Log in

Relevant bibliographies by topics / Ion Beam Analysis / Journal articles

To see the other types of publications on this topic, follow the link: Ion Beam Analysis.

Journal articles on the topic 'Ion Beam Analysis'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 July 2025

Create a spot-on reference in APA, MLA, Chicago, Harvard, and other styles

Select a source type:

Consult the top 50 journal articles for your research on the topic 'Ion Beam Analysis.'

Next to every source in the list of references, there is an 'Add to bibliography' button. Press on it, and we will generate automatically the bibliographic reference to the chosen work in the citation style you need: APA, MLA, Harvard, Chicago, Vancouver, etc.

You can also download the full text of the academic publication as pdf and read online its abstract whenever available in the metadata.

Browse journal articles on a wide variety of disciplines and organise your bibliography correctly.

1

Pathak, Anand P., Devesh K. Avasthi, and Bhupendra N. Dev. "Ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266, no. 8 (2008): iii. http://dx.doi.org/10.1016/j.nimb.2008.03.093.

Full text

APA, Harvard, Vancouver, ISO, and other styles

2

FUJIMOTO, Fuminori. "Ion beam analysis." Bunseki kagaku 40, no. 11 (1991): 577–97. http://dx.doi.org/10.2116/bunsekikagaku.40.11_577.

Full text

APA, Harvard, Vancouver, ISO, and other styles

3

Kramer, Edward J. "Ion-Beam Analysis of Polymer Surfaces and Interfaces." MRS Bulletin 21, no. 1 (1996): 37–42. http://dx.doi.org/10.1557/s0883769400035144.

Full text

Abstract:

Ion-beam analysis of chemical composition as a function of depth is by now well-established for inorganic materials and is an important method of investigating growth of thin films. It has been applied to polymers much more recently, perhaps because fairly obvious problems with radiation damage discouraged workers in this field initially. Ion-beam analysis has developed, however, into a analytical tool that complements other methods, such as x-ray photoelectron spectroscopy and neutron reflection, very well. The purpose of this short article is to give the reader an introduction to its current

APA, Harvard, Vancouver, ISO, and other styles

4

Al-Bayati, A. H., K. G. Orrman-Rossiter, D. G. Armour, J. A. Van den Berg, and S. E. Donnelly. "Ion beam deposition and in-situ ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 63, no. 1-2 (1992): 109–19. http://dx.doi.org/10.1016/0168-583x(92)95179-u.

Full text

APA, Harvard, Vancouver, ISO, and other styles

5

Bahng, Jungbae, Yuncheol Kim, Young-woo Lee, et al. "Multi-filament ion source for uniform ion beam generation." Journal of Physics: Conference Series 2743, no. 1 (2024): 012054. http://dx.doi.org/10.1088/1742-6596/2743/1/012054.

Full text

Abstract:

Abstract Ion beams are employed in various fields such as semiconductor manufacturing, surface modification and material science. The uniformity of ion beams is crucial in many applications, but conventional ion sources that use a single filament often limit the uniformity and intensity of the ion beam. This paper presents a study that aims to optimize a multi-filament ion source to enhance the uniformity of ion beams. The study includes a detailed explanation of the ion source components and design, methods for measuring ion beam uniformity with its experimental design, followed by results, a

APA, Harvard, Vancouver, ISO, and other styles

6

Ishii, Yasuyuki, and Takeru Ohkubo. "Analysis of Ion-Species of a Dedicated Duoplasmatron-type Ion Source for a 100 keV-Rage Compact Ion-Microbeam System." Journal of Physics: Conference Series 2326, no. 1 (2022): 012013. http://dx.doi.org/10.1088/1742-6596/2326/1/012013.

Full text

Abstract:

Abstract Hydrogen-ion beam species generated by a dedicated duoplasmatron-type ion source that was developed for a MeV compact ion-microbeam system was experimentally analyzed in a test bench to study the ion source feature. Bimolecular and trimolecular hydrogen-ion beams were mainly generated by the duoplasmatron-type ion source. The ratio of the two different molecular hydrogen-ion beams was controlled by turning hydrogen-gas pressure. This experiment showed that the duoplasmatron-type ion source could produce a single molecular hydrogen-ion beam for ion-microbeam applications.

