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Journal articles on the topic 'Near-field optical microscopy'

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Published: 4 June 2021
Last updated: 7 February 2022

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1

Labardi, M., P. G. Gucciardi, and M. Allegrini. "Near-field optical microscopy." La Rivista del Nuovo Cimento 23, no. 4 (April 2000): 1–35. http://dx.doi.org/10.1007/bf03548884.

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2

Vobornik, Dušan, and Slavenka Vobornik. "Scanning Near-Field Optical Microscopy." Bosnian Journal of Basic Medical Sciences 8, no. 1 (February 20, 2008): 63–71. http://dx.doi.org/10.17305/bjbms.2008.3000.

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An average human eye can see details down to 0,07 mm in size. The ability to see smaller details of the matter is correlated with the development of the science and the comprehension of the nature. Today’s science needs eyes for the nano-world. Examples are easily found in biology and medical sciences. There is a great need to determine shape, size, chemical composition, molecular structure and dynamic properties of nano-structures. To do this, microscopes with high spatial, spectral and temporal resolution are required. Scanning Near-field Optical Microscopy (SNOM) is a new step in the evolution of microscopy. The conventional, lens-based microscopes have their resolution limited by diffraction. SNOM is not subject to this limitation and can offer up to 70 times better resolution.
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3

OKAZAKI, Satoshi, and Toshihiko NAGAMURA. "Near-field Scanning Optical Microscopy." Journal of the Japan Society for Precision Engineering 57, no. 7 (1991): 1155–58. http://dx.doi.org/10.2493/jjspe.57.1155.

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4

Averbukh, I. Sh, B. M. Chernobrod, O. A. Sedletsky, and Y. Prior. "Coherent near field optical microscopy." Optics Communications 174, no. 1-4 (January 2000): 33–41. http://dx.doi.org/10.1016/s0030-4018(99)00696-3.

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5

Buratto, Steven K. "Near-field scanning optical microscopy." Current Opinion in Solid State and Materials Science 1, no. 4 (August 1996): 485–92. http://dx.doi.org/10.1016/s1359-0286(96)80062-3.

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6

Kirstein, Stefan. "Scanning near-field optical microscopy." Current Opinion in Colloid & Interface Science 4, no. 4 (August 1999): 256–64. http://dx.doi.org/10.1016/s1359-0294(99)90005-5.

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7

AOKI, Hiroyuki. "Scanning Near-Field Optical Microscopy." Kobunshi 55, no. 10 (2006): 831–35. http://dx.doi.org/10.1295/kobunshi.55.831.

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8

Dürig, U., D. W. Pohl, and F. Rohner. "Near‐field optical‐scanning microscopy." Journal of Applied Physics 59, no. 10 (May 15, 1986): 3318–27. http://dx.doi.org/10.1063/1.336848.

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9

Dunn, Robert C. "Near-Field Scanning Optical Microscopy." Chemical Reviews 99, no. 10 (October 1999): 2891–928. http://dx.doi.org/10.1021/cr980130e.

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10

Betzig, E., M. Isaacson, A. Lewis, and K. Lin. "Near-Field Scanning Optical Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 184–87. http://dx.doi.org/10.1017/s0424820100125853.

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The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.
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11

Betzig, E., A. Harootunian, M. Isaacson, and A. Lewis. "Near-field scanning optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 642–43. http://dx.doi.org/10.1017/s0424820100144644.

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In general, conventional methods of optical imaging are limited in spatial resolution by either the wavelength of the radiation used or by the aberrations of the optical elements. This is true whether one uses a scanning probe or a fixed beam method. The reason for the wavelength limit of resolution is due to the far field methods of producing or detecting the radiation. If one resorts to restricting our probes to the near field optical region, then the possibility exists of obtaining spatial resolutions more than an order of magnitude smaller than the optical wavelength of the radiation used. In this paper, we will describe the principles underlying such "near field" imaging and present some preliminary results from a near field scanning optical microscope (NS0M) that uses visible radiation and is capable of resolutions comparable to an SEM. The advantage of such a technique is the possibility of completely nondestructive imaging in air at spatial resolutions of about 50nm.
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12

Safarov, Viatcheslav I., Vladimir A. Kosobukin, Claudine Hermann, Georges Lampel, and Jacques Peretti. "Near-field magneto-optical microscopy." Microscopy Microanalysis Microstructures 5, no. 4-6 (1994): 381–88. http://dx.doi.org/10.1051/mmm:0199400504-6038100.

