Academic literature on the topic 'Nanostructured materials Atomic force microscopy'
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Journal articles on the topic "Nanostructured materials Atomic force microscopy"
Meyer, Ernst, Suzanne P. Jarvis, and Nicholas D. Spencer. "Scanning Probe Microscopy in Materials Science." MRS Bulletin 29, no. 7 (2004): 443–48. http://dx.doi.org/10.1557/mrs2004.137.
Full textMangamma, G., Mohan Kant, M. S. R. Rao, S. Dash, A. K. Tyagi, and Baldev Raj. "Atomic Force Acoustic Microscopy of Nanostructured SiC Coatings." Journal of Scanning Probe Microscopy 4, no. 1 (2009): 36–41. http://dx.doi.org/10.1166/jspm.2009.1005.
Full textBabentsov, V., F. Sizov, J. Franc, A. Luchenko, E. Svezhentsova, and Z. Tsybrii. "Atomic-force microscopy and photoluminescence of nanostructured CdTe." Semiconductors 47, no. 9 (2013): 1198–202. http://dx.doi.org/10.1134/s1063782613090030.
Full textSharma, Shubham, Swarna Jaiswal, Brendan Duffy, and Amit Jaiswal. "Nanostructured Materials for Food Applications: Spectroscopy, Microscopy and Physical Properties." Bioengineering 6, no. 1 (2019): 26. http://dx.doi.org/10.3390/bioengineering6010026.
Full textPasseri, D., A. Alippi, A. Bettucci, et al. "Local elastic measurement in nanostructured materials via atomic force acoustic microscopy technique." Acta Crystallographica Section A Foundations of Crystallography 61, a1 (2005): c452—c453. http://dx.doi.org/10.1107/s0108767305080979.
Full textRuffino, Francesco, Filippo Giannazzo, Fabrizio Roccaforte, Vito Raineri, and Maria Grazia Grimaldi. "Clustering of Gold on 6H-SiC and Local Nanoscale Electrical Properties." Solid State Phenomena 131-133 (October 2007): 517–22. http://dx.doi.org/10.4028/www.scientific.net/ssp.131-133.517.
Full textGoryl, M., B. Such, F. Krok, K. Meisel, J. J. Kolodziej, and M. Szymonski. "Atomic force microscopy studies of alkali halide surfaces nanostructured by DIET." Surface Science 593, no. 1-3 (2005): 147–54. http://dx.doi.org/10.1016/j.susc.2005.06.057.
Full textTaurbayev, Y. T., K. A. Gonchar, A. V. Zoteev, et al. "Electrochemical Nanostructuring of Semiconductors by Capillary-Cell Method." Key Engineering Materials 442 (June 2010): 1–6. http://dx.doi.org/10.4028/www.scientific.net/kem.442.1.
Full textAbramof, P. G., N. G. Ferreira, A. F. Beloto, and A. Y. Ueta. "Investigation of nanostructured porous silicon by Raman spectroscopy and atomic force microscopy." Journal of Non-Crystalline Solids 338-340 (June 2004): 139–42. http://dx.doi.org/10.1016/j.jnoncrysol.2004.02.039.
Full textLee, Hak Joo, Jae Hyun Kim, Ki Ho Cho, et al. "Adhesion Test of Nanostructured Materials by a Novel AFM Probe." Key Engineering Materials 353-358 (September 2007): 2253–56. http://dx.doi.org/10.4028/www.scientific.net/kem.353-358.2253.
Full textDissertations / Theses on the topic "Nanostructured materials Atomic force microscopy"
Wang, Debin. "Thermochemical nanolithography fabrication and atomic force microscopy characterization of functional nanostructures." Diss., Georgia Institute of Technology, 2010. http://hdl.handle.net/1853/34776.
Full textLi, Tai-De. "Atomic force microscopy study of nano-confined liquids." Diss., Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/24674.
Full textMartinez-Morales, Alfredo Adolfo. "Synthesis, characterization and applications of novel nanomaterial systems and semiconducting nanowires." Diss., [Riverside, Calif.] : University of California, Riverside, 2010. http://proquest.umi.com/pqdweb?index=0&did=2019838541&SrchMode=2&sid=2&Fmt=2&VInst=PROD&VType=PQD&RQT=309&VName=PQD&TS=1273864032&clientId=48051.
Full textHolroyd, Dale. "Atomic force microscopy : a novel tool for the analysis of the mechanism of action of antimicrobial peptides on target membranes." Thesis, Stellenbosch : Stellenbosch University, 2003. http://hdl.handle.net/10019.1/53306.
Full textChen, Chuanhui. "Scanning Probe Microscopy Study of Molecular Nanostructures on 2D Materials." Diss., Virginia Tech, 2017. http://hdl.handle.net/10919/79369.
