Dissertations / Theses on the topic 'Memory test'
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Kociuba, Chelsea K. "The Poreh Nonverbal Memory Test." Cleveland State University / OhioLINK, 2011. http://rave.ohiolink.edu/etdc/view?acc_num=csu1318370174.
Full textRowe, Christina J. "Prospective Memory and College Students: Validation of the Wood Prospective Memory Test." Thesis, University of North Texas, 1992. https://digital.library.unt.edu/ark:/67531/metadc501069/.
Full textTeaford, Max. "Validating the Poreh Nonverbal Memory Test through the Biber Figure Learning Test." Cleveland State University / OhioLINK, 2016. http://rave.ohiolink.edu/etdc/view?acc_num=csu1462044475.
Full textNordstrand, Dennis. "Test-enhanced learning, working memory and fluid intelligence." Thesis, Umeå universitet, Institutionen för psykologi, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-122471.
Full textDuring the last decade, test-enhanced learning has been thoroughly cemented as an efficient way to promote durable learning. Many materials and conditions have been explored in relation to this method. Only recently, however, have individual differences in relation to test-enhanced learning received attention as an area of study. An area as of yet relatively unexplored is the relationship between differences in cognitive ability and the process of retrieval as a method of learning. The present study set out to explore this relationship by measuring general fluid intelligence and working memory capacity in a sample of upper secondary level students (n = 189, M = 16.89 years of age) who used a test-enhanced learning method. The results indicate that working memory and fluid intelligence are both related to this learning process, however the former to a significantly higher degree than the latter
Kniele, Kathryn Kloss Jacqueline D. "Emotional expressivity and working memory capacity /." Philadelphia, Pa. : Drexel University, 2004. http://dspace.library.drexel.edu/handle/1860/399.
Full textNordstrand, Dennis. "Test-Enhanced Learning, Working Memory, and Difficulty of Material." Thesis, Umeå universitet, Institutionen för psykologi, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-149176.
Full textDet är väl etablerat att upprepad testning är mer fördelaktigt för hållbar inlärning än upprepad instudering av samma material, ett fenomen känt som testeffekten. Denna studie ämnade undersöka arbetsminnets roll i relation till inlärningsprocessen och svårighetsgrad av material med testbaserat lärande som metod. Som mellangruppsmanipulation delades deltagare (n = 99, M = 25.62 år gamla) in i två grupper, en som upprepade gånger studerade materialet och en som alternerade studerande med tester. Ett material med två svårighetsgrader och ett direkt samt fördröjda retentionstester användes som inomgruppsmanipulation. Vidare användes ett n-backtest som mått på arbetsminneskapacitet. Resultat visade ingen signifikant inverkan av arbetsminne på varken inlärningsprocessen eller retention i relation till svårighetsgrad av material. Testbetingelsen presterade signifikant högre på retentionstest än studiebetingelsen. Testeffekten fastställs ytterligare som lovande metodik för praktisk applikation i utbildningssektorn oberoende av både arbetsminneskapacitet och svårighetsgrad.
ZHOU, YUAN. "POWER VARIATIONS AND TEST SCHEDULING FOR EMBEDDED MEMORY ARRAYS." University of Cincinnati / OhioLINK, 2006. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1140810178.
Full textGreub, Becca L. "The Validity of the Letter Memory Test as a Measure of Memory Malingering: Robustness to Coaching." Ohio University / OhioLINK, 2004. http://www.ohiolink.edu/etd/view.cgi?ohiou1108042793.
Full textAhlström, Daniel. "Minimizing memory requirements for deterministic test data in embedded testing." Thesis, Linköping University, Linköping University, Department of Computer and Information Science, 2010. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-54655.
