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DeBusk, Gerald Kenneth. "An Examination of Organizatinal Performance Measurement System Utilization." Diss., Virginia Tech, 2003. http://hdl.handle.net/10919/11130.
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This dissertation provides results of three studies, which examine the utilization of organizational performance measurement systems. Evidence gathered in the first study provides insight into the number of perspectives or components found in the evaluation of an organization's performance and the relative weight placed on those components. The evidence suggests that the number of performance measurement components and their relative composition is situational. Components depend heavily on the strategies selected by the organization. Bottom-line financial measures like return on invested capital and net profit, while perceived as more important than their nonfinancial counterparts, were not part of the extracted components suggesting that they were viewed as outcomes to be achieved by controlling key nonfinancial measures.
The second study examines potential cognitive difficulties inherent in the use of performance measurement systems. Results suggest that whether performance was better than target, worse than target, or equal to target does not affect the perceived importance of the measures. Results also suggest an emphasis on historical financial measures and a lack of emphasis on more forward-looking nonfinancial measures. In addition, there is evidence of a halo effect in that an organization's performance on financial measures appears to influence an individual's perception of the organization's performance on nonfinancial measures.
The third study uses structural equation modeling and other related procedures to examine the relationships surrounding an executive's use of performance measurement information. Results suggest that a personality characteristic of executives, specifically their intolerance of ambiguity, affects the amount of information perceived to be important in a performance measurement system. The results further suggest that the amount of information perceived to be important affects the evaluation of organizational performance with perceived risk serving as a mediating variable.
Overall, these three studies add to our knowledge of organizational performance measurement system utilization by examining the relative weightings of performance measures, the judgmental effects from utilization of performance measurement systems, and the impact of intolerance of ambiguity on the importance of performance measurement data. In addition, this dissertation examines the link between performance measurement data and the perception of risk in the evaluation of organizational performance.<br>Ph. D.
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Rojas, Elizabeth C. "Development and Validation of the Distress Tolerance Questionnaire (DTQ)." Scholar Commons, 2017. http://scholarcommons.usf.edu/etd/6943.
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Distress tolerance (DT) is the perceived ability to withstand psychological stress, and has been studied for its relationship to psychopathology, personality features, mood states, and behaviors. Previous work suggests that the two existing modalities of DT measurement (behavioral and self-report) are tapping conceptually and empirically different constructs. The current developed a novel, self-report measure of DT that conceptually mapped onto behavioral DT in two samples: community participants (N = 982) and undergraduates (N = 282). Two separate factors emerged, non-goal oriented distress intolerance (DI), and goal-oriented distress tolerance (DT). Fit indices were acceptable in the community sample, but poor in the college sample. Both factors showed associations with existing self-report (SR) DT measures, behavioral outcomes, and behavioral tasks (in the college sample) supporting construct validity. Associations with the DT personality network were similar to that of the existing DT-SR measures, and failed to support discriminant validity. Likewise, the documentation of the novel measures with the broad DT nomological network showed predicted associations with personality, mood, and psychopathology, supporting existing literature. Novel measures predicted some significant variance in DT outcomes (psychopathology, behavioral outcomes), above and beyond existing DT-SR, however magnitude was small in nature, and the college sample failed to replicate these results. Measurement invariance testing showed failure at the scalar level in college students. Overall, novel measures did not provide clear support for a separate behavioral definition of DT, and corroborated prior studies investigating extant DT measures and the broad DT nomological network.
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Morrisette, Jennifer A. "The use of a piezoelectric actuator to improve precision of a coordinate measurement machine." Thesis, Georgia Institute of Technology, 1997. http://hdl.handle.net/1853/17044.
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Wright, H. L. "Physiological measurement of the influence of Gz baseline on +Gz tolerance in flight." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk2/ftp01/MQ43410.pdf.
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Sun, Fangting. "On lifetime maximization and fault tolerance measurement in wireless ad hoc and sensor networks." College Park, Md.: University of Maryland, 2007. http://hdl.handle.net/1903/7843.
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Thesis (Ph. D.) -- University of Maryland, College Park, 2007.<br>Thesis research directed by: Dept. of Electrical and Computer Engineering . Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
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Jaša, Aleš. "1. Návrh kontrolních procesů vevýrobě bezpečtnostního ventilu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229782.
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The aim of this thesis is precise definition of control processes for components of Pressure Limit Valve 5 Generation (PLV5) which is produced by Bosch Diesel Ltd. in Jihlava. The objective was to define measurement methods which ensure identical results of measurement between co. Bosch Diesel Ltd. in Jihlava and suppliers of individual components. The results of this study are introduced into control drawings and described in individual conclusions of the thesis.
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Petitcuenot, Mathieu. "Maîtrise de la qualité géométrique des pièces de formes complexes sur tout le cycle de conception et fabrication : Application à une aube de turbine." Thesis, Cachan, Ecole normale supérieure, 2015. http://www.theses.fr/2015DENS0025.
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Ma thèse s'intègre dans un contexte de développement d'une cotation fonctionnelle dans un environnement de CAO 3D chez Snecma, acteur majeur dans le monde de la propulsion aéronautique et spatiale. Les objectifs de ces travaux de recherches sont variés et suivent une logique de maîtrise de la géométrie sur tout le cycle de conception / contrôle / fabrication, notamment par le déploiement de la cotation ISO.Dans un premier temps une définition fonctionnelle ISO est proposée pour des pièces de formes complexes qui composent une turbo-machine, tout en considérant les problèmes liés au contrôle en métrologie automatique et sans contact. Cette définition nécessite quelques mises à jour des normes actuelles. Une autre difficulté fut de répondre aux demandes industrielles dans leur globalité en considérant les différents types de pièces des moteurs.Une seconde partie importante du travail consiste à développer des outils de contrôle et d'analyse de surfaces 3D complexes en vue d'une meilleure connaissance de leur géométrie en séparant les défauts locaux et globaux, qui n’ont pas le même impact fonctionnel.Une troisième partie consiste à développer une stratégie de transfert de fabrication 3D sur des pièces complexes usinées sur des montages 6 points en considérant les problèmes d’orientation des surfaces.L’ensemble des travaux permet de garantir le respect, sur des pièces de formes complexes, des exigences fonctionnelles de la définition jusqu’à la pièce usinée grâce au déploiement des normes ISO de cotation.Ces travaux ont abouti à une publication au CIRP CAT 2014 en Chine, le développement en interne Snecma d’un outil de quantification des défauts globaux/locaux, une volonté forte de développer un outil générique de transfert 3D basé sur le travail réalisé, deux distinctions créativité Snecma dont une classé seconde sur toutes les créativités 2013 et un changement de grande ampleur dans la méthode de contrôle des spécifications de forme de profils d’aube<br>My PhD thesis is integrated into a context of functional dimensioning development in a 3D CAD environment at Snecma, a major player in the aerospace propulsion world. The objectives of this research work are varied but follow one goal: mastery quality geometry throughout the design, control and manufacturing cycle, by the deployment of the ISO standards of tolerancing.At first a functional definition ISO is proposed for parts with complex shapes that make up a turbo-machine while considering issues related to metrology and automatic control without contact. This definition requires some updates of existing standards. Another problem was to meet industrial demands in their entirety by considering the various types of engine parts.A second important part of the work is to develop control and analyze tools for complex 3D shapes for a better understanding of their geometry by separating local and global faults, which do not have the same functional impact.A third part develops a 3D manufacturing transfer strategy on complex workpieces on mounting “6 points” by considering the surface orientation problems.All work ensures compliance of functional requirements, on parts with complex shapes, from definition to the workpiece through the deployment of ISO standards of tolerancing.This work led to a publication in CIRP CAT 2014 China, a Snecma internal development of a quantification tool of global / local defects, a strong wich to develop a 3D transfer generic tool based on the work done, two awards Snecma creativity with one ranked second in 2013 on all the awards and a major change in the control method of form profiles specifications
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SARAVANAN, SHANKAR. "EVALUATION OF SPHERICITY USING MODIFIED SEQUENTIAL LINEAR PROGRAMMING." University of Cincinnati / OhioLINK, 2005. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1132343760.
