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Relevant bibliographies by topics / Laser metrology

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Academic literature on the topic 'Laser metrology'

Author: Grafiati

Published: 4 June 2021

Last updated: 12 February 2022

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Journal articles on the topic "Laser metrology"

1

Yamaguchi, Ichirou. "Laser metrology for industry." Review of Laser Engineering 24, Supplement (1996): 213–16. http://dx.doi.org/10.2184/lsj.24.supplement_213.

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Bikmukhametov, K. A., Yu D. Kolomnikov, B. S. Mogil'nitskii, and V. Ya Cherepanov. "Laser Metrology at SNIIM." Measurement Techniques 47, no. 8 (August 2004): 753–56. http://dx.doi.org/10.1023/b:mete.0000047690.22373.99.

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Mei, Zhong Yi, and Zhen Wei Luo. "Researching Metrology System on the Basis of Laser Tracker." Applied Mechanics and Materials 423-426 (September 2013): 2409–13. http://dx.doi.org/10.4028/www.scientific.net/amm.423-426.2409.

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A digital flexible assembly system is developed which is used to assemble one fuselage large component of a large aircraft. The laser tracking metrology system is the important part of the flexible assembly system. The metrology system is composed of three modules: laser tracking measurement module, data processing module, and real-time motion simulation module. The laser tracking measurement module is mainly completing the measurement functions of the laser tracker. Data processing module is the core module of the metrology system, and is responsible for all data computation and transmission in assembling and positioning the aircraft component. The real-time motion simulation module provides the three-dimensional scene simulation of the assembly to the users and gives the users a more intuitive understanding of the assembly process. This paper introduces the system structure and working principle of the developed metrology system which based on the laser tracker. The application of the metrology system and the flexible assembly system can greatly improve the assembly accuracy.

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Aketagawa, Masato. "Special Issue on Laser Metrology for Precision Measurement and Inspection in Industry." International Journal of Automation Technology 9, no. 5 (September 5, 2015): 465–59. http://dx.doi.org/10.20965/ijat.2015.p0465.

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Industrial production processes are becoming more difficult and complex because of the need to accept or react to global requirements for ecology, energy saving, downsizing, short lead times, information technology, etc. Metrology and inspection play very important roles in production processes because these must decide the final quality of manufactured industrial goods. Laser/optical metrology is widely used in industry to maintain meter definition traceability because it is, in principle, nondestructive. This makes laser metrology a candidate for use in final industrial inspection. This special issue originated in Laser Metrology for Precision Measurement and Inspection in Industry 2014 (LMPMI2014), also the 11th IMEKO symposium. LMPMI2014 covers a very wide area, including precision engineering, dimensional measurement, shape measurement, micro/meso/nano metrology, interferometry, and standards and calibration technology. This IJAT special issuefeatures papers selected from LMPMI2014. Advanced papers in this issue present the latest achievements in laser metrology ranging from basic research to actual industrial application. These papers should prove useful to readers seeking to share their industrial R&D knowledge and experience. The important contributions of the authors and reviewers are most deeply appreciated and make this issue both fascinating and its ideas far-reaching.

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DOWELL, MARLA. "Pulsed-Laser Metrology at NIST." Optics and Photonics News 12, no. 2 (February 1, 2001): 30. http://dx.doi.org/10.1364/opn.12.2.000030.

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Dalton, Graham. "Reverse engineering using laser metrology." Sensor Review 18, no. 2 (June 1998): 92–96. http://dx.doi.org/10.1108/02602289810209867.

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Hata, Seiichi. "Special Issue on Micro-Nano Materials and Processing." International Journal of Automation Technology 9, no. 6 (November 5, 2015): 611. http://dx.doi.org/10.20965/ijat.2015.p0611.

