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Journal articles on the topic 'Microscopes and microscopy'
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1
Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.
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Chen, Xiaodong, Bin Zheng, and Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology." Analytical Cellular Pathology 34, no. 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.
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The conventional optical microscope has been the primary tool in assisting pathological examinations. The modern digital pathology combines the power of microscopy, electronic detection, and computerized analysis. It enables cellular-, molecular-, and genetic-imaging at high efficiency and accuracy to facilitate clinical screening and diagnosis. This paper first reviews the fundamental concepts of microscopic imaging and introduces the technical features and associated clinical applications of optical microscopes, electron microscopes, scanning tunnel microscopes, and fluorescence microscopes. The interface of microscopy with digital image acquisition methods is discussed. The recent developments and future perspectives of contemporary microscopic imaging techniques such as three-dimensional and in vivo imaging are analyzed for their clinical potentials.
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J. H., Youngblom, Wilkinson J., and Youngblom J.J. "Telepresence Confocal Microscopy." Microscopy and Microanalysis 6, S2 (August 2000): 1164–65. http://dx.doi.org/10.1017/s1431927600038319.
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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments. While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.At California State University-Stanislaus, home of the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system. Our Leica TCS NT confocal system, with an interchangeable upright (DMRXE) and inverted microscope (DMIRBE) set up,
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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.
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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.
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O'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implementation of microscope sites, from the microscope room to the building that surrounds it. Laboratories have been constructed to house high-sensitive instruments with resolutions ranging down to sub-Angstrom levels; we present the various design philosophies used for some of these laboratories and our experiences with them. Four facilities are described: the National Center for Electron Microscopy OAM Laboratory at LBNL; the FEGTEM Facility at the University of Sheffield; the Center for Integrative Molecular Biosciences at TSRI; and the Advanced Microscopy Laboratory at ORNL.
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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Confocal Laser Scanning Microscopy By Remote Access." Microscopy Today 7, no. 7 (September 1999): 32–33. http://dx.doi.org/10.1017/s1551929500064798.
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In recent years there have been a growing number of facilities interested in developing remote access capabilities to a variety of microscopy systems. While certain types of microscopes, such as electron microscopes and scanning probe microscopes have been well established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal microscope.At California State University, home to the CSUPERB (California State University Program for Education and Research in Biotechnology) Confocal Microscope Core Facility, we have established a remote access confocal laser scanning microscope facility that allows users with virtually any type of computer platform to connect to our system.
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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.
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Graef, M. De, N. T. Nuhfer, and N. J. Cleary. "Implementation Of A Digital Microscopy Teaching Environment." Microscopy and Microanalysis 5, S2 (August 1999): 4–5. http://dx.doi.org/10.1017/s1431927600013349.
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The steady evolution of computer controlled electron microscopes is dramatically changing the way we teach microscopy. For today’s microscopy student, an electron microscope may be just another program on the desktop of whatever computer platform he or she uses. This is reflected in the use of the term Desktop Microscopy. The SEM in particular has become a mouse and keyboard controlled machine, and running the microscope is not very different from using a drawing program or a word processor. Transmission electron microscopes are headed in the same direction.While one can debate whether or not it is wise to treat an SEM or a TEM as just another black-box computer program, it is a fact that these machines are here to stay, which means that microscopy educators must adapt their traditional didactic tools and methods. One way to bring electron microscopes into the classroom is through the use of remote control software packages, such as Timbuktu Pro or PC-Anywhere. The remote user essentially opens a window containing the desktop of the microscope control computer and has all functions available. On microscopes with specialized graphics boards, integration of the image and control display for remote operation may not be straightforward, and often requires the purchase of additional graphics boards for the remote machine.
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Seraphin, Supapan, Gary W. Chandler, and Michelle S. Switala. "Computer Network Laboratory for Microscopy Education at the Materials Science and Engineering Department, The University of Arizona." Microscopy Today 3, no. 1 (February 1995): 14–15. http://dx.doi.org/10.1017/s1551929500062210.
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We report here on the first year of development of a novel teaching facility which incorporates new techniques designed to reach new audiences without diluting subject content. Interactive computer software coupled with rich scientific content of microscopic images provides a unique opportunity to help students learn science and technology, the laboratory is comprised of twenty student workstations networked to various microscopes, thus expanding the number of students capable of "hands-on" data acquisition and analysis by twenty times. Two scanning electron microscopes (SEM), a transmission electron microscope (TEM), and several light microscopes (LM) are interfaced through a server to the workstations.
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Madrid-Wolff, Jorge, and Manu Forero-Shelton. "Protocol for the Design and Assembly of a Light Sheet Light Field Microscope." Methods and Protocols 2, no. 3 (July 4, 2019): 56. http://dx.doi.org/10.3390/mps2030056.
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Light field microscopy is a recent development that makes it possible to obtain images of volumes with a single camera exposure, enabling studies of fast processes such as neural activity in zebrafish brains at high temporal resolution, at the expense of spatial resolution. Light sheet microscopy is also a recent method that reduces illumination intensity while increasing the signal-to-noise ratio with respect to confocal microscopes. While faster and gentler to samples than confocals for a similar resolution, light sheet microscopy is still slower than light field microscopy since it must collect volume slices sequentially. Nonetheless, the combination of the two methods, i.e., light field microscopes that have light sheet illumination, can help to improve the signal-to-noise ratio of light field microscopes and potentially improve their resolution. Building these microscopes requires much expertise, and the resources for doing so are limited. Here, we present a protocol to build a light field microscope with light sheet illumination. This protocol is also useful to build a light sheet microscope.
