (UHV-TEM) has been used for a limited number of studies most notably on the 7x7 reconstructed surface. The limiting factor in these studies has been the availability of microscopes capable of in-situ sample preparation and imaging in a UHV environment. The Hitachi UHV-H9000 located at Northwestern University has recently been used to observe several surface reconstructions on a single crystal silicon <111> thin film. Transmission electron diffraction (TED) patterns were obtained for 7x7, and 5x1 surface reconstructions.
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Matsumoto, Takao, Takayoshi Tanji, and Akira Tonomura. "A high-resolution fraunhofer in-line electron holography." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1222–23. http://dx.doi.org/10.1017/s0424820100151945.
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In-line holography is advantageous in terms of contrast in imaging weak phase objects. However, most of the recent articles on electron holography had an off-axis configuration employing an electron biprism and were applied successfully only to objects with a rather strong phase shift such as magnetic flux and thin crystals. When it comes to the observation of considerably weak phase object, the off-axis method fails. We applied Fraunhofer in-line electron holography to observe an undecagold cluster, the core of which has a diameter of 0.82 nm, and obtained a high resolution image with high contrast that has been obtained neither by off-axis electron holography nor by conventional transmission electron microscopy.A Hitachi HF-2000 electron microscope equipped with a 200-kV cold field emission gun was used during the experiment. The specimen, Monoamino-Undecagold (NanoProbes, Inc., Stony Brook, N.Y.), was prepared in a highly dispersive form on a thin carbon film supported by a thick holey carbon film.
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Yang, Jiao, Xin Yu Wang, Peng Kai Li, Ji Fa Huang, and Peng Hao Deng. "Synthesis of Self-Supporting ZnO Nanowire Array Film and its Optical Property and Room Temperature Ferromagnetism." Materials Science Forum 1036 (June 29, 2021): 45–52. http://dx.doi.org/10.4028/www.scientific.net/msf.1036.45.
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X-ray diffractometer, field emission scanning electron microscope (SEM, Hitachi S-4800), laser confocal micro-region Raman spectrometer and vibration sample magnetometer were used to systematically study the effects of polyethyleneimine concentrations and exposure time on the morphology and size of ZnO nanowire arrays. The photoelectric property and the relationship between the morphology of nanowire arrays and ferromagnetism at room temperature were also analyzed. Under 15 min exposure time, when the polyethyleneimine concentration is 2.25 g / L, the obtained ZnO nanowire array film exhibits the smallest size, the optimal density and vertical orientation. According to the study of luminescence and room temperature magnetism, it is shown that the optical and ferromagnetic property are related to the variation tendency of oxygen defects and surface defects of the ZnO nanowires.
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Li, Chao Rong, Hu Yang, and Juan Li. "Rapid Fabrication of Large-Area SiO2 Nanoparticle Monolayer Films Via Water-Induced Interfacial Assembly." Applied Mechanics and Materials 528 (February 2014): 112–17. http://dx.doi.org/10.4028/www.scientific.net/amm.528.112.
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Water/toluene interfacial self-assembly of nanostructures is a powerful bottom-up approach for film fabrication because of the low cost and high efficiency, and it is a simple and universal method for almost all low-dimensional nanostructures. The method involved adding alcohol and then toluene (here the dispersant was itself alcohol, only toluene was added) into SiO2 nanoparticle dispersion, and then a large quantity of distilled water was rapidly poured into the mixed system. Simultaneously, nanoparticles in the dispersion were extracted to the water/toluene interface, forming a thin film with a nearly perfect hexagonal close packed phase. Large-area nanoparticle monolayer films (e.g., more than 20 cm2) could be prepared in less than 1 min. The close-packed structures of these thin films were verified by a field emission scanning electron microscopy (FESEM, Hitachi S-4800, Japan). We also investigated the whole process of forming the films and found out the mechanism of water-induced interfacial assembly. As for the specific kinetic mechanism of the fabrication process, it is expected to further study in later time.
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Kimoto, K., Y. Yahisa, T. Hirano, K. Usami, and S. Narishige. "Compositional separation in CoCrTa thin film as observed using a TEM with an imaging filter." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 480–81. http://dx.doi.org/10.1017/s0424820100138774.
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Cobalt chromium alloys are current longitudinal high-density recording media. Compositional features in the cobalt chromium thin films directly affect the magnetic and recording properties. Elemental analyses of the films have been performed by several methods, however, topological nature and crystallographic information are still ill-defined because of limitations in these methods.In the present study, elemental mapping of cobalt and chromium in a CoCrTa thin film has been quantitatively performed using a transmission electron microscope (TEM) with an imaging filter.A chromium underlayer (75nm thick) and a CoCrTa magnetic layer (27nm thick) were deposited on a Ni-P plated Al-Mg alloy substrate using direct current magnetron sputtering at a substrate temperature of 270°C. Target contents for sputtering of the CoCrTa film are shown in Table I. Energy-filtered images and electron energy loss spectra (EELS) were acquired using a TEM (Hitachi, HF-2000) equipped with an imaging filter (Gatan, imaging filter model 678). Because of the high brightness of a field emission gun, this system allows a small collection semiangle (4.4 mrad) and a narrow energy window (20-30 eV) for imaging.
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Liu, Y., H. Wang, J. Mazumder, and J. M. Rigsbee. "HRTEM Study of Sputtered Cu-6at% Ta Films." Microscopy and Microanalysis 3, S2 (August 1997): 409–10. http://dx.doi.org/10.1017/s143192760000893x.
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Cu-refractory metal composites such as Cu-Ta alloys are attracting research interest because of their potential high electrical and thermal conductivity and high mechanical strength at elevated temperatures [1]. In the previous study, it has been shown that the hardness of Cu-Ta is three times of the Cu substrate [2] and the Ta was found to exist as discrete particle and aligned particles. In this presentation, we report the detailed study on the microstructure of the heat treated film and hot-pressed film.The Cu-6at%Ta films were deposited on Cu foil at 100°C by RF co-sputtering. The films examined in this study was hot-pressed under 35 MPa pressure at Ar atmosphere for 1 hour. Cross-sectional TEM samples were examined using a Hitachi 9000 high resolution transmission electron microscope (HRTEM) at the Center for Microanalysis, Materials Research Laboratory, University of Illinois at Urbana-Champaign.
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Matsukawa, Daisaku, Hiroko Yotsuyanagi, Shiori Sakakibara, Noriyuki Yamazaki, Tetsuya Enomoto, and Takeharu Motobe. "Novel Low Temperature Curable Photosensitive Negative-tone Polyimide with Higher Resolution and Reliability." International Symposium on Microelectronics 2018, no. 1 (October 1, 2018): 000508–11. http://dx.doi.org/10.4071/2380-4505-2018.1.000508.
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Abstract Hitachi Chemical DuPont MicroSystems (HDMS) has been developing photo sensitive negative-tone polyimides (PIs) as dielectrics for re-distribution layers (RDLs) in wafer level packages (WLPs) and as protection layers in semiconductor ICs. Photo sensitive negative-tone PIs can simplify the manufacturing process and ensure high reliability owing to their good mechanical properties, high thermal stability, and high electrical properties. On the other hand, since advanced packaging application such as Fan-Out WLP (FO-WLP) requires finer L/S design as well as higher reliability, lithographic performance of PIs has to be further improved and good cured film property should be achieved when cured at lower temperature (<230 °C). In order to meet these requirements, HDMS started the development of new PI which shows enhanced lithographic performance with good film property. In this paper, we will demonstrate our novel low temperature curable photo sensitive solvent developable negative-tone PI. By adopting a new photo-package to improve lithographic performance, this PI can achieve 3 μm via opening at 5 μm cured thickness and 5 μm via opening at 10 μm cured thickness with smooth pattern profile after cure. In addition, this PI shows good film property when cured at 200 °C and no electrical failure is observed during 300h bias-HAST using 2/2 μm L/S pattern.
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Dineen, M. T. "Use of digital microscopy in process control during the manufacture of rubber-modified thermoplastics." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 616–17. http://dx.doi.org/10.1017/s0424820100165549.
