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Journal articles on the topic 'Line Profile Analysis'

Author: Grafiati

Published: 4 June 2021

Last updated: 14 March 2023

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1

Scardi, Paolo, and Matteo Leoni. "Line profile analysis: pattern modellingversusprofile fitting." Journal of Applied Crystallography 39, no. 1 (January 12, 2006): 24–31. http://dx.doi.org/10.1107/s0021889805032978.

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Powder diffraction data collected on a nanocrystalline ceria sample within a round robin conducted by the IUCr Commission on Powder Diffraction were analysed by two alternative approaches: (i) whole-powder-pattern modelling based upon a fundamental microstructural parameters approach, and (ii) a traditional whole-powder-pattern fitting followed by Williamson–Hall and Warren–Averbach analysis. While the former gives results in close agreement with those of transmission electron microscopy, the latter tends to overestimate the domain size effect, providing size values about 20% smaller. The origin of the discrepancy can be traced back to a substantial inadequacy of profile fitting with Voigt profiles, which leads to systematic errors in the following line profile analysis by traditional methods. However, independently of the model, those systematic errors seem to have little effect on the volume-weighted mean size.

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2

Reiners, A., and F. Royer. "Altair's inclination from line profile analysis." Astronomy & Astrophysics 428, no. 1 (November 23, 2004): 199–204. http://dx.doi.org/10.1051/0004-6361:20041315.

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3

Troian, Andrea, Luca Rebuffi, Matteo Leoni, and Paolo Scardi. "Toward a reference material for line profile analysis." Powder Diffraction 30, S1 (December 22, 2014): S47—S51. http://dx.doi.org/10.1017/s0885715614001298.

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A powder obtained by ball milling a commercial FeMo alloy has been identified and investigated as possible reference material for powder diffraction line profile analysis. Ball milling yields micrometer-scale agglomerate particles made of rounded nanocrystalline domains with extensive lattice defects, so as to produce both size and strain contributions to the line profiles. The capability of a modern whole-powder pattern modeling to accurately quantify those aspects and the stability of the powder over a decade are shown and discussed.

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4

Armstrong, N., R. Whitely, A. L. Vella, A. Dowd, and I. Dragomir-Cernatescu. "X-ray line profile analysis of CeO2nanoparticles." Acta Crystallographica Section A Foundations of Crystallography 61, a1 (August 23, 2005): c452. http://dx.doi.org/10.1107/s0108767305081018.

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5

Townsend, R. H. D. "Spatial wavelet analysis of line-profile variations." Monthly Notices of the Royal Astronomical Society 310, no. 3 (December 11, 1999): 851–62. http://dx.doi.org/10.1046/j.1365-8711.1999.02996.x.

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6

Manninen, S. O., M. J. Cooper, and D. A. Cardwell. "Gamma ray source line broadening and compton line profile analysis." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 245, no. 2-3 (May 1986): 485–89. http://dx.doi.org/10.1016/0168-9002(86)91285-4.

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7

Czinkota, Sid. "Structural analysis of pipeline stresses created by line lowering." Canadian Journal of Civil Engineering 14, no. 6 (December 1, 1987): 719–27. http://dx.doi.org/10.1139/l87-109.

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To increase the depth of soil which covers a buried steel pipeline, the line can be lowered without cutting and welding. The degree of curvature in the new profile is the critical factor for controlling the resultant strains. Presented are two methods of calculating the required profile for a line containing high-pressure natural gas. One of the two is selected as being more efficient than the other and is compared with other known methods. Finally, a case history using the new method is presented. Key words: pipelines, gas pipelines, structural analysis, stress analysis, axial stress, axial strain, deflection, curvature, profiles.

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8

Dietrich, M., and W. Kollatschny. "Emission Line Variations of BLRG." Symposium - International Astronomical Union 159 (1994): 444. http://dx.doi.org/10.1017/s0074180900176259.

