Academic literature on the topic 'Image defects'
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Journal articles on the topic "Image defects"
Lee, Wei-Chen, and Pei-Ling Tai. "Defect Detection in Striped Images Using a One-Dimensional Median Filter." Applied Sciences 10, no. 3 (2020): 1012. http://dx.doi.org/10.3390/app10031012.
Full textZhang, Na, Gang Yang, Fan Hu, Hua Yu, Jingjing Fan, and Siqing Xu. "A Novel Adversarial Deep Learning Method for Substation Defect Image Generation." Sensors 24, no. 14 (2024): 4512. http://dx.doi.org/10.3390/s24144512.
Full textChen, Ming Fu, Chih Chung Chou, Chun Jie Lien, and Rui Cian Weng. "An Optical Inspection System for Chip Defects Using a High Rate Line Scanner." Applied Mechanics and Materials 574 (July 2014): 462–67. http://dx.doi.org/10.4028/www.scientific.net/amm.574.462.
Full textDr. Avinash S, Dr. Prathapchandra, and Mr. Ramachandra. "Fault Detection in Printed Circuit Board (PCB) using Image Subtraction Method." International Journal of Innovative Technology and Exploring Engineering 13, no. 7 (2024): 1–6. http://dx.doi.org/10.35940/ijitee.g9906.13070624.
Full textDr., Avinash S. "Fault Detection in Printed Circuit Board (PCB) using Image Subtraction Method." International Journal of Innovative Technology and Exploring Engineering (IJITEE) 13, no. 7 (2024): 1–6. https://doi.org/10.35940/ijitee.G9906.13070624.
Full textZhou, Yang, Lijuan Zhu, and Dong Ma. "Research on Traditional Image Segmentation Method Based on Oil Drilling Pipe Defects." Journal of Physics: Conference Series 2639, no. 1 (2023): 012057. http://dx.doi.org/10.1088/1742-6596/2639/1/012057.
Full textGuo, LongYuan, ShiNan Li, Wenjing Hu, et al. "Sub-Pixel Level Defect Detection Based on Notch Filter and Image Registration." International Journal of Pattern Recognition and Artificial Intelligence 32, no. 06 (2018): 1854016. http://dx.doi.org/10.1142/s0218001418540162.
Full textGao, Pengyu, Xin Yan, Jinpeng He, Haojun Yang, Xindu Chen, and Xiangdong Gao. "Processing of Eddy Current Infrared Thermography and Magneto-Optical Imaging for Detecting Laser Welding Defects." Metals 15, no. 2 (2025): 119. https://doi.org/10.3390/met15020119.
Full textWei, Bing, Lei Gao, Xue-song Tang, and Kuangrong Hao. "Multi-Class Object Learning with Application to Fabric Defects Detection." AATCC Journal of Research 8, no. 1_suppl (2021): 165–72. http://dx.doi.org/10.14504/ajr.8.s1.20.
Full textRiza, Dimas Firmanda Al, Tetsuhito Suzuki, Yuichi Ogawa, and Naoshi Kondo. "External Defects and Soil Deposits Identification on Potato Tubers using 2CCD Camera and Principal Component Images." Industria: Jurnal Teknologi dan Manajemen Agroindustri 12, no. 2 (2023): 143–55. http://dx.doi.org/10.21776/ub.industria.2023.012.02.4.
Full textDissertations / Theses on the topic "Image defects"
Louridas, Efstathios. "Image processing and analysis of videofluoroscopy images in cleft palate patients." Thesis, University of Kent, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.267392.
Full textPalmquist, Jonathan. "Detecting defects on cheese using hyperspectral image analysis." Thesis, Umeå universitet, Institutionen för fysik, 2020. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-172695.
Full textAl-Eidarous, Mustafa H. "Image processing : techniques for locating defects on shirt collars." Thesis, University of Hull, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.301339.
Full textWi, Huiju. "Evaluating Defects of Bridge Elements Using an Image Processing Approach." Thesis, Griffith University, 2014. http://hdl.handle.net/10072/366670.
Full textYang, Hsien-Min 1957. "IC defect detection using color information and image processing." Thesis, The University of Arizona, 1988. http://hdl.handle.net/10150/276831.