Full textBrown, Treva T. "Fabrication and Characterization of Intricate Nanostructures." ScholarWorks@UNO, 2017. https://scholarworks.uno.edu/td/2399.
Full textTeixeira, Fernanda de Sá. "Anisotropia de resistividade elétrica em filmes finos nanoestruturados." Universidade de São Paulo, 2007. http://www.teses.usp.br/teses/disponiveis/3/3140/tde-27072007-175354/.
Full textPeña, Guédez Luis Alejandro. "Sistemas nanoestructurados y propiedades de transporte en capas delgadas de manganita." Doctoral thesis, Universitat de Barcelona, 2014. http://hdl.handle.net/10803/144552.
Full textBecerril-Garcia, Hector Alejandro. "DNA-Templated Nanomaterials." Diss., CLICK HERE for online access, 2007. http://contentdm.lib.byu.edu/ETD/image/etd1823.pdf.
Full textYang, Yong. "Carbon dioxide assisted polymer micro/nanofabrication." Connect to resource, 2005. http://rave.ohiolink.edu/etdc/view?acc%5Fnum=osu1117591862.
Full textBooks on the topic "Nanostructured materials Atomic force microscopy"
International Conference on Scanning Probe Microscopy in Biomaterials Science (2nd 2000 Bristol, England). SPM Biomaterials 2000: Proceedings of the 2nd International Conference on Scanning Probe Microscopy in Biomaterials Science, Bristol, United Kingdom, 23 June 2000. Edited by Jandt Klaus D and Marchant Roger E. Elsevier, 2001.
Find full textP, Moody Michael, Cairney Julie M, Ringer Simon P, and SpringerLink (Online service), eds. Atom Probe Microscopy. Springer New York, 2012.
Find full textWiesendanger, Roland, Seizo Morita, and Franz J. Giessibl. Noncontact Atomic Force Microscopy: Volume 2. Springer, 2012.
Find full textMeyer, Ernst, Roland Wiesendanger, Seizo Morita, and Franz J. Giessibl. Noncontact Atomic Force Microscopy: Volume 3. Springer, 2015.
Find full textLoomis, Cole Merritt. Two-dimensional photonic bandgap materials in the visible: The study of silicon-based triangular PBG lattice characteristics. 2000.
Find full textLoomis, Cole Merritt. Two-dimensional photonic bandgap materials in the visible: The study of silicon-based triangular PBG lattice characteristics. 2000.
Find full textRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization [Working Title]. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.94185.
Full textMoody, Michael P., Baptiste Gault, Julie M. Cairney, and Simon P. Ringer. Atom Probe Microscopy. Springer, 2014.
Find full textMoody, Michael P., Baptiste Gault, and Julie M. Cairney. Atom Probe Microscopy. Springer, 2012.
Find full textBook chapters on the topic "Nanostructured materials Atomic force microscopy"
Yamaguchi, Hiroyasu, and Akira Harada. "Direct Observation of Supramolecular Structures of Biorelated Materials by Atomic Force Microscopy." In Macromolecular Nanostructured Materials. Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-662-08439-7_16.
Full textMishra, Raghvendrakumar, V. R. Remya, Jayesh Cherusseri, Nandakumar Kalarikkal, and Sabu Thomas. "Nanostructured Epoxy/Block Copolymer Blends: Characterization of Micro-and Nanostructure by Atomic Force Microscopy, Scanning Electron Microscopy, and Transmission Electron Microscopy." In Polymeric and Nanostructured Materials. Apple Academic Press, 2018. http://dx.doi.org/10.1201/b22428-7.
Full textHsu, Jin Ray, Chih Chung Hsiao, Cheng Kuo Sung, and Chaug Liang Hsu. "Thermo-Mechanical Effect on Nanostructure Formation Using Atomic Force Microscopy." In Materials Science Forum. Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-990-3.151.
Full textBarth, Clemens. "Nanostructured Surfaces of Doped Alkali Halides." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_15.
Full textAp. Sanches, Edgar, Osvaldo N. Oliveira, and Fabio lima Leite. "Atomic Force Microscopy Study of Conductive Polymers." In Nanostructured Conductive Polymers. John Wiley & Sons, Ltd, 2010. http://dx.doi.org/10.1002/9780470661338.ch9.
Full textProksch, Roger. "Multi-Frequency Atomic Force Microscopy." In Scanning Probe Microscopy of Functional Materials. Springer New York, 2010. http://dx.doi.org/10.1007/978-1-4419-7167-8_5.
Full textXia, Yijun, and Bo Song. "KPFM and its Use to Characterize the CPD in Different Materials." In Conductive Atomic Force Microscopy. Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.ch14.