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The production of rubber modified thermoplastics can exceed rates of 30,000 pounds per hour. If a production plant needs to equilibrate or has an upset, that means operating costs and lost revenue. Results of transmission electron microscopy (TEM) can be used for process adjustments to minimize product loss. Conventional TEM, however, is not a rapid turnaround technique. The TEM process was examined, and it was determined that 50% of the time it took to complete a polymer sample was related to film processing, even when using automated equipment. By replacing the conventional film portion of the process with a commercially available system to digitally acquire the TEM image, a production plant can have the same TEM image in the control room within 1.5 hours of sampling.A Hitachi H-600 TEM Operated at 100 kV with a tungsten filament was retrofitted with a SEMICAPS™ image collection and processing workstation and a KODAK MEGAPLUS™ charged coupled device (CCD) camera (Fig. 1). Media Cybernetics Image-Pro Plus software was included, and connections to a Phaser II SDX printer and the network were made. Network printers and other PC and Mac software (e.g. NIH Image) were available. By using digital acquisition and processing, the time it takes to produce a hard copy of a digital image is greatly reduced compared to the time it takes to process film.
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Collazo-Davila, C., E. Landree, D. Grozea, G. Jayaram, R. Plass, P. C. Stair, and L. D. Marks. "Design and Initial Performance of an Ultrahigh Vacuum Sample Preparation Evaluation Analysis and Reaction (SPEAR) System." Microscopy and Microanalysis 1, no. 6 (December 1995): 267–79. http://dx.doi.org/10.1017/s1431927695112672.
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Results concerning the calibration and use of a new ultrahigh vacuum (UHV) surface preparation and analysis system are reported. This Sample Preparation Evaluation Analysis and Reaction (SPEAR) side chamber system replaces an older surface side chamber that was attached to a Hitachi UHV H-9000 microscope. The system combines the ability to prepare clean surfaces using sample heating, cooling, ion milling, or thin film growth with surface analytical tools such as Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM), along with atomic surface structure information available from high-resolution transmission electron microscopy (HREM). The chemical sensitivity of the XPS and AES are demonstrated in preliminary studies of catalytic and semiconductor samples. In addition, the surface preparation capabilities are also demonstrated for the Si(100) and Ge(100) surfaces, including the ability to acquire secondary electron images during milling. During operation, the entire system is capable of maintaining the UHV conditions necessary for surface studies.
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Fairer, Jeffrey K., N. Ravishankar, Joseph R. Michael, and C. Barry Carter. "TEM Analysis of an Alumina Bicrystal Section Using a Fib." Microscopy and Microanalysis 7, S2 (August 2001): 326–27. http://dx.doi.org/10.1017/s1431927600027707.
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Grain boundary migration (GBM) during the sintering and densification of a polycrystalline ceramic material occurs as a result of mass transport across an interface. When there is a liquid film present, either due to additives used for liquid-phase sintering or unavoidable impurities in the material, the mass transport can be visualized in terms of dissolving material from one grain and precipitating it on another. in order to study the effects of crystallography on GBM in the presence of a liquid phase, alumina bicrystals have been fabricated with anorthite (CaA12Si208) glass films at the interface. The alumina-anorthite system in a bicrystal geometry is used because the pseudo-binary phase diagram of the system is well known, the bicrystal geometry allows for control over the original interface misorientation, and the glassy phase of anorthite is the most commonly occurring glass in commercially used alumina.Fig. 1 is a secondary-electron SEM image of an alumina bicrystal recorded using a field-emission SEM (Hitachi S900) operating at 5 kV.
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Frost, Bernhard, and David C. Joy. "Three Dimensional Mask Metrology by Off-Axis Electron Holography." Microscopy and Microanalysis 7, S2 (August 2001): 574–75. http://dx.doi.org/10.1017/s1431927600028944.
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Even though all real objects are three dimensional, imaging and metrology performed by using electron-beam tools such as scanning electron microscopes is inherently two dimensional. Any information about the third dimension must therefore be obtained by inference, or by time consuming special methods such as stereo-photogrammetry. If, however, the structures of interest are thin enough to be electron transparent then quantitative three dimensional metrology can be performed directly by using off-axis transmission electron holography. Here we demonstrate the application to a SCALPEL lithography mask which consists of chromium lines on a silicon support film. The off-axis holography was performed in a field emission transmission electron microscope, a Hitachi HF2000 operated at 200keV. The sample is positioned so that half the beam passes through the specimen while the rest travels only through the vacuum. An electrostatic biprism then recombines these two components to form the hologram which is recorded onto a CCD camera.
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Erlandsen, Stanley L., Carol L. Wells, Stephen B. Olmsted, ArDean Leith, and Michael Marko. "Application of the Sterecon System for the Determination of Area, Volume, and Linear Distance of Cell Surface Topography of Secondary and Backscatter Electron Stereoscopic Images in Low-Voltage Field Emission SEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1320–21. http://dx.doi.org/10.1017/s0424820100131231.
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Extraction of quantitative information on surface topography in SEM can.be accomplished with, stereoscopic visual parallaxes. This method has received little attention in the last decade and to our knowledge has not been applied to high resolution secondary or backscatter electron images from field emission SEM. The STERECON system was developed for 3-D reconstruction of cells from stereo images obtained by high voltage EM. The present study describes the application of STERECON to quantitative determination of volume, surface area, and linear distance of topographical features in high resolution SEM.Trophozoites of the free-living protozoan, Hexamita inflata, and two bacterial species (Proteus mirabilus and Enterococcus faecalis) were fixed in 2.5-3.0% glutaraldehyde, dehydrated in ethanol, critical point dried in CO2, and coated with about 1 nm of platinum before examination at low kV (<4.0) in a Hitachi S-900 field emission SEM equipped with secondary (Se) and backscatter (YAG scintillator) detectors and photographed on Polaroid type 52 film using a stereo tilt of 8°.
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Treacy, M. M. J., M. E. Bisher, and A. J. Jacobson. "Hollow-cone analysis of intercalated particles in layered H(Ca2Nan-3NbnO3n+1) materials." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 748–49. http://dx.doi.org/10.1017/s042482010014957x.
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The series of compounds H(Ca2Nan-3NbnO3n+1) form tetragonal perovskite-related layer structures that are strongly bound in two dimensions, but more weakly bound in the third. These materials can be delaminated by intercalating basic surfactant molecules into the layers, which spontaneously exfoliate the structure to form stable dispersions in a polar solvent. On drying a diluted droplet of this dispersion on an amorphous carbon film supported on a TEM specimen grid, all sheets are observed to lie flat on the carbon, with the thin tetragonal c-axis parallel to the optic axis. Typical sheet dimensions are 1 μm × 1 μm × 1.4 nm. Layered materials prepared in this way make fascinating specimens for transmission electron microscopy because the thickness, composition and orientation are known. Depending on the dispersion density, sheets will occasionally overlap with parallel c axes, but with random relationship between the a axes.Layers of exfoliated H(Ca2Nb3O10) material were examined in a Hitachi H9000NAR microscope equipped with a high angle electronic hollow cone unit.
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Liu, J., and G. E. Spinnler. "Observation of a supported metal catalyst in an ultra-high-resolution field-emission SEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 784–85. http://dx.doi.org/10.1017/s0424820100149751.
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Zeolites loaded with noble-metal particles are interesting catalytic systems. The relative positions of small metal particles on and within the support structure may have significant consequences for catalytic activity. Small metal particles dispersed on model and commercial catalyst supports have been observed by using secondary and Auger electrons in a UHV STEM. In this paper we further report preliminary results of observing a metal/zeolite catalyst in a commercial high-resolution field-emission SEM and investigate the contrast variations of SEM images with the change of incident beam energies.Metal-loaded zeolite samples were ground to fine powders and were dispersed onto a thin holey carbon film coated on a copper grid. The samples were directly observed without being coated with conducting materials. Such coating would obscure fine-scale surface details and make imaging of small metal particles impossible. The experiments were performed in a field-emission Hitachi S-5000 SEM, operating from 0.5 to 30 kV.