APA, Harvard, Vancouver, ISO, and other styles

7

Mingay, D. W., V. M. Prozesky, and P. B. Kotzé. "Prompt ion beam analysis by pulsed beams." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 35, no. 3-4 (1988): 339–43. http://dx.doi.org/10.1016/0168-583x(88)90293-5.

Full text

APA, Harvard, Vancouver, ISO, and other styles

8

Cookson, J. A., and T. W. Conlon. "MeV ion-beam analysis." Journal of Research of the National Bureau of Standards 93, no. 3 (1988): 473. http://dx.doi.org/10.6028/jres.093.123.

Full text

APA, Harvard, Vancouver, ISO, and other styles

9

Matuo, Youichirou, Yoshinobu Izumi, Ayako N. Sakamoto, Yoshihiro Hase, Katsuya Satoh, and Kikuo Shimizu. "Molecular Analysis of Carbon Ion-Induced Mutations in DNA Repair-Deficient Strains of Saccharomyces cerevisiae." Quantum Beam Science 3, no. 3 (2019): 14. http://dx.doi.org/10.3390/qubs3030014.

Full text

Abstract:

Mutations caused by ion beams have been well-studied in plants, including ornamental flowers, rice, and algae. It has been shown that ion beams have several significantly interesting features, such as a high biological effect and unique mutation spectrum, which is in contrast to low linear energy transfer (LET) radiation such as gamma rays. In this study, the effects of double strand breaks and 8-oxo-2′-deoxyguanosine (8-oxodG) caused by ion-beam irradiation were examined. We irradiated repair-gene-inactive strains rad52, ogg1, and msh2 using carbon ion beams, analyzed the lethality and mutage

APA, Harvard, Vancouver, ISO, and other styles

10

Zhou, Lin, Yi Fan Dai, Xu Hui Xie, Chang Jun Jiao, and Sheng Yi Li. "Analysis of Correcting Ability of Ion Beam Figuring." Key Engineering Materials 364-366 (December 2007): 470–75. http://dx.doi.org/10.4028/www.scientific.net/kem.364-366.470.

Full text

Abstract:

In ion beam figuring process, typically, the smaller ion beam diameter has a good ability to “correct” the optical surface error, i.e. the smaller ion beam diameter indicates the higher material removal efficiency ε. The material removal efficiency is defined as the ratio of the volume of desired material removal to that of the real material removal. However the smaller ion beam diameter always results in more processing time, which usually decreases the process reliability. In this paper, the relationship between the material removal efficiency and the ion beam diameter is analyzed. The theor

APA, Harvard, Vancouver, ISO, and other styles

11

Martinsson, Bengt G., and Hans-Christen Hansson. "Ion beam thermography — analysis of chemical compounds using ion beam techniques." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 34, no. 2 (1988): 203–8. http://dx.doi.org/10.1016/0168-583x(88)90744-6.

Full text

APA, Harvard, Vancouver, ISO, and other styles

12

Madala, Surendra. "Plasma FIB Provides Vital Delayering and Site-Specific Failure Analysis Capabilities for Larger-Scale Structures." EDFA Technical Articles 18, no. 1 (2016): 30–35. http://dx.doi.org/10.31399/asm.edfa.2016-1.p030.

Full text

Abstract:

Abstract Plasma focused ion beam (PFIB) systems can generate ion beams with much higher current and are therefore able to remove larger volumes of material at much faster rates while still maintaining precise control of the beam and its milling action. This article explains how the improved performance of PFIB is leading to new applications in delayering, deprocessing, and site-specific failure analysis.

APA, Harvard, Vancouver, ISO, and other styles

13

Ujihira, Y. "Chemical analysis by ion beam." International Journal of Radiation Applications and Instrumentation. Part A. Applied Radiation and Isotopes 37, no. 1 (1986): 83–84. http://dx.doi.org/10.1016/0883-2889(86)90220-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

14

Sasaki, Yuichi, Kenichiro Yoshida, Fumitaka Nishiyama, et al. "Ion Beam Analysis of ZnSe." Japanese Journal of Applied Physics 31, Part 2, No. 4B (1992): L449—L451. http://dx.doi.org/10.1143/jjap.31.l449.

