Relevant bibliographies by topics / Materials Microscopy

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Materials Microscopy'

Author: Grafiati
Published: 4 June 2021
Last updated: 30 January 2023

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Journal articles on the topic "Materials Microscopy"

1

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el
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Kenik, Edward A., and Karren L. More. "SHaRE: Collaborative materials science research." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 804–5. http://dx.doi.org/10.1017/s0424820100106089.

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The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, tech
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McMillan, William. "Laser Scanning Confocal Microscopy for Materials Science." Microscopy Today 6, no. 5 (1998): 20–23. http://dx.doi.org/10.1017/s1551929500067791.

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Confocal microscopy has gained great popularity in biology and medical research because of the ability to image three-dimensional objects at greater resolution than conventional optical microscopes. In a typical Laser Scanning Confocal Microscope (LSCM), the specimen stage is stepped up or down to collect a series of two-dimensional images (or slices) at each focal plane. Conventional light microscopes create images with a depth of field, at high power, of 2 to 3 μm. The depth of field of confocal microscopes ranges from 0.5 to 1.5 μm, which allows information to be collected from a well defin
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Chornii, V. "New materials for luminescent scanning near-field microscopy." Functional materials 20, no. 3 (2013): 402–6. http://dx.doi.org/10.15407/fm20.03.402.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca
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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca
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LeGrange, Jane D. "Microscopic manipulation of materials by atomic force microscopy." Biophysical Journal 64, no. 3 (1993): 903–4. http://dx.doi.org/10.1016/s0006-3495(93)81451-6.

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Dudek, Marta. "Self-healing cement materials – microscopic techniques." Budownictwo i Architektura 19, no. 2 (2020): 033–40. http://dx.doi.org/10.35784/bud-arch.1494.

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The article presents a general classification of intelligent materials with self-healing (self-repairing) properties, focusing on self-healing cementitious materials. The purpose of the paper is to describe the prospects of two of the most popular micro-observation techniques, i.e. with the use of an optical and scanning electron microscope. In addition, it describes the advantages of using a tensile stage mounted in the microscope chamber for testing self-healing materials. The advantages and disadvantages of these devices have been characterized, and the results of preliminary research have
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Bernthaler, Timo, Ralf Löffler, and Gerhard Schneider. "Automated Quantitative Materials Microscopy." Microscopy and Microanalysis 20, S3 (2014): 862–63. http://dx.doi.org/10.1017/s1431927614006035.

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Thomas, G. "Electron Microscopy of inorganic materials." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 558–59. http://dx.doi.org/10.1017/s0424820100170529.

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Over the past two decades tremendous progress has been made in the use of advanced transmission electron microscopy techniques to solve complex materials problems. This is especially true in the case of inorganic materials, such as multicomponent metal oxides. The inherent complexity of the crystal structure and microstructure of these ceramic materials as well as the interdependence of the final properties on microstructure and processing mean that detailed characterization of the effect of processing variables on the structure and microstructure is imperative. Electron microscopy has become
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Dissertations / Theses on the topic "Materials Microscopy"

1

Mattocks, Philip. "Scanning tunnelling microscopy and atomic force microscopy of semiconducting materials." Thesis, University of Manchester, 2012. https://www.research.manchester.ac.uk/portal/en/theses/scanning-tunnelling-microscopy-and-atomic-force-microscopy-of-semiconducting-materials(9bc10301-2c4d-4dfb-a374-f65ee37ae23a).html.

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Michael Faraday first documented semiconducting behaviour in 1833 whenhe observed that the resistance of silver sulphide decreased with temperature,contrary to the behaviour of normal conducting materials. Up untilthe middle of the twentieth century, semiconductors were used as photodetectors,thermisters and rectifiers. In 1947 the invention of the transistor byBardeen and Brattain lead to the integrated circuit and paved the way formodern electronics. The need to produce smaller and faster transistors hasdriven research into new semiconductors. This thesis will first introduce the physics of
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Balakishan, Harishankar. "Nanoscale Tomography Based in Electrostatic Force Microscopy." Doctoral thesis, Universitat de Barcelona, 2021. http://hdl.handle.net/10803/671789.

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The ability to characterize the elements beneath the surface has been a dire necessity in the fields of materials science, polymer technology, biology, and medical sciences. Scanning Probe Microscopies are the family of microscopies that scans the surface using a nanometric probe and the acquired data is used to reconstruct the physical properties of the samples in nanometric resolution (e.g., topography). Since the measurements could be carried out in non-contact mode, the ability to study tomography have made them a better contender. SPM also possess the relative advantage of being non-invas
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Sklar, Zenon. "Quantitative acoustic microscopy of coated materials." Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.308851.

