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Relevant bibliographies by topics / Metrology of electromagnetism

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Academic literature on the topic 'Metrology of electromagnetism'

Author: Grafiati

Published: 8 June 2024

Last updated: 31 July 2025

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Journal articles on the topic "Metrology of electromagnetism"

1

Cahan, David. "The awarding of the Copley Medal and the ‘discovery’ of the law of conservation of energy: Joule, Mayer and Helmholtz revisited." Notes and Records of the Royal Society 66, no. 2 (2011): 125–39. http://dx.doi.org/10.1098/rsnr.2011.0045.

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This article analyses the awarding of the Royal Society's Copley Medal to James Prescott Joule (1870), Julius Robert Mayer (1871) and Hermann Helmholtz (1873) in the wake of the establishment of the law of conservation of energy during the 1850s and 1860s. It seeks to reconstruct the context in which the awards occurred, emphasizing at once a combination of individual scientific achievement, advocacy on behalf of Joule's supporters, nationalism, and the special role that Helmholtz played thanks to the strong social relationship that he had developed with the British scientific elite in the two

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Storey, L. R. O. "<i>Letter to the Editor</i>: Revision of the basic equations of wave distribution function analysis." Annales Geophysicae 16, no. 5 (1998): 651–53. http://dx.doi.org/10.1007/s00585-998-0651-3.

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Abstract. The basic equations of wave distribution function analysis are rewritten in forms that treat the electric and magnetic fields of the waves in a more symmetrical way than the original equations do, and are slightly better for computing.Key words. Radio science (electromagnetic metrology) · Electromagnetics (plasmas; signal processing and adaptive antennas)

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Kim, Sung, Jack Surek, and James Baker-Jarvis. "Electromagnetic Metrology on Concrete and Corrosion." Journal of Research of the National Institute of Standards and Technology 116, no. 3 (2011): 655. http://dx.doi.org/10.6028/jres.116.011.

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Hao, Ling, John C. Gallop, and Jie Chen. "Electromagnetic Metrology for Nano- Electromechanical Systems." IEEE Transactions on Instrumentation and Measurement 68, no. 6 (2019): 1827–32. http://dx.doi.org/10.1109/tim.2018.2879068.

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Jalil, Muhammad Arif Bin. "Optical Interferometers and Its Applications in the Field of Medicine." International Journal for Research in Applied Science and Engineering Technology 12, no. 6 (2024): 1346–53. http://dx.doi.org/10.22214/ijraset.2024.63323.

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Abstract: A series of methods known as interferometry uses the phenomenon of interference which is typically caused by the superimposition of electromagnetic waves to gather information [1]. In the fields of astronomy, fibre optics, engineering metrology, optical metrology, oceanography, seismology, quantum mechanics, nuclear and particle physics, plasma physics, remote sensing, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, and optometry, interferometry is a valuable tool of investigation.[2]. Optical interferometry provides sen

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Yuan, Guang Hui, and Nikolay I. Zheludev. "Detecting nanometric displacements with optical ruler metrology." Science 364, no. 6442 (2019): 771–75. http://dx.doi.org/10.1126/science.aaw7840.

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We introduce the optical ruler, an electromagnetic analog of a physical ruler, for nanoscale displacement metrology. The optical ruler is a complex electromagnetic field in which singularities serve as the marks on the scale. It is created by the diffraction of light on a metasurface, with singularity marks then revealed by high-magnification interferometric observation. Using a Pancharatnam-Berry phase metasurface, we demonstrate a displacement resolving power of better than 1 nanometer (λ/800, where λ is the wavelength of light) at a wavelength of 800 nanometers. We argue that a resolving po

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Neyezhmakov, Pavel, Serhii Buriakovskyi, Olena Vasylieva, Volodymyr Velychko, Fedir Venislavskyi, and Serhii Rudenko. "Implementation of NATO standards to improve the electromagnetic immunity and compatibility of equipment of the critical infrastructure objects." Ukrainian Metrological Journal, no. 1 (April 12, 2023): 9–20. http://dx.doi.org/10.24027/2306-7039.1.2023.282464.

