Dissertations / Theses on the topic 'Mikroskop BAM'
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Klingner, Nico. "Ionenstrahlanalytik im Helium-Ionen-Mikroskop." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2017. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-220036.
Full textThe present work describes the implementation of ion beam analysis methods in a helium-ion-microscope for the determination of sample compositions with a focused ion beam of < 1 nm size. Imaging in the microscope is realized by scanning the focused ion beam over the sample surface while measuring the local secondary electron yield. Although this procedure leads to a high topographical contrast, neither the yield nor the energy distribution of the secondary electrons deliver reliable information on the chemical composition of the sample. For this purpose, in this work different ion beam induced secondary particles were compared with respect to their suitability for the analysis of the chemical composition in the helium-ion-microscope. In particular the information content of the particles, their analysability and their yield were evaluated. As a result, the spectrometry of backscattered particles and the mass spectrometry of sputtered secondary ions were identified as the most promising methods and regarded in detail. The investigation focused on physical limitations and detection limits of the methods as well as their implementability into a helium-ion-microscope. Therefor various concepts of spectrometers were evaluated, tested and validated in terms of their efficiency, energy resolution and practicability in the microscope. Time-of-flight spectrometry by pulsing the primary ion beam could be identified as the most suitable technique and has been successfully implemented in a helium-ion-microscope. The measurement setup, signal processing and data handling as well as comparative simulations are described in detail. Further the spectrometer was characterized explicitly in terms of time, energy and mass resolution. Spatially resolved backscattering spectra will be shown demonstrating the feasibility of performing ion beam analysis in a helium-ion-microscope for the first time on a size scale of ≤ 60 nm. By pulsing the primary ion beam the technique of secondary ion mass spectrometry becomes automatically accessible. This method provides information on the molecular composition of samples and can reach higher detection limits than those from backscattering spectrometry. For the first time, in a helium-ion-microscope measured secondary ion mass spectra and spatially resolved elemental analysis by spectrometry of secondary ions, could be demonstrated. The results of this work are published 2016 in the scientific journal Ultramicroscopy, volume 162 on pages 91 to 971. In October 2016 there will be another publication as a book chapter in „Helium Ion Microscopy“ (publisher: Springer Verlag Heidelberg)
Švajdová, Anna. "Design elektronového mikroskopu." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2017. http://www.nusl.cz/ntk/nusl-319480.
Full textGoroš, Pavel. "Kontrast v obraze získaném pomocí ionizačního detektoru ve VP SEM." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2011. http://www.nusl.cz/ntk/nusl-219043.
Full textPolách, Ondřej. "Optimalizace tvaru čerpání diferenciálně čerpané komory pro novou koncepci elektronového mikroskopu." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2015. http://www.nusl.cz/ntk/nusl-221092.
Full textVykydal, Václav. "Radiační poškození vzorků v nízkovoltové transmisní elektronové mikroskopii." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2019. http://www.nusl.cz/ntk/nusl-400992.
Full textBrochs, Christoffer. "Defektidentifieringvid EBM-tillverkning." Thesis, Mittuniversitetet, Avdelningen för kvalitets- och maskinteknik, 2018. http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-34780.
Full textBetyg: 180827
Přikryl, Vojtěch. "In-situ mapování rozložení náboje a transportní odezvy nanostruktur připravených pomocí rastrovací sondové mikroskopie na grafenových Hallových strukturách." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2019. http://www.nusl.cz/ntk/nusl-399729.
Full textDvořák, Petr. "Studium vlastností povrchových plazmonových polaritonů na magnetických materiálech." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229810.
Full textHladík, Lukáš. "Přepínání spinových vortexů v magnetických nanodiscích." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2012. http://www.nusl.cz/ntk/nusl-230257.
Full textBabocký, Jiří. "Příprava a charakterizace nanostruktur s funkčními vlastnostmi v oblasti plazmoniky." Doctoral thesis, Vysoké učení technické v Brně. CEITEC VUT, 2020. http://www.nusl.cz/ntk/nusl-432891.
Full textŠkarvada, Pavel. "Lokální optické a elektrické charakteristiky optoelektronických součástek." Doctoral thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2012. http://www.nusl.cz/ntk/nusl-233561.
Full textPolcer, Simon. "Detekce a rozměření elektronového svazku v obrazech z TEM." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2020. http://www.nusl.cz/ntk/nusl-413022.
Full textBarapatre, Nirav. "Application of Ion Beam Methods in Biomedical Research." Doctoral thesis, Universitätsbibliothek Leipzig, 2013. http://nbn-resolving.de/urn:nbn:de:bsz:15-qucosa-126262.
Full textLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Full textElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Metelka, Ondřej. "Charakterizace struktur připravených selektivním mokrým leptáním křemíku." Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2014. http://www.nusl.cz/ntk/nusl-231496.
