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Relevant bibliographies by topics / Kikuchi diffraction

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Academic literature on the topic 'Kikuchi diffraction'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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Journal articles on the topic "Kikuchi diffraction"

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Nolze, Gert, Tomasz Tokarski, Łukasz Rychłowski, Grzegorz Cios, and Aimo Winkelmann. "Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns." Journal of Applied Crystallography 54, no. 3 (2021): 1012–22. http://dx.doi.org/10.1107/s1600576721004210.

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A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide-angle Kikuchi pattern of arbitrary resolution and unknown phase, the traces of all visibly diffracting lattice planes are manually derived from four initial Kikuchi band traces via an intuitive graphical user interface. A single Kikuchi bandwidth is then used as reference to scale all reciprocal lattice point distances. Kikuchi band detection, via a filtered Funk transformation, and simultaneous display of the band

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Eades, Alwyn. "Insights on Diffraction." Microscopy Today 10, no. 2 (2002): 34–35. http://dx.doi.org/10.1017/s1551929500057874.

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This article presents ideas on some topics related to electron diffraction in the TEM. These are in regard to topics that I have come to think of as standard parts of what it means to do microscopy. However, they represent insights that not all users share (or even agree with, maybe).Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD). This is because immersion lenses send parallel electrons, from different parts of the sample (like the Kikuchi lines from a flat specimen), to different places

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Otten, Max T. "On-line measurement of specimen thickness by Convergent Beam Electron Diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 480–81. http://dx.doi.org/10.1017/s0424820100136003.

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Convergent Beam Electron Diffraction (CBED) thickness measurement is the easiest and most accurate way of determining the thickness of crystalline materials. The method was described by Kelly et al. The specimen thickness can be calculated from a few measurements on a recorded diffraction pattern in a matter of minutes (by hand) or seconds (by a computer program).For thickness measurement a CBED pattern is needed that contains a two-beam diffracting condition, with a dark Kikuchi line going through the centre of the Bright-Field disc and the corresponding bright Kikuchi line through the centre

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Nolze, Gert, and Aimo Winkelmann. "Crystallometric and projective properties of Kikuchi diffraction patterns." Journal of Applied Crystallography 50, no. 1 (2017): 102–19. http://dx.doi.org/10.1107/s1600576716017477.

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Kikuchi diffraction patterns can provide fundamental information about the lattice metric of a crystalline phase. In order to improve the possible precision and accuracy of lattice parameter determination from the features observed in Kikuchi patterns, some useful fundamental relationships of geometric crystallography are reviewed, which hold true independently of the actual crystal symmetry. The Kikuchi band positions and intersections and the Kikuchi band widths are highly interrelated, which is illustrated by the fact that all lattice plane trace positions of the crystal are predetermined b

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Eades, J. A. "Topics in Electron Diffraction (TEM): A Tutorial." Microscopy and Microanalysis 7, S2 (2001): 764–65. http://dx.doi.org/10.1017/s1431927600029895.

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Introduction. Electron diffraction is sometimes considered to be a “difficult subject”. It is certainly one that can not be covered in the space available here. Rather this tutorial will present a few specific aspects of the topic. The topics have been chosen in the hope that they will provide illumination that spreads more widely than just onto the material presented. Several books treat electron diffraction with more generality.Kikuchi lines Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD

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Ram, Farangis, Stefan Zaefferer, and Dierk Raabe. "Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns." Journal of Applied Crystallography 47, no. 1 (2014): 264–75. http://dx.doi.org/10.1107/s1600576713030446.

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In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, t

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Weiland, H., and D. P. Field. "Automatic analysis of Kikuchi diffraction patterns." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 900–901. http://dx.doi.org/10.1017/s0424820100172231.

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Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstru

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Brodu, Etienne, and Emmanuel Bouzy. "A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission." Microscopy and Microanalysis 24, no. 6 (2018): 634–46. http://dx.doi.org/10.1017/s1431927618015441.

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AbstractThe finding of this study is that the interaction volume in electron microscopy in transmission is well ordered laterally, with a remarkable and unexpected consequence being that lateral subsections of the interaction volume produce subsections of the Kikuchi diffraction pattern. It makes the microstructure of samples directly visible in Kikuchi patterns. This is first illustrated with polycrystalline Ti–10Al–25Nb with an on-axis transmission Kikuchi diffraction set-up in a scanning electron microscope. It is then shown via a Monte Carlo simulation and a large-angle convergent-beam ele

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Burkhardt, Ulrich, Aimo Winkelmann, Horst Borrmann та ін. "Assignment of enantiomorphs for the chiral allotrope β-Mn by diffraction methods". Science Advances 7, № 20 (2021): eabg0868. http://dx.doi.org/10.1126/sciadv.abg0868.

