Journal articles on the topic 'Jury, virginia'
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Qasim, Isa C. "Navigating the Trunks and Spars." New Criminal Law Review 24, no. 4 (2021): 518–67. http://dx.doi.org/10.1525/nclr.2021.24.4.518.
Full textJasem, Haibat Hatem. "Euphemism as Doublespeak in Jhonny Depp-Amber Heard Defamation Trial." JOURNAL OF LANGUAGE STUDIES 7, no. 1 (2023): 12–25. http://dx.doi.org/10.25130/jls.7.1.2.
Full textDeRogatis, Amy. "What Would Jesus Do? Sexuality and Salvation in Protestant Evangelical Sex Manuals, 1950s to the Present." Church History 74, no. 1 (2005): 97–137. http://dx.doi.org/10.1017/s0009640700109679.
Full textDonovan, James M. "J. R. Pole . Contract and Consent: Representation and the Jury in Anglo-American Legal History . Charlottesville: University of Virginia Press. 2010. Pp. xiii, 264. $49.50." American Historical Review 116, no. 4 (2011): 1078–79. http://dx.doi.org/10.1086/ahr.116.4.1078a.
Full textBrunn-Bevel, Rachelle J., and W. Carson Byrd. "The Foundation of Racial Disparities in the Standardized Testing Era." Humanity & Society 39, no. 4 (2015): 419–48. http://dx.doi.org/10.1177/0160597615603750.
Full textPreuett, Jason A., Daniel J. Collins, Douglas Luster, and Timothy L. Widmer. "Screening Selected Gulf Coast and Southeastern Forest Species for Susceptibility to Phytophthora ramorum." Plant Health Progress 14, no. 1 (2013): 17. http://dx.doi.org/10.1094/php-2013-0730-01-rs.
Full textDeutsch, Michael E., and Erica Thompson. "Secrets and Lies: The Persecution of Muhammad Salah (Part II)." Journal of Palestine Studies 38, no. 1 (2008): 25–53. http://dx.doi.org/10.1525/jps.2008.38.1.25.
Full textHeidt, Mason. "Virginia." Texas A&M Journal of Property Law 6, no. 3 (2020): 369–81. http://dx.doi.org/10.37419/jpl.v6.i3.18.
Full textStockton Maxwell, R., Amy E. Hessl, Edward R. Cook, and Brendan M. Buckley. "A Multicentury Reconstruction of May Precipitation for the Mid-Atlantic Region Using Juniperus virginiana Tree Rings*." Journal of Climate 25, no. 3 (2012): 1045–56. http://dx.doi.org/10.1175/jcli-d-11-00017.1.
Full textMidgley, PA, A. Eggeman, T. White, and E. Bithell. "Towards Routine Structure Solution using Precession Electron Diffraction." Microscopy and Microanalysis 15, S2 (2009): 738–39. http://dx.doi.org/10.1017/s1431927609093799.
Full textYasuhara, A., W. Inami, K. Yamazaki, et al. "Observation of Magnetic and Electric Field in STEM by using CCD camera." Microscopy and Microanalysis 15, S2 (2009): 1058–59. http://dx.doi.org/10.1017/s1431927609093805.
Full textHan, J., M. Kim, and HN Han. "TEM Observation of Twin Evolution in Austenitic TWIP steel." Microscopy and Microanalysis 15, S2 (2009): 792–93. http://dx.doi.org/10.1017/s1431927609093817.
Full textIshikawa, I., E. Okunishi, H. Sawada, et al. "Development of a 200kV Atomic Resolution Analytical Electron Microscope." Microscopy and Microanalysis 15, S2 (2009): 188–89. http://dx.doi.org/10.1017/s1431927609093829.
Full textSato, K., K. Aoyagi, TJ Konno, and Y. Hirotsu. "Characterization of L10-Type FePd Alloy Nanoparticles by Atomic-Resolution HAADF-STEM and Electron Tomography." Microscopy and Microanalysis 15, S2 (2009): 1262–63. http://dx.doi.org/10.1017/s1431927609093830.
Full textKamimura, O., T. Dobashi, K. Kawahara, Y. Maehara, and K. Gohara. "10-kV Electron-Diffractive Imaging of Multiwall Carbon Nanotube." Microscopy and Microanalysis 15, S2 (2009): 746–47. http://dx.doi.org/10.1017/s1431927609093842.
Full textTakahashi, J., K. Kawakami, and Y. Yamaguchi. "Quantitative Analysis of Cementite in Steel by Atom Probe Tomography." Microscopy and Microanalysis 15, S2 (2009): 306–7. http://dx.doi.org/10.1017/s1431927609093854.
Full textHashimoto, A., M. Shimojo, K. Mitsuishi, and M. Takeguchi. "Three-dimensional Observation of Carbon Nanostructures with Confocal Scanning Tansmission Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 636–37. http://dx.doi.org/10.1017/s1431927609093866.