Full textHopps, J. H. "Keynote Address: Materials Research Instrumentation Development: A New Paradigm." In Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_1.
Full textGauldie, R. W., G. Raina, S. K. Sharma, and I. F. West. "Imaging Matrix Materials and Fundamental Lamellae Structure of Biogenic Aragonite." In Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer US, 1994. http://dx.doi.org/10.1007/978-1-4757-9322-2_7.
Full textUnertl, W. N., and X. Jin. "Atomic Force Microscopy of Polymer Surfaces." In Mechanical Properties and Deformation Behavior of Materials Having Ultra-Fine Microstructures. Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1765-4_42.
Full textConference papers on the topic "Nanostructured materials Atomic force microscopy"
Haluška, M., and H. Kuzmany. "Atomic force microscopy analysis of nucleation and diffusion of." In ELECTRONIC PROPERTIES OF NOVEL MATERIALS--SCIENCE AND TECHNOLOGY OF MOLECULAR NANOSTRUCTURES. ASCE, 1999. http://dx.doi.org/10.1063/1.59791.
Full textThomson, N. H. "Mechanical properties of individual microtubules measured using atomic force microscopy." In The 14th international winterschool on electronic properties of novel materials - molecular nanostructures. AIP, 2000. http://dx.doi.org/10.1063/1.1342559.
Full textZhao, Xiaopeng, and Harry Dankowicz. "Characterization of Intermittent Contact in Tapping Mode Atomic Force Microscopy." In ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/detc2005-84741.
Full textBarna, Shama F., Kyle E. Jacobs, Glennys A. Mensing, and Placid M. Ferreira. "Direct Writing on Phosphate Glass Using Atomic Force Microscopy for Rapid Fabrication of Nanostructures." In ASME 2016 International Mechanical Engineering Congress and Exposition. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/imece2016-67471.
Full textWatson, Gregory S., and Jolanta A. Blach. "Characterisation of cuticular nanostructures on surfaces of insects by atomic force microscopy: mining evolution for smart structures." In SPIE's International Symposium on Smart Materials, Nano-, and Micro- Smart Systems, edited by Alan R. Wilson. SPIE, 2002. http://dx.doi.org/10.1117/12.469733.
Full textJohannes, Matthew S., Daniel G. Cole, and Robert L. Clark. "Enabling Soft Lithography Using an Atomic Force Microscope." In ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/detc2008-49877.
Full textSaha, Gobinda C., A. Mateen, and Tahir I. Khan. "Tribological Performance Study of HVOF-Sprayed Microstructured and Nanostructured WC-17wt.%Co Coatings." In ASME 2010 International Mechanical Engineering Congress and Exposition. ASMEDC, 2010. http://dx.doi.org/10.1115/imece2010-40086.
Full textStrus, Mark C., Arvind Raman, Luis Zalamea, and R. Byron Pipes. "Nanomechanical Peeling of Carbon Nanotubes and Nanocoils Studied Using the Atomic Force Microscope." In ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2008. http://dx.doi.org/10.1115/detc2008-50020.
Full textKodama, Takashi, Ankur Jain, and Kenneth E. Goodson. "Nonmetallic Conduction Property of a DNA Templated Gold Nanowire." In ASME 2007 InterPACK Conference collocated with the ASME/JSME 2007 Thermal Engineering Heat Transfer Summer Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/ipack2007-33422.
Full textTang, Simon Y., Yang Hsia, and Craig Vierra. "The Nanostructure and Nanomechanics of a Novel Black Widow Spider Silk Assessed Using Atomic Force Microscopy." In ASME 2010 Summer Bioengineering Conference. American Society of Mechanical Engineers, 2010. http://dx.doi.org/10.1115/sbc2010-19338.
Full textReports on the topic "Nanostructured materials Atomic force microscopy"
Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada414116.
Full textHuber, Tito E. Scanning Force Microscopy of Nanostructured Conducting Composites and Polymeric Materials. Defense Technical Information Center, 2001. http://dx.doi.org/10.21236/ada398399.
Full textSolares, Santiago D. Trimodal Tapping Mode Atomic Force Microscopy. Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials. Office of Scientific and Technical Information (OSTI), 2015. http://dx.doi.org/10.2172/1215400.
Full textSolares, Santiago D. Final Technical Report for Award DESC0011912, "Trimodal Tapping Mode Atomic Force Microscopy: Simultaneous 4D Mapping of Conservative and Dissipative Probe-Sample Interactions of Energy-Relevant Materials”. Office of Scientific and Technical Information (OSTI), 2017. http://dx.doi.org/10.2172/1393854.
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