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Journal articles on the topic 'Low-energy electron diffraction (LEED) and reflection high-energy electron diffraction (RHEED)'

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Published: 4 June 2021

Last updated: 1 February 2022

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1

Gajdardziska-Josifovska, M., J. K. Weiss, and J. M. Cowley. "Energy-filtered convergent beam RHEED rocking curves from cleaved (100) surface of MgO." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 626–27. http://dx.doi.org/10.1017/s0424820100087446.

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Reflection high energy electron diffraction (RHEED) has been used extensively to observe changes in surface reconstructions by analyzing the geometry of the RHEED pattern and to monitor growth of layers in MBE systems by measuring the changes of the intensity of the specular spot with time. RHEED is also capable of yielding the structure of the surface by using dynamical diffraction theory to analyze experimental reflection rocking curves. These rocking curves trace the change in the intensity of the RHEED spots as a function of the angle of incident illumination. They are equivalent to the in

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2

Sakai, Y., S. Kitamura, and A. D. Buonaquisti. "Microprobe AES Combined With Scanning RHEED Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 368–69. http://dx.doi.org/10.1017/s0424820100135447.

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Surface micro-structure analysis is very important for surface study in material science. Observations of surface atomic steps and reconstructed structures have been made using several techniques: reflection high energy electron microscopy (RHEEM), low energy electron reflection microscopy (LEERM) and low energy electron diffraction microscopy (LEEDM).In the present experiment, observations of surface micro-structures have been made using a scanning type reflection high energy electron diffraction (RHEED) microscopy. This technique has certain advantages of easy combinations with multiple surf

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3

Venables, J. A., C. J. Harland, P. A. Bennett, and T. E. A. Zerrouk. "Electron diffraction in UHV SEM, REM, and TEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 594–95. http://dx.doi.org/10.1017/s0424820100170700.

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Electron diffraction techniques are widely used in Surface Science, with the main aim of determining atomic positions in surface reconstructions and the location of adsorbed atoms. These techniques require an Ultra-high vacuum (UHV) environment. The use of a focussed beam in UHV electron microscopes in principle allows such techniques to be applied on a microscopic scale. Most obviously this has been achieved in the Low Energy Electron Microscope (LEEM), where the corresponding diffraction technique, LEED, can now be used to investigate local areas with different surface structures, and to fol

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4

El-Jawad, Mohammad, Bruno Gilles, and Frederic Maillard. "Oxygen-Induced Formation of Nanopyramids on W(111)." Advanced Materials Research 324 (August 2011): 109–12. http://dx.doi.org/10.4028/www.scientific.net/amr.324.109.

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In this study, we investigated the role of oxygen in the faceting of the W(111) surface at temperatures close to T = 2000°C. For that purpose, we characterized the W(111) surface before and after the annealing step by low energy electron diffraction (LEED), reflection high energy electron diffraction (RHEED), scanning tunneling microscopy (STM), and Auger electron spectroscopy (AES). It is found that W(111) undergoes a massive reconstruction to form three sided pyramids of nanometer dimensions with mainly {211} planes as facet sides. Interestingly, the facetted W(111) surface is deprived from

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5

Kersker, Michael M. "Stm at High Temperature: What you see is what you see … usually." Microscopy Today 1, no. 5 (1993): 4. http://dx.doi.org/10.1017/s1551929500068048.

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There remains two basic axioms of all microscopists: the first….if you look, you're bound to see something, and the second….not everything you will see is artifact. These axioms apply particularly well to scanning probe microscopy at the molecular and atomic level. Fortunately, coarser resolution images share comforting similarities with images from other established scanning methods. Holes in optical discs look like holes when probed with AFM tips, and these holes look very much like SEM images, a subject with which we have some familiarity. At the molecular and atomic level, however, the sca

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6

Endo, Akira, Hiroshi Daimon, and Shozo Ino. "UHV-Sem Observation of Si(111) Surface Partially Covered with Surface Structure Induced by Au or Ag." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 304–5. http://dx.doi.org/10.1017/s0424820100180276.

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It is well known from LEED (low energy electron diffraction) and RHEED (reflection high energy electron diffraction) studies that when Au or Ag is deposited onto a clean Si (111) surface, many surface superstructures, for example 5×2-Au, √3 × √3-Ag etc. are formed depending upon the substrate temperatures and the coverages of the metals. Applying REM (reflection electron Microscopy) method. Osakabe et al. observed domains of these surface structures in real space, but detailed domain structures are not clear because the method cannot obtain high resolution due to the foreshortening effect. We

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7

Loretto, D., J. M. Gibson, and S. M. Yalisove. "Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 462–63. http://dx.doi.org/10.1017/s0424820100154287.