Full textEmbedded and automated tests reduce maintenance costs for embedded systems installed in remote locations. Testing multiple components of an embedded system, connected on a scan chain, using deterministic test patterns stored in a system provide high fault coverage but require large system memory. This thesis presents an approach to reduce test data memory requirements by the use of a test controller program, utilizing the observation of that there are multiple components of the same type in a system. The program use deterministic test patterns specific to every component type, which is stored in system memory, to create fully defined test patterns when needed. By storing deterministic test patterns specific to every component type, the program can use the test patterns for multiple tests and several times within the same test. The program also has the ability to test parts of a system without affecting the normal functional operation of the rest of the components in the system and without an increase of test data memory requirements. Two experiments were conducted to determine how much test data memory requirements are reduced using the approach presented in this thesis. The results for the experiments show up to 26.4% reduction of test data memory requirements for ITC´02 SOC test benchmarks and in average 60% reduction of test data memory requirements for designs generated to gain statistical data.
Doyle, Karen Elizabeth. "A test for the configural nature of episodic-like memory." Click here for download, 2008. http://proquest.umi.com/pqdweb?did=1564022521&sid=1&Fmt=2&clientId=3260&RQT=309&VName=PQD.
Full textCovelli, Javier M. "Ferroelectric memory devices and a proposed standardized test system design." Thesis, Monterey, California. Naval Postgraduate School, 1992. http://hdl.handle.net/10945/23676.
Full textRees, Laura M. (Laura Marie) Carleton University Dissertation Psychology. "The test of memory malingering; simulation studies and clinical validation." Ottawa, 1996.
Find full textTran, Chinh Nguyen. "An automatic test generation system for testing virtual memory operations /." Digital version accessible at:, 1999. http://wwwlib.umi.com/cr/utexas/main.
Full textLai, Ya-Chieh. "Test and diagnosis of microprocessor memory arrays using functional patterns." Thesis, Massachusetts Institute of Technology, 1996. http://hdl.handle.net/1721.1/40173.
Full textTakayama, Motohiro. "Intracarotid propofol test for speech and memory dominance in man." Kyoto University, 2006. http://hdl.handle.net/2433/143819.
Full text0048
新制・課程博士
博士(医学)
甲第12186号
医博第2939号
新制||医||915(附属図書館)
24022
UT51-2006-J179
京都大学大学院医学研究科脳統御医科学系専攻
(主査)教授 福山 秀直, 教授 河野 憲二, 教授 富樫 かおり
学位規則第4条第1項該当
Lianekhammy, Joann. "INVESTIGATING AGE-RELATED INHIBITORY DEFICITS IN SPATIAL WORKING MEMORY." UKnowledge, 2006. http://uknowledge.uky.edu/gradschool_theses/402.
Full textWright, Derek. "A Comprehensive Test and Diagnostic Strategy for TCAMs." Thesis, University of Waterloo, 2005. http://hdl.handle.net/10012/809.
Full textMagnuson, Scott A. "THE EFFECTS OF CEREBROVASCULAR ACCIDENTS ON PROSPECTIVE MEMORY." Wright State University Professional Psychology Program / OhioLINK, 2014. http://rave.ohiolink.edu/etdc/view?acc_num=wsupsych1372205700.
Full textSuzuki, Satoshi. "The Development of Embedded DRAM Statistical Quality Models at Test and Use Conditions." PDXScholar, 2010. https://pdxscholar.library.pdx.edu/open_access_etds/341.
Full textHumphrey, Nicole. "The Performance of Individuals with Intellectual Disability on the Test of Memory Malingering and the b Test." Xavier University / OhioLINK, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=xavier1559860686097716.
Full textAndreasen, Peter Allen. "Gallium arsenide DRAM memory cell design and evaluation of test methods." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1995. http://handle.dtic.mil/100.2/ADA306130.
Full textDonlin, Joanne Mac. "Memory for performance feedback : a test of three self-motivation theories /." Diss., This resource online, 1990. http://scholar.lib.vt.edu/theses/available/etd-08232007-111919/.
Full textKalva, Deepa. "Wafer probe and package test failure analysis of NAND flash memory." Connect to this title online, 2007. http://etd.lib.clemson.edu/documents/1202499512/.
