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Journal articles on the topic 'Neutron Depth Profiling (NDP)'

Author: Grafiati

Published: 3 June 2025

Last updated: 31 July 2025

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1

Lyons, Daniel J., Jamie L. Weaver, and Anne C. Co. "Considerations in applying neutron depth profiling (NDP) to Li-ion battery research." Journal of Materials Chemistry A 10, no. 5 (2022): 2336–51. http://dx.doi.org/10.1039/d1ta09639g.

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2

Weaver, Jamie Lynn. "(Invited) Considerations in Sample Environment and Data Processing for Operando Cell Studies by Neutron Depth Profiling." ECS Meeting Abstracts MA2023-02, no. 55 (2023): 2693. http://dx.doi.org/10.1149/ma2023-02552693mtgabs.

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Neutron depth profiling (NDP) is a nominally non-destructive analytical technique used to measure select isotopes (6Li, 14N, 10B, etc...) in a diversity of materials. NDP can be conducted on operating Li-ion cells and be used to provide researchers real-time information about cell formation, conductance, and resilience. The increased use of NDP for electrochemical studies within the past decade has inspired the development of new sample preparation and data reduction strategies. Select topics that have been studied in the U.S. have included issues of neutron attenuation and scattering due to t

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3

Hossny, K., S. Magdi, F. Nasr, Y. Yasser, and A. Magdy. "NEUTRON DEPTH PROFILE CALCULATIONS USING ARTIFICIAL NEURAL NETWORKS." EPJ Web of Conferences 247 (2021): 06046. http://dx.doi.org/10.1051/epjconf/202124706046.

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Neutron depth profiling (NDP) is a non-destructive technique used for identifying the concentration of impurity isotopes below the sample surface. NDP is carried out by detection of the emitted charged particles resulting from bombarding the sample with neutrons. NDP specifies the isotopic concentration versus the sample depth for a few micrometers below the surface. The sample is bombarded inside a research reactor using a thermal neutron beam. Charged particles like alpha particles or protons are produced from the neutron induced reactions in the sample. Each neutron isotopic interaction pro

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4

Tun, Z., J. J. Noël, Th Bohdanowicz, L. R. Cao, R. G. Downing, and L. V. Goncharova. "Cold-neutron depth profiling as a research tool for the study of surface oxides on metalsSpecial Issue on Neutron Scattering in Canada." Canadian Journal of Physics 88, no. 10 (2010): 751–58. http://dx.doi.org/10.1139/p10-062.

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A recent experiment at NIST has demonstrated that neutron depth profiling (NDP) based on the (n, α) reaction could be developed into a tool that could be routinely used for the study of passive oxides on metals. Whereas most metals are not (n, α) active, oxides grown with 17O, the only (n, α) active oxygen isotope, can be observed and tracked by this technique. Problems due to contamination of the samples by boron were encountered, but were shown to be surmountable. For our samples, the NDP facility at NIST, as it exists today, has enough flux and energy resolution to separate the α particles

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5

Çetiner, S. M., K. Ünlü, and R. G. Downing. "Development and applications of time-of-flight neutron depth profiling (TOF-NDP)." Journal of Radioanalytical and Nuclear Chemistry 276, no. 3 (2008): 623–30. http://dx.doi.org/10.1007/s10967-008-0609-7.

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6

Gilles, Ralph, Lukas Grossmann, Jiri Vacik, Antonino Cannavo, and Giovanni Ceccio. "In-Situ Neutron Depth Profiling Studies (Measurements and Simulations) to Characterize the Surface of Silicon Anodes and Complementary Neutron Techniques for in-Situ and Operando Characterization." ECS Meeting Abstracts MA2024-02, no. 60 (2024): 4058. https://doi.org/10.1149/ma2024-02604058mtgabs.

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In-situ methods for characterizing electrochemical systems are becoming increasingly important to understand the mechanism of lithiation and delithiation processes. The characterization of surfaces that have been under electrochemical influence is of great interest because many electrochemical processes originate here and are therefore crucial for cell performance. Pure silicon anodes with their large volume expansion, which leads to a short service life, can be modified at WACKER company by partial lithiation of microscale silicon particles [1]. Such anode types promise higher specific capaci

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7

Çetiner, Sacit M., and Kenan Ünlü. "Depth profiling of boron in ultra-shallow junction devices using time-of-flight neutron depth profiling (TOF-NDP)." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 579, no. 1 (2007): 148–52. http://dx.doi.org/10.1016/j.nima.2007.04.027.