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The assignment of enantiomorphs by diffraction methods shows fundamental differences for x-rays and electrons. This is particularly evident for the chiral allotrope of β-Mn. While it is not possible to determine the sense of chirality of β-Mn with established x-ray diffraction methods, Kikuchi pattern simulation of the enantiomorphs reveals differences, if dynamical electron diffraction is considered. Quantitative comparison between experimental and simulated Kikuchi patterns allows the spatially resolved assignment of the enantiomorph in polycrystalline materials of β-Mn, as well as the struc

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Ling, P., and R. Gronsky. "On the geometrical relationship between Kikuchi line position and excitation error in electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 870–71. http://dx.doi.org/10.1017/s0424820100145698.

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All of the main features of the geometry of Kikuchi lines can be thoroughly explained using the treatment first proposed by Kikuchi in which the observed diffraction lines are considered to arise from the elastic iBraggi scattering of electrons that had been previously scattered inelastically by the specimen. The positions of the lines occur at the intersection of Kikuchi cones or Kossel cones with the Ewald sphere, giving an accurate indication of the orientation of the specimen relative to the incident beam direction, and providing a rapid means (inspection) of deducing the sign of the devia

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Dissertations / Theses on the topic "Kikuchi diffraction"

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Kult, Andrew Blair. "Implementation of an algorithm for inverting Kikuchi electron diffraction images." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp04/mq28215.pdf.

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Tryblom, Axel. "Optimizing Transmission Kikuchi Diffraction for Analysing Grain Size and Orientation of Nanocrystalline Coatings." Thesis, Uppsala universitet, Tillämpad materialvetenskap, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-266442.

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In order to increase efficiency and lifetime of cutting tools it is typical to apply thin coatings by physical or chemical vapour deposition. Applying coatings on cutting tools has shown an increase in both efficiency and lifetime and are of large interest in further development. The study of coatings and their mechanical properties is a very active research area and produces tools extensively used in the industry. The behaviour of materials on a macroscopic scale can typically be related to microscopic properties. Some coatings produced by Chemical Vapour Deposition (CVD) but especially Phys

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Ram, Farangis Verfasser], Stefan [Akademischer Betreuer] Zaefferer, Joachim [Akademischer Betreuer] [Mayer, and Aimo [Akademischer Betreuer] Winkelmann. "The Kikuchi bandlet method for the intensity analysis of the electron backscatter Kikuchi diffraction patterns / Farangis Ram ; Stefan Zaefferer, Joachim Mayer, Aimo Winkelmann." Aachen : Universitätsbibliothek der RWTH Aachen, 2015. http://d-nb.info/1126729698/34.

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Ram, Farangis [Verfasser], Stefan Akademischer Betreuer] Zaefferer, Joachim [Akademischer Betreuer] [Mayer, and Aimo [Akademischer Betreuer] Winkelmann. "The Kikuchi bandlet method for the intensity analysis of the electron backscatter Kikuchi diffraction patterns / Farangis Ram ; Stefan Zaefferer, Joachim Mayer, Aimo Winkelmann." Aachen : Universitätsbibliothek der RWTH Aachen, 2015. http://d-nb.info/1126729698/34.

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蘇偉基 and Wai-kei So. "Surface structure determination of Ga/Si (111) 3x3-R30 by Kikuchi electron holography." Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 2001. http://hub.hku.hk/bib/B31226693.

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So, Wai-kei. "Surface structure determination of Ga/Si (111) 3x3-R30 by Kikuchi electron holography /." Hong Kong : University of Hong Kong, 2001. http://sunzi.lib.hku.hk/hkuto/record.jsp?B23621588.

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Hobday, Denise Marie. "LEED analysis of Ge(111)(#sq root#3X#sq root#3)R30deg-Ag and Kikuchi electron diffraction." Thesis, University of York, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.259880.

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Hu, Jing. "High resolution characterisation of corrosion and hydrogen pickup of Zr-Nb cladding alloys." Thesis, University of Oxford, 2016. http://ora.ox.ac.uk/objects/uuid:a986c6e5-bba4-48c2-8e30-7f77ebe5313e.

