Journal articles on the topic 'Interferometrisch'
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Wang, Fangjian, Angelina Scholz, Joachim Hug, and Christian Rembe. "Laser-Doppler-Dehnungssensor / Laser-Doppler strain gauge." tm - Technisches Messen 86, s1 (2019): 82–86. http://dx.doi.org/10.1515/teme-2019-0043.
Full textRiebeling, Jörg, Igor Wellem, Peter Lehmann, and Gerd Ehret. "Erfassung von Formabweichungen rotierender optischer Flächen mit linien-scannendem Interferometer, Echtzeitauswertung und Achsabweichungskompensation / Detection of form deviations of rotating optical surfaces with line-scanning interferometer, real-time evaluation and compensation of scan axis deviations." tm - Technisches Messen 86, s1 (2019): 92–96. http://dx.doi.org/10.1515/teme-2019-0049.
Full textVorbringer-Dorozhovets, Nataliya, Eberhard Manske, and Gerd Jäger. "Interferometrisches Rasterkraftmikroskop: Aufbau, messtechnische Eigenschaften und Applikationsmessungen / Interferometric atomic force microscope: design, metrological properties and application measurements." tm - Technisches Messen 85, s1 (2018): s52—s58. http://dx.doi.org/10.1515/teme-2018-0023.
Full textMüller, André F., Claas Falldorf, Gerd Ehret, and Ralf B. Bergmann. "Messen von asphärischen Linsenformen mittels räumlicher Kohärenz." tm - Technisches Messen 86, no. 6 (2019): 325–34. http://dx.doi.org/10.1515/teme-2019-0025.
Full textTereschenko, Stanislav, and Peter Lehmann. "Inline-fähige Weißlichtinterferometrie mit integrierter Schwingungskompensation / Inline scanning white-light interferomety with integrated vibration compensation." tm - Technisches Messen 85, s1 (2018): s14—s20. http://dx.doi.org/10.1515/teme-2018-0025.
Full textTereschenko, Stanislav, and Peter Lehmann. "Inline-fähige Weißlichtinterferometrie mit integrierter Schwingungskompensation." tm - Technisches Messen 86, no. 4 (2019): 197–207. http://dx.doi.org/10.1515/teme-2018-0085.
Full textWang, Fangjian, and Christian Rembe. "Entwurf eines kontaktlosen interferometrischen Dehnungssensors / Design of a contactless interferometric strain gauge." tm - Technisches Messen 85, s1 (2018): s117—s123. http://dx.doi.org/10.1515/teme-2018-0045.
Full textSun Lipeng, 孙立朋, 黄赟赟 Huang Yunyun та 关柏鸥 Guan Baiou. "微光纤干涉型生物传感器". Laser & Optoelectronics Progress 58, № 13 (2021): 1306004. http://dx.doi.org/10.3788/lop202158.1306004.
Full textJianwen Hua, Jianwen Hua, Zhanhu Wang Zhanhu Wang, Juan Duan Juan Duan, et al. "Review of Geostationary Interferometric Infrared Sounder." Chinese Optics Letters 16, no. 11 (2018): 111203. http://dx.doi.org/10.3788/col201816.111203.
Full textMeixner, Andreas, Andreas Purde, Hans Schweizer, et al. "Methoden der interferometrischen Formerfassung nicht-ruhender technischer Oberflächen (Methods for Interferometric Contour Measurement of Non Stationary Technical Surfaces)." tm - Technisches Messen 71, no. 4-2004 (2004): 211–17. http://dx.doi.org/10.1524/teme.71.4.211.30453.
Full textOsten, Wolfgang, Eugenio Garbusi Garbusi, Roger M. Groves, Klaus Körner, Giancarlo Pedrini, and Christof Pruss. "Interferometrische Messtechnik." Optik & Photonik 3, no. 3 (2008): 50–56. http://dx.doi.org/10.1002/opph.201190209.
Full textZhilong Zhao, Zhilong Zhao, Jin Wu Jin Wu, Yuanyuan Su Yuanyuan Su, Na Liang Na Liang, and Hongcheng Duan Hongcheng Duan. "Three-dimensional imaging interferometric synthetic aperture ladar." Chinese Optics Letters 12, no. 9 (2014): 091101–91104. http://dx.doi.org/10.3788/col201412.091101.
Full textFan, J., X. Zuo, T. Li, Q. Chen, and X. Geng. "AN IMPROVED INTERFEROMETRIC CALIBRATION METHOD BASED ON INDEPENDENT PARAMETER DECOMPOSITION." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLII-3 (April 30, 2018): 321–27. http://dx.doi.org/10.5194/isprs-archives-xlii-3-321-2018.
Full textGauglitz, Günter. "Interferometrische und Evaneszentfeldsensoren." Nachrichten aus Chemie, Technik und Laboratorium 43, no. 3 (1995): 316–18. http://dx.doi.org/10.1002/nadc.19950430309.
