Relevant bibliographies by topics / Microwave reflectometers

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'Microwave reflectometers'

Author: Grafiati
Published: 4 June 2021
Last updated: 29 July 2025

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Journal articles on the topic "Microwave reflectometers"

1

IVANCHENKO, Dmitry D., Boris A. KALUGIN, Nicolay N. KOLCHYGIN, and German G. POLOVNIKOV. "Portable Microwave Reflectometers." Turkish Journal of Physics 20, no. 8 (1996): 981–83. http://dx.doi.org/10.55730/1300-0101.2523.

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Giacalone, Jean-Claude, Roland Sabot, Frédéric Clairet, Christine Bottereau, and Diego Molina. "Measurement of the density of magnetized fusion plasma using microwave reflectometry." International Journal of Microwave and Wireless Technologies 1, no. 6 (2009): 505–9. http://dx.doi.org/10.1017/s175907870999078x.

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About 25 years have elapsed since the first measurement by a FW-CW (called fast sweeping) reflectometer of the electronic density in magnetized fusion plasma. Substituting tube sources with solid-state components has resulted in a decrease of the sweeping time from the millisecond to the microsecond range. Based on voltage control oscillators and on active frequency multipliers, four profile reflectometers covering the range 33–155 GHz are in operation on Tore-Supra tokamak. Their originality is the use of one source for the launched and reference signal, although the detection is heterodyne.
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Hwang, Paul A., Thomas L. Ainsworth, and Jeffrey D. Ouellette. "Microwave Specular Measurements and Ocean Surface Wave Properties." Sensors 21, no. 4 (2021): 1486. http://dx.doi.org/10.3390/s21041486.

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Microwave reflectometers provide spectrally integrated information of ocean surface waves several times longer than the incident electromagnetic (EM) wavelengths. For high wind condition, it is necessary to consider the modification of relative permittivity by air in foam and whitecaps produced by wave breaking. This paper describes the application of these considerations to microwave specular returns from the ocean surface. Measurements from Ku and Ka band altimeters and L band reflectometers are used for illustration. The modeling yields a straightforward integration of a closed-form express
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Hsia, R. P., W. M. Zhang, F. Jiang, C. W. Domier, and N. C. Luhmann. "Microwave beam steerers for electronically scanned reflectometers (abstract)." Review of Scientific Instruments 70, no. 1 (1999): 1077. http://dx.doi.org/10.1063/1.1149456.

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Kabanov, D. A., S. M. Nikulin, V. V. Petrov, and A. N. Salov. "Development of automatic microwave circuit analyzers with 12-pole reflectometers." Measurement Techniques 28, no. 10 (1985): 875–78. http://dx.doi.org/10.1007/bf00861766.

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Nikulin, S. M., and A. N. Salov. "Calibration of automatic microwave circuit analyzers with twelve-pole reflectometers." Measurement Techniques 31, no. 8 (1988): 790–93. http://dx.doi.org/10.1007/bf00863497.

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Yatskevich, V. A. "Measurement of microwave device parameters with the aid of multiterminal reflectometers." Measurement Techniques 30, no. 3 (1987): 279–85. http://dx.doi.org/10.1007/bf00867076.

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Ladvánszky, J., A. Hilt, and I. Csonka. "Reduction of measurement error in microwave reflectometers by minimum sensitivity calibration." Electronics Letters 29, no. 14 (1993): 1305. http://dx.doi.org/10.1049/el:19930871.

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Piña, R. Piña, A. Dueñas Jiménez, and C. A. Bonilla Barragán. "The Circuit and Network Analysis of Some Signal Separation Structures Constituting Microwave Six-Port Reflectometers." Universal Journal of Electrical and Electronic Engineering 2, no. 4 (2014): 183–96. http://dx.doi.org/10.13189/ujeee.2014.020407.

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Korotkov, K. S., and D. N. Milchenko. "FEATURES OF THE MEASURING DEVICES USING REFLECTOMETERS FOR DETERMINING S PARAMETERS OF MICROWAVE FOUR-TERMINAL CIRCUITS." Telecommunications and Radio Engineering 72, no. 11 (2013): 997–1003. http://dx.doi.org/10.1615/telecomradeng.v72.i11.60.

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Dissertations / Theses on the topic "Microwave reflectometers"

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Hubbard, Amanda Eileen. "Measurement of electron density on JET by microwave reflectometry." Thesis, Imperial College London, 1987. http://hdl.handle.net/10044/1/47392.

