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Journal articles on the topic 'Metrology'

Author: Grafiati

Published: 4 June 2021

Last updated: 25 July 2025

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1

Brown, Richard J. C., and Paul J. Brewer. "The Silent Benefactor: Why Explaining the Importance of Metrology Involves Addressing the Counterfactual." Metrology 5, no. 2 (2025): 27. https://doi.org/10.3390/metrology5020027.

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Metrology, the science of measurement, is an essential underpinning technology—an infratechnology. The correct functioning of the international measurement system that metrology supports is a prerequisite for the development of technology and wider progress in science. Metrology and the measurement system are at risk of being underappreciated. They potentially face a ‘no-win’ environment: their consistent success, a testament to their effectiveness, ironically leads to invisibility. The public and media tend only to pay attention when things go wrong, resulting in negative headlines. Furthermo

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2

Widarta, A. "CCEM key comparison CCEM.RF-K26. Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator. Final report of the pilot laboratory." Metrologia 61, no. 1A (2024): 01001. http://dx.doi.org/10.1088/0026-1394/61/1a/01001.

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Main text This report summarizes the results of the Key Comparison CCEM.RF-K26 Attenuation at 18 GHz, 26.5 GHz and 40 GHz using a step attenuator which has been performed from January 2015 to February 2018. Fourteen National Metrology Institutes (NMIs) participated in this key comparison, including the National Metrology Institute of Japan (NMIJ/AIST, Japan) which served as pilot laboratory, the National Institute of Metrology (NIM, China), the Physikalisch-Technische Bundesanstal (PTB, Germany), the Laboratoire national de métrologie et d'essais (LNE, France), the Swiss Federal Office for Met

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3

Batóg, Barbara, Mariusz Doszyń, Paweł Majda, et al. "Assessment of the impact of metrology on the economy in Poland by means of the Solow model." Wiadomości Statystyczne. The Polish Statistician 2024, no. 12 (2024): 16–37. https://doi.org/10.59139/ws.2024.12.2.

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The impact of metrology on the economy is typically determined on the basis of econometric models that are the modifications of the Cobb-Douglas function and which take into account total factor productivity (TFP). Such models make it possible to examine the cointegration of metrological variables and basic macroeconomic variables. However, this approach could not be used to determine the impact of metrology on the economy in Poland due to too few observations, and thus short time series of the macroeconomic data. The aim of the study presented in this article is to assess the impact of metrol

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4

Costa-Félix, Rodrigo, Americo Bernardes, José Carlos Valente de Oliveira, et al. "VII Brazilian Congress on Metrology (Metrologia 2013)." Journal of Physics: Conference Series 575 (January 6, 2015): 011001. http://dx.doi.org/10.1088/1742-6596/575/1/011001.

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5

Azzumar, Muhammad, та Agah Faisal. "DISEMINASI RESISTOR STANDAR 1 KΩ KE STANDAR KERJA". Jurnal Standardisasi 17, № 3 (2016): 223. http://dx.doi.org/10.31153/js.v17i3.322.

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<p>Abstrak<br />Diseminasi nilai kalibrasi resistor standar kepada standar kerja di Puslit Metrologi - LIPI telah dilakukan. Hal ini bertujuan untuk mendapatkan hasil kalibrasi dan estimasi ketidakpastiannya yang valid dan tertelusur ke SI pada standar kerja. Desiminasi dilakukan dengan cara mengimplenmentasikan nilai kalibrasi resistor standar 1 kΩ ke resistor acuan dan kemudian ke standar kerja. Nilai yang telah diturunkan kepada standar kerja, reference multimeter, telah dibandingkan dengan nilai pengukuran yang dilakukan oleh KRISS (Korea Research Institute of Standards and Sci

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6

Harfiah, Rismisari. "Implementasi Rancangan Pelatihan Kemetrologian bagi Juru Timbang Menggunakan Metode ADDIE." Cendekia Niaga 3, no. 1 (2019): 9–13. http://dx.doi.org/10.52391/jcn.v3i1.457.

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Legal metrology is a very large and complex field to be implemented. In realizing orderly measurement for all of Indonesia, very large human resources are needed. A total of 1900 Metrology Human Resources currently available cannot meet the needs of the community, which includes at least 14.230 traditional markets and hundreds of modern markets spread throughout Indonesia. Adding large numbers of Metrologi personnel from ASN is very difficult, the most likely choice is to recruit personnel outside metrology such as market managers of traditional and modern market. This situation encouraging id

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7

Kibble, Bryan. "Everyday instruments from basic metrology [Basic Metrology]." IEEE Instrumentation & Measurement Magazine 18, no. 3 (2015): 9–10. http://dx.doi.org/10.1109/mim.2015.7108212.

