Academic literature on the topic 'Lithographs'
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Journal articles on the topic "Lithographs"
Dziuban, Roman. "LUDVIK ZELINSKY AND HIS COOPERATION WITH ILLUSTRATORS OF THE MAGAZINE LWOWIANIN (1835–1842)." Proceedings of Research and Scientific Institute for Periodicals, no. 11(29) (2021): 225–75. http://dx.doi.org/10.37222/2524-0331-2021-11(29)-11.
Full textVandаlovskyi, V. "Artistic and technical features of the lithographic manner mixed technique." Research and methodological works of the National Academy of Visual Arts and Architecture, no. 27 (February 27, 2019): 92–98. http://dx.doi.org/10.33838/naoma.27.2018.92-98.
Full textMeijer, Rob, Peter Thomson, and Lysbeth Croiset van Uchelen-Brouwer. "The History of the Lithographie Royale, 1818-25." Quaerendo 31, no. 4 (2001): 281–306. http://dx.doi.org/10.1163/157006901x00173.
Full textNargiza Shirinova. "DESCRIPTION OF MEDICAL LITHOGRAPHS CREATED IN TURKESTAN IN THE 19TH AND EARLY 20TH CENTURIES." International Journal on Integrated Education 3, no. 12 (December 3, 2020): 64–67. http://dx.doi.org/10.31149/ijie.v3i12.914.
Full textSullivan, Ann M. "Lithographs by Alexander Calder." Mayo Clinic Proceedings 77, no. 4 (April 2002): 401. http://dx.doi.org/10.4065/77.4.401.
Full textSchein, R. H. "Representing Urban America: 19th-Century Views of Landscape, Space, and Power." Environment and Planning D: Society and Space 11, no. 1 (February 1993): 7–21. http://dx.doi.org/10.1068/d110007.
Full textBarton, Aleisha. "Contemplating Light: Experiencing Victor Moscoso’s Psychedelic Lithographs in the Museum." Arts 12, no. 5 (September 27, 2023): 213. http://dx.doi.org/10.3390/arts12050213.
Full textMiró, Fundacio Joan. "Art at Mayo Clinic Lithographs." Mayo Clinic Proceedings 76, no. 5 (May 2001): 501. http://dx.doi.org/10.4065/76.5.501.
Full textMirzorakhimov, A. "HISTORICAL AND RELIGIOUS LITHOGRAPHIC BOOKS ON THE LITERARY HERITAGE OF UZBEKISTAN." CURRENT RESEARCH JOURNAL OF HISTORY 03, no. 11 (November 1, 2022): 24–32. http://dx.doi.org/10.37547/history-crjh-03-11-05.
Full textFaria, Alberto. "Between Light and Shade." Studies in Digital Heritage 3, no. 2 (June 12, 2020): 122–27. http://dx.doi.org/10.14434/sdh.v3i2.27720.
Full textDissertations / Theses on the topic "Lithographs"
Frazer, Patrick. "Thomas Way and T.R. Way : commercial and artistic lithographers." Thesis, University of Reading, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.365848.
Full textBenoit-Renault, Viviane. "La lithographie en Bretagne (1819-1914)." Thesis, Paris 4, 2014. http://www.theses.fr/2014PA040217.
Full textIn the history of print, the study of lithography in province has long been neglected. The first founding worksonly date back to the last forty years. The purpose of this thesis on the history of art is to address this shortcomingby analysing lithography in historical Brittany between 1819 and 1914 bearing an interdisciplinarity mind open toeconomic and social history.Initially this research will be based on the study of lithographic printing. Following a general overviewon the evolution of the number of workshops and their geographical breakdown, leading and secondarylithographic centres are being considered. On the other hand, autographic printing which established itself andcame into competition with the lithographic workshops is being analysed with an emphasis on tin-plate printingworkshops being a characteristic feature of Brittany. Beyond this historical study, the following chapter paints aportrait of the printers and that of the lithographic production scene which being a social environment. It is aworld whereby the painter mingles with the professional lithographer, the drawing lover, the printer and thecraftsman. The reality of the printing world is being addressed in the third chapter with a particular focus on theworkshop and the history of the equipment specific to printing (plates and moulds). Subsequently the workshop isseen as a world in its own right with its celebrations and codes responsible for the working cohesion. This unitywill be accentuated in the second half of the XIX century with the constitution of lithographers unions. Thanksto the creation of a lithographs inventory drawn upon the austerity regarding registration of copyright and printpublic funds, the analysis of the print production in Brittany reveals an unexpected thematic diversity. The artisticprint on sheet, collections or illustrated albums is analysed from a stylistic and iconographic point of view.Finally, the study of useful lithography and the tin-box will bring this chapter to a close.Print trade which formsthe last link in the production chain is recounted through its merchants, a trade being transformed throughout XIXcentury, door-to-door and casual sellers. Lastly, the topic of the diffusion of print in Brittany is put forward asbeing the market place of Breton lithography within a national and international network
Monroe, Julia Boyette. ""Modern Primitive: Parody, Ambivalence, and Paradox in Paul Colin's Le Tumulte Noir"." VCU Scholars Compass, 2014. http://scholarscompass.vcu.edu/etd/624.