Full textDiedrich, Peter M. J. (Peter Mark John) Carleton University Dissertation Engineering Electrical. "A memory architecture, test, and reconfiguration approach for multiple embedded DRAM." Ottawa, 1989.
Find full textChatraphorn, Pongprot. "Accounting for Business Combinations: A Test for Long-Term Market Memory." Diss., Virginia Tech, 2001. http://hdl.handle.net/10919/25969.
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McPaul, Ann. "Memory and normal ageing in adults with intellectual disabilities : a research portfolio." Thesis, University of Edinburgh, 2014. http://hdl.handle.net/1842/9833.
Full textBosser, Alexandre Louis. "Single-event effects from space and atmospheric radiation in memory components." Thesis, Montpellier, 2017. http://www.theses.fr/2017MONTS085/document.
Full textElectronic memories are ubiquitous components in electronic systems: they are used to store data, and can be found in all manner of industrial, automotive, aerospace, telecommunication and entertainment systems. Memory technology has seen a constant evolution since the first practical dynamic Random-Access Memories (dynamic RAMs) were created in the late 60's. The demand for ever-increasing performance and capacity and decrease in power consumption was met thanks to a steady miniaturization of the component features: modern memory devices include elements barely a few tens of atomic layers thick and a few hundred of atomic layers wide.The side effect of this constant device miniaturization was an increase in the sensitivity of devices to radiation. Since the first radiation-induced single-event effects (SEEs) were identified in satellites in the late 70’s and particle-induced memory upsets were replicated in laboratory tests, radiation hardness has been a concern for computer memory manufacturers and for systems designers as well. In the early days, the need for data storage in radiation-rich environments, e.g. nuclear facilities, particle accelerators and space, primarily for military use, created a market for radiation-hardened memory components, capable of withstanding the effects of radiation. This market dwindled with the end of the Cold War and the loss of government interest, and in a matter of years, the shortage of available radiation-hard components led system designers to turn to so-called Commercial Off-The-Shelf (COTS) components.Since COTS devices are not designed with radiation hardness in mind, each COTS component must be assessed before it can be included in a system where reliability is important – a process known as Radiation Hardness Assurance (RHA). This has led to the emergence of radiation testing as a standard practice in the industry (and in the space industry in particular). Irradiation tests with particle accelerators and radioactive sources are performed to estimate a component’s radiation-induced failure rate in a given radiation environment, and thus its suitability for a given mission.The present work focuses on SEE testing of memory components. It presents the requirements, difficulties and shortcomings of radiation testing, and proposes methods for radiation test data processing; the detection and study of failure modes is used to gain insight on the tested components. This study is based on data obtained over four years on several irradiation campaigns, where memory devices of different technologies (static RAMs, ferroelectric RAM, magnetoresistive RAM, and flash) were irradiated with proton, heavy-ion, neutron and muon beams. The yielded data also supported the development of MTCube, a CubeSat picosatellite developed jointly by the Centre Spatial Universitaire (CSU) and LIRMM in Montpellier, whose mission is to carry out in-flight testing on the same memory devices. The underlying concepts regarding radiation, radiation environments, radiation-matter interactions, memory component architecture and radiation testing will be introduced in the first chapters, while the academic advances which were made during this study are presented in the final chapter
Emick, Michelle Adrianna. "A Measure of Prospective Memory in the Elderly." Thesis, University of North Texas, 1992. https://digital.library.unt.edu/ark:/67531/metadc501280/.
Full textVernieux, Louise Winsome. "Cisplatin chemotherapy, the auditory verbal learning test, and the structure of memory /." [St. Lucia, Qld.], 1997. http://www.library.uq.edu.au/pdfserve.php?image=thesisabs/absthe17065.pdf.
Full textHubley, Anita M. (Anita Marleen) Carleton University Dissertation Psychology. "Geriatric learning and memory battery: test development, psychometric evidence, and normative data." Ottawa, 1995.
