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Journal articles on the topic 'Laser metrology'

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Published: 4 June 2021
Last updated: 12 February 2022

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1

Yamaguchi, Ichirou. "Laser metrology for industry." Review of Laser Engineering 24, Supplement (1996): 213–16. http://dx.doi.org/10.2184/lsj.24.supplement_213.

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2

Bikmukhametov, K. A., Yu D. Kolomnikov, B. S. Mogil'nitskii, and V. Ya Cherepanov. "Laser Metrology at SNIIM." Measurement Techniques 47, no. 8 (August 2004): 753–56. http://dx.doi.org/10.1023/b:mete.0000047690.22373.99.

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3

Mei, Zhong Yi, and Zhen Wei Luo. "Researching Metrology System on the Basis of Laser Tracker." Applied Mechanics and Materials 423-426 (September 2013): 2409–13. http://dx.doi.org/10.4028/www.scientific.net/amm.423-426.2409.

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A digital flexible assembly system is developed which is used to assemble one fuselage large component of a large aircraft. The laser tracking metrology system is the important part of the flexible assembly system. The metrology system is composed of three modules: laser tracking measurement module, data processing module, and real-time motion simulation module. The laser tracking measurement module is mainly completing the measurement functions of the laser tracker. Data processing module is the core module of the metrology system, and is responsible for all data computation and transmission in assembling and positioning the aircraft component. The real-time motion simulation module provides the three-dimensional scene simulation of the assembly to the users and gives the users a more intuitive understanding of the assembly process. This paper introduces the system structure and working principle of the developed metrology system which based on the laser tracker. The application of the metrology system and the flexible assembly system can greatly improve the assembly accuracy.
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4

Aketagawa, Masato. "Special Issue on Laser Metrology for Precision Measurement and Inspection in Industry." International Journal of Automation Technology 9, no. 5 (September 5, 2015): 465–59. http://dx.doi.org/10.20965/ijat.2015.p0465.

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Industrial production processes are becoming more difficult and complex because of the need to accept or react to global requirements for ecology, energy saving, downsizing, short lead times, information technology, etc. Metrology and inspection play very important roles in production processes because these must decide the final quality of manufactured industrial goods. Laser/optical metrology is widely used in industry to maintain meter definition traceability because it is, in principle, nondestructive. This makes laser metrology a candidate for use in final industrial inspection. This special issue originated in Laser Metrology for Precision Measurement and Inspection in Industry 2014 (LMPMI2014), also the 11th IMEKO symposium. LMPMI2014 covers a very wide area, including precision engineering, dimensional measurement, shape measurement, micro/meso/nano metrology, interferometry, and standards and calibration technology. This IJAT special issuefeatures papers selected from LMPMI2014. Advanced papers in this issue present the latest achievements in laser metrology ranging from basic research to actual industrial application. These papers should prove useful to readers seeking to share their industrial R&D knowledge and experience. The important contributions of the authors and reviewers are most deeply appreciated and make this issue both fascinating and its ideas far-reaching.
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5

DOWELL, MARLA. "Pulsed-Laser Metrology at NIST." Optics and Photonics News 12, no. 2 (February 1, 2001): 30. http://dx.doi.org/10.1364/opn.12.2.000030.

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6

Dalton, Graham. "Reverse engineering using laser metrology." Sensor Review 18, no. 2 (June 1998): 92–96. http://dx.doi.org/10.1108/02602289810209867.

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7

Hata, Seiichi. "Special Issue on Micro-Nano Materials and Processing." International Journal of Automation Technology 9, no. 6 (November 5, 2015): 611. http://dx.doi.org/10.20965/ijat.2015.p0611.