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Davidson, Michael W. "50 Most Frequently Asked Questions About Optical Microscopy." Microscopy Today 8, no. 6 (August 2000): 12–19. http://dx.doi.org/10.1017/s1551929500052780.
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A significant percentage of technical experts who employ optical microscopes have had little or no formal training in optical microscope basics. Some, typically, were required to use microscopes during their technical education but, in general, microscope terminology and technology was a sideline to their major training. As a result, many useful basic microscope technical details were not learned because they were not necessary to accomplish what was needed in order to survive their major class work. At Florida State University, we try to make the [earning of microscope technology an inherent part of the students training. An important part of this training is this compendium of 50 of the most frequently asked questions about Optical Microscopy.
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Brooks, Donald A. "The College of Microscopy — Meeting Rapidly Growing Microscopy Demands." Microscopy Today 15, no. 4 (July 2007): 51. http://dx.doi.org/10.1017/s1551929500055735.
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The McCrone Group Inc. recently announced the completion of a 40,000 sq ft addition to house its new College of Microscopy. Since its founding in 1956, The McCrone Group has grown into a multi-faceted organization and now encompasses three main organizations, McCrone Associates - the analytical service and consulting firm; McCrone Microscopes & Accessories - the microscope and instrument sales group; and, the College of Microscopy - the microscopy learning center. The newly completed addition houses the first and only College of Microscopy and offers the largest array of basic and advanced modern microscopy courses and analytical instrumentation within any single educational facility worldwide. At The McCrone Group, we have more than $15 million worth of microscopes and analytical instrumentation and assembled one of the best scientific/administrative teams in the world.
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Jester, J. V., H. D. Cavanagh, and M. A. Lemp. "In vivo confocal imaging of the eye using tandem scanning confocal microscopy (TSCM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 56–57. http://dx.doi.org/10.1017/s0424820100102365.
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New developments in optical microscopy involving confocal imaging are now becoming available which dramatically increase resolution, contrast and depth of focus by optically sectioning through structures. The transparency of the anterior ocular structures, cornea and lens, make microscopic visualization and optical sectioning of the living intact eye an interesting possibility. Of the confocal microscopes available, the Tandem Scanning Reflected Light Microscope (referred to here as the Tandem Scanning Confocal Microscope), developed by Professors Petran and Hadravsky at Charles University in Pilzen, Czechoslovakia, permits real-time image acquisition and analysis facilitating in vivo studies of ocular structures.Currently, TSCM imaging is most successful for the cornea. The corneal epithelium, stroma, and endothelium have been studied in vivo and photographed in situ. Confocal scanning images of the superficial epithelium, similar to those obtained by scanning electron microscopy, show both light and dark surface epithelial cells.
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Russell, Phillip E., and A. D. Batchelor. "Scanned Probe Microscopy (AFM, et al.): How to Choose and Use." Microscopy and Microanalysis 4, S2 (July 1998): 894–95. http://dx.doi.org/10.1017/s1431927600024594.
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Virtually everyone associated with a science or engineering discipline has some baseline knowledge of optical microscopy; and most attendees at this conference have a reasonable exposure to at least some form of electron microscopy. The many developments in instrumentation and application require the modern microscopist to continuously follow the literature to stay aware of the ongoing improvements and advances in these microscopies. While electron and optical microscopes have been around for many decades, the family of microscopes known as Scanned Probe Microscopy (SPM) are just entering their second decade; and are actually in there first decade of widespread use.The most commonly used forms of scanned probe microscopy are the force microscopes; commonly referred to as Atomic Force Microscopy (AFM). This includes a wide variety of microscopy modes that are generally made available as modifications of a basic AFM. Before describing the basic versions of AFM, the fundamentals of instrument design must be addressed.
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Meyer-Ilse, W., H. Medecki, C. Magowan, R. Balhorn, M. Moronne, and D. Attwood. "Advanced microscopy—the new high-resolution zone-plate microscope at the advanced light source in Berkeley." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 112–13. http://dx.doi.org/10.1017/s0424820100136933.
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A new x-ray microscope (XM-1) has been installed at the Advanced Light Source in Berkeley. This transmission microscope uses zone-plates for a resolution exceeding visible light microscopies. Samples can be as thick as 10 microns, for wet or dry specimens. These features make x-ray microscopy a valuable complement to other advanced techniques.There are two types of x-ray microscopes, scanning and conventional (imaging) microscopes. The scanning type minimizes radiation dose to the sample and is convenient for high resolution use of fluorescent labels; however, it requires a spatially coherent x-ray source and as a result involves long exposure times. The conventional type provides a higher potential for ultimate resolution as there is no scanning stage needed, and it can operate with an incoherent light source. It therefore has a shorter exposure time, but does require a higher radiation dose due to lens inefficiencies. The new XM-1 is of the second type. Its optical layout is very similar to the Gottingen x-ray microscope operated at the BESSY facility in Berlin, Germany.
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Lee, Henry C. "Applying Microscopy in Forensic Science." Microscopy and Microanalysis 4, S2 (July 1998): 490–91. http://dx.doi.org/10.1017/s1431927600022571.
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Microscopy is of vital importance in the real world of the forensic scientist. In today's society, physical evidence is critical to the criminal justice system for the detection, investigation and prosecution of criminal acts. A trail of microscopic fibers led investigators in Atlanta to the conviction of the serial killer, Wayne Williams. Flecks of paint on a hit-run victim, analyzed microscopically, can be compared with the paint on a suspect vehicle to exclude or match it to the crime. The forensic firearms examiner compares the microscopic striations on a bullet to match it to the gun it was fired from. Microscopes are used throughout the modern forensic laboratory. They are essential in searching for evidence. They aid the examiner in identifying and comparing trace evidence. As the scales of justice symbolize forensic science, microscopes symbolize the trace evidence examiner.Because of the variety of physical evidence, forensic scientists use several types of microscopes in their investigations.
