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Journal articles on the topic 'Kikuchi diffraction'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Nolze, Gert, Tomasz Tokarski, Łukasz Rychłowski, Grzegorz Cios, and Aimo Winkelmann. "Crystallographic analysis of the lattice metric (CALM) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns." Journal of Applied Crystallography 54, no. 3 (2021): 1012–22. http://dx.doi.org/10.1107/s1600576721004210.

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A new software is presented for the determination of crystal lattice parameters from the positions and widths of Kikuchi bands in a diffraction pattern. Starting with a single wide-angle Kikuchi pattern of arbitrary resolution and unknown phase, the traces of all visibly diffracting lattice planes are manually derived from four initial Kikuchi band traces via an intuitive graphical user interface. A single Kikuchi bandwidth is then used as reference to scale all reciprocal lattice point distances. Kikuchi band detection, via a filtered Funk transformation, and simultaneous display of the band

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2

Eades, Alwyn. "Insights on Diffraction." Microscopy Today 10, no. 2 (2002): 34–35. http://dx.doi.org/10.1017/s1551929500057874.

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This article presents ideas on some topics related to electron diffraction in the TEM. These are in regard to topics that I have come to think of as standard parts of what it means to do microscopy. However, they represent insights that not all users share (or even agree with, maybe).Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD). This is because immersion lenses send parallel electrons, from different parts of the sample (like the Kikuchi lines from a flat specimen), to different places

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3

Otten, Max T. "On-line measurement of specimen thickness by Convergent Beam Electron Diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 480–81. http://dx.doi.org/10.1017/s0424820100136003.

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Convergent Beam Electron Diffraction (CBED) thickness measurement is the easiest and most accurate way of determining the thickness of crystalline materials. The method was described by Kelly et al. The specimen thickness can be calculated from a few measurements on a recorded diffraction pattern in a matter of minutes (by hand) or seconds (by a computer program).For thickness measurement a CBED pattern is needed that contains a two-beam diffracting condition, with a dark Kikuchi line going through the centre of the Bright-Field disc and the corresponding bright Kikuchi line through the centre

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4

Nolze, Gert, and Aimo Winkelmann. "Crystallometric and projective properties of Kikuchi diffraction patterns." Journal of Applied Crystallography 50, no. 1 (2017): 102–19. http://dx.doi.org/10.1107/s1600576716017477.

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Kikuchi diffraction patterns can provide fundamental information about the lattice metric of a crystalline phase. In order to improve the possible precision and accuracy of lattice parameter determination from the features observed in Kikuchi patterns, some useful fundamental relationships of geometric crystallography are reviewed, which hold true independently of the actual crystal symmetry. The Kikuchi band positions and intersections and the Kikuchi band widths are highly interrelated, which is illustrated by the fact that all lattice plane trace positions of the crystal are predetermined b

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5

Eades, J. A. "Topics in Electron Diffraction (TEM): A Tutorial." Microscopy and Microanalysis 7, S2 (2001): 764–65. http://dx.doi.org/10.1017/s1431927600029895.

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Introduction. Electron diffraction is sometimes considered to be a “difficult subject”. It is certainly one that can not be covered in the space available here. Rather this tutorial will present a few specific aspects of the topic. The topics have been chosen in the hope that they will provide illumination that spreads more widely than just onto the material presented. Several books treat electron diffraction with more generality.Kikuchi lines Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD

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6

Ram, Farangis, Stefan Zaefferer, and Dierk Raabe. "Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns." Journal of Applied Crystallography 47, no. 1 (2014): 264–75. http://dx.doi.org/10.1107/s1600576713030446.

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In order to retrieve crystallographic information from an electron backscatter Kikuchi diffraction pattern, its Kikuchi bands have to be localized. One of the main reasons for the limited precision of the present Kikuchi band localization methods is that the diffuse edges of a Kikuchi band are convoluted by many other Kikuchi bands that intersect them. To improve the localization accuracy, Kikuchi bands have to be deconvoluted. In this article, a new method for the deconvolution and localization of Kikuchi bands is presented. The deconvolution is based on the fact that, in a Kikuchi pattern, t

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7

Weiland, H., and D. P. Field. "Automatic analysis of Kikuchi diffraction patterns." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 900–901. http://dx.doi.org/10.1017/s0424820100172231.