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In late 1989 we started a monitoring campaign of the line profile variations of more than 40 Broad-Line Radio Galaxies (BLRG) at Calar Alto Observatory/Spain. BLRG are the most extreme species of AGN regarding line width and structure of their optical emission line profiles showing FWZI up to 35000 km s−1, eg. 3C332 or Arp102B. Quite often the broad emission line profiles are characterized by a double hump structure. The analysis of the broad emission lines provides information about fundamental parameters of the inner part of the AGN like size, structure and kinematics of the line emitting region. In the following we present line profile variations of a BLRG we are studying.

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9

Ungár, Tamás, L. Balogh, and Gábor Ribárik. "Twinning, Dislocations and Grain Size in NanoSPD Materials Determined by X-Ray Diffraction." Materials Science Forum 584-586 (June 2008): 571–78. http://dx.doi.org/10.4028/www.scientific.net/msf.584-586.571.

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High resolution X-ray line profile analysis is sensitive to crystallite size, dislocation densities and character, and to planar defects, especially stacking faults or twinning. The different effects of microstructure features can be evaluated separately on the basis of the different corresponding profile functions and the different hkl dependences of line broadening. Profiles of faulted crystals consist of sub-profiles broadened and shifted according to different hkl conditions. The systematic analysis of the breadts and shifts of sub-profiles enables X-ray line profile analysis by using defect related profile functions corresponding to: (i) size, (ii) strain and (iii) planar faults, respectively. It is shown that twinning can either be enhanced or weakened by severe plastic deformation.

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10

Mishnev, A., and E. Ivanovskis. "X-ray line profile analysis of nanostructured oxytocin." Acta Crystallographica Section A Foundations of Crystallography 62, a1 (August 6, 2006): s163. http://dx.doi.org/10.1107/s0108767306096747.

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11

Balona, L. A., and C. A. Engelbrecht. "Photometry and frequency analysis of line profile variables." Monthly Notices of the Royal Astronomical Society 214, no. 4 (June 1985): 559–74. http://dx.doi.org/10.1093/mnras/214.4.559.

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12

Scardi, P., M. Ermrich, A. Fitch, E.-Wen Huang, R. Jardin, R. Kuzel, A. Leineweber, et al. "Size–strain separation in diffraction line profile analysis." Journal of Applied Crystallography 51, no. 3 (May 29, 2018): 831–43. http://dx.doi.org/10.1107/s1600576718005411.

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Separation of size and strain effects on diffraction line profiles has been studied in a round robin involving laboratory instruments and synchrotron radiation beamlines operating with different radiation, optics, detectors and experimental configurations. The studied sample, an extensively ball milled iron alloy powder, provides an ideal test case, as domain size broadening and strain broadening are of comparable size. The high energy available at some synchrotron radiation beamlines provides the best conditions for an accurate analysis of the line profiles, as the size–strain separation clearly benefits from a large number of Bragg peaks in the pattern; high counts, reliable intensity values in low-absorption conditions, smooth background and data collection at different temperatures also support the possibility to include diffuse scattering in the analysis, for the most reliable assessment of the line broadening effect. However, results of the round robin show that good quality information on domain size distribution and microstrain can also be obtained using standard laboratory equipment, even when patterns include relatively few Bragg peaks, provided that the data are of good quality in terms of high counts and low and smooth background.

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13

Djerdj, I., A. M. Tonejc, A. Tonejc, and N. Radić. "XRD line profile analysis of tungsten thin films." Vacuum 80, no. 1-3 (October 2005): 151–58. http://dx.doi.org/10.1016/j.vacuum.2005.08.017.

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14

Louër, D. "Investigating Nanocrystalline Materials with Diffraction Line Profile Analysis." Acta Crystallographica Section A Foundations of Crystallography 56, s1 (August 25, 2000): s134. http://dx.doi.org/10.1107/s0108767300023266.

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15

Cernanský, M. "Cumulants and moments in the line profile analysis." Zeitschrift für Kristallographie Supplements 2008, no. 27 (February 2008): 127–33. http://dx.doi.org/10.1524/zksu.2008.0017.

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16

Treiber, E. E., and P. W. May. "Broad band profile technique—a modification of X-ray line profile analysis." Micron and Microscopica Acta 16, no. 1 (January 1985): 45–48. http://dx.doi.org/10.1016/0739-6260(85)90030-9.