Full textvan Belle, Gerard T. "Interferometric astrometry." New Astronomy Reviews 53, no. 11-12 (2009): 336–43. http://dx.doi.org/10.1016/j.newar.2010.07.012.
Full textWatkins, Lionel R. "Interferometric ellipsometer." Applied Optics 47, no. 16 (2008): 2998. http://dx.doi.org/10.1364/ao.47.002998.
Full textPieraccini, M., F. Papi, and S. Rocchio. "Interferometric RotoSAR." Electronics Letters 51, no. 18 (2015): 1451–53. http://dx.doi.org/10.1049/el.2015.1785.
Full textBerger, J. P. "Interferometric Instrumentation." EAS Publications Series 69-70 (2014): 53–73. http://dx.doi.org/10.1051/eas/1569004.
Full textSlater, S. D., and K. P. Parsons. "Interferometric Microscopy." Imaging Science Journal 45, no. 3-4 (1997): 265. http://dx.doi.org/10.1080/13682199.1997.11736426.
Full textMachado, Rachel R. P., Elton Soares de Lima Filho, Rafael C. Dutra, et al. "Metabolic Activity Interferometer: A Powerful Tool for Testing Antibiotics." Journal of Sensors 2012 (2012): 1–7. http://dx.doi.org/10.1155/2012/493797.
Full textXiao, Xiang, Min Zhou, and Gerard T. Schuster. "Salt-flank delineation by interferometric imaging of transmitted P- to S-waves." GEOPHYSICS 71, no. 4 (2006): SI197—SI207. http://dx.doi.org/10.1190/1.2209550.
Full textCornwell, T. J. "Imaging Techniques: Limitations to the Quality of Images." Symposium - International Astronomical Union 158 (1994): 37–45. http://dx.doi.org/10.1017/s0074180900107302.
Full textLiang Xue, Liang Xue, Shouyu Wang Shouyu Wang, Keding Yan Keding Yan, Nan Sun Nan Sun, Zhenhua Li Zhenhua Li, and Fei Liu Fei Liu. "Fast pixel shifting phase unwrapping algorithm in quantitative interferometric microscopy." Chinese Optics Letters 12, no. 7 (2014): 071801–71806. http://dx.doi.org/10.3788/col201412.071801.
Full textXu, Bing, Zhiwei Li, Yan Zhu, Jiancun Shi, and Guangcai Feng. "SAR Interferometric Baseline Refinement Based on Flat-Earth Phase without a Ground Control Point." Remote Sensing 12, no. 2 (2020): 233. http://dx.doi.org/10.3390/rs12020233.
Full textLee, Sui Ping, Yee Kit Chan, and Tien Sze Lim. "An Absolute Phase Estimation Method for Interferometry Imagery." Journal of Engineering Technology and Applied Physics 1, no. 2 (2019): 14–19. http://dx.doi.org/10.33093/jetap.2019.1.2.4.
Full textPing Lee, Sui, Yee Kit Chan, and Tien Sze Lim. "An Absolute Phase Estimation Method for Interferometry Imagery." Journal of Engineering Technology and Applied Physics 1, no. 2 (2019): 14–19. http://dx.doi.org/10.33093/jetap.2019.1.2.40.
Full textten Brummelaar, Theo A. "Reducing Binary Star Data from Long-Baseline Interferometers." Proceedings of the International Astronomical Union 2, S240 (2006): 178–87. http://dx.doi.org/10.1017/s1743921307003997.
Full textHärtig, Frank, and Karin Kniel. "Universelles Verfahren zur interferometrischen Messung von Längen und Durchmessern auf KMG (Universal Method for Interferometric Measurements of Lengths and Diameters on CMM)." tm – Technisches Messen 74, no. 1 (2007): 1–4. http://dx.doi.org/10.1524/teme.2007.74.1.1.
Full textBratchenko, H. D., H. H. Smaglyuk, D. V. Grygoriev, and A. I. Plotnik. "3D POSITION MEASUREMENT SIMULATION OF AIR TARGET'S SCATTERRERS IN INTERFEROMETRIC ISAR." Key title Zbìrnik naukovih pracʹ Odesʹkoï deržavnoï akademìï tehnìčnogo regulûvannâ ta âkostì -, no. 2(11) (2017): 58–64. http://dx.doi.org/10.32684/2412-5288-2017-2-11-58-64.
Full textSu’an Xu, Su’an Xu, Luc Chassagne Luc Chassagne, Suat Topcu Suat Topcu, Le Chen Le Chen, Jian Sun Jian Sun, and Tianhong Yan Tianhong Yan. "Polarimetric interferometer for measuring nonlinearity error of heterodyne interferometric displacement system." Chinese Optics Letters 11, no. 6 (2013): 061201–61205. http://dx.doi.org/10.3788/col201311.061201.
