Relevant bibliographies by topics / HRTEM (High Resolution Transmission Electron Microscopy)

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'HRTEM (High Resolution Transmission Electron Microscopy)'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

1

Gruehn, R. "High resolution transmission electron microscopy (HRTEM)." Fresenius' Zeitschrift für analytische Chemie 333, no. 7 (1989): 781–82. http://dx.doi.org/10.1007/bf00476638.

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Howe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.

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In situ hot-stage high-resolution transmission electron microscopy (HRTEM) provides unique capabilities for quantifying the dynamics of interfaces at the atomic level. Such information complements detailed static observations and calculations of interfacial structure, and is essential for understanding interface theory and solid-state phase transformations. This paper provides a brief description of particular requirements for performing in situ hot-stage HRTEM and illustrates the use of this technique to obtain quantitative data on the atomic mechanisms and kinetics of interface motion during
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O'Keefe, Michael A., and John C. H. Spence. "“Resolution” in atomic-resolution Electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 498–99. http://dx.doi.org/10.1017/s0424820100086799.

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The Rayleigh resolution criterion was developed for incoherent imaging conditions and cannot, in general, be applied to coherent high-resolution transmission electron microscopy (HRTEM). In fact, the Rayleigh criterion may lead to paradoxical results since it considers only two scatterers and does not account for the signal-to-noise ratio. It may, however, be used for dark-field HAAD STEM imaging. For the case of strong multiple scattering in HRTEM lattice imaging, the only general relations that can be assumed between the image of a specimen and its projected crystal potential are those impos
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FERROW, E. A. "Computer-simulated high-resolution transmission electron microscopy (HRTEM) in tourmaline." Journal of Microscopy 177, no. 1 (1995): 68–76. http://dx.doi.org/10.1111/j.1365-2818.1995.tb03534.x.

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Lu, Jing Mei, and Xuan Cheng. "Analysis of Nanocrystal of Porous Silicon with High-Resolution Transmission Electron Microscopy." Advanced Materials Research 650 (January 2013): 34–38. http://dx.doi.org/10.4028/www.scientific.net/amr.650.34.

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The porous silicon samples were prepared with n(111) Si wafers by electrochemical polarization and their microstructures were characterized by high-resolution transmission electron microscopy (HRTEM). The DigitalMicrograph image processing was used to analyze the HRTEM images. The distorted Si (111) crystal plane was observed on porous silicon and could be distinguished with the Fourier transforming electron diffraction (ED) pattern. Grain boundaries were presented in the HRTEM images where the lattice fringes distortions took place. The anisotropy property could be preserved at a small locati
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Howe, J. M. "High-resolution tem of transformation interfaces in metals." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 284–87. http://dx.doi.org/10.1017/s0424820100126287.

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The advent of medium and high-voltage transmission electron microscopes with point-to-point resolutions below 0.2 nm has made it possible to study transformation interfaces in metals at the atomic level. Understanding the atomic structures of these interfaces is critical to understanding microstructural development and the resulting physical and mechanical properties of metals. One area of transformation interfaces in metals that has been investigated by high- resolution transmission electron microscopy (HRTEM), is the structures of interphase boundaries of metastable aging precipitates in Al
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Rečnik, A., D. L. Carroll, K. A. Shaw, D. M. Lind, and M. Rühle. "Structural Characterization of Fe3O4–NiO Superlattices Using High-reSolution Transmission Electron Microscopy." Journal of Materials Research 12, no. 8 (1997): 2143–51. http://dx.doi.org/10.1557/jmr.1997.0287.

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Superlattices of Fe3O4–NiO layers have been studied by high-resolution transmission electron microscopy (HRTEM). These superlattices are grown by oxygen-plasma-assisted molecular-beam epitaxy (MBE) on (001) oriented MgO substrates, and exhibit a high degree of ordering at the interfaces between the interlayers. The lack of misfit dislocations at the Fe3O4–NiO interfaces suggeststhat lattice strain is largely accommodated by changes in the lattice spacing. By quantitative HRTEM analysis of Fe3O4–NiO interfaces, possible atomic models are discussed, having implications in magnetic ordering and s
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Seyring, Martin, Xiaoyan Song, Andrey Chuvilin, Ute Kaiser, and Markus Rettenmayr. "Characterization of grain structure in nanocrystalline gadolinium by high-resolution transmission electron microscopy." Journal of Materials Research 24, no. 2 (2009): 342–46. http://dx.doi.org/10.1557/jmr.2009.0071.

