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Books on the topic 'Metrology of electromagnetism'

Author: Grafiati
Published: 8 June 2024
Last updated: 31 July 2025

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1

G, Bradford Ann, and National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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2

International Symposium on Electromagnetic Metrology (1989 Beijing, China). Electromagnetic metrology: Proceedings of International Symposium on Electromagnetic Metrology, ISEM '89, August 19-22, 1989, Beijing, China. International Academic Publishers, 1989.

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3

Motohisa, Kanda, and United States. National Bureau of Standards, eds. Electromagnetic compatibility and interference metrology: M.T. Ma, M. Kanda. National Bureau of Standards, 1986.

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4

E, DeWeese Mary, and National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

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5

E, Bailey A., and International Union of Radio Science., eds. URSI register of national standards laboratories for electromagnetic metrology. A. Hilger, 1990.

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6

E, DeWeese Mary, and United States. National Bureau of Standards, eds. Metrology for electromagnetic technology: A bibliography of NBS publications. U.S. Dept. of Commerce, National Bureau of Standards, 1988.

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7

M, Butler Chalmers, and National Institute of Standards and Technology (U.S.), eds. EMI/EMC metrology challenges for industry: A workshop on measurements, standards, calibrations, and accreditation. U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.

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8

National Institute of Standards and Technology (U.S.), ed. METROLOGY FOR ELECTROMAGNETIC TECHNOLOGY: A BIBLIOGRAPHY OF NIST PUBLICATIONS... NIST 5064 ... U.S. DEPARTMENT OF COMMERCE... 1997. s.n., 1998.

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9

Electromagnetic compatibility and interference metrology. National Bureau of Standards, 1986.

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10

Beijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.

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11

Beijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.

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12

Metrology for electromagnetic technology: A bibliography of NIST publications. U.S. Dept. of Commerce, National Institute of Standards, 1989.

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13

Metrology for electromagnetic technology: A bibliography of NBS publications. U.S. Dept. of Commerce, National Bureau of Standards, 1987.

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14

Buchwald, Jed Z., and Robert Fox, eds. The Oxford Handbook of the History of Physics. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199696253.001.0001.

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Abstract:
This Handbook traces the history of physics, bringing together chapters on major advances in the field from the seventeenth century to the present day. It is organized into four sections, following a broadly chronological structure. Part I explores the place of reason, mathematics, and experiment in the age of what we know as the scientific revolution of the seventeenth century. The contributions of Galileo, René Descartes, and Isaac Newton are central to this section, as is the multiplicity of paths to the common goal of understanding. Some of these paths reflected the turn to Thomas Kuhn’s c
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15

Hami, Abdelkhalak El, Philippe Pougnet, and Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.

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16

Hami, Abdelkhalak El, Philippe Pougnet, and Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.

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17

Hami, Abdelkhalak El, Philippe Pougnet, and Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.

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18

Hami, Abdelkhalak El, Philippe Pougnet, and Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.

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