Journal articles on the topic 'Line feature'
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Li, Stan. "Nearest feature line." Scholarpedia 3, no. 3 (2008): 4357. http://dx.doi.org/10.4249/scholarpedia.4357.
Full textWei Ng, Pan. "Feature Separation: An Approach for Product Line Evolution." International Journal of Engineering and Technology 6, no. 2 (2014): 99–103. http://dx.doi.org/10.7763/ijet.2014.v6.674.
Full textKang, K. C., Jaejoon Lee, and P. Donohoe. "Feature-oriented product line engineering." IEEE Software 19, no. 4 (2002): 58–65. http://dx.doi.org/10.1109/ms.2002.1020288.
Full textYan, Lijun, Jun‐Bao Li, Xiaorui Zhu, Jeng‐Shyang Pan, and Linlin Tang. "Bilinear discriminant feature line analysis for image feature extraction." Electronics Letters 51, no. 4 (2015): 336–38. http://dx.doi.org/10.1049/el.2014.3834.
Full textImani, Maryam, and Hassan Ghassemian. "Feature extraction using median–mean and feature line embedding." International Journal of Remote Sensing 36, no. 17 (2015): 4297–314. http://dx.doi.org/10.1080/01431161.2015.1079665.
Full textZhao, Liang, Shoudong Huang, Lei Yan, and Gamini Dissanayake. "A new feature parametrization for monocular SLAM using line features." Robotica 33, no. 3 (2014): 513–36. http://dx.doi.org/10.1017/s026357471400040x.
Full textKrueger, Charles, and Paul Clements. "An Enterprise Feature Ontology for Feature‐Based Product Line Engineering." INSIGHT 22, no. 2 (2019): 34–42. http://dx.doi.org/10.1002/inst.12244.
Full textKrueger, Charles, and Paul Clements. "An Enterprise Feature Ontology for Feature-Based Product Line Engineering." INCOSE International Symposium 27, no. 1 (2017): 533–47. http://dx.doi.org/10.1002/j.2334-5837.2017.00377.x.
Full textKamaei, Kamran, and Hakan Altınçay. "Editing the nearest feature line classifier." Intelligent Data Analysis 19, no. 3 (2015): 563–80. http://dx.doi.org/10.3233/ida-150732.
Full textYan-wen, Guo, Peng Qun-sheng, Hu Guo-fei, and Wang Jin. "Smooth feature line detection for meshes." Journal of Zhejiang University-SCIENCE A 6, no. 5 (2005): 460–68. http://dx.doi.org/10.1631/jzus.2005.a0460.
Full textPietroni, Nico, Stefano Nuvoli, Thomas Alderighi, Paolo Cignoni, and Marco Tarini. "Reliable feature-line driven quad-remeshing." ACM Transactions on Graphics 40, no. 4 (2021): 1–17. http://dx.doi.org/10.1145/3476576.3476737.
Full textPietroni, Nico, Stefano Nuvoli, Thomas Alderighi, Paolo Cignoni, and Marco Tarini. "Reliable feature-line driven quad-remeshing." ACM Transactions on Graphics 40, no. 4 (2021): 1–17. http://dx.doi.org/10.1145/3450626.3459941.
Full textAn, Su-Yong, Jeong-Gwan Kang, Lae-Kyoung Lee, and Se-Young Oh. "Line Segment-Based Indoor Mapping with Salient Line Feature Extraction." Advanced Robotics 26, no. 5-6 (2012): 437–60. http://dx.doi.org/10.1163/156855311x617452.
Full textMajhi, Banshider, Y. Santhosh Reddy, and D. Prasanna Babu. "Novel Features for Off-line Signature Verification." International Journal of Computers Communications & Control 1, no. 1 (2006): 17. http://dx.doi.org/10.15837/ijccc.2006.1.2268.
Full textZeng, Jiexian, Liqin Zhan, Xiang Fu, and Binbin Wang. "Straight line matching method based on line pairs and feature points." IET Computer Vision 10, no. 5 (2016): 459–68. http://dx.doi.org/10.1049/iet-cvi.2014.0372.
Full textHwang, Jae-Ho. "Feature Extraction by Line-clustering Segmentation Method." KIPS Transactions:PartB 13B, no. 4 (2006): 401–8. http://dx.doi.org/10.3745/kipstb.2006.13b.4.401.
Full textJeng-Shyang Pan, Qingxiang Feng, Lijun Yan, and Jar-Ferr Yang. "Neighborhood Feature Line Segment for Image Classification." IEEE Transactions on Circuits and Systems for Video Technology 25, no. 3 (2015): 387–98. http://dx.doi.org/10.1109/tcsvt.2014.2351092.