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Wallace, Paul M. "Microscopy studies of non-linear optical materials /." Thesis, Connect to this title online; UW restricted, 2005. http://hdl.handle.net/1773/8525.

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Cassidy, A. M. C. "Probing pharmaceutical materials using atomic force microscopy." Thesis, University of Cambridge, 2010. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.597359.

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Microscopic techniques were used to study the surface behaviour of model active pharmaceutical ingredients (APIs) and excipients, while under stress, and this was compared with the response of the bulk material. The model APIs were caffeine/oxalic acid, caffeine/malonic acid cocrystals and aspirin whilst spheronised microcrystalline cellulose (s-MCC), pregelatinised starch (PGS) and dicalcium phosphate dehydrate served as examples of excipients. The difference between the surface and bulk behaviour of caffeine cocrystals in response to storage in controlled humidity environments was investigat
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Gambrel, Grady A. "Scanning Tunneling Microscopy of Two-Dimensional Materials." The Ohio State University, 2017. http://rave.ohiolink.edu/etdc/view?acc_num=osu149424786854182.

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Tomic, Aleksandra T. "Scanning tunneling microscopy of complex electronic materials." Diss., Connect to online resource - MSU authorized users, 2008.

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Thesis (Ph.D.)--Michigan State University. Dept. of Physics and Astronomy, 2008.<br>Title from PDF t.p. (viewed on Mar. 27, 2009) Includes bibliographical references (p. 95-102). Also issued in print.
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Neat, Matthew James. "Scanning tunnelling microscopy and spectroscopy of quantum materials." Thesis, University of St Andrews, 2018. http://hdl.handle.net/10023/13008.

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Paus, K. "The electron microscopy of silicon of sapphire materials." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.382598.

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Joseph, Edith Michelle Maryse <1977&gt. "Application of FTIR microscopy to cultural heritage materials." Doctoral thesis, Alma Mater Studiorum - Università di Bologna, 2009. http://amsdottorato.unibo.it/1404/.

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Research in art conservation has been developed from the early 1950s, giving a significant contribution to the conservation-restoration of cultural heritage artefacts. In fact, only through a profound knowledge about the nature and conditions of constituent materials, suitable decisions on the conservation and restoration measures can thus be adopted and preservation practices enhanced. The study of ancient artworks is particularly challenging as they can be considered as heterogeneous and multilayered systems where numerous interactions between the different components as well as degradation
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Books on the topic "Materials Microscopy"

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B, Williams David. Transmission electron microscopy: A textbook for materials science. Plenum, 1996.

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Barry, Carter C., ed. Transmission electron microscopy: A textbook for materials science. Plenum Press, 1996.

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Acoustic microscopy. 2nd ed. University Press, 2009.

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Acoustic microscopy. Clarendon Press, 1992.

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Cullis, A. G., and J. L. Hutchison, eds. Microscopy of Semiconducting Materials. Springer Berlin Heidelberg, 2005. http://dx.doi.org/10.1007/3-540-31915-8.

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G, Rickerby David, Valdrè Giovanni, and Valdrè U, eds. Impact of electron and scanning probe microscopy on materials research. Kluwer Academic Publishers, 1999.

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Barry, Carter C., ed. Transmission electron microscopy: A textbook for materials science. 2nd ed. Springer, 2009.

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8

M, Anderson R., Tracy Bryan, and Bravman J. C, eds. Specimen preparation for transmission electron microscopy of materials III: Symposium held December 5-6, 1991, Boston, Mass., U.S.A. Materials Research Society, 1992.

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1939-, Hiraga K., ed. High-resolution electron microscopy for materials science. Springer, 1998.

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1948-, Gai Pratibha L., ed. In-situ microscopy in materials research: Leading international research in electron and scanning probe microscopies. Kluwer Academic Publishers, 1997.

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Book chapters on the topic "Materials Microscopy"

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Gashti, Mazeyar Parvinzadeh, Farbod Alimohammadi, Amir Kiumarsi, et al. "Microscopy of Nanomaterials." In Nanocomposite Materials. CRC Press, 2016. http://dx.doi.org/10.1201/9781315372310-6.

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Wen, Jian Guo. "Transmission Electron Microscopy." In Practical Materials Characterization. Springer New York, 2014. http://dx.doi.org/10.1007/978-1-4614-9281-8_5.

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Bolton, William, and R. A. Higgins. "Practical microscopy." In Materials for Engineers and Technicians. Routledge, 2020. http://dx.doi.org/10.1201/9781003082446-10.

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Schmidt, Ute, Jörg Müller, and Joachim Koenen. "Confocal Raman Imaging of Polymeric Materials." In Confocal Raman Microscopy. Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-75380-5_20.

