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1

Mishra, Raja K. "Quantitative lorentz microscopy of NdFeB magnets." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 552–53. http://dx.doi.org/10.1017/s0424820100104820.

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It is now well established that quantitative measurement of domain wall width using Lorentz electron microscopy is nontrivial. The usual technique of extrapolating divergent wall image widths of over-focussed or under-focussed Fresnel images suffers from serious errors since it is based on geometrical considerations and does not take into account the wave optical effects of electron scattering in the microscope. These errors are overcome if one supplements the measurements with image computation for the specific electron optical system and the specimen configuration. Another way of circumventing the errors is by using Differential Phase Contrast Microscopy in a Scanning Transmission Microscope which unfortunately requires instrumentation changes in the electron source and the electron detection system. In this paper we describe a simple method of calculating quantitative values of domain wall energy and domain wall width from Fresnel images obtainable in any standard transmission electron microscope.
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2

Huang, Ping, Rajeswari Jayaraman, Giulia Fulvia Mancini, Alex Kruchkov, Marco Cantoni, Yoshie Murooka, Tatiana Latychevskaia, et al. "Investigating Skyrmions Using Lorentz Transmission Electron Microscopy." Microscopy and Microanalysis 24, S1 (August 2018): 932–33. http://dx.doi.org/10.1017/s1431927618005159.

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3

McVitie, S., D. McGrouther, S. McFadzean, D. A. MacLaren, K. J. O’Shea, and M. J. Benitez. "Aberration corrected Lorentz scanning transmission electron microscopy." Ultramicroscopy 152 (May 2015): 57–62. http://dx.doi.org/10.1016/j.ultramic.2015.01.003.

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4

McFadyen, Ian R. "Differential phase contrast Lorentz microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 4 (August 1990): 758–59. http://dx.doi.org/10.1017/s0424820100176927.

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Transmission electron microscopy can provide high spatial resolution information on domain structures in thin magnetic films provided the interaction between the electron beam and the magnetic sample is correctly utilised: As an electron beam passes through a magnetic sample it suffers a phase shift due to the magnetic induction of the sample and the associated stray fields. The derivative of this phase shift is a direct measure of the in-plane magnetic induction integrated along the electron trajectory, Therefore measurement of this phase derivative would provide the integrated in-plane induction directly. The conventional phase contrast techniques of Fresnel and Foucault Lorentz microscopy provide image contrast which has a very non-linear relationship to the above mentioned phase derivative. Differential phase contrast Lorentz microscopy (DPC), on the other hand, does provide direct, high resolution information on the phase derivative of the electron wave as it leaves tile sample. In this technique a focused probe of electrons is scanned cross the sample and a position sensitive detector in the far field measures two orthogonal components of the probe deflection angle at each point in the scan. This corresponds to the derivative of the phase of the electron wave as it leaves the sample, and thus to the integral of the in-plane induction at each point.
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5

Tang, Jin, Lingyao Kong, Weiwei Wang, Haifeng Du, and Mingliang Tian. "Lorentz transmission electron microscopy for magnetic skyrmions imaging." Chinese Physics B 28, no. 8 (August 2019): 087503. http://dx.doi.org/10.1088/1674-1056/28/8/087503.

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6

KANAZAWA, Naoya, Xiuzhen YU, Yoshinori ONOSE, Yoshio MATSUI, Naoto NAGAOSA, and Yoshinori TOKURA. "Observation of Skyrmion Lattice by Lorentz Transmission Electron Microscopy." Nihon Kessho Gakkaishi 53, no. 4 (2011): 274–79. http://dx.doi.org/10.5940/jcrsj.53.274.

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7

Peng, Li-cong, Ying Zhang, Shu-lan Zuo, Min He, Jian-wang Cai, Shou-guo Wang, Hong-xiang Wei, Jian-qi Li, Tong-yun Zhao, and Bao-gen Shen. "Lorentz transmission electron microscopy studies on topological magnetic domains." Chinese Physics B 27, no. 6 (June 2018): 066802. http://dx.doi.org/10.1088/1674-1056/27/6/066802.

