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Books on the topic 'Materiais - Microscopia'

Author: Grafiati

Published: 4 June 2021

Last updated: 9 February 2022

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1

B, Williams David. Transmission electron microscopy: A textbook for materials science. Plenum, 1996.

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2

Barry, Carter C., ed. Transmission electron microscopy: A textbook for materials science. Plenum Press, 1996.

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3

Cullis, A. G., and J. L. Hutchison, eds. Microscopy of Semiconducting Materials. Springer Berlin Heidelberg, 2005. http://dx.doi.org/10.1007/3-540-31915-8.

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4

Acoustic microscopy. Clarendon Press, 1992.

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5

Acoustic microscopy. 2nd ed. University Press, 2009.

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6

J, Brooks John S., and Pietra Giuseppe G, eds. Atlas of microscopic artifacts and foreign materials. Williams & Wilkins, 1997.

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7

P, Saville B., and Royal Microscopical Society (Great Britain), eds. Microscopy of textile fibres. BIOS Scientific in association with the Royal Microscopical Society, 1995.

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8

Clarke, A. R. Microscopy techniques for materials science. CRC Press, 2002.

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9

Cullis, A. G., and P. A. Midgley, eds. Microscopy of Semiconducting Materials 2007. Springer Netherlands, 2008. http://dx.doi.org/10.1007/978-1-4020-8615-1.

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10

International School on Electron Microscopy in Materials Science (1991 Mesagne, Italy). Electron microscopy in materials science: Centro nazionale per la ricerca e lo sviluppo dei materiali, CNRSM, Training Program on Materials Science : proceedings of the International School on Electron Microscopy in Materials Science, Mesagne, Brindisi, Italy, 7-19 October, 1991. Edited by Merli P. G, Antisari M. Vittori, and Centro nazionale per la ricerca e lo sviluppo dei materiali. Training Program on Materials Science. World Scientific, 1992.

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11

Baker, David Rodney. Electron microscopy of advanced engineering materials. University of Birmingham, 1989.

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12

T, Oikawa, ed. Analytical electron microscopy for materials science. Springer, 2002.

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13

Surface preparation and microscopy of materials. Wiley, 1992.

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14

Bozdogan, Rafet. Analytical electron microscopy of advanced materials. University of Birmingham, 1991.

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15

Shindo, Daisuke, and Tetsuo Oikawa. Analytical Electron Microscopy for Materials Science. Springer Japan, 2002. http://dx.doi.org/10.1007/978-4-431-66988-3.

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16

Gai, Pratibha L., ed. In-Situ Microscopy in Materials Research. Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-6215-3.

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17

Kalinin, Sergei V., and Alexei Gruverman, eds. Scanning Probe Microscopy of Functional Materials. Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7167-8.

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18

Gross, Axel. Theoretical Surface Science: A Microscopic Perspective. Springer-Verlag Berlin Heidelberg, 2009.

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19

Tor, Grande, ed. Chemical thermodynamics of materials: Macroscopic and microscopic aspects. John Wiley, 2004.

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20

1955-, Howe James M., ed. Transmission electron microscopy and diffractometry of materials. 2nd ed. Springer, 2002.

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21

Fultz, Brent, and James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-662-04516-9.

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22

Fultz, Brent, and James Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-29761-8.

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23

Fultz, Brent, and James M. Howe. Transmission Electron Microscopy and Diffractometry of Materials. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-662-04901-3.

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24

Shindo, Daisuke, and Kenji Hiraga. High-Resolution Electron Microscopy for Materials Science. Springer Japan, 1998. http://dx.doi.org/10.1007/978-4-431-68422-0.

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25

1939-, Hiraga K., ed. High-resolution electron microscopy for materials science. Springer, 1998.

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26

Krishnan, Kannan M. Principles of Materials Characterization and Metrology. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.001.0001.

