Books on the topic 'Industrial microscopy'

Yablon, Dalia G., ed. Scanning Probe Microscopy in Industrial Applications. Hoboken, NJ: John Wiley & Sons, Inc, 2013. http://dx.doi.org/10.1002/9781118723111.

Fuchs, Ekkehard. Particle beam microanalysis: Fundamentals, methods, and applications. Weinheim, F.R.G: VCH, 1990.

1949-, Bhushan Bharat, and Fuchs H. O. 1907-, eds. Applied scanning probe methods IV: Industrial application. Berlin: Springer, 2005.

Bharat, Bhushan, Bimberg Dieter, Fuchs Harald, Klitzing Klaus von, Sakaki Hiroyuki 1944-, Wiesendanger R. (Roland) 1961-, and SpringerLink (Online service), eds. Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009.

1949-, Bhushan Bharat, and Kawata Satoshi 1966-, eds. Applied scanning probe methods VI: Characterization. Heidelberg: Springer, 2007.

1949-, Bhushan Bharat, and Kawata Satoshi 1966-, eds. Applied scanning probe methods VI: Characterization. Heidelberg: Springer, 2007.

1949-, Bhushan Bharat, Fuchs H, and Kawata Satoshi 1966-, eds. Applied scanning probe methods V: Scanning probe microscopy techniques. Berlin: Springer, 2007.

1949-, Bhushan Bharat, Fuchs H, and Kawata Satoshi 1966-, eds. Applied scanning probe methods V: Scanning probe microscopy techniques. Berlin: Springer, 2007.

Lin, Wang Zhong, and Hui Chun, eds. Electron microscopy of nanotubes. Boston: Kluwer Academic Publishers, 2003.

service), SpringerLink (Online, ed. Scanning Probe Microscopy in Nanoscience and Nanotechnology. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg, 2010.

Loretto, M. H. Electron beam analysis of materials. 2nd ed. London: Chapman & Hall, 1994.

(1989), Ernst-Abbe Colloquium Jena. Proceedings. Jena, German Democratic Republic: Friedrich-Schiller-Universität Jena, 1989.

1945-, Avouris Phaedon, Bimberg Dieter, Fuchs Harald, Klitzing Klaus von, Sakaki Hiroyuki 1944-, Wiesendanger R. (Roland) 1961-, and SpringerLink (Online service), eds. Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009.

International Metallographic Society. Technical Meeting. Advances and applications in the metallography and characterization of materials and microelectronic components: Proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society. Columbus, Ohio: International Metallographic Society, 1996.

1949-, Bhushan Bharat, Fuchs H, and Kawata Satoshi 1966-, eds. Applied scanning probe methods V: Scanning probe microscopy techniques. Berlin: Springer, 2007.

1949-, Bhushan Bharat, and Fuchs H. O. 1907-, eds. Applied scanning probe methods II: Scanning probe microscopy techniques. Berlin: Springer, 2005.

service), SpringerLink (Online, ed. Applied Scanning Probe Methods XIII: Characterization. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009.

Christophe, Gorecki, Asundi Anand, Osten Wolfgang, SPIE Europe, Bas-Rhin (France) Conseil général, Comité National d'Optique et de Photonique (France), and Society of Photo-optical Instrumentation Engineers., eds. Optical micro- and nanometrology in microsystems technology: 5-7 April 2006, Strasbourg, France. Bellingham, Wash: SPIE, 2006.

MSMS-10 (2010 Liptovský Ján, Slovakia). Mössbauer spectroscopy in materials science--2010: Proceedings of the international conference, MSMS-10, Liptovský Ján, Slovakia, 31 January-5 February, 2010. Edited by Tuček Jiří and Miglierini Marcel. Melville, N.Y: American Institute of Physics, 2010.

James, Howe, and SpringerLink (Online service), eds. Transmission Electron Microscopy and Diffractometry of Materials. 4th ed. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013.

Wenbing, Yun, and Society of Photo-optical Instrumentation Engineers., eds. X-ray microbeam technology and applications: 11-12 July, 1995, San Diego, California. Bellingham, Wash., USA: SPIE, 1995.