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Lin-Steadman, Patricia V. "Studying Abroad and Intercultural Outcomes: Differences Experienced Between International Exchange Students and U.S. Study Abroad Students." Digital Commons @ East Tennessee State University, 2020. https://dc.etsu.edu/etd/3800.
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A major focus of many U.S. higher-education institutions is to increase internationalization of their campus through, in part, the promotion of study abroad experiences among domestic students and to recruit and retain international students to their institution. This study explored the effects of certain factors on various domains of the Global Engagement Measurement Scale (GEMS) – Cultural Engagement, Ambiguity Tolerance, Knowledge of Host Site, and Diversity Openness – among U.S. students who have studied abroad and international exchange students who have studied in the U.S. There was a particular focus, on determining whether U.S. study abroad students, compared to international students, rate differently on GEMS scales, after controlling for other possible confounding variables. Participants were recruited from three Southeastern, public, 4-year universities and were eligible if they were enrolled at any of those universities in the last five years.
A hierarchical regression analysis revealed several factors significantly affected each of the various outcomes on the GEMS. Cultural Engagement and Ambiguity Tolerance were both predicted by the institution of study and the type of student (U.S. study abroad versus international exchange). Knowledge of Host Site was predicted by whether or not the trip was government sponsored, pre-trip familiarity with the host culture, and type of student. The overall regression model for Diversity Openness was not significant. These results provide insights into key factors that affect the overall global engagement of college students and can be used to inform university faculty and staff about features they can add to improve campus internationalization efforts.
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Howell, Catherine Johnson. "Tolerance limits based on indirect measurements." Diss., Georgia Institute of Technology, 1993. http://hdl.handle.net/1853/24862.
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Mišún, Filip. "Návrh automatického cyklu pro posuzování způsobilosti měření obrobkovou sondou na obráběcím centru." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-443252.
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This diploma thesis describes the procedures of individual electronic compensations for CNC machines used to increase the accuracy of machines. This part is followed by the determining tolerance of the measuring and the influence of individual electronic compensations based on measured data using touch probe and calibrated standards according to VDA 5 norm.
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Gater, Christian. "Fault-tolerant distributed measurement systems." Thesis, University of Edinburgh, 1987. http://hdl.handle.net/1842/16990.
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Goormaghtigh, Frederic. "New insights into the persistence phenomenon." Doctoral thesis, Universite Libre de Bruxelles, 2016. http://hdl.handle.net/2013/ULB-DIPOT:oai:dipot.ulb.ac.be:2013/235567.
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Together with the current antibiotic resistance crisis, bacterial persistence appears to play an increasingly important role in the frequent failure of antibiotic treatments. Persister cells are rare bacteria that transiently become drug tolerant, allowing them to survive lethal concentrations of bactericidal antibiotics. Upon antibiotic removal, persister cells are able to resume growth and give rise to a new bacterial population as sensitive to the antibiotic as the original population. Interest in persister cells seriously increased in the past few years as these phenotypic variants were shown to be involved in the recalcitrance of chronic infections, such as tuberculosis and pneumonia and in the well-known biofilm tolerance to antibiotics. Persistence has therefore been extensively studied throughout the last decade, which led to the discovery of large variety of different molecular mechanisms involved in persisters formation. However, the specific physiology of bacterial persisters remains elusive up to now, mainly because of the transient nature and the low frequencies of persister cells in growing bacterial cultures. This work aims to gain a better understanding of the physiology of Escherichia coli persisters by combining population analyses with single-cell observations.In the first part of this thesis, we developed an experimental method allowing for measuring persistence with increased reproducibility. The method was further refined, which allowed us to observe four distinct phases in the ofloxacin time-kill curve, suggesting the existence of a tolerance continuum at the population level at treatment time. Characterization of these four phases notably revealed that the growth rate and the intrinsic antibiotic susceptibility of the strain define the number of surviving cells at the onset of the persistence phase, while persister cells survival mainly relies on active stress responses (SOS and stringent responses in particular).We next investigated the molecular mechanisms underlying the well-known correlation between persistence and the growth rate. Interestingly, we showed that the growth rate determines the number of survival cells at the onset of the persistent phase, whereas it does not affect the death rate of persister cells during antibiotic treatment. Furthermore, slow growth was shown to influence survival to ofloxacin independently of the replication rate, thereby suggesting that target inactivation solely cannot explain this correlation. However, our preliminary data indicate that ppGpp induction upon ofloxacin exposure substantially increases in slow growing bacterial populations, supporting a model in which slow growth would allow bacteria to respond faster to the antibiotic treatment, thereby generating more persisters than fast growing bacterial populations.Finally, both population and single-cell analyses were performed to assess the influence of the SOS response on persistence to ofloxacin. Firstly, population analyses revealed that the SOS response is required for survival of both sensitive and persister cells, but only during recovery, after ofloxacin removal, presumably allowing cells to induce SOS-dependent DNA repair pathways, required to deal with the accumulated ofloxacin-induced DNA lesions. The SOS response therefore appears as a good target for anti-persisters strategies, as shown by the 100-fold decrease in persistence upon co-treatment of a bacterial population with an SOS-inhibitor and ofloxacin. Secondly, single-cell analyses revealed that persister cells sustain similar DNA damages than sensitive cells upon ofloxacin treatment and induce SulA- and SOS-independent filamentation upon antibiotic removal, probably reflecting the presence of remaining cleaved complexes, formed during ofloxacin exposure. Importantly, we showed filamentation to occur in persister cells upon ampicillin treatment as well, thereby suggesting these filaments to be part of a more general survival pathway, which molecular basis remains unknown.<br>Doctorat en Sciences<br>info:eu-repo/semantics/nonPublished
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Broad, Andrea. "Endotoxin tolerance in context : microenvironments, measurements and toll-like receptor interactions." Thesis, University of Newcastle Upon Tyne, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.443019.