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Kenik, E. A., and M. Nastasi. "Disordering and phase decomposition of a nickel-aluminum intermetallic under lowtemperature electron irradiation." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 774–75. http://dx.doi.org/10.1017/s042482010010593x.
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In situ electron irradiations at 300 and 1000 kV have been performed at 100 and 300 K on Ni2Al3 for comparison with its response under ion irradiation. In addition, the behavior of Ni2Al3 will be compared to that of NiAl3 reported previously. Thin multilayered films of alternating nickel and aluminum were electron beam deposited onto a NaCl substrate. The substrate was dissolved in deionized water and the Ni/Al film was mounted on 3 mm diam grids. The films were vacuum annealed for 1—2 h at 623 K to allow interdiffusion between the layers. Electron diffraction indicated that the films were fine-grained (∼20 nm diam) Ni2Al3, which is the prototype for the hexagonal D513 structure. No appreciable amount of other phases was detected.The specimens were irradiated with 1000 kV electrons in a Hitachi HU-1000B or with 200—300 kV electrons in Philips EM430 and CM30 microscopes. All three microscopes are equipped for nominal room temperature or low temperature (∼100 K) irradiations.
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Kholov, P. A., N. V. Gaponenko, K. V. Shaidakova, V. I. Krymski, V. A. Filipenya, T. V. Petlitskaya, V. V. Kolos, and A. N. Pyatlitski. "CONDENSER STRUCTURES BASED ON BARIUM TITANATE FILMS FORMED BY SOL-GEL METHOD." Doklady BGUIR, no. 1 (March 6, 2020): 74–80. http://dx.doi.org/10.35596/1729-7648-2020-18-1-74-80.
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The objective of the work is investigation the dielectric permittivity and dielectric loss tangent of BaTiO3 films in a capacitor structure formed by sol – gel method on a Si/TiOx/Pt substrate. The basis of this capacitor is a four-layer film of barium titanate xerogel with a thickness of about 200 nm. The film was synthesized by sol-gel method at a final annealing temperature 750 °C. The problems related to the development of method of forming multilayer capacitor structures, the analysis of the morphology and phase composition of BaTiO3 film, and also the measurement of the capacitance-voltage characteristics in the frequency range 10 kHz – 2 MHz have been solved. Morphology of the films was analyzed using a Hitachi S-4800 scanning electron microscope. X-ray diffraction spectra was recorded using a DRON-3 automated diffractometer, using monochromatic CuKα radiation. Capacitance-voltage characteristics were obtained using a B1500A semiconductor analyzer. Dielectric constant and dielectric loss tangent, calculated for capacitance measurements, are changed as follows: for a bias voltage of U = 0 V, the change in ε is 232–214, and tanδ 0.022–0.16, and for a bias voltage of U = 10 V, ε occurs in the range 135–124 and tanδ from 0.02 to 0.1. The obtained frequency dependences of the dielectric constant of BaTiO3 films show a decrease in the dielectric constant in the range of 10 kHz – 2 MHz. It was found that, with a BaTiO3 film thickness of less than 100 nm, a thin-film capacitor with a lower platinum electrode is not always formed, which is probably caused by shunting of the structure.
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Yagi, Tōru. "Fire, Prayer, and Purification." Journal of Religion in Japan 9, no. 1-3 (September 22, 2020): 195–212. http://dx.doi.org/10.1163/22118349-00901010.
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Abstract Kyoto is home to a number of unique year-end festivals. This article focuses on traditions that occur during Shimotsuki and Shiwasu (the eleventh and twelfth months of the old Japanese lunisolar calendar), including the fire festivals of O-hitaki, Niinamesai, and Daikondaki; events that celebrate visiting deities, such as Daishikō; and purification rites of Shintō, Buddhist, and folk tradition, such as Kakure nenbutsu, Butsumyōe, and Sekizoro. Analysis and comparison of these rituals reveals a common motivation for their origin. As the power of the sun wanes with the winter solstice, the people of Kyoto in the past felt a need to reflect on the previous year, cleanse themselves of accumulated sin and misfortune, and pray that the coming year would bring peace, fortune, and a fertile harvest.
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Veilleux, G., M. Boumerzoug, R. G. Saint-Jacques, and Lê H. Dao. "TEM studies of pulse electrodeposited Cu-Se and CuInSe2 films." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 696–97. http://dx.doi.org/10.1017/s0424820100176617.
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Photovoltaic technology is considered as one of the major options for large-scale energy production without pollution. Thin-film technologies are seen as a potential approach to produce cost-effective electricity by photovoltaic. Among the different thin-film deposition techniques (CVD, vacuum evaporation, sputtering, etc.), electrodeposition has emerged as a low-cost method. Using a pulsed electrodeposition technique semiconductor thin films of Cu-Se and CuInSe2 with improved uniformity and lower impurity have been prepared. Varying the electrodeposition solution pH, stoichiometric CuSe, Cu3Se2, Cu2 Se and Cu2Se films on Indium Tin Oxide (ITO) coated glass or Ni electrodes were obtained. Their composition and properties varied with heat treatment (3).This paper reports the detailed study by Energy-Dispersive Spectrometry (EDS) and Transmission Electron Microscopy (TEM) of heat treatment effects on the composition and phase changes. EDS analyses were done on films deposited onto ITO glass using an Hitachi S-530 Scanning Electron Microscope (SEM). Cerac 99.99% pure powders were used to establish EDS calibration spectra. TEM studies were done on films directly deposited onto Ni grids. Selected area diffraction pattern (SADP) analyses were used to identify the structures. Samples were examined in a Philips EM-300 TEM operated at 100 kV.
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Moretz, R. C., James J. Crute, and K. R. Peters. "Differential Contrast Imaging of High Resolution TEM Micrographs of Rotary Shadowed Heterodouplex Protein Complexes." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 66–67. http://dx.doi.org/10.1017/s042482010016279x.
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The resolution attainable from rotary shadowed molecules is limited by sample preparation method, the distribution of the metal through the shadowing procedure and the grain structure of the metal film. Utilizing very thin metal coats (less than a few 0.1 nm measured perpendicular to the substrate) and metals that form small grain sizes improves the resolution. Differential hysteresis (DH) processing of the micrograph data offers the opportunity to utilize the full range of contrast information present in the images and to improve the structural analysis and interpretation of high resolution rotary shadowed macromolecules. A protein complex of interest that shows varying structures in the presence or absence of ATP was prepared by glycerol spray onto freshly cleaved mica. The mica was placed on the stage of a Cressington CFE-50 and dried in vacuo for 5 min. Samples were rotary shadowed with 0.2 nm W/Ta (measured on the support) at 5° incident angle, followed by stabilization with 2.5 to 3.0 nm C. Replicas were examined in a Hitachi H-7000 with a LaB6 gun at 100 kV at direct magnifications of 100,000x. Micrographs were taken on Kodak type 4489 EM film at one f-stop higher than for standard silver halide printing to provide a full gray scale data file during digitization.
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Choi, Ju-Hwan, Changmo Sung, Lawrence F. Allard, and Kyung HoShin. "The Effects of P and Pt on the Microstructure of Co-Cr-P-Pt Thin Film Magnetic Recording Media." Microscopy and Microanalysis 3, S2 (August 1997): 531–32. http://dx.doi.org/10.1017/s1431927600009545.
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Because of their high coercivity, cobalt alloy thin films are among the most popular materials used for ultra-high density longitudinal magnetic recording media. The recording and magnetic properties of the materials are related to their microstructure; in particular, depletion of Co in a grain boundary phase, and physical separation of the grains act to increase coercivity and thus to produce low noise media. We are studying a new alloy system comprising 18 nm thick Co-Cr-P-Pt films (Mr.t ≈ 0.9 memu/cm2), prepared by DC sputtering. A coercivity of 2600 Oe or higher was obtained in these films even when they were deposited without heating the substrate or applying a bias voltage. The effects of P and Pt addition were characterized by high-resolution TEM coupled with energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). A Hitachi HF-2000 field emission TEM was used to image both low P (≈ 6 at. %) and high P (≈ 12 at. %) samples, and to provide a 1 nm beam for high spatial resolution EDS and EELS.
