Books on the topic 'Ion mass spectrometry'
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van der Heide, Paul. Secondary Ion Mass Spectrometry. John Wiley & Sons, Inc., 2014. http://dx.doi.org/10.1002/9781118916780.
Full textPaglia, Giuseppe, and Giuseppe Astarita, eds. Ion Mobility-Mass Spectrometry. Springer US, 2020. http://dx.doi.org/10.1007/978-1-0716-0030-6.
Full textMahoney, Christine M., ed. Cluster Secondary Ion Mass Spectrometry. John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118589335.
Full textMarch, Raymond E., and John F. J. Todd. Quadrupole Ion Trap Mass Spectrometry. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471717983.
Full textJ, Todd John F., ed. Quadrupole ion trap mass spectrometry. 2nd ed. J. Wiley, 2005.
Find full textO'Neill, Karen Elizabeth. Studies in ion trap mass spectrometry. University of East Anglia, 1992.
Find full textBenninghoven, Alfred, Richard J. Colton, David S. Simons, and Helmut W. Werner, eds. Secondary Ion Mass Spectrometry SIMS V. Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-82724-2.
Full textFujii, Toshihiro, ed. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer US, 2015. http://dx.doi.org/10.1007/978-1-4899-7588-1.
Full textA, Brown, and Vickerman J. C, eds. Handbook of static secondary ion mass spectrometry. J. Wiley, 1989.
Find full textHearn, Martin John. Polymer surface studies by secondary ion mass spectrometry. Leicester Polytechnic, 1988.
Find full textSaunders, William Hundley, and James M. Farrar. Techniques for the study of ion-molecule reactions. Wiley, 1988.
Find full textIdentification of essential oils by ion trap mass spectroscopy. Academic Press, 1989.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama). Secondary ion mass spectrometry: SIMS IX : proceedings of the Ninth International Conference on Secondary Ion Mass Spectrometry (SIMS IX)...,7-12 November 1993. Edited by Benninghoven A. 1932-. Wiley, 1994.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (11th 1997 Orlando, Fla.). Secondary ion mass spectrometry, SIMS XI: Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997. Edited by Gillen G. Wiley, 1998.
Find full textG, Rüdenauer F., and Werner H. W, eds. Secondary ion mass spectrometry: Basic concepts, instrumental aspects, applications, and trends. J. Wiley, 1987.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (8th 1991 Amsterdam,Netherlands). Secondary ion mass spectrometry: SIMS VIII : proceedings of the eighth International Conference on Secondary Ion Mass Spectrometry, Amsterdam, the Netherlands, September 15-20 1991. Edited by Benninghoven A. 1932-. Wiley, 1992.
Find full textInternational Conferenceon Secondary Ion Mass Spectrometry (7th 1989 California, USA). Secondary ion mass spectrometry SIMS VII: Proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-8th, 1989. Edited by Benninghoven A. 1932-. Wiley, 1990.
Find full textMai, H. Investigation of the sampling volume in secondary ion microanalysis. Akademie der Wissenschaften der DDR, Zentralinstitut für Festkörperphysik und Werkstofforschung, 1986.
Find full textG, Wilson Robert. Secondary ion mass spectrometry: A practical handbook for depth profiling and bulk impurity analysis. Wiley, 1989.
Find full textFayek, Mostafa. Secondary ion mass spectrometry in the earth sciences: Gleaning the big picture from a small spot. Mineralogical Association of Canada, 2009.
Find full textA, Hedin, Sundqvist B. U. R, and Benninghoven A. 1932-, eds. Ion Formation from Organic Solids (IFOS V). Wiley, 1990.
Find full textInternational, Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles France). Secondary ion mass spectrometry: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987. Wiley, 1988.
Find full textThielking, Gerhard. Ion/Neutral-Komplexe als Zwischenstufen massenspektometrischer Fragmentierungen. W. Maraun, 1991.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (10th 1995 Muenster, Germany). Secondary ion mass spectrometry, SIMS X: Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany, October 1-6th, 1995. Edited by Benninghoven A, Hagenhoff B, and Werner H. W. Wiley, 1997.