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Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstru

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8

Brodu, Etienne, and Emmanuel Bouzy. "A New and Unexpected Spatial Relationship Between Interaction Volume and Diffraction Pattern in Electron Microscopy in Transmission." Microscopy and Microanalysis 24, no. 6 (2018): 634–46. http://dx.doi.org/10.1017/s1431927618015441.

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AbstractThe finding of this study is that the interaction volume in electron microscopy in transmission is well ordered laterally, with a remarkable and unexpected consequence being that lateral subsections of the interaction volume produce subsections of the Kikuchi diffraction pattern. It makes the microstructure of samples directly visible in Kikuchi patterns. This is first illustrated with polycrystalline Ti–10Al–25Nb with an on-axis transmission Kikuchi diffraction set-up in a scanning electron microscope. It is then shown via a Monte Carlo simulation and a large-angle convergent-beam ele

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9

Burkhardt, Ulrich, Aimo Winkelmann, Horst Borrmann та ін. "Assignment of enantiomorphs for the chiral allotrope β-Mn by diffraction methods". Science Advances 7, № 20 (2021): eabg0868. http://dx.doi.org/10.1126/sciadv.abg0868.

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The assignment of enantiomorphs by diffraction methods shows fundamental differences for x-rays and electrons. This is particularly evident for the chiral allotrope of β-Mn. While it is not possible to determine the sense of chirality of β-Mn with established x-ray diffraction methods, Kikuchi pattern simulation of the enantiomorphs reveals differences, if dynamical electron diffraction is considered. Quantitative comparison between experimental and simulated Kikuchi patterns allows the spatially resolved assignment of the enantiomorph in polycrystalline materials of β-Mn, as well as the struc

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10

Ling, P., and R. Gronsky. "On the geometrical relationship between Kikuchi line position and excitation error in electron diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 870–71. http://dx.doi.org/10.1017/s0424820100145698.

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All of the main features of the geometry of Kikuchi lines can be thoroughly explained using the treatment first proposed by Kikuchi in which the observed diffraction lines are considered to arise from the elastic iBraggi scattering of electrons that had been previously scattered inelastically by the specimen. The positions of the lines occur at the intersection of Kikuchi cones or Kossel cones with the Ewald sphere, giving an accurate indication of the orientation of the specimen relative to the incident beam direction, and providing a rapid means (inspection) of deducing the sign of the devia

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11

Picard, Yoosuf N., Ranga Kamaladasa, Marc De Graef, et al. "Future Prospects for Defect and Strain Analysis in the SEM via Electron Channeling." Microscopy Today 20, no. 2 (2012): 12–16. http://dx.doi.org/10.1017/s1551929512000077.

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Electron diffraction in both SEM and TEM provides a contrast mechanism for imaging defects as well as a means for quantifying elastic strain. Electron backscatter diffraction (EBSD) is the commercially established method for SEM-based diffraction analysis. In EBSD, Kikuchi patterns are acquired by a charge-coupled device (CCD) camera and indexed using commercial software. Phase and crystallographic orientation information can be extracted from these Kikuchi patterns, and researchers have developed cross-correlation methods to measure strain as well.

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12

Zhao, H., S. P. Tear, and A. H. Jones. "Surface sensitivity of Kikuchi-electron diffraction patterns." Physical Review B 52, no. 11 (1995): 8439–45. http://dx.doi.org/10.1103/physrevb.52.8439.

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13

Dingley, D. J. "Investigation of Low Symmetry Crystals Using Elctron Backscatter Diffraction." Microscopy and Microanalysis 5, S2 (1999): 222–23. http://dx.doi.org/10.1017/s1431927600014434.