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Peters, Klaus-Ruediger, William H. Martin, and Eisaku Oho. "Digital imaging with field emission scanning electron microscopes (FSEM)." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1276–77. http://dx.doi.org/10.1017/s0424820100131012.
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Digital image acquisition and display of field emission scanning electron micrographs face limitations in terms of detail recognition, sampling of high resolution information, image output and storage space for high pixel density images. The image acquisition and image output of a JEOL JSEM-890 “in lens” field emission SEM were digitized and several approaches for adequate access to the scanned electron probe data have been developed. Images are acquired digitally in 3×4 VGA format (in multiples of 640×490 pixels) and stored in a RECOGNITION CONCEPTS INC. image processor (Trapix Plus). The images are displayed on workstation monitors with 1280×1024 format (HITACHI CM2085MU), and image documentation is done by several techniques of varying output quality. Low quality image documentation on plain paper can be obtained using a laser jet printer (HEWLETT PACKARD: Laser Jet III). High quality output is provided by a video printer utilizing special but inexpensive paper (SEIKOSHA VP350H). In addition, conventional analog CRT output and CRT photography on 4×5 inch POLAROID (Type 55 Positive/Negative) film is used.
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Yoshida, T., H. Kasai, J. E. Bonevich, T. Matsuda, and A. Tonomura. "Lorentz microscopy observation of vortex dynamics due to transport current." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 366–67. http://dx.doi.org/10.1017/s0424820100138208.
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At present, Lorentz microscopy is the only one method to visualize individual vortices in superconductors and observe their motion in real time. Using this technique, we have investigated the fascinating vortex dynamics in superconductors, niobium and BSCCO. And recently we applied it to investigate current driven vortex motion.The vortices are driven by the Lorentz force due to the transport current, and begin to move. This couses the vortex to dissipate the energy i.e., causes the resistive state in the superconductor. Therefore to clarify the vortex motion is important especially in the relation with vortex pinning.The sample we examined was niobium thin film, which was single-crystallized by annealing and thinned by chemical etching. It was put in the low temperature specimen stage specially developed for the vortex observation, which was installed in 350 kV FE-TEM based Hitachi H-9000.We observed current driven vortex motion in the temperature (T) range from 4.5 K to Tc = 9.25 K and in a (externally applied) magnetic field (B) up to 100 Gauss.
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Hirayama, T., Q. Ru, T. Tanji, and A. Tonomura. "Application of electron holography to material science studies on magnetic domain states of small particles." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 1028–29. http://dx.doi.org/10.1017/s0424820100150976.
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The observation of small magnetic materials is one of the most important applications of electron holography to material science, because interferometry by means of electron holography can directly visualize magnetic flux lines in a very small area. To observe magnetic structures by transmission electron microscopy it is important to control the magnetic field applied to the specimen in order to prevent it from changing its magnetic state. The easiest method is tuming off the objective lens current and focusing with the first intermediate lens. The other method is using a low magnetic-field lens, where the specimen is set above the lens gap.Figure 1 shows an interference micrograph of an isolated particle of barium ferrite on a thin carbon film observed from approximately [111]. A hologram of this particle was recorded by the transmission electron microscope, Hitachi HF-2000, equipped with an electron biprism. The phase distribution of the object electron wave was reconstructed digitally by the Fourier transform method and converted to the interference micrograph Fig 1.
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Apkarian, R. P. "Condenser/objective lens SE-I Imaging of chromium-coated biological specimens using a Schottky field emission source." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 68–69. http://dx.doi.org/10.1017/s0424820100152318.
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We have had experience with high resolution SE-I enriched imaging of chromium(Cr) coated soft and hard biological tissue. SEMs equipped with condenser/objective (c/o) lens stages and LaB6(ISI DS-130) or cold cathode field emission (CFE)(Hitachi S-900) sources operated at high voltage(15-30 KeV) were assessed by the comparison of emission properties and image contrasts generated from ferritin test specimens. Practical source performance during the imaging of metal coated bulk biological tissues is subject to the metal film quality which is responsible for generating accurate topographic contrasts at high magnifications of biologically significant structures in the 1-10 nm range. Recently a thermionically assisted Schottky field emission source(SFE) has been designed for the c/o lens optics of the ISI DS-130 SEM. A practical consideration for the imaging of biological microdomains at high magnification must be: how does the SFE source compare with the LaB6 emitter on the same optical column and can the SFE compare with the CFE for producing quality ultrahigh magnification (500,000x) topographic contrasts in the nanometer range.
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Kola, R. "Analysis of transition metal induced surface defects in silicon following apid thermal processing." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 458–59. http://dx.doi.org/10.1017/s0424820100154263.
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Rapid Thermal Processing(RTP) is extensively used in VLSI technology for implant activation, licidation, oxidation, and passivation glass reflow. The diffusion of back-side depositions of transition metals during rapid thermal annealing and the resulting front-side defect formation in silicon has recently been investigated by several authors but a detailed analysis of the defect structure, morphology, and chemistry is lacking. The defect structure and chemistry on both the front and back sides of the wafers ter RTA were investigated by TEM on plan-view and cross-section foils. A Philips EM430 microscope ierating at 300 KeV and a Hitachi H-800 microscope operating at 200 KeV were used. Ni and Cu sputter deposited on the back-side of 4 inch diameter (100) Si wafers were diffused for 10 sec at 1150°C in trogen ambient. The thickness of the metal film was 50 nm. A Heatpulse 2101 RTA system was used.Fig. 1 is a CDF micrograph showing a group of precipitates on the front surface of a sample nickel diffused from the back surface.
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Frost, B., D. C. Joy, and E. Voelkl. "Investigations on electric charging by electron holography." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 766–67. http://dx.doi.org/10.1017/s0424820100171560.
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The electric charging of latex spheres was investigated by electron holography using a Hitachi HF-2000 field emission electron microscope. In order to get fringe spacings smaller than 1/20 of the diameter of the spheres (0.264 μm and 2.68 μm) and interference widths of at least twice the sphere diameter, we used different magnification modes. The low magnification mode was achieved by switching off the objective lens and imaging the specimen by the intermediate lens. For higher magnifications the specimen was imaged by the objective lens which operated as an electron optical magnifier, i.e. the front focal plane was situated above the specimen.For easiest interpretation of the reconstructed phase distributions, a high symmetry of the sample is of advantage. Therefore we eliminated any unknown electric interaction between a supporting film and the charged sphere by placing the sphere at the edge of a bar of the copper grid. In that case the charge image method can be used as a simple model to evaluate the distribution of the electric potential.
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Ai, R., H. J. Fan, and L. D. Marks. "HREM Study of electron-induced surface radiation damage in ReO3." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 636–37. http://dx.doi.org/10.1017/s0424820100087495.
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It has been known for a long time that electron irradiation induces damage in maximal valence transition metal oxides such as TiO2, V2O5, and WO3, of which transition metal ions have an empty d-shell. This type of damage is excited by electronic transition and can be explained by the Knoteck-Feibelman mechanism (K-F mechanism). Although the K-F mechanism predicts that no damage should occur in transition metal oxides of which the transition metal ions have a partially filled d-shell, namely submaximal valence transition metal oxides, our recent study on ReO3 shows that submaximal valence transition metal oxides undergo damage during electron irradiation.ReO3 has a nearly cubic structure and contains a single unit in its cell: a = 3.73 Å, and α = 89°34'. TEM specimens were prepared by depositing dry powders onto a holey carbon film supported on a copper grid. Specimens were examined in Hitachi H-9000 and UHV H-9000 electron microscopes both operated at 300 keV accelerating voltage. The electron beam flux was maintained at about 10 A/cm2 during the observation.
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Dusch, Ruth, and W. Kraft. "Serum-Gesamtprotein, -Albumin und -Globuline beim Hund." Tierärztliche Praxis Ausgabe K: Kleintiere / Heimtiere 32, no. 01 (2004): 45–49. http://dx.doi.org/10.1055/s-0037-1622392.