Full textAbdellatif, Abeer Moustafa. "A study of developmental defects of enamel using clinical indices and image analysis." Thesis, University of Sheffield, 2002. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.247151.
Full textJorgenson, Todd F. "Comparison of two imaging modalities : F-speed film and digital images for detection of osseous defects in patients with vertical bone defects /." Oklahoma City : [s.n.], 2003.
Find full textWei, Guo-Feng. "An image quality model based on the influence of Mura defects in TFT-LCDs." Thesis, University of Leeds, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.581866.
Full textGNANAPRAKASAM, PRADEEP. "CHARACTERIZATION OF SEED DEFECTS IN HIGHLY SPECULAR SMOOTH COATED SURFACES." UKnowledge, 2004. http://uknowledge.uky.edu/gradschool_theses/318.
Full textJohnson, Christopher Ian. "Image processing techniques for the detection and characterisation of features and defects in railway tracks." Thesis, Manchester Metropolitan University, 2013. http://e-space.mmu.ac.uk/332148/.
Full textBooks on the topic "Image defects"
Louban, Roman. Image Processing of Edge and Surface Defects. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-00683-8.
Full textChung, Michael J. Detection of fuse defects by image processing methods. Materials Research Laboratory, 1988.
Find full text1950-, Mickelson Alan Rolf, ed. Defect recognition and image processing in semiconductors 1995: Proceedings of the sixth international conference, held in Boulder, Colorado, 3-6 December 1995. Institute of Physics Pub., 1996.
Find full textInternational Conference on Defects--Recognition, Imaging and Physics in Semiconductors (8th 1999 Narita-shi, Japan). Defects--recognition, imaging and physics in semiconductors 1999: Proceedings of the eighth International Conference on Defects--Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999. Elsevier, 2000.
Find full textInternational Conference on Defects--Recognition, Imaging and Physics in Semiconductors (8th 1999 Narita-shi, Japan). Defects--recognition, imaging and physics in semiconductors 1999: Proceedings of the eighth International Conference on Defects--Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15-18, 1999. Elsevier, 2000.
Find full textJ, Jiménez, and International Symposium on Defect Recognition and Image Processing in III-V Compounds (5th : 1993 : Santander, Spain), eds. Defect recognition and image processing in semiconductors and devices: Proceedings of the fifth international conference, Santander, Spain, 6-10 September 1993. Institute of Physics Pub., 1994.
Find full textInternational, Symposium on Defect Recognition and Image Processing in III-V. Compounds (3rd 1989 Tokyo Japan). Defect recognition and image processing in III-V compounds, III: Proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP III), Tokyo, Japan, 22-25 September 1989. North Holland, 1990.
Find full textInternational Symposium on Defect Recognition and Image Processing in III-V Compounds (2nd 1987 Monterey, Calif.). Defect recognition and image processing in III-V compounds, II: Proceedings of the Second International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP II), Monterey, California, April 27-29, 1987. Elsevier, 1987.
Find full textP, Fillard J., ed. Defect recognition and image processing in III-V compounds: Proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985. Elsevier, 1985.
Find full textInternational Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany). Defect recognition and image processing in semiconductors 1997: Proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997. Institute of Physics Pub., 1998.
Find full textBook chapters on the topic "Image defects"
Goldstein, Joseph I., Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, and David C. Joy. "Image Defects." In Scanning Electron Microscopy and X-Ray Microanalysis. Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6676-9_9.
Full textGordon, Sonya G. "Septal Defects." In Veterinary Image-Guided Interventions. John Wiley & Sons, Ltd, 2015. http://dx.doi.org/10.1002/9781118910924.ch63.
Full textLi, Wei, Xin’an Yuan, Jianming Zhao, Xiaokang Yin, and Xiao Li. "Design and Testing of High-Resolution Probe Arrays Using Alternating Current Field Measurement Technique." In Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures. Springer Nature Singapore, 2024. http://dx.doi.org/10.1007/978-981-97-7255-1_5.