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The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system

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8

Liu, J., L. Wang, and J. M. Cowley. "REM observations of oxygen-annealed rutile (001) surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 646–47. http://dx.doi.org/10.1017/s0424820100087549.

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Rutile (single crystal TiO2) is widely used in electrochemistry, photochemical energy conversion and photocatalytic reactions of gases as a catalytic material. It is important to characterize the surface properties of rutile in order to understand its catalytic behavior. The rutile (001) surface is extremely unstable, forming facets on annealing as revealed by the LEED results. In this paper we report some preliminary results on the investigation of oxygen annealed rutile (001) surface, obtained by reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) tec

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9

Weierstall, U., J. M. Zuo, T. Kjørsvikf, and J. C. H. Spence. "A UHV Diffraction Camera With Energy Filter for Convergent Beam RHEED and TED." Microscopy and Microanalysis 5, S2 (1999): 206–7. http://dx.doi.org/10.1017/s1431927600014355.

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A UHV diffraction camera has been built which can be used in either transmission or reflection mode. Fig. 1 shows a schematic view of the instrument. The optical axis of the instrument is vertical, with gun below and a downward-looking CCD camera on top. The pressure with gun operating is 1×10−10 Torr. An ion pump and oil-free turbo system is used. The electron gun is a fully bakeable custom UHV RHEED gun with LaB emitter and two magnetic lenses. This allows the beam to be focused to an area of about 1 micron on the surface of the sample. The gun works in the energy range of l-50keV. A double

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10

Ichikawa, Masakazu. "Reflection High-Energy Electron Diffraction (RHEED)." Zairyo-to-Kankyo 43, no. 1 (1994): 35–44. http://dx.doi.org/10.3323/jcorr1991.43.35.

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11

MAKSYM, P. A. "COMPUTATIONAL THEORY OF REFLECTION HIGH ENERGY ELECTRON DIFFRACTION." Surface Review and Letters 04, no. 03 (1997): 513–24. http://dx.doi.org/10.1142/s0218625x97000493.

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The theory of reflection high energy electron diffraction (RHEED) by crystal surfaces is reviewed, with special emphasis on computational techniques. Multiple scattering is accounted for by solving the Schrödinger equation exactly to obtain the amplitudes of the diffracted beams above the surface. The surface and substrate are divided into atomic layers and the RHEED intensities for the entire system are determined from the scattering properties of the individual layers. Alternative methods for implementing this approach are explained and compared. Recent applications to analysis of real RHEED

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12

LIU, JINGYUE. "Energy-filtered reflection electron microscopy and reflection high-energy electron diffraction on Zeiss 912 TEM." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 580–81. http://dx.doi.org/10.1017/s0424820100148733.

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In reflection electron microscopy (REM) and reflection high energy electron diffraction (RHEED) the average path length of the elastically scattered electrons in the crystal ranges from 10 -100 nm and a significant portion of the electrons in the RHEED pattern spots used for imaging is inelastically scattered. The excitations of surface plasmons, bulk plasmons and valence electrons involves energy losses of 10 ∽30 eV. Thus the image contrast and resolution in REM are degraded due to chromatic aberration of the objective lens. The use of energy filters in a TEM should offer significant improvem

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13

ICHIMIYA, AYAHIKO, YUSUKE OHNO, and YOSHIMI HORIO. "STRUCTURAL ANALYSIS OF CRYSTAL SURFACES BY REFLECTION HIGH ENERGY ELECTRON DIFFRACTION." Surface Review and Letters 04, no. 03 (1997): 501–11. http://dx.doi.org/10.1142/s0218625x97000481.

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For surface structure determinations by reflection high energy electron diffraction (RHEED), intensity rocking curves are analyzed through RHEED dynamical calculations. Since fast electrons are scattered dominantly in the forward direction by atoms, dynamic diffraction mainly occurs in the forward direction. By the use of this feature, it is possible to choose a diffraction condition under which electrons are diffracted mainly by lattice planes parallel to the surface, when the incident direction is chosen at a certain azimuthal angle with respect to a crystal zone axis. This diffraction condi

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14

Egelhoff, W. F., and I. Jacob. "Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K." Physical Review Letters 62, no. 13 (1989): 1577. http://dx.doi.org/10.1103/physrevlett.62.1577.5.