Find full textInternational Conference on Secondary Ion Mass Spectrometry. (7th 1989 Monterey, Calif.). Secondary ion mass spectrometry: SIMS VII: proceedings of the seventh International Conference on Secondary Ion Mass Spectrometry (SIMS VII), Hyatt Regency Hotel, Monterey, California, USA, September 3rd-4th, 1989. Edited by Benninghoven A, Huber Alfred 1918-, and Werner H. W. Wiley, 1990.
Find full textFox, Harvey Stuart. A study of shallow implants in silicon by secondary ion mass spectrometry. typescript, 1989.
Find full textFalcini, Mark R. A. A study of gas phase ion chemistry using high pressure mass spectrometry. typescript, 1992.
Find full textA, Hites R., ed. Electron capture negative ion mass spectra of environmental contaminants and related compounds. VCH Publishers, 1988.
Find full textVargas-Aburto, Carlos. Development of a quadrupole-based secondary-ion mass spectrometry (SIMS) system at Lewis Research Center. NASA, 1990.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (5th 1985 Washington, D.C.). Secondary ion mass spectrometry: SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985. Edited by Benninghoven A. Springer-Verlag, 1986.
Find full textGibson, W. C. Fast ion mass spectrometry and charged particle spectrography investigations of transverse ion acceleration and beam-plasma interactions. National Aeronautics and Space Administration, 1987.
Find full text(Editor), A. Benninghoven, C. A. Evans (Editor), K. D. McKeegan (Editor), H. A. Storms (Editor), and H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry. John Wiley and Sons Ltd, 1990.
Find full textInternational Conference on Secondary Ion Mass Spectrometry (6th 1987 Versailles, France). Secondary ion mass spectrometry. Edited by Benninghoven A. 1932-, Huber Alfred 1918-, and Werner H. W. Wiley, 1988.
Find full textTodd, John F., and Raymond E. March. Quadrupole Ion Trap Mass Spectrometry. Wiley & Sons, Incorporated, John, 2008.
Find full textIon Mobility Spectrometry - Mass Spectrometry: Theory and Applications. Taylor & Francis Group, 2017.
Find full textWilkins, Charles L., and Sarah Trimpin. Ion Mobility Spectrometry - Mass Spectrometry: Theory and Applications. Taylor & Francis Group, 2010.
Find full textIon Mobility Spectrometry Mass Spectrometry Theory And Applications. CRC Press, 2010.
Find full text(Editor), A. Benninghoven, B. Hagenhoff (Editor), and H. W. Werner (Editor), eds. Secondary Ion Mass Spectrometry: SIMS X. John Wiley & Sons Ltd (Import), 1997.
Find full textBenninghoven, A., R. Shimizu, and Y. Nihei. Secondary Ion Mass Spectrometry: SIMS IX. John Wiley & Sons, 1994.
Find full textH, Futrell J., and University of Utah. Dept. of Chemistry., eds. Gaseous ion chemistry and mass spectrometry. Wiley, 1986.
Find full textFujii, Toshihiro. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer, 2016.
Find full textFujii, Toshihiro. Ion/Molecule Attachment Reactions: Mass Spectrometry. Springer, 2015.
Find full text(Editor), Raymond E. March, and John F.J Todd (Editor), eds. Practical Aspects of Ion Trap Mass Spectrometry, Volume I (Modern Mass Spectrometry). CRC, 1995.
Find full text(Editor), Raymond E. March, and John F.J Todd (Editor), eds. Practical Aspects of Ion Trap Mass Spectrometry, Volume II (Modern Mass Spectrometry). CRC, 1995.
Find full textE, March Raymond, and Todd John F. J, eds. Practical aspects of ion trap mass spectrometry. CRC Press, 1995.
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