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Pan, M., K. Ishizuka, C. E. Meyer, O. L. Krivanek, J. Sasakit, and Y. Kimurat. "Progress in Computer Assisted Electron Microscopy." Microscopy and Microanalysis 3, S2 (August 1997): 1093–94. http://dx.doi.org/10.1017/s1431927600012356.
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All the lenses, deflectors and stigmators of contemporary electron microscopes are controlled digitally by an internal computer. Control through RS232 serial interface by an external computer has also become a standard feature. This external control has made so-called computer assisted electron microscopy (CAEM) possible and practical. We are developing a CAEM system with two objectives: (1) to free inexperienced microscopists from technical details of operating an electron microscope, especially transmission electron microscopes (TEM); (2) to assist experienced microscopists to operate their microscopes with higher accuracy and efficiency. The features include automated and/or assisted standard operations in focusing, stigmating, and aligning the microscope, and also sophisticated tuning that requires the evaluation of subtle changes in image features such as aligning the incident electron beam direction in the presence of 3-fold astigmatism in objective lens. CAEM can further assist operators in selecting areas or objects and taking images/diffraction/energy spectrum with all the parameters well controlled and catalogued together, thus not only enabling ease-of-use and high accuracy in operation but also yielding more information on the specimen.
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Brama, Elisabeth, Christopher J. Peddie, Gary Wilkes, Yan Gu, Lucy M. Collinson, and Martin L. Jones. "ultraLM and miniLM: Locator tools for smart tracking of fluorescent cells in correlative light and electron microscopy." Wellcome Open Research 1 (December 13, 2016): 26. http://dx.doi.org/10.12688/wellcomeopenres.10299.1.
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In-resin fluorescence (IRF) protocols preserve fluorescent proteins in resin-embedded cells and tissues for correlative light and electron microscopy, aiding interpretation of macromolecular function within the complex cellular landscape. Dual-contrast IRF samples can be imaged in separate fluorescence and electron microscopes, or in dual-modality integrated microscopes for high resolution correlation of fluorophore to organelle. IRF samples also offer a unique opportunity to automate correlative imaging workflows. Here we present two new locator tools for finding and following fluorescent cells in IRF blocks, enabling future automation of correlative imaging. The ultraLM is a fluorescence microscope that integrates with an ultramicrotome, which enables ‘smart collection’ of ultrathin sections containing fluorescent cells or tissues for subsequent transmission electron microscopy or array tomography. The miniLM is a fluorescence microscope that integrates with serial block face scanning electron microscopes, which enables ‘smart tracking’ of fluorescent structures during automated serial electron image acquisition from large cell and tissue volumes.
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Nessler, Randy, Ryan Potter, Jodi Stahl, Katina Wilson, Thomas Moninger, and Kenneth Moore. "Formal and Informal Microscopy Education at the University of Iowa Central Microscopy Research Facility: Project Centered Training." Microscopy and Microanalysis 7, S2 (August 2001): 814–15. http://dx.doi.org/10.1017/s1431927600030142.
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The University of Iowa Central Microscopy Research Facility (CMRF) has been in existence for 27 years. Starting out as a transmission electron microscopy (TEM) research laboratory, the facility has offered formal college courses. These courses require that students identify a project to investigate during the semester. Theory from the formal lecture is reinforced by work performed in the laboratory session. From its modest beginnings, the CMRF has continually grown. Currently, the facility offers two Confocal microscopes, two Scanning Electron Microscopes, a Scanning Probe Microscope, Energy Dispersive Spectroscopy, a Mossbauer spectrometer, a PTI Ion Imaging/Ratio system, a Freeze Fracture apparatus, and three light microscopes equipped with CCD cameras. Techniques range from routine histology to in-situ hybridization. Technological advances over the history of the facility have not been confined to the lab. in the past, most lectures were given using overheads and 35mm slides.
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Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (August 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.
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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as surface area, volume and the micro-distribution of cellular constituents, is often required for the development of accurate structural models of cells and organelle systems and for assessing and characterizing changes due to experimental manipulation. Performing estimates of such quantities from light microscopic data can result in gross inaccuracies because the contribution to total morphometries of delicate features such as membrane undulations and excrescences can be quite significant. For example, in a recent study by Shoop et al, electron microscopic analysis of cultured chick ciliary ganglion neurons showed that spiny projections from the plasmalemma that were not well resolved in the light microscope effectively doubled the surface area of these neurons.While the resolution provided by the electron microscope has yet to be matched or replaced by light microscopic methods, one drawback of electron microscopic analysis has always been the relatively small sample size and limited 3D information that can be obtained from samples prepared for conventional transmission electron microscopy. Reconstruction from serial electron micrographs has provided one way to circumvent this latter problem, but remains one of the most technically demanding skills in electron microscopy. Another approach to 3D electron microscopic imaging is high voltage electron microscopy (HVEM). The greater accelerating voltages of HVEM's allows for the use of much thicker specimens than conventional transmission electron microscopes.
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Flores, Daniela P., and Timothy C. Marzullo. "The construction of high-magnification homemade lenses for a simple microscope: an easy “DIY” tool for biological and interdisciplinary education." Advances in Physiology Education 45, no. 1 (March 1, 2021): 134–44. http://dx.doi.org/10.1152/advan.00127.2020.
