Relevant bibliographies by topics / Mixed-signal system

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers

Academic literature on the topic 'Mixed-signal system'

Author: Grafiati
Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Mixed-signal system"

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Zagursky, V. "Characterization techniques for mixed signal system." Computer Standards & Interfaces 21, no. 2 (June 1999): 112. http://dx.doi.org/10.1016/s0920-5489(99)91977-3.

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Kougianos, Elias. "Nanoelectronic Mixed-Signal System Design [Book Reviews]." IEEE Consumer Electronics Magazine 6, no. 1 (January 2017): 147–48. http://dx.doi.org/10.1109/mce.2016.2614559.

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Pouros, S. P., V. D. Vassios, and D. K. Papakostas. "FPGA - Based Mixed - Signal Circuits Testing System Implementation." Journal of Engineering Science and Technology Review 9, no. 6 (December 2016): 131–34. http://dx.doi.org/10.25103/jestr.096.19.

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Ozev, S., and A. Orailoglu. "System-level test synthesis for mixed-signal designs." IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 48, no. 6 (June 2001): 588–99. http://dx.doi.org/10.1109/82.943329.

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Chou, E., and B. Sheu. "Nanometer mixed-signal system-on-a-chip design." IEEE Circuits and Devices Magazine 18, no. 4 (July 2002): 7–17. http://dx.doi.org/10.1109/mcd.2002.1021118.

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Pucha, R. V., S. Hegde, M. Damani, K. Tunga, A. Perkins, S. Mahalingam, G. Ramakrishna, et al. "System-Level Reliability Assessment of Mixed-Signal Convergent Microsystems." IEEE Transactions on Advanced Packaging 27, no. 2 (May 2004): 438–52. http://dx.doi.org/10.1109/tadvp.2004.830357.

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Mallik, A. "Tunnel FETs for Mixed-Signal System-On-Chip Applications." ECS Transactions 53, no. 5 (May 2, 2013): 93–104. http://dx.doi.org/10.1149/05305.0093ecst.

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Van Lammeren, J. P. M., and R. W. B. Wissing. "Mixed-signal quadrature demodulator with a multicarrier regeneration system." IEEE Journal of Solid-State Circuits 35, no. 3 (March 2000): 441–45. http://dx.doi.org/10.1109/4.826827.

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Bello, D. S. S., R. Tangelder, and H. Kerkhoff. "Modeling a verification test system for mixed-signal circuits." IEEE Design & Test of Computers 18, no. 1 (2001): 63–71. http://dx.doi.org/10.1109/54.902823.

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Li, Hongge. "A compensability RF CMOS mixed-signal interface for implantable system." Analog Integrated Circuits and Signal Processing 61, no. 3 (April 24, 2009): 301–7. http://dx.doi.org/10.1007/s10470-009-9311-0.

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Dissertations / Theses on the topic "Mixed-signal system"

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Hajjar, Ara. "An integrable mixed-signal test system /." Thesis, McGill University, 1998. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=21298.

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The growing need for integrable test solutions has prompted the creation of various test bus standards. A mixed-signal test core is an ideal complement to these standards. This work presents the design and implementation of an integrable test system. The design consists of two major components: a stimulus generator, and a waveform extractor.
A memory-based generator is used to construct the stimulus generation component. Such a circuit repeats a finite portion of an infinite-length PDM sequence in order to produce any arbitrary analog waveform. The circuitry is simple to design---it is comprised of a scan chain, and a 1-bit DAC; it is also area-efficient and robust (mostly digital design). Furthermore, since the analog signal is generated from a digital bit-stream, it is both stable and repeatable.
The extraction component of the test system focuses on the capture of steady-state type responses. A novel A/D algorithm is presented: the Multi-Pass technique. By taking advantage of repetitive waveforms, the Multi-Pass convertor achieves both area-efficiency and high-speed performance. A single on-chip comparator and sample-and-hold circuit is sufficient to extract analog waveforms. In addition, a novel, area-efficient, integrable, and highly-linear voltage reference design is presented.
Experimental results from two prototype boards serve to validate the proposed test system design. The first board implements the system using discrete components; the second makes use of a custom IC fabricated in a 0.5 mum CMOS process. The work presented in this thesis provides the groundwork for obtaining a practical and fully integrable mixed signal test system.
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Hajjar, Ara. "An integrable mixed-signal test system." Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1999. http://www.collectionscanada.ca/obj/s4/f2/dsk1/tape8/PQDD_0027/MQ50616.pdf.

