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Journal articles on the topic 'Micro-diffraction X'

Author: Grafiati

Published: 4 June 2021

Last updated: 1 February 2022

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1

Musumeci, Daniele, Chunhua Hu, and Michael Ward. "Fighting Counterfeit Drugs Using Micro-X-Ray Diffraction." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1134. http://dx.doi.org/10.1107/s2053273314088652.

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A new protocol using micro-X-ray diffraction is developed to certify the authenticity of drug tablets, and therefore to prevent, deter, or detect counterfeit medicinal products. The method uses X-ray to map hidden patterns printed under the tablet coating and on packages. The patterns such as barcodes and logos are made of compounds approvoved by the Food and Drug Administration. The method is nondestructive, automated and user-friendly. The protocol relies on verification of phase, composition, and pattern readout in a single measurement, which reduces the risk of circumvention.

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2

Wroblewski, Thomas, A. Bjeoumikhov, and Bernd Hasse. "Micro Diffraction Imaging of Bulk Polycrystalline Materials." Materials Science Forum 524-525 (September 2006): 273–78. http://dx.doi.org/10.4028/www.scientific.net/msf.524-525.273.

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X-ray diffraction imaging applies an array of parallel capillaries in front of a position sensitive detector. Conventional micro channel plates of a few millimetre thickness have successfully been used as collimator arrays but require short sample to detector distances to achieve high spatial resolution. Furthermore, their limited absorption restricts their applications to low energy X-rays of around 10 keV. Progress in the fabrication of long polycapillaries allows an increase in the sample to detector distance without decreasing resolution and the use of high X-ray energies enables bulk inve

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3

Eatough, M. O., M. A. Rodriguez, D. Dimos, and B. Tuttle. "Microanalysis of Ferroelectric Memories Using Micro X-Ray Diffraction." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 244–45. http://dx.doi.org/10.1017/s042482010016368x.

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Since the advent of the microdiffractometer a new world of analysis possibilities have opened. In this paper we will discuss a novel use of microdifraction. We have developed a method for monitoring domain switching in ferroelectric thin films in situ using micro x-ray diffraction (μXRD). μXRD is a nontraditional x-ray diffraction technique which has recently attracted much attention [3]. The microdiffractometer is capable of obtaining a diffraction pattern from 0 – 150° 20 simultaneously from regions as small as 30μm in diameter. The purpose of this study was to determine if ferroelectric swi

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4

Kirk, C., and G. Cressey. "Pushing the limits of laboratory X-ray (micro) diffraction." Acta Crystallographica Section A Foundations of Crystallography 60, a1 (2004): s51. http://dx.doi.org/10.1107/s010876730409899x.

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5

Lau, Deborah, David Hay, and Natasha Wright. "Micro X-ray diffraction for painting and pigment analysis." AICCM Bulletin 30, no. 1 (2006): 38–43. http://dx.doi.org/10.1179/bac.2006.30.1.005.

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6

Wang, Hejing, and Jian Zhou. "On the peak shapes of X-ray micro diffraction." Acta Crystallographica Section A Foundations of Crystallography 66, a1 (2010): s301—s302. http://dx.doi.org/10.1107/s0108767310093062.

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7

Tardif, Samuel, Alban Gassenq, Kevin Guilloy, et al. "Lattice strain and tilt mapping in stressed Ge microstructures using X-ray Laue micro-diffraction and rainbow filtering." Journal of Applied Crystallography 49, no. 5 (2016): 1402–11. http://dx.doi.org/10.1107/s1600576716010347.

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Laue micro-diffraction and simultaneous rainbow-filtered micro-diffraction were used to measure accurately the full strain tensor and the lattice orientation distribution at the sub-micrometre scale in highly strained, suspended Ge micro-devices. A numerical approach to obtain the full strain tensor from the deviatoric strain measurement alone is also demonstrated and used for faster full strain mapping. The measurements were performed in a series of micro-devices under either uniaxial or biaxial stress and an excellent agreement with numerical simulations was found. This shows the superior po

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8

Nichols, M. C., and R. W. Ryon. "An X-Ray Micro-Fluorescence Analysis System With Diffraction Capabilities." Advances in X-ray Analysis 29 (1985): 423–26. http://dx.doi.org/10.1154/s0376030800010533.