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15

Egelhoff, W. F., and I. Jacob. "Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K." Physical Review Letters 62, no. 8 (1989): 921–24. http://dx.doi.org/10.1103/physrevlett.62.921.

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16

Mitura, Zbigniew. "Comparison of azimuthal plots for reflection high-energy positron diffraction (RHEPD) and reflection high-energy electron diffraction (RHEED) for Si(111) surface." Acta Crystallographica Section A Foundations and Advances 76, no. 3 (2020): 328–33. http://dx.doi.org/10.1107/s2053273320001205.

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Azimuthal plots for RHEPD (reflection high-energy positron diffraction) and RHEED (reflection high-energy electron diffraction) were calculated using dynamical diffraction theory and then compared. It was assumed that RHEPD and RHEED azimuthal plots can be collected practically by recording the intensity while rotating the sample around the axis perpendicular to the surface (for the case of X-ray diffraction, such forms of data are called Renninger scans). It was found that RHEPD plots were similar to RHEED plots if they were compared at Bragg reflections of the same order. RHEPD plots can als

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17

ZHAO, T. C., A. IGNATIEV, and S. Y. Tong. "DYNAMICAL EFFECTS IN REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION INTENSITY OSCILLATIONS." Surface Review and Letters 01, no. 02n03 (1994): 253–60. http://dx.doi.org/10.1142/s0218625x94000254.

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Intensity oscillations during MBE growth are simulated by periodic arrays of steps using dynamical multiple scattering theory of RHEED. Our results show that the oscillations depend strongly upon the scattering geometry. Phase effects, double periodicity, etc. observed in experiments can be explained within the framework of dynamical scattering. Conditions for which a simple interpretation of the oscillations can be made are also discussed.

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18

Müller, Bert, and Martin Henzler. "Comparison of reflection high-energy electron diffraction and low-energy electron diffraction using high-resolution instrumentation." Surface Science 389, no. 1-3 (1997): 338–48. http://dx.doi.org/10.1016/s0039-6028(97)00447-0.

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19

ATWATER, HARRY A., C. C. AHN, S. S. WONG, G. HE, H. YOSHINO, and S. NIKZAD. "ENERGY-FILTERED RHEED AND REELS FOR IN SITU REAL TIME ANALYSIS DURING FILM GROWTH." Surface Review and Letters 04, no. 03 (1997): 525–34. http://dx.doi.org/10.1142/s0218625x9700050x.

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Energy-filtered reflection high energy electron diffraction and reflection electron energy loss spectroscopy expand the usefulness of reflection high energy electron diffraction for quantitative structure determination and surface spectroscopy during film growth. Several implementations of energy-filtered reflection high energy electron diffraction are discussed, along with the progress and prospects for structure determination. New developments in parallel detection reflection electron energy loss spectroscopy (PREELS) enable the use of this method to obtain surface-spectroscopic information

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20

SHIGETA, Y., and Y. FUKAYA. "STUDY OF STRUCTURE CHANGES ON THESiSURFACES USING REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION." International Journal of Modern Physics B 18, no. 03 (2004): 289–316. http://dx.doi.org/10.1142/s021797920402388x.

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In order to investigate surface structure change due to phase transition, surface melting, surface segregation and thin film growth, we have developed a new system for reflection high-energy electron diffraction (RHEED) with two pairs of magnetic coils to measure rocking curves in short time. This system is the most suitable tool to determine the structure change with temperature in a wide range, and we studied the dynamical structure change during film growth of Si on Si (111) and the phase transitions of Si (111) and Si (100) surfaces at high temperature.

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21

Peng, L. M., and J. M. Cowley. "Reflection monolayer scattering and RHEED diffraction conditions." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 962–63. http://dx.doi.org/10.1017/s0424820100106879.

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In an infinite crystal, when the fast electrons are transmitted through the crystal, the effects of the periodic potential distribution on the incident electron wave can be best described by expanding the electron wavefunction in terms of propagating Bloch waves having the same periodicity as that of the crystal. The requirement for a three dimensional translation symmetry excludes the existence of evanescent Bloch waves with imaginary component of wave vector. With the presence of external surfaces, as in the case of reflection high energy electron diffraction (RHEED), the translation symmetr

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22

Ghosh, Mithun, and Ding-Shyue Yang. "Structures of self-assembled n-alkanethiols on gold by reflection high-energy electron diffraction." Physical Chemistry Chemical Physics 22, no. 30 (2020): 17325–35. http://dx.doi.org/10.1039/d0cp02866e.

