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Journal articles on the topic 'Materials Microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 30 January 2023

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1

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage el

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2

Kenik, Edward A., and Karren L. More. "SHaRE: Collaborative materials science research." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 804–5. http://dx.doi.org/10.1017/s0424820100106089.

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The Shared Research Equipment (SHaRE) Program provides access to the wide range of advanced equipment and techniques available in the Metals and Ceramics Division of ORNL to researchers from universities, industry, and other national laboratories. All SHaRE projects are collaborative in nature and address materials science problems in areas of mutual interest to the internal and external collaborators. While all facilities in the Metals and Ceramics Division are available under SHaRE, there is a strong emphasis on analytical electron microscopy (AEM), based on state-of-the-art facilities, tech

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3

McMillan, William. "Laser Scanning Confocal Microscopy for Materials Science." Microscopy Today 6, no. 5 (1998): 20–23. http://dx.doi.org/10.1017/s1551929500067791.

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Confocal microscopy has gained great popularity in biology and medical research because of the ability to image three-dimensional objects at greater resolution than conventional optical microscopes. In a typical Laser Scanning Confocal Microscope (LSCM), the specimen stage is stepped up or down to collect a series of two-dimensional images (or slices) at each focal plane. Conventional light microscopes create images with a depth of field, at high power, of 2 to 3 μm. The depth of field of confocal microscopes ranges from 0.5 to 1.5 μm, which allows information to be collected from a well defin

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4

Chornii, V. "New materials for luminescent scanning near-field microscopy." Functional materials 20, no. 3 (2013): 402–6. http://dx.doi.org/10.15407/fm20.03.402.

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5

Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar ca

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7

LeGrange, Jane D. "Microscopic manipulation of materials by atomic force microscopy." Biophysical Journal 64, no. 3 (1993): 903–4. http://dx.doi.org/10.1016/s0006-3495(93)81451-6.

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8

Dudek, Marta. "Self-healing cement materials – microscopic techniques." Budownictwo i Architektura 19, no. 2 (2020): 033–40. http://dx.doi.org/10.35784/bud-arch.1494.

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The article presents a general classification of intelligent materials with self-healing (self-repairing) properties, focusing on self-healing cementitious materials. The purpose of the paper is to describe the prospects of two of the most popular micro-observation techniques, i.e. with the use of an optical and scanning electron microscope. In addition, it describes the advantages of using a tensile stage mounted in the microscope chamber for testing self-healing materials. The advantages and disadvantages of these devices have been characterized, and the results of preliminary research have

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9

Bernthaler, Timo, Ralf Löffler, and Gerhard Schneider. "Automated Quantitative Materials Microscopy." Microscopy and Microanalysis 20, S3 (2014): 862–63. http://dx.doi.org/10.1017/s1431927614006035.

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10

Thomas, G. "Electron Microscopy of inorganic materials." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 558–59. http://dx.doi.org/10.1017/s0424820100170529.

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Over the past two decades tremendous progress has been made in the use of advanced transmission electron microscopy techniques to solve complex materials problems. This is especially true in the case of inorganic materials, such as multicomponent metal oxides. The inherent complexity of the crystal structure and microstructure of these ceramic materials as well as the interdependence of the final properties on microstructure and processing mean that detailed characterization of the effect of processing variables on the structure and microstructure is imperative. Electron microscopy has become

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11

Lamvik, M. K. "The Role of Temperature in Limiting Radiation Damage to Organic Materials in Electron Microscopes." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 404–5. http://dx.doi.org/10.1017/s0424820100135629.

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The intensity of the electron beam in an electron microscope is at once the basis for progress as well as the ultimate limitation in electron microscopy of organic materials. Gabor noted that the highest intensity available for light optics comes from sunlight, which produces an energy density of 2,000 watts/cm2-steradian. The electron sources in early microscopes could produce a million times that amount, and modern sources even more. While the high intensity made good images possible (because numerical apertures used for electron microscopes are less than 1% of the size used in light microsc

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12

Baretzky, Brigitte, Bernd Reinsch, Ulrike Täffner, Gerhard Schneider, and Manfred Rühle. "Continuous Microscopy of Ceramic Materials with Atomic Force Microscopy." International Journal of Materials Research 87, no. 5 (1996): 332–40. http://dx.doi.org/10.1515/ijmr-1996-870504.