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Industrial production processes are becoming more difficult and complex because of the need to accept or react to global requirements for ecology, energy saving, downsizing, short lead times, information technology, etc. Metrology and inspection play very important roles in production processes because these must decide the final quality of manufactured industrial goods. Laser/optical metrology is widely used in industry to maintain meter definition traceability because it is, in principle, nondestructive. This makes laser metrology a candidate for use in final industrial inspection. This special issue originated in Laser Metrology for Precision Measurement and Inspection in Industry 2014 (LMPMI2014), also the 11th IMEKO symposium. LMPMI2014 covers a very wide area, including precision engineering, dimensional measurement, shape measurement, micro/meso/nano metrology, interferometry, and standards and calibration technology. This IJAT special issuefeatures papers selected from LMPMI2014. Advanced papers in this issue present the latest achievements in laser metrology ranging from basic research to actual industrial application. These papers should prove useful to readers seeking to share their industrial R&D knowledge and experience. The important contributions of the authors and reviewers are most deeply appreciated and make this issue both fascinating and its ideas far-reaching.

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ASAKURA, Toshimitsu. "Laser metrology 30 years. Development from old to modern optical metrology." Review of Laser Engineering 19, no. 1 (1991): 40–41. http://dx.doi.org/10.2184/lsj.19.40.

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de La Rochefoucauld, Ombeline, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Lei Huang, Xavier Levecq, Martin Piponnier, and Philippe Zeitoun. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging." Sensors 21, no. 3 (January 28, 2021): 874. http://dx.doi.org/10.3390/s21030874.

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For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.

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de Groot, Peter, Gregg Gallatin, George Gardopee, and Robert Dixon. "Laser feedback metrology of optical systems." Applied Optics 28, no. 13 (July 1, 1989): 2462. http://dx.doi.org/10.1364/ao.28.002462.

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Dissertations / Theses on the topic "Laser metrology"

1

Ortiz, Julio Enrique. "New millennium interferometer laser metrology testbed." Thesis, Massachusetts Institute of Technology, 1997. http://hdl.handle.net/1721.1/42639.

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Hines, Braden E. (Braden Eric). "Laser metrology system for stellar interferometry." Thesis, Massachusetts Institute of Technology, 1988. http://hdl.handle.net/1721.1/14769.

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Hospodar, Edward J. "A laser metrology system for precision pointing." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 2003. http://library.nps.navy.mil/uhtbin/hyperion-image/03Dec%5FHospodar.pdf.

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Thesis (M.S. in Astronautical Engineering)--Naval Postgraduate School, December 2003.
Thesis advisor(s): Brij N. Agrawal, Hong-Jen Chen. Includes bibliographical references (p. 63). Also available online.

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Dunmeyer, David Richard 1978. "Laser speckle modeling for three-dimensional metrology and LADAR." Thesis, Massachusetts Institute of Technology, 2001. http://hdl.handle.net/1721.1/16763.

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Thesis (M.Eng. and S.B.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
Includes bibliographical references (leaves 103-111).
This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections.
In this thesis, I developed three-dimensional laser-speckle models to help in the development process of three-dimensional optical-metrology imaging systems. These models were developed to aid in the proof of concept for various three-dimensional metrology techniques. These models were then compared to real-world imaging systems, developed by both the author and other staff at the MIT Lincoln Laboratory, to determine their ability to accurately model said imaging systems. I also looked at the laser speckle statistics associated with mid-field systems in an exo-atmospheric environment as they relate to LADAR.
by David Richard Dunmeyer.
M.Eng.and S.B.

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Oram, Richard Joseph. "An investigation of the frequency stability and passive ultra low thermal expansion glass ceramic optical cavities." Thesis, University of Newcastle Upon Tyne, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.304656.

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Barwood, Geoffrey P. "Frequency stabilised laser diodes and their use in length metrology." Thesis, University of Kent, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.314498.

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Dacasa, Pereira Hugo. "Spatial and temporal metrology of coherent ultrashort pulses inthe extreme-ultraviolet domain." Thesis, Université Paris-Saclay (ComUE), 2017. http://www.theses.fr/2017SACLX041/document.