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23

ICHIMIYA, AYAHIKO. "Characterization of surface structure. Reflection high energy electron diffraction-Auger electron spectroscopy (RHEED-AES method)." Nihon Kessho Gakkaishi 29, no. 2 (1987): 152–53. http://dx.doi.org/10.5940/jcrsj.29.152.

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24

ZHAO, T. C., S. Y. TONG, and A. IGNATIEV. "DETERMINATION OF LINEAR-CHAIN MULTIPLE BOUND STATE RESONANCES IN REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION." Surface Review and Letters 01, no. 02n03 (1994): 261–71. http://dx.doi.org/10.1142/s0218625x94000266.

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Using the R-matrix dynamical theory of Reflection High-Energy Electron Diffraction (RHEED), we analyze the intensity anomalies commonly observed in RHEED rocking curves. Results for Ag(001) and Pt(111) show that the anomalies are associated with the trapping of particular components of the electron wave field inside the crystal by linear chain potential parallel to the surface. These pseudobound states correspond to minima in the total elastic flux of an ultrathin film (≤10 monolayer) and maxima in the inelastic flux. The discrete energy levels of the bound states in Ag(001) and Pt(111) are de

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25

Ichinokawa, Takeo. "Scanning Low-Energy Electron Diffraction Microscopy Combined with Scanning Tunnling Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 302–3. http://dx.doi.org/10.1017/s0424820100180264.

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A ultra-high vacuum scanning electron microscope (UHV-SEM) with a field emission gun (FEG) has been operated in an energy range of from 100 eV to 3 keV. A new technique of scanning low energy electron diffraction (LEED) microscopy has been added to the other techniques: scanning Auger microscopy (SAM), secondary electron microscopy, electron energy loss microscopy and the others available for the UHV-SEM. In addition to scanning LEED microscopy, a scanning tunneling microscope (STM) has been installed in the UHV-SEM-.The combination of STM with SEM covers a wide magnification range from 105 to

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Griesche, J., and K. Jacobs. "Reflection high-energy electron diffraction (RHEED) oscillations in phase-locked epitaxy of ZnSe." Journal of Crystal Growth 203, no. 1-2 (1999): 45–50. http://dx.doi.org/10.1016/s0022-0248(99)00090-1.

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Hyodo, Toshio, Yuki Fukaya, Izumi Mochizuki, et al. "Surface sensitivity of total reflection high-energy positron diffraction." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1611. http://dx.doi.org/10.1107/s2053273314083880.

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"Reflection high-energy positron diffraction (RHEPD) is the positron counterpart of reflection high-energy electron diffraction (RHEED). RHEPD was proposed in 1992 [1], and first demonstrated in 1998 [2]. Unlike the case of the electron, the potential energy of the positron inside a crystal is positive, and hence positrons incident on a crystal surface with a glancing angle smaller than a certain critical angle are totally reflected. This feature makes the positrons a tool extremely sensitive to the topmost layer of the crystal surface. Recent development of a brightness-enhanced intense posit

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DUDAREV, S. L., and M. J. WHELAN. "RESONANCE SCATTERING OF HIGH ENERGY ELECTRONS BY A CRYSTAL SURFACE." International Journal of Modern Physics B 10, no. 02 (1996): 133–68. http://dx.doi.org/10.1142/s0217979296000064.

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In this review we summarize the results of recent experimental and theoretical studies of the phenomenon known as resonance scattering of high-energy electrons from crystal surfaces. Resonance scattering is responsible for the appearance of bright features observed in reflection high-energy electron diffraction (RHEED) patterns and has found numerous applications in reflection electron microscopy and in RHEED studies of dynamics of molecular beam epitaxial growth of semiconductor crystals. The origin of the effect remained obscure for more than sixty years following the discovery of resonance

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29

Ishibashi, Yoshihiro. "Intensity Oscillation of Reflection High-Energy Electron Diffraction(RHEED) by a Polynuclear Growth Model." Journal of the Physical Society of Japan 60, no. 10 (1991): 3215–17. http://dx.doi.org/10.1143/jpsj.60.3215.