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Industrial production processes are becoming more difficult and complex because of the need to accept or react to global requirements for ecology, energy saving, downsizing, short lead times, information technology, etc. Metrology and inspection play very important roles in production processes because these must decide the final quality of manufactured industrial goods. Laser/optical metrology is widely used in industry to maintain meter definition traceability because it is, in principle, nondestructive. This makes laser metrology a candidate for use in final industrial inspection. This special issue originated in Laser Metrology for Precision Measurement and Inspection in Industry 2014 (LMPMI2014), also the 11th IMEKO symposium. LMPMI2014 covers a very wide area, including precision engineering, dimensional measurement, shape measurement, micro/meso/nano metrology, interferometry, and standards and calibration technology. This IJAT special issuefeatures papers selected from LMPMI2014. Advanced papers in this issue present the latest achievements in laser metrology ranging from basic research to actual industrial application. These papers should prove useful to readers seeking to share their industrial R&D knowledge and experience. The important contributions of the authors and reviewers are most deeply appreciated and make this issue both fascinating and its ideas far-reaching.
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8

ASAKURA, Toshimitsu. "Laser metrology 30 years. Development from old to modern optical metrology." Review of Laser Engineering 19, no. 1 (1991): 40–41. http://dx.doi.org/10.2184/lsj.19.40.

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9

de La Rochefoucauld, Ombeline, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Lei Huang, Xavier Levecq, Martin Piponnier, and Philippe Zeitoun. "EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging." Sensors 21, no. 3 (January 28, 2021): 874. http://dx.doi.org/10.3390/s21030874.

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For more than 15 years, Imagine Optic have developed Extreme Ultra Violet (EUV) and X-ray Hartmann wavefront sensors for metrology and imaging applications. These sensors are compatible with a wide range of X-ray sources: from synchrotrons, Free Electron Lasers, laser-driven betatron and plasma-based EUV lasers to High Harmonic Generation. In this paper, we first describe the principle of a Hartmann sensor and give some key parameters to design a high-performance sensor. We also present different applications from metrology (for manual or automatic alignment of optics), to soft X-ray source optimization and X-ray imaging.
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10

de Groot, Peter, Gregg Gallatin, George Gardopee, and Robert Dixon. "Laser feedback metrology of optical systems." Applied Optics 28, no. 13 (July 1, 1989): 2462. http://dx.doi.org/10.1364/ao.28.002462.

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11

Zaidi, Zain, Vala Fathipour, Xiangli Jia, and Connie Chang-Hasnain. "Wavelength-Demultiplexed Laser Interferometry for Metrology." IEEE Photonics Journal 13, no. 1 (February 2021): 1–9. http://dx.doi.org/10.1109/jphot.2020.3044969.

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12

Nicklaus, K., S. Cesare, L. Massotti, L. Bonino, S. Mottini, M. Pisani, and P. Silvestrin. "Laser metrology concept consolidation for NGGM." CEAS Space Journal 12, no. 3 (June 27, 2020): 313–30. http://dx.doi.org/10.1007/s12567-020-00324-6.

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13

Elias, Nicholas M., and Donald J. Hutter. "The Baseline Metrology System of the USNO Astrometric Interferometer." Symposium - International Astronomical Union 158 (1994): 174–76. http://dx.doi.org/10.1017/s007418090010751x.

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The USNO Astrometric Interferometer (USNOAI; a subarray of the Navy Prototype Optical Interferometer at Lowell Observatory) is presently under construction and expected to begin limited operations within a year. The main goal of the USNOAI observations is to provide a northern hemisphere catalog of several thousand stars with positions known to a few mas. In order to meet this requirement, a baseline laser metrology system must be employed to measure the three-dimensional motions of the baselines with an accuracy better than ~ 0.1 μm. The metrology scheme, as presently conceived, represents the largest and most complex high-resolution laser metrology system ever attempted.
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14

Fiorani, Luca, Florinda Artuso, Isabella Giardina, Antonia Lai, Simone Mannori, and Adriana Puiu. "Photoacoustic Laser System for Food Fraud Detection." Sensors 21, no. 12 (June 18, 2021): 4178. http://dx.doi.org/10.3390/s21124178.