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AbstractA prototype X-ray fluorescence system for chemical and phase microanalysis of materials has been developed and tested. Preliminary work with this system has indicated X-ray fluorescence detection limits on the order of 40 picograms for heavier elements such as gold when using a 100 micron collimator, 400 second counting time and a silver anode operating at 12 Kw. Phase identification by X- ray diffraction can be obtained from the same spot. A proposed design for an improved system providing greater elemental sensitivities and capable of semi-automated operation has been completed.

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9

Nestola, Fabrizio, Marcello Merli, Paolo Nimis, et al. "In situ analysis of garnet inclusion in diamond using single-crystal X-ray diffraction and X-ray micro-tomography." European Journal of Mineralogy 24, no. 4 (2012): 599–606. http://dx.doi.org/10.1127/0935-1221/2012/0024-2212.

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10

Hofmann, F., X. Song, T. S. Jun, et al. "High energy transmission micro-beam Laue synchrotron X-ray diffraction." Materials Letters 64, no. 11 (2010): 1302–5. http://dx.doi.org/10.1016/j.matlet.2010.03.014.

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11

Noma, Takashi, Kazuhiro Takada, Hirokatsu Miyata, and Atsuo Iida. "X-ray micro diffraction study on mesostructured silica thin films." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 467-468 (July 2001): 1021–25. http://dx.doi.org/10.1016/s0168-9002(01)00577-0.

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12

Müller, Christian, Morteza Esmaeili, Christian Riekel, Dag W. Breiby, and Olle Inganäs. "Micro X-ray diffraction mapping of a fluorene copolymer fibre." Polymer 54, no. 2 (2013): 805–11. http://dx.doi.org/10.1016/j.polymer.2012.10.059.

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13

Lynch, P. A., A. W. Stevenson, D. Liang, D. Parry, S. Wilkins, and N. Tamura. "A laboratory based system for Laue micro x-ray diffraction." Review of Scientific Instruments 78, no. 2 (2007): 023904. http://dx.doi.org/10.1063/1.2437777.

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14

Wroblewski, T., A. A. Bjeoumikhov, and B. Hasse. "D004 Micro X-ray Diffraction Imaging of Bulk Polycrystalline Materials." Powder Diffraction 20, no. 2 (2005): 173. http://dx.doi.org/10.1154/1.1979023.

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15

Alexeev, A. V., and S. A. Gromilov. "X-Ray Diffraction Study of Micro Amounts of Polycrystalline Samples." Journal of Structural Chemistry 51, no. 4 (2010): 744–57. http://dx.doi.org/10.1007/s10947-010-0110-3.

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16

Duan Zeming, 段泽明, 姜其立 Jiang Qili, 刘俊 Liu Jun, 潘秋丽 Pan Qiuli, and 程琳 Cheng Lin. "Micro Energy Dispersive X-Ray Diffraction Analysis by Polycapillary X-Ray Optics Focusing." Acta Optica Sinica 38, no. 12 (2018): 1230002. http://dx.doi.org/10.3788/aos201838.1230002.

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17

Berti, Giovanni. "Detection and Modelling of Micro-Crystallinity by Means of X-ray Powder Diffractometry." Advances in X-ray Analysis 38 (1994): 405–12. http://dx.doi.org/10.1154/s037603080001805x.

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Methods for detecting and modeling micro-crystallinity are discussed in view of determining the systematic effects produced on powder diffraction patterns by both sample features and instrumentation. The mathematical theory of x-ray powder diffraction is the appropriate developmental base for defining micro-crystallinity models in terms of structural ohservables, as well as the “mean equivalent lattice” in terms of computational approximations. Such a theory indicates the way to detect micro-crystallinity accurately and precisely within the limits of the approximations. Measurements have been

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18

Dobal, P. S., R. S. Katiyar, Y. Jiang, R. Guo, and A. S. Bhalla. "Micro-Raman scattering and x-ray diffraction studies of (Ta2O5)1−x(TiO2)x ceramics." Journal of Applied Physics 87, no. 12 (2000): 8688–94. http://dx.doi.org/10.1063/1.373597.