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Electron backscatter diffraction patterns obtained from low symmetry crystals can present difficulties for automated pattern recognition. For example, when only a single zone axis is observed in the diffraction pattern and the Kikuchi bands used for indexing all pass through the zone axis then only two-dimensional crystallographic information is obtained. This results in there being a 180 degree ambiguity in the measured orientation. Furthermore, it is often observed that in automated indexing of quartz, an additional ambiguity is introduced when the zone axis imaged is [0001]. In this case it

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14

Zhu, Chaoyi, Kevin Kaufmann, and Kenneth Vecchio. "Automated Reconstruction of Spherical Kikuchi Maps." Microscopy and Microanalysis 25, no. 4 (2019): 912–23. http://dx.doi.org/10.1017/s1431927619000710.

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AbstractAn automated approach to fully reconstruct spherical Kikuchi maps from experimentally collected electron backscatter diffraction patterns and overlay each pattern onto its corresponding position on a simulated Kikuchi sphere is presented in this study. This work demonstrates the feasibility of warping any Kikuchi pattern onto its corresponding location of a simulated Kikuchi sphere and reconstructing a spherical Kikuchi map of a known phase based on any set of experimental patterns. This method consists of the following steps after pattern collection: (1) pattern selection based on mul

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15

Fant, G. Y. "Multislice calculation of Kikuchi patterns." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 52–53. http://dx.doi.org/10.1017/s0424820100152239.

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The diffraction of the inelastically and pseudo-elastically scattered electrons in a crystal gives rise to the diffuse background in a diffraction pattern, including Kikuchi patterns as they are known, which are very sensitive to the direction of electron incidence relative to the crystal orientation. In the exact zone orientation, i.e., when the electrons are travelling along a major zone axis, a Kikuchi-band pattern is formed which reflects the crystal symmetry about that axis; otherwise, the pattern is known as Kikuchi-line pattern (thereafter collectively referred to as K-patterns).For loc

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16

Baudin, T., Y. Chastel, and R. Pennelle. "Strain Estimation by Electron Back Scattered Diffraction." Microscopy and Microanalysis 3, S2 (1997): 569–70. http://dx.doi.org/10.1017/s1431927600009739.

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The quality of the Kikuchi patterns obtained for example by electron backscattered diffraction decreases when the dislocation density increases in strained materials, and consequently, it can theoretically be correlated to the strain through the average dislocation density measurement particularly for monotonic deformation paths. For that purpose, in a first step it is necessary to define a quality factor defined in the Hough space or with the Burns method currently used when the Kikuchi patterns are automatically analyzed. Then, and it is the most important point, the quality factor must be l

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17

Fanta, Alice Bastos, Matteo Todeschini, Andrew Burrows, et al. "Elevated temperature transmission Kikuchi diffraction in the SEM." Materials Characterization 139 (May 2018): 452–62. http://dx.doi.org/10.1016/j.matchar.2018.03.026.

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18

Pascal, Elena, Saransh Singh, Ben Hourahine, Carol Trager-Cowan, and Marc De Graef. "Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns." Microscopy and Microanalysis 23, S1 (2017): 540–41. http://dx.doi.org/10.1017/s1431927617003385.

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19

Vespucci, S., A. Winkelmann, K. Mingard, D. Maneuski, V. O'Shea, and C. Trager-Cowan. "Exploring transmission Kikuchi diffraction using a Timepix detector." Journal of Instrumentation 12, no. 02 (2017): C02075. http://dx.doi.org/10.1088/1748-0221/12/02/c02075.

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20

Schwarzer, R. A. "Automated Crystal Orientation Measurement by backscatter Kikuchi diffraction." Zeitschrift für Kristallographie Supplements 2006, suppl_23_2006 (2006): 163–68. http://dx.doi.org/10.1524/zksu.2006.suppl_23.163.

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21

Yao, Nan, and John M. Cowley. "Inelastic Electron Scattering and Total Reflectivity in RHEED." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 392–93. http://dx.doi.org/10.1017/s0424820100135563.

