Journal articles: 'Nc-AFM'

1

OHNISHI, Hiroshi. "NC-AFM 2000." Hyomen Kagaku 22, no. 3 (2001): 210. http://dx.doi.org/10.1380/jsssj.22.210.

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Laflör, Linda, Michael Reichling, and Philipp Rahe. "Protruding hydrogen atoms as markers for the molecular orientation of a metallocene." Beilstein Journal of Nanotechnology 11 (September 22, 2020): 1432–38. http://dx.doi.org/10.3762/bjnano.11.127.

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A distinct dumbbell shape is observed as the dominant contrast feature in the experimental data when imaging 1,1’-ferrocene dicarboxylic acid (FDCA) molecules on bulk and thin film CaF2(111) surfaces with non-contact atomic force microscopy (NC-AFM). We use NC-AFM image calculations with the probe particle model to interpret this distinct shape by repulsive interactions between the NC-AFM tip and the top hydrogen atoms of the cyclopentadienyl (Cp) rings. Simulated NC-AFM images show an excellent agreement with experimental constant-height NC-AFM data of FDCA molecules at several tip–sample distances. By measuring this distinct dumbbell shape together with the molecular orientation, a strategy is proposed to determine the conformation of the ferrocene moiety, herein on CaF2(111) surfaces, by using the protruding hydrogen atoms as markers.

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Hosaka, Sumio, Takayuki Takizawa, Daisuke Terauchi, You Yin, and Hayato Sone. "Pico-Newton Controlled Step-in Mode NC-AFM Using a Quadrature Frequency Demodulator and a Slim Probe in Air for CD-AFM." Key Engineering Materials 497 (December 2011): 95–100. http://dx.doi.org/10.4028/www.scientific.net/kem.497.95.

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We have studied a step-in mode non-contact atomic force microscopy (NC-AFM) for precise measurement of fine and steep structure with nanometer resolution in air. When a high aspect structure is measured using step-in mode AFM with the sharpened and slim probe, it is required that AFM control has to be performed at a force of <1 nN in pico-Newton range to suppress the bending and slipping of the probe on slop. Using a home-made step-in mode NC-AFM using a quadrature frequency demodulator for resonant frequency shift of the cantilever, the NC-AFM demonstrated that Si steep structure was faithfully observed at about 2 pN in air.

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Katsube, Daiki, Ryota Shimizu, Yoshiaki Sugimoto, Taro Hitosugi, and Masayuki Abe. "Identification of OH groups on SrTiO₃(100)-( 13×13)-R33.7° reconstructed surface by non-contact atomic force microscopy and scanning tunneling microscopy." Applied Physics Letters 122, no. 7 (February 13, 2023): 071602. http://dx.doi.org/10.1063/5.0139493.

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Atomic resolution imaging of a SrTiO3(100)-([Formula: see text])-R33.7° reconstructed surface using non-contact atomic force microscopy (NC-AFM) and its simultaneous measurement with scanning tunneling microscopy (STM) is presented. Simultaneous STM and NC-AFM imaging reveals three patterns of image contrast depending on the tip apex condition and the relationship between the SrTiO3(100)-([Formula: see text])-R33.7° surface reconstructed structure and the NC-AFM image contrast. The NC-AFM image contrast variation is deduced from the tip apex polarity on the basis of an analysis of two images with opposite contrast. This interpretation is consistent with the results of simultaneous imaging of the SrTiO3(100)-([Formula: see text])-R33.7° surface. Furthermore, the results and interpretation identified an OH group, which is one of the surface defects, and this adsorption site.

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Lübbe, Jannis, Matthias Temmen, Philipp Rahe, and Michael Reichling. "Noise in NC-AFM measurements with significant tip–sample interaction." Beilstein Journal of Nanotechnology 7 (December 1, 2016): 1885–904. http://dx.doi.org/10.3762/bjnano.7.181.

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The frequency shift noise in non-contact atomic force microscopy (NC-AFM) imaging and spectroscopy consists of thermal noise and detection system noise with an additional contribution from amplitude noise if there are significant tip–sample interactions. The total noise power spectral density D Δ f (f m) is, however, not just the sum of these noise contributions. Instead its magnitude and spectral characteristics are determined by the strongly non-linear tip–sample interaction, by the coupling between the amplitude and tip–sample distance control loops of the NC-AFM system as well as by the characteristics of the phase locked loop (PLL) detector used for frequency demodulation. Here, we measure D Δ f (f m) for various NC-AFM parameter settings representing realistic measurement conditions and compare experimental data to simulations based on a model of the NC-AFM system that includes the tip–sample interaction. The good agreement between predicted and measured noise spectra confirms that the model covers the relevant noise contributions and interactions. Results yield a general understanding of noise generation and propagation in the NC-AFM and provide a quantitative prediction of noise for given experimental parameters. We derive strategies for noise-optimised imaging and spectroscopy and outline a full optimisation procedure for the instrumentation and control loops.

