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Journal articles on the topic 'Nanoscale contact'

Author: Grafiati

Published: 4 June 2021

Last updated: 7 February 2022

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1

Liu, X. M., X. You, and Zhuo Zhuang. "Contact and Friction at Nanoscale." Advanced Materials Research 33-37 (March 2008): 999–1004. http://dx.doi.org/10.4028/www.scientific.net/amr.33-37.999.

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Molecular Dynamics (MD) simulations of indentation and scratch over crystal nickel (100) were carried out to investigate the microstructure evolution at nanoscale. The dislocation nucleation and propagation during process were observed preferably between close-packed planes. Dislocation loops are formed under both indentation and scratch process, and indentation and friction energy were transferred to the substrate in the form of phonon of disordered atoms, then part of the energy dissipated and rest is remain in the form of permanent plastic deformation.

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2

Yang, Fut K., Wei Zhang, Yougun Han, Serge Yoffe, Yungchi Cho, and Boxin Zhao. "“Contact” of Nanoscale Stiff Films." Langmuir 28, no. 25 (2012): 9562–72. http://dx.doi.org/10.1021/la301388e.

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3

Jonáš, Alexandr, Martin Kochanczyk, Alexandro D. Ramirez, Michael Speidel, and Ernst-Ludwig Florin. "Mechanical Contact Spectroscopy: Characterizing Nanoscale Adhesive Contacts via Thermal Forces." Langmuir 35, no. 17 (2019): 5809–20. http://dx.doi.org/10.1021/acs.langmuir.8b04074.

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4

Sadat, Seid, Aaron Tan, Yi Jie Chua, and Pramod Reddy. "Nanoscale Thermometry Using Point Contact Thermocouples." Nano Letters 10, no. 7 (2010): 2613–17. http://dx.doi.org/10.1021/nl101354e.

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5

Lazenby, Robert A., Kim McKelvey, Massimo Peruffo, Marc Baghdadi, and Patrick R. Unwin. "Nanoscale intermittent contact-scanning electrochemical microscopy." Journal of Solid State Electrochemistry 17, no. 12 (2013): 2979–87. http://dx.doi.org/10.1007/s10008-013-2168-2.

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6

Jakob, A. M., J. Buchwald, B. Rauschenbach, and S. G. Mayr. "Nanoscale-resolved elasticity: contact mechanics for quantitative contact resonance atomic force microscopy." Nanoscale 6, no. 12 (2014): 6898–910. http://dx.doi.org/10.1039/c4nr01034e.

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7

Zhang, Jie, Guillaume Michal, Ahn Kiet Tieu, Hong Tao Zhu, and Guan Yu Deng. "Hertz Contact at the Nanoscale with a 3D Multiscale Model." Applied Mechanics and Materials 846 (July 2016): 306–11. http://dx.doi.org/10.4028/www.scientific.net/amm.846.306.

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This paper presents a three-dimensional multiscale computational model, which is proposed to combine the simplicity of FEM model and the atomistic interactions between two solids. A significant advantage of the model is that atoms are populated in the contact regions, which saves significant computation time compared to fully MD simulations. The model is used in the case of asperity contact. The normal displacement, contact radius and pressure distribution are compared with those from Hertz’s solution and atomistic simulations in the literature. Some important features of nanoscale contacts obtained by MD simulations can be caught by the model with acceptable accuracy and low computational cost.

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8

Santos, Sergio, and Neil H. Thomson. "Energy dissipation in a dynamic nanoscale contact." Applied Physics Letters 98, no. 1 (2011): 013101. http://dx.doi.org/10.1063/1.3532097.

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9

Rivetti, Marco, Thomas Salez, Michael Benzaquen, Elie Raphaël, and Oliver Bäumchen. "Universal contact-line dynamics at the nanoscale." Soft Matter 11, no. 48 (2015): 9247–53. http://dx.doi.org/10.1039/c5sm01907a.

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10

Zhang, Zhenyu, Andrew J. Morse, Steven P. Armes, Andrew L. Lewis, Mark Geoghegan, and Graham J. Leggett. "Nanoscale Contact Mechanics of Biocompatible Polyzwitterionic Brushes." Langmuir 29, no. 34 (2013): 10684–92. http://dx.doi.org/10.1021/la4018689.