Full textHauser, Hubert [Verfasser], and Holger [Akademischer Betreuer] Reinecke. "Nanoimprint lithography for solar cell texturisation = Nanoimprint Lithographie fuer die Solarzellentexturierung." Freiburg : Universität, 2013. http://d-nb.info/1123476160/34.
Full textCaillau, Mathieu. "Nanotechnologie verte : des polymères de la biomasse comme résines éco-efficientes pour la lithographie." Thesis, Lyon, 2017. http://www.theses.fr/2017LYSEC037/document.
Full text. Lithography is a key step in micro / nanotechnology with applications in the fields of microelectronics, flexible electronics, photonics, photovoltaics, microfluidics and biomedical. This lithography step requires the use of a writable resist to act as a temporary mask for transferring patterns in the underlying material by etching or deposition. Nowadays, lithography uses synthetic organic resin, organic solvents and hazardous chemicals which is contrary to environmental issues and generates additional costs associated with risk and waste management. Furthermore, regulation rules (REACh, US pollution act) tend to move toward the protection of human health and the environment from the risks that can be posed by chemicals and promote alternative chemicals. In this context, this PhD work aimed at replacing conventional synthetic organic resist with a biopolymer. This biopolymer will not be modified by synthetic organic chemistry, will be compatible with conventional lithography instruments and it should be developable in water. It was demonstrated that chitosan was a positive tone resist allowing accomplishing a complete lithography-etching process. The whole process was performed in aqueous solution without the use of hazardous chemicals. 50 nm features were obtained after ebeam lithography/plasma etching into a silica layer without the use of an additional masking layer. 0.3-0.5 μm feature were obtained using photolithography
Kadiri, Hind. "Auto-organisation assistée pour la nanoimpression à grande échelle et surfaces optiques multifonctionnelles." Thesis, Troyes, 2018. http://www.theses.fr/2018TROY0001.
Full textLarge scale nanostructuring is one of the major issues in nanotechnology and a bottleneck for addressing numerous societal issues (health, energy and environment). However, conventional lithographic methods used in microelectronics are becoming extremely expensive and complex especially when large scale nanostructuring is necessary. Therefore alternative cost-effective and easy to use nanolithography methods need to be developed.NanoImprint Lithography (NIL) is a very powerful method for fast and large scale nanostructuring provided the molds are available. In this study in collaboration with SILSEF, we developed a new and original nanopatterning technology at large scale and at low cost compared to other lithographic methods.Two scientific goals were tackeld: 1) development of a new method for manufacturing molds with different sizes of simple and complex structures and at large scale (20x20 cm2). Molds were obtained by using colloidal lithography combined with Reactive Ion Etching (RIE) and/or physical vapor deposition. 2) direct and indirect functional validations by self-organization for micro / meso and nanoimprint. Three applications have been addressed; enhanced light extraction efficiency of scintillating crystals, antireflection (vis and IR) and wettability in a context of multifunctional optical surfaces
Mehrotra, Prateek. "High Aspect Ratio Lithographic Imaging at Ultra-high Numerical Apertures: Evanescent Interference Lithography with Resonant Reflector Underlayers." Thesis, University of Canterbury. Electrical and Computer Engineering, 2012. http://hdl.handle.net/10092/6935.
Full textLakcher, Amine. "Nouvelles perspectives de métrologie dimensionnelle par imagerie de microscope électronique pour le contrôle de la variabilité des procédés de fabrication des circuits intégrés." Thesis, Université Grenoble Alpes (ComUE), 2018. http://www.theses.fr/2018GREAT052/document.
Full textIn advanced technological nodes as well as derived technologies, aggressive design rules are needed. This leads to a complexity of structures in the current integrated circuits. Such structures pose a significant challenge to chip manufacturing processes, in particular patterning steps of lithography and etching. In order to improve and optimize these structures, designers need to rely on the rules and knowledge that engineers have about their processes. These rules need to be fed by complex dimensional and structural information: corner rounding, tip to tip distances, line end shortening, etc. Metrology must evolve so that engineers are able to measure and quantify the dimensions of the most complex structures in order to assess the process variability. Currently the variability is mainly quantified using data from the inline monitoring of simple structures as they are the only ones to guarantee a robust and reproducible measurement. But, they can hardly be considered as representative of the process or the circuit. Using CD-SEM metrology to measure complex structures in a robust way is a technical challenge. The creation of measurement recipes is complex, time consuming and does not guarantee a stable measurement. However, a significant amount of information is contained in the SEM image. The analysis tools provided by the equipment manufacturers allow to extract the SEM contours of a structure present in the image. Thus, the CD-SEM takes images and the metrology part is performed offline to estimate the variability.This thesis offers engineers new possibilities of dimensional metrology in order to apply it for process control of complex structures. SEM contours are used as a source of information and used to generate new metrics
Bouanani, Shayma. "Vers l'industrialisation de l'auto-assemblage dirigé des copolymères à blocs : développement de procédés de lithographie compatibles avec les noeuds technologiques sub-10 nm pour des applications de type contacts." Thesis, Université Grenoble Alpes (ComUE), 2017. http://www.theses.fr/2017GREAT053/document.