Full textFu Chang, Ya-Ching Lu, and T. Pavlidis. "Feature analysis using line sweep thinning algorithm." IEEE Transactions on Pattern Analysis and Machine Intelligence 21, no. 2 (1999): 145–58. http://dx.doi.org/10.1109/34.748823.
Full textPang, Y., Y. Yuan, and X. Li. "Generalised nearest feature line for subspace learning." Electronics Letters 43, no. 20 (2007): 1079. http://dx.doi.org/10.1049/el:20072176.
Full textLIANG, S. C., and W. J. CHEN. "Extraction of Line Feature in Binary Images." IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences E91-A, no. 8 (2008): 1890–97. http://dx.doi.org/10.1093/ietfec/e91-a.8.1890.
Full textJiang, Junjun, Ruimin Hu, Zhen Han, and Tao Lu. "Nearest feature line embedding for face hallucination." Electronics Letters 49, no. 8 (2013): 536–38. http://dx.doi.org/10.1049/el.2012.3724.
Full textHan, Deqiang, Chongzhao Han, and Yi Yang. "Modified center-based feature line classification approach." Frontiers of Electrical and Electronic Engineering in China 5, no. 2 (2010): 173–78. http://dx.doi.org/10.1007/s11460-010-0004-3.
Full textZorec, J. "Emission-like feature due to a latitudinal differential rotation." Symposium - International Astronomical Union 162 (1994): 257–58. http://dx.doi.org/10.1017/s0074180900214976.
Full textXia, Zhen, Hai Jiao Gao, and Xiu Hua Zhang. "An Effective Multi-Feature Extraction Method for Manually Plotted Well-Log Curve Line." Applied Mechanics and Materials 511-512 (February 2014): 452–56. http://dx.doi.org/10.4028/www.scientific.net/amm.511-512.452.
Full textWeber, Christopher, Stefanie Hahmann, Hans Hagen, and Georges-Pierre Bonneau. "Sharp feature preserving MLS surface reconstruction based on local feature line approximations." Graphical Models 74, no. 6 (2012): 335–45. http://dx.doi.org/10.1016/j.gmod.2012.04.012.
Full textSeo, Kukhwan, Jongyeol Kim, Jongmin Yoon, and Kyusik Chung. "Comparison of Feature Performance and its Application to Feature Combination in Off-Line Handwritten Korean Alphabet Recognition." International Journal of Pattern Recognition and Artificial Intelligence 12, no. 02 (1998): 251–61. http://dx.doi.org/10.1142/s0218001498000178.
Full textHaris, Malik, and Adam Glowacz. "Lane Line Detection Based on Object Feature Distillation." Electronics 10, no. 9 (2021): 1102. http://dx.doi.org/10.3390/electronics10091102.
Full textSIMON, J. C., and O. BARET. "REGULARITIES AND SINGULARITIES IN LINE PICTURES." International Journal of Pattern Recognition and Artificial Intelligence 05, no. 01n02 (1991): 57–77. http://dx.doi.org/10.1142/s0218001491000065.
Full textFerreira, Johnny Maikeo, Silvia Regina Vergilio, and Marcos Quinaia. "Software Product Line Testing Based on Feature Model Mutation." International Journal of Software Engineering and Knowledge Engineering 27, no. 05 (2017): 817–39. http://dx.doi.org/10.1142/s0218194017500309.
Full textLi, Zeyu, Jinling Wang, Kai Chen, and Yu Sun. "New Environmental Line Feature-based Vision Navigation: Design and Analysis." Journal of Navigation 70, no. 5 (2017): 1133–52. http://dx.doi.org/10.1017/s0373463317000224.
Full textEyal Salman, Hamzeh, Abdelhak-Djamel Seriai, and Christophe Dony. "Feature-Level Change Impact Analysis Using Formal Concept Analysis." International Journal of Software Engineering and Knowledge Engineering 25, no. 01 (2015): 69–92. http://dx.doi.org/10.1142/s0218194015400045.
Full textLiang, Y., and Y. H. Sheng. "BUILDING FACADE MODELING UNDER LINE FEATURE CONSTRAINT BASED ON CLOSE-RANGE IMAGES." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLII-3 (April 30, 2018): 993–97. http://dx.doi.org/10.5194/isprs-archives-xlii-3-993-2018.
Full textYadav, Hitesh, and A. Charan Kumari. "Analysis of Features using Feature Model in Software Product Line: A Case Study." International Journal of Education and Management Engineering 8, no. 2 (2018): 48–57. http://dx.doi.org/10.5815/ijeme.2018.02.06.