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8

Frankenberger, Martin, Markus Trunk, Stefan Seidlmayer, et al. "SEI Growth Impacts of Lamination, Formation and Cycling in Lithium Ion Batteries." Batteries 6, no. 2 (2020): 21. http://dx.doi.org/10.3390/batteries6020021.

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The accumulation of solid electrolyte interphases (SEI) in graphite anodes related to elevated formation rates (0.1C, 1C and 2C), cycling rates (1C and 2C), and electrode-separator lamination is investigated. As shown previously, the lamination technique is beneficial for the capacity aging in graphite-LiNi1/3Mn1/3Co1/3O2 cells. Here, surface resistance growth phenomena are quantified using electrochemical impedance spectroscopy (EIS). The graphite anodes were extracted from the graphite NMC cells in their fully discharged state and irreversible accumulations of lithium in the SEI are revealed

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9

Ceccio, Giovanni, Jiri Vacik, Jakub Siegel, et al. "Etching and Doping of Pores in Polyethylene Terephthalate Analyzed by Ion Transmission Spectroscopy and Nuclear Depth Profiling." Membranes 12, no. 11 (2022): 1061. http://dx.doi.org/10.3390/membranes12111061.

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This work is devoted to the study of controlled preparation and filling of pores in polyethylene terephthalate (PET) membranes. A standard wet chemical etching with different protocols (isothermal and isochronous etching for different times and temperatures and etching from one or both sides of the films) was used to prepare the micrometric pores. The pores were filled with either a LiCl solution or boron deposited by magnetron sputtering. Subsequent control of the pore shape and dopant filling was performed using the nuclear methods of ion transmission spectroscopy (ITS) and neutron depth pro

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10

Gilles, Ralph. "(Invited) Neutrons as a Powerful Tool for Better Understanding Electrochemistry on Various Length and Time Scales." ECS Meeting Abstracts MA2023-02, no. 55 (2023): 2691. http://dx.doi.org/10.1149/ma2023-02552691mtgabs.

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Today, sophisticated methods are applied to gain a deeper understanding of processes in in-situ electrochemistry. There are few ways to study electrochemically relevant processes on different length and/or time scales without affecting the processes themselves. Probes that cover a sufficient volume of the sample non-destructively and are sensitive to the important charge carriers are in great demand. For such purposes, neutrons are an ideal candidate to perform this task because they have relatively high sensitivity to the light chemical elements, can distinguish neighboring elements of the pe

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11

Tomandl, I., J. Vacik, T. Kobayashi, et al. "Analysis of Li distribution in ultrathin all-solid-state Li-ion battery (ASSLiB) by neutron depth profiling (NDP)." Radiation Effects and Defects in Solids 175, no. 3-4 (2020): 394–405. http://dx.doi.org/10.1080/10420150.2019.1701471.

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12

Linsenmann, Fabian, Philip Rapp, Markus Trunk, et al. "Spatially and Time-Resolved Investigation of Lithium Plating on a Graphite Electrode during Fast Charging Using Operando Neutron Depth Profiling (NDP)." ECS Meeting Abstracts MA2020-01, no. 2 (2020): 144. http://dx.doi.org/10.1149/ma2020-012144mtgabs.

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13

Linsenmann, Fabian, Philip Rapp, Markus Trunk, et al. "Spatially and Time-Resolved Investigation of Lithium Plating on a Graphite Electrode during Fast Charging Using Operando Neutron Depth Profiling (NDP)." ECS Meeting Abstracts MA2020-02, no. 3 (2020): 595. http://dx.doi.org/10.1149/ma2020-023595mtgabs.

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14

Werner, L., M. Trunk, R. Gernhäuser, R. Gilles, B. Märkisch, and Zs Révay. "The new neutron depth profiling instrument N4DP at the Heinz Maier-Leibnitz Zentrum." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 911 (December 2018): 30–36. http://dx.doi.org/10.1016/j.nima.2018.09.113.

