Relevant bibliographies by topics / Ion Beam Analysis (IBA)

Contents

  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Ion Beam Analysis (IBA)'

Author: Grafiati
Published: 25 May 2024
Last updated: 19 July 2025

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the lists of relevant articles, books, theses, conference reports, and other scholarly sources on the topic 'Ion Beam Analysis (IBA).'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Journal articles on the topic "Ion Beam Analysis (IBA)"

1

Dobrovodský, Jozef, Dušan Vaňa, Matúš Beňo, Anna Závacká, Martin Muška, and Róbert Riedlmajer. "Status of Ion Beam Modification and Analysis of Materials at STU MTF." Research Papers Faculty of Materials Science and Technology Slovak University of Technology 26, no. 43 (2018): 9–16. http://dx.doi.org/10.2478/rput-2018-0025.

Full text
Abstract:
Abstract The new Ion Beam Centre (IBC) equipped with 6 MV tandem ion accelerator and 500 kV ion implanter systems was built at the Slovak University of Technology, Faculty of Materials Science and Technology (STU MTF). The facility provides Ion Beam Modification of Materials (IBMM) and Ion Beam Analysis (IBA), which includes Rutherford Backscattering Spectrometry (RBS), Particle Induced X-ray Analysis (PIXE), Elastic Recoil Spectrometry (ERDA) and Nuclear Reaction Analysis (NRA). Presented are selected experimental procedures carried out in the IBC during the first year of operation. They pres
APA, Harvard, Vancouver, ISO, and other styles
2

Ješkovský, Miroslav, Jakub Kaizer, Ivan Kontuľ, et al. "Recent developments in IBA analysis at CENTA, Bratislava." EPJ Web of Conferences 261 (2022): 01002. http://dx.doi.org/10.1051/epjconf/202226101002.

Full text
Abstract:
An experimental setup used at the CENTA (Centre for Nuclear and Accelerator Technologies) laboratory to carry out IBA (Ion Beam Analysis) techniques is described. PIXE (Particle Induced X-ray Emission) technique offers a unique way of non-destructive elemental analysis using accelerated ion beams. The calibration of instrumental constants (H-values) of SDD and BEGe detectors, used in the setup, is described in detail. The H-value was determined as a function of X-ray energy by using thin MicroMatter standards of chosen elements. The calibrated H-values were then used in GUPIXWIN for the determ
APA, Harvard, Vancouver, ISO, and other styles
3

Möller, Sören, Daniel Höschen, Sina Kurth, et al. "A New High-Throughput Focused MeV Ion-Beam Analysis Setup." Instruments 5, no. 1 (2021): 10. http://dx.doi.org/10.3390/instruments5010010.

Full text
Abstract:
The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrange
APA, Harvard, Vancouver, ISO, and other styles
4

Shi, Liqun, Hao Shen, and Xufei Wang. "23th International Conference on Ion Beam Analysis (IBA 2017)." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 450 (July 2019): 1–7. http://dx.doi.org/10.1016/j.nimb.2019.05.037.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Chiari, Massimo. "External Beam IBA Measurements for Cultural Heritage." Applied Sciences 13, no. 5 (2023): 3366. http://dx.doi.org/10.3390/app13053366.

Full text
Abstract:
Ion beam analysis (IBA) methods refer to a set of analytical techniques based on the interactions of energetic ions, produced by a particle accelerator, with matter. The result of such interactions is the emission of characteristic radiation, X and gamma rays, and charged particles, which, upon detection, provide valuable information on the absolute concentration and depth distribution of the elements in the bombarded material. Moreover, IBA techniques can be performed while maintaining the object to be investigated at atmospheric pressure, without placing it in vacuum, in an analysis chamber,
APA, Harvard, Vancouver, ISO, and other styles
6

Romolo, F. S., M. E. Christopher, M. Donghi, et al. "Integrated Ion Beam Analysis (IBA) in Gunshot Residue (GSR) characterisation." Forensic Science International 231, no. 1-3 (2013): 219–28. http://dx.doi.org/10.1016/j.forsciint.2013.05.006.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Mayer, M. "An expert-assisted system for improving the quality of IBA simulations by SIMNRA." Journal of Physics: Conference Series 2326, no. 1 (2022): 012007. http://dx.doi.org/10.1088/1742-6596/2326/1/012007.