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Ensuring that domestic technical equipment meets modern safety and reliability requirements in accordance with NATO standards is a pressing problem in Ukraine. Without metrological support for testing the electromagnetic compatibility and immunity to powerful electromagnetic fields of natural and artificial origin, it is impossible to ensure reliable and safe use of modern electronic, electroenergetics and electric equipment in critical infrastructure facilities. The paper presents the metrological traceability paths of the state measurement standards in the field of electromagnetic meas

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Jalil, Muhammad Arif Bin. "Interferometers and Its Applications in Physics." International Journal for Research in Applied Science and Engineering Technology 12, no. 7 (2024): 98–104. http://dx.doi.org/10.22214/ijraset.2024.63447.

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Abstract: The interference phenomenon, which is usually brought about by the superimposition of electromagnetic waves, is employed by a collection of techniques collectively referred to as interferometry to gather data.[1] Interferometry is a helpful investigative tool in a number of fields, including astronomy, fibre optics, engineering metrology, optical metrology, oceanography, seismology, quantum mechanics, nuclear and particle physics, plasma physics, remote sensing, biomolecular interactions, surface profiling, microfluidics, mechanical stress/strain measurement, velocimetry, and optomet

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NIKOLAEV, M. YU, E. V. NIKOLAEVA, and A. K. NIKITIN. "PROCESS MODELING AND METROLOGY IN ELECTRICAL IMPULSE SYSTEMS." Actual Issues Of Energy 4, no. 1 (2022): 070–74. http://dx.doi.org/10.25206/2686-6935-2022-4-1-70-74.

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Electromagnetic force pulses are forces of mutual repulsion between the inductor and the anchor. Under their action, the anchor is shifted towards the cleaned surface of the affected object and elastic vibrations are transmitted to it. In electro-pulse interaction systems, the duration of the energy accumulation process, and then its release in extremely small time intervals, allows to obtain the maximum possible values of mechanical impulse action on the surface of the affected object. The maximum operating voltage on a capacitive energy storage device can reach 5 kV or higher. Electro-pulse

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Safarov, Abdurauf, Khurshid Sattarov, Makhammatyokub Bazarov, and Almardon Mustafoqulov. "Issues of the electromagnetic current transformers searching projecting." E3S Web of Conferences 264 (2021): 05038. http://dx.doi.org/10.1051/e3sconf/202126405038.

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The necessity of the primary transformers rapidly increases due to the fast development of the microprocessing automated control systems and operation of the railway transport power supply devices, transferring to the flexible automated output. These transformers, besides high metrology characteristics, have to be highly reliable, have a wide range of change, stability, little dimensions.

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Dissertations / Theses on the topic "Metrology of electromagnetism"

1

Sahin, Seckin. "Ultra-wideband, On-Chip Phased Arrays for Millimeter-wave and Terahertz Applications." The Ohio State University, 2019. http://rave.ohiolink.edu/etdc/view?acc_num=osu1574177160069196.

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Napolitano, Mario. "Interaction-based nonlinear quantum metrology with a cold atomic ensemble." Doctoral thesis, Universitat Politècnica de Catalunya, 2014. http://hdl.handle.net/10803/144558.

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In this manuscript we present an experimental and theoretical investigation of quantum-noise-limited measurement by nonlinear interferometry, or from another perspective, quantum-noise-limited interaction-based measurement. The experimental work is performed using a polarization-based quantum interface between propagating light pulses and cold rubidium-87 atoms trapped in an optical dipole trap. We first review the theory of quantum metrology and estimation theory, and we describe theoretical proposals for nonlinear quantum metrology as developed by the group of Carlton M. Caves in the Uni

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Badenhorst, J. "Metrology and modelling of high frequency probes." Thesis, Link to the online version, 2008. http://hdl.handle.net/10019/808.

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Le, Charles Tuan-Cong. "Angular memory effect and its interferometric applications in rough surface mean height profiling /." Thesis, Connect to this title online; UW restricted, 1996. http://hdl.handle.net/1773/6005.