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ZusammenfassungIn 406 Serumproben gesunder Hunde im Alter zwischen sechs Wochen und 16 Jahren, die 69 Rassen angehörten oder Mischlinge waren und in neun Altersgruppen eingeteilt wurden, erfolgte die Untersuchung von Gesamtprotein nach der Biuret-Methode, von Albumin mithilfe von ALB plus der Firma Roche jeweils mit dem Autoanalyser Hitachi 717 und die Bestimmung der α1-, α2-, β-und γ-Globulin-Fraktionen mit der Zellulose-Azetatfolien-Elektrophorese. Für jedes untersuchte Merkmal konnte eine signifikante Altersabhängigkeit nachgewiesen werden. Der Gesamtproteingehalt stieg lebenslang von 45,5 ± 1,6 g/l bei sechs Wochen alten Hunden auf 66,1 ± 4,4 g/l bei über zehnjährigen an. Anstiege zeigten sich auch bei der Konzentration von Albumin (von 30,0 ± 1,8 auf 36,8 ± 3,2 g/l), der α2-Globuline (von 2,8 ± 0,4 auf 5,7 ± 1,2 g/l), der β-Globuline (von 6,3 ± 1,0 auf 13,5 ± 1,6 g/l) sowie der γ-Globuline (von 1,8 ± 0,3 auf 3,9 ± 0,6 g/l). Lediglich die Konzentration der α1-Globuline nahm im ersten Lebensjahr von 4,1 ± 0,4 auf 3,4 ± 0,7 g/l ab. Die altersabhängigen Unterschiede sollten bei der Beurteilung von Laborergebnissen bei kranken Hunden berücksichtigt werden.
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Kotula, P. G., D. D. Erickson, and C. B. Carter. "The use of high-resolution FESEM to study solid-state phase transformations and reactions." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1028–29. http://dx.doi.org/10.1017/s0424820100172875.
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High-resolution field-emission-gun scanning electron microscopy (FESEM) has recently emerged as an extremely powerful method for characterizing the micro- or nanostructure of materials. The development of high efficiency backscattered-electron detectors has increased the resolution attainable with backscattered-electrons to almost that attainable with secondary-electrons. This increased resolution allows backscattered-electron imaging to be utilized to study materials once possible only by TEM. In addition to providing quantitative information, such as critical dimensions, SEM is more statistically representative. That is, the amount of material that can be sampled with SEM for a given measurement is many orders of magnitude greater than that with TEM.In the present work, a Hitachi S-900 FESEM (operating at 5kV) equipped with a high-resolution backscattered electron detector, has been used to study the α-Fe2O3 enhanced or seeded solid-state phase transformations of sol-gel alumina and solid-state reactions in the NiO/α-Al2O3 system. In both cases, a thin-film cross-section approach has been developed to facilitate the investigation. Specifically, the FESEM allows transformed- or reaction-layer thicknesses along interfaces that are millimeters in length to be measured with a resolution of better than 10nm.
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Lindsey, E. F., C. W. Price, E. L. Pierce, and E. J. Hsieh. "SEM analysis of DC magnetron sputtered beryllium films." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 960–61. http://dx.doi.org/10.1017/s0424820100106867.
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Columnar structures produced by DC magnetron sputtering can be altered by using RF biased sputtering or by exposing the film to nitrogen pulses during sputtering, and these techniques are being evaluated to refine the grain structure in sputtered beryllium films deposited on fused silica substrates. Beryllium is brittle, and fractures in sputtered beryllium films tend to be intergranular; therefore, a convenient technique to analyze grain structure in these films is to fracture the coated specimens and examine them in an SEM. However, fine structure in sputtered deposits is difficult to image in an SEM, and both the low density and the low secondary electron emission coefficient of beryllium seriously compound this problem. Secondary electron emission can be improved by coating beryllium with Au or Au-Pd, and coating also was required to overcome severe charging of the fused silica substrate even at low voltage. The coating structure can obliterate much of the fine structure in beryllium films, but reasonable results were obtained by using the high-resolution capability of an Hitachi S-800 SEM and either ion-beam coating with Au-Pd or carbon coating by thermal evaporation.
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Saito, Yoshio, Chihiro Kaito, and Shigeo Maeda. "Growth and morphology of NaCl-type crystals prepared by various methods." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 848–49. http://dx.doi.org/10.1017/s0424820100177374.
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NaCl type crystals generally grow a cube. NaCl-type crystals with rhombic prism shape have been found among the cube crystals. No convincing interpretation for the rhombic prism crystals has been given. The growth mechanisms of some crystals have been clarified by means of potetial energy calculations in previous papers. In the present paper, free energy of NaCl type crystals having various shapes have been calculated in order to make clear the origin of the appearing of the rhombic prism crystals. The growth mechanism is discussed on the basis of the free energy.NaCl crystals were grown from aqueous solution in a glass made growth cell thermostated with circulating water(±l⋅C). The NaCl crystals were grown at temperature of 50°C which is equivalent to the supersaturation of 2%. The grown crystals were mounted on a net and were dried with a filter paper as quickly as possible. The specimens were examined by a microscope. PbS crystals are prepared by the two-heater method which have been developed to produce ultrafine particles of low melting materials. The detail of the preparation has been shown in a previous paper. The grown crystals collected on a carbon film supported by an electron microscope grid were observed with a Hitachi H-9000 electron microscope.
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Nadaraja, Shri Kumaran, and Boon Kar Yap. "In depth study of lead frame tape residuein quad flat non-leaded package." Microelectronics International 36, no. 4 (October 7, 2019): 129–36. http://dx.doi.org/10.1108/mi-12-2018-0077.
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Purpose Lead frame tape is a crucial support for lead frames in the IC assembly process. The tape residue on the quad flat non-leaded (QFN) could result in low reliability and failure in electrical conductivity tests. The tape residue would affect overall performance of the chips and contribute to low pass yield. The purpose of this paper is to present an in-depth study of tape residue and factors that may affect it. Design/methodology/approach An experiment using lead frame and tapes from three manufacturers with two types of die bond adhesives, namely, die attach film (DAF) and wafer back coating (WBC), was conducted. Copper (Cu) wire bonding and die bonding performances were measured in terms of process capability, stitch bond strength and die attach strength. Findings Results showed that no tape residue was observed on the thermoplastic adhesive-based lead frames manufactured by Hitachi after the de-taping process because of the tape’s thermoplastic adhesive properties. Originality/value This paper studies the occurrence of tape residue and a viable solution for it through the correct process optimization and combination of semiconductor manufacturing materials. Factors that may affect tape residue have also been studied and further research can be done to explore other options in the future as an alternate solution.
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Erlandsen, Stanley L., Stephen Olmsted, Paul Walther, Ya Chen, Jim Pawley, Gary Dunny, and Carol L. Wells. "A microbial model for visualization of surface proteins using cryoimmobilization and high-resolution cryo-SEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 44–45. http://dx.doi.org/10.1017/s0424820100146060.
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Numerous studies on high resolution visualization of surface membrane proteins have utilized colloidal gold markers in conjunction with SEM, TEM, and by freeze-fracture cytochemistry using conventional or fracture flip methods, but in each case only information on the distribution of the marker complex, and not the actual structure of individual surface protein(s) was obtained.To investigate the detection of individual surface proteins, we have used a microbial model to examine surface proteins involved in conjugation or the transfer of DNA in Enterococcus faecalis. Two surface proteins encoded by the pCF10 plasmid, aggregation substance (Asc10; globular shape) and surface exclusion protein (Sec10; helical shape), mediate the aggregation of donor and recipient cells and prevent aggregation of like donor cells, respectively. Isogenic strains of E. faecalis that constitutively express neither Asc10 or Sec10 (pWM401) or both (pINY1801) were processed by 1) conventional chemical fixation, dehydration, critical point drying with CO2, ion beam sputtering with a discontinuous platinum film (<1 nm), and examination in a Hitachi S-900 FESEM operated at low voltage (<3 keV), or 2) cryoimmobilization of cells by high pressure freezing (Balzers HPM 010), mounting in a Gatan cryoholder followed by etching for 60 minutes at −100°C, cryocoating by planar magnetron sputtering (Balzers MED 010), and examination at −100°C in the S-900 FESEM.