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Economically motivated adulterations of food, in general, and spices, in particular, are an emerging threat to world health. Reliable techniques for the rapid screening of counterfeited ingredients in the supply chain need further development. Building on the experience gained with CO2 lasers, the Diagnostic and Metrology Laboratory of ENEA realized a compact and user-friendly photoacoustic laser system for food fraud detection, based on a quantum cascade laser. The sensor has been challenged with saffron adulteration. Multivariate data analysis tools indicated that the photoacoustic laser system was able to detect adulterants at mass ratios of 2% in less than two minutes.
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15

Jones, Tyler B., Nils Otterstrom, Jarom Jackson, James Archibald, and Dallin S. Durfee. "Laser wavelength metrology with color sensor chips." Optics Express 23, no. 25 (December 9, 2015): 32471. http://dx.doi.org/10.1364/oe.23.032471.

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16

Liang, Wei, Vladimir S. Ilchenko, Danny Eliyahu, Elijah Dale, Anatoliy A. Savchenkov, David Seidel, Andrey B. Matsko, and Lute Maleki. "Compact stabilized semiconductor laser for frequency metrology." Applied Optics 54, no. 11 (April 8, 2015): 3353. http://dx.doi.org/10.1364/ao.54.003353.

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17

Oechsner, Ulrich, Christian Knothe, Mats Rahmel, and Michael Schulz. "Laser Sources for Metrology and Machine Vision." Optik & Photonik 11, no. 2 (April 2016): 31–34. http://dx.doi.org/10.1002/opph.201600015.

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18

Yatsunenko, S., and M. Fabich. "3D Laser Microscopy for Nanotechnology and Metrology." Acta Physica Polonica A 116, Supplement (December 2009): S—194—S—195. http://dx.doi.org/10.12693/aphyspola.116.s-194.

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19

Kenny, Emer, Davis Coakley, and Gerard Boyle. "Ocular microtremor measurement using laser-speckle metrology." Journal of Biomedical Optics 18, no. 1 (January 11, 2013): 016010. http://dx.doi.org/10.1117/1.jbo.18.1.016010.

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20

Bonino, Luciana, Stefano Cesare, Luca Massotti, Sergio Mottini, Kolja Nicklaus, Marco Pisani, and Pierluigi Silvestrin. "Laser metrology for next generation gravity mission." IEEE Instrumentation & Measurement Magazine 20, no. 6 (December 2017): 16–21. http://dx.doi.org/10.1109/mim.2017.8121946.

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21

Oh, Jeong Seok, and Seung-Woo Kim. "Femtosecond laser pulses for surface-profile metrology." Optics Letters 30, no. 19 (October 1, 2005): 2650. http://dx.doi.org/10.1364/ol.30.002650.

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22

Dubrov, M. N., M. T. Prilepin, and V. A. Aleshin. "Laser interferometers in metrology of large lengths." Measurement Techniques 33, no. 5 (May 1990): 445–46. http://dx.doi.org/10.1007/bf00864428.

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23

Schmitt, Robert, Tilo Pfeifer, and Guilherme Mallmann. "Machine integrated telecentric surface metrology in laser structuring systems." ACTA IMEKO 2, no. 2 (January 15, 2014): 73. http://dx.doi.org/10.21014/acta_imeko.v2i2.106.

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The laser structuring is an innovative technology used in a broad spectrum of industrial branches. There is, however, a market trend to smaller and more accurate micro structures, which demands a higher level of precision and efficiency in this process. In this terms, an inline inspection is necessary, in order to improve the process through a closed-loop control and early defect detection. Within this paper an optical measurement system for inline inspection of micro and macro surface structures is described. Measurements on standards and laser structured surfaces are presented, which underline the potential of this technique for inline surface inspection of laser structured surfaces.
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24

Droste, Stefan, Gabriel Ycas, Brian R. Washburn, Ian Coddington, and Nathan R. Newbury. "Optical Frequency Comb Generation based on Erbium Fiber Lasers." Nanophotonics 5, no. 2 (June 1, 2016): 196–213. http://dx.doi.org/10.1515/nanoph-2016-0019.

