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Journal articles on the topic 'Industrial microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 August 2024

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1

Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (July 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.

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2

Solebello, Louis P. "Industrial Mineral Microscopy." Microscopy Today 1, no. 5 (August 1993): 5. http://dx.doi.org/10.1017/s155192950006805x.

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What is industrial mineral microscopy? It is the application of any micro-analytical technique used to characterize and identify non-metallic and non-fuel earth materials. Humans have used industrial minerals since ancient times. The earliest known scientific work which dealt expressly with minerals and artificial products derived from them is Theophrastus On Stones. Theophrastus, a pupil and friend of Aristotle, described the use of fuller's earth and gypsum for whitening discolored cloth garments in the latter half of the 4th century, B.C. Fuller's earth is still used today as a decolorizing agent by manufacturers of oil and fat products. Gypsum, of course, is widely used in plaster of paris, cement, and paper.Today, industrial minerals are encountered often by people in everyday life. Electronic, pharmaceutical, cosmetic, construction, paper, and plastics industries use industrial minerals in a multitude of products.

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3

Galuska, Alan A. "Atomic Force Microscopy of Industrial Polymers." Microscopy and Microanalysis 5, S2 (August 1999): 982–83. http://dx.doi.org/10.1017/s1431927600018237.

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The performance of many industrial polymers is determined by the microscopic morphology of the polymers. For example, surface morphology can influence properties such as adhesion, friction, sealing, blocking, printability, wettability, and haze. Furthermore, bulk morphology often controls mechanical properties such as toughness. strength, wear, and tear resistance. In order to optimize polymer performance, quick reliable methods of determining surface and bulk morphology are essential.In the past, electron microscopy (in particular TEM) has been the primary method for determining polymer morphology. However, the usefulness of electron microscopy has been limited by the destructive nature of the electron beam, the naturally poor contrast between polymer types, and the difficulty in preparing (staining, etching, cryogenic ultramicrotoming, etc.) high quality specimens.Recently, the tapping phase-shift mode of atomic force microscopy (TPSAFM) has provided the polymer scientist with a simple, quick, flexible and quantitative method for determining polymer surface and bulk morphology.

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4

Gilmore, R. S. "Industrial ultrasonic imaging and microscopy." Journal of Physics D: Applied Physics 29, no. 6 (June 14, 1996): 1389–417. http://dx.doi.org/10.1088/0022-3727/29/6/001.

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5

Bateman, C. A., J. J. Kilgore, and P. J. Smaltz. "Microscopy of Industrial Ceramic Materials." Microscopy and Microanalysis 7, S2 (August 2001): 552–53. http://dx.doi.org/10.1017/s143192760002883x.

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The microscopy effort within the Saint-Gobain R&D labs involves working with a wide variety of ceramic materials. Samples vary from routine QC type work, to manufacturing plant emergencies, to failure analysis, to marketing support. A typical sample will require a variety of techniques to provide a solution within a few working days. Working in such an environment it is essential that people are aware of the different analytical tools that can be utilized in a given situation. For the microscopists in our lab this means a working knowledge of the techniques that are close to our core competencies centered around optical microscopy and SEM; these include AFM, XRD, Auger, SIMS, and FTIR, which are all used in a complimentary fashion. The examples shown here are illustrative of the kinds of problems worked on and the interactive nature of the solutions.XRD of a siliconized silicon carbide material showed that it contained a higher fraction of the beta phase than was expected.

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6

Gerrard, D. L. "Industrial applications of Raman microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 2 (August 1992): 1502–3. http://dx.doi.org/10.1017/s0424820100132145.

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One of the major advantages of Raman spectroscopy for the industrial analyst is its capability for providing spatially resolved molecular information on a wide range of inorganic materials. Although the technique of Raman microscopy has been available for nearly twenty years its value in industrial analysis is still not widely appreciated. Recent developments in the use of near infrared excitation with Fourier transform spectrometers and of microline focus systems with charge-coupled devices as detectors have greatly expanded the value of the technique and should help it to appeal to a wider audience. Raman microscopy provides much valuable information in its own right and can often be used to solve analytical problems without reference to any other technique. However, it is usually of greatest value to the industrial analyst when used in conjunction with other microspectroscopy techniques such as scanning electron microscopy/energy dispersive X-ray analysis, infrared microscopy, proton-induced X-ray emission, laser ionisation mass analysis and laser scanning optical microscopy.