Full textThe competitiveness-chasing in which industrial manufactures are involved, leads to an exponential increase in the number of functionalities per chips, as well as reducing their unit cost, which results in a continuous decrease of their size. To achieve this, DSA (Directed Self-Assembly) of block copolymers, combines conventional lithography techniques with the molecular-scale organizational properties of copolymers. In this framework, the overall objective of this thesis is to evaluate the industrialization potential of the DSA process by graphoepitaxy for contact hole shrink and contact multiplication applications. In particular, it is necessary to demonstrate the ability of this technique to meet the ITRS specifications in terms of CD uniformity, misalignment and hole open yield. A first study on contact shrink, based on the impact of material properties, surface affinity and guiding feature size, allows us to understand the mechanisms involved in the appearance of defects. A second part of the study deals with contact multiplication. To address this application, two types of guides have been studied: elliptical guiding patterns and more complex ones called "peanut". The study of the process window in terms of process parameters such as annealing time and temperature, but also commensurability was conducted. Particular attention was paid to guide size variation and its impact on DSA final pitch. Experimental data from this study were correlated with simulations. The success criteria are based on the lithographic performances that must be judged through advanced metrology. The development of a specific metrology to measure the placement error of contacts as well as their pitch was conducted
Armeanu, Ana. "Simulation électromagnétique utilisant une méthode modale de décomposition en ondelettes." Phd thesis, Université de Grenoble, 2011. http://tel.archives-ouvertes.fr/tel-00721767.
Full textBooks on the topic "Lithographs"
1875-1955, Mann Thomas, Limited Editions Club, and Pondside Press, eds. Eight lithographs. [New York?]: Limited Editions Club, 1991.
Find full textErni, Hans. Erni Lithograph: Werkverzeichnis der Lithographien = Catalogue raisonné of the lithographs. Zürich: ABC Verlag, 1993.
Find full textAdams, Clinton. Crayonstone: The life and work of Bolton Brown with a catalogue of his lithographs. Albuquerque: University of New Mexico Press, 1993.
Find full textOnobrakpeya, Bruce. Poems and lithographs. Lagos, Nigeria: Ovuomaroro Gallery, 1989.
Find full textPowell, Virginia. Virginia Powell: Lithographs. Sunninghill, Berks: Austin/Desmond, 1987.
Find full textBook chapters on the topic "Lithographs"
Bandelier, Philippe, Anne-Laure Charley, and Alexandre Lagrange. "Photolithography." In Lithography, 1–40. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch1.
Full textBesacier, Maxime, Christophe Constancias, and Jean-Yves Robic. "Extreme Ultraviolet Lithography." In Lithography, 41–100. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch2.
Full textConstancias, Christophe, Stefan Landis, Serdar Manakli, Luc Martin, Laurent Pain, and David Rio. "Electron Beam Lithography." In Lithography, 101–82. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch3.
Full textGierak, Jacques. "Focused Ion Beam Direct-Writing." In Lithography, 183–232. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch4.
Full textHawkes, Peter. "Charged Particle Optics." In Lithography, 233–74. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch5.
Full textJouve, Amandine, Michael May, Isabelle Servin, and Julia Simon. "Lithography resists." In Lithography, 275–368. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.ch6.
Full textLandis, Stefan. "Front Matter." In Lithography, i—xxvi. Hoboken, NJ USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118557662.fmatter.
Full textAnner, George E. "Lithography." In Planar Processing Primer, 439–91. Dordrecht: Springer Netherlands, 1990. http://dx.doi.org/10.1007/978-94-009-0441-5_11.
Full textVeendrick, Harry. "Lithography." In Bits on Chips, 151–66. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-76096-4_9.
Full textKim, Dae-Eun, and In-Ha Sung. "Lithography." In Encyclopedia of Tribology, 1994–2007. Boston, MA: Springer US, 2013. http://dx.doi.org/10.1007/978-0-387-92897-5_1051.