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19

He, Bob Baoping. "Microdiffraction using two-dimensional detectors." Powder Diffraction 19, no. 2 (2004): 110–18. http://dx.doi.org/10.1154/1.1752948.

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X-ray diffraction analysis on small samples or micro-area of large samples is always a challenge due to weak diffraction and poor statistics, especially when dealing with samples containing large grain size, inhomogeneous phase distribution, and preferred orientation. Two-dimensional X-ray diffraction has many advantages in microdiffraction analysis. A two-dimensional detector can collect a large amount of data both in terms of speed and angular coverage. This paper covers some aspects about instrumentation of two-dimensional X-ray diffraction and its applications in phase identification and s

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20

Suvorova and Buffat. "Electron diffraction from micro- and nanoparticles of hydroxyapatite." Journal of Microscopy 196, no. 1 (1999): 46–58. http://dx.doi.org/10.1046/j.1365-2818.1999.00608.x.

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21

De Nolf, Wout, Frederik Vanmeert, and Koen Janssens. "XRDUA: crystalline phase distribution maps by two-dimensional scanning and tomographic (micro) X-ray powder diffraction." Journal of Applied Crystallography 47, no. 3 (2014): 1107–17. http://dx.doi.org/10.1107/s1600576714008218.

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Imaging of crystalline phase distributions in heterogeneous materials, either plane projected or in virtual cross sections of the object under investigation, can be achieved by scanning X-ray powder diffraction employing X-ray micro beams and X-ray-sensitive area detectors. Software exists to convert the two-dimensional powder diffraction patterns that are recorded by these detectors to one-dimensional diffractograms, which may be analysed by the broad variety of powder diffraction software developed by the crystallography community. However, employing these tools for the construction of cryst

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22

HORIUCHI, Hiroyuki, and Masahiko TANAKA. "Crystallographic Analyses of Mineral Textures by Micro-area X-ray Diffraction." Journal of the Mineralogical Society of Japan 21, no. 2 (1992): 47–57. http://dx.doi.org/10.2465/gkk1952.21.47.

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23

Reibenspies, Joseph H., and Nattamai S. P. Bhuvanesh. "Combinatorial screening employing nylon loops and micro-X-ray powder diffraction." Journal of Pharmaceutical and Biomedical Analysis 37, no. 3 (2005): 611–14. http://dx.doi.org/10.1016/j.jpba.2004.11.007.

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24

Pernot, Etienne, Michel Mermoux, J. Kreisel, et al. "X-ray Diffraction, Micro-Raman and Birefringence Imaging of Silicon Carbide." Materials Science Forum 353-356 (January 2001): 283–86. http://dx.doi.org/10.4028/www.scientific.net/msf.353-356.283.

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25

Choi, W. J., T. Y. Lee, K. N. Tu, et al. "Tin whiskers studied by synchrotron radiation scanning X-ray micro-diffraction." Acta Materialia 51, no. 20 (2003): 6253–61. http://dx.doi.org/10.1016/s1359-6454(03)00448-8.

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26

IZAWA, Matthew R. M., Roberta L. FLEMMING, Neil R. BANERJEE, and Philip J. A. McCAUSLAND. "Micro-X-ray diffraction assessment of shock stage in enstatite chondrites." Meteoritics & Planetary Science 46, no. 5 (2011): 638–51. http://dx.doi.org/10.1111/j.1945-5100.2011.01180.x.

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27

Bjelle, Anders, and Bengt Sundström. "MICRO X-RAY DIFFRACTION OF CARTILAGE BIOPSY SPECIMENS IN ARTICULAR CHONDROCALCINOSIS." Acta Pathologica Microbiologica Scandinavica 76, no. 4 (2009): 497–500. http://dx.doi.org/10.1111/j.1699-0463.1969.tb03281.x.

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28

Mao, Ho-Kwang, and Russell J. Hemley. "Energy dispersive x-ray diffraction of micro-crystals at ultrahigh pressures." High Pressure Research 14, no. 4-6 (1996): 257–67. http://dx.doi.org/10.1080/08957959608201410.