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13

Cullis, Anthony G. "Microscopy of Semiconducting Materials 1985." MRS Bulletin 10, no. 3 (1985): 28–29. http://dx.doi.org/10.1557/s0883769400043086.

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14

Kojima, Seiji. "Acoustic Microscopy to Ferroelectric Materials." Japanese Journal of Applied Physics 24, S3 (1985): 148. http://dx.doi.org/10.7567/jjaps.24s3.148.

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15

Brown, L. M. "Advances in microscopy of materials." Materials Science and Technology 6, no. 10 (1990): 967–73. http://dx.doi.org/10.1179/026708390790189551.

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16

Fujita, Hiroshi. "Materials science through electron microscopy." Radiation Effects and Defects in Solids 124, no. 1 (1992): 9–20. http://dx.doi.org/10.1080/10420159208219823.

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17

Wang, Z. "MATERIALS SCIENCE: High-Pressure Microscopy." Science 312, no. 5777 (2006): 1149–50. http://dx.doi.org/10.1126/science.1127181.

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18

Heiderhoff, Ralf, Andreas Makris, and Thomas Riedl. "Thermal microscopy of electronic materials." Materials Science in Semiconductor Processing 43 (March 2016): 163–76. http://dx.doi.org/10.1016/j.mssp.2015.12.014.

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19

Peng, Lian-Mao, and J. L. Aragón. "Electron microscopy of aperiodic materials." Micron 31, no. 5 (2000): 457–58. http://dx.doi.org/10.1016/s0968-4328(99)00124-9.

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20

Bateman, C. A., J. J. Kilgore, and P. J. Smaltz. "Microscopy of Industrial Ceramic Materials." Microscopy and Microanalysis 7, S2 (2001): 552–53. http://dx.doi.org/10.1017/s143192760002883x.

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The microscopy effort within the Saint-Gobain R&D labs involves working with a wide variety of ceramic materials. Samples vary from routine QC type work, to manufacturing plant emergencies, to failure analysis, to marketing support. A typical sample will require a variety of techniques to provide a solution within a few working days. Working in such an environment it is essential that people are aware of the different analytical tools that can be utilized in a given situation. For the microscopists in our lab this means a working knowledge of the techniques that are close to our core compe

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21

Anderson, Michael W. "Surface microscopy of porous materials." Current Opinion in Solid State and Materials Science 5, no. 5 (2001): 407–15. http://dx.doi.org/10.1016/s1359-0286(01)00038-9.

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22

James, D. I. "Microscopy techniques for materials science." Polymer Testing 22, no. 6 (2003): 721. http://dx.doi.org/10.1016/s0142-9418(03)00014-x.

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23

Heydenreich, Johannes, and Wolfgang Rechner. "Analytical electron microscopy of materials." Mikrochimica Acta 91, no. 1-6 (1987): 93–113. http://dx.doi.org/10.1007/bf01199482.

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24

Blanford, C. F., A. Stein, and C. B. Carter. "Electron Microscopy of Hierarchical Materials." Microscopy and Microanalysis 5, S2 (1999): 820–21. http://dx.doi.org/10.1017/s1431927600017426.

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Recent innovations in materials chemistry have allowed the preparation of “hierarchical” ceramic and polymer materials that possess features on several different size scales. One of the newest hierarchical materials are ceramics that exhibit a three-dimensional ordered array of half-micron voids. These macroporous structures are synthesized from a liquid ceramic precursor and a polymer colloidal crystal template. This template is extracted by either thermal or chemical methods leaving a structure such as the porous zirconia particle shown in Fig. 1. The final structure of these materials may b

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25

Kachel, T., K. Holldack, W. Guda, M. Neuber, and C. Wilde. "Photoelectron microscopy from magnetic materials." Le Journal de Physique IV 04, no. C9 (1994): C9–439—C9–444. http://dx.doi.org/10.1051/jp4:1994972.

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26

Walther, T., and Ana M. Sanchez. "Microscopy of Semiconducting Materials 2015." Semiconductor Science and Technology 30, no. 11 (2015): 110301. http://dx.doi.org/10.1088/0268-1242/30/11/110301.