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Foster, A. S., A. L. Shluger, and R. M. Nieminen. "Realistic model tips in simulations of nc-AFM." Nanotechnology 15, no. 2 (January 13, 2004): S60—S64. http://dx.doi.org/10.1088/0957-4484/15/2/013.

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LeDue, J. M., M. Lopez-Ayon, S. A. Burke, Y. Miyahara, and P. Grütter. "HighQoptical fiber tips for NC-AFM in liquid." Nanotechnology 20, no. 26 (June 10, 2009): 264018. http://dx.doi.org/10.1088/0957-4484/20/26/264018.

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8

Bennewitz, R., O. Pfeiffer, S. Schär, V. Barwich, E. Meyer, and L. N. Kantorovich. "Atomic corrugation in nc-AFM of alkali halides." Applied Surface Science 188, no. 3-4 (March 2002): 232–37. http://dx.doi.org/10.1016/s0169-4332(01)00910-2.

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9

Hölscher, H., W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. "Simulation of NC-AFM images of xenon(111)." Applied Physics A 72, S1 (March 2001): S35—S38. http://dx.doi.org/10.1007/s003390100724.

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Katsube, Daiki, Hayato Yamashita, Satoshi Abo, and Masayuki Abe. "Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films." Beilstein Journal of Nanotechnology 9 (February 21, 2018): 686–92. http://dx.doi.org/10.3762/bjnano.9.63.

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We have designed and developed a combined system of pulsed laser deposition (PLD) and non-contact atomic force microscopy (NC-AFM) for observations of insulator metal oxide surfaces. With this system, the long-period iterations of sputtering and annealing used in conventional methods for preparing a metal oxide film surface are not required. The performance of the combined system is demonstrated for the preparation and high-resolution NC-AFM imaging of atomically flat thin films of anatase TiO2(001) and LaAlO3(100).

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König, Thomas, Georg H. Simon, Lars Heinke, Leonid Lichtenstein, and Markus Heyde. "Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy." Beilstein Journal of Nanotechnology 2 (January 3, 2011): 1–14. http://dx.doi.org/10.3762/bjnano.2.1.

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Surfaces of thin oxide ﬁlms were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The contact potential was determined by Kelvin probe force microscopy (KPFM) and the electronic structure by scanning tunneling spectroscopy (STS). On magnesium oxide, different color centers, i.e., F0, F+, F2+ and divacancies, have different effects on the contact potential. These differences enabled classiﬁcation and unambiguous differentiation by KPFM. True atomic resolution shows the topography at line defects in aluminum oxide. At these domain boundaries, STS and KPFM verify F2+-like centers, which have been predicted by density functional theory calculations. Thus, by determining the contact potential and the electronic structure with a spatial resolution in the nanometer range, NC-AFM and STM can be successfully applied on thin oxide ﬁlms beyond imaging the topography of the surface atoms.

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12

Iwatsuki, M., K. Suzuki, S. Kitamura, and M. Kersker. "Comparative Surface Study of Atomic Images With Variable Temperature UHF-AFM and STM." Microscopy and Microanalysis 4, S2 (July 1998): 328–29. http://dx.doi.org/10.1017/s1431927600021760.

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The AFM technique has made a remarkable progress recently. However, relatively few studies using the UHV-AFM have been reported compared to those using atmospheric AFMs or UHV-STMs. Atomic-resolution images of the clean sample surface in ultrahigh vacuum, which is relatively active and not observable in atmosphere, have been reported only few examples. The intense reaction between the tip of the cantilever and the sample in contact mode imaging, one of the techniques used in atomic imaging in atmosphere, often damages the surface of the sample, making it difficult to acquire atomic-resolution images in UHV.In order to reduce the strong interaction between the tip and the sample, the noncontact imaging technique for the UHV-AFM (NC-AFM: JAFM-4500XT) has been developed. However, none of the atmospheric NC-AFMs has succeeded in achieving atomic level resolution.

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Hoff, Brice, Claude R. Henry, and Clemens Barth. "Charging C60 islands with the AFM tip." Nanoscale 8, no. 1 (2016): 411–19. http://dx.doi.org/10.1039/c5nr04541j.

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We show that noncontact AFM (nc-AFM) and electrostatic force microscopy (EFM) can be used to transfer electrons on demand from the AFM tip into single bulk-like C₆₀ islands, which are supported on the insulating NaCl(001) surface. Kelvin probe force microscopy (KPFM) helps to characterize the charge in C₆₀ islands and their interaction with the NaCl support.