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Les impulsions ultra-brèves de rayonnement ultraviolet extrême (UVX) ont un grand champ d’application dans les domaines tels que le diagnostic de plasmas, la spectroscopie ou l’étude de la dynamique ultrarapide dans les atomes et les molécules.Aujourd’hui, il existe trois sources délivrant ce genre d’impulsions. Les harmoniques d’ordre élevé (HHG, en anglais) générés dans les gaz rares ou sur les solides peuvent fournir des impulsions attosecondes. Cependant, leur énergie, le plus souvent de l’ordre du nanojoule, limite les applications. L’amplification des impulsions harmoniques dans les plasmas créés par laser (SXRL, en anglais) a démontré pouvoir fournir des énergies de plusieurs dizaines de microjoules. Des énergies plus élevées peuvent être obtenues avec les lasers à électrons libres (LEL) UVX injectés, mais ce sont des Très Grandes Infrastructures ayant un accès limité.Ces dernières années, des progrès significatifs ont été réalisé avec chacune des ces sources, avec pour objectif la génération d’impulsions plus brèves. Il est devenu nécessaire de développer des nouvelles techniques de métrologie temporelle des impulsions UVX ultra-brèves. De plus, beaucoup d’expériences, comme ceux impliquant des phénomènes non-linéaires, nécessitent de hautes intensités UVX. La focalisation efficace des impulsions de faibles énergies peut significativement augmenter le domaine d’application. De bons fronts d’onde sont nécessaires pour focaliser les impulsions UVX à haute intensité, et les optiques doivent aussi être de bonne qualité et alignées avec précision.Dans cette thèse, les propriétés spatiales des harmoniques d’ordre élevé ont été extensivement étudiées grâce à un senseur de front d’onde UVX. Cet appareil couplé à une source HHG a démontré être utile pour la caractérisation de table et à la longueur d’onde ainsi que pour l’optimisation de systèmes optiques UVX.Le problème de la mise en place de la complète caractérisation temporelle d’impulsions UVX est aussi discuté en détail, et deux nouveaux schémas pour la reconstruction d’impulsions de LEL injectés et de lasers X à plasma sont présentés. Finalement, la première implantation d’un système d’amplification à dérive de fréquence (CPA, en anglais) sur un LEL UVX est présentée et son implantation pour les lasers X à plasmas est aussi discutée
Ultrashort pulses of extreme-ultraviolet (XUV) radiation have a wide range of applications in fields such as plasma probing, spectroscopy, or the study of ultrafast dynamics in atoms and molecules.Nowadays, there are three main sources of such pulses. High-order harmonic generation (HHG) in rare gases or solid surfaces is able to provide attosecond pulses. However, their limited energy, of the order of nanojoules, limits its number of applications. The amplification of high-harmonic pulses in laser-driven plasmas (SXRL) has been demonstrated to provide energies of tens of microjules. Higher pulse energies can be obtained from seeded XUV free-electron lasers (FELs), large-scale facilities with more limited accessibility.In recent years, significant progress has been made with each of these sources towards the generation of shorter pulses. It is thus necessary to develop new techniques for full temporal metrology of ultrashort XUV pulses. Additionally, many experiments, such as those involving nonlinear phenomena, require high XUV intensities. Efficient focusing of low-energy pulses can significantly increase their range of application. Good wavefronts are required in order to focus XUV pulses to high intensities, and the optics must be of high quality and precisely aligned.In this thesis, the spatial properties of high-harmonic pulses are extensively explored thanks to the use of an XUV Hartmann wavefront sensor. This device is also proven here to be useful for tabletop, at-wavelength characterization and optimization of XUV optical systems with HHG sources.The problem of performing full temporal characterization of XUV pulses is also discussed in detail, and two new schemes for complete pulse reconstruction for seeded XUV FELs and seeded SXRLs are presented. Finally, the first implementation of chirped pulse amplification (CPA) in a seeded XUV FEL is reported, and its implementation in seeded SXRLs is discussed as well

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Deprez, Maxime. "Moyen de métrologie pour la conception et l’évaluation de chaines lasers hyper intenses utilisant la recombinaison cohérente de lasers élémentaires." Thesis, Université Paris-Saclay (ComUE), 2018. http://www.theses.fr/2018SACLS241/document.