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17

Ungár, Tamás, Levente Balogh, and Gábor Ribárik. "Defect-Related Physical-Profile-Based X-Ray and Neutron Line Profile Analysis." Metallurgical and Materials Transactions A 41, no. 5 (August 25, 2009): 1202–9. http://dx.doi.org/10.1007/s11661-009-9961-7.

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18

Nazarova, L. S., and N. G. Bochkarev. "Analysis of Double-Peaked Profile Lines in 3C390.3." Symposium - International Astronomical Union 205 (2001): 76–77. http://dx.doi.org/10.1017/s0074180900220482.

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The analysis of the line ratios along the profiles show that CIV/Lα line ratio is low in the center of lines but high in the wings although the Lα/Hβ line ratio has changed the opposite way. The line ratios have been modeled using the photoionization code CLOUDY. On the bases of the photoionization modeling along the line profiles we discuss the possible geometry of the emitted gas.

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19

Ungár, Tamás. "Dislocation Densities, Slip-System Types and Burgers Vector Populationsinhexagonal and Cubiccrystalsfrom X-Ray Line Profile Analysis." Materials Science Forum 702-703 (December 2011): 479–84. http://dx.doi.org/10.4028/www.scientific.net/msf.702-703.479.

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X-ray diffraction line profile analysis can be carried out on the hkl planes corresponding to the same texture component or the same crystallographic orientation fiber. It is shown that in textured polycrystalline materials or in thin films or multilayers X-ray line profiles measured on planes corresponding either to the main or the minor texture components can provide the Burgers vector population and dislocations densities in the different texture components separately. The experimental technique is outlined for textured specimens and the multiple convolutional whole profile method, i.e. the CMWP line profile analysis procedure, is presented for its capacity to determine the substructure pertaining to different texture components in textured samples.

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20

Yu, Niankun, Luis C. Ho, Jing Wang, and Hangyuan Li. "Statistical Analysis of H i Profile Asymmetry and Shape for Nearby Galaxies." Astrophysical Journal Supplement Series 261, no. 2 (July 20, 2022): 21. http://dx.doi.org/10.3847/1538-4365/ac626b.

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Abstract We present a uniform analysis of the integrated profile of the H i emission line of 29,958 nearby (z < 0.06) galaxies extracted from the ALFALFA 21 cm survey. We apply the curve-of-growth technique to derive a database of spectral parameters and robust estimates of their associated uncertainties. Besides the central velocity and total flux, the main catalog provides new measures of line width, profile asymmetry, and profile shape. For a subsample of 13,511 galaxies with optical properties available from the Sloan Digital Sky Survey, we compute inclination angle-corrected line widths, rotation velocities empirically calibrated from spatially resolved observations, and dynamical masses based on H i sizes estimated from the H i mass. To facilitate subsequent scientific applications of the database, we also compile a number of ancillary physical properties of the galaxies, including their optical morphology, stellar mass, and various diagnostics of star formation activity. We use the homogeneous catalog of H i parameters to examine the statistical properties of profile asymmetry and shape. Across the full sample, which covers a wide range of stellar masses and environments, statistically significant H i profile asymmetry is detected in ∼20% of the galaxy population. The global H i profiles are 35.2% ± 0.3% single-peaked, 26.9% ± 0.3% flat-topped, and 37.9% ± 0.3% double-horned. At a given inclination angle, double-horned profiles are preferentially associated with galaxies of higher stellar mass or optical concentration, while galaxies of lower mass or concentration tend to have single-peaked profiles.

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21

Audebrand, Nathalie, and Daniel Louër. "The Microstructure of Nanocrystalline Powders from Line Profile Analysis." Materials Science Forum 443-444 (January 2004): 71–76. http://dx.doi.org/10.4028/www.scientific.net/msf.443-444.71.

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The theoretical background currently used in line profile analysis is reviewed. It covers the size and structure imperfection effects at the origin of diffraction line broadening. The propagation of errors, i.e. old errors and new errors related to profile fitting techniques, is commented. The experimental conditions for minimising errors are described. Representative examples of microstructure characterisation of nanopowders are presented.