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Komiyama, Masaharu, Takayuki Uchihashi, Yasuhiro Sugawara, and Seizo Morita. "Molecular orbital interpretation of thymine/graphite nc-AFM images." Surface and Interface Analysis 32, no. 1 (2001): 53–56. http://dx.doi.org/10.1002/sia.1004.

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15

Iwatsuki, Masashi, Kazuyuki Suzuki, Shin-ich Kitamura, and Mike Kersker. "Comparative Surface Studies at Atomic Resolution with Ultrahigh Vacuum Variable-Temperature Atomic Force and Scanning Tunneling Microscopes." Microscopy and Microanalysis 5, no. 3 (May 1999): 208–15. http://dx.doi.org/10.1017/s143192769900015x.

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With the ultrahigh vacuum variable-temperature scanning tunneling microscope (UHV-VT-STM), atomic-level observation has been achieved. An ultrahigh vacuum atomic force microscope (UHV-AFM) has also been developed, with success in obtaining atom images where observation in noncontact (NC) mode with a frequency modulation (FM) detection method was attempted. Using the FM detection method in the constant oscillation amplitude of the cantilever excitation mode, we have obtained atomic-resolution images of Si(111) 7 × 7 structures and Si(100) 2 × 1 structures and other structures together with STM images in an ultrahigh vacuum environment. Also shown here are contact potential difference (CPD) images using the NC-AFM method.

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Lu, Jianchen, Binbin Da, Wei Xiong, Renjun Du, Zhenliang Hao, Zilin Ruan, Yong Zhang, Shijie Sun, Lei Gao, and Jinming Cai. "Identification and electronic characterization of four cyclodehydrogenation products of H2TPP molecules on Au(111)." Physical Chemistry Chemical Physics 23, no. 20 (2021): 11784–88. http://dx.doi.org/10.1039/d1cp01040a.

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17

Xu, Xixiang, Jinyan Zhang, Anhong Hu, Cao Yu, Minghao Qu, Changtao Peng, Xiaoning Ru, et al. "Development of Nanocrystalline Silicon Based Multi-junction Solar Cell Technology for High Volume Manufacturing." MRS Proceedings 1536 (2013): 57–62. http://dx.doi.org/10.1557/opl.2013.738.

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ABSTRACTWe conduct a comparative study mainly on two types of nc-Si based solar cell structures, a-Si/a-SiGe/nc-Si triple-junction and a-Si/nc-Si double-junction. We have attained comparable initial efficiency for the both solar cell structures, 10.8∼11.8% initial total area efficiency (85 - 95W over an area of 0.79 m2). For better compatibility to our installed manufacturing equipment, we deposit a-Si and a-SiGe component cells with the existing deposition machines. Only nc-Si bottom component cells are prepared in separate deposition machines tailored for nc-Si process. Material properties of nc-Si and TCO films are also studied by Raman spectra, SEM, and AFM.

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18

Katsube, Daiki, Shoki Ojima, Eiichi Inami, and Masayuki Abe. "Atomic-resolution imaging of rutile TiO2(110)-(1 × 2) reconstructed surface by non-contact atomic force microscopy." Beilstein Journal of Nanotechnology 11 (March 10, 2020): 443–49. http://dx.doi.org/10.3762/bjnano.11.35.

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The structure of the rutile TiO2(110)-(1 × 2) reconstructed surface is a phase induced by oxygen reduction. There is ongoing debate about the (1 × 2) reconstruction, because it cannot be clarified whether the (1 × 2) structure is formed over a wide area or only locally using macroscopic analysis methods such as diffraction. We used non-contact atomic force microscopy, scanning tunneling microscopy, and low-energy electron diffraction at room temperature to characterize the surface. Ti2O3 rows appeared as bright spots in both NC-AFM and STM images observed in the same area. High-resolution NC-AFM images revealed that the rutile TiO2(110)-(1 × 2) reconstructed surface is composed of two domains with different types of asymmetric rows.

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Zago, Dagaci Muhammad, Suzi Salwah Binti Jika, Nur Azam Bin Badarulzaman, Nurun Najwa Binti Ruslan, Awwal Hussain Nuhu, and Nazia Bano. "Probing Dynamic Mechanical Analysis and Atomic Force Microscopy of Polypropylene/Kaolin Nanocomposite." International Journal of Engineering & Technology 7, no. 4.30 (November 30, 2018): 465. http://dx.doi.org/10.14419/ijet.v7i4.30.22369.

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The Dynamic mechanical analysis (DMA) and Atomic force microscopy (AFM) studies were conducted and evaluated on polypropylene/kaolin (P/K) nanocomposite treated with maleic anhydride (MA) and dicumyl peroxide (DCP) as additives in an in- situ process. Two-roll mill was used in compounding of the nanocomposites while moulding were done by injection moulding machine. Investigation in to the effect of K and MA/DCP on the nanocomposites (NCs) indicates that interfacial interactions between PP and K as filler was eminent. DMA analysis reveals an increase in the storage modulus which was at maximum significantly in P/K NC with 3 wt% and decrease in damping factor tan δ also at P/K NC of 3 wt%. The AFM study indicates that there was uniform and smooth surface roughness among the NCs. Thus, addition of MA/DCP on to P/K NC improves the reinforcing influence on the nanocomposites for better improvement.