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8

Gorji, M. Saleh, Di Wang, Ralf Witte, Xiake Mu, Robert Kruk, Christian Kübel, and Horst Hahn. "In situ Lorentz Transmission Electron Microscopy of FeRh Thin Films." Microscopy and Microanalysis 24, S1 (August 2018): 934–35. http://dx.doi.org/10.1017/s1431927618005160.

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9

Nepijko, S. A., and G. Schönhense. "Quantitative Lorentz transmission electron microscopy of structured thin permalloy films." Applied Physics A 96, no. 3 (February 19, 2009): 671–77. http://dx.doi.org/10.1007/s00339-009-5131-4.

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10

Bagués, Núria, Brandi L. Wooten, Bin He, Brian C. Sales, Joseph Heremans, and David McComb. "Lorentz Transmission Electron Microscopy Imaging of Magnetic Textures in MnBi." Microscopy and Microanalysis 27, S1 (July 30, 2021): 2178–79. http://dx.doi.org/10.1017/s1431927621007832.

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11

McFadyen, I. R. "Implementation of differential phase contrast Lorentz microscopy on a conventional transmission electron microscope." Journal of Applied Physics 64, no. 10 (November 15, 1988): 6011–13. http://dx.doi.org/10.1063/1.342134.

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12

Chapman, J. N. "Extraction of Quantitative Magnetic Data Using Transmission Lorentz Microscopy." Microscopy and Microanalysis 7, S2 (August 2001): 220–21. http://dx.doi.org/10.1017/s1431927600027173.

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The study of magnetic thin films by Lorentz microscopy in the transmission electron microscope (TEM) is a well-established technique. However, in many instances, images are recorded with the specimen in its as-grown state or in a single remanent state following application of a magnetic field outside the microscope. Although such images can provide valuable information, they rarely produce insight into the mechanism by which the magnetic material reverses nor do they show the magnetic structures that form during the reversal process. Furthermore, it is not possible to determine, for example, the field range over which a reversal takes place. Given the importance of such elements for magnetic sensing and storage applications, there is considerable incentive to develop techniques which not only yield the magnetisation loop for an individual element but which reveal how the spatial distribution of magnetisation evolves as a function of field.
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13

De Hosson, Jeff Th M., Nicolai G. Chechenin, Daan-Hein Alsem, Tomas Vystavel, Bart J. Kooi, Antoni R. Chezan, and Dik O. Boerma. "Ultrasoft Magnetic Films Investigated with Lorentz Tranmission Electron Microscopy and Electron Holography." Microscopy and Microanalysis 8, no. 4 (August 2002): 274–87. http://dx.doi.org/10.1017/s1431927602020214.

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As a tribute to the scientific work of Professor Gareth Thomas in the field of structure-property relationships this paper delineates a new possibility of Lorentz transmission electron microscopy (LTEM) to study the magnetic properties of soft magnetic films. We show that in contrast to the traditional point of view, not only does the direction of the magnetization vector in nano-crystalline films make a correlated small-angle wiggling, but also the magnitude of the magnetization modulus fluctuates. This fluctuation produces a rapid modulation in the LTEM image. A novel analysis of the ripple structure in nano-crystalline Fe-Zr-N film corresponds to an amplitude of the transversal component of the magnetization ΔMy of 23 mT and a longitudinal fluctuation of the magnetization of the order of ΔMx = 30 mT. The nano-crystalline (Fe99Zr1)1−xNx films have been prepared by DC magnetron reactive sputtering with a thickness between 50 and 1000 nm. The grain size decreased monotonically with N content from typically 100 nm in the case of N-free films to less than 10 nm for films containing 8 at%. The specimens were examined with a JEOL 2010F 200 kV transmission electron microscope equipped with a post column energy filter (GIF 2000 Gatan Imaging Filter). For holography, the microscope is mounted with a biprism (JEOL biprism with a 0.6 μm diameter platinum wire).
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14

de Hosson, Jeff T. M., and Hans A. De Raedt. "Nano-Structured Thin Films: A Lorentz Transmission Electron Microscopy and Electron Holography Study." Materials Science Forum 475-479 (January 2005): 4241–50. http://dx.doi.org/10.4028/www.scientific.net/msf.475-479.4241.