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AbstractOptical frequency combs have revolutionized optical frequency metrology and are being actively investigated in a number of applications outside of pure optical frequency metrology. For reasons of cost, robustness, performance, and flexibility, the erbium fiber laser frequency comb has emerged as the most commonly used frequency comb system and many different designs of erbium fiber frequency combs have been demonstrated. We review the different approaches taken in the design of erbium fiber frequency combs, including the major building blocks of the underlying mode-locked laser, amplifier, supercontinuum generation and actuators for stabilization of the frequency comb.
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25

Негрійко, А. М., І. В. Мацнєв, В. М. Ходаковський, and Л. П. Яценко. "Narrow optical resonances In laser spectroscopy ana metrology." Scientific Herald of Uzhhorod University.Series Physics 34 (November 25, 2013): 189–93. http://dx.doi.org/10.24144/2415-8038.2013.34.189-193.

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26

Otsuka, Kenju. "Self-Mixing Thin-Slice Solid-State Laser Metrology." Sensors 11, no. 2 (February 15, 2011): 2195–245. http://dx.doi.org/10.3390/s110202195.

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27

Hoga, Morihisa. "Metrology using laser in lithography of semiconductor industry." Review of Laser Engineering 27, Supplement (1999): 104–5. http://dx.doi.org/10.2184/lsj.27.supplement_104.

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28

Dudderar, T. D., R. Meynart, and P. G. Simpkins. "Full-field laser metrology for fluid velocity measurement." Optics and Lasers in Engineering 9, no. 3-4 (January 1988): 163–99. http://dx.doi.org/10.1016/s0143-8166(98)90002-1.

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29

Hong, Mina, and Guangnan Meng. "Laser Scanning Confocal Microscopy 3D Surface Metrology Applications." Microscopy and Microanalysis 24, S1 (August 2018): 1140–41. http://dx.doi.org/10.1017/s1431927618006189.

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30

Schuldt, Thilo, Martin Gohlke, Dennis Weise, Ulrich Johann, Achim Peters, and Claus Braxmaier. "Compact Laser Interferometer for Translation and Tilt Metrology." International Journal of Optomechatronics 1, no. 2 (June 7, 2007): 168–79. http://dx.doi.org/10.1080/15599610701385537.

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31

Plankensteiner, D., J. Schachenmayer, H. Ritsch, and C. Genes. "Laser noise imposed limitations of ensemble quantum metrology." Journal of Physics B: Atomic, Molecular and Optical Physics 49, no. 24 (November 22, 2016): 245501. http://dx.doi.org/10.1088/0953-4075/49/24/245501.

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32

Chiu, Chia-Pin, James G. Maveety, and Quan A. Tran. "Characterization of solder interfaces using laser flash metrology." Microelectronics Reliability 42, no. 1 (January 2002): 93–100. http://dx.doi.org/10.1016/s0026-2714(01)00129-9.

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33

Canut, J. A., F. Dalmases, J. L. Gandia, and R. Salvador. "Effects of maxillary protraction determined by laser metrology." European Journal of Orthodontics 12, no. 3 (August 1, 1990): 340–45. http://dx.doi.org/10.1093/ejo/12.3.340.

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34

Muñoz-Rodríguez, J. Apolinar. "Shape connection by pattern recognition and laser metrology." Applied Optics 47, no. 20 (July 3, 2008): 3590. http://dx.doi.org/10.1364/ao.47.003590.

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35

Toensmeier, Patrick A. "Laser Metrology Can Increase Production Efficiency and Economy." Plastics Engineering 63, no. 5 (May 2007): 52–53. http://dx.doi.org/10.1002/j.1941-9635.2007.tb00116.x.