Full text
Abstract:
Abstract SIMNRA is a popular software suite for the simulation of ion beam analysis (IBA) spectra. SIMNRA 7.04 implements a new expert system supporting users in selecting the most accurate simulation settings for a given ion/target combination at a given energy and geometry. The expert system is a piece of artificial intelligence emulating the ability and knowledge of a human IBA expert. It points out potential problems with the current simulation parameters and recommends model settings with enhanced accuracy.
APA, Harvard, Vancouver, ISO, and other styles
8

UTUI, R. J., N. P. O. HOMMAN, and K. G. MALMQVIST. "THE NEW LOW ENERGY ION BEAM ANALYSIS FACILITY AT MAPUTO UNIVERSITY." International Journal of PIXE 05, no. 04 (1995): 249–53. http://dx.doi.org/10.1142/s0129083595000289.

Full text
Abstract:
A new Ion Beam Analysis (IBA) facility which was recently installed in the Department of Physics of the Eduardo Mondlane University of Maputo, Mozambique, is described. The set up is based on a low energy (500 keV) Van de Graaff proton accelerator and is intended to be used in particle induced X-ray emission (PIXE), Rutherford Backscattering (RBS) and nuclear reaction analysis (NRA). Preliminary experiments on beam diagnostics were performed successfully and the followed procedure is described.
APA, Harvard, Vancouver, ISO, and other styles
9

Möller, Sören, Hyunsang Joo, Marcin Rasinski, Markus Mann, Egbert Figgemeier, and Martin Finsterbusch. "Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis." Batteries 8, no. 2 (2022): 14. http://dx.doi.org/10.3390/batteries8020014.

Full text
Abstract:
The localisation and quantitative analysis of lithium (Li) in battery materials, components, and full cells are scientifically highly relevant, yet challenging tasks. The methodical developments of MeV ion beam analysis (IBA) presented here open up new possibilities for simultaneous elemental quantification and localisation of light and heavy elements in Li and other batteries. It describes the technical prerequisites and limitations of using IBA to analyse and solve current challenges with the example of Li-ion and solid-state battery-related research and development. Here, nuclear reaction a
APA, Harvard, Vancouver, ISO, and other styles
10

Dobrovodský, J., D. Vaňa, M. Beňo, F. Lofaj, and R. Riedlmajer. "Ion Beam Analysis including ToF-ERDA of complex composition layers." Journal of Physics: Conference Series 2712, no. 1 (2024): 012024. http://dx.doi.org/10.1088/1742-6596/2712/1/012024.

Full text
Abstract:
Abstract When developing new materials for example, for high-temperature nuclear reactors with the potential of hydrogen production, that are characterized by radiation, high temperature and corrosion resistance, it is indispensable the knowledge of their detailed elemental composition and its possible variation with depth from surface. Several analytical methods based on different physical principles are used to determine the depth distribution of elements in the surface layers of materials. For the quantitative determination of elemental depth profile to a depth of several micrometres are ap
APA, Harvard, Vancouver, ISO, and other styles
More sources

Dissertations / Theses on the topic "Ion Beam Analysis (IBA)"

1

Back, Markus. "Investigation of the properties of thin films grown via sputtering and resistive thermal evaporation : an Ion Beam Analysis (IBA) study." Thesis, Uppsala universitet, Tillämpad kärnfysik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-257506.