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15

Torrisi, Alfio, Jiří Vacík, Giovanni Ceccio, et al. "Chemiresistors Based on Li-Doped CuO–TiO2 Films." Chemosensors 9, no. 9 (2021): 246. http://dx.doi.org/10.3390/chemosensors9090246.

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Chemiresistors based on thin films of the Li-doped CuO–TiO2 heterojunctions were synthesized by a 2-step method: (i) repeated ion beam sputtering of the building elements (on the Si substrates and multisensor platforms); and (ii) thermal annealing in flowing air. The structure and composition of the films were analyzed by several methods: Rutherford Backscattering (RBS), Neutron Depth Profiling (NDP), Secondary Ion Mass Spectrometry (SIMS), and Atomic Force Microscopy (AFM), and their sensitivity to gaseous analytes was evaluated using a specific lab-made device operating in a continuous gas f

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16

Hebert, Kurt. "Stress-Driven Diffusion of Lithium into Anode Copper Current Collectors during Plating and Stripping." ECS Meeting Abstracts MA2024-02, no. 7 (2024): 810. https://doi.org/10.1149/ma2024-027810mtgabs.

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Stresses in lithium metal anodes determine their stability during inevitable volume changes experienced upon cycling. Lithium deformation during cycling in liquid cells can initiate surface morphological instabilities which lead to capacity loss, e. g. whiskers and moss (1-3). Evidence suggests that whiskers grow by solid-state diffusion to the whisker base (3,4), and that whiskers relieve compressive stress in the metal generated by electrodeposition (5,6). While quantitative characterization of these processes is challenging, diffusion accompanying morphology instabilities can be detected wh

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17

Welsh, J. F., W. D. James, E. A. Schweikert, and H. G. McWhinney. "Studies in neutron depth profiling." Journal of Radioanalytical and Nuclear Chemistry Articles 167, no. 1 (1993): 111–19. http://dx.doi.org/10.1007/bf02035469.

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18

Parikh, Nalin R., Eric C. Frey, Hans C. Hofsäss, et al. "Neutron depth profiling by coincidence spectrometry." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 45, no. 1-4 (1990): 70–74. http://dx.doi.org/10.1016/0168-583x(90)90787-u.

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19

Downing, R. Gregory, and George P. Lamaze. "Neutron depth profiling technique and facilities." Neutron News 4, no. 1 (1993): 15–20. http://dx.doi.org/10.1080/10448639308218930.

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20

Schweikert, E. A., and J. F. Welsh. "New approaches for neutron depth profiling." Journal of Radioanalytical and Nuclear Chemistry Articles 180, no. 2 (1994): 255–62. http://dx.doi.org/10.1007/bf02035913.

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21

Downing, R. G., J. T. Maki, and R. F. Fleming. "Analytical applications of neutron depth profiling." Journal of Radioanalytical and Nuclear Chemistry Articles 112, no. 1 (1987): 33–46. http://dx.doi.org/10.1007/bf02037274.

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22

Chanjuan, Tang, Xiao Caijin, Yao Yonggang, et al. "Neutron depth profiling system at CARR." Applied Radiation and Isotopes 148 (June 2019): 102–7. http://dx.doi.org/10.1016/j.apradiso.2019.02.003.

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23

Maki, John T., Ronald F. Fleming, and Dietrich H. Vincent. "Deconvolution of neutron depth profiling spectra." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 17, no. 2 (1986): 147–55. http://dx.doi.org/10.1016/0168-583x(86)90077-7.

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24

Downing, R. G., and G. P. Lamaze. "Near-surface profiling of semiconductor materials using neutron depth profiling." Semiconductor Science and Technology 10, no. 11 (1995): 1423–31. http://dx.doi.org/10.1088/0268-1242/10/11/001.

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25

Li, Run-dong, Xin Yang, Guan-bo Wang, Hai-feng Dou, Da-zhi Qian, and Shu-yu Wang. "Development of neutron depth profiling at CMRR." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 788 (July 2015): 1–4. http://dx.doi.org/10.1016/j.nima.2015.03.058.

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26

Shi, Cong, Cai-jin Xiao, Yong-gang Yao, et al. "Inverse iteration algorithm for neutron depth profiling." Journal of Radioanalytical and Nuclear Chemistry 317, no. 1 (2018): 81–85. http://dx.doi.org/10.1007/s10967-018-5786-4.