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36

Lau, K., R. J. Hocken, and W. C. Haight. "Automatic laser tracking interferometer system for robot metrology." Precision Engineering 8, no. 1 (January 1986): 3–8. http://dx.doi.org/10.1016/0141-6359(86)90002-4.

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37

Sommargren, G. E. "A new laser measurement system for precision metrology." Precision Engineering 9, no. 4 (October 1987): 179–84. http://dx.doi.org/10.1016/0141-6359(87)90075-4.

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38

Ivanov, T. I., E. J. Salumbides, M. O. Vieitez, P. C. Cacciani, C. A. de Lange, and W. Ubachs. "Extreme-ultraviolet laser metrology of O i transitions." Monthly Notices of the Royal Astronomical Society: Letters 389, no. 1 (September 1, 2008): L4—L7. http://dx.doi.org/10.1111/j.1745-3933.2008.00507.x.

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39

Hei, Kefei, Guang Shi, Andreas Hansel, Zhongwen Deng, Sylwester Latkowski, Steven A. Van den Berg, Erwin Bente, and Nandini Bhattacharya. "Distance Metrology With Integrated Mode-Locked Ring Laser." IEEE Photonics Journal 11, no. 6 (December 2019): 1–10. http://dx.doi.org/10.1109/jphot.2019.2940068.

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40

Smith, Kevin B., and Yuan F. Zheng. "Point Laser Triangulation Probe Calibration for Coordinate Metrology." Journal of Manufacturing Science and Engineering 122, no. 3 (October 1, 1999): 582–86. http://dx.doi.org/10.1115/1.1286256.

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Point Laser Triangulation (PLT) probes have significant advantages over traditional touch probes. These advantages include throughput and no contact force, which motivate use of PLT probes on Coordinate Measuring Machines (CMMs). This document addresses the problem of extrinsic calibration. We present a precise technique for calibrating a PLT probe to a CMM. This new method uses known information from a localized polyhedron and measurements taken on the polyhedron by the PLT probe to determine the calibration parameters. With increasing interest in applying PLT probes for point measurements in coordinate metrology, such a calibration method is needed. [S1087-1357(00)01703-2]
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41

Privalov, V. E. "Use of He-Ne/I2 laser in metrology." Measurement Techniques 29, no. 9 (September 1986): 825–30. http://dx.doi.org/10.1007/bf00863287.

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42

Neumann, B., A. Dämon, D. Hogenkamp, E. Beckmann, and J. Kollmann. "A laser-autofocus for automatic microscopy and metrology." Sensors and Actuators 17, no. 1-2 (May 1989): 267–72. http://dx.doi.org/10.1016/0250-6874(89)80090-3.

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43

Ruiz-Lopez, M., A. Faenov, T. Pikuz, N. Ozaki, A. Mitrofanov, B. Albertazzi, N. Hartley, et al. "Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis." Journal of Synchrotron Radiation 24, no. 1 (January 1, 2017): 196–204. http://dx.doi.org/10.1107/s1600577516016568.

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Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and applied, which allowed an efficient and detailed beamline characterization at the SACLA XFEL. So far, the potential of Fresnel diffraction for beamline metrology has not been fully exploited because its high-frequency fringes could be only partly resolved with ordinary pixel-limited detectors. Using the high-spatial-frequency imaging capability of an irradiated LiF crystal, 2D information of the coherence degree, beam divergence and beam quality factor M 2 were retrieved from simple diffraction patterns. The developed beam metrology was validated with a laboratory reference laser, and then successfully applied at a beamline facility, in agreement with the source specifications.
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44

Wang, Hui Bo. "Experiment and Analysis System without Modulation Locked Fiber Grating System." Applied Mechanics and Materials 513-517 (February 2014): 3886–89. http://dx.doi.org/10.4028/www.scientific.net/amm.513-517.3886.