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11

Bhattacharya, Manjima, Riya Chakraborty, Arjun Dey, Ashok Kumar Mandal, and Anoop Kumar Mukhopadhyay. "Improvement in nanoscale contact resistance of alumina." Applied Physics A 107, no. 4 (2012): 783–88. http://dx.doi.org/10.1007/s00339-012-6888-4.

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12

Brogly, Maurice, Olivier Noel, Houssein Awada, Gilles Castelein, and Jacques Schultz. "A nanoscale study of the adhesive contact." Comptes Rendus Chimie 9, no. 1 (2006): 99–110. http://dx.doi.org/10.1016/j.crci.2005.08.005.

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13

Dev, Sachin, and Saurabh Lodha. "Process Variation-Induced Contact Resistivity Variability in Nanoscale MS and MIS Contacts." IEEE Transactions on Electron Devices 66, no. 10 (2019): 4320–25. http://dx.doi.org/10.1109/ted.2019.2933008.

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14

Shi, Li, and Arunava Majumdar. "Thermal Transport Mechanisms at Nanoscale Point Contacts." Journal of Heat Transfer 124, no. 2 (2001): 329–37. http://dx.doi.org/10.1115/1.1447939.

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We have experimentally investigated the heat transfer mechanisms at a 90±10 nm diameter point contact between a sample and a probe tip of a scanning thermal microscope (SThM). For large heated regions on the sample, air conduction is the dominant tip-sample heat transfer mechanism. For micro/nano devices with a submicron localized heated region, the air conduction contribution decreases, whereas conduction through the solid-solid contact and a liquid meniscus bridging the tip-sample junction become important, resulting in the sub-100 nm spatial resolution found in the SThM images. Using a one dimensional heat transfer model, we extracted from experimental data a liquid film thermal conductance of 6.7±1.5 nW/K. Solid-solid conduction increased linearly as contact force increased, with a contact conductance of 0.76±0.38W/m2-K-Pa, and saturated for contact forces larger than 38±11 nN. This is most likely due to the elastic-plastic contact between the sample and an asperity at the tip end.

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15

Pajares, Antonia, Marina Chumakov, and Brian R. Lawn. "Strength of silicon containing nanoscale flaws." Journal of Materials Research 19, no. 2 (2004): 657–60. http://dx.doi.org/10.1557/jmr.2004.19.2.657.

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Silicon is a principal material in submicrometer-scale devices. Components in such devices are subject to intense local stress concentrations from nanoscale contacts during function. Questions arise as to the fundamental nature and extent of any strength-degrading damage incurred at such contacts on otherwise pristine surfaces. Here, a simple bilayer test procedure is adapted to probe the strengths of selected areas of silicon surfaces after nanoindentation with a Berkovich diamond. Analogous tests on silicate glass surfaces are used as a control. The strengths increase with diminishing contact penetration in both materials, even below thresholds for visible cracking at the impression corners. However, the strength levels in the subthreshold region are much lower in the silicon, indicating exceptionally high brittleness and vulnerability to small-scale damage in this material. The results have important implications in the design of devices with silicon components.

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16

Tomizawa, Yasushi, Yongfang Li, Akihiro Koga, Hiroshi Toshiyoshi, Yasuhisa Ando, and Hiroyuki Fujita. "Electric Contact Stability and Wear Durability at a Nanoscale Sliding Electric Contact." IEEJ Transactions on Sensors and Micromachines 133, no. 6 (2013): 229–36. http://dx.doi.org/10.1541/ieejsmas.133.229.

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17

Zhu, Bin, Ding Yi, Yuxi Wang, et al. "Self-inhibition effect of metal incorporation in nanoscaled semiconductors." Proceedings of the National Academy of Sciences 118, no. 4 (2021): e2010642118. http://dx.doi.org/10.1073/pnas.2010642118.