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13

Hamann, H. F., M. Larbadi, S. Barzen, T. Brown, A. Gallagher, and D. J. Nesbitt. "Extinction near-field optical microscopy." Optics Communications 227, no. 1-3 (November 2003): 1–13. http://dx.doi.org/10.1016/j.optcom.2003.08.039.

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14

Stein, Benjamin P. "Optical near-field Raman microscopy." Physics Today 56, no. 5 (May 2003): 9. http://dx.doi.org/10.1063/1.4797041.

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15

Kazantsev, Dmitry V., Evgenii V. Kuznetsov, Sergei V. Timofeev, Artem V. Shelaev, and Elena A. Kazantseva. "Apertureless near-field optical microscopy." Uspekhi Fizicheskih Nauk 187, no. 03 (May 2016): 277–95. http://dx.doi.org/10.3367/ufnr.2016.05.037817.

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16

Kazantsev, D. V., E. V. Kuznetsov, S. V. Timofeev, A. V. Shelaev, and E. A. Kazantseva. "Apertureless near-field optical microscopy." Physics-Uspekhi 60, no. 3 (March 31, 2017): 259–75. http://dx.doi.org/10.3367/ufne.2016.05.037817.

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17

Heinzelmann, H., and D. W. Pohl. "Scanning near-field optical microscopy." Applied Physics A Solids and Surfaces 59, no. 2 (August 1994): 89–101. http://dx.doi.org/10.1007/bf00332200.

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18

Bouhelier, Alexandre. "Field-enhanced scanning near-field optical microscopy." Microscopy Research and Technique 69, no. 7 (2006): 563–79. http://dx.doi.org/10.1002/jemt.20328.

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19

Betzig, E., A. Lewis, A. Harootunian, M. Isaacson, and E. Kratschmer. "Near Field Scanning Optical Microscopy (NSOM)." Biophysical Journal 49, no. 1 (January 1986): 269–79. http://dx.doi.org/10.1016/s0006-3495(86)83640-2.

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20

Mauser, Nina, and Achim Hartschuh. "Tip-enhanced near-field optical microscopy." Chem. Soc. Rev. 43, no. 4 (2014): 1248–62. http://dx.doi.org/10.1039/c3cs60258c.

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21

Fleischer, Monika. "Near-field scanning optical microscopy nanoprobes." Nanotechnology Reviews 1, no. 4 (August 1, 2012): 313–38. http://dx.doi.org/10.1515/ntrev-2012-0027.

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AbstractNear-field scanning optical microscopy (NSOM) is a powerful method for the optical imaging of surfaces with a resolution down to the nanometer scale. By focusing an external electromagnetic field to the subwavelength aperture or apex of a sharp tip, the diffraction limit is avoided and a near-field spot with a size on the order of the aperture or tip diameter can be created. This point light source is used for scanning a sample surface and recording the signal emitted from the small surface area that interacts with the near field of the probe. In tip-enhanced Raman spectroscopy, such a tip configuration can be used as well to record a full spectrum at each image point, from which chemically specific spectral images of the surface can be extracted. In either case, the contrast and resolution of the images depend critically on the properties of the NSOM probe used in the experiment. In this review, an overview of eligible tip properties and different approaches for tailoring specifically engineered NSOM probes is given from a fabrication point of view.
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22

Muramatsu, Hiroshi, Norio Chiba, Katsunori Homma, Kunio Nakajima, Tatsuaki Ataka, Satoko Ohta, Akihiro Kusumi, and Masamichi Fujihira. "Near‐field optical microscopy in liquids." Applied Physics Letters 66, no. 24 (June 12, 1995): 3245–47. http://dx.doi.org/10.1063/1.113392.

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23

ITO, Shinzaburo, and Hiroyuki AOKI. "Scanning Near Field Optical Microscopy : SNOM." Journal of The Adhesion Society of Japan 41, no. 5 (2005): 170–76. http://dx.doi.org/10.11618/adhesion.41.170.