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This paper aims at applying advanced transmission electron microscopy (TEM) to functional materials, such as ultra-soft magnetic films for high-frequency inductors, to reveal the structure-property relationship. The ultimate goal is to delineate a more quantitative way to obtain information of the magnetic induction and local magnetization. Nano-crystalline Fe-Zr-N films have been prepared by DC magnetron reactive sputtering with a thickness between 50 and 500 nm. Conventional TEM and selected area diffraction (SAD), reveal crystallites of sizes ranging between 2 and 30 nm. The films showed a granular or hillock type of roughness with an rms amplitude of 5 nm. In particular this paper concentrates on an analysis of phase maps in electron holography and intensity maps in Lorentz transmission electron microscopy including the thickness variation over the sample. For a particular statistical description of the roughness and values for the roughness it is shown that analytical expressions can be obtained. We demonstrate that starting from the concept of the vector potential in classical electrodynamics these results can be achieved assuming independent stationary Gaussian distributions for the height correlation functions.
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15

Tonomura, Akira. "1-MV Field-Emission Transmission Electron Microscope." Microscopy and Microanalysis 7, S2 (August 2001): 918–19. http://dx.doi.org/10.1017/s143192760003066x.

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We developed a 1-MV field-emission transmission electron microscope to help in further improving electron holography, Lorentz microscopy, and high-resolution electron microscopy. This microscope is characterized by an electron beam having the highest brightness ever, 2×1010 A/cm2, and by the highest lattice-resolution below 0.5 Å. These two features were attained by minimizing the mechanical vibration of the whole column and by improving the stability of both the electron beam and the high voltage. If the tiny electron source located at the top of the 7-m-high microscope moves by as little as a fraction of the source size, 50 Å in diameter relative to the column, due to mechanical vibration or beam deflection by the AC magnetic fields, the beam brightness will be greatly degraded. If the ripples ΔE of the high-voltage E exceed ΔE/E = 5 × 10−7 /min, then the inherent monochromatic feature of the beam is deteriorated by the increase in energy spread.Through the preliminary experiments testing the vibration and magnetic shielding of the acceleration tube as well as the high stability of the high voltage, and through the numerical simulations on the vibration modes of the whole column, we were led to the conclusion that the microscope must be separated into three parts that are connected by cables.
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16

Wang, Binbin, Nuria Bagues, Tao Liu, Jiaqiang Yan, Roland Kawakami, and David McComb. "Spatial Frequency Selection in Lorentz 4D-Scanning Transmission Electron Microscopy Reconstruction." Microscopy and Microanalysis 26, S2 (July 30, 2020): 1902–5. http://dx.doi.org/10.1017/s1431927620019777.

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17

Tamura, Takahiro, Yukinori Nakane, Hiroshi Nakajima, Shigeo Mori, Ken Harada, and Yoshizo Takai. "Phase retrieval using through-focus images in Lorentz transmission electron microscopy." Microscopy 67, no. 3 (March 26, 2018): 171–77. http://dx.doi.org/10.1093/jmicro/dfy014.

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18

Zhang, Senfu, Junwei Zhang, Yan Wen, Yong Peng, Ziqiang Qiu, Takao Matsumoto, and Xixiang Zhang. "Deformation of Néel-type skyrmions revealed by Lorentz transmission electron microscopy." Applied Physics Letters 116, no. 14 (April 6, 2020): 142402. http://dx.doi.org/10.1063/5.0002592.

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19

McVitie, S., and U. Hartmann. "A study of the magnetic structure of magnetic force microscope tips using transmission electron microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 770–71. http://dx.doi.org/10.1017/s0424820100088166.