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7

Kristiansen, K. "Industrial applications of electron microscopy." Ultramicroscopy 24, no. 1 (January 1988): 71. http://dx.doi.org/10.1016/0304-3991(88)90344-0.

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8

Ross, F. M., K. M. Krishnan, N. Thangaraj, R. F. C. Farrow, R. F. Marks, A. Cebollada, S. S. P. Parkin, et al. "Applications of Electron Microscopy in Collaborative Industrial Research." MRS Bulletin 21, no. 5 (May 1996): 17–23. http://dx.doi.org/10.1557/s0883769400035466.

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The transmission electron microscope (TEM) is one of the most useful tools available to the materials scientist. Yet both the complexity and expense of the equipment, and the huge investment in time necessary to become proficient in specimen preparation and image acquisition and analysis, mean that it is difficult for most industrial institutions to maintain a state-of-the-art TEM facility. How can industry overcome this problem? One solution is to set up a collaboration with a university, an industrial partner, or a government research laboratory. Such collaborations can be extremely valuable to the company, which gains access to microscopes, specimen-preparation equipment and the expertise of professional microscopists, and to the research laboratory, which benefits from the industrial perspective and the private sector's proficiency in materials preparation and processing.Such collaborations exist, and they can produce excellent results. In this article, we present three case studies in which successful collaboration has occurred between industry and one of the Department of Energy's scientific user facilities, the National Center for Electron Microscopy (NCEM-see sidebar). Our aim is not only to describe results that we hope will be of scientific interest but also to encourage industrial researchers to consider collaborations with institutes such as NCEM.

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9

Magonov, S. "Industrial Applications of Scanning Probe Microscopy." Microscopy and Microanalysis 4, S2 (July 1998): 522–23. http://dx.doi.org/10.1017/s143192760002273x.

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The evolution of scanning tunneling microscopy (STM) into atomic force microscopy (AFM) have led to a family of scanning probe techniques which are widely applied in fundamental research and in industry. Visualization of the atomic- and molecular-scale structures and the possibility of modifying these structures using a sharp probe were demonstrated with the techniques on many materials. These unique capabilities initiated the further development of AFM and related methods generalized as scanning probe microscopy (SPM). The first STM experiments were performed in the clean conditions of ultra-high vacuum and on well-defined conducting or semi-conducting surfaces. These conditions restrict SPM applications to the real world that requires ambient-condition operation on the samples, many of which are insulators. AFM, which is based on the detection of forces between a tiny cantilever carrying a sharp tip and a sample surface, was introduced to satisfy these requirements. High lateral resolution and unique vertical resolution (angstrom scale) are essential AFM features.

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10

Ade, H., A. P. Smith, G. R. Zhuang, B. Wood, I. plotzker, E. Rightor, D. ‐J Liu, S. ‐C Lui, and C. Sloop. "Industrial applications of X‐ray microscopy." Synchrotron Radiation News 9, no. 5 (September 1996): 31–39. http://dx.doi.org/10.1080/08940889608602905.

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11

Song, Huixu, Qingwei Li, and Zhaoyao Shi. "Maximum Acceptable Tilt Angle for Point Autofocus Microscopy." Sensors 23, no. 24 (December 6, 2023): 9655. http://dx.doi.org/10.3390/s23249655.

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The complete and accurate acquisition of geometric information forms the bedrock of maintaining high-end instrument performance and monitoring product quality. It is also a prerequisite for achieving the ‘precision’ and ‘intelligence’ that the manufacturing industry aspires to achieve. Industrial microscopes, known for their high accuracy and resolution, have become invaluable tools in the precision measurement of small components. However, these industrial microscopes often struggle to demonstrate their advantages when dealing with complex shapes or large tilt angles. This paper introduces a ray-tracing model for point autofocus microscopy, and it provides the quantified relationship formula between the maximum acceptable tilt angle and the beam offset accepted in point autofocus microscopy, then analyzing the maximum acceptable tilt angle of the objects being measured. This novel approach uses the geometric features of a high-precision reference sphere to simulate the tilt angle and displacement of the surface under investigation. The research findings show that the maximum acceptable tilt angles of a point autofocus microscope vary across different measured directions. Additionally, the extent to which the maximum acceptable tilt angles are affected by the distances of the beam offset also varies. Finally, the difference between the experiment results and the theoretical results is less than 0.5°.

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12

Beacher, James. "Microscope Illumination: LEDs are the Future." Microscopy Today 19, no. 4 (July 2011): 18–21. http://dx.doi.org/10.1017/s1551929511000411.