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The rise of microscopy in the seventeenth century allowed scientists to discover a new world of microorganisms and achieve great physiological advances. One of the first microscopes of the epoch was Antonie van Leeuwenhoek’s microscope, a deceptively simple device that contains a single ball lens housed in a metal plate allowing the observation of samples at up to ×250 magnification. Such magnification was much greater than that achieved by rudimentary compound microscopes of the era, allowing for the discovery of microscopic, single-celled life, an achievement that marked the study of biology up to the nineteenth century. Since Leeuwenhoek’s design uses a single ball lens, it is possible to fabricate variations for educational activities in physics and biology university and high school classrooms. A fundamental problem, however, with home-built microscopes is that it is difficult to work with glass. We developed a simple protocol to make ball lenses of glass and gelatin with high magnification that can be done in a university/high school classroom, and we designed an optimized support for focusing and taking photographs with a smartphone. The protocol details a simple, easily accessible, low-cost, and effective tool for the observation of microscopic samples, possible to perform anywhere without the need for a laboratory or complex tools. Our protocol has been implemented in classrooms in Chile to a favorable reception.
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McMillan, William. "Laser Scanning Confocal Microscopy for Materials Science." Microscopy Today 6, no. 5 (July 1998): 20–23. http://dx.doi.org/10.1017/s1551929500067791.
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Confocal microscopy has gained great popularity in biology and medical research because of the ability to image three-dimensional objects at greater resolution than conventional optical microscopes. In a typical Laser Scanning Confocal Microscope (LSCM), the specimen stage is stepped up or down to collect a series of two-dimensional images (or slices) at each focal plane. Conventional light microscopes create images with a depth of field, at high power, of 2 to 3 μm. The depth of field of confocal microscopes ranges from 0.5 to 1.5 μm, which allows information to be collected from a well defined optical section rather than from most of the specimen. Therefore, due to this “thin” focal plane, out of focus light is virtually eliminated which results in an increase in contrast, clarity and detection.
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Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (June 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.
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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage electron microscopy (HVEM).The idea of carrying out dynamic experiments involving real-time observation of microscopic phenomena has always had an attraction for materials scientists. Ever since the first static images were obtained in the electron microscope, materials scientists have been interested in observing processes in real time: we feel that we obtain a true understanding of a microscopic phenomenon if we can actually watch it taking place. The idea behind “materials science in the electron microscope” is therefore to use the electron microscope—with its unique ability to image subtle changes in a material at or near the atomic level—as a laboratory in which a remarkable variety of experiments can be carried out. In this issue you will read about dynamic experiments in areas such as phase transformations, thin-film growth, and electromigration, which make use of innovative designs for the specimen, the specimen holder, or the microscope itself. These articles speak for themselves in demonstrating the power of real-time analysis in the quantitative exploration of reaction mechanisms.The first transmission electron microscopes operated at low accelerating voltages, up to about 100 kV. This placed a severe limitation on the thickness of foils that could be examined: Heavy elements, for example, had to be made into foils thinner than 0.1 μm. It was felt that any phenomenon whose “mean free path” was comparable to the foil thickness would be significantly affected by the foil surfaces, and therefore would be unsuitable for study in situ. However, technology quickly generated ever higher accelerating voltages, culminating in the giant 3 MeV electron microscopes. At these voltages, electrons can penetrate materials as thick as 6–9 μm for light elements such as Si and Al, and 1 μm for very heavy ones such as Au and U.
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McCrone, Walter C. "The Case for Polarized Light Microscopy." Microscopy Today 4, no. 7 (September 1996): 16–19. http://dx.doi.org/10.1017/s1551929500060971.
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I was one told by a Nobel Laureate in Chemistry that light microscopy was simply a service foundation. By this he meant to class the microscope with computers, gas chromatographs, infrared spectrophotometers, x-ray diffractometers, mass spectrometers, etc. With all due respect to this gentleman and to these other instruments, there is a vital difference between the polarized light microscopes (PLM) and each of these instruments. First, a trained microscopist requires far more training than a qualified operator of, and interpreter of data from these other instruments. Second, there is considerably more basic physical and chemical information observable and measurable with PLM.
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Mao, Hong, Robin Diekmann, Hai Po H. Liang, Victoria C. Cogger, David G. Le Couteur, Glen P. Lockwood, Nicholas J. Hunt, et al. "Cost-efficient nanoscopy reveals nanoscale architecture of liver cells and platelets." Nanophotonics 8, no. 7 (July 9, 2019): 1299–313. http://dx.doi.org/10.1515/nanoph-2019-0066.
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AbstractSingle-molecule localization microscopy (SMLM) provides a powerful toolkit to specifically resolve intracellular structures on the nanometer scale, even approaching resolution classically reserved for electron microscopy (EM). Although instruments for SMLM are technically simple to implement, researchers tend to stick to commercial microscopes for SMLM implementations. Here we report the construction and use of a “custom-built” multi-color channel SMLM system to study liver sinusoidal endothelial cells (LSECs) and platelets, which costs significantly less than a commercial system. This microscope allows the introduction of highly affordable and low-maintenance SMLM hardware and methods to laboratories that, for example, lack access to core facilities housing high-end commercial microscopes for SMLM and EM. Using our custom-built microscope and freely available software from image acquisition to analysis, we image LSECs and platelets with lateral resolution down to about 50 nm. Furthermore, we use this microscope to examine the effect of drugs and toxins on cellular morphology.
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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (July 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.
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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.
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Becker, John H. "Virtual Microscopes in Podiatric Medical Education." Journal of the American Podiatric Medical Association 96, no. 6 (November 1, 2006): 518–24. http://dx.doi.org/10.7547/0960518.