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22

Bowen, A. W. "Single-Line Profile Analysis of Superplastically Deformed Aluminium Alloys." Advances in X-ray Analysis 29 (1985): 271–80. http://dx.doi.org/10.1154/s0376030800010363.

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Superplastic deformation involves the controlled processing of materials in order to produce extensive deformation, the longest recorded elongation being nearly 5000%. Components of very complex shape can be formed in this way, thus offering substantial savings over the use of conventional manufacturing routes. Typically, these savings can be 50% in cost (through reduced man-hours required for component manufacture, from improved structural efficiency and from reduced material costs) and 25% in weight (through more efficient use of materials and the reduced requirement for joints and fasteners).The success of the superplastic process will depend, in large part, on achieving an adequate balance between the deformation input and the relief of work hardening by thermally activated relaxation processes. An attempt has therefore been made to establish whether the residual strain in superplastically deformed materials is related to deformation, parameters, and if so, to interpret this strain data in terms of the mechanisms of superplasticity.

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23

Milev, Adriyan, Michael Wilson, G. S. Kamali Kannangara, and Nguyen Tran. "X-ray diffraction line profile analysis of nanocrystalline graphite." Materials Chemistry and Physics 111, no. 2-3 (October 2008): 346–50. http://dx.doi.org/10.1016/j.matchemphys.2008.04.024.

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24

Leonardi, Alberto, Matteo Leoni, and Paolo Scardi. "Atomistic interpretation of microstrain in diffraction line profile analysis." Thin Solid Films 530 (March 2013): 40–43. http://dx.doi.org/10.1016/j.tsf.2012.05.037.

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25

Robouch, B. V., P. Zajdel, A. Kisiel, A. Marcelli, E. M. Sheregii, M. Cestelli Guidi, M. Piccinini, et al. "Analysis of the phonon line profile of hydrogenated CdTe." Journal of Physics: Condensed Matter 20, no. 32 (July 9, 2008): 325217. http://dx.doi.org/10.1088/0953-8984/20/32/325217.

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26

Trubin, V. A., and A. Szasz. "Modified Statistical Regularization in X-Ray Line Profile Analysis." Physica Status Solidi (a) 124, no. 2 (April 16, 1991): 387–91. http://dx.doi.org/10.1002/pssa.2211240202.

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27

Zhao, F., G. Lo Curto, L. Pasquini, J. I. González Hernández, J. R. De Medeiros, B. L. Canto Martins, I. C. Leão, et al. "Measuring and characterizing the line profile of HARPS with a laser frequency comb." Astronomy & Astrophysics 645 (December 22, 2020): A23. http://dx.doi.org/10.1051/0004-6361/201937370.

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Aims. We study the 2D spectral line profile of the High Accuracy Radial Velocity Planet Searcher (HARPS), measuring its variation with position across the detector and with changing line intensity. The characterization of the line profile and its variations are important for achieving the precision of the wavelength scales of 10−10 or 3.0 cm s−1 necessary to detect Earth-twins in the habitable zone around solar-like stars. Methods. We used a laser frequency comb (LFC) with unresolved and unblended lines to probe the instrument line profile. We injected the LFC light – attenuated by various neutral density filters – into both the object and the reference fibres of HARPS, and we studied the variations of the line profiles with the line intensities. We applied moment analysis to measure the line positions, widths, and skewness as well as to characterize the line profile distortions induced by the spectrograph and detectors. Based on this, we established a model to correct for point spread function distortions by tracking the beam profiles in both fibres. Results. We demonstrate that the line profile varies with the position on the detector and as a function of line intensities. This is consistent with a charge transfer inefficiency effect on the HARPS detector. The estimate of the line position depends critically on the line profile, and therefore a change in the line amplitude effectively changes the measured position of the lines, affecting the stability of the wavelength scale of the instrument. We deduce and apply the correcting functions to re-calibrate and mitigate this effect, reducing it to a level consistent with photon noise.