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Light microscopes in laboratories and hospitals are used for examining many different types of samples—from industrial research to life-science research and clinical screening. These procedures use conventional bright-field, differential phase contrast (DIC), and fluorescence microscopy among other techniques. In all cases, the light source on the microscope has a crucial influence on the quality of images viewed and the conclusions reached.

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13

Bolorizadeh, Mehdi. "Microscopy Education in the Fourth Industrial Revolution." Microscopy and Microanalysis 28, S1 (July 22, 2022): 2952. http://dx.doi.org/10.1017/s1431927622011060.

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14

Li, Jian. "The industrial application of advanced electron microscopy." JOM 58, no. 3 (March 2006): 19. http://dx.doi.org/10.1007/s11837-006-0154-1.

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15

Bian, Yinxu, Tao Xing, Kerong Jiao, Qingqing Kong, Jiaxiong Wang, Xiaofei Yang, Shenmin Yang, et al. "Computational Portable Microscopes for Point-of-Care-Test and Tele-Diagnosis." Cells 11, no. 22 (November 18, 2022): 3670. http://dx.doi.org/10.3390/cells11223670.

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In bio-medical mobile workstations, e.g., the prevention of epidemic viruses/bacteria, outdoor field medical treatment and bio-chemical pollution monitoring, the conventional bench-top microscopic imaging equipment is limited. The comprehensive multi-mode (bright/dark field imaging, fluorescence excitation imaging, polarized light imaging, and differential interference microscopy imaging, etc.) biomedical microscopy imaging systems are generally large in size and expensive. They also require professional operation, which means high labor-cost, money-cost and time-cost. These characteristics prevent them from being applied in bio-medical mobile workstations. The bio-medical mobile workstations need microscopy systems which are inexpensive and able to handle fast, timely and large-scale deployment. The development of lightweight, low-cost and portable microscopic imaging devices can meet these demands. Presently, for the increasing needs of point-of-care-test and tele-diagnosis, high-performance computational portable microscopes are widely developed. Bluetooth modules, WLAN modules and 3G/4G/5G modules generally feature very small sizes and low prices. And industrial imaging lens, microscopy objective lens, and CMOS/CCD photoelectric image sensors are also available in small sizes and at low prices. Here we review and discuss these typical computational, portable and low-cost microscopes by refined specifications and schematics, from the aspect of optics, electronic, algorithms principle and typical bio-medical applications.

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16

Wang, Ya Wei, Yuan Yuan Xu, Xing Long Zhu, Shou Wang Jiang, Yu Jiao Chen, Xue Fu Shang, Wei Feng Jin, Cui Hong Lv, Min Bu, and Ying Zhou Chen. "Phase Microscopy Method of Micro-Nano Sized Bubbles Based on Hilbert Phase Microscopy (HPM)." Advanced Materials Research 586 (November 2012): 316–21. http://dx.doi.org/10.4028/www.scientific.net/amr.586.316.

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Measuring shape of bubbles is very important in many industrial processes, because that its behavior in the fluid is closely related to its morphology. Phase microscopy imaging (PMI) method is one of the best useful methods in this field. In the paper, considering on PMI idea, it is put out a new method which improves an ordinary light microscope into a dual function that can do both PMI and its ordinary microscopy function. Its optical structure is designed by using Mach-Zehnder interferometer method which can be added on the platform of ordinary microscope. A glass hole (bubble) is used as a sample to do phase microscopy imaging via the improved device. The results of the experiment and theory show that the phase distribution of bubble is closely related to the shape of it, which is very useful to detect the bubble’s behavior in the flow field. Besides bubbles, the improved microscope can be also used to observe the phase body such as cells.

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17

Petronyuk, Y. S., E. S. Morokov, and V. M. Levin. "Methods of pulsed acoustic microscopy in industrial diagnostics." Bulletin of the Russian Academy of Sciences: Physics 79, no. 10 (October 2015): 1268–73. http://dx.doi.org/10.3103/s1062873815100184.

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18

Lewis, EN, LH Kidder, and KS Haber. "Industrial Applications of Near-Infrared Chemical Imaging Microscopy." Microscopy and Microanalysis 7, S2 (August 2001): 162–63. http://dx.doi.org/10.1017/s143192760002688x.