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Schmidt, Ute, Jörg Müller, and Joachim Koenen. "Confocal Raman Imaging of Polymeric Materials." In Confocal Raman Microscopy. Springer Berlin Heidelberg, 2010. http://dx.doi.org/10.1007/978-3-642-12522-5_11.

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Gault, Baptiste, Michael P. Moody, Julie M. Cairney, and Simon P. Ringer. "Atom Probe Microscopy and Materials Science." In Atom Probe Microscopy. Springer New York, 2012. http://dx.doi.org/10.1007/978-1-4614-3436-8_9.

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Hopps, J. H. "Keynote Address: Materials Research Instrumentation Development: A New Paradigm." In Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_1.

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Druffner, C., E. Schumaker, S. Sathish, G. S. Frankel, and P. Leblanc. "Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy." In Nondestructive Materials Characterization. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08988-0_12.

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Gilmore, R. S., R. E. Joynson, C. R. Trzaskos, and J. D. Young. "Acoustic Microscopy: Materials Art and Materials Science." In Review of Progress in Quantitative Nondestructive Evaluation. Springer US, 1987. http://dx.doi.org/10.1007/978-1-4613-1893-4_63.

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Zhou, Yangbo, Daniel S. Fox, and Hongzhou Zhang. "Helium Ion Microscopy for Two-Dimensional Materials." In Helium Ion Microscopy. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-41990-9_11.

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Conference papers on the topic "Materials Microscopy"

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Frank, Anna. "Hybrid battery materials – investigations on MoOx/MoS2 core/shell materials in three dimensions." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.603.

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Wolff, Niklas. "Nanostructure of Semiconductor Hybrid Aero-Materials." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.563.

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Johnstone, Duncan. "Multidimensional electron diffraction of soft materials." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.587.

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Jalil, Abdur. "Novel Topological Materials: The Bix-Tey Family." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.969.

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Stokes, Debbie J., and Mike F. Hayles. "Methodologies for the preparation of soft materials using cryoFIB SEM." In SPIE Scanning Microscopy, edited by Michael T. Postek, Dale E. Newbury, S. Frank Platek, and David C. Joy. SPIE, 2009. http://dx.doi.org/10.1117/12.821834.

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Weinbrenner, Paul, Stefan Ernst, Dominik M. Irber, and Friedemann Reinhard. "A planar scanning probe microscope for near-field microscopy." In Quantum Nanophotonic Materials, Devices, and Systems 2020, edited by Mario Agio, Cesare Soci, and Matthew T. Sheldon. SPIE, 2020. http://dx.doi.org/10.1117/12.2568029.

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Wang, Peng. "Cryo-electron Ptychographical Phase Imaging for Biological Materials." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.365.

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Wang, Peng. "Cryo-electron Ptychographical Phase Imaging for Biological Materials." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.381.

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Andersen, Anton. "Limiting damage to 2D materials during FIB processing." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.610.

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Huang, Xiaohui. "Quantifying Morphology of Mesoporous Materials by Electron Tomography." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1223.

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Reports on the topic "Materials Microscopy"

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Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada414116.

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Hammel, P. Microscopic subsurface characterization of layered magnetic materials using magnetic resonance force microscopy. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1580650.

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Mitchell, T. E., H. H. Kung, K. E. Sickafus, G. T. III Gray, R. D. Field, and J. F. Smith. High-resolution electron microscopy of advanced materials. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/548622.

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Carpener, R. W., W. Petuskey, and D. J. Smith. High Resolution Chemical Microscopy for Materials Science. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada417714.

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Jenkins, Catherine Ann. Magnetic spectroscopy and microscopy of functional materials. Office of Scientific and Technical Information (OSTI), 2011. http://dx.doi.org/10.2172/1050977.

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Treacy, Michael M. J. Structural Studies of Amorphous Materials by Fluctuation Electron Microscopy. Office of Scientific and Technical Information (OSTI), 2018. http://dx.doi.org/10.2172/1440910.

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Cobden, David. Combined microscopy studies of complex electronic materials. Final report. Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1570390.

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Huber, Tito E. Scanning Force Microscopy of Nanostructured Conducting Composites and Polymeric Materials. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada398399.

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Lev, Benjamin L. Atom chip microscopy: A novel probe for strongly correlated materials. Office of Scientific and Technical Information (OSTI), 2011. http://dx.doi.org/10.2172/1028620.

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Lai, Keji. Final Report on "Microscopy of Electrostatic Field Effect in Novel Quantum Materials". Office of Scientific and Technical Information (OSTI), 2019. http://dx.doi.org/10.2172/1505896.

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