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A method is presented for recognition of nanograins in high-resolution transmission electron microscope (HRTEM) images of nanocrystalline materials. We suggest a numerical procedure, which is similar to the experimental dynamic hollow cone dark-field method in transmission electron microscopy and the annular dark-field method in scanning transmission electron microscopy. The numerical routine is based on moving a small mask along a circular path in the Fourier spectrum of a HRTEM image and performing at each angular step an inverse Fourier transform. The procedure extracts the amplitude from t
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Sezen, Meltem, and Sina Sadighikia. "3D electron microscopy investigations of human dentin at the micro/nano-scale using focused ion beam based nanostructuring." RSC Advances 5, no. 10 (2015): 7196–99. http://dx.doi.org/10.1039/c4ra14364g.

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In this study, high resolution electron microscopy techniques, such as Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM) and High Resolution Transmission Electron Microscopy (HRTEM) allowed for revealing micro/nano features within human dentin with high definition and accuracy.
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Howe, James M., Hirotaro Mori, and Zhong Lin Wang. "In Situ High-Resolution Transmission Electron Microscopy in the Study of Nanomaterials and Properties." MRS Bulletin 33, no. 2 (2008): 115–21. http://dx.doi.org/10.1557/mrs2008.24.

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AbstractThis article introduces the use of in situ high-resolution transmission electron microscopy (HRTEM) techniques for the study and development of nanomaterials and their properties. Specifically, it shows how in situ HRTEM (and TEM) can be used to understand diverse phenomena at the nanoscale, such as the behavior of alloy phase formation in isolated nanometer-sized particles, the mechanical and transport properties of carbon nanotubes and nanowires, and the dynamic behavior of interphase boundaries at the atomic level. Current limitations and future potential advances in in situ HRTEM o
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Dissertations / Theses on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

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Dickinson, Calum. "Metal oxide porous single crystals and other nanomaterials : an HRTEM study." Thesis, University of St Andrews, 2007. http://hdl.handle.net/10023/217.

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Three-dimensional porous single crystals (PSCs) are a recent development in the growing world of mesoporous material. The mesoporosity allows for the material to retain their nanoproperties whilst being bulk in size. The current work concentrates on chromium oxide and cobalt oxide PSCs formed in the templates SBA-15 and KIT-6. HRTEM is the main technique used in this investigation, looking at the morphology and single crystallinity of these materials. A growth mechanism for the PSC material is proposed based on HRTEM observations. XRD studies revealed that the confinement effect, caused by the
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Tao, Shizhong. "High-resolution transmission electron microscopy of copper-oxide compounds /." [S.l.] : [s.n.], 1994. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=10775.

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Kong, Lisa (Lisa Fanzhen). "High-resolution transmission electron microscopy of III-V FinFETs." Thesis, Massachusetts Institute of Technology, 2018. http://hdl.handle.net/1721.1/119065.

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Thesis: S.B., Massachusetts Institute of Technology, Department of Materials Science and Engineering, 2018.<br>Cataloged from PDF version of thesis.<br>Includes bibliographical references (pages 47-50).<br>III-V materials have great potential for integration into future complementary metal-oxide-semiconductor technology due to their outstanding electron transport properties. InGaAs n-channel metal-oxide-semiconductor field-effect transistors have already demonstrated promising characteristics, and the antimonide material system is emerging as a candidate for p-channel devices. As transistor te
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Chand, Gopal. "Aberration determination and compensation in high resolution transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362968.

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Pierce, William Renton. "High-resolution transmission electron microscopy and electron energy loss spectroscopy of doped nanocarbons." Thesis, University of Manchester, 2014. https://www.research.manchester.ac.uk/portal/en/theses/highresolution-transmission-electron-microscopy-and-electron-energy-loss-spectroscopy-of-doped-nanocarbons(dd1340ba-4a31-49e5-a421-9dd47ea35256).html.

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Graphene, a one-atom thick sheet of carbon, is the thinnest, strongest and most electrically conductive material ever discovered. Alongside carbon nanotubes it is part of the group of nanocarbons whose unique properties have sparked huge interest in possible applications, including electronic devices, solar cells and biosensors. Doping of these materials allows for the modification of their optical and electronic properties,which is crucial to realising these applications. Studying the properties of these doped materials at atomic resolution and finding controllable and industrially scalable r
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Landauer, Matthew Noah. "Indirect modes of coherent imaging in high-resolution transmission electron microscopy." Thesis, University of Cambridge, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627491.