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29

Noyan, I. C. "D-109 Sampling Volume Concerns in Micro X-ray Diffraction—Invited." Powder Diffraction 19, no. 2 (2004): 203. http://dx.doi.org/10.1154/1.1779833.

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30

Berberich, F., H. Graafsma, B. Rousseau, et al. "Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films." Journal of Materials Research 20, no. 12 (2005): 3270–73. http://dx.doi.org/10.1557/jmr.2005.0421.

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A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

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31

Noma, Takashi, and Atsuo Iida. "Micro X-ray diffraction analysis of thin films using grazing-exit conditions." Journal of Synchrotron Radiation 5, no. 3 (1998): 902–4. http://dx.doi.org/10.1107/s090904959701755x.

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An X-ray diffraction technique using a hard X-ray microbeam for thin-film analysis has been developed. To optimize the spatial resolution and the surface sensitivity, the X-ray microbeam strikes the sample surface at a large glancing angle while the diffracted X-ray signal is detected with a small (grazing) exit angle. Kirkpatrick–Baez optics developed at the Photon Factory were used, in combination with a multilayer monochromator, for focusing X-rays. The focused beam size was about 10 × 10 µm. X-ray diffraction patterns of Pd, Pt and their layered structure were measured. Using a small exit

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32

Sun, Tianxi, Meirong Zhang, Xunliang Ding, Zhiguo Liu, Xiaoyan Lin, and Hui Liu. "Characterization of polycapillary X-ray lens for application in confocal three-dimensional energy-dispersive micro X-ray diffraction experiments." Journal of Applied Crystallography 40, no. 6 (2007): 1169–73. http://dx.doi.org/10.1107/s0021889807048285.

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A confocal technology based on polycapillary X-ray optics is proposed to perform three-dimensional energy-dispersive micro X-ray diffraction. A three-dimensional energy-dispersive micro X-ray diffractometer based on a polycapillary focusing X-ray lens (PFXRL) in the excitation channel and a polycapillary parallel X-ray lens (PPXRL) in the detection channel has been designed. At 2\theta = 90^ \circ, the lateral resolution l_X \times l_Y of this diffractometer is 49.7 \times 49.9 \rm \micro m at 7.5 keV, and its depth resolution d_Z is 48.1 \rm \micro m at 8.0 keV. The total resolution of this d

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33

Chen, Hongqiang, Y. Lawrence Yao, and Jeffrey W. Kysar. "Spatially Resolved Characterization of Residual Stress Induced by Micro Scale Laser Shock Peening." Journal of Manufacturing Science and Engineering 126, no. 2 (2004): 226–36. http://dx.doi.org/10.1115/1.1751189.

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Single crystal aluminum and copper of (001) and (110) orientation were shock peened using laser beam of 12 micron diameter and observed with X-ray micro-diffraction techniques based on a synchrotron light source. The X-ray micro-diffraction affords micron level resolution as compared with conventional X-ray diffraction which has only mm level resolution. The asymmetric and broadened diffraction profiles registered at each location were analyzed by sub-profiling and explained in terms of the heterogeneous dislocation cell structure. For the first time, the spatial distribution of residual stres

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34

Richard, Axel, Etienne Castelier, Herve Palancher, Jean-Sebastien Micha, and Philippe Goudeau. "Elastic strains in polycrystalline UO2 samples implanted with He: micro Laue diffraction measurements and elastic modeling." MRS Proceedings 1514 (2013): 125–30. http://dx.doi.org/10.1557/opl.2013.448.

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Abstract:In the framework of the study of long-term storage of the spent nuclear fuel, polycrystalline UO2 samples have been implanted with He ions. The thin implanted layer, close to the free surface is subjected to elastic stresses which are studied by x-ray diffraction (micro Laue diffraction) and a mechanical modeling. A simple expression of the displacement gradient tensor has been evidenced; it concerns only three terms (ε3, ε4 and ε5) which strongly evolve with considered grain orientations. Finally, we show that results obtained with micro diffraction are in very good agreement with co

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35

Sarov, Y., T. Ivanov, K. Ivanova, V. Sarova, I. Capek, and I. W. Rangelow. "Diffraction under total internal reflection for micro-fluidic analysis." Applied Physics A 84, no. 1-2 (2006): 191–96. http://dx.doi.org/10.1007/s00339-006-3597-x.