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8

Du, Mingxin, Boyong Gao, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong, and Yuqi Luo. "Design and Implementation of Time Metrology Vocabulary Ontology." Electronics 13, no. 14 (2024): 2828. http://dx.doi.org/10.3390/electronics13142828.

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The advent of the digital era has put forward an urgent need for the digitization of metrology, and the digitization of metrology vocabularies is one of the fundamental and critical steps to achieve the digital transformation of metrology. Metrology vocabulary ontology can facilitate the exchange and sharing of data and is an important way to achieve the digitization of metrology vocabulary. Time metrology vocabulary is a special and important part of the whole metrology vocabulary, and constructing its ontology can reduce the problems caused by semantic confusion, help to smooth the progress

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9

Krutikov, V. N., and V. V. Okrepilov. "Money Metrology." Measurement Techniques 63, no. 12 (2021): 993–1003. http://dx.doi.org/10.1007/s11018-021-01883-8.

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10

Krutikov, V. N., and V. V. Okrepilov. "Money metrology." Izmeritel`naya Tekhnika, no. 12 (2020): 42–50. http://dx.doi.org/10.32446/0368-1025it.2020-12-42-50.

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The influence of the provisions of legal metrology on the formation and functioning of the monetary environment in market conditions is studied. It is shown that the use of material (reference) measures for determining the value of goods in monetary units makes it possible to form a stable monetary system, equal for all market participants. This system can reasonably be attributed to information measuring systems. Systems based on the use of constant material measures that determine the value of goods and money in international trade have been formed and functioned for a long time. In the XIX-

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11

Kuster, Mark. "Metrology News." NCSL International measure 13, no. 2 (2021): 18–22. http://dx.doi.org/10.51843/measure.13.2.3.

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12

Picotto, G. B., L. Koenders, and G. Wilkening. "Nanoscale metrology." Measurement Science and Technology 20, no. 8 (2009): 080101. http://dx.doi.org/10.1088/0957-0233/20/8/080101.

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13

Klapetek, P., and L. Koenders. "Nanoscale metrology." Measurement Science and Technology 22, no. 9 (2011): 090101. http://dx.doi.org/10.1088/0957-0233/22/9/090101.

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14

Currim, Sabah, Richard T. Snodgrass, Young-Kyoon Suh, and Rui Zhang. "DBMS Metrology." ACM Transactions on Database Systems 42, no. 1 (2017): 1–42. http://dx.doi.org/10.1145/2996454.

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15

Crease, Robert P. "Chinese metrology." Physics World 24, no. 07 (2011): 16–17. http://dx.doi.org/10.1088/2058-7058/24/07/24.

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16

Hentschel, M., R. Kienberger, Ch Spielmann, et al. "Attosecond metrology." Nature 414, no. 6863 (2001): 509–13. http://dx.doi.org/10.1038/35107000.

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17

Kleine-Ostmann, T., T. Schrader, M. Bieler, et al. "THz Metrology." Frequenz 62, no. 5-6 (2008): 137–48. http://dx.doi.org/10.1515/freq.2008.62.5-6.137.

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18

Jiang, X., and D. J. Whitehouse. "Precision metrology." Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences 370, no. 1973 (2012): 4154–60. http://dx.doi.org/10.1098/rsta.2012.0175.

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This article is a summary of the Satellite Meeting, which followed on from the Discussion Meeting at the Royal Society on ‘Ultra-precision engineering: from physics to manufacture’, held at the Kavli Royal Society International Centre, Chicheley Hall, Buckinghamshire, UK. The meeting was restricted to 18 invited experts in various aspects of precision metrology from academics from the UK and Sweden, Government Institutes from the UK and Germany and global aerospace industries. It examined and identified metrology problem areas that are, or may be, limiting future developments in precision engi

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19

Whitehouse, D. J. "Surface metrology." Measurement Science and Technology 8, no. 9 (1997): 955–72. http://dx.doi.org/10.1088/0957-0233/8/9/002.

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20

Goch, G. "Gear Metrology." CIRP Annals 52, no. 2 (2003): 659–95. http://dx.doi.org/10.1016/s0007-8506(07)60209-1.