Full textConference papers on the topic "Lithographs"
Madaliyeva, Oysara. "EXPLORING THE NOTEBOOK "SOURCES OF BABUR" BY ABDULLA NOSIROV (Main Fund of the Russian Academy of Sciences of the Republic of Uzbekistan No. 13395)." In The Impact of Zahir Ad-Din Muhammad Bobur’s Literary Legacy on the Advancement of Eastern Statehood and Culture. Alisher Navoi' Tashkent state university of Uzbek language and literature, 2023. http://dx.doi.org/10.52773/bobur.conf.2023.25.09/fwrb3860.
Full textAguilar, Karen M., Shelby Powers, Leah Lackey, Arick Grootveld, and Andrew G. Klein. "Assessing Paper Texture Similarity in Matisse Lithographs Using a Triplet Neural Network." In 2021 IEEE MIT Undergraduate Research Technology Conference ((URTC)). IEEE, 2021. http://dx.doi.org/10.1109/urtc54388.2021.9740159.
Full textHendricks, Genevieve. "Le Corbusier’s Postwar Painterly Mythologies." In LC2015 - Le Corbusier, 50 years later. Valencia: Universitat Politècnica València, 2015. http://dx.doi.org/10.4995/lc2015.2015.828.
Full textLum, Bernice M., Andrew R. Neureuther, and Glenn D. Kubiak. "Modeling Soft X-Ray Projection Lithography." In Soft X-Ray Projection Lithography. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/sxray.1993.tud.10.
Full textSasian, Jose M. "New developments in the design of ring field projection cameras for EUV lithography." In International Optical Design Conference. Washington, D.C.: Optica Publishing Group, 1998. http://dx.doi.org/10.1364/iodc.1998.lthd.1.
Full textBalan, Nikita, Vladimir Ivanov, Alexander Pankratov, and Ekaterina Kharchenko. "METHOD FOR CALCULATION OF MASK SPECIFICATION CONTRIBUTION TO LITHOGRAPHIC BUDGETS." In International Forum “Microelectronics – 2020”. Joung Scientists Scholarship “Microelectronics – 2020”. XIII International conference «Silicon – 2020». XII young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis. LLC MAKS Press, 2020. http://dx.doi.org/10.29003/m1653.silicon-2020/372-374.
Full textKunz, R. R., M. A. Hartney, and M. Rothschild. "Resist Alternatives for Sub-0.35-μm Lithography Using Highly Attenuated Radiation." In Soft X-Ray Projection Lithography. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/sxray.1992.wc1.
Full textZaidi, Saleem H., and S. R. J. Brueck. "Multiple exposure interferometric lithography." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1992. http://dx.doi.org/10.1364/oam.1992.tui3.
Full textMcCallum, Martin. "Some lithographic limits of back end lithography." In Microelectronic and MEMS Technologies, edited by Chris A. Mack and Tom Stevenson. SPIE, 2001. http://dx.doi.org/10.1117/12.425217.
Full textBrunner, T. A. "Pushing photolithography to its limits." In OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/oam.1991.fp1.
Full textReports on the topic "Lithographs"
Soihl, Stephan. Transparent sculptures, lithographs, and watercolors : a personal response to the natural world. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.3127.
Full textPark, Jea. Lithography Hotspot Detection. Portland State University Library, January 2000. http://dx.doi.org/10.15760/etd.5665.
Full textLewis, Aaron. Wavelength Independent Optical Lithography. Fort Belvoir, VA: Defense Technical Information Center, June 1986. http://dx.doi.org/10.21236/ada171935.
Full textJi, Qing. Maskless, resistless ion beam lithography. Office of Scientific and Technical Information (OSTI), January 2003. http://dx.doi.org/10.2172/809301.
Full textZotter, Beth. Holographic Lithography for Industrial Nanomanufacturing. Office of Scientific and Technical Information (OSTI), March 2020. http://dx.doi.org/10.2172/1614764.
Full textBrowning, R., and R. F. Pease. Low Voltage Electron Beam Lithography. Fort Belvoir, VA: Defense Technical Information Center, April 1994. http://dx.doi.org/10.21236/ada281046.
Full textNAVAL RESEARCH LAB WASHINGTON DC. Low Voltage Electron Beam Lithography. Fort Belvoir, VA: Defense Technical Information Center, March 1995. http://dx.doi.org/10.21236/ada293396.
Full textLiu, Weidong. Low Voltage Electron Beam Lithography. Fort Belvoir, VA: Defense Technical Information Center, June 1995. http://dx.doi.org/10.21236/ada296625.
Full textBrowning, R., and R. F. Pease. Low Voltage Electron Beam Lithography. Fort Belvoir, VA: Defense Technical Information Center, October 1992. http://dx.doi.org/10.21236/ada263360.
Full textBrowning, R., and R. F. Pease. Low Voltage Electron Beam Lithography. Fort Belvoir, VA: Defense Technical Information Center, February 1993. http://dx.doi.org/10.21236/ada265358.
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