Full textAltınçay, Hakan, and Zafer Erenel. "Avoiding the interpolation inaccuracy in nearest feature line classifier by spectral feature analysis." Pattern Recognition Letters 34, no. 12 (2013): 1372–80. http://dx.doi.org/10.1016/j.patrec.2013.04.018.
Full textCheng, S., J. Yang, Z. Kang, and P. H. Akwensi. "A SCENE-ASSISTED POINT-LINE FEATURE BASED VISUAL SLAM METHOD FOR AUTONOMOUS FLIGHT IN UNKNOWN INDOOR ENVIRONMENTS." ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLII-2/W13 (June 5, 2019): 777–83. http://dx.doi.org/10.5194/isprs-archives-xlii-2-w13-777-2019.
Full textZhou, Fei, Limin Zhang, Chaolong Deng, and Xinyue Fan. "Improved Point-Line Feature Based Visual SLAM Method for Complex Environments." Sensors 21, no. 13 (2021): 4604. http://dx.doi.org/10.3390/s21134604.
Full textJian, Shengchao, Xiangang Peng, Haoliang Yuan, Chun Sing Lai, and Loi Lei Lai. "Transmission Line Fault-Cause Identification Based on Hierarchical Multiview Feature Selection." Applied Sciences 11, no. 17 (2021): 7804. http://dx.doi.org/10.3390/app11177804.
Full textXia, Xinghua, Xiaoyu Song, Fangun Luan, Jungang Zheng, Zhili Chen, and Xiaofu Ma. "Discriminative feature selection for on-line signature verification." Pattern Recognition 74 (February 2018): 422–33. http://dx.doi.org/10.1016/j.patcog.2017.09.033.
Full textHuang, Kai, and Hong Yan. "Off-line signature verification using structural feature correspondence." Pattern Recognition 35, no. 11 (2002): 2467–77. http://dx.doi.org/10.1016/s0031-3203(01)00222-9.
Full textLi, S. Z., and Juwei Lu. "Face recognition using the nearest feature line method." IEEE Transactions on Neural Networks 10, no. 2 (1999): 439–43. http://dx.doi.org/10.1109/72.750575.
Full textDu, Hao, and Yan Qiu Chen. "Rectified nearest feature line segment for pattern classification." Pattern Recognition 40, no. 5 (2007): 1486–97. http://dx.doi.org/10.1016/j.patcog.2006.10.021.
Full textChen, Xijiang, and Kegen Yu. "Feature Line Generation and Regularization From Point Clouds." IEEE Transactions on Geoscience and Remote Sensing 57, no. 12 (2019): 9779–90. http://dx.doi.org/10.1109/tgrs.2019.2929138.
Full textYuan Meng, 袁梦, 李艾华 Li Aihua, 郑勇 Zheng Yong, 崔智高 Cui Zhigao, and 鲍振强 Bao Zhengqiang. "Point-Line Feature Fusion in Monocular Visual Odometry." Laser & Optoelectronics Progress 55, no. 2 (2018): 021501. http://dx.doi.org/10.3788/lop55.021501.
Full textRen Qiancheng, 任前程. "Method for Extraction of Point Cloud Feature Line." Laser & Optoelectronics Progress 56, no. 6 (2019): 062803. http://dx.doi.org/10.3788/lop56.062803.
Full textKamaya, Hideyuki. "Double emission line feature from tiny cold clouds." Astrophysics and Space Science 291, no. 2 (2004): 185–91. http://dx.doi.org/10.1023/b:astr.0000032064.68168.1f.
Full textLee, Jaejoon, and Dirk Muthig. "Feature-oriented variability management in product line engineering." Communications of the ACM 49, no. 12 (2006): 55–59. http://dx.doi.org/10.1145/1183236.1183266.
Full textYanwei Pang, Yuan Yuan, and Xuelong Li. "Iterative Subspace Analysis Based on Feature Line Distance." IEEE Transactions on Image Processing 18, no. 4 (2009): 903–7. http://dx.doi.org/10.1109/tip.2008.2011167.
Full textYe, Ruifang, Chia-Sheng Pan, Ming Chang, and Chia-Ping Hsieh. "In-line inspection of surface feature and defect." Microsystem Technologies 24, no. 8 (2017): 3233–40. http://dx.doi.org/10.1007/s00542-017-3678-0.
Full textHuang, Dong, and Jian Gao. "On-line Signature Verification Based on GA-SVM." International Journal of Online Engineering (iJOE) 11, no. 6 (2015): 49. http://dx.doi.org/10.3991/ijoe.v11i6.5122.
Full textKawabata, Nobuo. "Attention and Depth Perception." Perception 15, no. 5 (1986): 563–72. http://dx.doi.org/10.1068/p150563.
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