Full text
Abstract:
In this project, thin films are being manufactured by different methods in a thin film deposition set-up and subsequently characterized. This is done in order to determine if the set-up is capable of producing films of sufficient quality to be used for research purposes in the ion physics group of the division of applied nuclear physics at Uppsala University. Both copper and silver films are manufactured by magnetron sputtering deposition. Copper films are also manufactured by evaporation deposition. Deposition is made on Si(001) substrates. The films are analyzed with Rutherford Backscatterin
APA, Harvard, Vancouver, ISO, and other styles
2

Bykov, Igor. "Experimental studies of materials migration in magnetic confinement fusion devices : Novel methods for measurement of macro particle migration, transport of atomic impurities and characterization of exposed surfaces." Doctoral thesis, KTH, Fusionsplasmafysik, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-145045.

Full text
Abstract:
During several decades of research and development in the field of Magnetically Confined Fusion (MCF) the preferred selection of materials for Plasma Facing Components (PFC) has changed repeatedly. Without doubt, endurance of the first wall will decide research availability and lifespan of the first International Thermonuclear Research Reactor (ITER). Materials erosion, redeposition and mixing in the reactor are the critical processes responsible for modification of materials properties under plasma impact. This thesis presents several diagnostic techniques and their applications for studies o
APA, Harvard, Vancouver, ISO, and other styles
3

Santos, Thales Borrely dos. "Controle de propriedades de filmes finos de óxido de alumínio através da assistência de feixe iônico." Universidade de São Paulo, 2017. http://www.teses.usp.br/teses/disponiveis/43/43134/tde-03062017-212721/.

Full text
Abstract:
Este trabalho tem por objetivo a caracterização de filmes finos de óxido de alumínio produzidos por deposição assistida por feixe de íons Ar+. Tal caracterização consiste em estabelecer a relação entre os parâmetros de produção (energia do feixe e uxo relativo de Ar), a composição e a estrutura dos lmes. Para tanto, utiliza-se técnicas de microscopia de força atômica, difração de raios-x, reetividade de raios-x e análise por feixe iônico. Resultados mostram que amostras produzidas à temperatura ambiente e à 450 oC são amorfas independentemente da energia do feixe iônico. Filmes formados com as
APA, Harvard, Vancouver, ISO, and other styles
4

Moro, Marcos Vinicius. "Estudos de técnicas de feixes iônicos para a quantificação do elemento químico boro." Universidade de São Paulo, 2013. http://www.teses.usp.br/teses/disponiveis/43/43134/tde-24092014-133916/.

Full text
Abstract:
Neste trabalho, estudamos e aplicamos técnicas analíticas com feixes iônicos para a identificação e quantificação do elemento químico Boro em amostras de Boro depositado sobre Níquel 11B/Ni, sobre Silício B/Si e em amostras de Silício Grau Metalúrgico - SiGM. Estas últimas foram fornecidas pelo grupo de metalurgia do Instituto de Pesquisas Tecnológicas (IPT). Especificamente, as seguintes técnicas analíticas foram utilizadas: Nuclear Reaction Analysis - NRA, Elastic Recoil Detection Analysis - ERDA e Secondary Ion Mass Spectrometry - SIMS. Nas amostras de B/Ni e B/Si, as concentrações foram ob
APA, Harvard, Vancouver, ISO, and other styles
5

Xia, Bingbing. "The growth and application of thin films grown by Atomic Layer Deposition (ALD)." Electronic Thesis or Diss., Sorbonne université, 2022. http://www.theses.fr/2022SORUS576.

Full text
Abstract:
Nous avons étudié les mécanismes de croissance du dépôt atomique couche par couche (ALD) de films minces de ZnO, TiO2, Al2O3 et HfO2, en particulier en utilisant le traçage isotopique stable en conjonction avec les techniques d'analyse par faisceau d'ions isotopiquement sensibles, à savoir, la Spectrométrie de rétrodiffusion de Rutherford (RBS), l’analyse de détection de recul élastique (ERDA) et l’analyse de réaction nucléaire (NRA). En utilisant des précurseurs ALD marqués au deutérium, isotope rare, nous distinguons l'origine des éléments bruts et des impuretés dans chacun des films - de l'
APA, Harvard, Vancouver, ISO, and other styles
6

Boudreault, Ghislain. "Accurate ion beam analysis." Thesis, University of Surrey, 2002. http://epubs.surrey.ac.uk/844001/.