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Single point near-infrared (NIR) spectroscopy is used extensively for characterizing raw materials and finished products in a wide variety of industries: polymers, paper, film, pharmaceuticals, paintings and coatings, food and beverages, agricultural products. As advanced industrial materials become more complex, their functionality is often determined by the spatial distribution of their discrete sample constituents. However, conventional single point NIR spectroscopy cannot adequately probe the interrelationship between the spatial distribution of sample components with the physical properties of the sample. to fully characterize these samples, it is necessary to probe simultaneously spatial and chemical heterogeneity and correlate these properties with sample characteristics.Recently, we have developed a novel NIR imaging spectrometer that can deliver spatially resolved chemical information very rapidly. in contrast to conventional, single point NIR spectrometers, the imaging system uses an infrared focal-plane array (FPA) to collect up to 76,800 complete spectra, one for each pixel on the array, in approximately one minute.

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19

Dammer, U., D. Anselmetti, M. Dreier, J. Frommer, J. Fünfschilling, G. Gerth, H. J. Güntherodt, et al. "Scanning probe microscopy for industrial applications: Selected examples." Scanning 15, no. 5 (1993): 257–64. http://dx.doi.org/10.1002/sca.4950150504.

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20

Schrof, W., J. Klingler, W. Heckmann, and D. Horn. "Confocal fluorescence and Raman microscopy in industrial research." Colloid & Polymer Science 276, no. 7 (August 24, 1998): 577–88. http://dx.doi.org/10.1007/s003960050284.

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21

Clarke, Theodore M. "Light Microscopy Criteria for Electronic Imaging." Microscopy Today 4, no. 6 (August 1996): 18–21. http://dx.doi.org/10.1017/s1551929500060855.

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Industrial laboratories have traditionally used 4” x 5” (100 x 125 mm) photomicrographs. Polaroid 4” x 5” prints have largely replaced glass plate and sheet film contact prints in industrial laboratories. High resolution 2000 by 3000 pixel imaging systems should be able to match the resolution of the 4” x 5” photomicrographs, typically 6 cycles per mm at a magnification of 500 times N.A., with a significantly larger field size which better utilizes modern, wide field optics. CCD cameras with 1024x 1280 pixel sensor arrays should be able to essentially match Polaroid 4” x 5“ photomicrograph prints in field size and resolution.

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22

Kolb, D. M., and M. A. Schneeweiss. "Scanning Tunneling Microscopy for Metal Deposition Studies." Electrochemical Society Interface 8, no. 1 (March 1, 1999): 26–30. http://dx.doi.org/10.1149/2.f05991if.

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Electrolytic metal deposition, particularly from aqueous solution, provides the basis for a number of indispensable industrial applications such as metal winning and refining, metal plating for corrosion protection, and surface finishing. Circuit board manufacturing in microelectronics, in particular, has renewed interest in the research of metal deposition. In addition to its industrial significance, electrodeposition is also of principal interest in regard to its fundamentals, such as, the investigation of electrocrystallization phenomena.

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23

Zhang, Peng, Mike Salmon, Shaojie Wang, Jingyi Zhang, Mark Izquierdo, and Jane Sun. "Industrial Applications of Electron Microscopy: A Shared Laboratory Perspective." Microscopy and Microanalysis 25, S2 (August 2019): 690–91. http://dx.doi.org/10.1017/s1431927619004185.

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24

Dionne, S., G. J. C. Carpenter, G. A. Botton, T. Malis, and M. W. Phaneuf. "Contributions of Microscopy to Advanced Industrial Materials and Processing." Microscopy and Microanalysis 8, S02 (August 2002): 188–89. http://dx.doi.org/10.1017/s1431927602101747.

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25

Eck, T. C., W. Soufi, and A. Nasrallah. "Product Certification by Automated Microscopy in an Industrial Setting." Microscopy and Microanalysis 9, S02 (July 24, 2003): 1036–37. http://dx.doi.org/10.1017/s1431927603445182.

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26

Lyman, CE. "Microscopy Short Courses for Industrial, Governmental, and Academic Users." Microscopy and Microanalysis 14, S2 (August 2008): 884–85. http://dx.doi.org/10.1017/s1431927608088168.

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27

Gutmannsbauer, W., H. J. Hug, and E. Meyer. "Scanning probe microscopy for nanometer inspections and industrial applications." Microelectronic Engineering 32, no. 1-4 (September 1996): 389–409. http://dx.doi.org/10.1016/0167-9317(95)00371-1.

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28

Karbach, A., and D. Drechsler. "Atomic force microscopy—a powerful tool for industrial applications." Surface and Interface Analysis 27, no. 5-6 (May 1999): 401–9. http://dx.doi.org/10.1002/(sici)1096-9918(199905/06)27:5/6<401::aid-sia533>3.0.co;2-a.