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In many medical schools, microscopes are being replaced as teaching tools by computers with software that emulates the use of a light microscope. This article chronicles the adoption of “virtual microscopes” by a podiatric medical school and presents the results of educational research on the effectiveness of this adoption in a histology course. If the trend toward virtual microscopy in education continues, many 21st-century physicians will not be trained to operate a light microscope. The replacement of old technologies by new is discussed. The fundamental question is whether all podiatric physicians should be trained in the use of a particular tool or only those who are likely to use it in their own practice. (J Am Podiatr Med Assoc 96(6): 518–524, 2006)
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Voelkl, E., L. F. Allard, D. Tarnoff, D. B. Williams, and L. A. Fama. "Teaching Microscopy and Microscope Theory Based on Remote Instrument Access and Instrument Automation." Microscopy and Microanalysis 6, S2 (August 2000): 1162–63. http://dx.doi.org/10.1017/s1431927600038307.
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The intense use of computers to operate electron microscopes as well as the ability to control microscopes remotely over the Internet, is increasingly changing the way electron microscopes are being used and how microscopy is being taught. Practically all of the top-of-the-line electron microscopes offered by the microscope vendors today are fully computer controllable, and provide for digital imaging. The combination of both features with the ever increasing speed of computers has created a situation that has and will continue to change the way electron microscopists work.Lehigh University together with Oak Ridge National Laboratory have collaborated since 1996 to make the instrumentation in the High Temperature Materials Laboratory at ORNL available for teaching purposes. The primary instrument being used is the Hitachi HF-2000 field emission TEM, which is controlled by Gatan's DigitalMicrograph™ (DM) software and uses a Ik by Ik CCD camera for digital imaging.
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Daberkow, I., and M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving." Microscopy and Microanalysis 4, S2 (July 1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.
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Recent developments promise the possibility to externally control every aspect of microscopes through a computer interface. In combination with high-resolution cameras and feedback to the microscope, this can be leveraged to create highly automatic routines, e.g., to remotely correct astigmatism. Together with the development of fast computer networks this creates a new branch of microscopy, the so-called “telemicroscopy”. The goal of telemicroscopy is the control of a microscope over a large distance including the transfer of images with an acceptable repetition rate. A big advantage for electron microscopy in particular is the possibility of having access to expensive and well-equipped microscopes. In the field of light microscopy the branch “telemedicine” was created, meaning the “virtual” presence of a colleague or specialist for discussion or diagnosis.Using transmission electron microscopy as an example, the history and special requirements for automation and telemicroscopy will be discussed. In the late 80's the first TEM with a remote control was revealed. Shortly thereafter, first automatic functions for defocus control and astigmatism correction were developed using a video camera as electronic image converter.
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Sutriyono, Widodo, and Retno Suryandari. "Addition of Illuminator Fiber Optic to Produce 3 Dimension Effects in Micrographic Observation Using Upright Microscope." Proceeding International Conference on Science and Engineering 3 (April 30, 2020): 493–96. http://dx.doi.org/10.14421/icse.v3.551.
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Microscope is one of the tools used in practicums with high intensity. The use of a microscope adjusts to the object to be observed in order to obtain optimal micrographic results. Stereo microscopes are used to observe three-dimensional objects. Upright microscopes are used to observe two-dimensional objects. This study aims to combine the two advantages of stereo microscopy that can produce three-dimensional micrography with the advantages of an upright microscope that has a high total magnification. The method used in this study is an experimental method by adding an optical fiber illuminator in the use of an upright microscope and then applying it in various observations. The conclusion of this research is the addition of an optical fiber illuminator in observations using an upright microscope can replace the function of a stereo microscope; can produce three-dimensional effects and increase magnification in Daphnia magna micrographic observations.
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Zeineh, Jack A. "Integrated Live and Stored Internet Based Digital Microscopy for Education." Microscopy and Microanalysis 6, S2 (August 2000): 1168–69. http://dx.doi.org/10.1017/s1431927600038332.
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Few educational institutions have well maintained microscopes that facilitate the experience intended by the creators of their teaching texts. The cost of putting a high quality selection of the different types of microscopes at every educational institution for access by all students is prohibitive. The advent of the Internet and the rapid proliferation of computers at educational institutions offer the prospect for dramatic improvements in microscopy education.We present an Internet based digital microscopy system with unique features for education. We have developed a unified architecture for management and transmission of live and stored microscope data over the Internet. The system consists of a combination of software and hardware. The hardware includes a microscope with a motorized stage, focus, and optionally a motorized nosepiece. Standard off the shelf components for each of the items can be used so that the user is afforded great flexibility in utilizing available hardware. Image acquisition is done by attaching a video camera to the microscope. Both analog and digital video cameras are supported, although it should be noted that users have experienced outstanding results with relatively inexpensive analog cameras.
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Kordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
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The Photoelectron Emission Microscope (PEEM) and Low Energy Electron Microscope (LEEM) are parallel-imaging electron microscopes with highly surface-sensitive image contrast mechanisms. In PEEM, the electron yield at the illumination wavelength determines image contrast, in LEEM, the intensity of low energy (< 100 eV) electrons back-diffracted from the surface, as well as interference effects, are responsible for image contrast. Mirror Electron Microscopy is also possible with the LEEM apparatus. In MEM, no electron penetration into the solid occurs, and an image of surface electronic potentials is obtained.While the emission microscope techniques named above are not high resolution methods, the unique contrast mechanisms, the ability to use thick single crystal samples, their compatibility with uhv surface science methods and new material-growth methods, coupled with real-time imaging capability, make them very useful.These microscopes do not depend on scanning probes, and some are compatible with pressures up to 10-3 Torr and specimen temperatures above 1300K.