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La nécessité de la montée en puissance, crête et moyenne, des chaines lasers hyper intenses a fait émerger un nouveau type d'architecture. Le principe consiste à combiner de manière cohérente un grand nombre de lasers élémentaires les plus simples et robustes possible. La difficulté de la montée en puissance est donc reportée essentiellement sur le système de recombinaison. Plusieurs laboratoires à travers le monde ont ainsi décidé de s'impliquer dans cette voie. S'il existe des concepts variés pour la boucle d'asservissement, il n'y a pas pour l'instant, à notre connaissance, de développement d'un moyen de métrologie absolue de la qualité du front d'onde final, et donc de la recombinaison. Or celui-ci est fondamental pour deux moments particuliers de la conception de ces nouvelles architectures.Dans un premier temps, il est nécessaire de connaître la nature, l'amplitude et la fréquence des défauts de phase en boucle ouverte afin de bien spécifier l'architecture de la tête optique et le système de contrôle/commande. Puis, lorsque la chaîne est pleinement opérationnelle, en boucle fermée, la qualité de la recombinaison doit être évaluée. L'objet de cette thèse est de proposer un nouvel interféromètre adapté à ces deux besoins, c'est-à-dire capable d'encaisser de fortes dynamiques et d'avoir en même temps des capacités de mesure absolue de très grandes précision et justesse, à haute cadence, afin de mesurer et d'analyser le front d'onde résultant de la combinaison des différents lasers sur toute la phase de conception de ces lasers, en boucle ouverte comme en boucle fermée
The need for the rise in power, peak and medium, of hyper intense laser chains has led to the emergence of a new type of architecture. The principle is to consistently combine a large number of the simplest and most robust elementary lasers possible. The difficulty of ramping up is therefore mainly transferred to the recombination system. Several laboratories around the world have thus decided to get involved in this path. If there are various concepts for the servo loop, there is currently, to our knowledge, no development of a means of absolute metrology of the quality of the final wavefront, and therefore of recombination. This is fundamental for two particular moments in the design of these new architectures.First, it is necessary to know the nature, amplitude and frequency of open loop phase faults in order to properly specify the optical head architecture and the control/command system. Then, when the chain is fully operational, in closed loop, the quality of the recombination must be evaluated. The purpose of this thesis is to propose a new interferometer adapted to these two needs, i.e. capable of withstanding strong dynamics and at the same time having absolute measurement capabilities of very high precision and accuracy, at high cadence, in order to measure and analyze the wavefront resulting from the combination of the different lasers over the entire design phase of these lasers, in open loop as in closed loop

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Junior, Jair De Martin. "Sistema de laser de diodo de cavidade estendida para padrões de frequência." Universidade de São Paulo, 2013. http://www.teses.usp.br/teses/disponiveis/18/18149/tde-29052014-144230/.

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Este trabalho tem como objetivo principal desenvolver uma nova fonte de laser de diodo compacta e robusta, além de um novo drive de controle para serem utilizados em padrões primário de tempo e frequência tipo chafariz de átomo de Césio e padrões compacto baseados em átomos frios. Um dos requisitos para utilização de laser de diodo em padrões primários de tempo e frequência é sua estabilidade em frequência e baixíssimo ruído espectral. Além disto, dada à aplicação embarcada, o laser deve ser extremamente robusto com relação às condições adversas: mecânicas, térmicas e elétricas. Tanto a parte optomecânica, quanto os controles eletrônicos do novo laser foram desenvolvidos neste trabalho. Vale salientar que tal sistema, em sua concepção, é de grande interesse para diversos outros tipos de aplicação, como espectroscopia de gases (LIDAR), referências em outras frequências e experimentos de física atômica e molecular, que possuem elevados níveis de exigência com relação a ruídos espectrais.
This work has as main objective to develop a new source of diode laser compact and robust, beyond a new drive control for use in primary of time and frequency standards type cesium atom fountain and compact standards-based cold atoms. One of the requirements for the use of diode laser in primary of time and frequency standards are their stability in frequency and are very low spectral noise. Furthermore, given the embedded application, the laser must be extremely robust with respect to adverse conditions: mechanical, thermal and electrical. Both opto-mechanical part, as the electronic controls of the new laser were developed in this work. It is noteworthy that such a system, in its conception, is of great interest to many other types of applications such as spectroscopy of gases (LIDAR), references in other frequencies and experiments of atomic and molecular physics, which have high levels of demand with respect to spectral noise.

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Lee, Woei Ming. "Optical trapping : optical interferometric metrology and nanophotonics." Thesis, St Andrews, 2010. http://hdl.handle.net/10023/882.