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29

Sozinov, S. A., A. N. Popova, N. S. Zakharov, and Z. R. Ismagilov. "Analysis of Carbonized Industrial Samples by Scanning Electron Microscopy." Coke and Chemistry 66, no. 8 (August 2023): 410–19. http://dx.doi.org/10.3103/s1068364x23701065.

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30

Созинов, С. А., А. Н. Попова, Н. С. Захаров, and З. Р. Исмагилов. "ANALYTICAL SCANNING ELECTRON MICROSCOPY STUDY OF INDUSTRIAL CARBONIZED SAMPLES." Koks i khimiya, no. 8 (November 29, 2023): 15–24. http://dx.doi.org/10.52351/00232815_2023_08_15.

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В работе методом сканирующей электронной микроскопии исследованы морфология, структура и минеральный состав образца промышленного карбонизата. Согласно полученным результатам исследуемый образец карбонизата включает в себя частицы различного фракционного состава, которые покрыты органической массой, содержащей кислород. Также установлено, что в состав входит диспергированный аморфный карбонат кальция, что подтверждается уменьшением содержания кислорода на поверхности частиц после нагрева образца в инертной атмосфере до 800 °C. Показано, что минеральная часть карбонизата содержит характерные для бурых углей элементы Ca, Mg. Выявленная микроструктура образца также свойственна буроугольным карбонизатам. The morphology, structure, and mineral composition of an industrial carbonized sample were investigated using scanning electron microscopy in the study. According to the results, the examined carbonized sample consists of particles of various size fractions, which are covered with an organic mass containing oxygen. The composition includes dispersed amorphous calcium carbonate, which is confirmed by the decrease in oxygen content on the surface of the particles after heating the sample in an inert atmosphere up to 800 °C. The mineral part of the carbonized material contains elements characteristic of brown coal, such as Ca and Mg. The microstructure of the sample identified is also characteristic of brown coal carbonized materials.

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31

Rideout, D. "Confocal Laser Technology for Industrial Use." Microscopy and Microanalysis 18, S2 (July 2012): 1958–59. http://dx.doi.org/10.1017/s1431927612011646.

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32

Razumić, Andrej, Biserka Runje, Dragutin Lisjak, Davor Kolar, Amalija Horvatić Novak, Branko Štrbac, and Borislav Savković. "Atomic Force Microscopy." Tehnički glasnik 18, no. 2 (May 15, 2024): 209–14. http://dx.doi.org/10.31803/tg-20230829155921.

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The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices. Thus far, there are no guidelines or guides available in the field of atomic force microscopy that analyze the influence of input parameters on the quality of measurement results, nor has the measurement uncertainty of the results been estimated. Given the complex functional relationship between input and output variables, which cannot always be explicitly expressed, one of the primary challenges is how to evaluate the measurement uncertainty of the results. The measurement uncertainty of the calibration grating step height on the AFM reference standard was evaluated using the Monte Carlo simulation method. The measurements within this study were conducted using a commercial, industrial atomic force microscope.

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33

Jagadeesan, Sreeshna, Indira Govindaraju, and Nirmal Mazumder. "An Insight into the Ultrastructural and Physiochemical Characterization of Potato Starch: a Review." American Journal of Potato Research 97, no. 5 (August 31, 2020): 464–76. http://dx.doi.org/10.1007/s12230-020-09798-w.

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Abstract Potatoes are highly consumed food around the world, usually following processing of some kind. Apart from its noteworthy presence in diets, potato starch has a multitude of industrial applications as a food additive and recently in novel domains such as nanotechnology and bioengineering. This review examines the microscopic and spectroscopic methods of characterizing potato starch and compares the different properties. The microscopic techniques such as optical microscopy and Scanning Electron Microscopy (SEM) allow observation of structural elements of potato starch. Differential Scanning Calorimetry (DSC) delves into the thermal behavior of starch in presence of water, while Fourier Transform Infrared (FTIR) spectroscopy and X-Ray Diffraction (XRD) analyze the behavior of various chemical bonds and crystallinity of starch. These characterizations are important from a dietary point of view for patients requiring a low-glycemic diet, as well as in facilitating research into a wider array of industrial applications.

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34

Sader, Kasim, Rishi Matadeen, Pablo Castro Hartmann, Tor Halsan, and Chris Schlichten. "Industrial cryo-EM facility setup and management." Acta Crystallographica Section D Structural Biology 76, no. 4 (April 1, 2020): 313–25. http://dx.doi.org/10.1107/s2059798320002223.