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30

Lehmpfuhl, G., and W. C. T. Dowell. "Convergent-beam reflection high-energy electron diffraction (RHEED) observations from an Si(111) surface." Acta Crystallographica Section A Foundations of Crystallography 42, no. 6 (1986): 569–77. http://dx.doi.org/10.1107/s0108767386098720.

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31

Spence, J. C. H., H. C. Poon, and D. K. Saldin. "Convergent-Beam Low Energy Electron Diffraction (CBLEED) and the Measurement of Surface Dipole Layers." Microscopy and Microanalysis 10, no. 1 (2004): 128–33. http://dx.doi.org/10.1017/s1431927604040346.

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We propose the formation of LEED patterns using a highly convergent beam forming a probe of nanometer dimensions. A reflection rocking curve may then be recorded in many diffraction orders simultaneously. Multiple scattering calculations show that the intensity variations within these rocking curves is as sensitive to the parameters describing the surface dipole layer as conventional I/V scans. However the data may be collected from areas sufficiently small to avoid defects and surface steps, radiation damage controlled by use of low voltages, and the information depth selected by choice of th

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Bauer, E., A. Pavlovska, and I. S. T. Tsong. "In Situ Nitride Growth Studies by Low Energy Electron Microscopy (LEEM) and Low Energy Electron Diffraction (LEED)." Microscopy and Microanalysis 3, S2 (1997): 611–12. http://dx.doi.org/10.1017/s1431927600009946.

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Nitride films play an increasing role in modern electronics, for example silicon nitride as insulating layer in Si-based devices or GaN in blue light emitting diodes and lasers. For this reason they have been the subject of many ex situ electron microscopic studies. A much deeper understanding of the growth of these important materials can be obtained by in situ studies. Although these could be done by SEM, LEEM combined with LEED is much better suited because of its excellent surface sensitivity and diffraction contrast. We have in the past studied the high temperture nitridation of Si(l11) b

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YAMANAKA, TOSHIRO, and SHOZO INO. "ELECTRON STANDING WAVES AT A SURFACE DURING REFLECTION HIGH ENERGY ELECTRON DIFFRACTION AND APPLICATION TO STRUCTURE ANALYSIS." International Journal of Modern Physics B 14, no. 21 (2000): 2171–222. http://dx.doi.org/10.1142/s0217979200002326.

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During observation of reflection high energy electron diffraction (RHEED), the interference between the incident and diffracted beams leads to the formation of surface electron standing waves. Characteristic X-ray emission is strongly excited if the atom exists in a strong wave field. Therefore, X-ray yields depends on the position of the atom and incident glancing angle (θg) of the electron beam, since the distribution of these waves changes with θg. Such anomalous intensities of X-ray emission are clearly observed under both Bragg and surface wave resonance conditions. By using these intensi

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Anstis, G. R. "A `three-beam' analysis of resonance scattering in reflection high-energy electron diffraction." Acta Crystallographica Section A Foundations of Crystallography 55, no. 2 (1999): 197–203. http://dx.doi.org/10.1107/s0108767398009003.

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Enhanced reflection of fast electrons from a crystal surface and a decrease in the depth of penetration of the primary beam occurs when diffraction conditions are such as to set up a wave travelling just beneath the crystal surface. This is the surface resonance condition for reflection high-energy electron diffraction (RHEED). Quantitative prediction of these effects can be achieved by assuming that only the primary and two diffracted beams are significant. Expressions for the coefficient of reflection and the depth of penetration in terms of a few Fourier coefficients of an effective potenti

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35

Eades, J. A. "Microdiffraction and convergent-beam diffraction from surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 526–27. http://dx.doi.org/10.1017/s0424820100154603.

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Microdiffraction from surfaces at near grazing incidence is an important method of surface characterization. It is very much akin to RHEED (reflection high-energy electron diffraction) except that in RHEED a large area of sample (∼ 1 mm2) contributes to the diffraction. In this respect the relationship between RHEED and surface microdiffraction is analogous to that between selected-area diffraction and microdiffraction in transmission. In addition RHEED systems usually have no post-specimen lenses and therefore operate at a fixed camera length.Surface microdiffraction can contribute important

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KORTE, UWE. "INTERPRETATION OF REFLECTION HIGH ENERGY ELECTRON DIFFRACTION FROM DISORDERED SURFACES: DYNAMICAL THEORY AND ITS APPLICATION TO THE EXPERIMENT." Surface Review and Letters 06, no. 03n04 (1999): 461–95. http://dx.doi.org/10.1142/s0218625x99000469.