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Xiao, Rui. "Dynamically reconfigurable mixed signal system design /." Available to subscribers only, 2007. http://proquest.umi.com/pqdweb?did=1407501391&sid=17&Fmt=2&clientId=1509&RQT=309&VName=PQD.

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Hannu, J. (Jari). "Embedded mixed-signal testing on board and system level." Doctoral thesis, Oulun yliopisto, 2013. http://urn.fi/urn:isbn:9789526200996.

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Abstract This thesis studies the methods to test mixed-signal devices and circuits on board and system level with embedded test instrumentation. The study is divided in three continuous sections, development of embedded test methods for discrete components, integration of test instruments on board level and development of test and health monitoring strategy for large scale system. The developed embedded test methods for mixed signal circuitry on board level are based on the standard for mixed signal test bus IEEE 1149.4. The standardized embedded test infrastructure is utilized for testing discrete components with emphasis on testing active components as diodes and transistors. The developed embedded tests are evaluated with PCOLA/SOQ method for manufacturing testing and also the usability of the tests is discussed. A solution for embedded mixed-signal test controller is presented with discussion of test communication and the possibilities of implementing embedded test control. The target in the development of the test control is to enable launch mixed signal tests on device remotely. The test controller is IEEE 1149.4 compatible and can generate and measure analog test signals while controlling boundary-scan enabled devices. The final section of the thesis focuses on an embedded test solution for aerospace bus system (MIL-STD-1553). Current solutions are based on testing the bus system during maintenance on ground. The developed test and monitoring method allows on-line monitoring of the bus to detect and locate possible defects which only occur during use of the aeroplane
Tiivistelmä Väitöstyössä tutkittiin sekasignaalilaitteiden ja -piirien testausmenetelmiä levy- ja järjestelmätasolla hyödyntäen sulautettuja testilaitteita. Työ jakaantuu kolmeen osaan; sulautettujen testausmenetelmien kehitys diskreeteille komponenteille, testi-instrumenttien integrointi piirilevytasolle sekä testaus- ja kunnonmonitorointimenetelmän kehitys laajemmalle järjestelmälle. Sulautettujen testimenetelmien kehitys sekasignaalipiireille piirilevytasolla perustuu sekasignaalitestiväylän standardiin IEEE 1149.4. Standardoitua sulautettua testi-infrastruktuuria käytettiin diskreettien komponenttien testaukseen painottuen aktiivikomponentteihin, kuten diodeihin ja transistoreihin. Kehitetyt sulautetut testit on arvioitu PCOLA/SOQ menetelmällä, jota hyödynnetään tuotantotestauksen testikattavuuden arvioinnissa. Lisäksi testimenetelmien käytettävyyttä arvioitiin. Sulautettu sekasignaalilaitteiden testikontrollerin tavoite on käynnistää ja suorittaa sekasignaalitestejä laitteessa etäältä. Kehitetty testikontrolleri on IEEE 1149.4 yhteensopiva ja voi generoida ja mitata analogista testisignaalia sekä samanaikaisesti ohjata testiväylää. Lisäksi etätestauksen mahdollistavasta testikommunikaatiomenetelmiä arvioitiin kuten myös erilaisia toteutustasoja sulautetuille testimenetelmille. Laajemman järjestelmän kehityksessä tutkittiin sulautettua testausratkaisua lentokoneen väyläjärjestelmälle, joka perustuu standardiin MIL-STD-1553B. Nykyiset menetelmät perustuvat väyläjärjestelmän testaukseen huollon yhteydessä, mutta osa virheistä ilmenee vain käytön aikana. Kehitetty testaus- ja monitorointimenetelmä mahdollistaa käytönaikaisen jatkuvan virheiden monitoroinnin sekä niiden paikantamisen lennon aikana
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Al-Junaid, Hessa Jassim. "SystemC-A : analogue and mixed-signal language for high level system design." Thesis, University of Southampton, 2006. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.427468.

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YELAMANCHILI, VEENA RAO. "A SIMULATION AND PERFORMANCE ESTIMATION SYSTEM FOR ANALOG AND MIXED SIGNAL SYSTEMS." University of Cincinnati / OhioLINK, 2003. http://rave.ohiolink.edu/etdc/view?acc_num=ucin1068671449.

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Omeni, Okundu Chukwuemeke. "Advanced mixed signal strategies for micropower CMOS system on chip." Thesis, Imperial College London, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.420136.