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Bowyer, Matouš. "Multiparametrická diagnostika vysokootáčkového stroje." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-402507.
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The goal of the thesis was applying multiparametric diagnostics to determine the state and wear of a high-speed milling machine. In the theoretical section, selected areas of multiparametric diagnostics have been described as well as a significant focus on vibrodiagnostics. The chosen methods for the practical section were incorporated into the group “metrological diagnostics”. Several different types of measurements have been performed on the designed test piece. The measurements were analyzed and lead to these specific results: a drawing of the test piece, a structured methodology for evaluating the test piece, recommendations for diagnostics of the specific machine, and proposals for the future development of the field of metrological diagnostics.
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Campos, José Alexandre de. "Avaliação experimental do desgaste de canto durante o processo de eletroerosão do AISI H13." Universidade Tecnológica Federal do Paraná, 2014. http://repositorio.utfpr.edu.br/jspui/handle/1/1165.
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A fabricação de moldes e matrizes são ricas em detalhes e geometrias complexas, exigindo tecnologias mais inovadoras e precisas. Um dos processos que se destaca na fabricação de moldes e matrizes, é o de eletroerosão por penetração (Electrical Discharge Machining - EDM). A usinagem por descargas elétricas é classificada como um processo de fabricação de geometria não definida, onde a remoção de material é realizada por repetidas descargas elétricas entre dois eletrodos eletricamente condutores. O desgaste da ferramenta é um dos principais parâmetros de medida no desempenho da usinagem por EDM. O maior problema ocasionado pelo desgaste de canto do eletrodo é a mudança de geometria da ferramenta no decorrer da usinagem, alterando a tolerância geométrica e o dimensional da cavidade. O presente trabalho propõe avaliação dimensional do desgaste de canto do eletrodo, no decorrer da usinagem do processo de EDM, variando o ângulo de superfície frontal do eletrodo. Outro propósito é a criação de um índice, chamado de taxa de arredondamento, que leva em consideração as áreas de desgaste de canto do eletrodo em função da área removida de material da peça. Os resultados mostraram que os eletrodos de cobre, cobre tungstênio e grafite, tem um grande crescimento de raio de canto no inicio da usinagem, estabilizando esses valores com tempo maiores de processo. O ângulo de superfície frontal do eletrodo influência diretamente no desgaste de canto do eletrodo. Os eletrodos de grafite não apresentaram comportamento de arredondamento de desgaste de canto durante os ensaios. Para o índice de taxa de arredondamento os eletrodos de cobre tungstênio tiveram o menor valor apresentado na usinagem do AISI H13.<br>The manufacture of molds and dies are rich in detail and complex geometries, requiring more innovative and precise technologes. One of the processes that stands out in the manufacture of molds and dies, is to EDM by penetration (Electrical Discharge Machining - EDM). The cutting by electrical discharge is classified as a non-defined geometry manufacturing process where material removal is carried out by repeated electrical discharge between two electrodes electrically conductive. The tool wear is a major measurement parameters in machining performance by EDM. The biggest problem caused by the electrode corner wear is the tool geometry change during the machining by changing the geometric tolerance and dimensional cavity. This paper proposes dimensional evaluation of the electrode corner wear, during the machining of the EDM process, varying the front surface of the electrode angle. Another purpose is to create an index, called rounding rate, which takes into account the areas of electrode corner wear due to the removed area of the workpiece material. The results showed that the copper electrode, copper tungsten and graphite, has a large corner radius growth at the beginning of machining, stabilizing these values with higher process time. The front surface of the electrode angle influence directly on the electrode corner wear. Graphite electrodes showed no corner wear rounding behavior during the tests. For rounding rate index tungsten copper electrodes had the lowest value presented in the machining of AISI H13.
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Kallakuri, PavanaSirisha. "A measurement based approach to designing fault-tolerant controllers for multivariable systems." Thesis, Tennessee State University, 2016. http://pqdtopen.proquest.com/#viewpdf?dispub=10158554.
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<p> This research introduces two new methodologies to design a set of controllers such that every controller in the set preserves closed-loop stability of a given multi variable plant under prescribed loop failures. The proposed approaches differ from existing techniques in two ways: First, these methods are strictly based on frequency response data of the plant that can be easily measured by experiments. No mathematical models or system identification processes are used. Second, while most control design methods find one controller, the proposed methods design a set of controllers satisfying the control objective. Two approaches are presented with examples illustrating the controller design. Integrity test results of the designed controllers under pre-specified loop failures are also presented.</p>
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Sillitoe, Judith Ann. "A Study of Sacral Tissue Tolerance to Pressure Using Transcutaneous Measurements of Oxygen and Carbon Dioxide." Thesis, University of Southampton, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.509478.
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Ahn, Charlene Sonja Preskill John P. "Extending quantum error correction : new continuous measurement protocols and improved fault-tolerant overhead /." Diss., Pasadena, Calif. : California Institute of Technology, 2004. http://resolver.caltech.edu/CaltechETD:etd-05192004-164713.
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Mezher, Rawad. "Randomness for quantum information processing." Electronic Thesis or Diss., Sorbonne université, 2019. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2019SORUS244.pdf.