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Reffner, John A., and William T. Wihlborg. "FR-IR Molecular Microanalysis System." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 2 (August 12, 1990): 270–71. http://dx.doi.org/10.1017/s0424820100134958.
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The IRμs™ is the first fully integrated system for Fourier transform infrared (FT-IR) microscopy. FT-IR microscopy combines light microscopy for morphological examination with infrared spectroscopy for chemical identification of microscopic samples or domains. Because the IRμs system is a new tool for molecular microanalysis, its optical, mechanical and system design are described to illustrate the state of development of molecular microanalysis. Applications of infrared microspectroscopy are reviewed by Messerschmidt and Harthcock.Infrared spectral analysis of microscopic samples is not a new idea, it dates back to 1949, with the first commercial instrument being offered by Perkin-Elmer Co. Inc. in 1953. These early efforts showed promise but failed the test of practically. It was not until the advances in computer science were applied did infrared microspectroscopy emerge as a useful technique. Microscopes designed as accessories for Fourier transform infrared spectrometers have been commercially available since 1983. These accessory microscopes provide the best means for analytical spectroscopists to analyze microscopic samples, while not interfering with the FT-IR spectrometer’s normal functions.
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Gauvin, Raynald, and Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope." Microscopy and Microanalysis 3, S2 (August 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.
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The observation of microstructural features smaller than 300 nm is generally performed using Transmission Electron Microscopy (TEM) because conventional Scanning Electron Microscopes (SEM) do not have the resolution to image such small phases. Since the early 1990’s, a new generation of microscopes is now available on the market. These are the Field Emission Gun Scanning Electron Microscope with a virtual secondary electron detector. The field emission gun gives a higher brightness than those obtained using conventional electron filaments allowing enough electrons to be collected to operate the microscope with incident electron energy, E0, below 5 keV with probe diameter smaller than 5 nm. At 1 keV, the electron range is 60 nm in aluminum and 10 nm in iron (computed using the CASINO program). Since the electron beam diameter is smaller than 5 nm at 1 keV, the resolution of these microscopes becomes closer to that of TEM.
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Bracker, CE, and P. K. Hansma. "Scanning tunneling microscopy and atomic force microscopy: New tools for biology." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 778–79. http://dx.doi.org/10.1017/s0424820100155864.
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A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.
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Cunningham, Brian. "Microscopy in the Real World - Instrumentation Requirements." Microscopy and Microanalysis 7, S2 (August 2001): 524–25. http://dx.doi.org/10.1017/s1431927600028695.
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In the last two decades, microscopy, in particular transmission electron microscopy, has moved from the research environment into industry. As such, the user requirements of the microscopes have changed. Previously, users required the highest performance in all aspects of microscopy e.g. imaging, analytical capabilities, with little regard to other factors. Today, additional requirements are being placed on areas such as ease of use, reliability, high throughput, expanded sample requirements, and networking capabilities. However, the “high performance” aspects of the instrumentation are still a high priority to the end user. These user requirements cause microscope manufacturers a dilemma in many instances. It is not always possible to provide the “new” requirements while still maintaining the high performance of the instruments, at a “reasonable” cost. An example is the large sample requirements in scanning electron microscopes. Large stages are inherently more prone to vibration than smaller stages, and therefore adversely affect resolution.
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Perkins, J. M., D. A. Blom, D. W. McComb, and L. F. Allard. "Functional Collaborative Remote Microscopy: Inter-Continental Atomic Resolution Imaging." Microscopy Today 16, no. 3 (May 2008): 46–49. http://dx.doi.org/10.1017/s1551929500059277.
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In recent years the development of remote microscopy, specifically in electron microscopes, has begun to emerge as a useful research tool rather than simply an educational or teaching aid. Scientists have long been able to work collaboratively at a distance; however, it is often in terms of receiving data or sending some instructions where there may be a delay in receipt of the information. When defining remote control it is important to note that electron microscopy requires instantaneous control and receipt of the feedback (in most cases via images on a screen). Without realtime control it is impossible to conduct high resolution imaging and analysis work. In terms of electron microscopy, there are several reasons for conducting experiments remotely: With sub-Ångström aberration-corrected scanning transmission electron microscopes, the environment within which the microscope itself sits is of utmost importance.
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Hudson, J. S. "Correlative microscopy techniques for material science." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 688–89. http://dx.doi.org/10.1017/s0424820100139810.
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The microscopy center at Clemson University recently invested funds to provide a computer network system that incorporates all of its microscopes. The facility connects SEM, TEM, STM/AFM, Auger Microprobe and the light microscope to Sun workstations equipped with chemical analysis and imaging programs. Images from the network system microscopes can be sent to any of the workstations. I should like to review a few applications of correlative microscopy techniques related to material science; this is a technology that allows the acquisition of multiple data from a given sample. Often a given technique can be augmented by the use of complimentary microscopy technique. Since electron microscopy is subject to interpretation, correlative microscopy methods will prove to be useful in reaching conclusions regarding the image micrographs. Additionally, more than one type of information may be necessary for a given material and this can be found with the different systems of microscopy. In my presentation I will discuss instrumentation and methods by demonstrating advantages and disadvantages of applications as they apply to materials such as polymers, ceramics, microstructures and textiles.
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Elings, Virgil. "Scanning probe microscopy: A new technology takes off." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 3 (August 12, 1990): 959. http://dx.doi.org/10.1017/s0424820100162363.