Full textBencan, A., J. Bernard, J. Tellier, B. Malic, and M. Kosec. "The Influence of Alkaline Germanate Based Liquid Phase Sintering Aid on Microstructure and Phase Composition of K0.5Na0.5NbO3 Ceramics." Microscopy and Microanalysis 15, S2 (2009): 786–87. http://dx.doi.org/10.1017/s1431927609093878.
Full textSato, T., H. Matsumoto, M. Konno, M. Fukui, I. Nagaoki, and Y. Taniguchi. "Application of Lattice Strain Analysis of Semiconductor Device by Nano-beam Diffraction Using the 300 kV Cold-FE TEM." Microscopy and Microanalysis 15, S2 (2009): 114–15. http://dx.doi.org/10.1017/s143192760909388x.
Full textOkunishi, E., I. Ishikawa, H. Sawada, F. Hosokawa, M. Hori, and Y. Kondo. "Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy." Microscopy and Microanalysis 15, S2 (2009): 164–65. http://dx.doi.org/10.1017/s1431927609093891.
Full textTomita, T., Y. Tanishiro, T. Miyata, et al. "Highly Stable 300kV Cold Field Emission Gun for 50pm Resolution Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 1084–85. http://dx.doi.org/10.1017/s1431927609093908.
Full textMoll, S., and L. Thomé. "Radiation Effects in Oxides Foreseen for the Immobilization and Transmutation of Radioactive Wastes: Case Study of Zirconia." Microscopy and Microanalysis 15, S2 (2009): 1344–45. http://dx.doi.org/10.1017/s143192760909391x.
Full textCollins, CL, J. Holland, SR Burgess, P. Statham, and N. Rowlands. "Accurate Quantitative EDS Mapping at High Count Rates with a Large Area Silicon Drift Detector." Microscopy and Microanalysis 15, S2 (2009): 230–31. http://dx.doi.org/10.1017/s1431927609093921.
Full textKannan, KR, and AR Raju. "Synthesis and Characterization of Nanomaterials Obtained by Sol-Gel Synthesis." Microscopy and Microanalysis 15, S2 (2009): 1264–65. http://dx.doi.org/10.1017/s1431927609093933.
Full textKlein, C., S. Mutas, A. Würfel, and E. Zschech. "Investigation of Boron Delta-layers in Silicon Measured by Atom Probe Tomography (APT)." Microscopy and Microanalysis 15, S2 (2009): 282–83. http://dx.doi.org/10.1017/s1431927609093945.
Full textAert, S. Van, J. Verbeeck, S. Bals, R. Erni, D. Van Dyck, and S. Van Tendeloo. "Atomic Resolution Mapping Using Quantitative High-angle Annular Dark Field Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 15, S2 (2009): 464–65. http://dx.doi.org/10.1017/s1431927609093957.
Full textCollins, CL, J. Holland, SR Burgess, and N. Rowlands. "X-Max Large Area SDD Detectors - Creating a Real Impact on Nano-Science." Microscopy and Microanalysis 15, S2 (2009): 172–73. http://dx.doi.org/10.1017/s1431927609093969.
Full textLametschwandtner, A., U. Lametschwandtner, H. Bartel, C. Radner, and B. Minnich. "Microvascular Anatomy of Extrahepatic Bile Ducts in Adult South African Clawed Toad, Xenopus laevis Daudin: Scanning Electron Microscopy of Vascular Corrosion Casts and Correlative Light Microscopy." Microscopy and Microanalysis 15, S2 (2009): 986–87. http://dx.doi.org/10.1017/s1431927609093970.
Full textGiannuzzi, LA, and M. Utlaut. "Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images." Microscopy and Microanalysis 15, S2 (2009): 650–51. http://dx.doi.org/10.1017/s1431927609093982.
Full textHovington, P., P. T-Pinard, M. Lagacé, D. Thibeault, R. Gauvin, and D. Drouin. "Evaluation of Strategies to Increase the Spatial Resolution of X-Ray Mapping in the FE-SEM of Low Concentration in Sub-Micron microstructures." Microscopy and Microanalysis 15, S2 (2009): 480–81. http://dx.doi.org/10.1017/s1431927609093994.
Full textSawada, H., T. Sasaki, F. Hosokawa, et al. "Correction of Spherical Aberration and Six-Fold Astigmatism Using Three Dodecapoles,." Microscopy and Microanalysis 15, S2 (2009): 1458–59. http://dx.doi.org/10.1017/s1431927609094008.
Full textWang, J., X. Wang, Y. Jiao, Q. Li, M.-W. Chu, and M. Malac. "Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures." Microscopy and Microanalysis 15, S2 (2009): 1244–45. http://dx.doi.org/10.1017/s143192760909401x.
Full textStegmann, H., Y. Ritz, D. Utess, H.-J. Engelmann, and E. Zschech. "In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System." Microscopy and Microanalysis 15, S2 (2009): 170–71. http://dx.doi.org/10.1017/s1431927609094021.