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Gilkes, Kai William Reginald. "Tetrahedral carbon : studies using high resolution transmission electron microscopy and neutron scattering." Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.281952.

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Tosaka, Masatoshi. "STRUCTURAL STUDY ON POLYMER CRYSTALS BY CRYOGENIC HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY." Kyoto University, 2000. http://hdl.handle.net/2433/181349.

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Said, Aurore. "Matériaux Nanohybrides à Large Bande Interdite: Études de Synthèses, Propriétés et Applications." Phd thesis, Université de la Méditerranée - Aix-Marseille II, 2007. http://tel.archives-ouvertes.fr/tel-00266833.

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Ma thèse consiste en l'étude du greffage des molécules de colorant sur des nanoparticules de ZnO, de leurs propriétés optiques et morphologiques, ainsi que les interactions électroniques entre le ZnO inorganique et le colorant organique. Nous avons créé des nanohybrides à base de nanosphères et nanobâtonnets de ZnO par deux voies: Ablation laser femtoseconde en phase liquide et Procédés chimiques. Des particules sphériques de quelques nanomètres sont générées par ablation laser révélant par la photoluminescence l'effet de confinement quantique due à la réduction de taille. Transfert d'excitati
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Dunin-Borkowski, Rafal Edward. "Fresnel and high resolution techniques for the characterisation of ultrathin semiconductor layers." Thesis, University of Cambridge, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.338135.

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Books on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

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Inc, ebrary, ed. High-resolution electron microscopy. Oxford University Press, 2009.

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Experimental high-resolution electron microscopy. 2nd ed. Oxford University Press, 1988.

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Horiuchi, S. Fundamentals of high-resolution transmission electron microscopy. North-Holland, 1994.

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Structure analysis of advanced nanomaterials: Nanoworld by high-resolution electron microscopy. De Gruyter, 2014.

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5

Spence, John C. H. High-Resolution Electron Microscopy. Oxford University Press, 2013.

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Spence, John C. H. High-Resolution Electron Microscopy. Oxford University Press, 2017.

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Peter, Buseck, Cowley J. M. 1923-, and Eyring LeRoy, eds. High-resolution transmission electron microscopy and associated techniques. Oxford University Press, 1988.

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(Editor), Peter Buseck, John Cowley (Editor), and LeRoy Eyring (Editor), eds. High-Resolution Transmission Electron Microscopy: And Associated Techniques. Oxford University Press, USA, 1989.

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High-Resolution Transmission Electron Microscopy: And Associated Techniques. Oxford University Press, USA, 1992.

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Manfred, Rühle, and Ernst F. 1938-, eds. High-resolution imaging and spectrometry of materials. Springer, 2003.

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Book chapters on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

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Malla, P. B., and S. Komameni. "High-Resolution Transmission Electron Microscopy (HRTEM) in the Study of Clays and Soils." In Advances in Soil Science. Springer New York, 1990. http://dx.doi.org/10.1007/978-1-4612-3316-9_4.

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Williams, David B., and C. Barry Carter. "High-Resolution TEM." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_28.

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Williams, David B., and C. Barry Carter. "High-Resolution TEM." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_28.

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Bell, David C. "Low Voltage High-Resolution Transmission Electron Microscopy." In Low Voltage Electron Microscopy. John Wiley & Sons, Ltd, 2012. http://dx.doi.org/10.1002/9781118498514.ch5.

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Hesse, Dietrich, Eric Detemple, Quentin M. Ramasse, et al. "Nanosession: High-Resolution Transmission Electron Microscopy." In Frontiers in Electronic Materials. Wiley-VCH Verlag GmbH & Co. KGaA, 2013. http://dx.doi.org/10.1002/9783527667703.ch35.

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Kohler-Redlich, P., and J. Mayer. "Quantitative Analytical Transmission Electron Microscopy." In High-Resolution Imaging and Spectrometry of Materials. Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-662-07766-5_4.

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Tanaka, Nobuo. "What is High-Resolution Transmission Electron Microscopy?" In Electron Nano-Imaging. Springer Japan, 2017. http://dx.doi.org/10.1007/978-4-431-56502-4_5.

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Fultz, Brent, and James M. Howe. "High-Resolution TEM Imaging." In Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-662-04901-3_10.

