Academic literature on the topic 'Masks (electronics)'
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Journal articles on the topic "Masks (electronics)"
Wivanius, Nadhrah, Nur Sakinah Asaad, Heru Wijanarko, and Ira Zamzami. "DESIGN OF EXPERIMENT (DOE) LIQUID PHOTOIMAGEABLE SOLDER MASKS PCB PADA TEACHING FACTORY MANUFACTURING OF ELECTRONICS (TFME) POLITEKNIK NEGERI BATAM." JURNAL INTEGRASI 12, no. 1 (April 22, 2020): 55–63. http://dx.doi.org/10.30871/ji.v12i1.1987.
Full textMuluneh, Melaku, Bawul Kim, Gershon Buchsbaum, and David Issadore. "Miniaturized, multiplexed readout of droplet-based microfluidic assays using time-domain modulation." Lab Chip 14, no. 24 (2014): 4638–46. http://dx.doi.org/10.1039/c4lc00819g.
Full textTomczyk, Mariusz, Paweł Kubik, and Witold Waliszewski. "Optimization of the Ablative Laser Cutting of Shadow Mask for Organic FET Electrode Fabrication." Electronics 9, no. 12 (December 18, 2020): 2184. http://dx.doi.org/10.3390/electronics9122184.
Full textKamali, Seyedeh Mahsa, Ehsan Arbabi, Hyounghan Kwon, and Andrei Faraon. "Metasurface-generated complex 3-dimensional optical fields for interference lithography." Proceedings of the National Academy of Sciences 116, no. 43 (October 7, 2019): 21379–84. http://dx.doi.org/10.1073/pnas.1908382116.
Full textRomankiw, L. T. "A path: from electroplating through lithographic masks in electronics to LIGA in MEMS." Electrochimica Acta 42, no. 20-22 (January 1997): 2985–3005. http://dx.doi.org/10.1016/s0013-4686(97)00146-1.
Full textElassy, Akau, Shiroma, Seo, and Ohta. "Low-Cost Rapid Fabrication of Conformal Liquid-Metal Patterns." Applied Sciences 9, no. 8 (April 15, 2019): 1565. http://dx.doi.org/10.3390/app9081565.
Full textVilà, Anna, Alberto Gomez, Luis Portilla, Marti Cirici, and Juan Ramon Morante. "Metal oxides as functional semiconductors. An inkjet approach." MRS Proceedings 1552 (2013): 45–50. http://dx.doi.org/10.1557/opl.2013.741.
Full textKuglics, Lajos, Attila Géczy, Karel Dusek, David Busek, and Balázs Illés. "Personal Air-Quality Monitoring with Sensor-Based Wireless Internet-of-Things Electronics Embedded in Protective Face Masks." Sensors 24, no. 8 (April 18, 2024): 2601. http://dx.doi.org/10.3390/s24082601.
Full textROMANKIW, L. T. "ChemInform Abstract: A Path: From Electroplating Through Lithographic Masks in Electronics to LIGA in MEMS." ChemInform 28, no. 48 (August 2, 2010): no. http://dx.doi.org/10.1002/chin.199748341.
Full textLauer, Scott, Whitten Little, Thomas Ambrose, Jeff Conrad, and Tim Cowen. "Precision Patterned Thin Films without Photolithography: Additive Manufacturing of Printed Electronics." International Symposium on Microelectronics 2013, no. 1 (January 1, 2013): 000927–31. http://dx.doi.org/10.4071/isom-2013-thp55.
Full textDissertations / Theses on the topic "Masks (electronics)"
Bay, Christoph. "Dynamic holographic masks for adaptive optical lithography." Thesis, University of Cambridge, 2012. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.609954.
Full textGeorge, Jonathan Keith. "Polar Synthetic Imaging| Single Pixel Imaging with Rotating Spiral Masks." Thesis, The George Washington University, 2014. http://pqdtopen.proquest.com/#viewpdf?dispub=1566270.
Full textThe use of spiral masks placed in front of a single pixel and rotated in time is investigated as a method of single pixel imaging. Single pixel imaging allows an image to be reconstructed from samples of a single pixel over time. This sampling has traditionally been accomplished with liquid crystal arrays or digital micromirror devices. A set of rotating spiral masks in the aperture offer an alternative solution that may reduce complexity and cost for some imaging applications.