Full text
Abstract:
This thesis primarily deals with accuracy obtainable when using IBA (Ion Beam Analysis) techniques to characterize materials. RBS (Rutherford Backscattering Spectrometry) is the main technique used, together with EBS (Elastic Backscattering Spectrometry), ERDA (Elastic Recoil Detection Analysis) and NRA (Nuclear Reaction Analysis). An exhaustive literature review on these analytical methods is made in connection with accuracy issues such as stopping powers and multiple scattering. The experimental set-ups and procedures are described, with emphasis laid on critical aspects of work where the hi
APA, Harvard, Vancouver, ISO, and other styles
7

Müggenburg, Jan. "Ion beam analysis of metallic vanadium superlattices : Ion beam analysis of metallic vanadium superlattices." Thesis, Uppsala universitet, Tillämpad kärnfysik, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-328067.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Messerly, Michael Joseph. "Ion-beam analysis of optical coatings." Diss., The University of Arizona, 1987. http://hdl.handle.net/10150/184273.

Full text
Abstract:
Rutherford backscattering spectrometry (RBS) is shown to be an elegant, powerful tool for the chemical characterization of optical coatings. RBS studies of several thin film materials are presented to illustrate the technique's unique abilities, and to show how RBS is best exploited in investigations of thin film stoichiometry and diffusion. The text begins with an introduction to optical coatings and the practical problems encountered in their implementation. The basic principles of RBS are discussed, and the technique is compared to other popular surface analysis tools. The introductory mate
APA, Harvard, Vancouver, ISO, and other styles
9

Gauntlett, F. E. "Novel applications of ion beam analysis techniques." Thesis, University of Surrey, 2009. http://epubs.surrey.ac.uk/842938/.

Full text
Abstract:
Ion beam analysis (IBA) has been used as a powerful tool for studying materials for many years. Depending on the specific experimental design, IBA techniques can provide a non-destructive means of analysing samples to obtain such information as the elements or isotopes present and diffusion or depth profiles. Ion beam analysis has the ability to keep up with the rapid progress in new materials both as technology improves and as scientists have the creativity to develop existing and new techniques. Many different types of IBA exist. The experiments reported in this thesis were carried out using
APA, Harvard, Vancouver, ISO, and other styles
10

Shearmur, Thomas E. "Ion beam analysis of diffusion in polymers." Thesis, University of Surrey, 1996. http://epubs.surrey.ac.uk/844449/.

Full text
Abstract:
With the rapid spread in use of polymers the study of diffusion in them is becoming increasingly important. For a number of industrial processes diffusion coefficients and elemental distributions need to be quantified precisely. From a more scientific approach accurate models need to be devised to describe the various diffusion mechanisms involved as well as the concentration and temperature dependencies of the diffusion coefficients. Using ion beam analysis techniques (Rutherford Backscattering and Nuclear Reaction Analysis) three systems were studied. The first was an industrially relevant s
APA, Harvard, Vancouver, ISO, and other styles
More sources

Books on the topic "Ion Beam Analysis (IBA)"

1

Jalabert, Denis, Ian Vickridge, and Amal Chabli. Swift Ion Beam Analysis in Nanosciences. John Wiley & Sons, Inc., 2017. http://dx.doi.org/10.1002/9781119005063.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Götz, Gerhard, Prof. Dr. sc. nat. and Gärtner Konrad, eds. High energy ion beam analysis of solids. Akademie-Verlag, 1988.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
3

Wang, Yongqiang. Handbook of modern ion beam materials analysis. 2nd ed. Materials Research Society, 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
4

Wang, Yongqiang. Handbook of modern ion beam materials analysis. 2nd ed. Materials Research Society, 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
5

Komarov, F. F. Non-destructive ion beam analysis of surfaces. Gordon and Breach Science Publishers, 1990.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
6

R, Tesmer Joseph, and Nastasi Michael Anthony 1950-, eds. Handbook of modern ion beam materials analysis. Materials Research Society, 1995.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
7