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Cette thèse est basée sur la génération et la compréhension de types particuliers des ensembles unitaires aleatoires. Ces ensembles est utile pour de nombreuses applications de physique et de l’Information Quantique, comme le benchmarking aléatoire, la physique des trous noirs, ainsi qu’à la démonstration de ce que l’on appelle un "quantum speedup" etc. D'une part, nous explorons comment générer une forme particulière d'évolution aléatoire appelée epsilon-approximateunitary t-designs . D'autre part, nous montrons comment cela peut également donner des exemples de quantum speedup, où les ordinateurs classiques ne peuvent pas simuler en temps polynomiale le caractère aléatoire. Nous montrons également que cela est toujours possible dans des environnements bruyants et réalistes<br>This thesis is focused on the generation and understanding of particular kinds of quantum randomness. Randomness is useful for many tasks in physics and information processing, from randomized benchmarking , to black hole physics , as well demonstrating a so-called quantum speedup , and many other applications. On the one hand we explore how to generate a particular form of random evolution known as a t-design. On the other we show how this can also give instances for quantum speedup - where classical computers cannot simulate the randomness efficiently. We also show that this is still possible in noisy realistic settings. More specifically, this thesis is centered around three main topics. The first of these being the generation of epsilon-approximate unitary t-designs. In this direction, we first show that non-adaptive, fixed measurements on a graph state composed of poly(n,t,log(1/epsilon)) qubits, and with a regular structure (that of a brickwork state) effectively give rise to a random unitary ensemble which is a epsilon-approximate t-design. This work is presented in Chapter 3. Before this work, it was known that non-adaptive fixed XY measurements on a graph state give rise to unitary t-designs , however the graph states used there were of complicated structure and were therefore not natural candidates for measurement based quantum computing (MBQC), and the circuits to make them were complicated. The novelty in our work is showing that t-designs can be generated by fixed, non-adaptive measurements on graph states whose underlying graphs are regular 2D lattices. These graph states are universal resources for MBQC. Therefore, our result allows the natural integration of unitary t-designs, which provide a notion of quantum pseudorandomness which is very useful in quantum algorithms, into quantum algorithms running in MBQC. Moreover, in the circuit picture this construction for t-designs may be viewed as a constant depth quantum circuit, albeit with a polynomial number of ancillas. We then provide new constructions of epsilon-approximate unitary t-designs both in the circuit model and in MBQC which are based on a relaxation of technical requirements in previous constructions. These constructions are found in Chapters 4 and 5
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Saathof, David. "An investigation of the measurement accuracy and productivity of a Waratah HTH 625c Processor Head." Thesis, University of Canterbury. School of Forestry, 2014. http://hdl.handle.net/10092/10459.
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Log processor heads have become increasingly used in New Zealand (NZ) forest harvesting operations to increase productivity and improve worker safety. Information regarding the measurement accuracy and productivity of new model processor heads is limited. As a result, log quality control (QC) is carried out on logs that have been merchandised by a processor head. This task can have a high risk for injury from man – machine interaction. A trend between studies was that older model Waratah’s did not have sufficient measurement accuracy to alleviate the requirement for log QC. In this study, a Waratah HTH 625c processor head operating in NZ was analysed for measurement accuracy and productivity.
Measurement accuracy was considered by measuring logs for length, diameter and branch size. A comparison of two methods of processing was also considered to determine measurement accuracy, productivity and production efficiency for the way logs are delimbed and merchandised. Once gathered, the data was then analysed to identify significant effects, trends and relationships between variables.
Length measurements were highly accurate but diameter measurements were under- estimated. It was also evident that although there was absolute accuracy, there was a high variability in measurements with underestimating and overestimating. Branch size was also found to have a significant impact in reducing length measurement accuracy and productivity. Single pass processing has significantly higher production efficiency than two pass processing, although single pass processing had a higher length error associated with it.
The Waratah HTH 625c processor head has better measurement accuracy than older model Waratah’s. However, logs are still cut out-of-spec which will require a log QC to identify. As measurement technology is further improved in processor heads, and improvements to NZ’s plantation resource (improved form and smaller branching) are realised at harvest age, measurement accuracy and productivity of log processor heads will further improve.
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Govinder, Kuvendran. "Theoretical analyses and design, construction and testing of a flow loop for the study of generalised forced and natural convection boiling heat transfer phenomena on typical light-water nuclear reactor fuel pin configurations." Diss., University of Pretoria, 2019. http://hdl.handle.net/2263/71554.
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In a worldwide pursuit for more Accident Tolerant nuclear Fuel (ATF), the quest to obtain and certify alternative nuclear fuel cladding tubes for light-water nuclear power reactors is still a key challenge. One of the facets in this program to develop more ATF is the heat transfer evaluation between the various proposed clad tubes manufactured from suitable replacement materials and the current problematic zirconium-alloy based clad tubes used in nuclear power reactors. For the heat transfer analysis, the accurate measurement of the temperature on the heat transfer surface of heated tubes to be tested was one of the important objectives for the effective analysis of the heat transfer characteristics to the water coolant. After extensive investigations, a suitable technique was developed and validated against recognised forced-convection heat transfer correlations. The results showed that this technique was well suited for external forced convection heat transfer studies from heated surfaces exposed to forced convection water coolants.<br>Dissertation (MSc)--University of Pretoria, 2019.<br>Mechanical and Aeronautical Engineering<br>MSc (Applied Science - Mechanics)<br>Unrestricted
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Shaporin, Alexey. "Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level." Doctoral thesis, Universitätsbibliothek Chemnitz, 2010. http://nbn-resolving.de/urn:nbn:de:bsz:ch1-200901902.