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Price, C. W. "Comparison of Low-and High-Voltage SEM Images of Beryllium." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 400–401. http://dx.doi.org/10.1017/s0424820100180756.
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Beryllium has a low secondary electron (SE) coefficient that produces a low signal-to-noise ratio, and in the past, this deficiency caused many workers to routinely coat beryllium with a high-Z material such as Au/Pd and examine the specimens at high voltage (HV). In principle, beryllium should be an ideal candidate for improved imaging with low voltage (LV), because its low atomic number permits excessive electron-beam penetration during HVSEM imaging — the use of LVSEM to analyze beryllium films was demonstrated previously. Unfortunately, low SE emission can seriously compromise LVSEM images from uncoated beryllium specimens, even with the improved LVSEM imaging capability of a SEM equipped with a field-emission gun (FESEM). This work demonstrates that some beryllium structures yield improved results with LVSEM imaging in a FESEM, particularly at low magnifications, while structures that require high magnification often yield better results with HVSEM.Specimens selected for this study include craters formed by a Cs+ ion beam in specimens that had been analyzed in an ion microanalyzer by secondary-ion mass spectroscopy (SIMS), machined surfaces, and fracture surfaces. SE images were obtained for this study with a Hitachi S-800 FESEM equipped with a cryogenic vacuum pumping system.Surface structure in a sputtered SIMS crater is shown at 2.0 kV in Fig. 1a and at 20 kV in Fig. 1b. This specimen was from commercial grade beryllium sheet. Prominent microtwins are visible in several grains in Fig. 1, and because of the excessive beam penetration at HV, the microtwins are better defined at LV in Fig. 1a than they are at HV in Fig. 1b. In addition, a fine faceted microstructure was formed by the ion beam that could be observed at intermediate magnifications, and it also was better defined at LV than at HV. The dark contamination film that is visible around some of the particles in Fig. 1a also is significant; this film was not apparent at voltages of 5 kV and higher, as demonstrated in Fig. 1b. SIMS ion images revealed that this material contained particles of several different compositions including carbides; since beryllium carbide hydrolyzes when exposed to moist air, the films are suspected to have formed by the decomposition of carbides when the specimen was removed from the ion microanalyzer after the SIMS analysis. This example demonstrates the excellent sensitivity of LVSEM to detect thin films, and it also suggests that contamination and the thin oxide film that forms on beryllium may impair SE imaging.
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Li, D. X., B. M. Davis, D. N. Seidman, and J. B. Ketterson. "High Resolution Electron Microscopy Study of Cu-Pd Superlattice." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 78–79. http://dx.doi.org/10.1017/s0424820100179142.
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Considerable interest has been generated in metallic superlattice structures by the discovery of anomalous variations in their physical properties as a function of layer thickness. We have prepared Cu-Pd superlattice samples consisting of 400 alternating layers of Cu and Pd, and with modulation wavelengths in the range 1.4-4.0 nm by dual electron beam evaporation. in a UHV system. Prior to depositing a superlattice film, a Cu buffer layer with a thickness of 130 nm was deposited onto a cleaved mica substrate. In order to study the growth morphology, crystal structure and atomic ordering near the interface, both plan-view and cross-sectional specimens of a Cu-Pd superlattice film have been studied using an Hitachi H-9000 high resolution electron microscope.Fig. 1 is a typical cross-sectional TEM image of the as deposited Cu-Pd superlattice film, showing the morphology of the growth of the crystallites and the crystal structures of the mica substrate, Cu buffer layer and Cu-Pd superlattice. The TEM image clearly shows a structure consisting of alternating layers of Cu and Pd with the expected thicknesses of approximately 1.15 nm. In this image the light and dark contrast regions are associated with the Cu and Pd layers, respectively. Fig. 2 shows a cross-sectional HREM image of the interface between the mica substrate and the Cu buffer layer. The interface, indicated by arrows, is uneven and the Cu buffer layer contains some textured polycrystalline grains, with a mean diameter of 10 nm. Many defects are observed in the Cu buffer layer. Fig. 3 is a cross-sectional HREM image of the Cu-Pd superlattice, along the [110] orientation, showing clear evidence of epitaxial stacking. The interface between the Cu and Pd layers is not atomically sharp, and the degree of abruptness of the interface between the Cu and Pd layers was within two to three monolayers. The structural coherence of the crystal planes was found to extend over several composition modulation periods, and was limited by the presence of structural defects. Many misfit dislocations were observed at the Cu-Pd interface, as indicated by arrows in Fig. 3, and the mean spacing between misfit dislocation is about 10 nm. Since the mismatch between the lattice constants of Cu and Pd is 7.5%, the multilayer structure must be considerably strained in order to accommodate this mismatch; however a significant dislocation density is also observed. As shown in Fig 4, some highly faulted regions were found within the multilayer structure and contained dislocations, stacking faults, microtwins and four differently oriented domain structures. Both the plan-view and cross-sectional HREM observations of the Cu-Pd superlattice have revealed a columnar mode of growth with a mean crystallite diameter of 100 nm, as shown in Figs. 1, 5 and 6. The crystal structure of the boundary region is quite imperfect and the modulation-layer sequence is vague, which might be caused by interdifusion between the Cu and Pd layers. It is obvious that such a growth morphology results in a structure with planar anisotropy.
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Malecki, Marek. "Stereo Imaging System for High-Voltage Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 178–79. http://dx.doi.org/10.1017/s0424820100179646.
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An analysis of three-dimensional ultrastructure is especially efficient when performed on stereo images. The high voltage electron microscope (HVEM) providing high beam penetration and low radiation damage to specimens has been shown to be the most effective instrument for such studies. The successive HVEM stereo images recorded on films are subsequently photoprinted or stored in an image processor memory can be observed on an RGB monitor. Successful stereo imaging must meet several requirements regarding magnification, specimen thickness, tilt axis and angle. In particular, the optimal tilt for stereo perception depends on the thickness and microscopical magnification. Ultramicrotome settings can provide only approximate information on section thickness; however, their sectioning compression, procedural etching or beam induced shrinkage has to be considered. The situation becomes even more difficult when extractable media are used because an amount of extracted material may seriously affect final thickness. An estimation of an exact thickness of whole cell mounts is practically impossible, and therefore, optimal tilt difficult to predict. Then the most reliable way is the laborious recording of series of images at different tilt angles and selection of the most effective. To overcome this constraint, I designed a very reliable system for AEI HVEM 7MkII allowing exact prediction of the perfect tilt angle. The diagram of the system is presented on Fig. 1 and a photograph of the assembly on Fig. 2. It consists of a low light level TV camera with two independent outputs-SIT/TVC/, image processor-Quantex/QIP/, two high resolution flat square monitors-Hitachi/H1 & H2/ and stereo viewer-Nikon/SN/. A signal from the first TV camera output goes to the QIP, after processing is displayed on monitor H1. A signal from the second output goes directly to the second monitor, H2. Prerequisites for using this system are axis-centered or eucentric goniometer and a rotation-free imaging system of HVEM. The recording procedure happens as follows. The specimen is tilted 1/2 of the value of the roughly predicted optimal angle and the resulting image is stored in the Quantex memory followed by recording on the film sheet. The left monitor displays the stored image from QIP, while the right monitor provides the live image. Then the specimen is tilted while being observed with a stereo viewer. When the strongest stereo effect is noticed, then tilting is stopped and an image recorded. If + and − tilt values differ, then perfectly symmetrical values can be calculated followed by image recording. Figs. 3 and 4 represent the stereo images of a human melanoma cell grown on a film grid. An optimal stereo perception was obtained for different magnifications, at different tilt angles determined using the system I have designed.
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Fanani, Fajriannoor. "KONSENTRASI DAN INTEGRASI KEPEMILIKAN PADA INDUSTRI MEDIA INTERNASIONAL DALAM PERANG FORMAT HIGH DEFINITION OPTICAL DISK." Jurnal The Messenger 4, no. 1 (March 23, 2016): 16. http://dx.doi.org/10.26623/themessenger.v4i1.273.