Find full textMcIntyre, Nancy J. (Nancy Jo) Carleton University Dissertation Psychology. "The visual recognition memory battery; test development, psychometric evidence, and normative data." Ottawa, 1997.
Find full textNagler-Nitzschner, Ursa. "Development of a working memory test for the German Bundeswehr’s online assessment." Doctoral thesis, Humboldt-Universität zu Berlin, 2021. http://dx.doi.org/10.18452/22529.
Full textLike most Western armed forces, the Bundeswehr faces both high personnel requirements and a shortage of skilled personnel. Online assessment can optimize the application process to ensure that capable personnel are retained more quickly. Online assessment has various advantages, but also challenges associated with it. Probably the biggest of these challenges is minimizing cheating, as online assessment takes place in a largely unsupervised environment. Various approaches are used to counter this problem, such as large item pools, which can be used to counter the dissemination of solutions on the Internet. However, this approach is associated with high costs. Automatic item generation, on the other hand, makes it possible to create psychometrically high-quality items in a cost-effective and time-efficient manner. For this reason, two working memory tests with automatic item generation for the German Armed Forces’ online assessment were developed and evaluated in the present study, with the aim of matching the high predictive validity of on-site diagnostics. The first study (N = 330) demonstrated that automatic item generation can be used for the developed working memory tests. Two different temporal variants were also investigated, with the longer stimulus presentation time proving to be more beneficial. The second study (N = 621) provided reliability and validity evidence. The tests showed good convergent and discriminant validity. In addition, one of the two tests demonstrated very good predictive validity. Taking into account the overall test quality criteria, this test was ultimately proposed for use in the German Armed Forces’ online assessment. Thus, the Bundeswehr now has a scientifically-grounded working memory test available for its online assessment.
Gast, Julianne. "The performance of juvenile delinquents on the Test of Memory Malingering (TOMM)." Xavier University / OhioLINK, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=xavier1386599469.
Full textDullaghan, Lucas, and Hanna Fellman. "Effects of (Un)Certain Social Information on Pain and Memory." Thesis, Örebro universitet, Institutionen för juridik, psykologi och socialt arbete, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:oru:diva-67647.
Full textDen aktuella studien utredde betydelsen av osäker och säker socialinformation för smärtintensitet och minne. Studiens hypotes var att den osäkragruppen skulle uppleva högre smärtintensitet och att den osäkra gruppenskulle komma ihåg mindre bilder än den grupp som fick säker information.Deltagarna var 42 studenter på ett medelstort universitet i Sverige, beroendepå vilken grupp de hamnade i fick de antingen osäker eller säker socialinformation om smärtintensiteten på det kommande kallvattentestet. Efter densociala informationen utfördes två kategoriseringsuppgifter där de skulle angeom en bild föreställde något levande eller ett objekt, både före och underkallvattentestet, med ett överraskande minnestest 30 minuter efterkallvattentestet på de bilder som visades under kategoriseringsuppgiften. Detvar ingen skillnad på grupperna i osäkerheten om deras förväntan avkallvattentestet. Däremot förväntade sig den gruppen som fick osäkerinformation att kallvattentestet skulle vara smärtsammare än de som fick densäkra informationen. Vi hittade ingen skillnad mellan grupperna i varkensmärtupplevelsen eller minnet. Till sist, minnet försämrades för bilderna sompresenterades under kallvattentestet, oberoende av vilken grupptillhörighetdeltagarna hade. För att summera så stöddes ingen av våra hypoteser. Förslagför kommande forskning är att manipulera hur den sociala informationen gesför att göra det mer tydligt för deltagarna.
Wiklund-Hörnqvist, Carola. "Brain-based teaching : behavioral and neuro-cognitive evidence for the power of test-enhanced learning." Doctoral thesis, Umeå universitet, Institutionen för psykologi, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:umu:diva-96395.
Full textKubik, Veit. "Effects of Testing and Enactment on Memory." Doctoral thesis, Stockholms universitet, Psykologiska institutionen, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:su:diva-108094.