Wang, Yongqiang. Handbook of modern ion beam materials analysis: Appendices. 2nd ed. Materials Research Society, 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
8

Wang, Yongqiang. Handbook of modern ion beam materials analysis: Appendices. 2nd ed. Materials Research Society, 2009.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
9

International Conference on Ion Beam Analysis (11th 1993 Balatonfüred, Hungary). Ion beam analysis: Proceedings of the eleventh International Conference on Ion Beam Analysis, Balatonfüred, Hungary, July 5-9, 1993. Edited by Gyulai J. North-Holland, 1994.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
10

International, Conference on Ion Beam Analysis (10th 1991 Eindhoven The Netherlands). Ion beam analysis: Proceedings of the Tenth International Conference on Ion Beam Analysis, Eindhoven, The Netherlands, 1-5 July, 1991. North-Holland, 1992.

Find full text
APA, Harvard, Vancouver, ISO, and other styles
More sources

Book chapters on the topic "Ion Beam Analysis (IBA)"

1

Avasthi, D. K., and G. K. Mehta. "Ion Beam Analysis." In Swift Heavy Ions for Materials Engineering and Nanostructuring. Springer Netherlands, 2011. http://dx.doi.org/10.1007/978-94-007-1229-4_3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Schmidt, Bernd, and Klaus Wetzig. "Ion Beam Technology." In Ion Beams in Materials Processing and Analysis. Springer Vienna, 2012. http://dx.doi.org/10.1007/978-3-211-99356-9_3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Šmit, Ž. "Ion-Beam Analysis Methods." In Modern Methods for Analysing Archaeological and Historical Glass. John Wiley & Sons Ltd, 2013. http://dx.doi.org/10.1002/9781118314234.ch7.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Dresselhaus, M. S., and R. Kalish. "Ion Beam Analysis Techniques." In Ion Implantation in Diamond, Graphite and Related Materials. Springer Berlin Heidelberg, 1992. http://dx.doi.org/10.1007/978-3-642-77171-2_4.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Yamamoto, Shunya. "Ion Beam Analysis of Materials." In An Advanced Course in Nuclear Engineering. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-7350-2_12.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Rupertus, Volker. "Ion Beam Spectrochemical Analysis (IBSCA)." In Surface and Thin Film Analysis. Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.ch22.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Valković, Vlado. "Ion Beam Analysis: Analytical Applications." In Low Energy Particle Accelerator-Based Technologies and Their Applications. CRC Press, 2022. http://dx.doi.org/10.1201/9781003033684-3.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Schmidt, Bernd, and Klaus Wetzig. "Ion Beam Preparation of Materials." In Ion Beams in Materials Processing and Analysis. Springer Vienna, 2012. http://dx.doi.org/10.1007/978-3-211-99356-9_5.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Petzold, G., P. Siebert, and J. Müller. "A Micromachined Electron Beam Ion Source." In Micro Total Analysis Systems 2000. Springer Netherlands, 2000. http://dx.doi.org/10.1007/978-94-017-2264-3_40.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Sakamoto, Tetsuo. "Focused Ion Beam Scanning Electron Microscope." In Compendium of Surface and Interface Analysis. Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_31.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Conference papers on the topic "Ion Beam Analysis (IBA)"

1

Chong, Xue Yao, and Dionaldo Zudhistira. "Techniques and Applications of Plasma Focused Ion Beam in Silicon Die Delayering." In 2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2024. http://dx.doi.org/10.1109/ipfa61654.2024.10690951.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Kennedy, C. E., and R. L. Swisher. "Cost Analysis of Solar Reflective Hard-Coat Materials Deposited by Ion-Beam-Assisted Deposition." In ASME 2004 International Solar Energy Conference. ASMEDC, 2004. http://dx.doi.org/10.1115/isec2004-65112.