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Chen, C. Julian. "A universal relation in NC-AFM, STM, and atom manipulation." Nanotechnology 16, no. 3 (January 12, 2005): S27—S34. http://dx.doi.org/10.1088/0957-4484/16/3/006.

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21

Wagner, Margareta, Martin Setvín, Michael Schmid, and Ulrike Diebold. "Sexiphenyl on Cu(100): nc-AFM tip functionalization and identification." Surface Science 678 (December 2018): 124–27. http://dx.doi.org/10.1016/j.susc.2018.03.004.

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SUZUKI, S., Y. KOIKE, K. FUJIKAWA, N. MATSUDAIRA, M. NAKAMURA, W. CHUN, M. NOMURA, and K. ASAKURA. "An approach to nano-chemical analysis through NC-AFM technique." Catalysis Today 117, no. 1-3 (September 30, 2006): 80–83. http://dx.doi.org/10.1016/j.cattod.2006.05.008.

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23

Pishkenari, Hossein Nejat. "Atomic interactions between metallic tips and surfaces in NC-AFM." Journal of Physics D: Applied Physics 48, no. 12 (February 27, 2015): 125301. http://dx.doi.org/10.1088/0022-3727/48/12/125301.

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24

Sahashi, Masashi, Yoshiyuki Watanabe, Shohei Kawasaki, and Kousaku Miyake. "Direct Measurement for Electric Resistance of Ferromagnetic Metal- Nano-Contact in Oxide Layer." Materials Science Forum 654-656 (June 2010): 1800–1802. http://dx.doi.org/10.4028/www.scientific.net/msf.654-656.1800.

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Nanocontacts Magneto-Resistive (NCMR) Spin-Valve devices using NOL (Nano-Oxide Layer) have been reported to show some kind of a new MR effect. If the NC resistivity nears to the bulk's value without limit, the NC resistance will be almost dominated by the sharvin resistance at the NC with 1 to 2nm size, which conductance regime dominates the NC resistance of our NCMR attract much interest for understanding MR mechanism of our NCMR, where the NC size is certainly just 1 to 2nm but the NC resistivity is still unknown. So, in this study we constructed the home-made circuit for directly measuring each conductive channel-current through each nano-contact with in-situ conducting AFM and tried to evaluate quantitatively the resistivity of each single NC in the NOL.

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Croshaw, Jeremiah, Taleana Huff, Mohammad Rashidi, John Wood, Erika Lloyd, Jason Pitters, and Robert A. Wolkow. "Ionic charge distributions in silicon atomic surface wires." Nanoscale 13, no. 5 (2021): 3237–45. http://dx.doi.org/10.1039/d0nr08295c.

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26

Xie, Ji Jia, Xiao Lei Wu, and You Shi Hong. "Study on Fatigue Crack Nucleation of Electrodeposited Nanocrystalline Nickel." Advanced Materials Research 33-37 (March 2008): 925–30. http://dx.doi.org/10.4028/www.scientific.net/amr.33-37.925.

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The mechanism of fatigue crack nucleation for nanocrystalline (nc) nickel was experimentally investigated in this paper. The samples of electrodeposited nc nickel were loaded cyclically by using a three point bending instrument at first. Then, atomic force microscopy (AFM) was used to scanning the sample surface after fatigue testing. The results indicated that, after fatigue testing, there are vortex-like cells with an average size of 108nm appeared along the crack on nc nickel sample. And, the roughness of sample surface increased with the maximum stress at the surface

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27

Rasmussen, Morten K., Kristoffer Meinander, Flemming Besenbacher, and Jeppe V. Lauritsen. "Noncontact atomic force microscopy study of the spinel MgAl2O4(111) surface." Beilstein Journal of Nanotechnology 3 (March 6, 2012): 192–97. http://dx.doi.org/10.3762/bjnano.3.21.

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Based on high-resolution noncontact atomic force microscopy (NC-AFM) experiments we reveal a detailed structural model of the polar (111) surface of the insulating ternary metal oxide, MgAl2O4 (spinel). NC-AFM images reveal a 6√3×6√3R30° superstructure on the surface consisting of patches with the original oxygen-terminated MgAl2O4(111) surface interrupted by oxygen-deficient areas. These observations are in accordance with previous theoretical studies, which predict that the polarity of the surface can be compensated by removal of a certain fraction of oxygen atoms. However, instead of isolated O vacancies, it is observed that O is removed in a distinct pattern of line vacancies reflected by the underlying lattice structure. Consequently, by the creation of triangular patches in a 6√3×6√3R30° superstructure, the polar-stabilization requirements are met.