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Books on the topic "Laser metrology"

1

International Conference on Laser Metrology and Machine Performance (1993 Southampton Institute). Laser metrology and machine performance. Edited by Blackshaw D. M. S, Hope A. D, and Smith Graham T. 1947-. Southampton: Computational Mechanics Publications, 1993.

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Boutier, Alain, ed. Laser Metrology in Fluid Mechanics. Hoboken, NJ USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118576847.

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International Conference on Laser Metrology and Machine Performance (2nd 1995 Southampton, England). Laser metrology and machine performance II. Edited by Hope A. D, Smith Graham T. 1947-, Blackshaw D. M. S, and Southampton Institute (Southampton England). Southampton: Computational Mechanics Publications, 1995.

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International, Conference on Laser Metrology Machine Tool CMM and Robot Performance (6th 2003 University of Huddersfield). Laser metrology and machine performance VI. Southampton: WIT, 2003.

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Hybrid phase unwrapping in laser speckle interferometry with overlapping windows. Aachen: Shaker, 2004.

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Schwarz, Oliver. Hybrid phase unwrapping in laser speckle interferometry with overlapping windows. Aachen: Shaker, 2004.

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International Conference on Laser Applications and Optical Metrology (2003 New Delhi, India). Proceedings of International Conference on Laser Applications and Optical Metrology. Edited by Shakher Chandra, Mehta D. S, and Indian Institute of Technology, Delhi. New Delhi: Indian Institute of Technology, 2004.

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V, Chugui Yuri, Institut lazernoĭ fiziki SO RAN, TDI SIE--Technological Design Institute of Scientific Instrument Engineering (Russia), and Society of Photo-optical Instrumentation Engineers, eds. Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life: 9-13 September 2002, Novosibirsk, Russia. Bellingham, Wash: SPIE, International Society for Optical Engineering, 2002.

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International Symposium on Laser Metrology (8th 2005 Merida, Yucatan, Mexico). Eighth International Symposium on Laser Metrology: Macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. Edited by Rodriguez-Vera R, Mendoza-Santoyo F, Centro de Investigaciones en Optica (León, Guanajuato, Mexico), International Measurement Confederation. Technical Committee on Measurement of Geometrical Quantities., and Society of Photo-optical Instrumentation Engineers. Bellingham, Wash: SPIE, 2005.

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Assoufid, Lahsen. Advances in metrology for x-ray and EUV optics III: 1-2 August 2010, San Diego, California, United States. Edited by SPIE (Society). Bellingham, Wash: SPIE, 2010.

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Book chapters on the topic "Laser metrology"

1

Schulz-DuBois, E. O. "Laser Velocimetry." In Optical Metrology, 88–100. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_9.

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Soares, O. D. D., and A. O. S. Gomes. "Laser Dimensional Metrology." In Optical Metrology, 24–58. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_4.

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Wickramasinghe, H. K. "Laser Heterodyne Probes." In Optical Metrology, 84–85. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_7.

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Agostini, Pierre, Andrew J. Piper, and Louis F. DiMauro. "Attosecond Metrology." In Handbook of Laser Technology and Applications, 307–20. 2nd ed. 2nd edition. | Boca Raton : CRC Press, 2021- |: CRC Press, 2021. http://dx.doi.org/10.1201/b21828-21.

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Kardestuncer, Hayrettin, and Ryszard J. Pryputniewicz. "Unification of FEM with Laser Experimentation." In Optical Metrology, 365–92. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_25.

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Siddall, Graham J., and Richard R. Baldwin. "Some Recent Developments in Laser Interferometry." In Optical Metrology, 69–83. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_6.

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Smith, Graham T. "Laser Instrumentation and Calibration." In Machine Tool Metrology, 201–77. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-25109-7_2.

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Ennos, A. E. "Measurement of Surface Form by Laser Profilometry." In Optical Metrology, 13–19. Dordrecht: Springer Netherlands, 1987. http://dx.doi.org/10.1007/978-94-009-3609-6_2.

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Halliwell, N. A. "Laser vibrometry." In Optical Methods in Engineering Metrology, 179–211. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1564-3_6.

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Most, Jean-Michel. "Laser Safety." In Laser Metrology in Fluid Mechanics, 307–20. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118576847.ch6.

