Journal articles on the topic 'Low workfunction metal'
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Labed, Madani, Nouredine Sengouga та You Seung Rim. "Control of Ni/β-Ga2O3 Vertical Schottky Diode Output Parameters at Forward Bias by Insertion of a Graphene Layer". Nanomaterials 12, № 5 (2022): 827. http://dx.doi.org/10.3390/nano12050827.
Full textSoni, Deepak, Amit Kumar Behera, Dheeraj Sharma, Dip Prakash Samajdar, and Dharmendra Singh Yadav. "Structural Modification of Doped Tunnel Field Effect Transistor for Enhanced Conduction Current and Lower Subthreshold Swing." Journal of Nanoelectronics and Optoelectronics 14, no. 11 (2019): 1539–47. http://dx.doi.org/10.1166/jno.2019.2665.
Full textKumar, Pushpendra, Florian Domengie, Charles Leroux, Patrice Gergaud, and G. Ghibaudo. "Impact of CMOS TiN metal gate process on microstructure and its correlation with electrical properties." MRS Advances 4, no. 27 (2019): 1565–71. http://dx.doi.org/10.1557/adv.2019.77.
Full textOh, Yong-Ho, and Young-Min Kim. "Gate Workfunction Optimization of a 32 nm Metal Gate MOSFET for Low Power Applications." Journal of Electrical Engineering and Technology 1, no. 2 (2006): 237–40. http://dx.doi.org/10.5370/jeet.2006.1.2.237.
Full textPan, James, Shamima Afroz, Scott Suko, James D. Oliver, and Thomas Knight. "High Workfunction, Compound Gate Metal Engineering for Low DIBL, High Gain, High Density Advanced RF Power Static Induction Transistor (SIT) and HV Schottky Diode in 4H Silicon Carbide." Materials Science Forum 924 (June 2018): 641–44. http://dx.doi.org/10.4028/www.scientific.net/msf.924.641.
Full textKim, Mansu, Geun-Chae Yu, and Young Chul Kim. "Effects of Low Workfunction Metal Acetate Layers on the Electroluminescent Characteristics of Organic Light-Emitting Diodes." Korean Chemical Engineering Research 51, no. 5 (2013): 634–39. http://dx.doi.org/10.9713/kcer.2013.51.5.634.
Full textYoon, Young Jun, Hye Rim Eun, Jae Hwa Seo, et al. "Short-Channel Tunneling Field-Effect Transistor with Drain-Overlap and Dual-Metal Gate Structure for Low-Power and High-Speed Operations." Journal of Nanoscience and Nanotechnology 15, no. 10 (2015): 7430–35. http://dx.doi.org/10.1166/jnn.2015.11146.
Full textPan, J., A. Gaibrois, M. Marripelly, et al. "Effects of Very High Workfunction Metals or Metal Alloys (NiCr) on High Switching Speed, HV Schottky Diodes for Mixed Signal or RF ASIC." MRS Advances 5, no. 37-38 (2020): 1937–46. http://dx.doi.org/10.1557/adv.2020.336.
Full textPark, Seung-Kyu, Jonghyuk Lee, Ran Hee Kim, et al. "Effects on Addition of Metal Oxides with Low Workfunctions on the Ca-Sr-Ba Oxide Cathodes for VUV Ionizers." Korean Journal of Materials Research 29, no. 4 (2019): 241–51. http://dx.doi.org/10.3740/mrsk.2019.29.4.241.
Full textTao, Meng. "Valence-Mending Passivation of Si(100) Surface: Principle, Practice and Application." Solid State Phenomena 242 (October 2015): 51–60. http://dx.doi.org/10.4028/www.scientific.net/ssp.242.51.
Full textKoch, Norbert, Egbert Zojer, Aparna Rajagopal, et al. "A New Alternative for the Low-Workfunction Electrode in Organic Devices." MRS Proceedings 598 (1999). http://dx.doi.org/10.1557/proc-598-bb11.12.
Full textScharber, M. C., C. J. Brabec, F. Padinger, and N. S. Sariciftci. "Quenching of the Magnetic Field Effect on the Photocurrent and Photocurrent Detected Magnetic Resonance in Conjugated Polymer-Fullerene Diodes." MRS Proceedings 598 (1999). http://dx.doi.org/10.1557/proc-598-bb3.29.
Full textKoch, N., J. Ghijsen, R. Ruiz, et al. "Interaction and Energy Level Alignment at Interfaces between Pentacene and Low Work Function Metals." MRS Proceedings 708 (2001). http://dx.doi.org/10.1557/proc-708-bb2.4.
Full textCho, Jinyoun, Maarten Debucquoy, Payo Maria Recaman, et al. "Contact resistivity reduction on lowly-doped n-type Si using a low workfunction metal and a thin TiOx interfacial layer for doping-free Si solar cells." September 21, 2017. https://doi.org/10.1016/j.egypro.2017.09.356.
Full textDatas, Alejandro, and Rodolphe Vaillon. "Thermionic-enhanced near-field thermophotovoltaics for medium-grade heat sources." April 2, 2019. https://doi.org/10.1063/1.5078602.
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