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There has been a persistent effort to understand and control the incorporation of metal impurities in semiconductors at nanoscale, as it is important for semiconductor processing from growth, doping to making contact. Previously, the injection of metal atoms into nanoscaled semiconductor, with concentrations orders of magnitude higher than the equilibrium solid solubility, has been reported, which is often deemed to be detrimental. Here our theoretical exploration reveals that this colossal injection is because gold or aluminum atoms tend to substitute Si atoms and thus are not mobile in the lattice of Si. In contrast, the interstitial atoms in the Si lattice such as manganese (Mn) are expected to quickly diffuse out conveniently. Experimentally, we confirm the self-inhibition effect of Mn incorporation in nanoscaled silicon, as no metal atoms can be found in the body of silicon (below 1017 atoms per cm−3) by careful three-dimensional atomic mappings using highly focused ultraviolet-laser-assisted atom-probe tomography. As a result of self-inhibition effect of metal incorporation, the corresponding field-effect devices demonstrate superior transport properties. This finding of self-inhibition effect provides a missing piece for understanding the metal incorporation in semiconductor at nanoscale, which is critical not only for growing nanoscale building blocks, but also for designing and processing metal–semiconductor structures and fine-tuning their properties at nanoscale.

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18

He, Xiaoling. "Adhesion Dynamics in Probing Micro- and Nanoscale Thin Solid Films." Mathematical Problems in Engineering 2008 (2008): 1–18. http://dx.doi.org/10.1155/2008/742569.

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This study focuses on modeling the probe dynamics in scratching and indenting thin solid films at micro- and nanoscales. The model identifies bifurcation conditions that define the stick-slip oscillation patterns of the tip. It is found that the local energy fluctuations as a function of the inelastic deformation, defect formation, material properties, and contact parameters determine the oscillation behavior. The transient variation of the localized function makes the response nonlinear at the adhesion junction. By quantifying the relation between the bifurcation parameters and the oscillation behavior, this model gives a realistic representation of the complex adhesion dynamics. Specifically, the model establishes the link between the stick-slip behavior and the inelastic deformation and the local potentials. This model justifies the experimental observations and the molecular dynamics simulation of the adhesion and friction dynamics in both the micro- and nanoscale contact.

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19

Mencarelli, Davide, Luca Pierantoni, Tullio Rozzi, and Fabio Coccetti. "Nanoscale Simulation of Three-Contact Graphene Ballistic Junctions." Nanomaterials and Nanotechnology 4 (January 2014): 14. http://dx.doi.org/10.5772/58547.

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20

Raftari, Maryam, Zhenyu J. Zhang, Steven R. Carter, Graham J. Leggett, and Mark Geoghegan. "Nanoscale Contact Mechanics between Two Grafted Polyelectrolyte Surfaces." Macromolecules 48, no. 17 (2015): 6272–79. http://dx.doi.org/10.1021/acs.macromol.5b01540.

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21

Byers, Jeff M., and Michael E. Flatté. "Probing Spatial Correlations with Nanoscale Two-Contact Tunneling." Physical Review Letters 74, no. 2 (1995): 306–9. http://dx.doi.org/10.1103/physrevlett.74.306.

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22

Duan Fang-Li, Wang Guang-Jian, and Qiu He-Bing. "Variation of adhesive force in the nanoscale contact." Acta Physica Sinica 61, no. 4 (2012): 046801. http://dx.doi.org/10.7498/aps.61.046801.

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23

Wang, Liang, Eric X. Jin, Sreemanth M. Uppuluri, and Xianfan Xu. "Contact optical nanolithography using nanoscale C-shaped apertures." Optics Express 14, no. 21 (2006): 9902. http://dx.doi.org/10.1364/oe.14.009902.

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24

Jayaweera, N. B., J. R. Downes, M. D. Frogley, et al. "The onset of plasticity in nanoscale contact loading." Proceedings of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences 459, no. 2036 (2003): 2049–68. http://dx.doi.org/10.1098/rspa.2002.1093.

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25

Hua, Wei, Bo Liu, Shengkai Yu, and Weidong Zhou. "Nanoscale roughness contact in a slider–disk interface." Nanotechnology 20, no. 28 (2009): 285710. http://dx.doi.org/10.1088/0957-4484/20/28/285710.