Full textDhankhar, Meena. "Paměťová buňka založená na magnetických vortexech." Doctoral thesis, Vysoké učení technické v Brně. CEITEC VUT, 2021. http://www.nusl.cz/ntk/nusl-442336.
Full textFlajšmanová, Jana. "Behaviour of Objects in Structured Light Fields and Low Pressures." Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2021. http://www.nusl.cz/ntk/nusl-444991.
Full textRačanský, David. "Scintilační detektor sekundárních elektronů pro VP SEM." Master's thesis, Vysoké učení technické v Brně. Fakulta elektrotechniky a komunikačních technologií, 2011. http://www.nusl.cz/ntk/nusl-219370.
Full textPlichta, Tomáš. "Povrchové a mechanické vlastnosti a-CSi:H a a-CSiO:H vrstev." Doctoral thesis, Vysoké učení technické v Brně. Fakulta chemická, 2020. http://www.nusl.cz/ntk/nusl-433414.
Full textHamann, Christine. "Magnetische Hybridschichten - Magnetische Eigenschaften lokal austauschgekoppelter NiFe/IrMn-Schichten." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2011. http://nbn-resolving.de/urn:nbn:de:bsz:14-qucosa-64664.
Full textPetráš, Roman. "Únavová odolnost a mechanizmy únavového poškození v materiálech pro vysoké teploty." Doctoral thesis, Vysoké učení technické v Brně. CEITEC VUT, 2021. http://www.nusl.cz/ntk/nusl-433631.
Full textKlingner, Nico. "Ionenstrahlanalytik im Helium-Ionen-Mikroskop." Doctoral thesis, 2016. https://tud.qucosa.de/id/qucosa%3A29153.
Full textThe present work describes the implementation of ion beam analysis methods in a helium-ion-microscope for the determination of sample compositions with a focused ion beam of < 1 nm size. Imaging in the microscope is realized by scanning the focused ion beam over the sample surface while measuring the local secondary electron yield. Although this procedure leads to a high topographical contrast, neither the yield nor the energy distribution of the secondary electrons deliver reliable information on the chemical composition of the sample. For this purpose, in this work different ion beam induced secondary particles were compared with respect to their suitability for the analysis of the chemical composition in the helium-ion-microscope. In particular the information content of the particles, their analysability and their yield were evaluated. As a result, the spectrometry of backscattered particles and the mass spectrometry of sputtered secondary ions were identified as the most promising methods and regarded in detail. The investigation focused on physical limitations and detection limits of the methods as well as their implementability into a helium-ion-microscope. Therefor various concepts of spectrometers were evaluated, tested and validated in terms of their efficiency, energy resolution and practicability in the microscope. Time-of-flight spectrometry by pulsing the primary ion beam could be identified as the most suitable technique and has been successfully implemented in a helium-ion-microscope. The measurement setup, signal processing and data handling as well as comparative simulations are described in detail. Further the spectrometer was characterized explicitly in terms of time, energy and mass resolution. Spatially resolved backscattering spectra will be shown demonstrating the feasibility of performing ion beam analysis in a helium-ion-microscope for the first time on a size scale of ≤ 60 nm. By pulsing the primary ion beam the technique of secondary ion mass spectrometry becomes automatically accessible. This method provides information on the molecular composition of samples and can reach higher detection limits than those from backscattering spectrometry. For the first time, in a helium-ion-microscope measured secondary ion mass spectra and spatially resolved elemental analysis by spectrometry of secondary ions, could be demonstrated. The results of this work are published 2016 in the scientific journal Ultramicroscopy, volume 162 on pages 91 to 971. In October 2016 there will be another publication as a book chapter in „Helium Ion Microscopy“ (publisher: Springer Verlag Heidelberg).
Wang, Bao-Gui [Verfasser]. "Multiphotonen-Mikroskopie und Laser-Nanochirurgie der Kornea mittels Naher-Infrarot-Nanojoule-Femtosekunden-Laserpulse / von Bao-Gui Wang." 2006. http://d-nb.info/982773544/34.
Full textLauterbach, Marcel. "Fast STED Microscopy." Doctoral thesis, 2009. http://hdl.handle.net/11858/00-1735-0000-0006-B4AC-8.
Full textKuchyňová, Markéta. "Reaktivnost křemene v experimentálních maltových tělesech." Master's thesis, 2016. http://www.nusl.cz/ntk/nusl-348308.
Full textShariq, Ahmed. "Short range ordering and microstructure property relationship in amorphous alloys." Doctoral thesis, 2007. http://hdl.handle.net/11858/00-1735-0000-0006-B44C-D.
Full textHamann, Christine. "Magnetische Hybridschichten - Magnetische Eigenschaften lokal austauschgekoppelter NiFe/IrMn-Schichten." Doctoral thesis, 2010. https://tud.qucosa.de/id/qucosa%3A25492.
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