Rathsack, Benjamen Michael. "Photoresist modeling for 365 nm and 257 nm laser photomask lithography and multi-analyte biosensors indexed through shape recognition." Access restricted to users with UT Austin EID, 2001. http://wwwlib.umi.com/cr/utexas/fullcit?p3035170.
Full textMa, Xu. "Generalized inverse lithography methods for phase-shifting mask design." Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file, 38 p, 2007. http://proquest.umi.com/pqdweb?did=1338919391&sid=3&Fmt=2&clientId=8331&RQT=309&VName=PQD.
Full textLevin, Marcy E. "The use of edge gradient analysis on chrome and emulsion photomasks to determine modulation transfer functions /." Online version of thesis, 1985. http://hdl.handle.net/1850/10148.
Full textAgrawal, Ankur. "Development and characterization of advanced electron beam resists." Diss., Georgia Institute of Technology, 2003. http://hdl.handle.net/1853/34054.
Full textCheshmehkani, Ameneh. "Design and synthesis of molecular resists for high resolution patterning performance." Thesis, Georgia Institute of Technology, 2013. http://hdl.handle.net/1853/50286.
Full textMishra, Ritwik. "Photoresist development on SiC and its use as an etch mask for SiC plasma etch." Thesis, Mississippi State : Mississippi State University, 2002. http://library.msstate.edu/etd/show.asp?etd=etd-06162002-205803.
Full textSinha, Ashwini K. "Design and Characterization of Materials and Processes for Area Selective Atomic Layer Deposition." Diss., Georgia Institute of Technology, 2006. http://hdl.handle.net/1853/19736.
Full textAlabi, Taiwo Raphael. "Design of photomodifiable material systems for maskless patterning of functional ceramic and metallic materials at multiple length scales." Diss., Georgia Institute of Technology, 2013. http://hdl.handle.net/1853/51709.
Full textBooks on the topic "Masks (electronics)"
Naoaki, Aizaki, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers. Japan Chapter., eds. Photomask and X-ray mask technology IV: 17-18 April, 1997, Kawasaki, Japan. Bellingham, Washington: SPIE, 1997.
Find full textHideo, Yoshihara, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers. Japan Chapter., eds. Photomask and X-ray mask technology III: 18-19 April, 1996, Kawasaki City, Kanagawa, Japan. Bellingham, Wash: SPIE, 1996.
Find full textNaoaki, Aizaki, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and X-ray mask technology V: 9-10 April, 1998, Kawasaki, Japan. Bellingham, Washington: SPIE, 1998.
Find full textMaurer, Wilhelm, and M. Warren Montgomery. Photomask technology 2010: 13-16 September 2010, Monterey, California, United States. Bellingham, Wash: Society of Photo-optical Instrumentation Engineers, 2010.
Find full textSymposium, on Photomask Technology (29th 2009 Monterey Calif ). Photomask technology 2009: 14-17 September 2009, Monterey, California, United States. Bellingham, Wash: SPIE, 2009.
Find full textJ, Grenon Brian, Kimmel Kurt R, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 22nd Annual BACUS Symposium on Photomask Technology: 1-4 October, 2002, Monterey, California, USA. Bellingham, Wash: SPIE, 2002.
Find full textUwe, Behringer, VDE/VDI-Gesellschaft für Mikroelektronik, Mikro- und Feinwerktechnik., Forschungszentrum Karlsruhe. Institute for Microstructure Technology., and Society of Photo-optical Instrumentation Engineers., eds. 16th European Conference on Mask Technology for Integrated Circuits and Microcomponents: 15-16 November 1999, Munich, Germany. Bellingham, Wash: SPIE, 2000.
Find full textMaurer, Wilhelm, and Frank E. Abboud. Photomask technology 2011: 19-22 September 2011, Monterey, California, United States. Edited by BACUS (Technical group) and SPIE (Society). Bellingham, Wash: SPIE, 2011.
Find full textT, Dao Giang, Grenon Brian J, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. 21st Annual BACUS Symposium on Photomask Technology: 3-5 October 2001, Monterey, [California] USA. Bellingham, Wash: SPIE, 2002.
Find full textW, Behringer Uwe F., VDE/VDI-Gesellschaft für Mikroelektronik, Mikro- und Feinwerktechnik., and Society of Photo-optical Instrumentation Engineers., eds. 17th European Conference on Mask Technology for Integrated Circuits and Microcomponents: Proceedings : 13-14 November 2000, Munich, Germany. Bellingham, Washington: SPIE, 2001.