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<p><em>High definition technology development in the entertainment industry, especially film industry, has produce classic problem about format consensus in the media industry. This situation eventually creates the so called “war of format” between the two most popular high definition formats, the Blu-ray from Sony/Hitachi and the HD DVD from Toshiba. Unlike the war of format before, for example is VHS versus Betamax war, that determinated mostly by the consumer, the format war between Blu-ray and HD DVD is strongly affect by the abilities of the companies behind the two format to consentrate and integrate their business moghul and also to make alliance between competitiors. Concentration of ownership is appears in the trend of holywood studios to merge with the bigger studios, which is creates a few conglomeration in the movie business. Integrations of business could be seen from the owners of the big studios that not only have the studios, but also many other business that relate or not with the entertainment business. And least, the alliance could be seen from this big studios alliance to support one of the format.</em></p><p><em>Initially the HD DVD was on the fruitfull position because has been back up by the studios like Warner Bros, Paramount, and Universal that have more market share in US that the studios that support Blu-ray format, which is Sony, Walt Disneym and 20<sup>th</sup> Century Fox. Fortunately for Blu-ray, Sony already sells millions of PS 3 console that ingeniously could read Blu-ray disk; this means there’s already millions of Blu-ray reader device in the hand of consument, something that Toshiba could not generate. In the end, the victory of Blu-ray format is accelerate by the switching side of Warner Brothers studio to the Blu-ray follow by the others big studios.</em></p><p><em>Conclusively, the success of a new technology, especially the media industry, is sometimes not depends on the quality of the technology itself. Often, the success is determined by the availability of the industries that support the technology. The war of format between HD DVD and Blu-ray definitely show the determination of media industry in the development of new technology.</em></p>
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Hashimoto, Yasushi. "Special Issue on Agro-Robotics." Journal of Robotics and Mechatronics 11, no. 3 (June 20, 1999): 171–72. http://dx.doi.org/10.20965/jrm.1999.p0171.
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The first intelligent agro-robot for tomato harvesting appeared at Tampa, Florida, in 1983. The presentation by Prof. N. Kawamura at the Department of Agricultural Engineering, Kyoto University, strongly impressed participants in the international symposium for agricultural machinery. Since then, several companies have become interested in developing intelligent agro-robots. As the one of the first, Toshiba demonstrated an intelligent robot for mass propagation in the biotechnological process at Exposition for Flowers in Osaka in 1990. In 1990, the IEEE International Workshop on Intelligent Robotics and Systems (IROS' 90) was held at the Mechanical Engineering Research Laboratory, Hitachi Ltd., in Tsuchiura, Japan, through cosponsorship of the Robotics Society of Japan and SICE, where two agricultural robotics sessions were first organized by Prof. P. Dario, one of the editors of this journal. In 1991, the International Federation of Automatic Control (IFAC) first conducted international workshop on Mathematical and Control Applications in Agriculture and Horticulture at Matsuyama, Japan, featuring a session for agro-robotics presenting several academic cases developed in companies including Toshiba, mentioned above. Several types of intelligent robot were introduced to agricultural applications as agro-robots. Agricultural machinery has a long history, with tractors and combines the main mechanized targets and far from intelligent robot. Highly advanced industrial technology including robots for factory automation widens field applications to new areas in agriculture and agricultural production must consider new labor based on the declining number of farmers in agriculture. New needs of agriculture are being covered by highly advanced engineering-technology developed in manufacturing plants, and it is to be noted that fruitful cooperation has begun in the new field liking industrial and agriculture technology, well demonstrated by the papers in this special issue. The first and second papers, by Tokunaga et al. and by Ogasawara et al., are from the high technology engineering project, Faculty of Engineering, at Kumamoto University, supported from 1994 to 1996 by the Science and Technology Agency, Japan. A watermelon harvesting robot developed as a new target has never been applied in industry. This research is not very important for developing new engineering in robotics and extremely useful in agricultural application. The third and fourth papers, by Noguchi et al. and Yamashita et al., are from engineering in agricultural machinery in interesting research on transportation robots. Prof. Noguchi and his group at the Department of Agricultural Engineering, Hokkaido University, presents a dramatic example of mobile agro-robotics in the field, while Prof. Yamashita, of the Department of Biomechanical Systems, Ehime University, and Prof. Sato developed a vehicle for greenhouse automation anticipating the new agriculture of the 21st century. The fifth paper, by Arima et al., is from agricultural machinery engineering in typical agricultural machinery firms in Japan. The cucumber harvesting robot was developed by ISEKI & Co., Ltd. The sixth paper, by Kobayashi et al., is from the Institute of Agricultural Machinery, BRAIN, and describes a grafting robot. The seventh paper, by Kondo et al., is agricultural machinery engineering involving to the intriguing technology of cutting robots. A chrysanthemum cutting robot is developed for biotechnological applications. Kondo is regarded as an up-and-coming young leader in IFAC activities. The eighth paper, by Dr. Hayashi, is involves agricultural machinery engineering in typical agricultural machinery firms in Japan. It introduces an automatic milking system developed by Kubota Co., Ltd. in cooperation with the Institute of Agricultural and Environmental Engineering, The Netherlands (IMAG-DLO). The ninth paper, by Dr. Yamada, involves agricultural machinery engineering in typical agricultural machinery firms in Japan, and introduces a transplanting robot developed by Yanmar Agricultural Equipment Co. Ltd. The final paper in this fascinating series is by Prof. H. Murase, who chairs the Technical Committee on Intelligent Control in Agricultural Automation, IFAC, has encouraged engineering for system control in agricultural applications since 1988, when the first working group for agricultural engineering was set up and chaired by myself. Agro-robotics has been discussed through several international workshop and symposium sponsored by IFAC since then. Note that IFAC is one of the most active international societies in control engineering taking on all problems in any phase involving robotics, as is done by IEEE. Prof. Murase is one of the most active chairmen in the 46 Technical Committees (TCs) and presents the global scope of agro-robotics in IFAC in conclusion, which is expected to be very useful. I thank Prof. A. Shimizu of Ehime University for his important advice and the authors contributing to this issue, especially Profs. T. Inoue and S. Kawaji of the Faculty of Engineering, Kumamoto University, for their kind cooperation in different engineering fields. Last, I thank Editor in Chief, Prof. T. Fukuda, the Deputy Chief Editors, Prof. M. Kaneko, and the Editors for providing this chance to demonstrate advances in agro-robotics in this special issue, which will encourage the development of robotics in ever widening applications.
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Zhang, Qunbing, and Jun Wang. "Fabrication and Super-Hydrophobicity of TiO2 Nanostructure with Urchin Shapes." International Journal of Chemical Reactor Engineering 8, no. 1 (September 27, 2010). http://dx.doi.org/10.2202/1542-6580.2252.
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Titanium dioxide (TiO2) film with urchin-like nanostructures has been successfully fabricated without invoking any catalyst or template on silicon substrate. The morphological features characterized by FE-SEM showed that TiO2 film consisted of numerous sharply tipped micro-daggers with lengths of several micrometers and diameters of about 20 nm. X-ray diffraction pattern (XRD) shows that all diffraction peaks can be indexed to the rutile phase of TiO2. The water repelling characteristics of the film were measured by Contact Angle Meter as well as snapshots taken from a Hitachi camera. This measurement shows the water has a contact angle (CA) of about 151.2°. The above measurements indicate that the TiO2 film has super-hydrophobic property.
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Izumi, Eiichi, Yoshinori Ikebe, Hiroyasu Shichi, and Hifumi Tamura. "Characterization of Surfaces and Thin Films by Means of an Ion Microprobe Analyzer." MRS Proceedings 75 (1986). http://dx.doi.org/10.1557/proc-75-739.
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A variety of materials such as semiconductors, metals, and insulators have been analyzed by use of the Hitachi IMA-3 ion microprobe analyzer. From the depth profile of a GaAs/AQ GaAs superlattice(50Å), a depth resolution of 45Å was obtained at 2350Å below the surface. The stable depth profile of a multilayer plastic film was obtained by using the negative ion beam(O) as a primary ion for charge neutralization. Further, the usefulness of the total ion monitoring method for correcting the changing factors of secondary ion intensity is demonstrated.