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28

Georgiev, L., and M. M. Ivanov. "Line-profile variability of EZ CMa." Symposium - International Astronomical Union 163 (1995): 54–55. http://dx.doi.org/10.1017/s0074180900201587.

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CCD spectra for the unusual Wolf-Rayet star EZ CMa (WR6) are presented. The analysis of the profile changes of HeII lines shows a correlation between the gravity center of the line and the skewness (Robert et al. 1992). The fourth moment (kurtosis) changes with phase and looks epoch independent. These observable effects could be treated as manifestations of wind variability rather than consequence of orbital motion.

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29

Soleimanian, V., and S. R. Aghdaee. "Comparison methods of variance and line profile analysis for the evaluation of microstructures of materials." Powder Diffraction 23, no. 1 (March 2008): 41–51. http://dx.doi.org/10.1154/1.2888763.

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A comparison of different methods of X-ray diffraction analysis for the determination of crystallite size and microstrain; namely, line profile analysis, Rietveld refinement, and three approaches based on the variance method, is presented. The analyses have been applied to data collected on a ceria sample prepared by the IUCr Commission on Powder Diffraction. In the variance method, split Pearson VII, the Voigt function, and its approximation pseudo-Voigt function were fitted to X-ray diffraction line profiles. Based on the fitting results, the variances of line profiles were calculated and then the crystallite size and root mean square strain were obtained from variance coefficients. A SS plot of Langford as well as a Fourier analysis and Rietveld refinement have been carried out. The average crystallite size and microstrain were determined. The values of area-weighted domain size determined from the variance method are in agreement with those obtained from line profile analysis within a single (largest) standard uncertainty, and the volume-weighted domain sizes derived from the SS plot, Fourier size distribution, and Rietveld refinement agree within a single standard uncertainty. The results of rms strain calculated from variance and Pearson VII shape function and those from Rietveld refinements fall within a single esd. However, the variance method in conjunction with pseudo-Voigt and Voigt functions produce rms strains substantially larger than those determined from line profile analysis and Rietveld refinements.

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30

Rodríquez-Carvajal, Juan, and T. Roisnel. "Line Broadening Analysis Using FullProf*: Determination of Microstructural Properties." Materials Science Forum 443-444 (January 2004): 123–26. http://dx.doi.org/10.4028/www.scientific.net/msf.443-444.123.

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A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of broadened lines of constant wavelength diffraction patterns is presented. The approach is based on the Voigt approximation and can be combined with the Rietveld method as well as with the profile matching (Le Bail fit) procedure. Both the instrumental and sample profiles are supposed to be well described by Voigt functions. To get reliable sample parameters a good knowledge of the Instrumental Resolution Function (IRF) is needed. Only a phenomenological treatment, in terms of coherent size domains and strains due to structural defects, is performed.

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31

Turneaure, Stefan J., and Y. M. Gupta. "Real-time microstructure of shock-compressed single crystals from X-ray diffraction line profiles." Journal of Applied Crystallography 44, no. 3 (May 6, 2011): 574–84. http://dx.doi.org/10.1107/s0021889811012908.

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Methods to obtain and analyze high-resolution real-time X-ray diffraction (XRD) measurements from shock-compressed single crystals are presented. Procedures for extracting microstructural information – the focus of this work – from XRD line profiles are described. To obtain quantitative results, careful consideration of the experimental geometry is needed, including the single-crystal nature of the sample and the removal of instrumental broadening. These issues are discussed in detail. Williamson–Hall (WH) and profile synthesis (PS) analysis procedures are presented. More accurate than WH, the PS procedure relies on a forward calculation in which a line profile is synthesized by convoluting the instrumental line profile with a line profile determined from a diffraction simulation. The diffraction simulation uses the actual experimental geometry and a model microstructure for the shocked crystal. The shocked-crystal microstructural parameters were determined by optimizing the match between the synthesized and measured line profiles. XRD measurements on an Al crystal, shocked along [100] to 7.1 GPa using plate-impact loading, are used to demonstrate the WH and PS analysis methods. In the present analysis, the microstructural line broadening arises because of a distribution of longitudinal elastic microstrains. The WH analysis resulted in FWHM longitudinal microstrain distributions of 0.22 and 0.38% for Lorentzian and Gaussian line shape assumptions, respectively. The optimal FWHM longitudinal microstrain for the PS method was 0.35% with a pseudo-Voigt distribution (40% Lorentzian–60% Gaussian). The line profile measurements and PS analysis presented in this work provide new insight into the heterogeneous distribution of elastic strains in crystals undergoing elastic–plastic deformation during shock compression. Such microstrain distribution measurements are complementary to continuum measurements, which represent averages of the heterogeneous strains or stresses. The PS analysis is a general method capable of incorporating microstructural models more complex than the microstrain distribution model used in this work. As a next step, the PS method will be applied to line profiles of multiple diffraction peaks to separate strain- and size-broadening effects in shocked crystals.

