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Journal articles on the topic 'Mixed signal test'

Author: Grafiati

Published: 4 June 2021

Last updated: 12 February 2022

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1

Cron, A. "P1149.4 Mixed-Signal Test Bus." IEEE Design & Test of Computers 13, no. 3 (1996): 98. http://dx.doi.org/10.1109/mdt.1996.536100.

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2

Dufils, M., J. L. Carbonero, P. Planelle, and P. Raynaud. "Mixed-signal simulation and test generation." International Journal of Electronics 95, no. 3 (2008): 239–48. http://dx.doi.org/10.1080/00207210701827954.

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3

Kramer, Randy. "Test throughput for mixed-signal devices." IEEE Instrumentation & Measurement Magazine 8, no. 1 (2005): 12–15. http://dx.doi.org/10.1109/mim.2005.8465942.

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4

Modi, M. "Mixed-signal test bus, embedded core test efforts advance." IEEE Design & Test of Computers 16, no. 2 (1999): 5–93. http://dx.doi.org/10.1109/mdt.1999.765189.

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5

Baker, K., A. M. Richardson, and A. P. Dorey. "Mixed signal test — techniques, applications and demands." IEE Proceedings - Circuits, Devices and Systems 143, no. 6 (1996): 358. http://dx.doi.org/10.1049/ip-cds:19960904.

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6

Stratigopoulos, Haralampos-G., and Christian Streitwieser. "Adaptive Test With Test Escape Estimation for Mixed-Signal ICs." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 37, no. 10 (2018): 2125–38. http://dx.doi.org/10.1109/tcad.2017.2783302.

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7

Haurie, X., and G. W. Roberts. "Arbitrary-precision signal generation for mixed-signal built-in-self-test." IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 45, no. 11 (1998): 1425–32. http://dx.doi.org/10.1109/82.735354.

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8

Barragán, Manuel J., Diego Vázquez, and Adoración Rueda. "Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications." Journal of Electronic Testing 27, no. 3 (2011): 305–20. http://dx.doi.org/10.1007/s10836-010-5192-5.

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9

Ruan, Xiaoli, and Zheying Li. "Mixed-signal SoC test based on task flow." JOURNAL OF ELECTRONIC MEASUREMENT AND INSTRUMENT 24, no. 11 (2010): 1024–30. http://dx.doi.org/10.3724/sp.j.1187.2010.01024.

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10

Kerkhoff, Hans G., and Bozena Kaminska. "Analog and mixed signal test techniques for SoCs." Microelectronics Journal 34, no. 10 (2003): 887–88. http://dx.doi.org/10.1016/s0026-2692(03)00234-9.

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11

Roberts, Gordon W., and Sadok Aouini. "Mixed-Signal Production Test: A Measurement Principle Perspective." IEEE Design & Test of Computers 26, no. 5 (2009): 48–62. http://dx.doi.org/10.1109/mdt.2009.117.

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12

Ozev, S., and A. Orailoglu. "System-level test synthesis for mixed-signal designs." IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 48, no. 6 (2001): 588–99. http://dx.doi.org/10.1109/82.943329.

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13

Richardson, A., and A. P. Dorey. "Editorial: Mixed signal & analogue IC test technology." IEE Proceedings - Circuits, Devices and Systems 143, no. 6 (1996): 357. http://dx.doi.org/10.1049/ip-cds:19960955.

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14

Xia, Tian, Justin Campbell, Jing Li, Randy Wolf, and John F. Sweeney. "Jitter measurement circuit for mixed signal production test." Measurement 40, no. 3 (2007): 272–82. http://dx.doi.org/10.1016/j.measurement.2006.06.004.

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15

Kerkhoff, Hans G. "The test search for true mixed-signal cores." Microelectronics Journal 36, no. 12 (2005): 1103–11. http://dx.doi.org/10.1016/j.mejo.2005.04.063.

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16

LIN, FENG, ZHENG HUI LIN, and T. WILLIAM LIN. "A uniform approach to mixed-signal circuit test." International Journal of Circuit Theory and Applications 25, no. 2 (1997): 81–93. http://dx.doi.org/10.1002/(sici)1097-007x(199703/04)25:2<81::aid-cta952>3.0.co;2-p.

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17

Argüelles, J., M. Martínez, and S. Bracho. "Dynamic Idd test circuit for mixed signal ICs." Electronics Letters 30, no. 6 (1994): 485–86. http://dx.doi.org/10.1049/el:19940343.

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18

Hannu, Jari, Teuvo Saikkonen, Juha Häkkinen, Juha Karttunen, and Markku Moilanen. "Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture." Journal of Electronic Testing 26, no. 6 (2010): 641–58. http://dx.doi.org/10.1007/s10836-010-5175-6.