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36

Dane, Thomas, Emanuela Di Cola, Lionel Lardiere, et al. "Exploring fibrous materials with micro/nanobeam scanning diffraction techniques." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C1071. http://dx.doi.org/10.1107/s2053273314089281.

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Fibrous materials play an important role in many fields of research spanning from industrial applications to life sciences. They are typically organized in hierarchical arrangements of structural features on multiple length scales. Employing focused monochromatic x-rays combined with scanning diffraction, such samples can be studied obtaining rich information in reciprocal space (molecular to mesoscale level) and direct space simultaneously [1][2]. The resolution of the latter is mainly limited by the focal spot size ranging from a few microns down to 100 nm and less. The arrival of fast, sens

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37

Bhuvanesh, Nattamai S. P., and Joseph H. Reibenspies. "A novel approach to micro-sample X-ray powder diffraction using nylon loops." Journal of Applied Crystallography 36, no. 6 (2003): 1480–81. http://dx.doi.org/10.1107/s0021889803021885.

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A novel method for sample mounting to obtain powder diffraction from very small amounts of samples (ranging from micrograms down to a few nanograms), by using a combination of multiwire area detector, three-circle diffractometer, monochromatic CuKα radiation and 10 µm nylon loops, has been developed. This method exploits customary single-crystal approaches to collect the powder diffraction pattern, which overcomes many of the limitations of conventional powder X-ray diffraction.

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38

Castillo, Francisco, Miguel Avalos Borja, Heather Jamieson, Gerardo Hernández Bárcenas, and Nadia Martínez Villegas. "Identification of diagenetic calcium arsenates using synchrotron-based micro X-ray diffraction." Boletín de la Sociedad Geológica Mexicana 67, no. 3 (2015): 479–91. http://dx.doi.org/10.18268/bsgm2015v67n3a11.

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39

Saka, Takashi. "Strain analysis in Si micro-electromechanical systems by dynamical X-ray diffraction." Journal of Applied Crystallography 45, no. 3 (2012): 496–502. http://dx.doi.org/10.1107/s0021889812008953.

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Long-range strain in nearly perfect crystalline materials can be detected by dynamical X-ray diffraction. Long-range strain due to uniform bending or torsion is undetectable by conventional methods when the specimen is vertical in a symmetrical Laue setting, but it can be detected by rotating the specimen along the scattering vector. This method is applied to Si devices for a resonating torsion mirror in a micro-electromechanical system. X-ray transmission topography clearly reveals local strain concentrations as enhancements or reductions in the diffraction intensity where non-uniform strain

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40

Das, Rasmi R., W. Pérez, and Ram S. Katiyar. "X-Ray diffraction and micro-raman investigation of (Sr1-xCax)Bi2Ta2O9 ceramics." Integrated Ferroelectrics 37, no. 1-4 (2001): 295–303. http://dx.doi.org/10.1080/10584580108015688.

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41

Beckers, Detlef, Gabriel Blaj, Herbert Pöllmann, Klaus Bethke, and Roger Meier. "Combined X-ray micro-diffraction, radiography and tomography analysis of solid objects." Acta Crystallographica Section A Foundations of Crystallography 66, a1 (2010): s301. http://dx.doi.org/10.1107/s0108767310093098.

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42

Rosenthal, Martin, Denis V. Anokhin, Valeriy A. Luchnikov, et al. "Microstructure of Banded Polymer Spherulites: Studies with Micro-Focus X-ray Diffraction." IOP Conference Series: Materials Science and Engineering 14 (November 1, 2010): 012014. http://dx.doi.org/10.1088/1757-899x/14/1/012014.

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43

Welcomme, E., P. Walter, P. Bleuet, et al. "Classification of lead white pigments using synchrotron radiation micro X-ray diffraction." Applied Physics A 89, no. 4 (2007): 825–32. http://dx.doi.org/10.1007/s00339-007-4217-0.