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Fangsuwannarak, Thipwan, K. Khunchana, and S. T. Rattanachan. "Optical Band Gaps and Electrical Conductance of Si Nanocrystals in SiO₂ Matrix for Optoelectronic Applications." Key Engineering Materials 545 (March 2013): 134–40. http://dx.doi.org/10.4028/www.scientific.net/kem.545.134.

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In this study, silicon nanocrystal (Si-nc) films were synthesized by compositing of Si-nc powder embedded in silicon oxide phase. The Si-nc film produced by the spin-coating methode using Tetraethylorthosilicate, ethanol, phosphoric acid, and Si-nc powder as suspension precursors. The variation in structural and optical properties of Si-nc sol films with the amounts of Si-nc powder have been characterized. Atomic force microscopy (AFM) shows that low density level of Si-nc power can result in the amount of porosity in the Si-nc films. It is found that when the Si-nc films have the higher Si-nc density, the small pores in the SiO2 phase were removed. In addition, optical energy gap (Eg) of Si-nc samples was evaluated by the Tauc plot method. It is a crucial attribute for a promising photonic device. The obtained optical bang gap values were extended from 1.10 eV to 1.40 eV as compared with the typical Si bulk. In addition, density of Si-nc clusters has a considerable effect on the electrical conductance of the Si-nc films measured at room temperature.

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Khatun, Aisha, Payel Aich, and D. Topwal. "Role of cationic size mismatch and effect of disorder in mixed valent manganites." AIP Advances 13, no. 2 (February 1, 2023): 025125. http://dx.doi.org/10.1063/9.0000526.

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Comparative studies of structure, magnetism, and magnetoresistance (MR) have been carried out in A-site ordered NdBaMn2O6 (O-NB), A-site disordered NdBaMn2O6 (D-NB) and A-site disordered NdCaMn2O6 (D-NC). O-NB, where A-site cations, Nd3+ and Ba2+ (of different ionic sizes) are arranged periodically, undergoes structural transition with temperature, while no structural change is present in D-NB where A-site cations are arranged randomly. However, structural transitions are observed in D-NC where Nd3+ and Ca2+ have similar ionic sizes. Magnetization (M) data shows O-NB has AFM ground state associated with a lower structurally symmetric phase and an FM ground state is observed for D-NB with higher structural symmetry. However, AFM ground state is observed in D-NC similar to that of O-NB. Both the disorder systems exhibit semiconductive transport characteristics over the entire temperature range. The resistivity data of disorder compounds have been fitted with different theoretical models to elucidate the conduction process in these systems. Further, MR studies depict a three times higher value of MR in both disorder compounds compared to that of order one. However, the behavior of MR with H is different for D-NB and D-NC, implying a different origin of this large MR in these compounds. We believe that the different magnetic ground state of D-NB and D-NC is the possible origin of their distinct MR behavior to the magnetic field.

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Lübbe, Jannis, Matthias Temmen, Sebastian Rode, Philipp Rahe, Angelika Kühnle, and Michael Reichling. "Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 4 (January 17, 2013): 32–44. http://dx.doi.org/10.3762/bjnano.4.4.

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The noise of the frequency-shift signal Δf in noncontact atomic force microscopy (NC-AFM) consists of cantilever thermal noise, tip–surface-interaction noise and instrumental noise from the detection and signal processing systems. We investigate how the displacement-noise spectral density d z at the input of the frequency demodulator propagates to the frequency-shift-noise spectral density d Δ f at the demodulator output in dependence of cantilever properties and settings of the signal processing electronics in the limit of a negligible tip–surface interaction and a measurement under ultrahigh-vacuum conditions. For a quantification of the noise figures, we calibrate the cantilever displacement signal and determine the transfer function of the signal-processing electronics. From the transfer function and the measured d z , we predict d Δ f for specific filter settings, a given level of detection-system noise spectral density d z ds and the cantilever-thermal-noise spectral density d z th. We find an excellent agreement between the calculated and measured values for d Δ f . Furthermore, we demonstrate that thermal noise in d Δ f , defining the ultimate limit in NC-AFM signal detection, can be kept low by a proper choice of the cantilever whereby its Q-factor should be given most attention. A system with a low-noise signal detection and a suitable cantilever, operated with appropriate filter and feedback-loop settings allows room temperature NC-AFM measurements at a low thermal-noise limit with a significant bandwidth.