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Cryo-electron microscopy (cryo-EM) has rapidly expanded with the introduction of direct electron detectors, improved image-processing software and automated image acquisition. Its recent adoption by industry, particularly in structure-based drug design, creates new requirements in terms of reliability, reproducibility and throughput. In 2016, Thermo Fisher Scientific (then FEI) partnered with the Medical Research Council Laboratory of Molecular Biology, the University of Cambridge Nanoscience Centre and five pharmaceutical companies [Astex Pharmaceuticals, AstraZeneca, GSK, Sosei Heptares and Union Chimique Belge (UCB)] to form the Cambridge Pharmaceutical Cryo-EM Consortium to share the risks of exploring cryo-EM for early-stage drug discovery. The Consortium expanded with a second Themo Scientific Krios Cryo-EM at the University of Cambridge Department of Materials Science and Metallurgy. Several Consortium members have set up in-house facilities, and a full service cryo-EM facility with Krios and Glacios has been created with the Electron Bio-Imaging Centre for Industry (eBIC for Industry) at Diamond Light Source (DLS), UK. This paper will cover the lessons learned during the setting up of these facilities, including two Consortium Krios microscopes and preparation laboratories, several Glacios microscopes at Consortium member sites, and a Krios and Glacios at eBIC for Industry, regarding site evaluation and selection for high-resolution cryo-EM microscopes, the installation process, scheduling, the operation and maintenance of the microscopes and preparation laboratories, and image processing.

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35

Meradi, Hazem, L'Hadi Atoui, Lynda Bahloul, Kotbia Labiod, and Fadhel Ismail. "Characterization of diatomite from Sig region (West Algeria) for industrial application." Management of Environmental Quality: An International Journal 27, no. 3 (April 11, 2016): 281–88. http://dx.doi.org/10.1108/meq-04-2015-0057.

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Purpose – Diatomite also known Kieselguhr, is a non-metallic mineral composed of the skeletal remains of microscopic single-celled aquatic algae called diatoms. The purpose of this paper is to test and to evaluate the diatomite of Sig region (West Algeria) to substitute the main mould powder used in continuous casting of steel for thermal insulation and lubrication. Design/methodology/approach – To assess the behavior of diatomite at different temperatures, a combination of simultaneous scanning calorimetric and thermogravimetric testing was used and to evaluate the structure of diatomite, the scanning microscopy method was applied. Findings – The results showed different endothermic and exothermic peaks, mainly at 84.7°C and 783.5°C for endothermic peaks and 894.9°C for exothermic peak. The scanning microscopy method was used and a large porosity was observed. The trial industrial in continuous casting of steel showed a weak loss temperature of steel. Originality/value – This product may be used for thermal insulation in continuous casting of steel. Also the characterization showed the hot behavior of this product with the various transformations and could give the possibility to other use.

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36

Bergin, F. J., and H. F. Shurvell. "Applications of Fourier Transform Raman Spectroscopy in an Industrial Laboratory." Applied Spectroscopy 43, no. 3 (March 1989): 516–22. http://dx.doi.org/10.1366/0003702894202913.

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In the past, the usefulness of laser Raman spectroscopy as an analytical technique in industrial laboratories has been greatly reduced by problems of laser-induced fluorescence. One method of circumventing this problem is to use near-infrared excitation coupled with a modified FT-IR spectrometer. In this paper, we report the results of some initial exploratory experiments which indicate that significant fluorescence rejection can be achieved. This fluorescence rejection opens up new areas of application for Raman spectroscopy. The advantages and limitations of FT-Raman spectroscopy are discussed. In addition, some initial experiments are outlined on Fourier transform Raman microscopy using a conventional microscope.

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37

Gailet, Jacqueline. "Scanning Acoustical Microscopy." Microscopy Today 2, no. 5 (August 1994): 26–28. http://dx.doi.org/10.1017/s155192950006630x.

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One of Olympus' not well known product in the American market is the UH3 Scanning Acoustic Microscope (SAM). This state of the art, highly versatile microscope has many applications from non-destructive imaging to biomedical analysis, to pharmaceutical applications to name a few areas of current industrial interest.The principle behind SAM is quite simple, and uses the basic physical laws of reflection. High frequency sound waves are mechanically produced by a piezoelectric crystal. A high voltage impulse spike starts the crystal vibrating at its preset resonant frequency emitting acoustical plane waves through a medium with a relatively high sound velocity such as sapphire. The waves are made to converge by a half-spherical lens at the bottom of the sapphire rod. The diameter of the lens is less than one millimeter and depends on the operating frequency. The lower the frequency, the larger is the diameter of the lens.