International Congress on X-ray Optics and Microanalysis. (12th 1989 Cracow, Poland). 12th International Congress on X-ray Optics and Microanalysis: 28 Aug-1 Sept 1989 Cracow : 12 ICXOM. Cracow: Academy of Mining and Metallurgy, 1989.

Zlateva, Ganka. Microstructure of metals and alloys: An atlas of transmission electron microscopy images. Boca Raton, FL: CRC Press, 2008.

Organization, World Health, ed. Determination of airborne fibre number concentrations: A recommended method, by phase-contrast optical microscopy, membrane filter method. Geneva: World Health Organization, 1997.

Postek, Michael T. Scanning microscopies 2011: Advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States. Edited by SPIE (Society). Bellingham, Wash: SPIE, 2011.

L, Ackerman Jerome, Ellingson W. A, and Materials Research Society, eds. Advanced tomographic imaging methods for the analysis of materials: Symposium held November 28-30, 1990, Boston, Massachusetts, U.S.A. Pittsburgh, Pa: Materials Research Society, 1991.

D, Kaplan Wayne, ed. Microstructural characterization of materials. Chichester: J. Wiley, 1999.

Industrial relations under the microscope:a critical assessment and outlook (1995 Sydney). Industrial relationspolicy under the microscope. [Sydney, NSW]: ACIRRT, 1996.

Brandon, D. G. Microstructural characterization of materials. 2nd ed. Chichester, England: John Wiley, 2008.

Garner, Walter. Industrial Microscopy. Creative Media Partners, LLC, 2015.

Industrial Applications of Electron Microscopy (Encyclopedia of Library & Information Science). CRC, 2002.

Li, Zhigang. Industrial Applications of Electron Microscopy. Taylor & Francis Group, 2002.

Li, Zhigang. Industrial Applications of Electron Microscopy. Taylor & Francis Group, 2002.

Li, Zhigang. Industrial Applications of Electron Microscopy. Taylor & Francis Group, 2002.

Li, Zhigang. Industrial Applications of Electron Microscopy. Taylor & Francis Group, 2002.

Li, Zhigang. Industrial Applications of Electron Microscopy. Taylor & Francis Group, 2002.

Scanning Probe Microscopy for Industrial Applications. John Wiley & Sons Inc, 2014.

Yablon, Dalia G. Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley & Sons, Incorporated, John, 2013.

Yablon, Dalia G. Scanning Probe Microscopy�in Industrial Applications: Nanomechanical Characterization. Wiley & Sons, Incorporated, John, 2013.

Applied Scanning Probe Methods Xiii Biomimetics And Industrial Applications. Springer, 2008.

Yablon, Dalia G. Scanning Probe Microscopy�in Industrial Applications: Nanomechanical Characterization. Wiley & Sons, Incorporated, John, 2013.

Yablon, Dalia G. Scanning Probe Microscopy�in Industrial Applications: Nanomechanical Characterization. Wiley & Sons, Incorporated, John, 2013.

Fuchs, Harald, Bharat Bhushan, and Masahiko Tomitori. Applied Scanning Probe Methods X: Biomimetics and Industrial Applications. Springer, 2008.

Fuchs, Harald, Bharat Bhushan, and Masahiko Tomitori. Applied Scanning Probe Methods X: Biomimetics and Industrial Applications. Springer, 2010.

Yablon, Dalia G. Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical Characterization. Wiley & Sons, Limited, John, 2013.

(Editor), Bharat Bhushan, and Harald Fuchs (Editor), eds. Applied Scanning Probe Methods IV: Industrial Applications (NanoScience and Technology). Springer, 2006.

Fuchs, Erich, H. Oppolzer, and H. Rehme. Particle Beam Microanalysis: Fundamentals, Methods and Applications. VCH Publishing, 1991.

Applied scanning probe methods VII: Biomimetics and industrial applications. Berlin: Springer, 2007.

Applied scanning probe methods VII: Biomimetics and industrial applications. Berlin: Springer, 2007.

Fuchs, Harald, Bharat Bhushan, and Various. Applied Scanning Probe Methods VII: Biomimetics and Industrial Applications. Springer, 2010.