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Fultz, Brent, and James Howe. "High-Resolution TEM Imaging." In Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-29761-8_11.

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Fultz, Brent, and James M. Howe. "High-Resolution TEM Imaging." In Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-04516-9_10.

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Conference papers on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

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Rai, Raghaw, James Conner, Sharon Murphy, and Swaminathan Subramanian. "Challenges in Evaluating Thickness, Phase, and Strain in Semiconductor Devices Using High Resolution Transmission Electron Microscopy." In ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0343.

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Abstract The aggressive scaling of metal oxide semiconductor field effect transistor (MOSFET) device features, including gate dielectrics, silicides, and strained Si channels, presents unique metrology and characterization challenges to control electrical properties such as reliability and leakage current. This paper describes challenges faced in measuring the thickness of thin gate oxides and interfacial layers found in high-K gate dielectrics, determining Ni silicide phase in devices, and characterizing strain in MOSFETs with SiGe stressors. From case studies, it has been observed that thin
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Wang, Yafei, Songyan Hu, Guangxu Cheng, Zaoxiao Zhang, and Jianxiao Zhang. "Influence of Quenching-Tempering on the Carbide Precipitation of 2.25Cr-1Mo-0.25V Steel Used in Reactor Pressure Vessels." In ASME 2019 Pressure Vessels & Piping Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/pvp2019-93054.

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Abstract The carbide precipitation of 2.25Cr-1Mo-0.25V steel is studied during the head-fabrication heat treatment process using gold replica technique, scanning electron microscopy (SEM), transmission electron microscopy (TEM) and selected area electron diffraction (SAED). Shapes, structures and sizes of carbides before and after heat treatment are analyzed. The dissolution of strip-shaped carbides and the precipitation of granular carbides are confirmed. Amorphous films at the boundaries of carbides are observed by high-resolution transmission electron microscope (HRTEM), which is formed due
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Srinivasan, S. S., N. Kislov, Yu Emirov, D. Y. Goswami, and E. K. Stefanakos. "Investigation of ZnFe2O4 Nanoparticles Prepared by High Energy Milling." In ASME 2009 International Mechanical Engineering Congress and Exposition. ASMEDC, 2009. http://dx.doi.org/10.1115/imece2009-11573.

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Nanoparticles of Zinc Ferrite (ZnFe2O4) prepared by both wet- and dry- high-energy ball milling (HEBM), have been investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), atomic force microscopy (AFM), surface area and pore size distribution (BET) and wavelength-dependent diffuse reflectance and scattering turned into absorption coefficient estimation using the Kubelka-Munk theory. It was found that after 72 hours of HEBM, the particle size was decreased from 220 nm for the initial material to 16.5 nm and 9.4 nm for
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Bonifacio, C. S., P. Nowakowski, M. J. Campin, M. L. Ray, and P. E. Fischione. "Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies." In ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0241.

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Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of
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Thangapandian, N., S. Balasivanandha Prabu, and R. Paskaramoorthy. "Synthesis and Characterization of High Performance Polymer Nanocomposite Using Carbon Nanotubes as Fillers." In ASME 2013 International Manufacturing Science and Engineering Conference collocated with the 41st North American Manufacturing Research Conference. American Society of Mechanical Engineers, 2013. http://dx.doi.org/10.1115/msec2013-1251.

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In this work, the chemical vapour deposition (CVD) method is used for the production of carbon nanotubes (CNTs). The catalyst, Fe/MgO, was prepared through sonication technique. It was heated to 600 °C for 6 hours and this was used as the template for growing the CNTs using acetylene as carbon precursor. The deposited CNTs were separated by acid treatment followed by air oxidation. The purified CNTs were examined by scanning electron microscopy (SEM) and high resolution transmission electron microscopy (HRTEM). The CNTs were observed to have a multi-wall structure with the diameter in the rang
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Lu, Xinchun, Hui Wang, Chenhui Zhang, and Jianbin Luo. "Structure and Tribological Properties of Ultra-Thin Tetrahedral Amorphous Carbon (ta-C) Films." In ASME 2006 International Mechanical Engineering Congress and Exposition. ASMEDC, 2006. http://dx.doi.org/10.1115/imece2006-14412.