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38

Goresh, S. "Industrial Applications of Electron Probe Microanalysis (EPMA)." Microscopy and Microanalysis 17, S2 (July 2011): 616–17. http://dx.doi.org/10.1017/s1431927611003953.

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Liu, Jingyue. "Advanced Electron Microscopy Characterization of Nanostructured Heterogeneous Catalysts." Microscopy and Microanalysis 10, no. 1 (January 22, 2004): 55–76. http://dx.doi.org/10.1017/s1431927604040310.

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Heterogeneous catalysis is one of the oldest nanosciences. Although model catalysts can be designed, synthesized, and, to a certain degree, characterized, industrial heterogeneous catalysts are often chemically and physically complex systems that have been developed through many years of catalytic art, technology, and science. The preparation of commercial catalysts is generally not well controlled and is often based on accumulated experiences. Catalyst characterization is thus critical to developing new catalysts with better activity, selectivity, and/or stability. Advanced electron microscopy, among many characterization techniques, can provide useful information for the fundamental understanding of heterogeneous catalysis and for guiding the development of industrial catalysts. In this article, we discuss the recent developments in applying advanced electron microscopy techniques to characterizing model and industrial heterogeneous catalysts. The importance of understanding the catalyst nanostructure and the challenges and opportunities of advanced electron microscopy in developing nanostructured catalysts are also discussed.

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Lyman, Charles E. "SEM Short Courses for Industry: the Lehigh Microscopy School as an example." Microscopy Today 17, no. 1 (January 2009): 28–33. http://dx.doi.org/10.1017/s1551929500054985.

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Short courses in scanning electron microscopy (SEM) can quickly sharpen practical skills for industrial microscopists. The SEM and the energy-dispersive X-ray spectrometer (EDS) together constitute one of the most powerful and versatile instruments available for solving industrial problems, but interpreting images and spectra is not quite as simple as acquiring them. Applications of SEM span many disciplines, and each application may require knowledge of different aspects of the microscope, and of the industrial problem at hand, to successfully interpret the images and data obtained. Regardless of the problem, whether transistors or trachea cells, the interpretation of SEM images relies upon the microscopist's understanding the fundamentals of image formation as well as the practical aspects of specimen preparation and microscope operation. Many people using SEMs today have not taken any courses beyond the on-site and demo-lab instruction provided by SEM vendors. Equipment manufacturers provide excellent training on how to use the knobs and menus on the SEM to produce useful images and data via the embedded software functions. Since there are many options and setup procedures, these instrument-specific courses are valuable for the novice and expert alike.

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Postek, Michael T., Marylyn Bennett, Nestor J. Zaluzec, Thomas Wheatley, and Samuel Jones. "National Institute of Standards and Technology - Texas Instruments Industrial Collaboratory Testbed." Microscopy and Microanalysis 4, S2 (July 1998): 22–23. http://dx.doi.org/10.1017/s1431927600020237.

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One of the missions of the NIST Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. Industry. This responsibility is found within the Precision Engineering Division (PED). The successful development of a “Collaboratory” for TelePresence Microscopy provides an important new tool to promote technology transfer in the area of length metrology and measurement technology. NIST and Texas Instruments, under the auspices of the National Advanced Manufacturing Testbed (NAMT) and in collaboration with the University of Illinois are developing a microscopy collaboratory testbed. This facility is designed to demonstrate the value of telepresence microscopy within a large distributed manufacturing facility such as Texas Instruments and between organizations such as NIST, Texas Instruments and Universities.Telepresence Microscopy is an application of the state-of-the-art Internet based technology to long-distance scientific endeavors.

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Yang, Olivier Guise. "Applications of Atomic Force Microscopy in Industrial Polymer Systems Lanti." Microscopy and Microanalysis 20, S3 (August 2014): 2068–69. http://dx.doi.org/10.1017/s1431927614012070.

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Belini, Valdinei Luís, Philipp Wiedemann, and Hajo Suhr. "In situ microscopy: A perspective for industrial bioethanol production monitoring." Journal of Microbiological Methods 93, no. 3 (June 2013): 224–32. http://dx.doi.org/10.1016/j.mimet.2013.03.009.

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LeBret, J. B., and M. G. Norton. "Tin Whiskers – A Recurring Industrial Problem Examined With Electron Microscopy." Microscopy and Microanalysis 9, S02 (July 24, 2003): 806–7. http://dx.doi.org/10.1017/s1431927603444036.