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Cao, Nan, Alexander Riss, Eduardo Corral-Rascon, Alina Meindl, Willi Auwärter, Mathias O. Senge, Maryam Ebrahimi, and Johannes V. Barth. "Surface-confined formation of conjugated porphyrin-based nanostructures on Ag(111)." Nanoscale 13, no. 47 (2021): 19884–89. http://dx.doi.org/10.1039/d1nr06451g.

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On the Ag(111) surface and mediated by temperature, McMurry coupling resulted in the construction of conjugated porphyrin nanostructures linked by CC, which were identified by high resolution STM and nc-AFM images and XPS.

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NEJAT PISHKENARI, HOSSEIN, and ALI MEGHDARI. "TEMPERATURE DEPENDENCE STUDY OF NONCONTACT AFM IMAGES USING MOLECULAR DYNAMICS SIMULATIONS." International Journal of Modern Physics: Conference Series 05 (January 2012): 418–32. http://dx.doi.org/10.1142/s2010194512002309.

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The effect of temperature on the noncontact atomic force microscopy (NC-AFM) surface imaging is investigated with the aid of molecular dynamics (MD) analysis based on the Sutton-Chen (SC) interatomic potential. Particular attention is devoted to the tip and sample flexibility at different temperatures. When a gold coated probe is brought close to the Au (001) surface at high temperatures, the tip and surface atoms are pulled together and their distance becomes smaller. The tip and sample atoms displacement varies in the different environment temperatures and this leads to the different interaction forces. Along this line, to study the effect of temperature on the resulting images, we have employed the well-known NC-AFM model and carried out realistic non-equilibrium MD 3D simulations of atomic scale imaging at different close approach positions to the surface.

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Chatelain, Baptiste, Ali El Barraj, Clémence Badie, Lionel Santinacci, and Clemens Barth. "Collective amplification of nearby nanoparticles in the Coulomb blockade restricted charging of a single nanoparticle." New Journal of Physics 23, no. 12 (December 1, 2021): 123009. http://dx.doi.org/10.1088/1367-2630/ac38cb.

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Abstract The characterization of charges in oxide supported metal nanoparticles (NP) is of high interest in research fields like heterogeneous catalysis and microelectronics. A general desire is to manipulate the charge of an oxide supported single NP and to characterize afterwards the charge and its interference with the insulating support but also with nearby NPs in the vicinity. By using noncontact AFM (nc-AFM) and Kelvin probe force microscopy (KPFM) in ultra-high vacuum and at room temperature we show that a ∼5 nm small AuNP can be directly charged with electrons by the AFM tip and that upon the charging, nearby AuNPs sensitively change their electrostatic potential with a large impact on the charge detection by nc-AFM and KPFM. The AuNPs are supported on a 40 nm thick insulating Al2O3 film, which is grown by atomic layer deposition on Si(001). Due to Coulomb blockades, the NP charging appears in the form of large and discrete peaks in detuning versus bias voltage curves. Finite element method calculations reveal that the large peaks can only be observed when the potentials of nearby insulated NPs get modified by the NP’s electron charge, according to the electrostatic induction principle. In view of the number of transferred electrons, we anticipate that after the charging, the electrons are transferred from the AuNP to the NP-Al2O3 interface or into Al2O3 subsurface regions directly underneath.

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Goretta, Sarah, Christelle Tasciotti, Simon Mathieu, Mario Smet, Wouter Maes, Yoann M. Chabre, Wim Dehaen, et al. "Expeditive Syntheses of Functionalized Pentahelicenes and NC-AFM on Ag(001)." Organic Letters 11, no. 17 (September 3, 2009): 3846–49. http://dx.doi.org/10.1021/ol9014255.

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35

Couturier, G., L. Nony, R. Boisgard, and J. P. Aimé. "Stability analysis of an oscillating tip–cantilever system in NC-AFM." Applied Surface Science 188, no. 3-4 (March 2002): 341–48. http://dx.doi.org/10.1016/s0169-4332(01)00948-5.

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36

Such, B., J. J. Kolodziej, P. Czuba, F. Krok, P. Piatkowski, P. Struski, and M. Szymonski. "STM/nc-AFM investigation of (n×6) reconstructed GaAs(001) surface." Surface Science 530, no. 3 (May 2003): 149–54. http://dx.doi.org/10.1016/s0039-6028(03)00394-7.

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37

Hosoi, H., K. Sueoka, K. Hayakawa, and K. Mukasa. "Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM." Applied Surface Science 157, no. 4 (April 2000): 218–21. http://dx.doi.org/10.1016/s0169-4332(99)00529-2.

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Nakasa, Akihiko, Uichi Akiba, and Masamichi Fujihira. "Self-assembled monolayers containing biphenyl derivatives as challenge for nc-AFM." Applied Surface Science 157, no. 4 (April 2000): 326–31. http://dx.doi.org/10.1016/s0169-4332(99)00567-x.