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Hanson, Gregory Richard. "Microwave reflectometry on the advanced toroidal facility to measure density fluctuations and their radial correlation lengths." Diss., Georgia Institute of Technology, 1991. http://hdl.handle.net/1853/17280.

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Medvedeva, Anna. "Étude expérimentale de la turbulence au bord du plasma du tokamak ASDEX Upgrade par réflectométrie à balayage ultra rapide." Thesis, Université de Lorraine, 2017. http://www.theses.fr/2017LORR0240/document.

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La turbulence au sein d’un plasma contribue de manière significative à l’augmentation du transport de l’énergie et des particules. Ce transport diminue la qualité de confinement du plasma réduisant la possibilité d’atteindre le seuil de fusion. Notre travail a consisté à étudier et à mesurer l’évolution des caractéristiques de la turbulence ainsi que son rôle durant la transition d’un mode à faible confinement (L-mode) à un mode de confinement amélioré (H-mode) des plasmas du tokamak ASDEX Upgrade. Nous avons, en particulier, étudié la phase de transition intermédiaire (I-phase) où la turbulen
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Humbert, Vincent. "Etude des états fondamentaux dans des systèmes supraconducteurs désordonnés de dimension 2." Thesis, Université Paris-Saclay (ComUE), 2016. http://www.theses.fr/2016SACLS149/document.

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Un matériau 3D, initialement supraconducteur, peut avoir différents états fondamentaux dépendamment de son degré de désordre : supraconducteur, métallique ou isolant. A dimension réduite (2D), la localisation d’Anderson interdit théoriquement tout état métallique. La modification du désordre induit alors une Transition directe Supraconducteur-Isolant (TSI). La présence de fortes interactions électroniques, non prises en compte dans les théories conventionnelles, pourrait cependant remettre en cause ce paradigme et laisser émerger des états métalliques 2D, complexifiant l’image généralement adm
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Djeldjellani, Mohamed. "Étude d'un applicateur destiné à la mesure des propriétés diélectriques de la peau par réflectométrie temporelle." Besançon, 1989. http://www.theses.fr/1989BESA2019.

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Appareil de mesure de la permittivite de la peau "in vivo" en haute frequence (0,1 a 10 ghz). Variations de la dispersion dielectrique dues a l'hydratation, la vascularisation, a l'epaisseur du tissu sous-cutane
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Deshours, Frédérique. "Mise en œuvre d'un système de mesure load-pull à partir d'un analyseur de réseaux à six-portes pour la caractérisation expérimentale des transistors de puissance." Paris 6, 1996. http://www.theses.fr/1996PA066118.

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Les systèmes de communication deviennent de plus en plus complexes et doivent répondre à des critères bien précis (taille, poids, consommation). Leur conception passe inéluctablement par une phase d'optimisation de leurs différentes fonctions électroniques. Pour répondre à ce besoin de conception optimale, des logiciels de simulation numérique non linéaire (touchstone, mds) ont été développés et commercialisés. Cependant, la validité des résultats obtenus par la simulation repose, en grande partie, sur la qualité des modèles électriques non linéaires des composants introduits dans les simulate
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Hui, Dan. "Non-contacting six-port reflectometers for in-situ measurement of microwave circuit modules /." 2008. http://wwwlib.umi.com/dissertations/fullcit/3289600.

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Cheng-YuWang and 王振宇. "Development of Microwave Reflectometry System for Magnetized plasma Diagnostics." Thesis, 2011. http://ndltd.ncl.edu.tw/handle/24915672878995424108.

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碩士<br>國立成功大學<br>太空天文與電漿科學研究所<br>99<br>This thesis develops a reflectometry system for diagnostics of plasma density profile and fluctuations in magnetized plasmas. Measuring the plasma density profile and fluctuations are important for studying magnetized plasmas. By using the theory of high frequency wave propagation in magnetized plasmas, the phase shift caused by EM wave reflection from the plasma cutoff layer can be measured to determine the plasma density profile and fluctuations. We first describe the results of the system test. Then, we apply the system to measure plasma density in the
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Books on the topic "Microwave reflectometers"

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T, Neece Robert, and Langley Research Center, eds. Reflectometer distance measurement between parallel conductive plates. National Aeronautics and Space Administration, Langley Research Center, 1995.