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Magnetic force microscopy (MFM) has become an important tool in the investigation of the micromagnetic structure of magnetic systems. The interaction of stray magnetic field from a sample with a sharp magnetic tip is measured as the tip is scanned across the surface of the sample. Characterisation of the tip-sample interaction is of paramount importance if the measured signal obtained by MFM is to be put on a quantitative basis. In this paper we describe the preliminary results obtained by studying MFM tips using the Lorentz techniques of transmission electron microscopy.The MFM tips were prepared from 25nm thick Ni wire by an electrolytic etching and polishing technique which produces tips with a sharp apex of radius <100nm. The nature of the tips meant that only the very end of the tips were thin enough to be observed using 200kV electrons in TEM.
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20

Matsui, I., T. Katsuta, T. Kawasaki, S. Hayashi, T. Furutsu, T. Onai, K. Myochin, et al. "Development of a 1MV-Field-Emission Electron Microscope I. Instrument." Microscopy and Microanalysis 6, S2 (August 2000): 1138–39. http://dx.doi.org/10.1017/s1431927600038186.

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We have developed 100-kV, 200-kV, and 350-kV cold-field-emission transmission electron microscopes (FE-TEMs) successively up to this time. Using these instruments, we have been studying the magnetic structure of materials, high-resolution imaging by electron holography, and dynamic observation of the vortex in superconductors by Lorentz microscopy. To make more progress in our research, we need a better electron beam in terms of coherency, beam brightness, and penetration. Here, we report a new lMV-cold-field-emission transmission electron microscope we have developed. Historically, the pioneering projects on a lMV-field-emission scanning transmission electron microscope (FE-STEM) (Zeitler and Crewe, 1974) and a 1.6MV FE-STEM (Jouffrey et al., 1984) have been reported. In 1988, Maruse and Shimoyama obtained a lMV-field-emission beam using their 1.25MV-STEM connected to a field-emission gun. Since then, continuous improvements in beam brightness has been made.The target specifications of our 1 MV-cold-field-emission TEM (H-1000FT) are as follows: Acceleration voltage: 1MV, high-voltage stability :
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21

Kim, Taeho Roy, Ai Leen Koh, and Robert Sinclair. "Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy." Microscopy and Microanalysis 20, S3 (August 2014): 286–87. http://dx.doi.org/10.1017/s1431927614003158.

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22

Chess, Jordan J., Sergio A. Montoya, Eric E. Fullerton, and Benjamin J. McMorran. "Determination of domain wall chirality using in situ Lorentz transmission electron microscopy." AIP Advances 7, no. 5 (May 2017): 056807. http://dx.doi.org/10.1063/1.4977500.

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23

Marshall, A. F., L. Klein, J. S. Dodge, C. H. Ahn, J. W. Reiner, L. Mieville, T. H. Geballe, M. R. Beasely, and A. Kapitulnik. "Magnetic and Crystallographic Microstructure of SrRuO3 Studied by Lorentz Transmission Electron Microscopy." Microscopy and Microanalysis 3, S2 (August 1997): 521–22. http://dx.doi.org/10.1017/s1431927600009491.

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SrRuO3 is a low temperature ferromagnet (Tc ≌ 150K) which has recently been investigated in thin film form due to its structural compatibility with other thin film perovskites materials of practical interest, including high-temperature superconductors. Magnetization studies of thin films of SrRuO3 deposited on cubic SrTiO3 indicate strong uniaxial anisotropy with the easy direction approximately along either the a or b axis, which are difficult to distinguish. The orthorhombic structure of SrRuO3 (a = 5.53, b = 5.57, c = 7.84 Å) has six symmetry-related orientations on the cubic substrate (a = 3.9Å). Using Lorentz transmission electron microscopy both the magnetic and the crystallographic domain microstructure are characterized.For TEM imaging the films are readily removed from the substrate by chemical etching, using a HF:HNO3:H2O etch of approximately 1:1:1 dilution. Free-floating SrRuO3 films of 300-1000Å in thickness are then supported on standard carbon/formvar films on Cu substrates.
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Toporov, A. Yu, R. M. Langford, and A. K. Petford-Long. "Lorentz transmission electron microscopy of focused ion beam patterned magnetic antidot arrays." Applied Physics Letters 77, no. 19 (November 6, 2000): 3063–65. http://dx.doi.org/10.1063/1.1323737.