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The detailed studies of the electron energy distribution of the specular reflected beam and the total reflectivity for a platinum single crystal (111) surface under a variety of diffraction conditions were carried out on a JEM-2000FX transmission electron microscope equipped with a Gatan 666 paralleldetection electron energy loss spectrometer.Five different diffraction conditions are characterized as D1-D5. With D1, the specular reflected spot falls in an intersection of a parallel Kikuchi line with a parabola; with D2, the specular reflected spot coincides with an intersection of the Kikuchi

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22

WEI, C. M., I. H. HONG, and Y. C. CHOU. "A NEW DIRECT SURFACE STRUCTURAL PROBE: INVERSION OF MEASURED KIKUCHI ELECTRON PATTERNS." Surface Review and Letters 01, no. 02n03 (1994): 335–58. http://dx.doi.org/10.1142/s0218625x94000333.

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The technique of electron-emission holography (EEH) is reviewed with respect to its potential as a direct local structural probe. Direct inversion of the measured Kikuchi electron patterns is emphasized. The description of how the multiple scattering effects are eliminated by the integral-energy phase-summing method is presented. High-fidelity, artifact-free three-dimensional atomic images obtained by inverting simulated diffuse LEED and photoelectron diffraction patterns are shown. Direct inversion of the measured Kikuchi patterns shows clear images of the neighboring atoms within the range o

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23

Winkelmann, Aimo, Gert Nolze, Grzegorz Cios, Tomasz Tokarski, and Piotr Bała. "Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps." Materials 13, no. 12 (2020): 2816. http://dx.doi.org/10.3390/ma13122816.

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For the precise determination of orientations in polycrystalline materials, electron backscatter diffraction (EBSD) requires a consistent calibration of the diffraction geometry in the scanning electron microscope (SEM). In the present paper, the variation of the projection center for the Kikuchi diffraction patterns which are measured by EBSD is calibrated using a projective transformation model for the SEM beam scan positions on the sample. Based on a full pattern matching approach between simulated and experimental Kikuchi patterns, individual projection center estimates are determined on a

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24

Brodu, Etienne, Emmanuel Bouzy, Jean Jacques Fundenberger, Benoit Beausir, Lydia Laffont, and Jacques Lacaze. "Crystallography of Growth Blocks in Spheroidal Graphite." Materials Science Forum 925 (June 2018): 54–61. http://dx.doi.org/10.4028/www.scientific.net/msf.925.54.

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A better understanding of spheroidal graphite growth is expected in a near future thanks to widespread use of transmission electron microscopy. However, common transmission electron microscopy is quite time consuming and new indexing techniques are being developed, among them is transmission Kikuchi diffraction in a scanning electron microscope, a recent technique derived from electron backscatter diffraction. In the present work, on-axis transmission Kikuchi diffraction in scanning electron microscope, completed by transmission electron microscopy, was used with the objective of producing new

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25

Zaefferer, S. "On-Line Semi-Automatic Measurement of Individual Crystal Orientations in Heavily Deformed Materials in the TEM." Microscopy and Microanalysis 5, S2 (1999): 202–3. http://dx.doi.org/10.1017/s1431927600014331.

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The measurement of individual crystal orientations in heavily deformed materials is of great importance especially for the study of recrystallization mechanisms. The electron backscattering diffraction (EBSD) technique which is frequently used nowadays in the SEM for these kind of studies has three important drawbacks: first, its spatial resolution is limited to about 0.5 μm, second, the sample deformation is limited to only about 60 %, and third, the dislocation microstructure cannot be observed. All these problems can be overcome using a micro beam diffraction technique in the TEM. Two techn

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Kim, Yootaek, and Tung Hsu. "The Panoramic Rheed Patterns." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 324–25. http://dx.doi.org/10.1017/s0424820100180379.