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32

Zhang, Tie, Jun Zhang, and Chuan Xi Sun. "The Profile Analysis of Wheels and Rails of Different Wear Stages for Heavy-Haul Wagons." Applied Mechanics and Materials 602-605 (August 2014): 291–94. http://dx.doi.org/10.4028/www.scientific.net/amm.602-605.291.

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A large number of wheel and rail profiles of different wear stages are tracked and measured using the wheel/rail profile admeasuring apparatus for DaTong-QinHuangdao heavy-haul line. The finite element method (FEM) models and dynamic models of the contact between wheels and rails are both established for two working conditions (i.e., straight line and curve line). In addition, the corresponding parameters and indexes are obtained through the simulation and calculation. The results show that the maximum equivalent stress for the wheel profile of type II is lower than those of wheel profiles in other stages for the straight and curve lines. Its contact stress distribution is more uniform than others. The dynamics indexes including stationarity and stability of the standard wheel profiles ( i.e. LM) are the best. The indexes are gradually reduced along with the abrasion of wheel profiles. When passing the curve, the dynamics indexes of wheel profiles in each stage are reached the evaluation standard. The abrasion rate of wheels and rails can be reduced relatively when wheels are matched with the worn rails in the stable stage.

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33

Levine, Lyle E., Peter Geantil, Bennett C. Larson, Jonathan Z. Tischler, Michael E. Kassner, and Wenjun Liu. "Validating classical line profile analyses using microbeam diffraction from individual dislocation cell walls and cell interiors." Journal of Applied Crystallography 45, no. 2 (March 15, 2012): 157–65. http://dx.doi.org/10.1107/s0021889812001616.

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Dislocation structures in deformed metals produce broad asymmetric diffraction line profiles. During analysis, these profiles are generally separated into two nearly symmetric subprofiles corresponding to diffraction by dislocation cell walls and cell interiors. These subprofiles are then interpreted using complex models of dislocation-based line broadening. Until now, it has not been possible to test the many assumptions that are made in such an analysis. Here, depth-resolved microbeam diffraction was used to measure diffraction line profiles from numerous individual dislocation cell walls and cell interiors in a heavily deformed Cu single crystal. Summing these profiles directly constructed the cell-interior and cell-wall subprofiles that have been approximated in the line profile analysis literature for the past 30 years. Direct comparison between the reconstructed subprofiles and the macroscopic asymmetric line profile from the same sample allows the first direct tests of many of the assumptions that have been used for interpreting these X-ray measurements.

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34

Sano, Mutsumi, Sunao Takahashi, Ayumi Shiro, Takahisa Shobu, and Kengo Nakada. "Internal Dislocation Density in Deformed GlidCop from X-Ray Line Profile Analysis." Materials Science Forum 1016 (January 2021): 1223–28. http://dx.doi.org/10.4028/www.scientific.net/msf.1016.1223.

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Dislocation densities of GLIDCOP®, dispersion-strengthened copper with ultra-fine particles of aluminum oxide, were evaluated by employing the X-ray line profile analysis using the modified Williamson-Hall and modified Warren-Averbach methods. X-ray diffraction profiles for GlidCop samples with compressive strains applied at 200oC were measured with synchrotron radiation. The dislocation densities of GlidCop with compressive strain ranging from 0.6 to 4.3% were in the order of 3.2 × 1014–5.8 × 1014 m-2. The dislocation density increased with increasing the compressive strain within the measured strain range.