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Zhou, Mengxi. "CEM des implants cardiaques aux basses fréquences 50 Hz dans un contexte normatif." Electronic Thesis or Diss., Université de Lorraine, 2023. http://www.theses.fr/2023LORR0110.

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Les dispositifs médicaux implantables actifs (DMIA) ont été rapidement développés et largement appliqués pour le traitement des pathologies cardiaques avec des technologies constamment mises à jour au cours des dernières décennies. Le nombre croissant de porteurs de DMAI, y compris dans la population active, a entraîné un questionnement quant à leurs effets potentiels en présence d'un champ électromagnétique (CEM). Ces interrogations ont, dès les années 60, concerné les possibles interférences liées au réseau de transport de l'énergie. En effet, les fréquences allouées à l'énergie électrique (

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Matos, Carmen. "Robotically Controlled Measurement System for Millimeter-Wave Antennas." The Ohio State University, 2020. http://rave.ohiolink.edu/etdc/view?acc_num=osu1588180162492972.

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Scheich, Roland. "Caractérisation et prédétermination des perturbations électromagnétiques conduites dans les convertisseurs de l'électronique de puissance." Grenoble INPG, 1993. https://hal.archives-ouvertes.fr/tel-02020576.

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Les travaux présentés dans ce mémoire ont pour objectif la modélisation des perturbations conduites dans les convertisseurs d'Electronique de Puissance. La caractérisation de ces perturbations émises sur le réseau d'alimentation se fait dans la bande des radiofréquences de 10 kHZ à 30 MHZ. Un chapitre important a été consacré aux notions de base, en traitement du signal, en matière de normes d'émission et de métrologie afin de définir clairement les méthodes et les procédures de mesure. Caractériser les spectres d'émission des convertisseurs d'électronique nécessite d'identifier les sources pe

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Galindo, Muñoz Natalia. "Development of direct measurement techniques for the in-situ internal alignment of accelerating structures." Doctoral thesis, Universitat Politècnica de València, 2018. http://hdl.handle.net/10251/100488.

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Las exigentes tolerancias de alineación en los componentes de los futuros colisionadores lineales de partículas requieren el desarrollo de nuevas técnicas de alineación más precisas que las existentes. Este es el caso del Colisionador Lineal Compacto (Compact Linear Collider, CLIC), cuyos objetivos altamente restrictivos de alineamiento alcanzan los 10 um. Para poder lograr el máximo rendimiento del acelerador, es necesario que el posicionamiento de las estructuras que aceleran las partículas y de los campos que las guían cumplan las tolerancias de alineación para dirigir el haz a lo largo de

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Zheng, Jiabao. "Efficient spin-photon interface for solid-state-based spin systems for quantum information processing and enhanced metrology." Thesis, 2017. https://doi.org/10.7916/D8N87PB3.

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The holy grail for quantum engineers and scientists is to build the quantum internet that spans over the entire globe. This information infrastructure holds the promise for transmitting information securely, scaling up computing power exponentially and setting the standards for precision measurement at the ultimate limit. Solid-state-based spin systems recently emerge as promising building blocks for the quantum internet. Among these candidates, the negatively charged nitrogen vacancy (NV) center in diamond attracted much attention thanks to its optical addressability, long spin coherence time

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Lauria, Eugene F. "A Study of a Reimaging System for Correcting Large-Scale Phase Errors in Reflector Antennas." 1992. https://scholarworks.umass.edu/theses/1210.

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This thesis investigates a new approach for dealing with the adverse effects of large-scale deformations in the main reflector of large Cassegrain antennas. In this method, the incident aperture distribution is imaged onto a tertiary focal plane. This is accomplished by using an optical imaging system consisting of a lens mounted behind the Cassegrain focus of the antenna. The lens forms a real image of the product of the incident aperture distribution and the pupil function of the antenna. The pupil function describes the profile of the main reflector of the antenna. If the incident aperture

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Books on the topic "Metrology of electromagnetism"

1

G, Bradford Ann, and National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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2

International Symposium on Electromagnetic Metrology (1989 Beijing, China). Electromagnetic metrology: Proceedings of International Symposium on Electromagnetic Metrology, ISEM '89, August 19-22, 1989, Beijing, China. International Academic Publishers, 1989.