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25

Walton, Stephanie K., Katharina Zeissler, Will R. Branford, and Solveig Felton. "MALTS: A Tool to Simulate Lorentz Transmission Electron Microscopy From Micromagnetic Simulations." IEEE Transactions on Magnetics 49, no. 8 (August 2013): 4795–800. http://dx.doi.org/10.1109/tmag.2013.2247410.

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Yu, Andrew C. C., Chester C. H. Lo, Amanda K. Petford-Long, David C. Jiles, and Terunobu Miyazaki. "Lorentz transmission electron microscopy and magnetic force microscopy characterization of NiFe/Al-oxide/Co films." Journal of Applied Physics 91, no. 2 (January 15, 2002): 780–84. http://dx.doi.org/10.1063/1.1427142.

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27

Dunin-Borkowski, R., L. Houben, J. Barthel, A. Thust, M. Luysberg, B. B. Chris, K. András, T. Kasama, R. J. Harrison, and J. R. Jinschek. "Opportunities for Chromatic Aberration Corrected High-Resolution Transmission Electron Microscopy, Lorentz Microscopy and Electron Holography of Magnetic Minerals." Microscopy and Microanalysis 18, S2 (July 2012): 1708–9. http://dx.doi.org/10.1017/s1431927612010392.

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28

Kashyap, Isha, Yongmei M. Jin, Eric P. Vetter, Jerrold A. Floro, and Marc De Graef. "Lorentz Transmission Electron Microscopy Image Simulations of Experimental Nano-Chessboard Observations in Co-Pt Alloys." Microscopy and Microanalysis 24, no. 3 (June 2018): 221–26. http://dx.doi.org/10.1017/s143192761800034x.

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AbstractThe magnetization configuration of a novel nano-chessboard structure consisting of L10and L12phases in a Co40Pt60alloy is investigated using Lorentz transmission electron microscopy (LTEM) and micro-magnetic simulations. We show high-resolution LTEM images of nano-size magnetic features acquired through spherical aberration correction in Lorentz Fresnel mode. Phase reconstructions and LTEM image simulations are carried out to fully understand the magnetic microstructure. The experimental Fresnel images of the nano-chessboard structure show zig-zag shaped magnetic domain walls at the inter-phase boundaries between L10and L12phases. A circular magnetization distribution with vortex and anti-vortex type arrangement is evident in the phase reconstructed magnetic induction maps as well as simulated maps. The magnetic contrast in experimental LTEM images is interpreted with the help of magnetic induction maps simulated for various relative electron beam-sample orientations inside the TEM.
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29

Phatak, C., E. Humphrey, M. DeGraef, and A. Petford-Long. "Determination of the 3-D Magnetic Vector Potential using Lorentz Transmission Electron Microscopy." Microscopy and Microanalysis 15, S2 (July 2009): 134–35. http://dx.doi.org/10.1017/s1431927609094665.

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30

Asaka, T., M. Nagao, T. Yokosawa, K. Kokui, E. Takayama-Muromachi, K. Kimoto, K. Fukuda, and Y. Matsui. "Magnetocrystalline anisotropy behavior in the multiferroic BiMnO3 examined by Lorentz transmission electron microscopy." Applied Physics Letters 101, no. 5 (July 30, 2012): 052407. http://dx.doi.org/10.1063/1.4742747.

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31

Mori, S., K. Yoshidome, Y. Nagamine, Y. Togawa, K. Yoshii, and K. Takenaka. "Lorentz transmission electron microscopy observation of magnetic domains in La0.825Sr0.175(Mn,Al)O3." Journal of Applied Physics 107, no. 9 (May 2010): 09D306. http://dx.doi.org/10.1063/1.3358225.