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1953-, Seals Joseph, and Langley Research Center, eds. Microwave reflectometer ionization sensor. National Aeronautics and Space Administration, Langley Research Center, 1993.

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Cataldo, Andrea. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Springer Berlin Heidelberg, 2011.

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Hugenholtz, Coenraad Albertus Jacobus. Microwave interferometer and reflectometer techniques for thermonuclear plasmas. [s.n.], 1990.

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Cataldo, Andrea, Egidio De Benedetto, and Giuseppe Cannazza. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Springer, 2011.

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Cataldo, Andrea, Egidio De Benedetto, and Giuseppe Cannazza. Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications. Springer, 2013.

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7

Esa, Mazlina. Microwave reflectometer for measuring the permittivities of isolated single particles. 1986.

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Hubbard, Amanda Eileen. Measurement of electron density on jet by microwave reflectometry. 1987.

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Book chapters on the topic "Microwave reflectometers"

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Cataldo, Andrea, Egidio De Benedetto, and Giuseppe Cannazza. "Introduction to Microwave Reflectometry." In Advances in Reflectometric Sensing for Industrial Applications. Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-031-79497-1_1.

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Rusek, Andrew. "Reflectometers, Time-Domain." In Encyclopedia of RF and Microwave Engineering. John Wiley & Sons, Inc., 2005. http://dx.doi.org/10.1002/0471654507.eme375.

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Wang, Ruonan, Yong Li, Qianxiang Gao, Yang Fang, and Zhenmao Chen. "Imaging and Evaluation of Wall-Thinning Defects in GFRP via Cross-Polarization Microwave Reflectometry." In Studies in Applied Electromagnetics and Mechanics. IOS Press, 2025. https://doi.org/10.3233/saem250005.

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The wall-thinning defect is one of the critical flaws that have been posing a severe threat to the structural integrity of Glass Fibre Reinforced Polymer (GFRP) employed in the hostile environment. In this paper, a sweep-frequency microwave testing method based on Cross-polarization Microwave Reflectometry (CMR) is proposed for detection and imaging of subsurface wall-thinning defects in the unidirectional GFRP. The simulation model of CMR is established along with the scrutinization of the characteristics regarding the testing signal in Ka band (26.5 GHz∼40 GHz). In experiments, a microwave t
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Cupido, L., A. Silva, M. E. Manso, and F. Serra. "High performance drivers for fast sweep microwave reflectometry." In Fusion Technology 1996. Elsevier, 1997. http://dx.doi.org/10.1016/b978-0-444-82762-3.50185-3.

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Cataldo, Andrea, Egidio De Benedetto, and Giuseppe Cannazza. "Microwave Reflectometry for Sensing Applications in the Agrofood Industry." In Novel Advances in Microsystems Technologies and Their Applications. CRC Press, 2017. http://dx.doi.org/10.1201/b15283-15.

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Cataldo, Andrea, Egidio De Benedetto, and Giuseppe Cannazza. "Microwave Reflectometry for Sensing Applications in the Agrofood Industry." In Smart Sensors for Industrial Applications. CRC Press, 2017. http://dx.doi.org/10.1201/b14875-30.

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E., Marek, and Norhudah Sem. "Ultra Wideband Microwave Multi-Port Reflectometer in Microstrip-Slot Technology: Operation, Design and Applications." In Advanced Microwave and Millimeter Wave Technologies Semiconductor Devices Circuits and Systems. InTech, 2010. http://dx.doi.org/10.5772/8760.

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Conference papers on the topic "Microwave reflectometers"

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Chahine, S. Abou, G. Neveux, and B. Huyart. "A Rigorous Approach for Calibrating Six-Port Reflectometers." In 2002 32nd European Microwave Conference. IEEE, 2002. http://dx.doi.org/10.1109/euma.2002.339478.

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Noujeim, K. M., and T. Roberts. "Reduced-complexity E-band VNAs with tethered far-reaching reflectometers." In 2016 46th European Microwave Conference (EuMC). IEEE, 2016. http://dx.doi.org/10.1109/eumc.2016.7824543.

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Staszek, Kamil, Slawomir Gruszczynski, and Krzysztof Wincza. "Improved design of an ultra-broadband probe for multiprobe reflectometers." In 2015 Asia-Pacific Microwave Conference (APMC). IEEE, 2015. http://dx.doi.org/10.1109/apmc.2015.7413115.