Full text
Abstract:
Commercialization of concentrating solar power (CSP) technologies require the development of advanced reflector materials that are low cost and maintain high specular reflectance for extended lifetimes under severe outdoor environments. During the past 9 years, the National Renewable Energy Laboratory (NREL) has funded Science Applications International Corporation (SAIC) in McLean, Virginia, to develop a promising low-cost advanced solar reflective material (ASRM) combining the best of both thin-glass and silvered-polymer reflectors. The alumina (Al2O3) coating is deposited by ion-beam-assist
APA, Harvard, Vancouver, ISO, and other styles
3

Walter, J., R. Fischer, and C. Birzer. "Analysis Methods for Characterizing Drop Test Robustness of Lead-Free FBGAs." In ISTFA 2005. ASM International, 2005. http://dx.doi.org/10.31399/asm.cp.istfa2005p0145.

Full text
Abstract:
Abstract During the last few years the drop test has become more and more important for electronic handheld components. Drop test reliability for lead-free solder interconnects is an extreme challenge today. Thus, the need for improved micro structural diagnostics of new material combinations and crack detection methods has increased. The target of this paper is to summarize detection and analysis methods for solder joint cracks, material characterization [1] and preparation methods of assembled printed circuit boards (PCB) after a drop test to completely understand lead-free solder interconne
APA, Harvard, Vancouver, ISO, and other styles
4

Herschbein, Steven B., Carmelo F. Scrudato, George K. Worth, and Edward S. Hermann. "The Challenges of Backside Focused Ion Beam (FIB) Editing in the Presence of Deep Trench Decoupling Capacitors." In ISTFA 2011. ASM International, 2011. http://dx.doi.org/10.31399/asm.cp.istfa2011p0031.

Full text
Abstract:
Abstract For most advanced semiconductor products, Focused Ion Beam (FIB) circuit modification and node access through the backside of the chip is the only viable approach. The high density of interconnect wiring and the presence of C4 solder bumping for chip to module attachment has made complex edits virtually impossible with long standing conventional frontside techniques. Unfortunately, the presence of buried circuit elements on the very latest designs greatly complicates the backside editing formula. The introduction of deep trench capacitors as a distributed circuit element in logic desi
APA, Harvard, Vancouver, ISO, and other styles
5

Blalock, Travis, Xiao Bai, and Afsaneh Rabiei. "Effect of Substrate Temperature on Properties of Nano-Scale Functionally Graded Calcium Phosphate Coatings." In ASME 2006 International Manufacturing Science and Engineering Conference. ASMEDC, 2006. http://dx.doi.org/10.1115/msec2006-21047.

Full text
Abstract:
The effect of substrate temperature and processing parameters on microstructure and crystallinity of calcium phosphate coatings deposited on heated substrates in an Ion Beam Assisted Deposition (IBAD) system are being studied. The experimental procedures include mechanical testing and film thickness measurements using bonding strength and profilometery. Cross-sectional scanning transmission electron microscopy (STEM) with energy dispersive X-ray spectroscopy (EDX) through the thickness of the film as well as scanning electron microscopy (SEM) with EDX at the top surface of the film was perform
APA, Harvard, Vancouver, ISO, and other styles
6

Sˇkoric´, B., D. Kakasˇ, and M. Rakita. "Some Tribological Aspects of the Duplex Coatings With Additional Ion Bombardment." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-64218.

Full text
Abstract:
A duplex surface treatment involves the sequential application of two surface technologies to produce a surface composition with combined properties. A typical duplex process involves plasma nitriding and the coating treatment of steels. In the paper are presented characteristics of hard coatings, type TiN, produced by classic technology PVD (physical vapour deposition) and IBAD (ion beam assisted deposition). The synthesis of the TiN film by IBAD has been performed by irradiation of Ar ions. The evolution of the microstructure from porous and columnar grains to densel packed grains is accompa
APA, Harvard, Vancouver, ISO, and other styles
7

Mefo, J., K. J. Kirkby, B. J. Sealy, G. Boudreault, C. Jeynes, and E. J. H. Collart. "Elemental analysis of residual deposits in an ion implanter using IBA techniques." In Proceedings of the 2002 14th International Conference on Ion Implantation Technology. IEEE, 2002. http://dx.doi.org/10.1109/iit.2002.1258042.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