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27

Titchmarsh, J. M. "Microscopy Techniques for Materials Scientists." Journal of Microscopy 212, no. 2 (2003): 210–12. http://dx.doi.org/10.1046/j.1365-2818.2003.01241.x.

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28

Thomas, G. "Electron microscopy of nanostructured materials." Nanostructured Materials 3, no. 1-6 (1993): 101–13. http://dx.doi.org/10.1016/0965-9773(93)90068-m.

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29

Weaver, J. M. R., C. Ilett, M. G. Somekh, and G. A. D. Briggs. "Acoustic microscopy of solid materials." Metallography 18, no. 1 (1985): 3–34. http://dx.doi.org/10.1016/0026-0800(85)90030-8.

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30

Chen, R. T., and M. G. Jamieson. "Advances in microscopy of polymers: A FESEM and STM study." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1042–43. http://dx.doi.org/10.1017/s0424820100089524.

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Microscopy has played a major role in establishing structure-process-property relationships in the research and development of polymeric materials. With advances in electron microscopy instrumentation (e.g., field emission SEM - FESEM) and the invention of new scanning probe microscopes (e.g., scanning tunneling microscope - STM), resolution of structures or morphologies down to the nanometer scale can be achieved with ease. This paper will focus on the application of FESEM and STM in order to understand the structure of commercial polymeric materials. Characterization of polymers using other

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31

Yamanaka, Kazushi. "Ultrasonic Force Microscopy." MRS Bulletin 21, no. 10 (1996): 36–41. http://dx.doi.org/10.1557/s0883769400031626.

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As an imaging method of elastic properties and subsurface features on the microscopic scale, the scanning acoustic microscope (SAM) provides spatial resolution comparable or superior to that of optical microscopes. Nondestructive evaluation methods of defects and elastic properties on the microscopic scale were developed by using the SAM, and they have been widely applied to various fields in science and technology. One major problem in acoustic microscopy is resolution. The best resolution of SAM with water as the coupling fluid has been 240 nm at a frequency of 4.4 GHz. At a more conventiona

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32

Erlandsen, Stanley L. "Microscopy Society of America." Microscopy and Microanalysis 8, no. I1 (2002): 36–37. http://dx.doi.org/10.1017/s1431927602021098.

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It is my pleasure to welcome you to Microscopy and Microanalysis 2002, jointly sponsored by the Microscopy Society of America, Microbeam Analysis Society, Microscopy Society of Canada/Société de Microscopie du Canada, and the International Metallographic Society. An excellent program with an outstanding list of invited speakers for symposia has been assembled by the Program Committee consisting of the Chair, Edgar Voelkl, and Co-Chairs, David Piston (MSA), Raynald Gauvin (MAS/MSC), and Allan Lockley (IMS). Highlights of Microscopy and Microanalysis 2002 include the world's largest display of m

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33

Abdurrochman, Andri, Muhamad Octamar Wahidullah, Dziban Naufal, et al. "A Potential Application of Photonic Jet in Observing Micro-Metric Materials." Materials Science Forum 966 (August 2019): 507–11. http://dx.doi.org/10.4028/www.scientific.net/msf.966.507.

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Photonic jet microscopy is a technical field of microscopy applying photonic jet phenomenon to increase the resolution of objects or area of objects being observed. Mostly it is used in optical microscopy as the demand of visual observations are increased, especially for the micro-metric biological objects. In addition to our previous works inoptical assessment of observing a micrometric object under a microsphere using an optical microscope, now we made the electromagnetic assessment. It concludes if smaller microsphere magnifies greater than bigger microsphere. Therefore, applying photonic j

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34

GOTO, Shigeaki, Minglei LI, Zhigang JIA, So ITO, Yuki SHIMIZU, and Wei GAO. "1510 Noncontact electrostatic force microscopy for surface profile measurement of insulating materials." Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21 2015.8 (2015): _1510–1_—_1510–4_. http://dx.doi.org/10.1299/jsmelem.2015.8._1510-1_.