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In der vorliegenden Arbeit wird eine Methode zur Charakterisierung von Mikrosystemen mit beweglichen Komponenten dargestellt. Sie erlaubt, funktionsrelevante Parameter und deren Schwankungen produktionsbegleitend auf Waferlevel zu ermitteln. Dabei wird vorausgesetzt, dass die Sollform der Struktur und die Abweichungsarten bekannt sind. Die Methode beruht auf dem Vergleich von numerisch berechneten mit experimentell ermittelten Eigenfrequenzen der untersuchten Mikrosysteme. Dazu wird die Abhängigkeit verschiedener Eigenfrequenzen von den gesuchten Parametern mittels einer Parametervariationsanalyse berechnet und durch eine geeignete Funktion angenähert. Die Messung der dynamischen Eigenschaften erfolgt mit Hilfe eines Bewegungsanalysators, der auf einem Laser-Doppler-Vibrometer basiert. Im letzen Schritt werden die gesuchten Parameter berechnet. Kernpunkt der entwickelten Methode sind Messungen auf der Basis von speziellen Teststrukturen, die im Waferlayout neben den eigentlichen Nutzstrukturen platziert sind und parallel mit den Nutzstrukturen prozessiert werden. Es werden Algorithmen zur Generierung des Designs der Teststrukturen und ihrer Platzierung im Waferlayout entwickelt. Dabei werden das Design der Nutzstruktur und deren funktionsrelevante Parameter, der technologische Ablauf und materialspezifische Kennwerte berücksichtigt. Im Ergebnis liegt eine Bibliothek von Standard-Teststrukturen vor, die für produktionsbegleitende Messungen sowie für die Übertragbarkeit der Ergebnisse geeignet sind. Außerdem werden allgemeingültige Richtlinien zur Durchführung der Messungen an den Standard-Teststrukturen abgeleitet. Das Messverfahren wurde an unterschiedlichen Mikrosystemen mit beweglichen Komponenten überprüft und zu einer allgemeinen Messmethode für diese Klasse von Mikrosystemen erweitert<br>In this work a method for the characterization of microsystems with movable components is presented. The method allows to determine the relevant parameters and their variations on wafer level if the nominal shape of the structure and the type of deviations are known. The method is based on a comparison of the numerically calculated and experimentally measured Eigenfrequencies of the microsystems. For that purpose, the relationships between various Eigenfrequencies and the searched parameters are calculated by parameter variation analysis and the results of this analysis are approximated with appropriate functions. A Laser Doppler vibrometer based motion analyzer is used to determine the frequency response function of the micromechanical structure and extract Eigenfrequencies. The comparison of the measured and the calculated frequencies provides values for the searched parameters. The key element of the developed method is the measurement on special test structures that are placed in the wafer layout next to the actual microsystems and processed in the same technological process parallel to the actual microsystems. Algorithms for designing the test structures and their placement in the wafer layout are shown, taking into account the design of the actual microsystems and the function parameters of the technological process as well as material characteristics. As a result, a library of standard test structures for function relevant parameters is available. A general guideline for the measurement on the test structures is presented. The presented method is verified on various microsystems and extended to a whole class of microsystems with movable components
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Venkataraman, Sunitha. "Systematic Analysis of the Small-Signal and Broadband Noise Performance of Highly Scaled Silicon-Based Field-Effect Transistors." Diss., Georgia Institute of Technology, 2007. http://hdl.handle.net/1853/16232.
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The objective of this work is to provide a comprehensive analysis of the small-signal and broadband noise performance of highly scaled silicon-based field-effect transistors (FETs), and develop high-frequency noise models for robust radio frequency (RF) circuit design. An analytical RF noise model is developed and implemented for scaled Si-CMOS devices, using a direct extraction procedure based on the linear two-port noise theory.
This research also focuses on investigating the applicability of modern CMOS technologies for extreme environment electronics. A thorough analysis of the DC, small-signal AC, and broadband noise performance of 0.18 um and 130 nm Si-CMOS devices operating at cryogenic temperatures is presented. The room temperature RF noise model is extended to model the high-frequency noise performance of scaled MOSFETs at temperatures down to 77 K and 10 K. Significant performance enhancement at cryogenic temperatures is demonstrated, indicating the suitability of scaled CMOS technologies for low temperature electronics. The hot-carrier reliability of MOSFETs at cryogenic temperatures is investigated and the worst-case gate voltage stress condition is determined. The degradation due to hot-carrier-induced interface-state creation is identified as the dominant degradation mechanism at room temperature down to 77 K. The effect of high-energy proton radiation on the DC, AC, and RF noise performance of 130 nm CMOS devices is studied. The performance degradation is investigated up to an equivalent total dose of 1 Mrad, which represents the worst case condition for many earth-orbiting and planetary missions.
The geometric scaling of MOSFETs has been augmented by the introduction of novel FET designs, such as the Si/SiGe MODFETs. A comprehensive characterization and modeling of the small-signal and high-frequency noise performance of highly scaled Si/SiGe n-MODFETs is presented. The effect of gate shot noise is incorporated in the broadband noise model. SiGe MODFETs offer the potential for high-speed and low-voltage operation at high frequencies and hence are attractive devices for future RF and mixed-signal applications.
This work advances the state-of-the-art in the understanding and analysis of the RF performance of highly scaled Si-CMOS devices as well as emerging technologies, such as Si/SiGe MODFETs. The key contribution of this dissertation is to provide a robust framework for the systematic characterization, analysis and modeling of the small-signal and RF noise performance of scaled Si-MOSFETs and Si/SiGe MODFETs both for mainstream and extreme-environment applications.
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Shaporin, Alexey. "Dynamic parameter identification techniques and test structures for microsystems characterization on wafer level." Doctoral thesis, Chemnitz Univ.-Verl, 2009. http://d-nb.info/1000815250/04.
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"Reconciling The Differences Between Tolerance Specification And Measurement Methods." Master's thesis, 2014. http://hdl.handle.net/2286/R.I.26804.
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abstract: Dimensional Metrology is the branch of science that determines length, angular, and geometric relationships within manufactured parts and compares them with required tolerances. The measurements can be made using either manual methods or sampled coordinate metrology (Coordinate measuring machines). Manual measurement methods have been in practice for a long time and are well accepted in the industry, but are slow for the present day manufacturing. On the other hand CMMs are relatively fast, but these methods are not well established yet. The major problem that needs to be addressed is the type of feature fitting algorithm used for evaluating tolerances. In a CMM the use of different feature fitting algorithms on a feature gives different values, and there is no standard that describes the type of feature fitting algorithm to be used for a specific tolerance. Our research is focused on identifying the feature fitting algorithm that is best used for each type of tolerance. Each algorithm is identified as the one to best represent the interpretation of geometric control as defined by the ASME Y14.5 standard and on the manual methods used for the measurement of a specific tolerance type. Using these algorithms normative procedures for CMMs are proposed for verifying tolerances. The proposed normative procedures are implemented as software. Then the procedures are verified by comparing the results from software with that of manual measurements.
To aid this research a library of feature fitting algorithms is developed in parallel. The library consists of least squares, Chebyshev and one sided fits applied on the features of line, plane, circle and cylinder. The proposed normative procedures are useful for evaluating tolerances in CMMs. The results evaluated will be in accordance to the standard. The ambiguity in choosing the algorithms is prevented. The software developed can be used in quality control for inspection purposes.<br>Dissertation/Thesis<br>Masters Thesis Mechanical Engineering 2014
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Li, Jun-Jie, and 李俊杰. "Five-axis Machine Tool machanism errors tolerance measurement and compensation research." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/54661628193352628867.