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Zr cladding alloys have been used for many years as the first safety barrier layer of a nuclear reactor. However, the recent Fukushima accidents and industrial demands to increase the burnup of fuels have led to increasing interest in a detailed mechanistic understanding of aqueous corrosion and hydrogen pickup and the performance at high temperatures. As part of an international MUZIC-2 programme (Mechanistic Understanding of Zr Corrosion and Hydrogen pickup), I have used a range of advanced microscopy techniques to study the microstructure, the nanoscale chemistry and the porosity in a serie

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Tort, Morgan. "The effects of severe plastic deformation on an age hardenable Al-2.5Cu-1.5Mg alloy." Thesis, Clermont-Ferrand 2, 2015. http://www.theses.fr/2015CLF22578.

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Les effets du pressage à canaux égaux (ECAP), un procédé de déformation plastique sévère, ont été examinés dans un alliage Al-2.5Cu-1.5Mg (pourcentage en masse) prône à être durci par traitement thermique et précipitant dans la région α + S. Une multitude de techniques microscopiques, calorimétriques et analytiques ont été utilisés pour caractériser et quantifier les microstructures, incluant la diffraction Kikuchi, la microscopie électronique en transmission, la calorimétrie différentielle à balayage et la sonde atomique tomographique. Quatre différents traitements thermiques initiaux ont été

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Lee, Genevieve W. "Advanced Characterization of Solid-State Dissimilar Material Joints." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu1492794418438023.

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Books on the topic "Kikuchi diffraction"

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Dingley, D. J. Atlas of backscattering Kikuchi diffraction patterns. Institute of Physics Pub., 1995.

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Book chapters on the topic "Kikuchi diffraction"

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Williams, David B., and C. Barry Carter. "Kikuchi Diffraction." In Transmission Electron Microscopy. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_19.

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Williams, David B., and C. Barry Carter. "Kikuchi Diffraction." In Transmission Electron Microscopy. Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_19.

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Day, Austin P. "Spherical Kikuchi Maps and Other Rarities." In Electron Backscatter Diffraction in Materials Science. Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-88136-2_5.

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"The Kikuchi Diffraction Pattern." In Introduction to Texture Analysis. CRC Press, 2009. http://dx.doi.org/10.1201/9781420063660-12.

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"The Kikuchi Diffraction Pattern." In Introduction to Texture Analysis. CRC Press, 2009. http://dx.doi.org/10.1201/9781420063660-c6.

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"Kikuchi and resonance patterns." In Reflection High-Energy Electron Diffraction. Cambridge University Press, 2004. http://dx.doi.org/10.1017/cbo9780511735097.008.

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"Automated Crystal Orientation Measurement by backscatter Kikuchi diffraction." In Ninth European Powder Diffraction Conference. Oldenbourg Wissenschaftsverlag, 2006. http://dx.doi.org/10.1524/9783486992526-029.

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Champness, P. E. "Finding your way around reciprocal space: Kikuchi diffraction." In Electron Diffraction in the Transmission Electron Microscope. Garland Science, 2020. http://dx.doi.org/10.1201/9781003076872-6.

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Krishnan, Kannan M. "Diffraction of Electrons and Neutrons." In Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0008.

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Electron scattering, significantly stronger than that for X-rays, is sensitive to surfaces and small volumes of materials. Low-energy electron diffraction (LEED) provides information on surface reconstruction and the arrangement of adsorbed atoms. Reflection high energy electron diffraction (RHEED) probes surface crystallography, and monitors, in situ, mechanisms of thin film growth. Transmission electron diffraction reveals a planar cross-section of the reciprocal lattice, where intensities are products of the structure and lattice amplitude factors determined by the overall shape of the specimen. The amplitude of any diffracted beam at the exit surface oscillates with thickness (fringes) and the excitation error (bend contours). Selected area diffraction produce spot or ring patterns, where low-index zone-axis orientations reflect the symmetry of the crystal, and double-diffraction shows positive intensities even for reflections forbidden by extinction rules. Kikuchi lines appear as pairs of dark and bright lines, and help in tilting the specimen. A focused probe produces convergent beam electron diffraction (CBED), useful for symmetry analysis at nanoscale resolution. Neutrons interact with the nucleus and the magnetic moment of the atom via the spin of the neutron; the latter finds particular use in studies of magnetic order. The atomic scattering factor for neutrons shows negligible angular dependence.

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Ingle, N. J. C. "Inelastic scattering techniques for in situ characterization of thin film growth: backscatter Kikuchi diffraction." In In Situ Characterization of Thin Film Growth. Elsevier, 2011. http://dx.doi.org/10.1533/9780857094957.1.29.