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Ultra-thin tetrahedral amorphous carbon (ta-C) films were deposited by the filtered cathodic vacuum arc (FCVA) technique. The thickness, structure, and topography of the films were studied by various analysis methods, such as auger electron spectroscopy (AES) depth profile, high resolution transmission electron microscope (HRTEM), Raman spectroscopy, and atomic force microscopy (AFM). A tribometer was used to investigate the tribological properties of the ta-C films. The results indicate that ta-C film with thickness less than 2 nm can be obtained by the FCVA technique. As the film thickness i
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Abbo, Hanna S., Ivan R. Green, and Salam J. J. Titinchi. "Synthesis of Highly Dispersed Carbon Supported Platinum Nanocatalyst for Fuel Cells." In ASME 2011 9th International Conference on Fuel Cell Science, Engineering and Technology collocated with ASME 2011 5th International Conference on Energy Sustainability. ASMEDC, 2011. http://dx.doi.org/10.1115/fuelcell2011-54669.

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Pt/C and Pt/CNT catalysts were prepared by colloidal method using sodium citrate as a stabilizer, and ethylene glycol as the reducing agent and solvent. X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) results showed that the Pt particles were highly dispersed on the support and had a very narrow particle distribution with particle size range of 1.5–2.4 nm for both catalysts. Based on the electrochemical properties characterized by cyclic voltammetry, it was found that the as-synthesized electrocatalysts possessed a significantly higher catalytic activity th
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Shi, Donglu, Yan Guo, Wei Wang, et al. "Deposition of Rare-Earth Doped Nanophosphors on Multi-Wall Carbon Nanotube Surfaces: A New Approach in Cancer Diagnosis." In ASME 2006 International Manufacturing Science and Engineering Conference. ASMEDC, 2006. http://dx.doi.org/10.1115/msec2006-21039.

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In biomedical science and nanotechnology, it often requires surface multi funcationalization of a nanoparticle or a nanotube. In cancer diagnosis for instance, not only does the nanoparticle need a cavity structure for storage and delivery of drugs, but also be luminescent for diagnosis. Europium doped Y2O3 were deposited on the multi wall carbon nanotube (MWCNTs) surface by a novel solution method. High resolution transmission electron microscopy (HRTEM) experiments were carried out to study the surface morphologies of the deposited rare-earth doped nanophosphors on MWCNTs. The crystal lattic
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Abbas, Ghazanfar, Rizwan Raza, Muhammad Ashraf Chaudhry, and Bin Zhu. "Preparation and Characterization of Nanocomposite Calcium Doped Ceria Electrolyte With Alkali Carbonates (NK-CDC) for SOFC." In ASME 2010 8th International Conference on Fuel Cell Science, Engineering and Technology. ASMEDC, 2010. http://dx.doi.org/10.1115/fuelcell2010-33325.

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The entire world’s challenge is to find out the renewable energy sources due to rapid depletion of fossil fuels because of their high consumption. Solid Oxide Fuel Cells (SOFCs) are believed to be the best alternative source which converts chemical energy into electricity without combustion. Nanostructured study is required to develop highly ionic conductive electrolyte for SOFCs. In this work, the calcium doped ceria (Ce0.8Ca0.2O1.9) coated with 20% molar ratio of two alkali carbonates (CDC-M: MCO3, where M = Na and K) electrolyte was prepared by co-precipitation method in this study. Ni base
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Lue, Jen-Lang, Jack Lee, Esther Chen, and Jian-Shing Luo. "A Review of TEM Observations of Failures of the Memory Cell in a Deep Trench Capacitor DRAM." In ISTFA 2003. ASM International, 2003. http://dx.doi.org/10.31399/asm.cp.istfa2003p0144.

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Abstract Application of the high resolution of Transmission Electron Microscopy (HRTEM) plays a very important role in structural analysis and materials characterization for process evaluation and failure analysis in the Integrated Circuit (IC) industry. We summarize TEM observation experience of the common memory failures of a BEST deep trench cell with an N-MOS gate used in CMOS DRAM technology. Memory cell failures are categorized into three areas for discussion – the deep trench (DT) capacitor, the transfer gate (GC), and the borderless bit-line contact (CB) between a transistor and a bit
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Reports on the topic "HRTEM (High Resolution Transmission Electron Microscopy)"

1

Ruben, G. C. High resolution transmission electron microscopy of melamine-formaldehyde aerogels and silica aerogels. Office of Scientific and Technical Information (OSTI), 1991. http://dx.doi.org/10.2172/6186167.

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