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Reflection high energy electron diffraction (RHEED) is one of the few surface science techniques that are applied in a fabrication process, namely to monitor the epitaxial growth of ultrathin films and advanced materials. In spite of this technological relevance the multiple scattering nature of the involved scattering processes has hindered the quantitative interpretation of RHEED in the case of real, i.e. imperfect, surfaces for a long time. This article reviews recent progress in the understanding of RHEED from surfaces exhibiting various types of disorder. It concentrates on a multiple sca

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Kim, Yootaek, and Tung Hsu. "The Panoramic Rheed Patterns." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (1990): 324–25. http://dx.doi.org/10.1017/s0424820100180379.

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When applying the reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) methods[1] on the study of crystal surfaces it is necessary to index the RHEED spots and recognize the azimuth of the electron beam direction. This can be difficult because the RHEED pattern, unlike the transmission electron diffraction (TED) pattern, is distorted by the inner potential of the specimen and only one half of the pattern is shown. We found that it is useful, at the beginning of working on a certain surface of a certain crystal, to record a panoramic RHEED pattern by rota

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HENZLER, M. "CAPABILITIES OF LEED FOR DEFECT ANALYSIS." Surface Review and Letters 04, no. 03 (1997): 489–500. http://dx.doi.org/10.1142/s0218625x9700047x.

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A diffraction pattern using low or high energy electron diffraction may be employed via the (integral) intensity of the spots to derive the atomic positions within a unit of a periodic arrangement. Spot profile analysis (SPA) provides information on periodic and nonperiodic arrangements of units as superstructure domains, terraces or facets, strained regions and so on. The first point will be the instrumentation suited for that type of analysis (SPA-LEED, SPA-RHEED and ELS-LEED, the latter using high resolution electron energy loss spectroscopy simultaneously with SPA). It will be discussed ho

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Ma, Y., and L. D. Marks. "Bloch-wave solution in the Bragg case." Acta Crystallographica Section A Foundations of Crystallography 45, no. 2 (1989): 174–82. http://dx.doi.org/10.1107/s0108767388010888.

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The Bloch-wave method for reflection diffraction problems, primarily electron diffraction as in reflection high-energy electron diffraction (RHEED) and reflection electron microscopy (REM), is developed. The basic Bloch-wave approach for surfaces is reviewed, introducing the current flow concept which plays a major role both in understanding reflection diffraction and determining the allowed Bloch waves. This is followed by a brief description of the numerical methods for obtaining the results including specific results for GaAs near to the [010] zone axis. A number of other Bloch-wave phenome

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40

Müller, B., and M. Henzler. "SPA‐RHEED—A novel method in reflection high‐energy electron diffraction with extremely high angular and energy resolution." Review of Scientific Instruments 66, no. 11 (1995): 5232–35. http://dx.doi.org/10.1063/1.1146090.

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Nishitani-Gamo, Mikka, Isao Sakaguchi, Kian Ping Loh, Tomohide Takami, Isao Kusunoki, and Toshihiro Ando. "Reflection high-energy electron diffraction and low energy electron diffraction studies of the homoepitaxially grown diamond (111) and (001) surfaces." Diamond and Related Materials 8, no. 2-5 (1999): 693–700. http://dx.doi.org/10.1016/s0925-9635(98)00415-4.

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Smith, David J., M. Gajdardziska-Josifovska, and M. R. McCartney. "Surface studies with a UHV-TEM." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.

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The provision of ultrahigh vacuum capabilities, as well as in situ specimen treatment and annealing facilities, makes the transmission electron microscope into a potentially powerful instrument for the characterization of surfaces. Several operating modes are available, including surface profile imaging, reflection electron microscopy (REM), and reflection high energy electron diffraction (RHEED), as well as conventional transmission imaging and diffraction. All of these techniques have been utilized in our recent studies of surface structures and reactions for various metals, oxides and semic

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Souda, Ryutaro, and Takashi Aizawa. "Reflection high energy electron diffraction (RHEED) study of ice nucleation and growth on Ni(111): influences of adspecies and electron irradiation." Physical Chemistry Chemical Physics 21, no. 35 (2019): 19585–93. http://dx.doi.org/10.1039/c9cp03082d.