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35

Persky, Eylon, Ilya Sochnikov, and Beena Kalisky. "Studying Quantum Materials with Scanning SQUID Microscopy." Annual Review of Condensed Matter Physics 13, no. 1 (2022): 385–405. http://dx.doi.org/10.1146/annurev-conmatphys-031620-104226.

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Electronic correlations give rise to fascinating macroscopic phenomena such as superconductivity, magnetism, and topological phases of matter. Although these phenomena manifest themselves macroscopically, fully understanding the underlying microscopic mechanisms often requires probing on multiple length scales. Spatial modulations on the mesoscopic scale are especially challenging to probe, owing to the limited range of suitable experimental techniques. Here, we review recent progress in scanning superconducting quantum interference device (SQUID) microscopy. We demonstrate how scanning SQUID

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36

Meschini, Stefania. "Correlative Microscopy in Life and Materials Sciences." European Journal of Histochemistry 61, s4 (2017): 1. http://dx.doi.org/10.4081/ejh.2017.2864.

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<p class="p1">The conference aims to update participants on innovative microscopic equipment which, by correlating the various features of optical and electron microscopy, can maximize the potential applications of morphological and ultrastructural methods. The conference will address the limits of sample preparation, the optimization of image processing, and the critical analysis of experimental results with different materials.</p>

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37

Zagal, José H., Sophie Griveau, Mireya Santander-Nelli, Silvia Gutierrez Granados, and Fethi Bedioui. "Carbon nanotubes and metalloporphyrins and metallophthalocyanines-based materials for electroanalysis." Journal of Porphyrins and Phthalocyanines 16, no. 07n08 (2012): 713–40. http://dx.doi.org/10.1142/s1088424612300054.

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We discuss here the state of the art on hybrid materials made from single (SWCNT) or multi (MWCNT) walled carbon nanotubes and MN4complexes such as metalloporphyrins and metallophthalocyanines. The hybrid materials have been characterized by several methods such as cyclic voltammetry (CV), scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM) and scanning electrochemical microscropy (SECM). The materials are employed for electrocatalysis of reactions such as oxygen and hydrogen peroxide reduction, nitri

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38

Ishikawa, Ryo. "Materials Characterization with Quantitative Electron Microscopy." Materia Japan 55, no. 10 (2016): 479–83. http://dx.doi.org/10.2320/materia.55.479.

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39

Hudson, J. S. "Correlative microscopy techniques for material science." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 688–89. http://dx.doi.org/10.1017/s0424820100139810.

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The microscopy center at Clemson University recently invested funds to provide a computer network system that incorporates all of its microscopes. The facility connects SEM, TEM, STM/AFM, Auger Microprobe and the light microscope to Sun workstations equipped with chemical analysis and imaging programs. Images from the network system microscopes can be sent to any of the workstations. I should like to review a few applications of correlative microscopy techniques related to material science; this is a technology that allows the acquisition of multiple data from a given sample. Often a given tec

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40

Bergin, F. J. "Fourier Transform Vibrational Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (1990): 274–75. http://dx.doi.org/10.1017/s0424820100134971.

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The continued improvement in Fourier transform instrumentation has considerably widened the range of materials and systems amenable to vibrational spectroscopic analysis. In particular these improvements have been crucial to the development of Fourier transform vibrational microscopy and, in recent years, there has been a proliferation of applications of FT-IR microscopy. Although primarily developed for analysis where high spatial resolution is required, the infrared microscope can also serve as an extremely useful and versatile sampling accessory. During the last few years we have been invol

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41

Sharma, Shubham, Swarna Jaiswal, Brendan Duffy, and Amit Jaiswal. "Nanostructured Materials for Food Applications: Spectroscopy, Microscopy and Physical Properties." Bioengineering 6, no. 1 (2019): 26. http://dx.doi.org/10.3390/bioengineering6010026.

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Nanotechnology deals with matter of atomic or molecular scale. Other factors that define the character of a nanoparticle are its physical and chemical properties, such as surface area, surface charge, hydrophobicity of the surface, thermal stability of the nanoparticle and its antimicrobial activity. A nanoparticle is usually characterized by using microscopic and spectroscopic techniques. Microscopic techniques are used to characterise the size, shape and location of the nanoparticle by producing an image of the individual nanoparticle. Several techniques, such as scanning electron microscopy

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42

Wen, Haidan, Mathew J. Cherukara, and Martin V. Holt. "Time-Resolved X-Ray Microscopy for Materials Science." Annual Review of Materials Research 49, no. 1 (2019): 389–415. http://dx.doi.org/10.1146/annurev-matsci-070616-124014.