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44

Sciau, P., P. Goudeau, N. Tamura, and E. Dooryhee. "Micro scanning X-ray diffraction study of Gallo-Roman Terra Sigillata ceramics." Applied Physics A 83, no. 2 (2006): 219–24. http://dx.doi.org/10.1007/s00339-006-3512-5.

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45

Huang, Y. B., J. Jutson, and D. M. Spiller. "Microstructure homogeneity study on Bi2223 multifilamentary tapes by micro-x-ray diffraction." Superconductor Science and Technology 13, no. 7 (2000): 1011–16. http://dx.doi.org/10.1088/0953-2048/13/7/318.

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46

Hofmann, Felix, Nicholas W. Phillips, Ross J. Harder, et al. "Micro-beam Laue alignment of multi-reflection Bragg coherent diffraction imaging measurements." Journal of Synchrotron Radiation 24, no. 5 (2017): 1048–55. http://dx.doi.org/10.1107/s1600577517009183.

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Multi-reflection Bragg coherent diffraction imaging has the potential to allow three-dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro-crystals. Until now such measurements were hampered by the need for laborious, time-intensive alignment procedures. Here a different approach is demonstrated, using micro-beam Laue X-ray diffraction to first determine the lattice orientation of the micro-crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and st

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47

Ning, Guangrong, and Roberta L. Flemming. "Rietveld refinement of LaB6: data from µXRD." Journal of Applied Crystallography 38, no. 5 (2005): 757–59. http://dx.doi.org/10.1107/s0021889805023344.

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The Rietveld method of crystal structure refinement was an important breakthrough, allowing crystal structural information to be obtained from powder diffraction data. One remaining challenge is to collect Rietveld-quality data for polycrystalline mineralsin situ, using laboratory-based micro X-ray diffraction (µXRD) techniques. Here a new data collection method is presented, called `multiframes', which produces high-quality data, suitable for Rietveld refinement, using the Bruker D8 DISCOVER micro X-ray diffractometer. 91 frames of two-dimensional X-ray diffraction data were collected for pow

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48

Takakuwa, Osamu, Yuta Mano, and Hitoshi Soyama. "Effect of Hydrogen on the Micro- and Macro-Strain near the Surface of Austenitic Stainless Steel." Advanced Materials Research 936 (June 2014): 1298–302. http://dx.doi.org/10.4028/www.scientific.net/amr.936.1298.

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The objective of this study is to evaluate the effect of hydrogen on the micro-and macro-strain of austenitic stainless steel using X-ray diffraction. When hydrogen is trapped in lattice sites, it can affect both the micro-and macro-strain. The micro-strain was evaluated through fitting profiles to measured X-ray diffraction profile using a fundamental parameter method. The macro-strain, i.e., the residual stress, was evaluated by a 2D method using a two-dimensional PSPC. The experimental samples were charged with hydrogen by a cathodic charging method. The results revealed that the induced re

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49

Xu, Hongliang. "Structure determination from X-ray powder diffraction data at low resolution." Acta Crystallographica Section A Foundations and Advances 70, a1 (2014): C143. http://dx.doi.org/10.1107/s2053273314098568.

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Knowledge of the structural arrangement of atoms in solids is necessary to facilitate the study of their properties. The best and most detailed structural information is obtained when the diffraction pattern of a single crystal a few tenths of a millimeter in each dimension is analyzed, but growing high-quality crystals of this size is often difficult, sometimes impossible. However, many crystallization experiments that do not yield single crystals do yield showers of randomly oriented micro-crystals that can be exposed to X-rays simultaneously to produce a powder diffraction pattern. Direct M

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50

Gonzalez, Victor, Annelies van Loon, Stephen WT Price, Petria Noble, and Katrien Keune. "Synchrotron micro-XRD and micro-XRD-CT reveal newly formed lead–sulfur compounds in Old Master paintings." Journal of Analytical Atomic Spectrometry 35, no. 10 (2020): 2267–73. http://dx.doi.org/10.1039/d0ja00169d.

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