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26

Byers, Jeff M., and Michael E. Flatté. "Probing Spatial Correlations with Nanoscale Two-Contact Tunneling." Physical Review Letters 74, no. 16 (1995): 3305. http://dx.doi.org/10.1103/physrevlett.74.3305.2.

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27

TOMIZAWA, Yasushi, Yasuhisa ANDO, and Hiroyuki FUJITA. "Electric Contact Characteristics at the Nanoscale Probe Tip." TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 78, no. 786 (2012): 615–26. http://dx.doi.org/10.1299/kikaic.78.615.

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28

Hirotani, Jun, Satoshi Kai, Tatsuya Ikuta, and Koji Takahashi. "C133 Experimental Study on Nanoscale Thermal Contact Resistance." Proceedings of the Thermal Engineering Conference 2009 (2009): 79–80. http://dx.doi.org/10.1299/jsmeted.2009.79.

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29

Ou, Z. Y., and S. D. Pang. "Fundamental solutions to Hertzian contact problems at nanoscale." Acta Mechanica 224, no. 1 (2012): 109–21. http://dx.doi.org/10.1007/s00707-012-0731-z.

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30

Bandyopadhyay, P., and A. K. Mukhopadhyay. "Unique observations in nanoscale dynamic contact of glass." Materials Today: Proceedings 46 (2021): 2167–70. http://dx.doi.org/10.1016/j.matpr.2021.02.670.

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31

Eriksson, Jens, Fabrizio Roccaforte, Filippo Giannazzo, et al. "Nano-Electro-Structural Evolution of Ni-Si Ohmic Contacts to 3C-SiC." Materials Science Forum 615-617 (March 2009): 569–72. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.569.

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This paper reports on the macro- and nanoscale electro-structural evolution, as a function of annealing temperature, of nickel-silicide Ohmic contacts to 3C-SiC, grown on 6H-SiC substrates by a Vapor-Liquid-Solid (VLS) technique. The structural and electrical characterization of the contacts, carried out by combining different techniques, showed a correlation between the annealing temperature and the electrical characteristics in both the macro- and the nanoscale measurements. Increasing the annealing temperature between 600 and 950 °C caused a gradual increase of the uniformity of the nanoscale current-distribution, with an accompanying reduction of the specific contact resistance from 5 x 10-5 to 8.4 x 10-6 Ωcm2. After high temperature annealing (950 °C) the structural composition of the contacts stabilized, as only the Ni2Si phase was detected. A comparison with previous literature findings suggests a superior crystalline quality of the single domain VLS 3C-SiC layers.

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32

Giannazzo, Filippo, Stefan Hertel, Andreas Albert, et al. "Electrical Properties of Hydrogen Intercalated Epitaxial Graphene/SiC Interface Investigated by Nanoscale Current Mapping." Materials Science Forum 821-823 (June 2015): 929–32. http://dx.doi.org/10.4028/www.scientific.net/msf.821-823.929.

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The electrical properties of the interface between quasi free standing bilayer graphene (QFBLG) and SiC(0001) have been investigated by nanoscale resolution current measurements using conductive atomic force microscopy (CAFM). I-V analyses were carried out on Au-capped QFBLG contacts with different sizes (from 200 down to 0.5 μm) fabricated on SiC samples with different miscut angles (from on-axis to 3.5° off-axis). The extracted QFBLG/SiC Schottky barrier height (SBH) was found to depend on the contact size. SBH values ∼0.9-1 eV were obtained for large contacts, whereas a gradual increase was observed below a critical (micrometer scale) contact size (depending on the SiC miscut angle) up to values approaching ∼1.5 eV. Nanoscale resolution current mapping on bare QFLBG contacts revealed that SiC step edges and facets represent preferential current paths causing the effective SBH lowering for larger contacts. The reduced barrier height in these regions can be explained in terms of a reduced doping of QFBLG from SiC substrate at (11-20) step edges with respect to the p-type doping on the (0001) terraces.