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Zaum, Daniel [Verfasser]. "System Level Analysis of Mixed-Signal Systems using State Space Models / Daniel Zaum." München : Verlag Dr. Hut, 2011. http://d-nb.info/1017353360/34.

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Zakizadeh, Jila. "Built-in self-test techniques for analog and mixed signal circuits." Thesis, University of Ottawa (Canada), 2005. http://hdl.handle.net/10393/27094.

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The present thesis attempts to develop new techniques for testing analog parts of embedded cores-based mixed signal integrated circuits and systems. In particular, the oscillation based test methodologies have been investigated in the thesis. In the oscillation based test methods, the circuit under test (CUT) is first converted to an oscillator in the test mode and the oscillation parameters, viz. frequency, amplitude, etc. are then measured. Any deviation of these parameters causes either the oscillation frequency of the converted CUT to differ from its nominal value, or the converted CUT stops oscillation altogether. For evaluation purpose, a program has been written in C to help us in simulating our test methodologies. The program is used to inject faults to the circuit under test. The detailed experimental results provided give frequency and amplitude measurements data performed on the individual circuit blocks together with fault coverage. In this work, however, only catastrophic faults were considered. The simulation experiments carried out on different circuits not only demonstrate that the developed approaches are quite feasible but show in addition that the fault coverage is quite satisfactory (100%) in all cases.
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Suparjo, Bambang Sunaryo. "Testing analogue circuits : design for testability structures and an investigation into supply current modelling." Thesis, University of Southampton, 1994. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.239871.

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Books on the topic "Mixed-signal system"

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Adaptive techniques for mixed signal system on chip. Dordrecht, NE: Springer, 2007.

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D, Peterson Gregory, and Teegarden Darrell A, eds. The system designer's guide to VHDL-AMS: Analog, mixed-signal, and mixed-technology modeling. San Francisco, Calif: Morgan Kaufmann, 2003.

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(2003), FDL'03. Languages for system specification: Selected contributions on UML, SystemC, System Verilig, mixed-signal systems, and property specification from FDL'03. Boston: Kluwer Academic Publishers, 2004.

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(2003), FDL'03. Languages for system specification: Selected contributions on UML, SystemC, System Verilog, mixed-signal systems, and property specifications from FDL '03. New York: Springer, 2011.

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(Firm), Knovel, and Institution of Engineering and Technology, eds. Test and diagnosis of analogue, mixed-signal and RF integrated circuits: The system on chip approach. London: Institution of Engineering and Technology, 2008.

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Farag, Emad N. Mixed signal VLSI wireless design: Circuits and systems. New York: Kluwer Academic, 2002.

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Farag, Emad N. Mixed signal VLSI wireless design: Circuits and systems. Boston: Kluwer Academic, 2000.

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1943-, Elmasry Mohamed I., ed. Mixed signal VLSI wireless design: Circuits and systems. Boston: Kluwer Academic, 2000.

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H, Currie Edward, and SpringerLink (Online service), eds. Introduction to Mixed-Signal, Embedded Design. New York, NY: Springer Science+Business Media, LLC, 2011.

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Roberts, Gordon W. Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 1995.

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Book chapters on the topic "Mixed-signal system"

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Soma, Mani. "System Test Methodologies Using IEEE 1149.4." In Analog and Mixed-Signal Boundary-Scan, 61–90. Boston, MA: Springer US, 1999. http://dx.doi.org/10.1007/978-1-4757-4499-6_4.

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Peterson, Gregory D. "A Comparison of Mixed-Signal Modeling Approaches." In System on Chip Design Languages, 79–86. Boston, MA: Springer US, 2002. http://dx.doi.org/10.1007/978-1-4757-6674-5_7.

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Doboli, Alex, and Edward H. Currie. "An Overview of Mixed-Signal, Embedded System Design." In Introduction to Mixed-Signal, Embedded Design, 1–49. New York, NY: Springer New York, 2010. http://dx.doi.org/10.1007/978-1-4419-7446-4_1.

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Haase, Jan, and Christoph Grimm. "Power Profiling of Embedded Analog/Mixed-Signal Systems." In Integrated Circuit and System Design. Power and Timing Modeling, Optimization, and Simulation, 250. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-17752-1_25.

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Kim, Jaeha. "Mixed-Signal System Verification: A High-Speed Link Example." In Computer Aided Verification, 16. Berlin, Heidelberg: Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-02658-4_2.