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With the expanding use of the scanning tunneling microscope, the technology is developing into other scanning near field microscopes, microscopes whose resolution is determined by the size of the probe, not by some wavelength. The first available “son of STM” will be the atomic force microscope (AFM), a very low force profilometer which has atomic resolution and can profile non-conducting surfaces. The hope is that this microscope may find more applications in biology than the scanning tunneling microscope (STM), which requires a conducting or very thin sample.In the past five years, the STM has progressed from curiosity to everyday lab tool, imaging surfaces with scans from a few nanometers up to 100 microns. When compared to an SEM, the STM has the advantages of higher resolution, lower cost, operation in air or liquid, real three-dimensional output, and small size. The disadvantages are smaller scan size, slower scan speeds, fewer spectroscopic functions and, of course, not as many of the nice features of the more mature electron microscopes. The AFM has similar features to the STM except that the detector and profiling tips are more complicated and more difficult to operate—disadvantages that will decrease with time.
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Kersker, M., C. Nielsen, H. Otsuji, T. Miyokawa, and S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
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Historically, ultra high spatial resolution electron microscopy has belonged to the transmission electron microscope. Today, however, ultra high resolution scanning electron microscopes are beginning to challenge the transmission microscope for the highest resolution.To accomplish high resolution surface imaging, not only is high resolution required. It is also necessary that the integrity of the specimen be preserved, i.e., that morphological changes to the specimen during observation are prevented. The two major artifacts introduced during observation are contamination and beam damage, both created by the small, high current-density probes necessary for high signal generation in the scanning instrument. The JSM-890 Ultra High Resolution Scanning Microscope provides the highest resolution probe attainable in a dedicated scanning electron microscope and its design also accounts for the problematical artifacts described above.Extensive experience with scanning transmission electron microscopes lead to the design considerations of the ultra high resolution JSM- 890.
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BULAT, TANJA, OTILIJA KETA, LELA KORIĆANAC, JELENA ŽAKULA, IVAN PETROVIĆ, ALEKSANDRA RISTIĆ-FIRA, and DANIJELA TODOROVIĆ. "Radiation dose determines the method for quantification of DNA double strand breaks." Anais da Academia Brasileira de Ciências 88, no. 1 (March 4, 2016): 127–36. http://dx.doi.org/10.1590/0001-3765201620140553.
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ABSTRACT Ionizing radiation induces DNA double strand breaks (DSBs) that trigger phosphorylation of the histone protein H2AX (γH2AX). Immunofluorescent staining visualizes formation of γH2AX foci, allowing their quantification. This method, as opposed to Western blot assay and Flow cytometry, provides more accurate analysis, by showing exact position and intensity of fluorescent signal in each single cell. In practice there are problems in quantification of γH2AX. This paper is based on two issues: the determination of which technique should be applied concerning the radiation dose, and how to analyze fluorescent microscopy images obtained by different microscopes. HTB140 melanoma cells were exposed to γ-rays, in the dose range from 1 to 16 Gy. Radiation effects on the DNA level were analyzed at different time intervals after irradiation by Western blot analysis and immunofluorescence microscopy. Immunochemically stained cells were visualized with two types of microscopes: AxioVision (Zeiss, Germany) microscope, comprising an ApoTome software, and AxioImagerA1 microscope (Zeiss, Germany). Obtained results show that the level of γH2AX is time and dose dependent. Immunofluorescence microscopy provided better detection of DSBs for lower irradiation doses, while Western blot analysis was more reliable for higher irradiation doses. AxioVision microscope containing ApoTome software was more suitable for the detection of γH2AX foci.
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Martin, Sonya, Antonio Virgilio Failla, Udo Spöri, Christoph Cremer, and Ana Pombo. "Measuring the Size of Biological Nanostructures with Spatially Modulated Illumination Microscopy." Molecular Biology of the Cell 15, no. 5 (May 2004): 2449–55. http://dx.doi.org/10.1091/mbc.e04-01-0045.
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Spatially modulated illumination fluorescence microscopy can in theory measure the sizes of objects with a diameter ranging between 10 and 200 nm and has allowed accurate size measurement of subresolution fluorescent beads (∼40–100 nm). Biological structures in this size range have so far been measured by electron microscopy. Here, we have labeled sites containing the active, hyperphosphorylated form of RNA polymerase II in the nucleus of HeLa cells by using the antibody H5. The spatially modulated illumination-microscope was compared with confocal laser scanning and electron microscopes and found to be suitable for measuring the size of cellular nanostructures in a biological setting. The hyperphosphorylated form of polymerase II was found in structures with a diameter of ∼70 nm, well below the 200-nm resolution limit of standard fluorescence microscopes.
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Isaacson, M. "Three hundred years after Hooke and Van Leeuwenhoek: The revolution in optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 47 (August 6, 1989): 4–6. http://dx.doi.org/10.1017/s0424820100151994.
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Man is always trying to extend his vision through the four senses of sight, sound, touch and smell. The microscopy of Hooke and van Leeuwenhoek are examples of methods devised centuries ago to extend our visible vision. In fact, instrument designers have constructed microscopes using each one of the four senses to bring us peeks into the microworld. When Robert Hooke took some scrapings from his teeth and viewed the bacteria in these scrapings under his primitive microscope, a whole new view of the world ensued. But it should be noted that optical microscopes used two centuries after Hooke were not much different than the primitive 17th century versions. It was the illucidation of modern optics principles by Abbe and then Zernicke that allowed for the design of most present-day conventional optical microscopes and revolutionized the microscopy of their day. Even after that revolution, the laws of physics seemed to prevent imaging structures significantly smaller than the wavelength, λ, and this led to the search for other methods to increase resolution.