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When applying the reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) methods[1] on the study of crystal surfaces it is necessary to index the RHEED spots and recognize the azimuth of the electron beam direction. This can be difficult because the RHEED pattern, unlike the transmission electron diffraction (TED) pattern, is distorted by the inner potential of the specimen and only one half of the pattern is shown. We found that it is useful, at the beginning of working on a certain surface of a certain crystal, to record a panoramic RHEED pattern by rota

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27

Fundenberger, J. J., E. Bouzy, D. Goran, J. Guyon, A. Morawiec, and H. Yuan. "Transmission Kikuchi Diffraction (TKD)via a horizontally positioned detector." Microscopy and Microanalysis 21, S3 (2015): 1101–2. http://dx.doi.org/10.1017/s1431927615006297.

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28

Herron, Adam D., Shawn P. Coleman, Khanh Q. Dang, Douglas E. Spearot, and Eric R. Homer. "Simulation of kinematic Kikuchi diffraction patterns from atomistic structures." MethodsX 5 (2018): 1187–203. http://dx.doi.org/10.1016/j.mex.2018.09.001.

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29

Gomoyunova, M. V., I. I. Pronin, N. S. Faradzhev, and D. A. Valdaitsev. "Kikuchi-band formation in medium-energy electron-diffraction patterns." Physics of the Solid State 41, no. 3 (1999): 369–74. http://dx.doi.org/10.1134/1.1130785.

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30

Baba-Kishi, K. Z. "Measurement of crystal parameters on backscatter kikuchi diffraction patterns." Scanning 20, no. 2 (1998): 117–27. http://dx.doi.org/10.1002/sca.1998.4950200210.

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31

Sneddon, Glenn, Xuyang Zhou, Gregory Thompson, and Julie Cairney. "A Comparative Investigation Between Transmission Kikuchi Diffraction (TKD) and Precession Electron Diffraction (PED)." Microscopy and Microanalysis 26, S2 (2020): 270–71. http://dx.doi.org/10.1017/s1431927620014026.

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32

Nolze, Gert, Tomasz Tokarski, Grzegorz Cios, and Aimo Winkelmann. "Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns." Journal of Applied Crystallography 53, no. 2 (2020): 435–43. http://dx.doi.org/10.1107/s1600576720000692.

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A historical tool for crystallographic analysis is provided by the Hilton net, which can be used for manually surveying the crystal lattice as it is manifested by the Kikuchi bands in a gnomonic projection. For a quantitative analysis using the Hilton net, the projection centre as the relative position of the signal source with respect to the detector plane needs to be known. Interplanar angles are accessible with a precision and accuracy which is estimated to be ≤0.3°. Angles between any directions, e.g. zone axes, are directly readable. Finally, for the rare case of an unknown projection-cen

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33

Nolze, G., C. Grosse, and A. Winkelmann. "Kikuchi pattern analysis of noncentrosymmetric crystals." Journal of Applied Crystallography 48, no. 5 (2015): 1405–19. http://dx.doi.org/10.1107/s1600576715014016.

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Different models of Kikuchi pattern formation are compared with respect to their applicability to noncentrosymmetric crystals, and the breakdown of Friedel's rule in experimental electron backscatter diffraction (EBSD) patterns is discussed. DifferentAIIIBVsemiconductor materials are used to evaluate the resulting asymmetry of Kikuchi band profiles for polar lattice planes. By comparison with the characteristic etch pit morphology on a single-crystal surface, the polar character of the measured lattice planes can be assigned absolutely. The presented approach enables point-group-resolved orien

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34

Basinger, Jay, David Fullwood, Josh Kacher, and Brent Adams. "Pattern Center Determination in Electron Backscatter Diffraction Microscopy." Microscopy and Microanalysis 17, no. 3 (2011): 330–40. http://dx.doi.org/10.1017/s1431927611000389.

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AbstractThe pattern center of an electron backscatter diffraction (EBSD) image indicates the relative position of the image with reference to the interaction volume of the sample. As interest grows in high-resolution EBSD techniques, accurate knowledge of this position is essential for precise interpretation of the EBSD features. In a typical EBSD framework, Kikuchi bands are recorded on a phosphor screen. If the flat phosphor were instead shaped as a sphere, with its center at the specimen's electron interaction volume, then the incident backscattered electrons would form Kikuchi bands on tha

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35

Schwarzer, R. A. "The Determination of Local Texture by Electron Diffraction–A Tutorial Review." Textures and Microstructures 20, no. 1-4 (1993): 7–27. http://dx.doi.org/10.1155/tsm.20.7.