Full textAt the time of the doctoral defense, the following papers were unpublished and had a status as follows: Paper 1. Epub ahead of print. Paper 2: Manuscript. Paper 3: Manuscript.
Milton, Daniel. "Built-in self test of configurable memory resources in field programmable gate arrays." Auburn, Ala., 2007. http://repo.lib.auburn.edu/07M%20Theses/MILTON_DANIEL_9.pdf.
Full textReid, Kathrine. "Everyday memory in temporal lobe epilepsy : an investigation with the Current Orientation test." Thesis, University of Leicester, 1996. http://hdl.handle.net/2381/34683.
Full textHenríquez, Chaparro Fernando Antonio. "Validación del Test Your Memory (T.Y.M.) en una muestra de adultos mayores chilenos." Tesis, Universidad de Chile, 2013. http://www.repositorio.uchile.cl/handle/2250/130402.
Full textObjetivo: Validar el Test Your Memory (TYM) en una muestra de adultos mayores en Chile. Método: El TYM fue traducido y transculturizado al contexto chileno y se administró a 31 sujetos controles (CDR=0) y a 31 pacientes con demencia (CDR>1). A ambos grupos se les administró pruebas de eficiencia cognitiva global (MMSE, ACE-R y MoCA). A los cuidadores de los pacientes con demencia y a los acompañantes de los controles se les entrevistó mediante cuestionarios de valoración funcional en las actividades de la vida diaria (ADLQ, IADL, FAQ y FAST). Se aplicó en conjunto a pacientes con demencia y a sujetos controles, con sus respectivos cuidadores y acompañantes, escalas de valoración de gravedad de demencia (CDR y GDS). Se estimó la validez convergente, la confiabilidad (consistencia interna) y la utilidad diagnóstica (punto de corte, sensibilidad y especificidad) del TYM adaptado en Chile. Resultados: El TYM validado en una muestra de adultos mayores en Chile exhibió correlaciones significativas (p < 0,001) con los instrumentos de evaluación cognitiva (r = 0,918 con el MMSE; r = 0,932 con el ACE-R y r = 0,940 con el MoCA), gravedad de la demencia (r = -0,889 con la GDS y r = -0,802 con la CDR) y evaluación funcional (r = - 0,805 con el ADLQ, r = 0,813 con el IADL, r = -0,859 con la FAST y r = -0,761 con el FAQ), lo que da cuenta de una aceptable validez convergente. Presentó además una buena consistencia interna (alfa de Cronbach = 0,930). Su punto de corte fue de 39 puntos para detectar casos de demencia, con una sensibilidad de 0,935 y una especificidad de 0,839. Conclusión: El TYM validado en una muestra de adultos mayores chilenos mostró ser un screening de buenas propiedades psicométricas y diagnósticas, siendo de este modo un test válido, confiable y de aceptable utilidad diagnóstica para detectar demencias. Es fácil de administrar y por sus buenas características recomendable como una alternativa en la clínica de evaluación de demencias y quejas cognitivas en general
Houston, Wes S. "PRESIDENTS TEST PERFORMANCE OF PATIENTS WITH FOCAL EPILEPSY." University of Cincinnati / OhioLINK, 2001. http://rave.ohiolink.edu/etdc/view?acc_num=ucin991166083.
Full textFisher, Kimberly Gail. "The relative utility of implicit memory tasks and a forced-choice memory test for the detection of simulated brain injury deficits." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/tape15/PQDD_0002/NQ34261.pdf.
Full textFuentes, Antoine David R. "Contribution à l'étude du test aléatoire de mémoires RAM." S.l. : Université Grenoble 1, 2008. http://tel.archives-ouvertes.fr/tel-00322092.
Full textCramond, Alexander J. "The Longitudinal Stability of Memory in Males with Autism Spectrum Disorder." BYU ScholarsArchive, 2012. https://scholarsarchive.byu.edu/etd/3284.