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24

Ozcan, Aydogan, Ertugrul Cubukcu, Alberto Bilenca, Kenneth B. Crozier, Brett E. Bouma, Federico Capasso, and Guillermo J. Tearney. "Differential Near-Field Scanning Optical Microscopy." Nano Letters 6, no. 11 (November 2006): 2609–16. http://dx.doi.org/10.1021/nl062110v.

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25

Isaacson, M. "Resolution in near-field optical microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 454–55. http://dx.doi.org/10.1017/s042482010008657x.

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It has only been within the last half decade that the concept of super resolution microscopy in the near-field has been vigorously pursued and experimentally demonstrated. However, the idea of optical resolution unhindered by far field diffraction limitations was conceived more than a half century ago by Synge and further elaborated by O'Keefe in the fifties. That die method was possible, however, was only first demonstrated using 3cm wavelength microwaves almost 20 years later.The basic principles of the method of near field scanning optical microscopy (NSOM) have been described before in the literature. Briefly, the idea is as follows: if an optical probe (source or detector) of diameter D is positioned within a distance of approximately D/π from the surface of an object, and the reflected, transmitted or emitted light is detected, then the lateral spatial region from which the information occurs is limited to aregion of approximate size D and not by the wavelength of the illuminated or detected light.
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26

Lapshin, D. A., S. K. Sekatskii, V. S. Letokhov, and V. N. Reshetov. "Contact scanning near-field optical microscopy." Journal of Experimental and Theoretical Physics Letters 67, no. 4 (February 1998): 263–68. http://dx.doi.org/10.1134/1.567661.

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27

Lewis, Aaron, Klony Lieberman, Nily Kuck Ben-Ami, Galina Fish, Edward Khachatryan, Alina Strinkovski, Shmuel Shalom, Shula Druckmann, Michael Ottolenghi, and Udi Ben-Ami. "Near-Field Optical Microscopy in Jerusalem." Israel Journal of Chemistry 36, no. 1 (1996): 89–96. http://dx.doi.org/10.1002/ijch.199600012.

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28

Hartschuh, Achim. "Tip-Enhanced Near-Field Optical Microscopy." Angewandte Chemie International Edition 47, no. 43 (October 13, 2008): 8178–91. http://dx.doi.org/10.1002/anie.200801605.

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29

Klapetek, Petr, and Jirí Buršík. "Artefacts in Near-Field Optical Microscopy." Journal of Physics: Conference Series 61 (March 1, 2007): 570–75. http://dx.doi.org/10.1088/1742-6596/61/1/115.

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30

Nechay, B. A. "Femtosecond near-field scanning optical microscopy." Journal of Microscopy 194, no. 2-3 (May 1999): 329. http://dx.doi.org/10.1046/j.1365-2818.1999.00528.x.

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31

Keilmann, F. "Scattering-type near-field optical microscopy." Journal of Electron Microscopy 53, no. 2 (April 1, 2004): 187–92. http://dx.doi.org/10.1093/jmicro/53.2.187.

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32

Pohl, D. W., U. Ch Fischer, and U. T. Dürig. "Scanning near-field optical microscopy (SNOM)." Journal of Microscopy 152, no. 3 (December 1988): 853–61. http://dx.doi.org/10.1111/j.1365-2818.1988.tb01458.x.

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33

Isaacson, M. "Near-field scanning optical microscopy II." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 9, no. 6 (November 1991): 3103. http://dx.doi.org/10.1116/1.585320.

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34

Isaacson, M., J. Cline, and H. Barshatzky. "Resolution in near-field optical microscopy." Ultramicroscopy 47, no. 1-3 (November 1992): 15–22. http://dx.doi.org/10.1016/0304-3991(92)90182-j.

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35

Wu, Shi-fa. "Review of near-field optical microscopy." Frontiers of Physics in China 1, no. 3 (September 2006): 263–74. http://dx.doi.org/10.1007/s11467-006-0027-7.

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36

Karrai, K., G. Kolb, G. Abstreiter, and A. Schmeller. "Optical near-field induced current microscopy." Ultramicroscopy 61, no. 1-4 (December 1995): 299–304. http://dx.doi.org/10.1016/0304-3991(95)00126-3.