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碩士<br>明志科技大學<br>機電工程研究所<br>99<br>The purpose of the study is to compensate for geometric errors for five-axis machine tools in the static error so the study establishes the error model according to the relationship between geometric errors in five-axis machine tools. The model is to use the Homogeneous transformation matrix (HTM) to calculate five-axis kinematic equations, which is use matrix to multiplying workpiece coordinate system for the full five-axis machine tool sector errors, compared to machine mathematical relationship of coordinate system, and use the software to prove five-axis machine tool error compensation matrix. The study uses measurement machine tools to analyze each axis’ movement accuracy, micro laser interferometer, Coordinate Measuring Machine (CMM), laser auto-collimator, and 5D laser to measure each axis’ error to bring into five axis machine tools’ error compensation matrix and establishes full five-axis machine tool sector errors. The study uses Mastercam simulation cutting software to simulate NC codes of tool path in cutting material. Through the calculation of the Error Matrix by five-axis machine tools, the result is the revision of NC code showing that tolerance is 2μm after error correction. The study compares machining between 5-axis and 3-axis to confirm 5-axis machine tools are better than traditional 3-axis machine tools in tool path setting, NC code, processing time, and curve and surface milling.
keywords: machine tool, five-axis machine tool, Homogeneous Transformation Matrix.
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Jhao, Shu-Syun, and 趙俞勛. "Wide Measurement Range and High Supply Voltage Variation Tolerance All-Digital On-Chip Delay Measurement Circuit Design." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/19567490865686128832.
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碩士<br>輔仁大學<br>電機工程學系碩士班<br>102<br>In this thesis, wide measurement range and high supply voltage variation Tolerance all-digital on-chip delay measurement (OCDM) circuit design are proposed. The OCDM circuits not only have a high immunity to supply voltage variations without extra self-biasing or calibration circuit, but also achieve high wide measurement range.
The proposed OCDM circuit is implemented in TSMC 0.18μm standard CMOS technology, and simulation results show that measurement range can be improved to 1.2ns. Because using the vernier delay line with low supply sensitivity and two all-digital delay-locked loops, also the vernier delay line’s delay variation is about 1% with + 10% supply voltage variation. Also, the measurement resolution of this circuit is about 20.388ps with + 10% supply voltage variation.The proposed OCDM circuits can be implemented in all-digital design manner, making it very suitable for SOC application as well as system-level integration.
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Yih, Hsing Jeng, and 熊正一. "Reserching for Evaluating of Coordinate Measurement Geometrical Tolerance and Constructing CAD Figure." Thesis, 1993. http://ndltd.ncl.edu.tw/handle/33735341995144134091.
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HUANG, Chien-hua, and 黃建華. "The Research and Analysis of Color Quality Tolerance for Fabrics by Using Different Measurement Methods." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/51625020556018975232.
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碩士<br>亞東技術學院<br>纖維與材料應用產業研發碩士專班<br>99<br>The color and quality of fabric are very important for every customer, because correct color and quality present designers ideas accurately. Previously, most of color communications used color standard ships to be the reference basis in supply chain of textile. However, Spectrophotometer changes the way of color communications. According to analysis spectrophotometer, People discovered a serious blind spot in using color standards. Therefore, the communication of digital color control has became fashion nowadays. Even though the accuracy of spectrophotometer already can provides stable and authoritative analysis. But for reproducibility between human eyes and spectrophotometer, there hasn’t a specific research to expound the reliable. This research will focus on my company’s fabric, choose some appropriate fabric for spectrophotometer to measure, and proceed analysis. On the other hand, we have used digital single-lens reflex camera to be second tool for catching color to show. The reliable among spectrophotometer, digital single-lens reflex camera and human eyes is qualify for being trusted and used.
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Hsiu-Fan, Lai, and 來修帆. "High Delay Resolution and High Supply Voltage Variation Tolerance All-Digital On-Chip Delay Measurement Circuit Design." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/22443159029347985607.
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碩士<br>輔仁大學<br>電機工程學系碩士班<br>102<br>In this thesis, two high delay resolution and high supply voltage variation tolerance all-digital on-chip delay measurement (OCDM) circuits for the high performance system-on-chip (SoC) applications are proposed. One is proposed OCDM circuit and the other is proposed wide-range OCDM circuit. Both of proposed OCDM circuits not only have a high immunity to supply voltage variations without extra self-biasing or calibration circuit, but also achieve high delay measurement resolution.
The proposed OCDM circuit is implemented in TSMC 90nm standard CMOS technology, and simulation results show that delay measurement resolution can be improved to 1.04ps, and the average delay resolution is 11fs with + 10% supply voltage variation. The proposed wide-range OCDM circuit is implemented in TSMC 0.18μm CMOS technology, and simulation results show that delay measurement resolution can be improved to about 1ps, and the average delay variation is 0.692% with + 10% supply voltage variation.
The proposed OCDM circuits can be implemented in all-digital design manner, making it very suitable for SOC application as well as system-level integration.
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Jiang, Jia-Yu, and 姜家瑜. "The Measurement of Tolerance for College Students in Taiwan and the Exploration of its correlation with other variables." Thesis, 2014. http://ndltd.ncl.edu.tw/handle/65992506733960204221.
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碩士<br>國立臺南大學<br>教育學系測驗統計碩博士班<br>102<br>The purpose of this study is to understand college students' attitude of tolerance and its correlation with different background variables (gender, education level, related course experience, partisan orientation, religious belief, frequency of making Internet comments) in Taiwan.
For the purpose of this research, researchers use "situational tolerance scale" as the research tool. The results showed that college students obtained average score of 61.80 on the scale, around in the middle of the possible range of total score. Overall scale reliability is .821 and most of the indices of goodness of fit from confirmatory factor analysis fall within the acceptable range. Results of ANOVA analysis for background variables indicated that different levels of education, related course experience, and frequency of making Internet comments are significantly correlated with the performance on the scale.
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Huang, Kau-Lin, and 黃國林. "Chlorophyll fluorescence measurement distinguishing the tolerance and the susceptibility of papayas（Carica papaya L.) to Papaya ringspot virus." Thesis, 2004. http://ndltd.ncl.edu.tw/handle/77574167770476640072.
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碩士<br>國立臺灣大學<br>園藝學研究所<br>92<br>‘Tainunag No.2’ papaya cultivar is well known and popular in Taiwan, although it is susceptible to Papaya ringspoot virus ( PRSV ). Chlorophyll fluorescence is a tool to characterize photosystematic parameters of papaya plants under biotic stress of infection of the severe mottle with necrosis strain of Papaya ringspoot virus ( PRSV-SMN ) under the growth chamber condition. There were not significantly different of ratio of variable fluorescence to maximum fluorescence ( Fv/Fm ) among leaflets of the papaya leaf and among different leaf orders at phyllotaxy. However, the minimum fluorescence (Fo) in the lower part leaves was significantly higher compared to that of younger leaves while the Fv/Fm decreased. Parameters of chlorophyll fluorescence such as Fo, Fv, Fv/Fm were not significant different difference no matter when you measured during the day or at the night. Five weeks after inoculation of PRSV-SMN, fluorescence parameters, net photosynthetic rates (Pn), chlorophyll meter reading (CMR) and leaf temperature were dramatically changed at the infected leaves compared to that at the control plants. The ratio of variable fluorescence to minimum fluorescence (Fv/Fo), Fv/Fm and Pn significantly decreased 53%, 90% and 58% compared to that at the healthy control plants, respectively. So the disease severity progressed, the change of photosystematic parameters became more serious. Results might indicate that photosynthetic apparatus was serios damage due to virus infection. The viral susceptibility of ‘Thinung No.2’ was apparently able to analyze changes in parameters of fluorescence by chlorophyll fluorescence and gas exchange measurement.