Find full textBook chapters on the topic "Masks (electronics)"
Gupta, S. V. "Testing of Electronic Balances." In Mass Metrology, 149–69. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-23412-5_7.
Full textGupta, S. V. "Testing of Electronic Balances." In Mass Metrology, 159–80. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-12465-6_7.
Full textGupta, S. V. "Electronic Balances and Effect of Gravity." In Mass Metrology, 65–88. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-23412-5_4.
Full textGupta, S. V. "Electronic Balances and Effect of Gravity." In Mass Metrology, 69–95. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-12465-6_4.
Full textSmith, F. Leslie, John W. Wright, and David H. Ostroff. "Electronic Mass Communication Law." In Perspectives on Radio and Television, 387–97. 4th ed. New York: Routledge, 2023. http://dx.doi.org/10.4324/9781003417897-17.
Full textSmith, F. Leslie, John W. Wright, and David H. Ostroff. "Electronic Mass Media Networks." In Perspectives on Radio and Television, 547–65. 4th ed. New York: Routledge, 2023. http://dx.doi.org/10.4324/9781003417897-25.
Full textSmith, F. Leslie, John W. Wright, and David H. Ostroff. "Electronic Mass Media News." In Perspectives on Radio and Television, 244–74. 4th ed. New York: Routledge, 2023. http://dx.doi.org/10.4324/9781003417897-10.
Full textPau, L. F. "Mask Repair and Inspection." In Computer Vision for Electronics Manufacturing, 117–25. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-0507-1_8.
Full textReichwald, Ralf, and Frank T. Piller. "Mass Customization-Konzepte im Electronic Business." In Handbuch Electronic Business, 359–82. Wiesbaden: Gabler Verlag, 2000. http://dx.doi.org/10.1007/978-3-322-92969-3_15.
Full textReichwald, Ralf, and Frank T. Piller. "Mass Customization-Konzepte im Electronic Business." In Handbuch Electronic Business, 469–93. Wiesbaden: Gabler Verlag, 2002. http://dx.doi.org/10.1007/978-3-322-96349-9_19.
Full textConference papers on the topic "Masks (electronics)"
Angelova, Radostina A., Daniela Sofronova, Maria Dimova, Yavor Sofronov, Rositsa Velichkova, Peter Stankov, Detelin Markov, and Iskra Simova. "Heat transfer through protective face masks and respirators." In INTERNATIONAL CONFERENCE ON ELECTRONICS, ENGINEERING PHYSICS, AND EARTH SCIENCE. AIP Publishing, 2024. http://dx.doi.org/10.1063/5.0194778.
Full textAngelova, Radostina A., Sergey Mijorski, Peter Stankov, Daniela Sofronova, Rositsa Velichkova, Iskra Simova, and Detelin Markov. "Numerical simulation of the air permeability of protective face masks." In INTERNATIONAL CONFERENCE ON ELECTRONICS, ENGINEERING PHYSICS, AND EARTH SCIENCE. AIP Publishing, 2024. http://dx.doi.org/10.1063/5.0194777.
Full textLopez, J. P., J. A. Rodrigo, D. Jimenez, and J. M. Menendez. "Definition of masks related to psychovisual features for Video Quality Assessment." In 2015 IEEE International Symposium on Consumer Electronics (ISCE). IEEE, 2015. http://dx.doi.org/10.1109/isce.2015.7177767.
Full textRevin, L. S., A. L. Pankratov, A. V. Chiginev, D. V. Masterov, A. E. Parafin, and S. A. Pavlov. "Synchronous Regimes in YBCO Long Josephson Junctions Fabricated by Preliminary Topology Masks." In 2017 16th International Superconductive Electronics Conference (ISEC). IEEE, 2017. http://dx.doi.org/10.1109/isec.2017.8314206.
Full textDing, Jian-Jiun, Jen-Chieh Cheng, Xian-Cheng Lu, Sheng-Feng Tsai, Hsin-Ju Li, Hung-Chi Liu, Yang-Jyun Liou, and Cho-Ying Huang. "SVM-Based Root Identification Algorithm Using Ridge Features and Eroded Masks." In 2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan). IEEE, 2020. http://dx.doi.org/10.1109/icce-taiwan49838.2020.9258059.