Full textGordon, Sue, and n/a. "Development of a test of verbal memory for Canberra children : a normative pilot study." University of Canberra. Education, 1986. http://erl.canberra.edu.au./public/adt-AUC20060712.115035.
Full textErich, Bryce. "Detection of traumatic brain injury with the Picture Memory Interference Test in college students." Thesis, Pepperdine University, 2015. http://pqdtopen.proquest.com/#viewpdf?dispub=3728495.
Full textThe purpose of this study was to examine potential effects of head-injury on individuals’ performance on the Picture Memory Interference Test (PMIT). This study examined differences in the performance of college-aged students with and without a history of head-injury on the PMIT. Data was drawn from an archival dataset of PMIT completions held at UCLA and analyzed with permission. From the total dataset of 12,227 completions, experimental groups were derived and separated based upon assumed severity of head-injury, based upon self-report data. Following exclusions, the final data sub-set for analysis consisted of 6,897 unique completions of the PMIT. Of these, 412 were assigned to the Mild head-injury group; 61 individuals were assigned to the Moderate-Severe head-injury group. Multiple one-way ANCOVA were conducted to identify difference between group performances. The results of the current study are unclear as to whether or not the PMIT may effectively detect and discriminate college student participants with a history of head-injury from those without, although significant findings were obtained which demonstrated those with a history of mild head-injury obtained higher scores on particular trials of the PMIT.
Okura, Eve Kiyomi. "A Study of the Correlation Between Working Memory and Second Language EI Test Scores." BYU ScholarsArchive, 2011. https://scholarsarchive.byu.edu/etd/3025.
Full textCarter, Elisabeth Y. "Normative data on the Auditory memory test battery for ages 9 through 13 years." PDXScholar, 1989. https://pdxscholar.library.pdx.edu/open_access_etds/3867.
Full textGoldsmith, Susan Marie. "Test expectancies and memory organization." Thesis, 1989. https://dspace.library.uvic.ca//handle/1828/9454.
Full textGraduate
Kuo, Shyr-Fen, and 郭碩芬. "Semiconductor Memory Test Time Reduction and Automatic Generation of Flash Memory Built-in Self-Test Circuits." Thesis, 2004. http://ndltd.ncl.edu.tw/handle/15284824678922343291.
Full text國立清華大學
電機工程學系
92
Semiconductor memories play an important role in modern System-on-Chip (SoC) designs, including RAM and Flash memory. Semiconductor memory testing thus has been a key problem in testing integrated circuits for years. With their growing density and capacity, the test time grows rapidly if the test methodologies and equipments remain the same. Test time reduction other than parallel insertion—which is expensive and more and more difficult to keep up with the memory capacity growth—is a long time researched issue, as test cost is directly related to the time each product stays on the tester. Furthermore, we also need more design-for-testability (DFT) circuits to reduce the memory test time in the SoC era. The designers need to pay more attention to designing the DFT circuits. In this thesis, there are two parts devoted solving the memory testing issues discussed above. One is semiconductor memory test time reduction. We propose a systematic pproach to analying and rearranging the test items in the test flow. We propose two test compaction techniques: 1) merging existing test patterns, 2) developing efficient new test patterns. The proposed test time reduction algorithm is shown to effectively reduce the test time of an industrial DRAM test flow. The test time reduction tool also can identify the redundant test items, suggest a proper test list, and provide the correlation between the test items. In the industrial case, an extra 7% of the total test time is further reduced, on top of the original manually compacted test flow. The other is the Flash memory built-in self-test (BIST) circuit generator. This generator can generate synthesizable BIST RTL code in Verilog, and the generated BIST can combine with RAM BIST that is generated by a RAM BIST generator (called BRAINS). Besides, the generated BIST architecture supports paralled testing of multiple Flash memory cores to reduce test time in SoC.
Pokharel, Punj. "Path Delay Test Through Memory Arrays." Thesis, 2013. http://hdl.handle.net/1969.1/151274.
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