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X-ray microscopy has been an indispensable tool to image nanoscale properties for materials research. One of its recent advances is extending microscopic studies to the time domain to visualize the dynamics of nanoscale phenomena. Large-scale X-ray facilities have been the powerhouse of time-resolved X-ray microscopy. Their upgrades, including a significant reduction of the X-ray emittance at storage rings (SRs) and fully coherent ultrashort X-ray pulses at free-electron lasers (FELs), will lead to new developments in instrumentation and will open new scientific opportunities for X-ray imaging

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43

Sawyer, Linda C. "SEM of polymer materials." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 426–29. http://dx.doi.org/10.1017/s0424820100126913.

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Scanning electron microscopy (SEM) has become an analytical tool widely used in universities, industrial laboratories and modern plants in applications ranging from fundamental research and applied research to quality control. The SEM provides important and insightful observations, in the form of three dimensional images of bulk materials and surfaces, which provide input to conduct process-structure-properties studies of polymer materials. SEM analysis requires knowledge of the instruments, image formation and specimen preparation methods.Consideration must be given to the interaction of the

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44

Fu, Wen Wu. "Application of Virtual Network Electron Microscopy in Materials Science." Advanced Materials Research 898 (February 2014): 779–82. http://dx.doi.org/10.4028/www.scientific.net/amr.898.779.

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This paper first introduces the combination of virtual network and electronic scanner microscope, and uses nonlinear Burgers method to establish virtual network partial differential equations and the algorithm of scanning electron microscopy, and uses MATLAB software to draw the image of algorithm. It verifies the reliability of program. Finally, by using virtual network technology of scanning electron microscopy we obtained the contrast curve diagram of polypyrrole and sulfonated graphene, the image is displayed by three dimension of the virtual network. This method is extended to the teachin

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45

Suzuki, Takayuki, Akira Sasamoto, Yoshihiro Nishimura, and Tokuo Teramoto. "Materials characterization using magnetic force microscopy." International Journal of Applied Electromagnetics and Mechanics 28, no. 1-2 (2008): 163–69. http://dx.doi.org/10.3233/jae-2008-972.

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46

Hultman, L. "Transmission Electron Microscopy of Metastable Materials." Key Engineering Materials 103 (May 1995): 181–94. http://dx.doi.org/10.4028/www.scientific.net/kem.103.181.

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47

Raineri, Vito, and Filippo Giannazzo. "Scanning Capacitance Microscopy on Semiconductor Materials." Solid State Phenomena 78-79 (April 2001): 425–0. http://dx.doi.org/10.4028/www.scientific.net/ssp.78-79.425.

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48

Shindo, Daisuke. "Materials Characterization by Analytical Electron Microscopy." Journal of the Japan Institute of Metals 65, no. 5 (2001): 331. http://dx.doi.org/10.2320/jinstmet1952.65.5_331.

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Meyer, Ernst, Suzanne P. Jarvis, and Nicholas D. Spencer. "Scanning Probe Microscopy in Materials Science." MRS Bulletin 29, no. 7 (2004): 443–48. http://dx.doi.org/10.1557/mrs2004.137.

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AbstractThis brief article introduces the July 2004 issue of MRS Bulletin, focusing on Scanning Probe Microscopy in Materials Science.Those application areas of scanning probe microscopy (SPM) in which the most impact has been made in recent years are covered in the articles in this theme.They include polymers and semiconductors, where scanning force microscopy is now virtually a standard characterization method; magnetism, where magnetic force microscopy has served both as a routine analytical approach and a method for fundamental studies;tribology, where friction force microscopy has opened

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Tahraoui, T., S. Debboub, Y. Boumaïza, and A. Boudour. "Acoustic microscopy investigation of superconducting materials." Journal of the Acoustical Society of America 130, no. 4 (2011): 2369. http://dx.doi.org/10.1121/1.3654494.

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