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Tzu-Wei, Chao. "Flip-chip transition measurement and design of performance improved inductors and higher process tolerance coupled mutual inductors in multilayer structure." 2006. http://www.cetd.com.tw/ec/thesisdetail.aspx?etdun=U0001-2707200615252300.
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Chao, Tzu-Wei, and 趙子威. "Flip-chip transition measurement and design of performance improved inductors and higher process tolerance coupled mutual inductors in multilayer structure." Thesis, 2006. http://ndltd.ncl.edu.tw/handle/37660440575992865804.
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碩士<br>國立臺灣大學<br>電子工程學研究所<br>94<br>There are three topics in this thesis. The first topic is the flip-chip transition measurement up to millimeter wave frequency. The second is the design of performance improved inductors in the LTCC substrate. The last is the capacitor and coupled inductor with high process tolerance in the multilayer structure.
The characteristics of the conventional flip-chip are studied and obtained by the simulation. Its narrowband and wideband improvements are simulated and presented. Then we propose two measurement methods to extract the property of the flip-chip up to millimeter wave frequency. One is back-to-back flip-chip measurement method and the other is PRM (port reduction method). The programmable termination in CMOS circuit is designed and simulated for PRM.
To optimize the inductor design, the influence of the geometry on the inductor’s performance are introduced and analyzed. Then the spiral, multilayer, helical and solenoid inductors are designed and its performance on inductance, quality factor and self resonant frequency are compared. The spiral inductors with patterned or hollow ground are analyzed and designed to improve its performance. Finally, the center tapped inductors are designed for differential circuit with better symmetry property. All of inductors are designed in the LTCC substrate.
The capacitor and coupled inductor with high process tolerance are proposed to withstand the misalignment between stacked layers due to process variation. The transmission zero circuit and bandpass filter implemented with these components are designed and simulated to test the performance of high process tolerance in the circuit level.
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Zhao, Yaoyao. "An Integrated Process Planning System for Machining and Inspection." Phd thesis, 2009. http://tel.archives-ouvertes.fr/tel-00726013.
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Due to the deterministic nature of manufacturing processes, measuring important process parameters and performing timely adjustment is an effective way to improve manufacturing efficiency and quality. In-process measurement is such a method. It is capable of monitoring manufacturing processes in real time. However, the current information flow between different manufacturing processes is segmented due to the lack of a consolidated data model to represent sufficient information of a product. This directly results in segmented process planning for in-process measurement. The establishment of STEP (STandard for Exchange of Product data) offers manufacturers a new method to exchange product data through the entire product lifecycle. As an extension to STEP, STEP-NC provides the potential to finally close the gap between design and manufacturing in the drive for a complete and integrated product development environment. The STEP/STEP-NC data model is a long overdue improvement in the domain of process planning for Computer Numerical Controlled (CNC) machining in the industry where G-codes have been in use for more than half a century. STEP/STEP-NC brings richer information to the CNC machining industry presenting an opportunity for the development of more intelligent, interoperable and informative machining processes. The research work documented in this thesis introduces a consolidated STEP/STEP-NC data model and system for an automatic and integrated process planning system for machining, in-process measurement, and feedback. This research first developed the current STEP/STEP-NC data model with new definitions covering tolerance requirement information, and measurement operation information. A mechanism to link tolerance requirements and machining feature information was also developed to provide the crucial connection between machining and measurement. With sufficient information provided by the proposed STEP data model, the concept of an integrated process planning system was conceived to carry out automated process planning for machining and in-process measurement. The system is able to analyse and select critical tolerance(s) from an input data file, generate measuring operation(s) for each critical tolerance in-between machining operations. Measurement of each critical tolerance is also planned by the developed system including generating, allocating, and sequencing measurement points for each measuring operation. After the measurement results of each measuring operation are collected, the system analyses the results and provides proper adjustments to the immediate subsequent machining operation(s). A software prototype was developed to test the proposed data model and the integrated process planning and feedback concept. The ultimate goal of performing measurement in a manufacturing system is to gain close control of the machining process based on tolerance requirements and to adjust process errors as they occur. The key issue is to connect machining and tolerance requirements. What to measure and when to measure is another critical issue. This research has made an attempt to address these issues in order to realize a long-awaited paradigm of automatic placement of measurement procedures in-between machining operations and provide automated process-intermittent feedback to the machining process.
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黃名宏. "Jitter Tolerant Differential Non-linearity Measurement." Thesis, 2007. http://ndltd.ncl.edu.tw/handle/59830491459141580458.
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碩士<br>國立交通大學<br>電機學院碩士在職專班電機與控制組<br>96<br>As the prosperity of technology, circuit becomes more complicated and scale is going to be smaller. Thus, there’re many problems which are used to be treated as bias and can be ignored originally become much difficulty to overcome at present , jitter for example .Differential non-linearity measurement (Linear Ramp histogram method) introduced in IEEE 1057 can’t measure Differential non-linearity precisely within reasonable time frame in the case of turbulent jitter.
To have accurate measurement of Differential non-linearity under the influence of jitter, we propose a method called “Cumulative Differential non-linearity” in this paper. It can measure Differential non-linearity with jitter allowed. We use the characteristic of jitter to analyze Differential non-linearity. Compared with the method of Linear Ramp histogram method, we can get more precise Differential non-linearity by less time of sampling in the same test environment with jitter effect.
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Rakhmawati, Dwi Yuli, and 呂估麗. "Assessing Process Capability for Asymmetric Tolerances with Gauge Measurement Errors." Thesis, 2015. http://ndltd.ncl.edu.tw/handle/86732400480098055373.