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32

Tang, K., M. R. Visokay, C. A. Ross, R. Ranjan, T. Yamashita, and R. Sinclair. "Lorentz transmission electron microscopy study of micromagnetic structures in real computer hard disks." IEEE Transactions on Magnetics 32, no. 5 (1996): 4130–32. http://dx.doi.org/10.1109/20.539317.

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McFadyen, Ian R. "Quantitative magnetic imaging in STEM using DPC." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 612–13. http://dx.doi.org/10.1017/s0424820100148897.

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Magnetic domains can be imaged by a number of techniques in the transmission electron microscope. These techniques rely on the Lorentz force and are thus known collectively as Lorentz microscopy. More accurately the interaction of a fast electron with the magnetic induction of a sample can be described as a change in the phase of the electron wave where the phase gradient is given by: where e is the electron charge, h is Plank’s constant, is the magnetic induction and is the unit vector along the electron trajectory. The integration from - ∞ to ∞ takes into account the magnetic stray fields in addition to the magnetic induction within the sample itself.Magnetic samples can therefore be regarded as phase objects and the magnetic structure can be revealed by phase contrast techniques and at best one could hope to get a map of the phase gradient which is linearly related to the integrated induction.
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34

McVitie, Stephen, and John N. Chapman. "Reversal Mechanisms in Lithographically Defined Magnetic Thin Film Elements Imaged by Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 3, no. 2 (March 1997): 146–53. http://dx.doi.org/10.1017/s1431927697970124.

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Abstract: The magnetic behavior of lithographically defined thin film elements of permalloy imaged by Lorentz microscopy is described. Elements of thickness <100 nm, with in-plane dimensions in the micron and sub-micron range and of varying shape, have been subjected to in situ fields using an electron microscope that has been optimized for magnetic imaging. The information provided from the imaging modes has identified the details of the magnetization reversal mechanisms in the elements during the course of a hysteresis cycle. In particular, domain wall clusters which form at the edges of the elements are observed prior to switching of the magnetization. Results are described from elements with near single and multidomain structures with different geometry.
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Harada, Ken. "Lorentz microscopy observation of vortices in high-Tcsuperconductors using a 1-MV field emission transmission electron microscope." Microscopy 62, suppl 1 (April 2, 2013): S3—S15. http://dx.doi.org/10.1093/jmicro/dft013.

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Murakami, Y., Ryosuke Kainuma, Daisuke Shindo, and Akira Tonomura. "Magnetic Microstructure Analysis of Ferromagnetic Shape Memory Alloys and Related Compounds." Materials Science Forum 684 (May 2011): 117–28. http://dx.doi.org/10.4028/www.scientific.net/msf.684.117.

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We performed magnetic imaging of Ni-based ferromagnetic shape memory alloys. The magnetic microstructure was revealed by Lorentz microscopy and electron holography, which are powerful tools based on transmission electron microscopy. Observations of Ni51Fe22Ga27 and Ni50Mn25Al12.5Ga12.5 alloys, both of which have an L21-ordered structure in the parent phase, demonstrated that the antiphase boundaries (i.e., a type of planer defects) caused significant changes in the magnetization distribution due to depression of the atomic order—actually, the magnetization in these alloys depends upon the degree of chemical order. We propose a method which estimates the important magnetic parameters (the magnetocrystalline anisotropy constant and exchange stiffness constant) based on transmission electron microscopy observations. This method should be useful in magnetic measurements of nanometer-scale areas, for which conventional techniques cannot be applied.
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NAGAO, Masahiro, Yeong-Gi SO, and Koji KIMOTO. "Lorentz Transmission Electron Microscopy Observation of Magnetic Skyrmion-like Clusters in a Ferromagnetic Oxide." Journal of the Vacuum Society of Japan 57, no. 10 (2014): 391–97. http://dx.doi.org/10.3131/jvsj2.57.391.