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Materka, Andrzej, Pawel Pełczynski, and Michał Strzelecki. "Artificial Neural Network Mixed-Signal Prototype System for Model Parameter Identification." In Mixed Design of Integrated Circuits and Systems, 97–102. Boston, MA: Springer US, 1998. http://dx.doi.org/10.1007/978-1-4615-5651-0_15.

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Tobar, A. Mejía, A. M. Salazar Rojas, M. L. Nariño Ruano, J. J. Cabrera-López, W. Agredo Rodriguez, and F. Fonthal Rico. "Functional Electrical Stimulation System for Walking Based On Mixed Signal Circuits." In V Latin American Congress on Biomedical Engineering CLAIB 2011 May 16-21, 2011, Habana, Cuba, 587–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-21198-0_150.

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Gielen, Georges. "System-Level Design Issues for Mixed-Signal ICs and Telecom Frontends." In Analog Circuit Design, 141–65. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/978-1-4757-3198-9_7.

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Dang, Thao, Alexandre Donzé, and Oded Maler. "Verification of Analog and Mixed-Signal Circuits Using Hybrid System Techniques." In Formal Methods in Computer-Aided Design, 21–36. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-540-30494-4_3.

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Betting, Benjamin, Julius von Rosen, Lars Hedrich, and Uwe Brinkschulte. "A Highly Dependable Self-adaptive Mixed-Signal Multi-core System-on-Chip." In Architecture of Computing Systems – ARCS 2013, 122–33. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36424-2_11.

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Conference papers on the topic "Mixed-signal system"

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Shanbhag, N., and A. Singer. "System-assisted analog mixed-signal design." In 2011 Design, Automation & Test in Europe. IEEE, 2011. http://dx.doi.org/10.1109/date.2011.5763242.

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Chao Liang. "Mixed-signal verification methods for multi-power mixed-signal System-on-Chip (SoC) design." In 2013 IEEE 10th International Conference on ASIC (ASICON 2013). IEEE, 2013. http://dx.doi.org/10.1109/asicon.2013.6812042.

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Svensson, Lars, and Lena Peterson. "A system-level mixed-signal design course." In 2015 IEEE International Conference on Microelectronics Systems Education (MSE). IEEE, 2015. http://dx.doi.org/10.1109/mse.2015.7160014.

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Cabrera-Lopez, John Jairo, Jaime Velasco-Medina, Ernesto Rodriguez Denis, Juan Felipe Briceno Calderon, and Oscar Julian Gomez Guevara. "Bioimpedance measurement using mixed-signal embedded system." In 2016 IEEE 7th Latin American Symposium on Circuits & Systems (LASCAS). IEEE, 2016. http://dx.doi.org/10.1109/lascas.2016.7451078.

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Meier, Karlheinz. "A mixed-signal universal neuromorphic computing system." In 2015 IEEE International Electron Devices Meeting (IEDM). IEEE, 2015. http://dx.doi.org/10.1109/iedm.2015.7409627.

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Wang, Zhu-ping, Shun-an Zhong, and Yong-wang Ma. "Design and Simulate of Mixed-Signal System." In 2010 International Conference on Electrical and Control Engineering (ICECE). IEEE, 2010. http://dx.doi.org/10.1109/icece.2010.1128.

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"T1B: Digital and Mixed-Signal Circuits." In 2018 31st IEEE International System-on-Chip Conference (SOCC). IEEE, 2018. http://dx.doi.org/10.1109/socc.2018.8618574.

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Zhu, Keren, Hao Chen, Mingjie Liu, Xiyuan Tang, Nan Sun, and David Z. Pan. "Effective analog/mixed-signal circuit placement considering system signal flow." In ICCAD '20: IEEE/ACM International Conference on Computer-Aided Design. New York, NY, USA: ACM, 2020. http://dx.doi.org/10.1145/3400302.3415625.

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Ruan, Ken G. "Entire Embedded Control System Simulation Using a Mixed-Signal Mixed-Technology Simulator." In SAE 2005 World Congress & Exhibition. 400 Commonwealth Drive, Warrendale, PA, United States: SAE International, 2005. http://dx.doi.org/10.4271/2005-01-1430.

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Beringuier-Boher, Noemie, Kamil Gomina, David Hely, Jean-Baptiste Rigaud, Vincent Beroulle, Assia Tria, Joel Damiens, Philippe Gendrier, and Philippe Candelier. "Voltage Glitch Attacks on Mixed-Signal Systems." In 2014 17th Euromicro Conference on Digital System Design (DSD). IEEE, 2014. http://dx.doi.org/10.1109/dsd.2014.14.

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