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博士<br>國立臺灣科技大學<br>工業管理系<br>103<br>Gauge measurement errors (GME) began to play an important role in many types of manufacturing industries because it would affect the estimation and assessment of the process capability. In recent years, the issue of process capability assessment in the presence of GME for cases with symmetric tolerances was investigated enthusiastically. However, even processes with symmetric tolerances are very common in practical situations, cases of asymmetric tolerances also occur in manufacturing industries. In this dissertation, generalized confidence interval (GCI), sampling distribution (SD), and modified sampling distribution (MSD) approaches are applied to assess the performances of processes with asymmetric tolerances in the presence of the GME. To examine and compare the performance of the proposed approaches, an exhaustive simulation under various conditions was conducted. The conclusion is that the proposed approaches appear quite satisfactorily for assessing process performance with asymmetric tolerances in the presence of GME in terms of the Coverage Rate (CR) and the Average Value of Lower Confidence Bound (AVLCB). Examples are presented to illustrate the applicability of the proposed approaches in real factory condition.
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Ouyang, Yingkai. "A More Accurate Measurement Model for Fault-Tolerant Quantum Computing." Thesis, 2009. http://hdl.handle.net/10012/4270.
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Aliferis, Gottesman and Preskill [1] reduce a non-Markovian noise model to a local noise model, under assumptions on the smallness of the norm of the system-bath interaction. They also prove constructively that given a local noise model, it is possible to simulate an ideal quantum circuit with size L and depth D up to any accuracy, using circuit constructed out of noisy gates from the Boykin set with size $L' = O(L (log L)^a)$ and depth $D'=O(D (log D)^b)$, where $a$ and $b$ are constants that depend on the error correction code that we choose and the design of the fault-tolerant architecture, in addition to more assumptions [1]. These two results combined give us a fault-tolerant threshold theorem for non-Markovian noise, provided that the strength of the effective local noise model is smaller than a positive number that depends on the fault-tolerant architecture we choose. However the ideal measurement process may involve a strong system-bath interaction which necessarily gives a local noise model of large strength. We refine the reduction of the non-Markovian noise model to the local noise model such that this need not be the case, provided that system-bath interactions from the non-ideal operations is sufficiently small. We make all assumptions that [1] has already made, in addition to a few more assumptions to obtain our result. We also give two specific instances where the norm of the fault gets suppressed by some paramater other than the norm of the system-bath interaction. These include the large ratio of the norm of the ideal Hamiltonian to the norm of the perturbation, and frequency of oscillation of the perturbation. We hence suggest finding specific phenomenological models of noise that exhibit these properties.
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Chen, Kuo-Jui, and 陳國瑞. "Motion-Tolerant Automatic Remote Multiple Targets Physiological Signals Measurements." Thesis, 2016. http://ndltd.ncl.edu.tw/handle/24240502777521030171.
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碩士<br>元智大學<br>電機工程學系<br>104<br>Non-contact equipment for measuring physiological signal is a challenge task. Especially, to track multi-targets respiratory rate is much more difficult due to the vertical motion from upper-body is not conspicuous. Respiratory rate is an important physiological signal which is highly correlated to vital signs, diseases, and emotions. Therefore, a real-time robust image-based technique is developed for measuring multi-targets respiratory rate variation. In this work, we propose an ultrafast method to detect human body using depth information only. The front/back body of humans can be detected. In addition, under the demand of computation efficiency the salient area is found by Haar-like features from upper body. The vertical body motions estimated from optical flow through consecutive frames are decomposed by a median motion filter and smoothed by local mean filter. Finally, the respiratory rate is calculated by zero-crossing method. For performance evaluation, four kinds of experiment are conducted. The experiment results show that our proposed system for measuring respiratory rate has achieved a high accuracy using an extensive dataset.
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Ahn, Charlene Sonja. "Extending Quantum Error Correction: New Continuous Measurement Protocols and Improved Fault-Tolerant Overhead." Thesis, 2004. https://thesis.library.caltech.edu/1873/1/CSAthesisv4.pdf.
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<p>Quantum mechanical applications range from quantum computers to quantum key distribution to teleportation. In these applications, quantum error correction is extremely important for protecting quantum states against decoherence. Here I present two main results regarding quantum error correction protocols.</p>
<p>The first main topic I address is the development of continuous-time quantum error correction protocols via combination with techniques from quantum control. These protocols rely on weak measurement and Hamiltonian feedback instead of the projective measurements and unitary gates usually assumed by canonical quantum error correction. I show that a subclass of these protocols can be understood as a quantum feedback protocol, and analytically analyze the general case using the stabilizer formalism; I show that in this case perfect feedback can perfectly protect a stabilizer subspace. I also show through numerical simulations that another subclass of these protocols does better than canonical quantum error correction when the time between corrections is limited.</p>
<p>The second main topic is development of improved overhead results for fault-tolerant computation. In particular, through analysis of topological quantum error correcting codes, it will be shown that the required blowup in depth of a noisy circuit performing a fault-tolerant computation can be reduced to a factor of O(log log L), an improvement over previous results. Showing this requires investigation into a local method of performing fault-tolerant correction on a topological code of arbitrary dimension.</p>
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Köcher, Paul. "Hydraulic traits and their relevance for water use strategies in five broad-leaved tree species of a temperate mixed forest." Doctoral thesis, 2012. http://hdl.handle.net/11858/00-1735-0000-0001-BC4A-8.
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WEI-LING, LIN, and 林瑋玲. "On-Chip All-Digital Low-Power High Resolution Jitter Measurement Circuit with High Variation-Tolerant Working on 1GHz to 3GHz." Thesis, 2016. http://ndltd.ncl.edu.tw/handle/61973217222778364682.
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碩士<br>國立中正大學<br>電機工程研究所<br>104<br>System on chip has been a major development of the VLSI circuit. When many different circuits into a chip, the timing between circuits and circuits must be controlled accurately. PLL circuit is used to generate the source clock in the SoC system. If the clock jitter of the PLL circuit become too much, the mistakes of system operation will be generated. But it is difficult to measure the output clock jitter of the PLL circuit accurately by using external measuring equipments. It not only need to take the high cost of equipment but also the noise may cause that the measured result is not true to the original. For all these reasons, the built-in jitter measurement is be produced.
The features of the On-Chip All-Digital High Resolution Jitter Measurement Circuit with High Variation-Tolerant working on 1GHz to 3GHz are high application, high-resolution, process variation, low power and without reference clock. This proposed circuit use self-sampling technique to eliminate the requirement of the reference clock and Calibration circuit to promote the process variation tolerance. in addition, this proposed circuit uses the time amplifier circuit to increase the high accuracy.
The On-Chip All-Digital Low-Power High Resolution Jitter Measurement Circuit with High Variation-Tolerant working on 1GHz to 3GHz is designed in UMC 28nm process and TSMC 28nm process. The operating frequency range of this proposed circuit is from 1GHz to 3GHz. The total resolution of this proposed circuit is 0.59ps, power consumption is 0.62mW and the area of the chip is 0.0032mm2.