Full textSoltau, H., O. Jaratschin, A. Liebel, et al. "New Detector Architecture, for Electron Microscopes with SDDs." Microscopy and Microanalysis 15, S2 (2009): 204–5. http://dx.doi.org/10.1017/s1431927609094033.
Full textMarquis, EA, DW Saxey, A. Cerezo, and GDW Smith. "A UK Facility for Atom Probe Tomography Analysis." Microscopy and Microanalysis 15, S2 (2009): 288–89. http://dx.doi.org/10.1017/s1431927609094045.
Full textSasaki, T., H. Sawada, T. Nakamichi, et al. "Performance of Low-voltage Electron Microscope with New Aberration Correction System and Cold Field Emission Gun." Microscopy and Microanalysis 15, S2 (2009): 1080–81. http://dx.doi.org/10.1017/s1431927609094057.
Full textWang, P., G. Behan, AI Kirkland, and P. Nellist. "Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope." Microscopy and Microanalysis 15, S2 (2009): 42–43. http://dx.doi.org/10.1017/s1431927609094069.
Full textWu, X., I. Baker, MK Miller, and KL More. "Microstructure and Mechanical Behavior in Spinodal Fe35Ni15Mn25Al25 Alloy." Microscopy and Microanalysis 15, S2 (2009): 116–17. http://dx.doi.org/10.1017/s1431927609094070.
Full textRowenhorst, D., A. Lewis та G. Spanos. "Grain Boundary Curvature Analysis of β -Grains in Ti-21S". Microscopy and Microanalysis 15, S2 (2009): 640–41. http://dx.doi.org/10.1017/s1431927609094082.
Full textBean, SJ, VM Kugler, and D. Connor. "The Benefits Associated With a 1 mm Beam Gas Path Length on the Accuracy of X-ray Analysis in the Variable Pressure SEM." Microscopy and Microanalysis 15, S2 (2009): 1112–13. http://dx.doi.org/10.1017/s1431927609094094.
Full textTang, D., A. Rucki, H. Cerva, and P. Schlossmacher. "LM-STEM Study of Dislocations in Thick Silicon." Microscopy and Microanalysis 15, S2 (2009): 190–91. http://dx.doi.org/10.1017/s1431927609094100.
Full textHodoroaba, V.-D., and M. Procop. "Performance Check of a Wavelength Dispersive X-Ray Spectrometer (WDS) attached to the SEM." Microscopy and Microanalysis 15, S2 (2009): 1118–19. http://dx.doi.org/10.1017/s1431927609094112.
Full textWong, K., N. Anantharamaiah, R. Garcia, D. Batchelor, B. Pourdeyhimi, and D. Griffis. "Focused Ion Beam Characterization of Bicomponent Polymer Fibers." Microscopy and Microanalysis 15, S2 (2009): 370–71. http://dx.doi.org/10.1017/s1431927609094124.
Full textHartshorne, M., E. Toby, P. Uranga, M. Schmidt, P. Novotny, and M. Taheri. "Direct Observation of the Effects of Alloying Additions on Transformation Mechanisms in Emerging Steel Alloys with In-Situ TEM." Microscopy and Microanalysis 15, S2 (2009): 704–5. http://dx.doi.org/10.1017/s1431927609094136.
Full textDillon, S., and G. Rohrer. "Measuring the Grain Boundary Character and Energy Distributions of Ceramics From Serial Sections of Orientation Maps." Microscopy and Microanalysis 15, S2 (2009): 608–9. http://dx.doi.org/10.1017/s1431927609094148.
Full textWight, S., and J. Small. "Modeling and Measurements of Electron Beam Scattering into Adjacent Particles." Microscopy and Microanalysis 15, S2 (2009): 1266–67. http://dx.doi.org/10.1017/s143192760909415x.
Full textKourkoutis, LF, JH Song, HY Hwang, and DA Muller. "Atomic-Scale Chemical Imaging of Interdiffusion and Defects in (La0.7Sr0.3MnO3)5/(SrTiO3)5 Multilayers by Aberration Corrected Microscopy." Microscopy and Microanalysis 15, S2 (2009): 428–29. http://dx.doi.org/10.1017/s1431927609094161.
Full textStodolka, JP, MG Schweitzer, and TA Albrecht. "Towards an FE-SEM as a complete analytical laboratory." Microscopy and Microanalysis 15, S2 (2009): 182–83. http://dx.doi.org/10.1017/s1431927609094173.
Full textMichael, JR, DC Joy, and BJ Griffin. "Challenges in Achieving High Resolution at Low Voltages in the SEM." Microscopy and Microanalysis 15, S2 (2009): 660–61. http://dx.doi.org/10.1017/s1431927609094185.
Full textPoppell, E., C. Marks, A. Hill, and M. Hill. "Microbial Symbionts and Sponge Heterotrophy; Morphological Aspects of Sponge: Symbiont Integration via SEM Analysis." Microscopy and Microanalysis 15, S2 (2009): 844–45. http://dx.doi.org/10.1017/s1431927609094197.
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