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Paiè, Petra, Francesca Bragheri, Andrea Bassi, and Roberto Osellame. "Selective plane illumination microscopy on a chip." Lab on a Chip 16, no. 9 (2016): 1556–60. http://dx.doi.org/10.1039/c6lc00084c.
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Kuokkala, V. T., and T. K. Lepistö. "TEMTUTOR - a Teaching Multimedia Program for TEM." Microscopy and Microanalysis 3, S2 (August 1997): 1161–62. http://dx.doi.org/10.1017/s1431927600012691.
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Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simulation of transmission electron micrographs and related diffraction patterns can help the student better understand the image formation processes. Adding text, audio and video help capabilities to the program, it can be made an efficient supplemental teaching tool.TemTutor for Windows is based on microScope for Windows, which is a BF/DF TEM micrograph simulation program for dislocations and stacking faults.
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Ai, R. "A Microscope-Compatible Auger Electron Spectrometer." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.
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With the recent development of ultra-high vacuum high resolution electron microscopes (UHV-HREM), electron microscopes have become valuable tools for surface studies. Techniques such as surface profile image, surface sensitive plane view, and reflection electron microscopy have been developed to take full advantage of the atomic resolution of HREM to study surface structures. However a complete surface study requires information on both the surface structure and surface chemistry. Therefore in order to turn an electron microscope into a real surface analytical tool, the challenge is to develop a microscopecompatible, surface sensitive tool for in-situ surface chemical analysis.
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Bell, David C., and Ann T. Palmer. "Project Micro on Display At Sciencefest." Microscopy and Microanalysis 7, S2 (August 2001): 818–19. http://dx.doi.org/10.1017/s1431927600030166.
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ScienceFest is coordinated through the International JASON Project that introduces the world of science through live satellite broadcasts. Dr. Robert Ballard, the ocean explorer who found the Titanic, started the program in 1989. Included in the ScienceFest presentations at the John Ford Bell Museum of Natural History, Project MICRO run by the Minnesota Microscopy Society (MMS) was on display to the public. As in past years [1] the Project MICRO team of the MMS set up various microscope stations and invited the participants to record the things that they saw and to note what they learnt and mention the things they would like to see. The microscope stations are quite simple, low power ‘field’ microscopes and various samples as documented by the “Microscopic Explorations” [2] handbook that has been developed by the MSA in collaboration with the Lawrence Hall of Science [3] as part of their Great Explorations in Math and Science (GEMS) series.
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Hariharan, H., A. Koschan, B. Abidi, D. Page, M. Abidi, J. Frafjord, and S. Dekanich. "Extending Depth of Field in LC-SEM Scenes by Partitioning Sharpness Transforms." Microscopy Today 16, no. 2 (March 2008): 18–21. http://dx.doi.org/10.1017/s1551929500055875.
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When imaging a sample, it is desirable to have the entire area of interest in focus in the acquired image. Typically, microscopes have a limited depth of field (DOF) and this makes the acquisition of such an all-in-focus image difficult. This is a major problem in many microscopic applications and applies equally in the realm of scanning electron microscopy as well. In multifocus fusion, the central idea is to acquire focal information from multiple images at different focal planes and fuse them into one all-in-focus image where all the focal planes appear to be in focus.Large chamber scanning electron microscopes (LC-SEM) are one of the latest members in the SEM family that has found extensive use for nondestructive evaluations. Large objects (~1 meter) can be scanned in micro- or nano-scale using this microscope. An LC-SEM can provide characterization of conductive and non-conductive surfaces with a magnification from 10× to 200,000×. The LC-SEM, as with other SEMs, suffers from the problem of limited DOF making it difficult to inspect a large object while keeping all areas in focus.
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O’Keefe, M. A., J. Taylor, D. Owen, B. Crowley, K. H. Westmacott, W. Johnston, and U. Dahmen. "Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 384–85. http://dx.doi.org/10.1017/s0424820100164386.
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Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.
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Fisher, Knute A. "Scanned Probe Microscopy: Past, present, and future." Proceedings, annual meeting, Electron Microscopy Society of America 50, no. 1 (August 1992): 18–19. http://dx.doi.org/10.1017/s0424820100120497.
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In the past decade a new family of image-forming devices has been developed, machines that do not use lenses and are collectively called scanned probe microscopes (SPM). The SPM family evolved from the scanning tunneling microscope (STM) developed by Binnig and Rohrer in the early 1980s. The tunneling microscope and subsequent probe microscopes, such as the atomic force microscope (AFM), are based on the precise positioning and scanning of a probe within nanometer distances of a surface. Sub-nanometer precision is accomplished using piezoelectric ceramics that change shape with applied electrical potential allowing probes to be moved laterally with less than 0.1-nm resolution and vertically with less than 0.01-nm resolution. This method of positioning has been routinely used with SPM over the past 10 years, during which time many different probes have been developed. These probes measure signals from a variety of physical phenomena such as electron tunneling, atomic force, electrical conductivity, temperature gradients, light absorption, ion currents, and magnetic properties. A significant difference between SPM and conventional light and electron microscopes is that the probes can operate in a wide range of environments including pressures that range from ultrahigh vacuum to ambient pressure, temperatures that range from liquid helium to hundreds of degrees Kelvin, and physical states that include immersion in hydrophobic liquids such as oil and hydrophilic liquids such biological buffers. The probes are usually scanned in either a constant signal mode or in a constant height mode. Signals are amplified and can be used to control the probe's vertical position. The signal is recorded digitally and displayed on a computer screen and thus can be manipulated by image-processing tools to generate topographic maps of the surface. The references at the end of this article cite several of the major reviews of probe microscopy.