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21

Whitehouse, D. J. "Surface metrology." Computer Standards & Interfaces 21, no. 2 (1999): 185. http://dx.doi.org/10.1016/s0920-5489(99)92250-x.

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22

Williams, D. C. "Optical metrology." Optics & Laser Technology 20, no. 3 (1988): 163. http://dx.doi.org/10.1016/0030-3992(88)90048-5.

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23

Burch, J. M. "Optical metrology." Optics & Laser Technology 20, no. 2 (1988): 105. http://dx.doi.org/10.1016/0030-3992(88)90101-6.

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24

Ennos, A. E. "Speckle metrology." Optics & Laser Technology 26, no. 5 (1994): 371–72. http://dx.doi.org/10.1016/0030-3992(94)90127-9.

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25

Xiang, Guo-Yong, and Guang-Can Guo. "Quantum metrology." Chinese Physics B 22, no. 11 (2013): 110601. http://dx.doi.org/10.1088/1674-1056/22/11/110601.

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26

Baker, L. R. "Optical Metrology." Journal of Modern Optics 35, no. 5 (1988): 753–54. http://dx.doi.org/10.1080/09500348814550801.

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27

Margolis, Helen S. "Moving metrology." Nature Photonics 1, no. 5 (2007): 258–59. http://dx.doi.org/10.1038/nphoton.2007.55.

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28

Horiuchi, Noriaki. "Spin metrology." Nature Photonics 7, no. 6 (2013): 423. http://dx.doi.org/10.1038/nphoton.2013.143.

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29

Thompson, R. C. "Modern metrology." Contemporary Physics 34, no. 3 (1993): 153–55. http://dx.doi.org/10.1080/00107519308213813.

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30

Piruzyan, L. A. "Physiological Metrology." Doklady Biological Sciences 404, no. 1-6 (2005): 341–44. http://dx.doi.org/10.1007/s10630-005-0130-x.

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31

KIYONO, Satoshi. "Intelligent Metrology." Journal of the Japan Society for Precision Engineering 75, no. 1 (2009): 89–90. http://dx.doi.org/10.2493/jjspe.75.89.

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32

YOSHIZAWA, Toru. "Optical metrology." Journal of the Japan Society for Precision Engineering 75, no. 1 (2009): 93–94. http://dx.doi.org/10.2493/jjspe.75.93.

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33

Fischer, J., and B. Fellmuth. "Temperature metrology." Reports on Progress in Physics 68, no. 5 (2005): 1043–94. http://dx.doi.org/10.1088/0034-4885/68/5/r02.

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34

BIRD, H. A. "WHITHER METROLOGY?" Rheumatology 26, no. 3 (1987): 165–67. http://dx.doi.org/10.1093/rheumatology/26.3.165.

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35

Voas, Jeffrey, Rick Kuhn, and Phillip A. Laplante. "IoT Metrology." IT Professional 20, no. 3 (2018): 6–10. http://dx.doi.org/10.1109/mitp.2018.032501740.

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36

"Preface." Journal of Physics: Conference Series 2606, no. 1 (2023): 011001. http://dx.doi.org/10.1088/1742-6596/2606/1/011001.

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11th Brazilian Congress on Metrology (Metrologia 2021) The Metrology 2021 congress was held from October 18th to 21st, 2021. It was a remote event, with all activities done in virtual rooms. The general president of Metrology 2021 was Americo Bernardes, president of the Brazilian Society of Metrology and professor at the Federal University of Ouro Preto. Metrology 2021 Magna session was the lecture Dr. Claire M. Saundry (NIST) gave on the first day, October 18th. Dr. Saundry spoke about the main activities of the Interamerican Metrology System (or “Sistema Interamericano de Metrologia” – SIM)

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37

Chrzanowski, K. "Review of night vision metrology." Opto-Electronics Review 23, no. 2 (2015). http://dx.doi.org/10.1515/oere-2015-0024.

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AbstractA review of night vision metrology is presented in this paper. A set of reasons that create a rather chaotic metrologic situation on night vision market is presented. It is shown that there has been made a little progress in night vision metrology during last decades in spite of a big progress in night vision technology at the same period of time. It is concluded that such a big discrep- ancy between metrology development level and technology development can be an obstacle in the further development of night vision technology.

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38

Brown, Christopher A. "Surface Metrology Principles for Snow and Ice Friction Studies." Frontiers in Mechanical Engineering 7 (December 16, 2021). http://dx.doi.org/10.3389/fmech.2021.753906.