Full text

APA, Harvard, Vancouver, ISO, and other styles

15

Szökefalvi-Nagy, Z. "Ion beam analysis of metalloproteins." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 109-110 (April 1996): 234–38. http://dx.doi.org/10.1016/0168-583x(95)00913-2.

Full text

APA, Harvard, Vancouver, ISO, and other styles

16

Bethge, K. "Ion beam analysis of nitrogen." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 66, no. 1-2 (1992): 146–57. http://dx.doi.org/10.1016/0168-583x(92)96148-r.

Full text

APA, Harvard, Vancouver, ISO, and other styles

17

METSON, J. B., and M. J. GUSTAFSSON. "COMPLEMENTARY TECHNIQUES TO HIGH ENERGY ION BEAM ANALYSIS." Modern Physics Letters B 15, no. 28n29 (2001): 1402–10. http://dx.doi.org/10.1142/s0217984901003329.

Full text

Abstract:

Ion beam analysis methods generally rely on either the scattering of a high energy primary particle, or secondary process arising from the stopping of this particle in the substrate. The information typically obtained is the identification and quantitation of elements present, often resolved in terms of their depth distribution. However, there are a variety of techniques which offer complementary information on the structure composition and chemistry of a surface. These are typified by rather softer interactions with the surface, typified by low energy (kV) ion beams or photons, which interact

APA, Harvard, Vancouver, ISO, and other styles

18

Jia-Richards, Oliver. "Quantification of ionic-liquid ion source beam composition from time-of-flight data." Journal of Applied Physics 132, no. 7 (2022): 074501. http://dx.doi.org/10.1063/5.0094699.

Full text

Abstract:

Ionic-liquid ion sources produce beams of charged particles through evaporation and acceleration of ions and charged droplets from the surface of an ionic liquid. The composition of the emitted beam can impact the performance of ion sources for various applications such as focused beams for microfabrication and space propulsion. Numerical inference is considered for quantification of the beam composition of an ionic-liquid ion source through determining the current fraction of different species along with providing uncertainty in inferred values. An analysis of previously presented data demons

APA, Harvard, Vancouver, ISO, and other styles

19

KATAYAMA, Mitsuhiro, and Masakazu AONO. "Fundamentals and Present Aspects of Ion Beam Technology IV. Ion Beam Analysis." RADIOISOTOPES 44, no. 6 (1995): 412–28. http://dx.doi.org/10.3769/radioisotopes.44.6_412.

Full text

APA, Harvard, Vancouver, ISO, and other styles

20

Orbons, S. M., L. van Dijk, M. Bozkurt, P. N. Johnston, P. Reichart, and D. N. Jamieson. "Focused ion beam machined nanostructures depth profiled by macrochannelling ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 249, no. 1-2 (2006): 747–51. http://dx.doi.org/10.1016/j.nimb.2006.03.179.

Full text

APA, Harvard, Vancouver, ISO, and other styles

21

Schlemm, H. "Ion beam impurity analysis of radio-frequency mass filtered broad ion beams." Review of Scientific Instruments 69, no. 2 (1998): 1191–93. http://dx.doi.org/10.1063/1.1148662.

Full text

APA, Harvard, Vancouver, ISO, and other styles

22

Appleton, B. R., R. A. Zuhr, T. S. Noggle, N. Herbots, S. J. Pennycook, and G. D. Alton. "Ion Beam Deposition." MRS Bulletin 12, no. 2 (1987): 52–59. http://dx.doi.org/10.1557/s0883769400068408.

Full text

Abstract:

Ion beam processing of materials has a tradition at Oak Ridge National Laboratory that is as old as the laboratory itself. Consequently, when we began looking for a competitive way to participate in the excitement and new physics beginning to emerge from the fabrication and study of artificially structured materials, it was natural to look for a growth technique that incorporated ion beam processing. Our division, the Solid State Division, has a variety of ion implantation and ion beam analysis accelerators which are integrated with pulsed-laser sources into ultrahigh vacuum (UHV) surface anal

APA, Harvard, Vancouver, ISO, and other styles

23

Tan, Qiuyun, Kun Zhu, Pingping Gan, et al. "Beam commissioning and analysis of a continuous-wave window-type deuteron radio-frequency quadrupole." International Journal of Modern Physics E 29, no. 02 (2020): 1950111. http://dx.doi.org/10.1142/s0218301319501118.