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Abstract:

Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behavior (Engineering). With this focus, the book presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-

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27

Carter, C. Barry, and Williams David B. Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry. Springer, 2016.

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28

Carter, C. Barry, and Williams David B. Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry. Springer, 2018.

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29

Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set). Springer, 2004.

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30

High Resolution Microscopy of Materials: Volume 139. University of Cambridge ESOL Examinations, 2014.

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31

Howe, James M., Gerhard Dehm, and Josef Zweck. In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley-VCH Verlag GmbH, 2012.

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32

Howe, James M., Gerhard Dehm, and Josef Zweck. In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley & Sons, Limited, John, 2012.

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33

Howe, James M., Gerhard Dehm, and Josef Zweck. In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley & Sons, Incorporated, John, 2012.

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34

Howe, James M., Gerhard Dehm, and Josef Zweck. In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley & Sons, Incorporated, John, 2012.

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35

Howe, James M., Gerhard Dehm, and Josef Zweck. In-Situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science. Wiley & Sons, Incorporated, John, 2012.

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36

M, Anderson R., Tracy Bryan, and Bravman J. C, eds. Specimen preparation for transmission electron microscopy of materials III: Symposium held December 5-6, 1991, Boston, Mass., U.S.A. Materials Research Society, 1992.

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37

(Editor), Jim Bentley, I. Petrov (Editor), U. Dahmen (Editor), and Charles Allen (Editor), eds. Advances in Materials Problem Solving With the Electron Microscope: Symposium Held November 30-December 3, 1999, Boston, Massachusetts, U.S.A (Materials Research Society Symposium Proceedings). Materials Research Society, 2001.

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38

1949-, Williams David B., Pelton Alan R, and Gronsky R, eds. Images of materials. Oxford University Press, 1991.

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39

Martin, David C., Eric A. Stach, David A. Muller, and Paul A. Midgley. Electron Microscopy of Molecular and Atom-Scale Mechanical Behavior, Chemistry and Structure: Volume 839. University of Cambridge ESOL Examinations, 2014.

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40

Hobbs, L. W., D. B. Williams, and K. H. Westmacott. Materials Problem Solving with the Transmission Electron Microscope: Volume 62. University of Cambridge ESOL Examinations, 2014.

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41

High-Resolution Electron Microscopy (Monographs on the Physics and Chemistry of Materials). Oxford University Press, USA, 2003.

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42

C, Martin D., Materials Research Society Meeting, and Symposium on Electron Microscopy of Molecular and Atom-Scale Behavior, Chemistry and Structure (2004 : Boston, Mass.), eds. Electron microscopy of molecular and atom-scale mechanical behavior, chemistry and structure: Symposium held November 29-December 1, 2004, Boston, Massachusetts, U.S.A. Materials Research Society, 2005.

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43

Industrial Applications of Electron Microscopy (Encyclopedia of Library & Information Science). CRC, 2002.

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44

B, Hirsch P., ed. Topics in electron diffraction and microscopy of materials. Institute of Physics Publishing, 1999.

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45

A, G. Cullis John L. Hutchison. Microscopy of Semiconducting Materials. Springer, 2008.

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46

Haynes, Raymond. Optical Microscopy of Materials. Springer, 2013.

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47

W, Hobbs Linn, Westmacott K. H, Williams David B. 1949-, and Materials Research Society, eds. Materials problem solving with the transmission electron microscope: Symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A. Materials Research Society, 1986.

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48

Specimen Preparation for Transmission Electron Microscopy of Materials IV: Symposium Held April 2, 1997, San Francisco, California, U.S.A (Materials Research Society Symposia Proceedings, V. 480.). Materials Research Society, 1997.

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49

Rb4, John S. J. Brooks, and Giuseppe G. Pietra. Atlas of Microscopic Artifacts and Foreign Materials. Igaku-Shoin Medical Pub, 1997.

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50

In situ experiments with high voltage electron microscopes. Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, 1985.

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