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Stojanov, Petar, Elena Voloshina, Yuriy Dedkov, Stefan Schmitt, Torben Haenke, and Andreas Thissen. "Graphene on Rh(111): Combined DFT, STM, and NC-AFM Studies." Procedia Engineering 93 (2014): 8–16. http://dx.doi.org/10.1016/j.proeng.2013.11.040.

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Hinaut, A., K. Lekhal, G. Aivazian, S. Bataillé, A. Gourdon, D. Martrou, and S. Gauthier. "NC-AFM Study of the Adsorption of Hexamethoxytriphenylene on KBr(001)." Journal of Physical Chemistry C 115, no. 27 (June 17, 2011): 13338–42. http://dx.doi.org/10.1021/jp202873f.

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SASAKI, Naruo. "NC-AFM 2001 4th International Conference on Noncontact Atomic Force Microscopy." Hyomen Kagaku 23, no. 3 (2002): 194–95. http://dx.doi.org/10.1380/jsssj.23.194.

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KUBO, Toshitaka, Hideo ORITA, and Hisakazu NOZOYE. "NC-AFM and STM Studies on the Rutile TiO2 (011) Surface." Hyomen Kagaku 28, no. 7 (2007): 367–71. http://dx.doi.org/10.1380/jsssj.28.367.

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Guo, Yan Qing, Xiang Wang, Chao Song, Rui Huang, and Jie Song. "Influence of Radio Frequency Power on the Structural Properties of nc-Si Films Fabricated by VHF-PECVD." Key Engineering Materials 531-532 (December 2012): 469–72. http://dx.doi.org/10.4028/www.scientific.net/kem.531-532.469.

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In recent years, hydrogenated nanocrystalline silicon (nc-Si:H) film has received much attention due to its potential application in various optoelectronic devices. In the present work, nanocrystalline silicon (nc-Si) films were fabricated from SiH4 diluted with H2 in very high frequency (40.68 MHz) plasma enhanced chemical vapor deposition system. The influence of radio frequency (rf) power on the structural properties of nanocrystalline silicon films has been studied. Raman spectra show that the crystallinity of the nc-Si films can be increased by promoting the rf power. But over high rf power leads to the structural deterioration of nc-Si:H film. AFM images manifest that, with the increase of deposition time, the grain size becomes larger accompanied by the decrease of the number density.

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Pan, Hai Bin, Yuan Tian, Guang Gui Cheng, and Li Qiang Guo. "Experimental Investigation of the Impact of Annealing on Resistivity of Boron-Doped Hydrogenated Nanocrystalline Silicon Thin Films." Applied Mechanics and Materials 29-32 (August 2010): 1883–87. http://dx.doi.org/10.4028/www.scientific.net/amm.29-32.1883.

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Boron-doped hydrogenated nanocrystalline silicon (nc-Si:H) thin films were deposited by plasma enhanced chemical vapor deposition (PECVD). Microstructures of these films were characterized and analyzed by Raman spectrum and atomic force microscopy (AFM). Thickness and resistivity of these films was measured by high-resolution profilometer and four-point probe respectively. The impact of annealing on boron-doped nc-Si:H thin films’ resistivity and the relationship between resistivity and microstructure were investigated. The results show that annealing and the annealing temperature have great impact on resistivity of nc-Si:H thin films as a result of microstructures changing after annealing. Resistivity of nc-Si:H thin films decreases after annealing, but it rises with the increasing annealing temperature in the range of 250°C to 400°C.

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Sweetman, Adam, Sam Jarvis, Rosanna Danza, and Philip Moriarty. "Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe." Beilstein Journal of Nanotechnology 3 (January 9, 2012): 25–32. http://dx.doi.org/10.3762/bjnano.3.3.

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Background: Noncontact atomic force microscopy (NC-AFM) now regularly produces atomic-resolution images on a wide range of surfaces, and has demonstrated the capability for atomic manipulation solely using chemical forces. Nonetheless, the role of the tip apex in both imaging and manipulation remains poorly understood and is an active area of research both experimentally and theoretically. Recent work employing specially functionalised tips has provided additional impetus to elucidating the role of the tip apex in the observed contrast. Results: We present an analysis of the influence of the tip apex during imaging of the Si(100) substrate in ultra-high vacuum (UHV) at 5 K using a qPlus sensor for noncontact atomic force microscopy (NC-AFM). Data demonstrating stable imaging with a range of tip apexes, each with a characteristic imaging signature, have been acquired. By imaging at close to zero applied bias we eliminate the influence of tunnel current on the force between tip and surface, and also the tunnel-current-induced excitation of silicon dimers, which is a key issue in scanning probe studies of Si(100). Conclusion: A wide range of novel imaging mechanisms are demonstrated on the Si(100) surface, which can only be explained by variations in the precise structural configuration at the apex of the tip. Such images provide a valuable resource for theoreticians working on the development of realistic tip structures for NC-AFM simulations. Force spectroscopy measurements show that the tip termination critically affects both the short-range force and dissipated energy.