Full textFridrich, Jessica. "Sensor Defects in Digital Image Forensic." In Digital Image Forensics. Springer New York, 2012. http://dx.doi.org/10.1007/978-1-4614-0757-7_6.
Full textNakakura, Yuta, Kosuke Temizu, Mana Nishino, and Ryosuke Nakajima. "A Case Study on Evaluation of Defect Characteristics for Practical Application of Appearance Inspection Work Support System Utilizing Deep Learning." In Lecture Notes in Mechanical Engineering. Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-28839-5_60.
Full textDirik, Ahmet Emir. "Source Attribution Based on Physical Defects in Light Path." In Digital Image Forensics. Springer New York, 2012. http://dx.doi.org/10.1007/978-1-4614-0757-7_7.
Full textLehr, Jan, Jan Philipps, Alik Sargsyan, Martin Pape, and Jörg Krüger. "AD3: Introducing a Score for Anomaly Detection Dataset Difficulty Assessment Using VIADUCT Dataset." In Lecture Notes in Computer Science. Springer Nature Switzerland, 2024. http://dx.doi.org/10.1007/978-3-031-73113-6_26.
Full textLehr, J., C. Briese, S. Mönchinger, O. Kroeger, and J. Krüger. "Challenges of Automatic Optical Inspection of Used Turbine Blades with Convolutional Neural Networks." In Lecture Notes in Mechanical Engineering. Springer Nature Switzerland, 2025. https://doi.org/10.1007/978-3-031-77429-4_34.
Full textMery, Domingo. "Crossing Line Profile: A New Approach to Detecting Defects in Aluminium Die Casting." In Image Analysis. Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/3-540-45103-x_96.
Full textLuo, Dan, Joseph M. Gattas, and Poah Shiun Shawn Tan. "Real-Time Defect Recognition and Optimized Decision Making for Structural Timber Jointing." In Proceedings of the 2020 DigitalFUTURES. Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-33-4400-6_4.
Full textConference papers on the topic "Image defects"
Zhao, Rongxin, Feng Wang, Huayong Wu, and Zijie Zhou. "Recognition of Apparent Defects in Bridge Cable Bundle Wraps Based on Deep Learning Algorithms." In IABSE Symposium, Tokyo 2025: Environmentally Friendly Technologies and Structures: Focusing on Sustainable Approaches. International Association for Bridge and Structural Engineering (IABSE), 2025. https://doi.org/10.2749/tokyo.2025.1992.
Full textChoudhary, Binod Kumar, Atul Dadhich, and Asha Rajiv. "Detection of Defects in Processed Metals Through Image Analysis." In 2024 15th International Conference on Computing Communication and Networking Technologies (ICCCNT). IEEE, 2024. http://dx.doi.org/10.1109/icccnt61001.2024.10725974.
Full textZhang, ZiYe, and XiangQuan Chang. "Express packaging defects detection model based on YOLOv8." In 4th International Conference on Image Processing and Intelligent Control (IPIC 2024), edited by Kelin Du and Azlan bin Mohd Zain. SPIE, 2024. http://dx.doi.org/10.1117/12.3038509.
Full textGuo, Jing, Zhen Liu, Zheng Zhang, Zhiqiang Bai, Yaodong Wang, and Baoqing Guo. "Research on rail image acquisition and defects intelligent recognition technology." In Seventeenth International Conference on Digital Image Processing (ICDIP 2025), edited by Xudong Jiang, Jindong Tian, Ting-Chung Poon, and Zhaohui Wang. SPIE, 2025. https://doi.org/10.1117/12.3073228.
Full textWu, Mingtao, Vir V. Phoha, Young B. Moon, and Amith K. Belman. "Detecting Malicious Defects in 3D Printing Process Using Machine Learning and Image Classification." In ASME 2016 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/imece2016-67641.
Full textOuidadi, Hasnaa, Boyang Xu, and Shenghan Guo. "Defect Segmentation From X-Ray Computed Tomography of Laser Powder Bed Fusion Parts: A Comparative Study Among Machine Learning, Deep Learning, and Statistical Image Thresholding Methods." In ASME 2023 18th International Manufacturing Science and Engineering Conference. American Society of Mechanical Engineers, 2023. http://dx.doi.org/10.1115/msec2023-104387.