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Iwata, Y., H. Kobayashi, S. Kikuchi, E. Hatta, and K. Mukasa. "In situ reflection high-energy electron diffraction (RHEED) observation of Bi2Te3/Sb2Te3 multilayer film growth." Journal of Crystal Growth 203, no. 1-2 (1999): 125–30. http://dx.doi.org/10.1016/s0022-0248(99)00055-x.

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INO, Shozo. "Study of Epitaxy by RHEED(Reflection High Energy Electron Diffraction)-TRAXS(Total Reflection Angle X-Ray Spectroscopy)." Analytical Sciences 11, no. 3 (1995): 539–43. http://dx.doi.org/10.2116/analsci.11.539.

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ICHIMIYA, AYAHIKO, and YUSUKE OHNO. "STRUCTURAL ANALYSIS OF IMPERFECT CRYSTAL SURFACES BY REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION: ANTIPHASE DOMAINS OF A ${\rm Si}(111)(\sqrt 3 \times\sqrt 3)$-Ag SURFACE." Surface Review and Letters 04, no. 05 (1997): 985–90. http://dx.doi.org/10.1142/s0218625x97001164.

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For dynamical calculations of reflection high-energy electron diffraction (RHEED) for imperfect crystal surfaces, a general formula of Fourier coefficients of crystal potential with domain structures is developed. Using the formula, RHEED intensity rocking curves are calculated for a [Formula: see text]-Ag surface with antiphase domains. We discuss effects of antiphase domains of surfaces in structure determinations by RHEED.

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Hsu, Tung. "Reflection electron microscopy (REM) of NaCl crystals." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 808–9. http://dx.doi.org/10.1017/s0424820100171778.

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NaCl and other alkaline halide crystals are unstable under the electron beam and therefore have seldom been examined with the various electron beam techniques. Surfaces of these crystals, however, are of fundamental and application interests. There has been a considerable effort in studying these surfaces using the replica methods.Reflection high energy electron diffraction (RHEED) and reflection electron microscopy (REM) have been successfully applied to the study of stable insulators. Since direct observation on an uncoated surface is always desirable, we tried RHEED and REM on cleaved NaCl(

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Okada, Katsuyuki, Shojiro Komatsu, and Seiichiro Matsumoto. "Preparation of microcrystalline diamond in a low pressure inductively coupled plasma." Journal of Materials Research 14, no. 2 (1999): 578–83. http://dx.doi.org/10.1557/jmr.1999.0082.

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A 13.56 MHz low pressure inductively coupled plasma (ICP) has been applied to prepare diamond films. The Faraday shield drastically suppressed the electrostatic coupling, which frequently causes contamination due to the etching of the quartz tube. The characterizations of the obtained deposits by scanning electron microscopy (SEM), transmission electron diffraction (TED), and reflection high energy electron diffraction (RHEED) revealed that the deposits are composed of microcrystalline diamond and disordered microcrystalline graphite. The CO additive to a CH4/H2 plasma brought about the morpho

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Wang, L., J. Liu, and J. M. Cowley. "Zero-Loss Energy Filtered REM and RHEED Observations on Rutile (110) Surface." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 968–69. http://dx.doi.org/10.1017/s0424820100150678.

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In reflection electron microscopy (REM), the surface reflection electrons undergo both elastic and inelastic scattering within a crystal. The dominant inelastic processes are phonon scattering, valence electron excitation, bulk and surface plasmon excitation and combinations of these processes. Multiple inelastic scattering processes are also probable as the mean traveling distance of surface reflection electrons is about 10 to 100 nm. In reflection high energy electron diffraction pattern (RHEED), 50% to 90% of the electrons contributing to surface reflection spots used for imaging have suffe

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Mitura, Zbigniew. "Theoretical analysis of reflection high-energy electron diffraction (RHEED) and reflection high-energy positron diffraction (RHEPD) intensity oscillations expected for the perfect layer-by-layer growth." Acta Crystallographica Section A Foundations and Advances 71, no. 5 (2015): 513–18. http://dx.doi.org/10.1107/s2053273315010608.

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Predictions from two theoretical models, allowing one to determine the phase of intensity oscillations, are compared for reflected beams of electrons and positrons. Namely, results of the precise dynamical calculations are compared with results obtained using a simplified approach. Within the simplified model, changes in the specularly reflected beam intensity, expected to occur during the deposition of new atoms, are described with the help of interfering waves and the effect of refraction, and respective approximate analytical formulas are employed to determine the phase of the oscillations.

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