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Conference papers on the topic "Kikuchi diffraction"

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Bhatia, Vijay. "In-situ Heating and Biasing Transmission Kikuchi Diffraction." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.269.

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Fanta, Alice. "Challenges and perspectives of Transmission Kikuchi Diffraction in the SEM." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1124.

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Jacobson, Bryce T., Dmitriy Gavryushkin, Mark Harrison, and Kaley Woods. "Angularly sensitive detector for transmission Kikuchi diffraction in a scanning electron microscope." In SPIE OPTO, edited by Michael R. Douglass, Philip S. King, and Benjamin L. Lee. SPIE, 2015. http://dx.doi.org/10.1117/12.2083520.

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Sogami, I. S. "Kikuchi-Kossel diffraction line analysis on crystallization in salt-free aqueous colloidal suspensions." In SLOW DYNAMICS IN COMPLEX SYSTEMS: 3rd International Symposium on Slow Dynamics in Complex Systems. AIP, 2004. http://dx.doi.org/10.1063/1.1764184.

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Nowakowski, Pawel. "Transmission Kikuchi diffraction, a powerful technique for nanoscale materials characterization, and the influence of specimen preparation." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.914.

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Ernould, Clément. "A novel High-angular Resolution “on-axis” Transmission Kikuchi Diffraction (HR-TKD) technique for the fine characterization of deformed nanostructures in the SEM." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.230.

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Suzuki, Wataru, Kenta Ishihara, Ryo Kikuchi, Ken Suzuki, and Hideo Miura. "Change of the Effective Strength of Grain Boundaries in Alloy 617 Under Creep-Fatigue Loadings at 800°C." In ASME 2019 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/imece2019-11210.

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Abstract In this study, both EBSD (Electron Back-Scatter Diffraction) analysis and a micro tensile test system with FIB (Focused Ion Beam) equipment were applied to bicrystal specimens of Alloy 617 in order to establish a quantitative theory of the lifetime evaluation method under creep-fatigue loadings. The IQ (Image Quality) value which is obtained from the diffraction pattern (Kikuchi pattern) indicates the total density of defects such as vacancies, dislocations, and local strain was used for quantitatively evaluating the crystallinity of the alloy. KAM (Kernel Average Misorientation) valu

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Luo, Yifan, Kunio Tei, Ken Suzuki, and Hideo Miura. "Crystallinity-Induced Variation of the Yield Strength of Electroplated Copper Thin Films." In ASME 2017 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/imece2017-70302.

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The quality of grains and grain boundaries of polycrystalline copper thin films was analyzed by using image quality (IQ) value obtained from the observed Kikuchi pattern by applying electron back-scatter diffraction (EBSD) analysis. It is considered that the IQ value strongly correlates with the order of atomic configuration in the observed area, in other words, density of various defects, and thus, the area with high IQ value was defined as the area with high crystallinity. The yield strength of a grain was measured by using micro tensile test system in a scanning electron microscope. A bicry

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Zheng, Guoxiong, Yifan Luo, and Hideo Miura. "Degradation of the Strength of a Grain and a Grain Boundary due to the Accumulation of the Structural Defects of Crystal." In ASME 2018 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2018. http://dx.doi.org/10.1115/imece2018-87264.

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Various brittle fractures have been found to occur at grain boundaries in polycrystalline materials. In thin film interconnections used for semiconductor devices, open failures caused by electro- and strain-induced migrations have been found to be dominated by porous random grain boundaries that consist of a lot of defects. Therefore, it is very important to explicate the dominant factors of the strength of a grain boundary in polycrystalline materials for assuring the safe and reliable operation of various products. In this study, both electron back-scatter diffraction (EBSD) analysis and a m

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Sakamoto, Hayato, Ken Suzuki, and Hideo Miura. "Creep-Damage-Induced Deterioration of the Strength of Ni-Base Superalloy due to the Change of its Microstructure." In ASME 2017 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/imece2017-70317.

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Ni-base superalloys are widely used for various power plants and jet engines. Since the operating temperature of thermal plants and equipment has been increasing to improve their thermal efficiency for decreasing the emission of carbon-dioxide, the initially designed microstructure was found to change gradually during their operation. Since this change of microstructure should deteriorate the strength of the materials, sudden unexpected fracture should occur during the operation of the plants and equipment. Therefore, it is very important to clarify the dominant factor of the change of the mic

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