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33

Zhang, Jie, Liang Zhang, Ahn Kiet Tieu, Guillaume Michal, Hong Tao Zhu, and Guan Yu Deng. "Finite-Temperature Multiscale Simulations for 3D Nanoscale Contacts." Applied Mechanics and Materials 846 (July 2016): 288–93. http://dx.doi.org/10.4028/www.scientific.net/amm.846.288.

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A finite-temperature analysis of a multiscale model, which couples finite element and molecular dynamics, is presented in this paper. The model is evaluated by the patch test and demonstrates its capacity. Then, the multiscale scheme is used to study 3D nanoscale contacts. The linear relationship between the contact area ratio and load is observed at small loads, but the temperature effect is small. However, the change in the root mean square (RMS) of heights depends on the temperature at high loads.

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34

Rong, Wei Bin, Dong Jie Li, Li Ning Sun, and Jin Yu Wang. "Force Analysis and Modeling of Carbon Nanowires Operation in SEM." Advanced Materials Research 183-185 (January 2011): 1901–6. http://dx.doi.org/10.4028/www.scientific.net/amr.183-185.1901.

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Due to influence of size effect, the force properties in nanoscale are greatly different from those in macroscale and the traditional models of operation are becoming difficult to meet the development of nanoscale manipulation. To provide guiding theory for practical nano-manipulation, the nanoscale forces of contact and non-contact operation of nanowires are analyzed for nano-manipulation in SEM. The Vander Waals models among the probe, nanowire and substrate are modeled according to the force properties in nanoscale, and then the simplified models are simulated with MATLAB. The influence degree of various factors and the relationship of them during the operation are obtained. At last, experimental system is established to verify the correctness of the proposed models.

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35

Takada, Yukihiro, Masakazu Muraguchi, Tetsuo Endoh, Shintaro Nomura, and Kenji Shiraishi. "Investigation of the New Physical Model of Ohmic Contact for Future Nanoscale Contacts." ECS Transactions 28, no. 1 (2019): 73–79. http://dx.doi.org/10.1149/1.3375590.

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36

Kong, Hai-Yan, and Ji-Huan He. "A novel friction law." Thermal Science 16, no. 5 (2012): 1529–33. http://dx.doi.org/10.2298/tsci1205529k.

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Frictional force is a vitally important factor in the application of engineering either in macroscopic contacts or in micro/nanoscale contacts. Understanding of the influencing factors about frictional force is essential for the design of miniaturized devices and the use of minimal friction force. In the paper, dimensional analysis is used to analysis factors relative to frictional force. We show that the frictional force scales with where A is the contact area and N is the normal contact force. An experiment is carried out to verify the new friction law.

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37

Stan, Gheorghe, Sean W. King, and Robert F. Cook. "Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy." Nanotechnology 23, no. 21 (2012): 215703. http://dx.doi.org/10.1088/0957-4484/23/21/215703.

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38

Losada, Martin, Katherine Mackie, Joseph H. Osborne, and Santanu Chaudhuri. "Understanding Nanoscale Wetting Using Dynamic Local Contact Angle Method." Advanced Materials Research 138 (October 2010): 107–16. http://dx.doi.org/10.4028/www.scientific.net/amr.138.107.

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A multiscale quantum/classical-framework for hydrophobicity and UV absorption in heterogeneous coatings is presented. Atomistic water droplet simulations on coated oxide surface are used to define nanoscale contact-angles using a new numerical technique called the dynamic local contact angle (DLCA) method. The DLCA method is well suited to calculate macroscopic contact angles for polymeric and composite coatings. The accuracy of the method is tested for a series of common polymers and composites. In addition, the sensitivity of the contact angles towards functional groups and nanoscale roughness are tested using varying molecular structures. Fluorinated polyhedral oligomericsilsesquioxanes (F-POSS) molecular frameworks are used as a model system. Changes in contact angle and UV absorption spectrum as a function of hydrophobic chain length are calculated to test the feasibility of developing a virtual framework for new coating design connecting atomistic calculations to continuum level material properties.

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39

Lukyanov, Alex V., and Alexei E. Likhtman. "Dynamic Contact Angle at the Nanoscale: A Unified View." ACS Nano 10, no. 6 (2016): 6045–53. http://dx.doi.org/10.1021/acsnano.6b01630.