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19

Dufort, B., and G. W. Roberts. "On-chip analog signal generation for mixed-signal built-in self-test." IEEE Journal of Solid-State Circuits 34, no. 3 (1999): 318–30. http://dx.doi.org/10.1109/4.748183.

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20

Ozev, S., I. Bayraktaroglu, and A. Orailoglu. "Seamless test of digital components in mixed-signal paths." IEEE Design & Test of Computers 21, no. 1 (2004): 44–55. http://dx.doi.org/10.1109/mdt.2004.1261849.

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21

Bell, I. M., S. J. Spinks, and J. Machado da Silva. "Supply current test of analogue and mixed signal circuits." IEE Proceedings - Circuits, Devices and Systems 143, no. 6 (1996): 399. http://dx.doi.org/10.1049/ip-cds:19960903.

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22

Hatzopoulos, A. A., S. Siskos, and Th Laopoulos. "Current conveyor based test structures for mixed-signal circuits." IEE Proceedings - Circuits, Devices and Systems 144, no. 4 (1997): 213. http://dx.doi.org/10.1049/ip-cds:19971212.

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23

Kaminska, Bozena, Stephen Sunter, and Salvador Mir. "Analog and mixed signal test techniques for SOC development." Microelectronics Journal 36, no. 12 (2005): 1063. http://dx.doi.org/10.1016/j.mejo.2005.06.002.

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24

Henkel, Jorg. "New Directions in Analog/Mixed-Signal Design and Test." IEEE Design & Test 33, no. 5 (2016): 4. http://dx.doi.org/10.1109/mdat.2016.2597445.

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25

Bello, D. S. S., R. Tangelder, and H. Kerkhoff. "Modeling a verification test system for mixed-signal circuits." IEEE Design & Test of Computers 18, no. 1 (2001): 63–71. http://dx.doi.org/10.1109/54.902823.

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26

Hannu, Jari, Juha Häkkinen, Juha-Veikko Voutilainen, Heli Jantunen, and Markku Moilanen. "Current State of the Mixed-Signal Test Bus 1149.4." Journal of Electronic Testing 28, no. 6 (2012): 857–63. http://dx.doi.org/10.1007/s10836-012-5339-7.

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27

Hurst, S. L. "Analog signal generation for built-in self-test of mixed-signal integrated circuits." Microelectronics Journal 27, no. 1 (1996): 103–4. http://dx.doi.org/10.1016/s0026-2692(96)90016-6.

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28

KumarOjha, Mradul, and Shyam Akashe. "Analog and Mixed Signal Test Method based on OBIST Technique." International Journal of Computer Applications 109, no. 5 (2015): 33–37. http://dx.doi.org/10.5120/19187-0684.

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29

Kim, Byoungho. "Efficient Signature-Driven Self-Test for Differential Mixed-Signal Circuits." JSTS:Journal of Semiconductor Technology and Science 16, no. 5 (2016): 713–18. http://dx.doi.org/10.5573/jsts.2016.16.5.713.

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30

Loukusa, Veikko. "Behavioral test generation modeling approach for mixed-signal IC verification." Microelectronics Journal 34, no. 10 (2003): 907–12. http://dx.doi.org/10.1016/s0026-2692(03)00164-2.

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31

Sunter, S. K. "Cost/benefit analysis of the P1149.4 mixed-signal test bus." IEE Proceedings - Circuits, Devices and Systems 143, no. 6 (1996): 393. http://dx.doi.org/10.1049/ip-cds:19960899.

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32

Sun, Y. "Editorial: Analogue and mixed-signal test for systems on chip." IEE Proceedings - Circuits, Devices and Systems 151, no. 4 (2004): 335. http://dx.doi.org/10.1049/ip-cds:20040924.

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33

Byoungho Kim and J. A. Abraham. "Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications." IEEE Transactions on Instrumentation and Measurement 60, no. 6 (2011): 2014–24. http://dx.doi.org/10.1109/tim.2011.2113128.

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34

Hsu, H. "Introduction to mixed-signal ic test and measurement [Book Reviews]." IEEE Circuits and Devices Magazine 17, no. 4 (2001): 35. http://dx.doi.org/10.1109/mcd.2001.950062.

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35

Barragan, Manuel J., Haralampos-G. Stratigopoulos, Salvador Mir, Herve Le-Gall, Neha Bhargava, and Ankur Bal. "Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques." IEEE Design & Test 33, no. 6 (2016): 46–54. http://dx.doi.org/10.1109/mdat.2016.2590985.