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Tohmyoh, Hironori, and Tsuyoshi Akaogi. "Rubber-coupled acoustic microscopy for dry inspections of industrial products." NDT & E International 40, no. 5 (July 2007): 368–73. http://dx.doi.org/10.1016/j.ndteint.2007.01.007.

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Pan, H. C., and Y. C. K0. "Scanning electron microscopy of industrial low-flux dolomite refractory clinkers." Journal of Materials Science 22, no. 11 (November 1987): 4061–66. http://dx.doi.org/10.1007/bf01133358.

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Vázquez Acosta, F., Leticia M. Torres-Martínez, Lorena L. Garza-Tovar, A. Martínez-de la Cruz, and Wallter López González. "Mineralogical Characterization of Villa Reyes México Kaolin for Industrial Applications." Materials Science Forum 569 (January 2008): 341–44. http://dx.doi.org/10.4028/www.scientific.net/msf.569.341.

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A kaolin obtained from a region near to San Luis Potosí (México) was characterized by X-ray powder diffraction (DRX), optical microscopy (OM), scanning electron microscopy (SEM), X-ray fluorescence (XRF), thermal analysis (DTA/TGA), and chemical analysis. Mineralogical and morphological characteristics of the mineral are presented. The kaolin sample was formed mainly by kaolinite, but other minor phases were also detected such as quartz, cristobalite, trydimite, and dolomite. For iron lixiviation process, concentrate HCl was employed. The high content of volcanic glass detected, evidenced by optical microscopy, revealed an incomplete kaolinization process of the raw material. In agreement with these results, X-ray fluorescence analysis showed high- SiO2 and low-Al2O3 content in the sample as is expected on weakly kaolinized materials.

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Zhang, Xiao. "Digital imaging and quantitative image analysis of polymer blends." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 170–71. http://dx.doi.org/10.1017/s0424820100163319.

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Polymer microscopy involves multiple imaging techniques. Speed, simplicity, and productivity are key factors in running an industrial polymer microscopy lab. In polymer science, the morphology of a multi-phase blend is often the link between process and properties. The extent to which the researcher can quantify the morphology determines the strength of the link. To aid the polymer microscopist in these tasks, digital imaging systems are becoming more prevalent. Advances in computers, digital imaging hardware and software, and network technologies have made it possible to implement digital imaging systems in industrial microscopy labs.

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Osten, E. F., and M. S. Smith. "Field Emission Scanning Electron Microscopy Studies of Industrial Polymers - A Survey." Microscopy and Microanalysis 4, S2 (July 1998): 814–15. http://dx.doi.org/10.1017/s1431927600024193.

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We are using the term "Industrial Polymers" to refer to polymers [plastics] that are produced by the ton or (in the case of films) by the mile. For example, in descending order of world-wide use (tonnage), the top eight of these polymers are polyethylene (PE), polyvinyl chloride (PVC), polypropylene (PP), styrene polymers (including polystyrene - PS, and acrylonitrile-butadienestyrene/ styrene-acrylonitrile - ABS/SAN), polyesters (PETP), polyurethane (PU), phenolics and aminoplastics.Industrial polymers, which have been produced by the millions of tons for the last five decades and are of obvious social and economic importance, have been exhaustively characterized. Structural features which affect physical properties and indicate process variables have been studied by many techniques other than microscopy (x-ray diffraction, thermal analysis, rheology, chromatographies, etc.). Microscopy techniques for polymer characterization have been well documented. Our motivation to apply field emission (high resolution) scanning electron microscopy to the study of polymers is: (1) The application of low voltage, high resolution SEM to biological materials is well characterized.

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McCrone, Walter C. "Particle Analysis." Microscopy Today 6, no. 5 (July 1998): 18–19. http://dx.doi.org/10.1017/s155192950006778x.

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If you can recognize a robin or a banana by sight, you should be able to recognize single particles of coal, cement or gypsum when the microscope magnifies them to an equivalent size. This is the thesis of those who identify small particles by microscopy. No other microanalytical method identifies such small samples of such diverse substances so quickly.Single particles of almost any substance - animal, vegetable, mineral, industrial byproduct, raw material, corrosion product, flyash - can be identified in a few seconds to a few minutes by a microscopist trained in particle identification. The particle must be at least 2 to 3 microns in diameter and 10 picograms or 10-11 gram in weight for identification by light microscopy.

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