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Conference papers on the topic "Laser metrology"

1

Nürnberg, F., B. Kühn, and K. Rollmann. "Metrology of fused silica." In SPIE Laser Damage, edited by Greg J. Exarhos, Vitaly E. Gruzdev, Joseph A. Menapace, Detlev Ristau, and MJ Soileau. SPIE, 2016. http://dx.doi.org/10.1117/12.2242487.

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Zhao, Yuan'an, Guohang Hu, Zhen Cao, Shijie Liu, Meiping Zhu, and Jianda Shao. "High precision laser photometer for laser optics." In SPIE Optical Metrology, edited by Peter Lehmann, Wolfgang Osten, and Armando Albertazzi Gonçalves. SPIE, 2017. http://dx.doi.org/10.1117/12.2270075.

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Walmsley, I. A. "Attosecond metrology." In Quantum Electronics and Laser Science (QELS). Postconference Digest. IEEE, 2003. http://dx.doi.org/10.1109/qels.2003.238325.

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Asmus, John F. "Antimatter, clockwork orange, laser divestment." In Optical Metrology, edited by Renzo Salimbeni and Luca Pezzati. SPIE, 2005. http://dx.doi.org/10.1117/12.611742.

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Beghuin, D., M. vandeVen, M. Ameloot, D. Claessens, and P. Van Oostveldt. "Compact laser scanning confocal microscope." In Optical Metrology, edited by Heidi Ottevaere, Peter DeWolf, and Diederik S. Wiersma. SPIE, 2005. http://dx.doi.org/10.1117/12.611819.

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Asmus, John F., and Meg Abraham. "Laser dusting of delicate objects." In Optical Metrology, edited by Renzo Salimbeni and Luca Pezzati. SPIE, 2005. http://dx.doi.org/10.1117/12.612461.

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Rzepka, Janusz, Grzegorz Budzyn, Wojciech Fraczek, and Marcin Bielenin. "Zeeman laser for straightness measurements." In Optical Metrology, edited by Wolfgang Osten, Christophe Gorecki, and Erik L. Novak. SPIE, 2005. http://dx.doi.org/10.1117/12.612658.

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An, Xin, David S. Marx, Renaud Goullioud, and Feng Zhao. "Laser metrology in the micro-arcsecond metrology testbed." In Photonics Asia 2004, edited by Yun-Jiang Rao, Osuk Y. Kwon, and Gang-Ding Peng. SPIE, 2005. http://dx.doi.org/10.1117/12.580030.

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Miller, Anthony, Andrew Silberfarb, Orion Crisafulli, and Hideo Mabuchi. "Quantum Metrology with Cold Atomic Ensembles." In Laser Science. Washington, D.C.: OSA, 2008. http://dx.doi.org/10.1364/ls.2008.lthc2.

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Azarova, Valentina V., N. A. Efremova, Vaytcheslav N. Svirin, and V. A. Sharov. "Precision laser element metrology." In International Conference on Applied Optical Metrology, edited by Pramod K. Rastogi and Ferenc Gyimesi. SPIE, 1998. http://dx.doi.org/10.1117/12.323371.

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Reports on the topic "Laser metrology"

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H.W. Kugel, D. Loesser, A. L. Roquemore, M. M. Menon, and R. E. Barry. Precision metrology of NSTX surfaces using coherent laser radar ranging. Office of Scientific and Technical Information (OSTI), July 2000. http://dx.doi.org/10.2172/758241.

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Siders, C., J. Crane, V. Semenov, S. Betts, B. Kozioziemski, K. Wharton, S. Wilks, et al. High Brightness, Laser-Driven X-ray Source for Nanoscale Metrology and Femtosecond Dynamics. Office of Scientific and Technical Information (OSTI), February 2007. http://dx.doi.org/10.2172/902319.

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Nef, Evan, and Devin Imholte. SOW-14532 Advanced Test Reactor Non-Destructive Examination System (ANDES) Underwater Laser Metrology Support. Office of Scientific and Technical Information (OSTI), January 2018. http://dx.doi.org/10.2172/1466995.

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Rocca, Jorge J. Development of a Discharge Pumped 13 nm Laser for Metrology of Projection Lithography Optics at the Manufacture-Site. Fort Belvoir, VA: Defense Technical Information Center, September 2003. http://dx.doi.org/10.21236/ada422274.

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