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Electron diffraction methods are briefly reviewed for the determination of individual grain orientations and for the measurement of SAD pole figures. The standard techniques of orientation determination grain by grain using a TEM are the interpretation of selected area electron spot and microbeam Kikuchi diffraction patterns. Electron-transparent thin samples are required. Specimen regions smaller than 500 nm or 10 nm in diameter, respectively, can be studied. Alternatively, quantitative pole figures can be measured using a TEM from selected areas down to 0.5 μm in diameter.The orientations of

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36

Brodu, E., and E. Bouzy. "Complementarity of On-Axis Transmission Kikuchi Diffraction and Forward Scatter Diffraction Imaging in SEM." Microscopy and Microanalysis 24, S1 (2018): 612–13. http://dx.doi.org/10.1017/s1431927618003550.

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Reimer, L., and I. Fromm. "Electron spectroscopic diffraction at (111) silicon foils." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 382–83. http://dx.doi.org/10.1017/s0424820100153889.

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An electron diffraction pattern (EDP) consists of an overlap of patterns of all energy losses in the electron energy-loss spectrum (EELS). Electron spectroscopic diffraction (ESD) in an energy filtering electron microscope (EFEM) allows to separate the contributions of different energy losses to the unfiltered diagram observed in conventional TEM. We report about diffraction experiments with a Zeiss EM902 on (111) silicon foils which show how the EDP of single-crystal foils changes with increasing energy loss and foil thickness. An EDP normally contains the Bragg spots, diffuse streaks by elec

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38

Breen, Andrew J., Katharina Babinsky, Alec C. Day, et al. "Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data." Microscopy and Microanalysis 23, no. 2 (2017): 279–90. http://dx.doi.org/10.1017/s1431927616012605.

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AbstractCorrelative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline

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39

Sneddon, Glenn C., Patrick W. Trimby, and Julie M. Cairney. "Transmission Kikuchi diffraction in a scanning electron microscope: A review." Materials Science and Engineering: R: Reports 110 (December 2016): 1–12. http://dx.doi.org/10.1016/j.mser.2016.10.001.

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40

Erdman, Natasha, Masateru Shibata, Tara Nylese, and Travis Rampton. "Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction." Microscopy and Microanalysis 20, S3 (2014): 864–65. http://dx.doi.org/10.1017/s1431927614006047.

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41

Liu, Junliang, Sergio Lozano-Perez, Angus J. Wilkinson, and Chris R. M. Grovenor. "On the depth resolution of transmission Kikuchi diffraction (TKD) analysis." Ultramicroscopy 205 (October 2019): 5–12. http://dx.doi.org/10.1016/j.ultramic.2019.06.003.

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42

Fedchenko, O., A. Winkelmann, S. Chernov, et al. "Emitter-site specificity of hard x-ray photoelectron Kikuchi-diffraction." New Journal of Physics 22, no. 10 (2020): 103002. http://dx.doi.org/10.1088/1367-2630/abb68b.

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43

Karakhanyan, R. K., P. L. Aleksanyan, and Y. K. Manucharova. "On electron double diffraction in the formation of Kikuchi patterns." physica status solidi (a) 121, no. 1 (1990): K1—K3. http://dx.doi.org/10.1002/pssa.2211210142.

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44

Wright, S. I., and B. L. Adams. "Automated Lattice Orientation Determination From Electron Backscatter Kikuchi Diffraction Patterns." Textures and Microstructures 14 (1991): 273–78. http://dx.doi.org/10.1155/tsm.14-18.273.

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45

Chen, Yueyun, Jared Lodico, B. C. Regan, and Matthew Mecklenburg. "Determining Lattice Parameters by Curve-Fitting Transmission Kikuchi Diffraction Patterns." Microscopy and Microanalysis 27, S1 (2021): 2020–21. http://dx.doi.org/10.1017/s1431927621007340.