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40

Ye, Zhijiang, Hyeongjoo Moon, Min Hwan Lee, and Ashlie Martini. "Size and load dependence of nanoscale electric contact resistance." Tribology International 71 (March 2014): 109–13. http://dx.doi.org/10.1016/j.triboint.2013.11.012.

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41

Wang, Lin, Ruoxi Wang, Jing Wang, and Tak-Sing Wong. "Compact nanoscale textures reduce contact time of bouncing droplets." Science Advances 6, no. 29 (2020): eabb2307. http://dx.doi.org/10.1126/sciadv.abb2307.

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Many natural surfaces are capable of rapidly shedding water droplets—a phenomenon that has been attributed to the presence of low solid fraction textures (Φs ~ 0.01). However, recent observations revealed the presence of unusually high solid fraction nanoscale textures (Φs ~ 0.25 to 0.64) on water-repellent insect surfaces, which cannot be explained by existing wetting theories. Here, we show that the contact time of bouncing droplets on high solid fraction surfaces can be reduced by reducing the texture size to ~100 nm. We demonstrated that the texture size–dependent contact time reduction could be attributed to the dominance of line tension on nanotextures and that compact arrangement of nanotextures is essential to withstand the impact pressure of raindrops. Our findings illustrate a potential survival strategy of insects to rapidly shed impacting raindrops, and suggest a previously unidentified design principle to engineering robust water-repellent materials for applications including miniaturized drones.

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42

Maruya, Hironaga, Yasuko Oe, Hideaki Takashima, Azusa N. Hattori, Hidekazu Tanaka, and Shigeki Takeuchi. "Non-contact detection of nanoscale structures using optical nanofiber." Optics Express 27, no. 2 (2019): 367. http://dx.doi.org/10.1364/oe.27.000367.

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43

Wang, G. F., and X. Q. Feng. "Effects of surface stresses on contact problems at nanoscale." Journal of Applied Physics 101, no. 1 (2007): 013510. http://dx.doi.org/10.1063/1.2405127.

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44

Nasr, Joseph R., Daniel S. Schulman, Amritanand Sebastian, Mark W. Horn, and Saptarshi Das. "Mobility Deception in Nanoscale Transistors: An Untold Contact Story." Advanced Materials 31, no. 2 (2018): 1806020. http://dx.doi.org/10.1002/adma.201806020.

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45

Lin, Shiquan, Liang Xu, Laipan Zhu, Xiangyu Chen, and Zhong Lin Wang. "Electron Transfer in Nanoscale Contact Electrification: Photon Excitation Effect." Advanced Materials 31, no. 27 (2019): 1901418. http://dx.doi.org/10.1002/adma.201901418.

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46

Anciaux, Guillaume, and Jean-Francois Molinari. "Contact mechanics at the nanoscale, a 3D multiscale approach." International Journal for Numerical Methods in Engineering 79, no. 9 (2009): 1041–67. http://dx.doi.org/10.1002/nme.2590.

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47

Stan, Gheorghe, Santiago D. Solares, Bede Pittenger, Natalia Erina, and Chanmin Su. "Nanoscale mechanics by tomographic contact resonance atomic force microscopy." Nanoscale 6, no. 2 (2014): 962–69. http://dx.doi.org/10.1039/c3nr04981g.

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48

Wei, Zhongqing, Chen Wang, and Chunli Bai. "Investigation of Nanoscale Frictional Contact by Friction Force Microscopy." Langmuir 17, no. 13 (2001): 3945–51. http://dx.doi.org/10.1021/la001185q.

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49

Zhou, Yu Sheng, Sihong Wang, Ya Yang, et al. "Manipulating Nanoscale Contact Electrification by an Applied Electric Field." Nano Letters 14, no. 3 (2014): 1567–72. http://dx.doi.org/10.1021/nl404819w.

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50

Hu, Xiaoli, and Ashlie Martini. "Atomistic simulations of contact area and conductance at nanoscale interfaces." Nanoscale 9, no. 43 (2017): 16852–57. http://dx.doi.org/10.1039/c7nr05326f.

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