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Portier, X., A. K. Petford-Long, R. C. Doole, T. C. Anthony, and J. A. Brug. "Lorentz transmission electron microscopy on NiFe/Cu/Co/NiFe/MnNi active spin valve elements." Applied Physics Letters 71, no. 14 (October 6, 1997): 2032–34. http://dx.doi.org/10.1063/1.119778.

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39

Rajeswari, Jayaraman, Ping Huang, Giulia Fulvia Mancini, Yoshie Murooka, Tatiana Latychevskaia, Damien McGrouther, Marco Cantoni, et al. "Filming the formation and fluctuation of skyrmion domains by cryo-Lorentz transmission electron microscopy." Proceedings of the National Academy of Sciences 112, no. 46 (November 2, 2015): 14212–17. http://dx.doi.org/10.1073/pnas.1513343112.

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Magnetic skyrmions are promising candidates as information carriers in logic or storage devices thanks to their robustness, guaranteed by the topological protection, and their nanometric size. Currently, little is known about the influence of parameters such as disorder, defects, or external stimuli on the long-range spatial distribution and temporal evolution of the skyrmion lattice. Here, using a large (7.3×7.3 μm2) single-crystal nanoslice (150 nm thick) of Cu2OSeO3, we image up to 70,000 skyrmions by means of cryo-Lorentz transmission electron microscopy as a function of the applied magnetic field. The emergence of the skyrmion lattice from the helimagnetic phase is monitored, revealing the existence of a glassy skyrmion phase at the phase transition field, where patches of an octagonally distorted skyrmion lattice are also discovered. In the skyrmion phase, dislocations are shown to cause the emergence and switching between domains with different lattice orientations, and the temporal fluctuation of these domains is filmed. These results demonstrate the importance of direct-space and real-time imaging of skyrmion domains for addressing both their long-range topology and stability.
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40

Abarra, E. N., I. Okamoto, and T. Suzuki. "Magnetic force and Lorentz transmission electron microscopy analysis of bit transitions in longitudinal media." Journal of Applied Physics 85, no. 8 (April 15, 1999): 5015–17. http://dx.doi.org/10.1063/1.370076.

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Portier, X., A. K. Petford-Long, R. C. Doole, T. C. Anthony, and J. A. Brug. "In-situ magnetoresistance measurements on spin valve elements combined with Lorentz transmission electron microscopy." IEEE Transactions on Magnetics 33, no. 5 (1997): 3574–79. http://dx.doi.org/10.1109/20.619502.

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42

Pierobon, Leonardo, Robin E. Schäublin, and Jörg F. Löffler. "Comparison of conventional and Lorentz transmission electron microscopy in magnetic imaging of permanent magnets." Applied Physics Letters 119, no. 2 (July 12, 2021): 022401. http://dx.doi.org/10.1063/5.0055270.

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43

Tanigaki, Toshiaki, and Tetsuya Akashi. "Quantitative Magnetic Imaging of Skyrmions and Magnetic Thin Layers by Lorentz Transmission Electron Microscopy and Electron Holography." Microscopy and Microanalysis 24, S1 (August 2018): 928–29. http://dx.doi.org/10.1017/s1431927618005135.

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44

Aeschlimann, M., M. Scheinfein, J. Unguris, F. J. A. M. Greidanus, and S. Klahn. "Magnetic‐field‐modulated written bits in TbFeCo thin films: Transmission electron microscopy Lorentz and scanning electron microscopy with polarization analysis studies." Journal of Applied Physics 68, no. 9 (November 1990): 4710–18. http://dx.doi.org/10.1063/1.346151.

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45

Graef, M. De, N. T. Nuhfer, and M. R. McCartney. "Phase Contrast Of Magnetic Cobalt Spheres." Microscopy and Microanalysis 5, S2 (August 1999): 34–35. http://dx.doi.org/10.1017/s1431927600013490.