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Ivanovskaya, A., V. Krylov, and B. Rudko. "Application of EHF EM-Wave Reflectometers in Medical Diagnostics." In 2006 16th International Crimean Microwave and Telecommunication Technology. IEEE, 2006. http://dx.doi.org/10.1109/crmico.2006.256260.

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Maurin, David, Yansheng Xu, Bernard Huyart, Ke Wu, Michel Cuhaci, and Renato G. Bosisio. "CPW Millimeter-Wave Six-Port Reflectometers Using MHMIC and MMIC technologies." In 24th European Microwave Conference, 1994. IEEE, 1994. http://dx.doi.org/10.1109/euma.1994.337329.

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Staszek, Kamil, Piotr Kaminski, Artur Rydosz, Slawomir Gruszczynski, and Krzysztof Wincza. "A least-squares approach to the calibration of multiport reflectometers." In 2013 IEEE MTT-S International Microwave and RF Conference. IEEE, 2013. http://dx.doi.org/10.1109/imarc.2013.6777712.

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Bilik, V. "An Improved Method of Determining the Reference Port Characteristics of Six-Port Reflectometers." In 21st European Microwave Conference, 1991. IEEE, 1991. http://dx.doi.org/10.1109/euma.1991.336355.

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Deng Wanli, Liu He, and Xia Shiyao. "The Microwave Reflectometers At Reentry Spacecraft And Plasma Sheath Diagnosing Results Analysis." In International Conference on Millimeter Wave and Far-Infrared Technology. IEEE, 1990. http://dx.doi.org/10.1109/icmwft.1990.711399.

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Bensmida, Souheil, Philippe Poire, and Fadhel M. Ghannouchi. "Source-pull/load-pull measurement system based on rf and baseband coherent active branches using broadband six-port reflectometers." In 2007 European Microwave Conference. IEEE, 2007. http://dx.doi.org/10.1109/eumc.2007.4405352.

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Hur, Byul, and William R. Eisenstadt. "Automated wideband test system, measurement uncertainty, and design of on-chip six-port reflectometers for 5G applications." In 2015 85th ARFTG Microwave Measurement Conference (ARFTG). IEEE, 2015. http://dx.doi.org/10.1109/arftg.2015.7162901.

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Reports on the topic "Microwave reflectometers"

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MOYER, ROBERT D. A Theory for RF and Microwave Scalar Reflectometers. Office of Scientific and Technical Information (OSTI), 2003. http://dx.doi.org/10.2172/811718.

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T. Munsat, E. Mazzucato, H. Park, et al. Microwave Imaging Reflectometer for TEXTOR. Office of Scientific and Technical Information (OSTI), 2002. http://dx.doi.org/10.2172/807252.

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Mazzucato, E. Microwave Reflectometry for Magnetically Confined Plasmas. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/4379.

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E. Mazzucato, T. Munsat, H. Park, et al. Fluctuation Measurements in Tokamaks with Microwave Imaging Reflectometry. Office of Scientific and Technical Information (OSTI), 2001. http://dx.doi.org/10.2172/792990.

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G.J. Kramer, R. Nazikian, and E. Valeo. Simulation of Optical and Synthetic Imaging using Microwave Reflectometry. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/821514.

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E. Mazzucato. Microwave Imaging Reflectometry for the Visualization of Turbulence in Tokamaks. Office of Scientific and Technical Information (OSTI), 1999. http://dx.doi.org/10.2172/15128.

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E. Mazzucato. Numerical Study of Microwave Reflectometry in Plasmas with 2D Turbulent Fluctuations. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/4523.

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Mazzucato, E., and R. Nazikian. Microwave reflectometry for the study of density fluctuations in tokamak plasmas. Office of Scientific and Technical Information (OSTI), 1990. http://dx.doi.org/10.2172/6377672.

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E. Mazzucato. Microwave Imaging Reflectometry for the Measurement of Turbulent Fluctuations in Tokamaks. Office of Scientific and Technical Information (OSTI), 2004. http://dx.doi.org/10.2172/821811.

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Mazzucato, E., and R. Nazikian. Effects of turbulent fluctuations on density measurements with microwave reflectometry in tokamaks. Office of Scientific and Technical Information (OSTI), 1994. http://dx.doi.org/10.2172/10172215.

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