Full textGrall, Piotr, Iwona Kochanska, and Jacek Marszal. "Direction-of-Arrival Estimation Methods in Interferometric Echo Sounding." Sensors 20, no. 12 (2020): 3556. http://dx.doi.org/10.3390/s20123556.
Full textKallmeyer, F., G. Wernicke, S. Krüger, H. Gruber, W. Osten, and D. Kayser. "Optische Verarbeitung von interferometrischen Streifenbildern und die Fehlererkennung durch Wavelet-Filterung (Optical Processing of Interferometric Fringes and Detection of Faults by Wavelet Filtering)." tm - Technisches Messen 70, no. 2-2003 (2003): 66–70. http://dx.doi.org/10.1524/teme.70.2.66.20110.
Full textSiciliani de Cumis, Mario, F. Marino, M. Anderlini, et al. "Interferometric Quantum Sensors." Advances in Science and Technology 55 (September 2008): 154–59. http://dx.doi.org/10.4028/www.scientific.net/ast.55.154.
Full textGlindemann, A., F. Delplancke, P. Kervella, F. Paresce, A. Richichi, and M. Schöller. "Ground interferometric searches." Symposium - International Astronomical Union 202 (2004): 417–24. http://dx.doi.org/10.1017/s007418090021841x.
Full textPatra, A. S., and Alika Khare. "Interferometric array generation." Optics & Laser Technology 38, no. 1 (2006): 37–45. http://dx.doi.org/10.1016/j.optlastec.2004.09.008.
Full textChiou, Arthur E., Wen Wang, Greg J. Sonek, John Hong, and M. W. Berns. "Interferometric optical tweezers." Optics Communications 133, no. 1-6 (1997): 7–10. http://dx.doi.org/10.1016/s0030-4018(96)00456-7.
Full textJaeger, Gregg, Abner Shimony, and Lev Vaidman. "Two interferometric complementarities." Physical Review A 51, no. 1 (1995): 54–67. http://dx.doi.org/10.1103/physreva.51.54.
Full textChuss, David T., Edward J. Wollack, S. Harvey Moseley, and Giles Novak. "Interferometric polarization control." Applied Optics 45, no. 21 (2006): 5107. http://dx.doi.org/10.1364/ao.45.005107.
Full textKuznetsova, Yuliya, Alexander Neumann, and Steven R. J. Brueck. "Imaging interferometric microscopy." Journal of the Optical Society of America A 25, no. 3 (2008): 811. http://dx.doi.org/10.1364/josaa.25.000811.
Full textMujat, Mircea, Erwan Baleine, and Aristide Dogariu. "Interferometric imaging polarimeter." Journal of the Optical Society of America A 21, no. 11 (2004): 2244. http://dx.doi.org/10.1364/josaa.21.002244.
Full textKANG, H. C., S. Y. LEE, J. KIM, and D. Y. NOH. "EUV Interferometric Lithography." Physics and High Technology 20, no. 1/2 (2011): 9. http://dx.doi.org/10.3938/phit.20.002.
Full textYoung, Gavin, and Philipp Kukura. "Interferometric Scattering Microscopy." Annual Review of Physical Chemistry 70, no. 1 (2019): 301–22. http://dx.doi.org/10.1146/annurev-physchem-050317-021247.
Full textSchwider, J., and Liang Zhou. "Dispersive interferometric profilometer." Optics Letters 19, no. 13 (1994): 995. http://dx.doi.org/10.1364/ol.19.000995.
Full textSchwarz, Christian J., Yuliya Kuznetsova, and S. R. J. Brueck. "Imaging interferometric microscopy." Optics Letters 28, no. 16 (2003): 1424. http://dx.doi.org/10.1364/ol.28.001424.
Full textMertz, Lawrence N. "Interferometric angle encoder." Review of Scientific Instruments 62, no. 5 (1991): 1356–60. http://dx.doi.org/10.1063/1.1142499.
Full textItoh, Kazuyoshi, Takashi Inoue, Tetsuo Yoshida, and Yoshiki Ichioka. "Interferometric supermultispectral imaging." Applied Optics 29, no. 11 (1990): 1625. http://dx.doi.org/10.1364/ao.29.001625.
Full textAndrews, John R. "Interferometric power amplifiers." Optics Letters 14, no. 1 (1989): 33. http://dx.doi.org/10.1364/ol.14.000033.
Full textWolff, E. G., and R. C. Savedra. "Precision interferometric dilatometer." Review of Scientific Instruments 56, no. 7 (1985): 1313–19. http://dx.doi.org/10.1063/1.1137997.
Full textMANSURIPUR, MASUD. "Bracewell's Interferometric Telescope." Optics and Photonics News 11, no. 3 (2000): 41. http://dx.doi.org/10.1364/opn.11.3.000041.
Full textParks, Robert. "Standardizing Interferometric Measurement." Optics and Photonics News 4, no. 11 (1993): 67. http://dx.doi.org/10.1364/opn.4.11.000067.
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