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Baykara, Mehmet Z., Omur E. Dagdeviren, Todd C. Schwendemann, Harry Mönig, Eric I. Altman, and Udo D. Schwarz. "Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction." Beilstein Journal of Nanotechnology 3 (September 11, 2012): 637–50. http://dx.doi.org/10.3762/bjnano.3.73.

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Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image interpretation. In this paper, we analyze their impact on the acquired data, compare different methods to record atomic-resolution surface force fields, and determine the approaches that suffer the least from the associated artifacts. The related discussion underscores the idea that since force fields recorded by using NC-AFM always reflect the properties of both the sample and the probe tip, efforts to reduce unwanted effects of the tip on recorded data are indispensable for the extraction of detailed information about the atomic-scale properties of the surface.

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Song, Chao, and Rui Huang. "The Study on Microstructural and Optical Properties of Nanocrystalline Germanium Films." Materials Science Forum 663-665 (November 2010): 324–27. http://dx.doi.org/10.4028/www.scientific.net/msf.663-665.324.

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The germanium film and Ge/Si multilayer structure were fabricated by magnetron sputtering technique on silicon substrate at temperatures of 500°C. Raman scattering spectroscopy measurements reveal that the nanocrystalline Ge occurs in both kinds of samples. Furthermore, from the atomic force microscopy (AFM) results, it is found that the grain size as well as spatially ordering distribution of the nc-Ge can be modulated by the Ge/Si multilayer structure. The room temperature photoluminescence was also observed in the samples. However, compared with that from the nc-Ge film, the intensity of PL from the nc-Ge/a-Si multilayer film becomes weaker, which is attributed to its lower volume fraction of crystallized component.

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Song, Chao, Rui Huang, Xiang Wang, Jie Song, and Yan Qing Guo. "Correlation of Structural and Optical Properties of nc-Ge/a-Si Multilayers Grown by Ion Beam Sputtering." Advanced Materials Research 306-307 (August 2011): 1300–1303. http://dx.doi.org/10.4028/www.scientific.net/amr.306-307.1300.

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The nc-Ge/a-Si multilayer structures were fabricated by ion beam sputtering technique on silicon substrates at temperature of 400 °C. Raman scattering spectroscopy, atomic force microscopy (AFM) and room temperature photoluminescence were used to characterize the structure and optical property of the samples. It was found that the nc-Ge/a-Si multilayer sample can be obtained when the Ge sublayer is 3 nm. The room temperature photoluminescence was observed and the luminescent peak is located at 685 nm. Compared with the a-Ge/a-Si film, the intensity of PL of the nc-Ge/a-Si multilayer film becomes stronger due to the higher volume fraction of crystallized component.

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Kheirodin, Mohsen, Hossein Nejat Pishkenari, Ali Moosavi, and Ali Meghdari. "Study of Biomolecules Imaging Using Molecular Dynamics Simulations." Nano 10, no. 07 (October 2015): 1550096. http://dx.doi.org/10.1142/s1793292015500964.

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The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the biosample in contact and tapping modes may damage the sample structure and produce irreversible deformation, the noncontact mode of AFM (NC-AFM) is employed as the operating mode. The biosample is scanned using a carbon nanotube (CNT) as the AFM probe. CNTs because of their small diameter, high aspect ratio and high mechanical resistance attract many attentions for imaging purposes. The tip–sample interaction is simulated by the MD method. The protein, which has been considered as the biomolecule, is ubiquitin and a graphene sheet is used as the substrate. The effects of CNT's geometric parameters such as the CNT height, the diameter, the tilt angle, the flexibility and the number of layers on the image quality have been evaluated.

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Ktifa, S., M. Ghrib, F. Saadallah, H. Ezzaouia, and N. Yacoubi. "Photothermal Deflection Spectroscopy Study of Nanocrystalline Si (nc-Si) Thin Films Deposited on Porous Aluminum with PECVD." International Journal of Photoenergy 2012 (2012): 1–5. http://dx.doi.org/10.1155/2012/418924.

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We have studied the optical properties of nanocrystalline silicon (nc-Si) film deposited by plasma enhancement chemical vapor deposition (PECVD) on porous aluminum structure using, respectively, the Photothermal Deflection Spectroscopy (PDS) and Photoluminescence (PL). The aim of this work is to investigate the influence of anodisation current on the optical properties of the porous aluminum silicon layers (PASL). The morphology characterization studied by atomic force microscopy (AFM) technique has shown that the grain size of (nc-Si) increases with the anodisation current. However, a band gap shift of the energy gap was observed.

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Journal articles on the topic 'Nc-AFM'

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