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High stability of semiconductor lasers have been shown useful in many applications areas,[such as optical communication, high-resolution spectroscopy quantum metrology, laser cooling and trapping[. With the rapid development of fiber optic dense wavelength division multiplexing system, we require laser source with high frequency stability in 1.5μm band. In this paper It is clear that temperature, cavity length and injection current have effects on frequency stability of FBG external cavity semiconductor laser by simulation experiments. Besides that, the frequency stabilization system is adjusted. Therefore, the frequency jitter spectra before and after locking are given and the experimental results are analyzed. The results show that after locking laser the typical frequency jitter is significantly improved comparing with frequency fluctuation in the condition of free running.
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45

Zhu, Kaiyi, Hongfang Chen, Shulian Zhang, Zhaoyao Shi, Yun Wang, and Yidong Tan. "Frequency-Shifted Optical Feedback Measurement Technologies Using a Solid-State Microchip Laser." Applied Sciences 9, no. 1 (December 29, 2018): 109. http://dx.doi.org/10.3390/app9010109.

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Since its first application toward displacement measurements in the early-1960s, laser feedback interferometry has become a fast-developing precision measurement modality with many kinds of lasers. By employing the frequency-shifted optical feedback, microchip laser feedback interferometry has been widely researched due to its advantages of high sensitivity, simple structure, and easy alignment. More recently, the laser confocal feedback tomography has been proposed, which combines the high sensitivity of laser frequency-shifted feedback effect and the axial positioning ability of confocal microscopy. In this paper, the principles of a laser frequency-shifted optical feedback interferometer and laser confocal feedback tomography are briefly introduced. Then we describe their applications in various kinds of metrology regarding displacement measurement, vibration measurement, physical quantities measurement, imaging, profilometry, microstructure measurement, and so on. Finally, the existing challenges and promising future directions are discussed.
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46

Haitjema. "Calibration of Displacement Laser Interferometer Systems for Industrial Metrology." Sensors 19, no. 19 (September 22, 2019): 4100. http://dx.doi.org/10.3390/s19194100.

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Displacement laser interferometer systems are widely used for the calibration of machine tools and CMMs (Coordinate Measuring Machines). Additionally, they are often the workhorse in dimensional calibration laboratories, where they act as the basic metrological traceability link for many calibrations. This paper gives a review of the calibration of such systems, where several approaches, such as the calibrations of separate components or the system as a whole, are reviewed. The calibrations discussed are: the laser frequency, the counting system, software evaluation of the environmental conditions, environmental and material temperature sensor calibration and the calibration of optics that is part of the system. For these calibrations considerations are given about the ways these can be carried out and about establishing the re-calibration intervals.
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47

Dobosz, Marek. "Laser diode distance measuring interferometer - metrological properties." Metrology and Measurement Systems 19, no. 3 (October 1, 2012): 553–64. http://dx.doi.org/10.2478/v10178-012-0048-1.

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Abstract A novel laser diode based length measuring interferometer for scientific and industrial metrology is presented. Wavelength the stabilization system applied in the interferometer is based on the optical wedge interferometer. Main components of the interferometer such as: laser diode stabilization assembly, photodetection system, measuring software, air parameters compensator and base optical assemblies are described. Metrological properties of the device such as resolution, measuring range, repeatability and accuracy are characterized.
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48

Muñoz-Rodriguez, J. Apolinar. "Mobile Calibration Based on Laser Metrology and Approximation Networks." Sensors 10, no. 8 (August 17, 2010): 7681–704. http://dx.doi.org/10.3390/s100807681.

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49

Csencsics, Ernst, Shingo Ito, Johannes Schlarp, and Georg Schitter. "System Integration and Control for 3D Scanning Laser Metrology." IEEJ Journal of Industry Applications 8, no. 2 (March 1, 2019): 207–17. http://dx.doi.org/10.1541/ieejjia.8.207.

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50

Muralikrishnan, Bala, Steve Phillips, and Daniel Sawyer. "Laser trackers for large-scale dimensional metrology: A review." Precision Engineering 44 (April 2016): 13–28. http://dx.doi.org/10.1016/j.precisioneng.2015.12.001.

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