Full text

Abstract:

As high-intensity beams are required for various applications, high-power, high-current, continuous-wave (CW) radio-frequency quadrupole (RFQ) accelerators have become a research focus in recent years and also a direction for development in the future. To master and accumulate the advanced technology in design, fabrication and operation of high-current CW RFQs, the RFQ group at Peking University has built a window-type CW RFQ, operating at 162.5[Formula: see text]MHz, to accelerate a 50-mA deuteron beam from 50[Formula: see text]keV to 1[Formula: see text]MeV. It is the first relatively high-f

APA, Harvard, Vancouver, ISO, and other styles

24

Ma, Xiaoyun, Mengling Zhang, Wanbin Meng, Xiaoli Lu, Ziheng Wang, and Yanshan Zhang. "Analysis of the Dose Drop at the Edge of the Target Area in Heavy Ion Radiotherapy." Computational and Mathematical Methods in Medicine 2021 (November 11, 2021): 1–6. http://dx.doi.org/10.1155/2021/4440877.

Full text

Abstract:

Background. The dose distribution of heavy ions at the edge of the target region will have a steep decay during radiotherapy, which can better protect the surrounding organs at risk. Objective. To analyze the dose decay gradient at the back edge of the target region during heavy ion radiotherapy. Methods. Treatment planning system (TPS) was employed to analyze the dose decay at the edge of the beam under different incident modes and multiple dose segmentation conditions during fixed beam irradiation. The dose decay data of each plan was collected based on the position where the rear edge of th

APA, Harvard, Vancouver, ISO, and other styles

25

Balaji, S., S. Amirthapandian, B. K. Panigrahi, et al. "Study of ion beam mixing in Pt/Co bilayer by ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266, no. 8 (2008): 1692–96. http://dx.doi.org/10.1016/j.nimb.2008.01.055.

Full text

APA, Harvard, Vancouver, ISO, and other styles

26

Ishii, K., and S. Morita. "Depth profiling by ion-beam analysis." Acta Physica Hungarica 65, no. 2-3 (1989): 151–57. http://dx.doi.org/10.1007/bf03156058.

Full text

APA, Harvard, Vancouver, ISO, and other styles

27

Knapp, J. A., J. C. Barbour, and B. L. Doyle. "Ion beam analysis for depth profiling." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 10, no. 4 (1992): 2685–90. http://dx.doi.org/10.1116/1.577959.

Full text

APA, Harvard, Vancouver, ISO, and other styles

28

Biron, Isabelle, and S. bastien Beauchoux. "Ion beam analysis of Mosan enamels." Measurement Science and Technology 14, no. 9 (2003): 1564–78. http://dx.doi.org/10.1088/0957-0233/14/9/308.

Full text

APA, Harvard, Vancouver, ISO, and other styles

29

Moncoffre, N., G. Barbier, E. Leblond, Ph Martin, and H. Jaffrezic. "Diffusion studies using ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 140, no. 3-4 (1998): 402–8. http://dx.doi.org/10.1016/s0168-583x(98)00116-5.

Full text

APA, Harvard, Vancouver, ISO, and other styles

30

Szilágyi, E. "Energy spread in ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163 (March 2000): 37–47. http://dx.doi.org/10.1016/s0168-583x(99)00671-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

31

Sjöland, K. A., F. Munnik, and U. Wätjen. "Uncertainty budget for Ion Beam Analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163 (March 2000): 275–80. http://dx.doi.org/10.1016/s0168-583x(99)00911-8.

Full text

APA, Harvard, Vancouver, ISO, and other styles

32

Szilágyi, E., E. Kótai, and D. G. Merkel. "Ion-beam analysis of insulator samples." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 450 (July 2019): 184–88. http://dx.doi.org/10.1016/j.nimb.2018.08.026.

Full text

APA, Harvard, Vancouver, ISO, and other styles

33

Nordlund, K. "Molecular dynamics for ion beam analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 266, no. 8 (2008): 1886–91. http://dx.doi.org/10.1016/j.nimb.2007.11.056.