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37

Cricenti, A. "Scanning near-field optical microscopy (SNOM)." physica status solidi (c) 5, no. 8 (June 2008): 2615–20. http://dx.doi.org/10.1002/pssc.200779106.

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38

Barbara, A., T. López-Ríos, and P. Quémerais. "Near-field optical microscopy with a scanning tunneling microscope." Review of Scientific Instruments 76, no. 2 (February 2005): 023704. http://dx.doi.org/10.1063/1.1849028.

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39

Bouhelier, A., M. R. Beversluis, and L. Novotny. "Applications of field-enhanced near-field optical microscopy." Ultramicroscopy 100, no. 3-4 (August 2004): 413–19. http://dx.doi.org/10.1016/j.ultramic.2003.10.007.

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40

Wei, P. K., J. H. Hsu, W. S. Fann, and K. T. Tsai. "Dual-optical-mode near-field scanning optical microscopy." Applied Optics 35, no. 34 (December 1, 1996): 6727. http://dx.doi.org/10.1364/ao.35.006727.

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41

Betzig, E., M. Isaacson, H. Barshatzky, K. Lin, and A. Lewis. "Progress in near-field scanning optical microscopy (NSOM)." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 436–37. http://dx.doi.org/10.1017/s0424820100104248.

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The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.
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42

Pylkki, Russell J., Patrick J. Moyer, and Paul E. West. "Scanning Near-Field Optical Microscopy and Scanning Thermal Microscopy." Japanese Journal of Applied Physics 33, Part 1, No. 6B (June 30, 1994): 3785–90. http://dx.doi.org/10.1143/jjap.33.3785.

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43

Labouesse, Simon, Samuel C. Johnson, Hans A. Bechtel, Markus B. Raschke, and Rafael Piestun. "Smart Scattering Scanning Near-Field Optical Microscopy." ACS Photonics 7, no. 12 (November 12, 2020): 3346–52. http://dx.doi.org/10.1021/acsphotonics.0c00553.

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44

Shiku, Hitoshi, and Robert C. Dunn. "Peer Reviewed: Near-Field Scanning Optical Microscopy." Analytical Chemistry 71, no. 1 (January 1999): 23A—29A. http://dx.doi.org/10.1021/ac9900984.

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45

Jenei, Attila, Achim K. Kirsch, Vinod Subramaniam, Donna J. Arndt-Jovin, and Thomas M. Jovin. "Picosecond Multiphoton Scanning Near-Field Optical Microscopy." Biophysical Journal 76, no. 2 (February 1999): 1092–100. http://dx.doi.org/10.1016/s0006-3495(99)77274-7.

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46

Rücker, M., F. C. De Schryver, P. Vanoppen, K. Jeuris, S. De Feyter, J. Hotta, and H. Masuhara. "Near-field scanning optical microscopy and polymers." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 131, no. 1-4 (August 1997): 30–37. http://dx.doi.org/10.1016/s0168-583x(97)00191-2.

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47

Bozhevolnyi, Sergey I., Brian Vohnsen, and Kjeld Pedersen. "Near-field optical microscopy of nonlinear susceptibilities." Optics Communications 150, no. 1-6 (May 1998): 49–55. http://dx.doi.org/10.1016/s0030-4018(98)00014-5.

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48

Coello, Victor, and Sergey I. Bozhevolnyi. "Near-field optical microscopy of fractal structures." Nanotechnology 10, no. 1 (January 1, 1999): 108–12. http://dx.doi.org/10.1088/0957-4484/10/1/021.

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49

Wei, P. K., and W. S. Fann. "Large scanning area near field optical microscopy." Review of Scientific Instruments 69, no. 10 (October 1998): 3614–17. http://dx.doi.org/10.1063/1.1149147.

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50

Nechay, B. A., U. Siegner, M. Achermann, H. Bielefeldt, and U. Keller. "Femtosecond pump-probe near-field optical microscopy." Review of Scientific Instruments 70, no. 6 (June 1999): 2758–64. http://dx.doi.org/10.1063/1.1149841.

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