Toussaint, U. v. "Bayesian analysis of ion beam diagnostics." In The twentieth international workshop on bayesian inference and maximum entropy methods in science and engineering. AIP, 2001. http://dx.doi.org/10.1063/1.1381922.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Schaaf, Peter, Christof Illgner, Felix Landry, and Klaus-Peter Lieb. "Laser nitriding and ion beam analysis." In The fifteenth international conference on the application of accelerators in research and industry. AIP, 1999. http://dx.doi.org/10.1063/1.59282.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Klatt, Ch, B. Hartmann, and S. Kalbitzer. "Accelerator limitations to ion beam analysis." In The fourteenth international conference on the application of accelerators in research and industry. AIP, 1997. http://dx.doi.org/10.1063/1.52540.

Full text
APA, Harvard, Vancouver, ISO, and other styles

Reports on the topic "Ion Beam Analysis (IBA)"

1

Revesz, Peter, and Michael O. Thompson. Next Generation Ion Beam Analysis. Defense Technical Information Center, 1996. http://dx.doi.org/10.21236/ada316736.

Full text
APA, Harvard, Vancouver, ISO, and other styles
2

Kramer, Edward J. Ion Beam Analysis of Diffusion in Polymer Glasses. Defense Technical Information Center, 1989. http://dx.doi.org/10.21236/ada212339.

Full text
APA, Harvard, Vancouver, ISO, and other styles
3

Berning, Paul R., and Andrus Niiler. Particle Surface Layer Characterization Using Ion Beam Analysis. Defense Technical Information Center, 1996. http://dx.doi.org/10.21236/ada313848.

Full text
APA, Harvard, Vancouver, ISO, and other styles
4

Tegtmeier, Eric, Mary Hill, Daniel Rios, and Juan Duque. Focused Ion Beam analysis of non radioactive samples. Office of Scientific and Technical Information (OSTI), 2021. http://dx.doi.org/10.2172/1766960.

Full text
APA, Harvard, Vancouver, ISO, and other styles
5

Kulp, William D., and III. Development of Ion Beam Analysis Techniques for Archeological Research. Defense Technical Information Center, 1991. http://dx.doi.org/10.21236/ada245647.

Full text
APA, Harvard, Vancouver, ISO, and other styles
6

Dimitriou, P., ed. Developments in the Ion Beam Analysis Nuclear Data Library (IBANDL). IAEA-Nuclear Data Section, 2014. https://doi.org/10.61092/iaea.ps7j-8bxf.

Full text
APA, Harvard, Vancouver, ISO, and other styles
7

Nastasi, M. Ion beam analysis and modification of thin-film, high-temperature superconductors. Office of Scientific and Technical Information (OSTI), 1989. http://dx.doi.org/10.2172/5658129.

Full text
APA, Harvard, Vancouver, ISO, and other styles
8

D.G. Whyte. Dynamics of Plasma-Surface Interactions using In-situ Ion Beam Analysis. Office of Scientific and Technical Information (OSTI), 2009. http://dx.doi.org/10.2172/959136.

Full text
APA, Harvard, Vancouver, ISO, and other styles
9

Rosenberg, Beth Ellen. Analysis of Heavy-Ion Beam Images and Comparison to RetardingPotential Analyzer Measurements. Office of Scientific and Technical Information (OSTI), 2005. http://dx.doi.org/10.2172/878114.

Full text
APA, Harvard, Vancouver, ISO, and other styles
10

Chiari, M., and P. Dimitirou. Benchmarking Experiments for Ion Beam Analysis (Summary Report of the Technical Meeting). IAEA Nuclear Data Section, 2016. http://dx.doi.org/10.61092/iaea.xfh9-5z24.

Full text
APA, Harvard, Vancouver, ISO, and other styles
You might also be interested in the extended bibliographies on the topic 'Ion Beam Analysis (IBA)' for particular source types:
Journal articles Dissertations / Theses Books
We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!

To the bibliography