Full textBarone, Massimiliano. "Image Wafer Inspection based on Template Matching." In 10th International Conference on Advances in Computing and Information Technology (ACITY 2020). AIRCC Publishing Corporation, 2020. http://dx.doi.org/10.5121/csit.2020.101505.
Full textChandran, Loheshwaran, Mohamed Subair Syed Akbar Ali, Abhishek Saini, Zheng Fan, and Prabhu Rajagopal. "A Study on the Influence of Wave Scattering in Metamaterial-Based Super-Resolution Imaging of Defects in Materials." In 2022 49th Annual Review of Progress in Quantitative Nondestructive Evaluation. American Society of Mechanical Engineers, 2022. http://dx.doi.org/10.1115/qnde2022-98345.
Full textNejatpour, Reza, Ali Asmari Sadabad, and Ali Akbar Akbari. "Automated Weld Defects Detection Using Image Processing and CAD Methods." In ASME 2008 International Mechanical Engineering Congress and Exposition. ASMEDC, 2008. http://dx.doi.org/10.1115/imece2008-68854.
Full textSzczypinski, Piotr M., Artur Klepaczko, and Marcin Kociolek. "Barley defects identification." In 2017 10th International Symposium on Image and Signal Processing and Analysis (ISPA). IEEE, 2017. http://dx.doi.org/10.1109/ispa.2017.8073598.
Full textReports on the topic "Image defects"
Nguyen, Hung. DTPH56-14-H-CAAP02 Wall Break-Through in Composite Repaired Defects. Pipeline Research Council International, Inc. (PRCI), 2017. http://dx.doi.org/10.55274/r0011839.
Full textDecroux, Agnes, Kassem Kalo, and Keith Swinden. PR-393-205100-R01 IRIS X-Ray CT Qualification for Flexible Pipe Inspection (Phase 1). Pipeline Research Council International, Inc. (PRCI), 2021. http://dx.doi.org/10.55274/r0012068.
Full textDelwiche, Michael, Yael Edan, and Yoav Sarig. An Inspection System for Sorting Fruit with Machine Vision. United States Department of Agriculture, 1996. http://dx.doi.org/10.32747/1996.7612831.bard.
Full textChen, Pictiaw, Boaz Zion, and Michael J. McCarthy. Utilization of NMR Technology for Internal Nondestructive Quality Evaluation of Fruits and Vegetables. United States Department of Agriculture, 1994. http://dx.doi.org/10.32747/1994.7568778.bard.
Full textNestleroth, Dr J. Bruce. PR-3-823-R01 Remote Field Eddy Current Detection of Stress-Corrosion Cracks. Pipeline Research Council International, Inc. (PRCI), 1990. http://dx.doi.org/10.55274/r0011870.
Full textPoland, D., A. Lopez, S. Manay, and S. Sengupta. FY2006 Engineering Tech Base Report: Defect Detection in Large CT Image Sets. Office of Scientific and Technical Information (OSTI), 2006. http://dx.doi.org/10.2172/896596.
Full textDawalibi. L51925 Detection of Anomalies in Coated Pipelines Using Long Range Ultrasonics. Pipeline Research Council International, Inc. (PRCI), 2002. http://dx.doi.org/10.55274/r0010644.
Full textKane, Joshua James, and William Enoch Windes. Initial Assessment of X-Ray Computer Tomography image analysis for material defect microstructure. Office of Scientific and Technical Information (OSTI), 2016. http://dx.doi.org/10.2172/1364233.
Full textHeifetz, Alexander, Xin Zhang, Jafar Saniie, and William Cleary. Detection of Defects in Additively Manufactured Metallic Materials with Machine Learning of Pulsed Thermography Images. Office of Scientific and Technical Information (OSTI), 2020. http://dx.doi.org/10.2172/1673390.
Full textEngel, Bernard, Yael Edan, James Simon, Hanoch Pasternak, and Shimon Edelman. Neural Networks for Quality Sorting of Agricultural Produce. United States Department of Agriculture, 1996. http://dx.doi.org/10.32747/1996.7613033.bard.
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