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3

Motohisa, Kanda, and United States. National Bureau of Standards, eds. Electromagnetic compatibility and interference metrology: M.T. Ma, M. Kanda. National Bureau of Standards, 1986.

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4

E, DeWeese Mary, and National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

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5

E, Bailey A., and International Union of Radio Science., eds. URSI register of national standards laboratories for electromagnetic metrology. A. Hilger, 1990.

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6

E, DeWeese Mary, and United States. National Bureau of Standards, eds. Metrology for electromagnetic technology: A bibliography of NBS publications. U.S. Dept. of Commerce, National Bureau of Standards, 1988.

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7

M, Butler Chalmers, and National Institute of Standards and Technology (U.S.), eds. EMI/EMC metrology challenges for industry: A workshop on measurements, standards, calibrations, and accreditation. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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8

National Institute of Standards and Technology (U.S.), ed. METROLOGY FOR ELECTROMAGNETIC TECHNOLOGY: A BIBLIOGRAPHY OF NIST PUBLICATIONS... NIST 5064 ... U.S. DEPARTMENT OF COMMERCE... 1997. s.n., 1998.

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Electromagnetic compatibility and interference metrology. National Bureau of Standards, 1986.

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Beijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.

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Book chapters on the topic "Metrology of electromagnetism"

1

Sainson, Stéphane. "Metrology and Environment." In Electromagnetic Seabed Logging. Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-45355-2_3.

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2

Dubey, S. K., Saood Ahmad, C. K. Suman, et al. "Electromagnetic Metrology for Smart Technologies." In Metrology for Inclusive Growth of India. Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-8872-3_11.

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Dubey, S. K., Saood Ahmad, C. K. Suman, et al. "Electromagnetic Metrology for Smart Technologies." In Metrology for Inclusive Growth of India. Springer Singapore, 2020. http://dx.doi.org/10.1007/978-981-15-8872-3_12.

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Kahn, Walter K. "Inverse Methods in Microwave Metrology." In Inverse Methods in Electromagnetic Imaging. Springer Netherlands, 1985. http://dx.doi.org/10.1007/978-94-009-5271-3_22.

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Kahn, Walter K. "Inverse Methods in Microwave Metrology." In Inverse Methods in Electromagnetic Imaging. Springer Netherlands, 1985. http://dx.doi.org/10.1007/978-94-010-9444-3_61.

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Narang, Naina, Anshika Verma, Jaydeep Singh, and Dharmendra Singh. "Electromagnetic Metrology for Microwave Absorbing Materials." In Handbook of Metrology and Applications. Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-1550-5_80-1.

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Narang, Naina, Anshika Verma, Jaydeep Singh, and Dharmendra Singh. "Electromagnetic Metrology for Microwave Absorbing Materials." In Handbook of Metrology and Applications. Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-2074-7_80.

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Rahmat-Samii, Y. "Antenna Diagnosis by Microwave Holographic Metrology." In Electromagnetic Modelling and Measurements for Analysis and Synthesis Problems. Springer Netherlands, 1991. http://dx.doi.org/10.1007/978-94-011-3232-9_2.

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Nande, Swaraj Shekhar, Monika, Harish Singh Rawat, and Satya Kesh Dubey. "Study of Electromagnetic Induced Transparency and Its Dependence on Probe Decay for Cascade and Lambda Models." In Recent Advances in Metrology. Springer Nature Singapore, 2022. http://dx.doi.org/10.1007/978-981-19-2468-2_24.

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"Commission A: Electromagnetic Metrology." In Review of Radio Science 1996-1999. IEEE, 2009. http://dx.doi.org/10.1109/9780470546352.part1.