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46

Geiss, Roy H., Katherine P. Rice, and Robert R. Keller. "Transmission EBSD in the Scanning Electron Microscope." Microscopy Today 21, no. 3 (2013): 16–20. http://dx.doi.org/10.1017/s1551929513000503.

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We demonstrate in this article an exciting new method for obtaining electron Kikuchi diffraction patterns in transmission from thin specimens in a scanning electron microscope (SEM) fitted with a conventional electron backscattered diffraction (EBSD) detector. We have labeled the method transmission EBSD (t-EBSD) because it uses off-the-shelf commercial EBSD equipment to capture the diffraction patterns and also to differentiate it from transmission Kikuchi diffraction available in the transmission electron microscope (TEM). Lateral spatial resolution of less than 10 nm has been demonstrated f

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Schwarzer, Robert A., and Jarle Hjelen. "High-Speed Orientation Microscopy with Offline Solving Sequences of EBSD Patterns." Solid State Phenomena 160 (February 2010): 295–300. http://dx.doi.org/10.4028/www.scientific.net/ssp.160.295.

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A high speed in acquisition of backscatter Kikuchi patterns (BKP) and solving the stored raw patterns offline has many advantages over online EBSD. No compromise is made between speed and reliability. Automated backscatter Kikuchi diffraction in the scanning electron microscope (SEM) is about to become a tool for process and quality control. Mandatory requirements for these applications are measures to enable re-examination of the results at any time and a high speed. Therefore, fast acquisition of pattern sequences and off¬line indexing will soon become standard. Online pattern solving is opt

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Shen, Yitian, Jingchao Xu, Yongsheng Zhang, et al. "Spatial Resolutions of On-Axis and Off-Axis Transmission Kikuchi Diffraction Methods." Applied Sciences 9, no. 21 (2019): 4478. http://dx.doi.org/10.3390/app9214478.

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Spatial resolution is one of the key factors in orientation microscopy, as it determines the accuracy of grain size investigation and phase identification. We determined the spatial resolutions of on-axis and off-axis transmission Kikuchi diffraction (TKD) methods by calculating correlation coefficients using only the effective parts of on-axis and off-axis transmission Kikuchi patterns. During the calculation, we used average filtering to evaluate the spatial resolution more accurately. The spatial resolutions of both on-axis and off-axis TKD methods were determined in the same scanning elect

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Wright, S. I. "Automatic idexing of electron-backscatter diffraction patterns." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 598–99. http://dx.doi.org/10.1017/s0424820100170724.

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A typical Backscatter Kikuchi Diffraction pattern (BKD, also referred to in the literature as an EBSP or a BEKP) is shown in figure 1. Since the bands in the pattern represent planes in the diffracting volume, the lattice orientation can be determined from their geometrical arrangement. The task of correctly orienting a BKD can be broken into two parts: 1) finding the salient features in the pattern (either the diffraction bands or the intersections of the bands) and 2) using these features to determine the lattice orientation. Recent advances in feature detection in BKDs along with methods fo

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Zhu, Yimei, Hong Zhang, A. R. Moodenbaugh та M. Suenaga. "Dislocations in YBa2Cu3O7−δ (δ = 0.77)". Proceedings, annual meeting, Electron Microscopy Society of America 48, № 4 (1990): 72–73. http://dx.doi.org/10.1017/s0424820100173492.

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Abundant dislocations and dislocations associated with stacking faults were observed and characterized in YBa2Cu3O7−δ (δ= 0.77). The crystallographic orientation of the dislocation and the fault were analyzed using Kikuchi patterns matched with computer generated Kikuchi maps. The Burgers vector of the dislocation and the displacement vector of the fault were determined by using the g·b = 0 and g · R=0 criteria.Bulk samples of YBa2Cu3O7 were produced by standard pressing and sintering up to 970 °C. Samples were heated in air, then quenched into liquid nitrogen to reduce oxygen content. Subsequ

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