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35

Wang, Chun Xiang, Jing Qiang Zhang, and Zhi Jun Liu. "Reverse on the Spiral Bevel Gear’s Teeth Profile Line." Advanced Materials Research 308-310 (August 2011): 1596–99. http://dx.doi.org/10.4028/www.scientific.net/amr.308-310.1596.

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For the purposes of spiral bevel gears of cycloid gear is more and more extensive, the research on the reverse are rare phenomenon, this paper puts forward a reverse method: It’s based on three coordinates measuring system for prolate epicycloids’ bevel gear teeth profile. This method according to the forming principle of the spiral bevel gear tooth profile, with the back cone expanding the measured data of a group of good quality after simple processing, according to the involutes’ parameter equation for theoretical analysis, reverse out the base circle radius and modulus, make the bevel gear tooth profiles to reverse.

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36

Yajima, Zenjxo, Ken-ichi Ishikawa, Toshihiko Sasaki, and Yukio Hirose. "X-Ray Profile Analysis of 12% Chromium Stainless Steel." Advances in X-ray Analysis 37 (1993): 351–58. http://dx.doi.org/10.1154/s037603080001586x.

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X-ray line broadening is caused by variations in lattice strain and small particle size. When hydrogen is introduced into the steel by the electrolytica! method, structural changes are observed. X-ray line broadening is a suitable measurement in such cases. The Warren and Averbach Fourier analysis is a good method for line broadening studies. In this method, strain and particle size effects can be separated because broadening due to particle size is independent of order of the diffraction peaks, while broadening due to strain is not.

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37

LOBODA, P. A., I. A. LITVINENKO, G. V. BAYDIN, V. V. POPOVA, and S. V. KOLTCHUGIN. "Line shape modeling of multielectron ions in plasmas." Laser and Particle Beams 18, no. 2 (April 2000): 275–89. http://dx.doi.org/10.1017/s0263034600182175.

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A density-matrix theoretical model to calculate spectral line profiles of general multielectron ions in plasmas is described. The line-profile calculation involves electron collisional and radiative relaxation of ionic states, the emitter's motion (Doppler effect) and its interaction with a quasi-static ion microfield. Using the LineDM computer package implementing this model, line-profile calculations of the K- and L-shell transitions in Al XII, Ar XVII, Ar XVI, Cu XX, and Xe XLV ions have been performed in the context of plasma diagnostic issues of recent laboratory experiments. Comparisons of the calculated line profiles with experimental and other theoretical data show the applicability of the model and package for the detailed computational analysis of line radiation spectra from multielectron emitters in hot dense plasmas.

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38

Hashiguchi, Koji, Daniel Lisak, Agata Cygan, Roman Ciuryło, and Hisashi Abe. "Spectral analysis of H₂O near 7180 cm^–1 to accurately measure trace moisture in N₂ gas: evaluation of line shape profiles using Akaike Information Criterion." Japanese Journal of Applied Physics 61, no. 1 (December 22, 2021): 012003. http://dx.doi.org/10.35848/1347-4065/ac3724.

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Abstract The absorption spectra of H2O in N2 gas were measured at atmospheric pressure and room temperature near 7180 cm–1 in the moisture range of 9.7–148.7 nmol mol−1 in mole fraction using cavity ring-down spectroscopy. The line shape profiles used for the spectral analysis for the trace moisture measurement were evaluated based on the Akaike Information Criterion as well as the fitting residuals. The optimal line shape profile in this study was the speed-dependent asymmetric Voigt profile (SDAVP). From the comparison of the fitting results calculated using the Lorentzian profile (LP) with those calculated using the SDAVP, the relative difference in the integrated line area between the two line shape profiles was found to be systematic and constant. The measurement error due to the use of the LP could be corrected using a correction factor of 1.00479 ± 0.00077.