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The recent increased interest in Lorentz Microscopy methods is due to two important factors: (1) the advent of digital detection systems (CCD cameras) and advanced computer controlled transmission electron microscopes, and (2) the continually decreasing length scale of magnetic recording media and related magnetic materials. Along with the increased experimental resolution and detection sensitivity one should ask the question: how small a magnetic moment can one detect with conventional Lorentz or electron holography techniques? And, perhaps more importantly, which technique should one use to obtain the best spatial resolution? To address these questions we identified a simple model system :the uniformly magnetized sphere.The phase of the electron wave after passing through a region with a non-zero magnetic vector potential and an internal electrostatic potential Vscan be computed from the Aharonov-Bohm trajectory integral. For a spherical particle with a uniform magnetization and a constant mean inner potential (see geometry in Fig. la), this phase shift can be analytically computed.
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46

Petford-Long, Amanda K., Xavier Portier, Pascale Bayle-Guillemaud, Thomas C. Anthony, and James A. Brug. "In Situ Transmission Electron Microscopy Studies of the Magnetization Reversal Mechanism in Information Storage Materials." Microscopy and Microanalysis 4, no. 3 (June 1998): 325–33. http://dx.doi.org/10.1017/s1431927698980333.

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The Foucault and Fresnel modes of Lorentz microscopy, together with a quantitative magnetization mapping technique, summed image differential phase-contrast imaging, were used to study the magnetization reversal mechanism of the sense layer in spin-valve structures exhibiting the giant magnetoresistance effect. In addition to studies of sheet film, lithographically defined spin-valve elements were investigated. A current can be passed through the element during magnetizing so that the effect of the applied current on the giant magnetoresistance and magnetization reversal mechanism can be studied. Results are presented for a number of different spin-valve structures.
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47

Ahn, Jae-Pyoung, Sang-Won Yoon, and Sang-Woo Kim. "Magnetic properties of Fe75Si15Al10 crystalline powders and domain structural observations using Lorentz transmission electron microscopy." Journal of Applied Physics 103, no. 7 (April 2008): 07E719. http://dx.doi.org/10.1063/1.2831365.

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48

Zak, Andrzej M., and Wlodzimierz Dudzinski. "Microstructural and In Situ Lorentz TEM Domain Characterization of As-Quenched and γ’-Precipitated Co49Ni30Ga21 Monocrystal." Crystals 10, no. 3 (February 28, 2020): 153. http://dx.doi.org/10.3390/cryst10030153.

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The article concerns the rarely described magnetic domain structure of Heusler alloys in the case of a single crystal [100]-oriented Co-Ni-Ga alloy. The structure of the magnetic domains of the alloy was compared in two states: in the quenched and additionally aged state. Ageing led to precipitation of the spherical phase γ’ nanoparticles (Co-rich, FCC lattice with a = 0.359 nm). Lorentz transmission electron microscopy observation methods combined with cooling and in situ heating of the sample in the transmission electron microscope in the temperature range from 140 K to 300 K were combined to observe the magnetic domain structure. Significant differences in the dimensions and morphology of magnetic domain boundaries have been demonstrated. The quenched sample showed no change in stripe domain structure when the aged sample showed significant development of branching magnetic structures. This may be due to a change in the chemical composition of the matrix resulting from a decrease in cobalt and nickel content at the expense of precipitations.
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49

Kasama, T., R. E. Dunin-Borkowski, T. Asaka, R. J. Harrison, R. K. K. Chong, S. A. McEnroe, E. T. Simpson, Y. Matsui, and A. Putnis. "The application of Lorentz transmission electron microscopy to the study of lamellar magnetism in hematite-ilmenite." American Mineralogist 94, no. 2-3 (February 1, 2009): 262–69. http://dx.doi.org/10.2138/am.2009.2989.

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50

Bagues, Nuria, Binbin Wang, Tao Liu, Camelia Selcu, Stephen Boona, Roland Kawakami, Mohit Randeria, and David McComb. "Imaging of Magnetic Textures in Polycrystalline FeGe Thin Films via in-situ Lorentz Transmission Electron Microscopy." Microscopy and Microanalysis 26, S2 (July 30, 2020): 1700–1702. http://dx.doi.org/10.1017/s1431927620019029.

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