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1

Wilson, R. G. Secondary ion mass spectrometry. Wiley, 1989.

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2

van der Heide, Paul. Secondary Ion Mass Spectrometry. John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118916780.

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3

Paglia, Giuseppe, and Giuseppe Astarita, eds. Ion Mobility-Mass Spectrometry. Springer US, 2020. http://dx.doi.org/10.1007/978-1-0716-0030-6.

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4

Mahoney, Christine M., ed. Cluster Secondary Ion Mass Spectrometry. John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.

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5

March, Raymond E., and John F. J. Todd. Quadrupole Ion Trap Mass Spectrometry. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471717983.

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6

J, Todd John F., ed. Quadrupole ion trap mass spectrometry. 2nd ed. J. Wiley, 2005.

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7

O'Neill, Karen Elizabeth. Studies in ion trap mass spectrometry. University of East Anglia, 1992.

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8

Benninghoven, Alfred, Richard J. Colton, David S. Simons, and Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.

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9

Fujii, Toshihiro, ed. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer US, 2015. http://dx.doi.org/10.1007/978-1-4899-7588-1.

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10

A, Brown, and Vickerman J. C, eds. Handbook of static secondary ion mass spectrometry. J. Wiley, 1989.

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11

Hearn, Martin John. Polymer surface studies by secondary ion mass spectrometry. Leicester Polytechnic, 1988.

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12

Saunders, William Hundley, and James M. Farrar. Techniques for the study of ion-molecule reactions. Wiley, 1988.

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13

Identification of essential oils by ion trap mass spectroscopy. Academic Press, 1989.

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14

International Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama). Secondary ion mass spectrometry: SIMS IX : proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)...,7-12 November 1993. Edited by Benninghoven A. 1932-. Wiley, 1994.

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15

International Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Edited by Gillen G. Wiley, 1998.

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16

G, Rüdenauer F., and Werner H. W, eds. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications, and trends. J. Wiley, 1987.

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17

International Conference on Secondary Ion Mass Spectrometry (8th 1991 Amsterdam,Netherlands). Secondary ion mass spectrometry: SIMS VIII : proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, Amsterdam, the Netherlands, September 15-20 1991. Edited by Benninghoven A. 1932-. Wiley, 1992.

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18

International Conferenceon Secondary Ion Mass Spectrometry (7th 1989 California, USA). Secondary ion mass spectrometry SIMS VII: Proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989. Edited by Benninghoven A. 1932-. Wiley, 1990.

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19

Mai, H. Investigation of the sampling volume in secondary ion microanalysis. Akademie der Wissenschaften der DDR, Zentralinstitut für Festkörperphysik und Werkstofforschung, 1986.

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20

G, Wilson Robert. Secondary ion mass spectrometry: A practical handbook for depth profiling and bulk impurity analysis. Wiley, 1989.

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21

Fayek, Mostafa. Secondary ion mass spectrometry in the earth sciences: Gleaning the big picture from a small spot. Mineralogical Association of Canada, 2009.

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22

A, Hedin, Sundqvist B. U. R, and Benninghoven A. 1932-, eds. Ion Formation from Organic Solids (IFOS V). Wiley, 1990.

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23

International, Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles France). Secondary ion mass spectrometry: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Wiley, 1988.

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24

Thielking, Gerhard. Ion/Neutral-Komplexe als Zwischenstufen massenspektometrischer Fragmentierungen. W. Maraun, 1991.

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25

International Conference on Secondary Ion Mass Spectrometry (10th 1995 Muenster, Germany). Secondary ion mass spectrometry, SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995. Edited by Benninghoven A, Hagenhoff B, and Werner H. W. Wiley, 1997.

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26

International Conference on Secondary Ion Mass Spectrometry. (7th 1989 Monterey, Calif.). Secondary ion mass spectrometry: SIMS VII: proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-4th, 1989. Edited by Benninghoven A, Huber Alfred 1918-, and Werner H. W. Wiley, 1990.

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27

Fox, Harvey Stuart. A study of shallow implants in silicon by secondary ion mass spectrometry. typescript, 1989.

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28

Falcini, Mark R. A. A study of gas phase ion chemistry using high pressure mass spectrometry. typescript, 1992.

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29

A, Hites R., ed. Electron capture negative ion mass spectra of environmental contaminants and related compounds. VCH Publishers, 1988.

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30

Vargas-Aburto, Carlos. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. NASA, 1990.

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31

International Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, D.C.). Secondary ion mass spectrometry: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985. Edited by Benninghoven A. Springer-Verlag, 1986.

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32

Gibson, W. C. Fast ion mass spectrometry and charged particle spectrography investigations of transverse ion acceleration and beam-plasma interactions. National Aeronautics and Space Administration, 1987.

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33

(Editor), A. Benninghoven, C. A. Evans (Editor), K. D. McKeegan (Editor), H. A. Storms (Editor), and H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry. John Wiley and Sons Ltd, 1990.

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34

L, Bentz B., and Odom R. W, eds. Secondary ion mass spectrometry. Elsevier, 1995.

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35

International Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles, France). Secondary ion mass spectrometry. Edited by Benninghoven A. 1932-, Huber Alfred 1918-, and Werner H. W. Wiley, 1988.

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36

Todd, John F., and Raymond E. March. Quadrupole Ion Trap Mass Spectrometry. Wiley & Sons, Incorporated, John, 2008.

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37

Ion Mobility Spectrometry - Mass Spectrometry: Theory and Applications. Taylor & Francis Group, 2017.

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38

Wilkins, Charles L., and Sarah Trimpin. Ion Mobility Spectrometry - Mass Spectrometry: Theory and Applications. Taylor & Francis Group, 2010.

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39

Ion Mobility Spectrometry Mass Spectrometry Theory And Applications. CRC Press, 2010.

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40

(Editor), A. Benninghoven, B. Hagenhoff (Editor), and H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry: SIMS X. John Wiley & Sons Ltd (Import), 1997.

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41

Benninghoven, A., R. Shimizu, and Y. Nihei. Secondary Ion Mass Spectrometry: SIMS IX. John Wiley & Sons, 1994.

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42

Gillen, Edited by: G. Secondary Ion Mass Spectrometry SIMS XI. Wiley, 1998.

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43

H, Futrell J., and University of Utah. Dept. of Chemistry., eds. Gaseous ion chemistry and mass spectrometry. Wiley, 1986.

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44

Secondary Ion Mass Spectrometry Sims V. Springer, 1986.

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45

Fujii, Toshihiro. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer, 2016.

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46

Fujii, Toshihiro. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer, 2015.

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47

(Editor), Raymond E. March, and John F.J Todd (Editor), eds. Practical Aspects of Ion Trap Mass Spectrometry, Volume I (Modern Mass Spectrometry). CRC, 1995.

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48

(Editor), Raymond E. March, and John F.J Todd (Editor), eds. Practical Aspects of Ion Trap Mass Spectrometry, Volume II (Modern Mass Spectrometry). CRC, 1995.

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49

E, March Raymond, and Todd John F. J, eds. Practical aspects of ion trap mass spectrometry. CRC Press, 1995.

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50

Practical Aspects Of Trapped Ion Mass Spectrometry. CRC Press, 2010.

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