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Recent advances in surface metrology science are applied to understanding friction with snow and ice. Conventional surface metrology’s measurement, analyses, and characterizations, have inherent limitations for elucidating tribological interactions. Strong functional correlations and confident discriminations with slider surface topographies, textures, or “roughness”, have largely eluded researchers using conventional methods. Building on 4 decades of research using multiscale geometric methods, two surface metrology axioms and corollaries are proposed with good potential to provide new techno

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39

Cheng, Mingjian, Wenjie Jiang, Lixin Guo, Jiangting Li, and Andrew Forbes. "Metrology with a twist: probing and sensing with vortex light." Light: Science & Applications 14, no. 1 (2025). https://doi.org/10.1038/s41377-024-01665-1.

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AbstractOptical metrology is a well-established subject, dating back to early interferometry techniques utilizing light’s linear momentum through fringes. In recent years, significant interest has arisen in using vortex light with orbital angular momentum (OAM), where the phase twists around a singular vortex in space or time. This has expanded metrology’s boundaries to encompass highly sensitive chiral interactions between light and matter, three-dimensional motion detection via linear and rotational Doppler effects, and modal approaches surpassing the resolution limit for improved profiling

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40

Lewis, Andrew John, and Andrew Yacoot. "Editorial for the Metrologia Focus Issue on Length Metrology." Metrologia, January 5, 2023. http://dx.doi.org/10.1088/1681-7575/acb05b.

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Abstract This Focus Issue of Metrologia was instigated by the Consultative Committee for Length's Working Group on Strategic Planning when it met online in 2020 during the COVID-19 pandemic. Submission of articles started closely thereafter and was closed in September 2022. Covering a wide range of topics, the issue shows that despite the Coronavirus pandemic disrupting laboratory work, length metrology researchers have continued to deliver cutting edge research. The revised definition of the metre and its Mise en Pratique, both published in 2019, have stimulated further research and opened ad

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41

"8th Brazilian Congress on Metrology (Metrologia 2015)." Journal of Physics: Conference Series 733 (July 2016): 011001. http://dx.doi.org/10.1088/1742-6596/733/1/011001.

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42

"9th Brazilian Congress on Metrology (Metrologia 2017)." Journal of Physics: Conference Series 975 (March 2018): 011001. http://dx.doi.org/10.1088/1742-6596/975/1/011001.

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43

"Metrology." Precision Engineering 15, no. 4 (1993): 300. http://dx.doi.org/10.1016/0141-6359(93)90162-4.

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44

Wright, Louise, and Stuart Davidson. "Digital twins for metrology; metrology for digital twins." Measurement Science and Technology, January 18, 2024. http://dx.doi.org/10.1088/1361-6501/ad2050.

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Abstract Digital twinning is a rapidly growing area of research. Digital twins combine models and data to provide up-to-date information about the state of a system. They support reliable decision-making in fields such as structural monitoring and advanced manufacturing. The use of metrology data to update models in this way offers benefits in many areas, including metrology itself. The recent activities in digitalisation of metrology offer a great opportunity to make metrology data “twin-friendly” and to incorporate digital twins into metrological processes. This paper discusses key features

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45

Giovannetti, Vittorio, Seth Lloyd, and Lorenzo Maccone. "Quantum Metrology." Physical Review Letters 96, no. 1 (2006). http://dx.doi.org/10.1103/physrevlett.96.010401.

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46

"Chemical metrology." Analytical Methods 8, no. 46 (2016): 8119–22. http://dx.doi.org/10.1039/c6ay90155g.

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47

Bennett, Seton, and Joaquin Valdés. "Materials metrology." Metrologia 47, no. 2 (2010). http://dx.doi.org/10.1088/0026-1394/47/2/e01.

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48

Thomas, David J., Ralf Nolte, and Vincent Gressier. "Neutron metrology." Metrologia 48, no. 6 (2011). http://dx.doi.org/10.1088/0026-1394/48/6/e01.

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49

Vorburger, Theodore. "Surface Metrology." Optical Engineering 24, no. 3 (1985). http://dx.doi.org/10.1117/12.7973491.

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50

Koenders, L., F. Meli, and G. Wilkening. "Nanoscale Metrology." Measurement Science and Technology 18, no. 2 (2007). http://dx.doi.org/10.1088/0957-0233/18/2/e01.

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