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Pietila, Doug, Lisa DeBra, John Guan, and Chung Lee. "Effects of Processing Conditions on the Material Properties of Polyimide Thin Films." MRS Proceedings 203 (1990). http://dx.doi.org/10.1557/proc-203-289.
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ABSTRACTThe effects of curing rate and solvent content prior to curing were examined for Hitachi PIX L110 polyimide thin films. DMA, TMA, DSC, and wafer bow measurements were used to elucidate in-plane storage modulus, Z-axis CTE, heat capacity, and residual stress dependencies on processing conditions and film position across the wafer. It was found that the residual stress and storage modulus are highly dependent on the processing conditions. Additionally, the heat capacity and storage modulus showed significant dependency on wafer position as well as processing conditions. The Z-axis CTE was found to deviate significantly from values published for the in-plane (xy) direction.
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Zhang, Liangmin, Fajian Zhang, and R. O. Claus. "Synthesis and Characterization of Electrostatical Self-Assembly CdSe/Polymer Nanocomposite Films." MRS Proceedings 733 (2002). http://dx.doi.org/10.1557/proc-733-t5.6.
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AbstractUsing a novel electrostatic self-assembly (ESA) method to incorporate CdSe quantum dots into polymer we have successfully synthesized ultrathin films. This method allows the molecular-level thickness control and layer-by-layer formation of multilayer thin and thick films using alternative anionic and cationic molecular solution dipping. From ellipsometric measurements, we obtained that the thickness of per bilayer is around 3.7 nm. UV-vis absorption spectra versus the number of bilayers have also been obtained using an Hitachi 2001 spectrometer. The size of CdSe quantum dots has been measured using transmission electron microscopy before the CdSe quantum dots are incorporated and confirmed using atomic force microscopy after the formation of the film, respectively. Both measurements indicate that the diameter of the CdSe quantum dots is 2-3 nm. Xray photoelectron spectroscopy indicates that the concentration of the CdSe quantum dots in the film is 2.14%.
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Mil'Shtein, S., S. Iatrolt, D. Kharas, R. O. Bell, and D. Sandstrom. "Study of Solar Cells by Sem Dark Voltage Contrast." MRS Proceedings 283 (1992). http://dx.doi.org/10.1557/proc-283-921.
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ABSTRACTFor the first time the Scanning Electron Microscopy (SEM) Dark Voltage Contrast (DVC) technique was used to examine the field distribution in a solar cell made of polycrystalline silicon.The samples were cut off solar cells made of Edge-defined Film-fed Grown (EFG) Silicon and lapped at 2 and 5 degree angles. The DVC measurements were performed at forward, reverse, and zero bias conditions using a Hitachi S-570 SEM and a Kevex-8000 microanalyzer.The I-V curves were recorded to test the electric performance of the samples. We examined two groups of solar cells. One group of cells demonstrated, after regular processing, reasonable electrical performance and abrupt DVC profile. The other group was intentionally doped with titanium, which presumably was agglomerated in the p-n junction area thus degrading completely the electrical performance of the cells and weakening the electric field by a factor of 4–6.
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Leonov, Sergey. "CHARACTERISTICS OF FRAGMENTS OF SHELLS AFTER HITTING THE TRIPLEX GLASS OF THE CAR WITH SHOTS FROM A HUNTING "SAIGA" CARBINE UNDER THE CARTRIDGE 5, 45X39." Russian Journal of Forensic Medicine, June 10, 2021. http://dx.doi.org/10.17816/fm381.
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Abstract. The article is devoted to the possibilities of innovative research methods in forensic medicine-scanning electron microscopy with energy-dispersion analysis. The described methods were used in conducting experimental studies in the case of a gunshot retrograde injury.
Aim. The purpose of the work was to study the particles formed during the destruction of a semi-shell shell and an obstacle (triplex car glass) when fired from a hunting Saiga carbine with 5. 45x39 cartridges.
Material and methods. Car triplex windshields from BMW and Mercedes-Benz cars were used as a barrier. The shots were fired from a hunting Saiga carbine with a 5.45x39 cartridge. The shots were fired from a distance of 10 m. As targets, white calico with dimensions of 100x150 cm was used, stretched on a wooden frame, or fixed on a chipboard. The distance between the target and the barrier was 100 cm, which roughly corresponded to the distance from the windshield of the car to the driver and the passenger in the front seat. The studies were carried out using the SEM "Hitachi FlexSem1000 II" and the energy-dispersive X-ray spectrometer "Bruker Quantax 80".
Results. As a result of the conducted research with the help of microscopy, the presence of 7 types of foreign bodies on the surface of the target was established, which are the products of the destruction of the fire projectile and the barrier: glass fragments; glass fragments; crumbly deposition of glass particles; glass fragments caked with the metal of the projectile; fragments of the projectile; spherical metal particles; overlays of molten metal in the form of puddles. With the help of energy dispersion analysis, it was possible to determine the elemental composition of the particles of the barrier, the fire shell, and to identify the overlap of the target particles.
Conclusion. As a result of the experimental study, it was found that the use of SEM and EDS analysis significantly increases the effectiveness and evidence-based expert research in solving the problems of causing damage through the barrier-the windscreen of modern cars.
Key words: scanning electron microscopy, gunshot trauma, energy dispersion analysis, fragments of the barrier.
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"Verification of the analytical signal additivity for the spectrophotometric determination of the total content of Cu(II), Co(II), Ni(II), Pb(II), Zn(II) using indicator films." Kharkov University Bulletin Chemical Series, no. 30 (2018). http://dx.doi.org/10.26565/2220-637x-2018-30-07.
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Statistical 3s- and t-criteria are used for the verification of the absorbance additivity of the immobilized in gelatin films complexes of 4-(2-pyridylazo)-resorcinol (PAR) with metal ions Co(II), Ni(II), Cu(II), Zn(II), Pb(II), both in equal concentrations, and in different ratios of their molar concentrations over the entire range of metal contents. An Agfa photographic film for offset printing is used as a transparent polymeric sorbent. Silver halides are previously removed from the gelatin layer. The extraction of the reagent into the gelatin film layer is carried out from an aqueous solution of PAR (1 mmol/l) for 45 minutes; the films with the reagent are kept in a solution of metal salts during 15 minutes. The light absorption of the films with red metal complexes is measured versus to the yellow film with the reagent on the Hitachi U-2000 spectrophotometer and the KFK-3 photocolorimeter. Two types of solutions are prepared in the concentration range (0.25–6.5)·10-5 mol/l — solutions of individual metal salts and solutions containing five metal ions simultaneously. Method I: the concentration of metal ions in individual solutions (c) is set equal to the total metal concentration in their mixture (сΣ); the metal concentrations in the mixture are equal (сΣ/5). Method II: the concentrations of metal ions in individual solutions are set to the same as in their mixtures; the ratio of the concentrations of metals in the solutions of their mixture is varied. 3-5 samples of the modified films are immersed in the solutions, air dried and obtained the value of absorbance in the wavelength range 480-580 nm in 5 nm steps. The results of the measurements are averaged and the dispersions are calculated for the individual and summary signals. The analytical signal from the sum of metal complexes(АΣ) and the sum of analytical signals from individual metal complexes (ΣА) are compared. In the case of application of the 3s-criterion, the deviation from the additivity of the total signal is assumed to be statistically insignificant if the calculated differences (| AΣ – ΣА/n | or | AΣ – ΣА |), doesn’t exceed the tripled standard deviation of the total signal. In the case of Student's-test, the critical value (tcrit=t0.01,f) and the calculated on the basis of the experimental data criterion value are compared. It is found, that the analytical signal from the sum of metals, both in equal concentrations, and in different ratios of their molar concentrations, doesn’t have significant deviations from additivity in the entire range of the metal contents and wavelength range. The indicator films are used for spectrophotometric and visual-test determination of the total content of Cu (II), Co (II), Ni (II), Pb (II), Zn (II) in samples of natural water. The accuracy of the determinations is proved by atomic absorption spectroscopy.