Full text

APA, Harvard, Vancouver, ISO, and other styles

34

Raepsaet, C., H. Khodja, P. Bossis, Y. Pipon, and D. Roudil. "Ion beam analysis of radioactive samples." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 267, no. 12-13 (2009): 2245–49. http://dx.doi.org/10.1016/j.nimb.2009.03.022.

Full text

APA, Harvard, Vancouver, ISO, and other styles

35

Sofield, CJ, and JA Cookson. "Ion beam analysis of thin films." Vacuum 35, no. 10-11 (1985): 513. http://dx.doi.org/10.1016/0042-207x(85)90386-0.

Full text

APA, Harvard, Vancouver, ISO, and other styles

36

Boerma, D. O. "Materials analysis using ion beam techniques." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 50, no. 1-4 (1990): 77–90. http://dx.doi.org/10.1016/0168-583x(90)90335-r.

Full text

APA, Harvard, Vancouver, ISO, and other styles

37

David, Daniel. "New trends in ion-beam analysis." Surface Science Reports 16, no. 7 (1992): 333–75. http://dx.doi.org/10.1016/0167-5729(92)90001-r.

Full text

APA, Harvard, Vancouver, ISO, and other styles

38

Leavitt, J. A., L. C. McIntyre, M. D. Ashbaugh, R. P. Cox, Z. Lin, and R. B. Gregory. "Ion-beam analysis of silicon carbide." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 118, no. 1-4 (1996): 613–16. http://dx.doi.org/10.1016/0168-583x(95)01462-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

39

Vickridge, I. C., I. W. M. Brown, T. C. Ekström, and W. J. Trompetter. "Ion beam analysis of sialon ceramics." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 118, no. 1-4 (1996): 608–12. http://dx.doi.org/10.1016/0168-583x(96)00244-3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

40

Malmqvist, Klas G. "Ion beam analysis for the environment." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 85, no. 1-4 (1994): 84–94. http://dx.doi.org/10.1016/0168-583x(94)95791-6.

Full text

APA, Harvard, Vancouver, ISO, and other styles

41

Demortier, Guy. "Ion beam analysis of gold jewelry." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 64, no. 1-4 (1992): 481–87. http://dx.doi.org/10.1016/0168-583x(92)95520-2.

Full text

APA, Harvard, Vancouver, ISO, and other styles

42

Kuiper, A. E. T., and F. H. P. M. Habraken. "Ion beam analysis of interface reactions." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 64, no. 1-4 (1992): 739–43. http://dx.doi.org/10.1016/0168-583x(92)95569-d.

Full text

APA, Harvard, Vancouver, ISO, and other styles

43

Rizzutto, M. A., N. Added, M. H. Tabacniks, et al. "Teeth characterization using ion beam analysis." Journal of Radioanalytical and Nuclear Chemistry 269, no. 3 (2006): 683–87. http://dx.doi.org/10.1007/s10967-006-0286-3.

Full text

APA, Harvard, Vancouver, ISO, and other styles

44

Patel, S., P. Varma, M. S. Tiwari, and N. Shukla. "Effect of ion beam on electromagnetic ion cyclotron instability in hot anisotropic plasma-particle aspect analysis." Annales Geophysicae 29, no. 8 (2011): 1469–78. http://dx.doi.org/10.5194/angeo-29-1469-2011.

Full text

Abstract:

Abstract. Using the general loss-cone distribution function electromagnetic ion cyclotron (EMIC) instability affected by up going ion beam has been studied by investigating the trajectories of charged particles. The plasma consisting of resonant and non-resonant particles has been considered. It is assumed that the resonant particles participate in energy exchange with the wave, whereas non-resonant particles support the oscillatory motion of the wave. The effect of ion beam velocity on the dispersion relation, growth rate, parallel and perpendicular resonant energy of the EMIC wave with gener

APA, Harvard, Vancouver, ISO, and other styles

45

Deka, Manoj K., Balaram Pradhan, Apul N. Dev, Deepsikha Mahanta, Jalil Manafian, and Khaled H. Mahmoud. "Shock Waves in Ion-Beam-Depleted Spin-Polarized Quantum Plasma with Ionic Pressure Anisotropy." Plasma 8, no. 1 (2025): 3. https://doi.org/10.3390/plasma8010003.