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36

Hu, John, Mark Haffner, Samantha Yoder, Mark Scott, Gursharan Reehal, and Mohammed Ismail. "Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education." IEEE Transactions on Education 53, no. 4 (2010): 662–71. http://dx.doi.org/10.1109/te.2010.2040738.

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37

Yagi, Takuya, Haruo Kobayashi, Yohei Tan, et al. "Production Test Considerations for Mixed-signal IC with Background Calibration." IEEJ Transactions on Electrical and Electronic Engineering 5, no. 6 (2010): 627–31. http://dx.doi.org/10.1002/tee.20584.

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38

Loukusa, V. "Embedded System Level Self-Test for Mixed-Signal IO Verification." Journal of Electronic Testing 22, no. 4-6 (2006): 463–70. http://dx.doi.org/10.1007/s10836-006-9458-x.

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39

Raczkowycz, J., P. Mather, and S. Saine. "Using a sigma–delta modulator as a test vehicle for embedded mixed-signal test." Microelectronics Journal 31, no. 8 (2000): 689–99. http://dx.doi.org/10.1016/s0026-2692(00)00049-5.

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40

Guo, Li Jie. "Nonlinear Analysis of Mixed Signal Test Based on Graphic Program Design." Applied Mechanics and Materials 539 (July 2014): 489–92. http://dx.doi.org/10.4028/www.scientific.net/amm.539.489.

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Abstract:

In this paper, based on the parabolic interpolation function of nonlinear Lagrange, we establish the mathematical model of business translation graphical teaching method. In order to verify the availability and reliability of the model and algorithm, we test the performance of graphic business English translation platform. After testing the mixed signal of platform, the current with fault is lower than circuit without fault. The peak voltage of triangular wave is about-6V and 6V. According to the response curves of English translation circuit, different sequencers realize the parallel translation. It improves business English translation speed, and provides the technical reference for the innovation cultivation of business English talents.

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41

Kim, Byoungho, and Jacob A. Abraham. "Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits." IEEE Transactions on Circuits and Systems I: Regular Papers 58, no. 8 (2011): 1773–84. http://dx.doi.org/10.1109/tcsi.2011.2106030.

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42

Sehgal, A., S. Ozev, and K. Chakrabarty. "Test infrastructure design for mixed-signal SOCs with wrapped analog cores." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14, no. 3 (2006): 292–304. http://dx.doi.org/10.1109/tvlsi.2006.871758.

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43

Davidson, Scott. "An Introduction to Mixed-Signal IC Test & Measurement [Book Review]." IEEE Design & Test 30, no. 3 (2013): 94–96. http://dx.doi.org/10.1109/mdat.2013.2271566.

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44

Kim, Byoungho, and Jacob A. Abraham. "Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems." IEEE Transactions on Circuits and Systems II: Express Briefs 59, no. 11 (2012): 785–89. http://dx.doi.org/10.1109/tcsii.2012.2220693.

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45

Akbay, S. S., A. Halder, A. Chatterjee, and D. Keezer. "Low-Cost Test of Embedded RF/Analog/Mixed-Signal Circuits inSOPs." IEEE Transactions on Advanced Packaging 27, no. 2 (2004): 352–63. http://dx.doi.org/10.1109/tadvp.2004.828819.

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46

Arabi, K., and B. Kaminska. "Testing analog and mixed-signal integrated circuits using oscillation-test method." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 16, no. 7 (1997): 745–53. http://dx.doi.org/10.1109/43.644035.

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47

Nagi, N., A. Chatterjee, Heebyung Yoon, and J. A. Abraham. "Signature analysis for analog and mixed-signal circuit test response compaction." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 17, no. 6 (1998): 540–46. http://dx.doi.org/10.1109/43.703834.

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48

Lopresti, Philip V. "Extending Design-for-Test Into the Analog and Mixed-Signal Domains." AT&T Technical Journal 73, no. 2 (1994): 49–55. http://dx.doi.org/10.1002/j.1538-7305.1994.tb00578.x.

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49

Kim, B., H. Shin, J. H. Chun, and J. A. Abraham. "Predicting mixed-signal dynamic performance using optimised signature-based alternate test." IET Computers & Digital Techniques 1, no. 3 (2007): 159. http://dx.doi.org/10.1049/iet-cdt:20060154.

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50

Taillefer, C. S., and G. W. Roberts. "Reducing measurement uncertainty in a DSP-based mixed-signal test environment without increasing test time." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13, no. 7 (2005): 852–60. http://dx.doi.org/10.1109/tvlsi.2005.850113.

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