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Conference papers on the topic "Metrology of electromagnetism"

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de Aguilar, Javier Diaz, María Luisa Romero, Laura Matias, et al. "Metrology for electric vehicle charging stations." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646114.

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Seifert, Frank, Lorenz Keck, David Newell, and Darine Haddad. "The Quantum Electro-Mechanical Metrology Suite." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646165.

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Xue, Yilun, Bing Yu, Wangbin Xue, et al. "Quantum Enhanced Optical Phase Metrology Beyond the Standard Quantum Limit." In 2024 Photonics & Electromagnetics Research Symposium (PIERS). IEEE, 2024. http://dx.doi.org/10.1109/piers62282.2024.10618235.

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Djokic, B., H. Parks, and A. Said. "Metrology Framework for Electric Vehicle Charging Stations in Canada." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646063.

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Elg, Alf-Peter, Gert Rietveld, Jari Hällström, et al. "High-Voltage Metrology for Electric Energy and Supply Reliability." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646152.

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Marzano, Martina, Luca Callegaro, Juan Medved, et al. "QuAHMET: Quantum anomalous Hall effect materials and devices for metrology." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10645997.

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Wahlberg, Eric, Hans He, Tobias Bergsten, Karin Cedergren, and Gunnar Eklund. "Development of Graphene Quantum Hall Effect AC Metrology at RISE." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646073.

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Giordano, Domenico, Jorge Quintana Fernandez, Daniele Gallo, et al. "Metrology support for enhanced energy efficiency in DC transportation systems." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646053.

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Zucca, M., N. Al-Zubaidi-R-Smith, L. Bartova, et al. "The project ‘Metrology for Static and Dynamic Characterization of Supercapacitors’ – MetSuperCap." In 2024 Conference on Precision Electromagnetic Measurements (CPEM). IEEE, 2024. http://dx.doi.org/10.1109/cpem61406.2024.10646148.

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Nsugbe, Ejay, Ibrahim Sanusi, Olusayo Obajemu, Oluwarotimi Williams Samuel, Mojisola Grace Asogbon, and Guanglin Li. "A Low Channel Number Sensing Approach for an Ethnic Specific Labour Immanency Prediction using Bio-Electromagnetism." In 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT). IEEE, 2021. http://dx.doi.org/10.1109/metroind4.0iot51437.2021.9488436.

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Reports on the topic "Metrology of electromagnetism"

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DeWeese, Mary E. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1989. http://dx.doi.org/10.6028/nist.ir.89-3921.

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Kline, Kathryn E., and Mary E. DeWeese. metrology for electromagnetic technology :. National Bureau of Standards, 1985. http://dx.doi.org/10.6028/nbs.ir.85-3029.

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Kline, Kathryn E., and Mary E. DeWeese. Metrology for electromagnetic technology :. National Bureau of Standards, 1986. http://dx.doi.org/10.6028/nbs.ir.86-3048.

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Kline, Kathryn E., and Mary E. DeWeese. Metrology for electromagnetic technology :. National Bureau of Standards, 1987. http://dx.doi.org/10.6028/nbs.ir.87-3074.

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DeWeese, Mary E. Metrology for electromagnetic technology :. National Bureau of Standards, 1988. http://dx.doi.org/10.6028/nbs.ir.88-3097.

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DeWeese, Mary E. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1990. http://dx.doi.org/10.6028/nist.ir.3946.

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DeWeese, Mary E. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1991. http://dx.doi.org/10.6028/nist.ir.3972.

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DeWeese, Mary E., and Sarabeth Meynihan. Metrology for electromagnetic technology :. National Institute of Standards and Technology, 1992. http://dx.doi.org/10.6028/nist.ir.3994.

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Ma, Mark T. Electromagnetic compatibility and interference metrology. National Bureau of Standards, 1986. http://dx.doi.org/10.6028/nbs.tn.1099.

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Metrology for electromagnetic technology:. National Institute of Standards and Technology, 1993. http://dx.doi.org/10.6028/nist.ir.5008.

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