Full text

Abstract:

In this study, the effects of pressure anisotropy and viscosity on the propagation of shock waves in spin-polarized degenerate quantum magnetoplasma are studied under the influence of the streaming energy of ion beams. The effects of different suitable plasma parameters on the shock wave’s potential profile are studied using the steady state solution of the Zakharov–Kuznetsov–Burgers (Z–K–B) equation, as well as the numerical simulation of the governing non-linear Z–K–B equation. First-order analysis of the non-linear wave propagation depicted a new beam-induced stable mode whose Mach number m

APA, Harvard, Vancouver, ISO, and other styles

46

Brogden, Valerie, Cameron Johnson, Chad Rue, et al. "Material Sputtering with a Multi-Ion Species Plasma Focused Ion Beam." Advances in Materials Science and Engineering 2021 (January 13, 2021): 1–9. http://dx.doi.org/10.1155/2021/8842777.

Full text

Abstract:

Focused ion beams are an essential tool for cross-sectional material analysis at the microscale, preparing TEM samples, and much more. New plasma ion sources allow for higher beam currents and options to use unconventional ion species, resulting in increased versatility over a broader range of substrate materials. In this paper, we present the results of a four-material study from five different ion species at varying beam energies. This, of course, is a small sampling of the enormous variety of potential specimen and ion species combinations. We show that milling rates and texturing artifacts

APA, Harvard, Vancouver, ISO, and other styles

47

Wang, Y. Q. "Ion beam analysis of ion-implanted polymer thin films." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 161-163 (March 2000): 1027–32. http://dx.doi.org/10.1016/s0168-583x(99)00989-1.

Full text

APA, Harvard, Vancouver, ISO, and other styles

48

Kennedy, V. J., A. Markwitz, U. D. Lanke, A. McIvor, H. J. Trodahl, and A. Bittar. "Ion beam analysis of ion-assisted deposited amorphous GaN." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 190, no. 1-4 (2002): 620–24. http://dx.doi.org/10.1016/s0168-583x(01)01279-4.

Full text

APA, Harvard, Vancouver, ISO, and other styles

49

George, A., T. Kalvas, S. Melanson, M. Dehnel, and N. G. R. Broderick. "H^- beam emittance analysis in a multicusp ion source." Journal of Physics: Conference Series 2244, no. 1 (2022): 012038. http://dx.doi.org/10.1088/1742-6596/2244/1/012038.

Full text

Abstract:

Abstract Emittance of the ion beam extracted from an ion source is dependent on the initial focusing action at the plasma sheath. The properties of the plasma sheath is further dependent on the local electric fields and charge densities around the sheath. Experiments are conducted for creating different sets of conditions around the plasma sheath in an H- multicusp filament ion source and the resulting emittance of the extracted H- ion beam is measured. Variation of beam emittance under different plasma densities, electrode voltages and gas flows are analysed.

APA, Harvard, Vancouver, ISO, and other styles

50

Mammadov, F. E., S. A. Aliev, I. I. Gurbanov, et al. "The Analysis of the Ion Beam Composition of InSb and (InSb)0.98Bi0.02 Obtained by Liquid Metal Ion Source." East European Journal of Physics, no. 1 (March 3, 2025): 272–75. https://doi.org/10.26565/2312-4334-2025-1-31.

Full text

Abstract:

To investigate the mass composition of the ion beam obtained through field ion emission, a mass analyzer designed analogous to the Wien velocity filter was utilized. This Wien filter analyzer operates based on the principle of intersecting mutually perpendicular electric and magnetic fields (E×B) to classify charged particles according to their mass and charge. The ion beam was obtained using mInSb and InSb0.98Bi0.02 as the working The mass composition of the ion group was analyzed using this method. In the experiments, it was found that the ion beam obtained using InSb as the working substanc

APA, Harvard, Vancouver, ISO, and other styles

We offer discounts on all premium plans for authors whose works are included in thematic literature selections. Contact us to get a unique promo code!