Full textWiem, Belhedi, Ben Messaoud Mohamed Anouar, and Bouzid Aicha. "Time-frequency masks for monaural speech separation: A comparative review." In 2016 7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications (SETIT). IEEE, 2016. http://dx.doi.org/10.1109/setit.2016.7939911.
Full textMai, T. A., and B. Richerzhagen. "High precision and high speed cutting of 4th generation OLED masks with LaserMicroJet®." In 2007 Quantum Electronics and Laser Science Conference. IEEE, 2007. http://dx.doi.org/10.1109/qels.2007.4431521.
Full textGopinath, Shivasubramanian, and Vijayakumar Anand. "Modulating Axial Resolutions of Scenes Recorded Incoherently Using Cubic Phase Masks by Chaos-Engineering." In 2023 International Conference on Next Generation Electronics (NEleX). IEEE, 2023. http://dx.doi.org/10.1109/nelex59773.2023.10421312.
Full textHui Zhao, Hongwei Yi, and Yingcai Li. "Influences of sinusoidal component on typical phase masks used to realize wave-front coding technique." In 2011 International Conference on Electronics and Optoelectronics (ICEOE). IEEE, 2011. http://dx.doi.org/10.1109/iceoe.2011.6013059.
Full textYu, Mufan, Shanshan Zou, Ailing Jia, and Xiangzhang Cheng. "Recognition of the standardization of wearing masks during the epidemic of COVID-19." In 2021 IEEE Asia-Pacific Conference on Image Processing, Electronics and Computers (IPEC). IEEE, 2021. http://dx.doi.org/10.1109/ipec51340.2021.9421236.
Full textReports on the topic "Masks (electronics)"
Teitsma and Shuttleworth. PR-004-03127-R01 Gas Coupled Ultrasonic Pipeline Inspection. Chantilly, Virginia: Pipeline Research Council International, Inc. (PRCI), January 2008. http://dx.doi.org/10.55274/r0010897.
Full textSukys, Raimundas, and J. S. Rochefort. Control Electronics for an Ion Mass Filter in the Lower Ionosphere Payload Development Program. Fort Belvoir, VA: Defense Technical Information Center, September 1985. http://dx.doi.org/10.21236/ada175439.
Full textNARYKOVA, N. A., S. V. KHATAGOVA, and Yu R. PEREPELITSYNA. PEJORATIVE WORDS IN GERMAN MASS-MEDIA IN NOMINATIONS OF POLITICIANS. Science and Innovation Center Publishing House, April 2022. http://dx.doi.org/10.12731/2077-1770-2021-14-1-3-57-68.
Full textTaylor, James, and Cheryl Smith. The electronic balance and some gravimetric applications (the density of solids and liquids, pycnometry and mass). Gaithersburg, MD: National Institute of Standards and Technology, 1994. http://dx.doi.org/10.6028/nist.ir.5375.
Full textDaibog, E. I., S. W. Kahler, and V. G. Stolpovskii. Study of the Relationship Between Coronal Mass Ejections and Energetic Electrons in Interplanetary Space,. Fort Belvoir, VA: Defense Technical Information Center, December 1996. http://dx.doi.org/10.21236/ada319277.
Full textAubert, B. A Measurement of the Total Width, the Electronic Width, and the Mass of the Upsilon (10580) Resonance. Office of Scientific and Technical Information (OSTI), May 2004. http://dx.doi.org/10.2172/826925.
Full textWagner, Gregor. A Measurement of the Total Width, the Electronic Width and the Mass of the Upsilon(10580) Resonance. Office of Scientific and Technical Information (OSTI), August 2003. http://dx.doi.org/10.2172/815249.
Full textOh, Ju Hyun, Aimee Martinez, Huaixuan Cao, Garrett George, Jared Cobb, Poonam Sharma, Lauren Fassero, et al. Radio frequency heating of washable conductive textiles for bacteria and virus inactivation. Engineer Research and Development Center (U.S.), January 2024. http://dx.doi.org/10.21079/11681/48060.
Full textKulik, Yaroslav. Measurement of the $W$ boson mass using electrons at the edge of $D^0$ central calorimeter modules. Office of Scientific and Technical Information (OSTI), August 2001. http://dx.doi.org/10.2172/1421391.
Full textCrowne, Frank J. Derivation of Effective-Mass Expressions for Electrons and Holes in the Anisotropic Multiband Semimetals Ar, Sb, and Bi. Fort Belvoir, VA: Defense Technical Information Center, August 2000. http://dx.doi.org/10.21236/ada381337.
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