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TENG FENG-EN, HAN WEI, LIU YAN-LING, and WANG YU-MING. "X-RAY PROFILE ANALYSIS ON DEFORMED SEMICRYSTAL LINE POLYETHYLENE FILMS." Acta Physica Sinica 40, no. 12 (1991): 1955. http://dx.doi.org/10.7498/aps.40.1955.

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KUMAGAI, Masayoshi, and Ryoichi YOKOYAMA. "Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis." Journal of the Society of Materials Science, Japan 69, no. 3 (March 15, 2020): 277–83. http://dx.doi.org/10.2472/jsms.69.277.

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41

SHOBU, Takahisa, Ayumi SHIRO, and Yutaka YOSHIDA. "Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis." Journal of the Society of Materials Science, Japan 69, no. 4 (April 15, 2020): 343–47. http://dx.doi.org/10.2472/jsms.69.343.

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42

NISHIDA, Masayuki, Tadafumi HASHIMOTO, and Masayoshi KUMAGAI. "Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis." Journal of the Society of Materials Science, Japan 69, no. 5 (May 15, 2020): 421–26. http://dx.doi.org/10.2472/jsms.69.421.

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43

Gubicza, Jenő, J. Szépvölgyi, I. Mohai, and Tamás Ungár. "X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics." Materials Science Forum 378-381 (October 2001): 729–34. http://dx.doi.org/10.4028/www.scientific.net/msf.378-381.729.

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44

Lee, Seong-Jae, Siek Hyung, and Kangwhan Lee. "An Analysis of the Symbiotic Star Z And Line Profile." Journal of the Korean earth science society 33, no. 7 (December 29, 2012): 608–17. http://dx.doi.org/10.5467/jkess.2012.33.7.608.

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45

KURITA, Masanori. "A statistical analysis of half-width of diffraction line profile." Transactions of the Japan Society of Mechanical Engineers Series A 54, no. 508 (1988): 2154–60. http://dx.doi.org/10.1299/kikaia.54.2154.

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46

Rao, S., and C. R. Houska. "Analytical X-ray line profile analysis based upon correlated dislocations." Acta Crystallographica Section A Foundations of Crystallography 44, no. 6 (November 1, 1988): 1021–28. http://dx.doi.org/10.1107/s0108767388006634.

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47

Zou, Kun, and Hongzhang Weng. "Terrain Feature Line Extraction by Improved Gradient-Based Profile Analysis." International Journal of Signal Processing, Image Processing and Pattern Recognition 10, no. 3 (March 31, 2017): 1–12. http://dx.doi.org/10.14257/ijsip.2017.10.3.01.

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48

Matei, Florica, Nicolae Aldea, Marius Rada, and Ioana Pop. "Fundamental Parameter Method Applied to X-Ray Line Profile Analysis." Bulletin of University of Agricultural Sciences and Veterinary Medicine Cluj-Napoca. Horticulture 73, no. 2 (November 30, 2016): 310. http://dx.doi.org/10.15835/buasvmcn-hort:11954.

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Crystallite size strain effect the mechanical, electric, magnetic and optical properties of many kind of the nanomaterials. The effects of the finite crystallite size and lattice strain can be very well observed as the deformation in the shape of the X-ray line profile (XRLP). In this contribution we have used the fundamental parameter (FP) [1,2] method to evaluate the nanostructure materials assuming a theoretical model of experimental XRLP. In this contribution we have used various distribution functions such as normal, lognormal, Gumbel, Maxwell and Student. The best values of the crystallite size of nanostructued materials are chosen by analysis of root mean squares of residuals and by correlation matrix of the fit parameters. The entire procedure was implemented in the GnuPlot script.

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Ungár, Tamás. "Characterization of nanocrystalline materials by X-ray line profile analysis." Journal of Materials Science 42, no. 5 (December 21, 2006): 1584–93. http://dx.doi.org/10.1007/s10853-006-0696-1.

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Bozhinova, I., S. Iordanova, and A. Pashov. "Analysis of Hαspectral line profile in a DC hydrogen discharge." Journal of Physics D: Applied Physics 49, no. 47 (October 28, 2016): 475201. http://dx.doi.org/10.1088/0022-3727/49/47/475201.

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