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27

Coakley, K. J., R. G. Downing, G. P. Lamaze, H. C. Hofsäss, J. Biegel, and C. Ronning. "Modeling detector response for neutron depth profiling." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 366, no. 1 (1995): 137–44. http://dx.doi.org/10.1016/0168-9002(95)00519-6.

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28

Lamaze, G. P., H. Chen-Mayer, J. K. Langland, and R. G. Downing. "Neutron Depth Profiling with the New NIST Cold Neutron Source." Surface and Interface Analysis 25, no. 3 (1997): 217–20. http://dx.doi.org/10.1002/(sici)1096-9918(199703)25:3<217::aid-sia226>3.0.co;2-3.

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29

Hossain, T. Z., and P. M. Zeitzoff. "Determination of boron by the neutron depth profile (NDP) technique for VLSI processing application." Journal of Radioanalytical and Nuclear Chemistry Articles 113, no. 2 (1987): 379–82. http://dx.doi.org/10.1007/bf02050510.

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30

Chu, Wei-Kan. "Large angle coincidence spectrometry for neutron depth profiling." Radiation Effects and Defects in Solids 108, no. 1 (1989): 125–26. http://dx.doi.org/10.1080/10420158908217875.

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31

Vacı́k, J., J. Červená, V. Hnatowicz, et al. "Pulse-shape discrimination in neutron depth profiling technique." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 142, no. 3 (1998): 397–401. http://dx.doi.org/10.1016/s0168-583x(98)00271-7.

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32

Felcher, G. P. "Magnetic depth profiling studies by polarized neutron reflection." Physica B: Condensed Matter 192, no. 1-2 (1993): 137–49. http://dx.doi.org/10.1016/0921-4526(93)90115-m.

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33

Trivelpiece, Cory L., John J. Petrunis, Carlo G. Pantano, and R. Gregory Downing. "Glass Surface Layer Density by Neutron Depth Profiling." International Journal of Applied Glass Science 3, no. 2 (2012): 137–43. http://dx.doi.org/10.1111/j.2041-1294.2012.00088.x.

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34

Havránek, V., V. Hnatowicz, J. Kvítek, J. Vacík, J. Hoffmann, and D. Fink. "Neutron depth profiling by large angle coincidence spectrometry." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 73, no. 4 (1993): 523–30. http://dx.doi.org/10.1016/0168-583x(93)95836-t.

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35

Ünlü, Kenan, and Bernard W. Wehring. "Neutron depth profiling at the University of Texas." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 353, no. 1-3 (1994): 402–5. http://dx.doi.org/10.1016/0168-9002(94)91685-3.

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36

Hlinka, Vasil, Ibrahim Oksuz, and R. Gregory Downing. "Neutron depth profiling extended with PIXE element analysis." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 563 (June 2025): 165672. https://doi.org/10.1016/j.nimb.2025.165672.

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37

Dou Haifeng, 窦海峰, 李润东 Li Rundong, 徐家云 Xu Jiayun, 袁姝 Yuan Shu, and 唐凤平 Tang Fengping. "Physical model of neutron depth profiling in common conditions." High Power Laser and Particle Beams 25, no. 5 (2013): 1279–82. http://dx.doi.org/10.3788/hplpb20132505.1279.

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38

Vacík, J., J. Červená, V. Hnatowicz, V. Havránek, and D. Fink. "Neutron depth profiling facility at Nuclear Physics Institute Rez." Acta Physica Hungarica 75, no. 1-4 (1994): 369–72. http://dx.doi.org/10.1007/bf03156605.

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39

Downing, R. G., G. P. Lamaze, J. K. Langland, and S. T. Hwang. "Neutron depth profiling: Overview and description of NIST facilities." Journal of Research of the National Institute of Standards and Technology 98, no. 1 (1993): 109. http://dx.doi.org/10.6028/jres.098.008.

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40

Whitney, S., S. R. Biegalski, Y. H. Huang, and J. B. Goodenough. "Neutron Depth Profiling Applications to Lithium-Ion Cell Research." Journal of The Electrochemical Society 156, no. 11 (2009): A886. http://dx.doi.org/10.1149/1.3216033.

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41

Kolářova, P., J. Vacı́k, J. Špirková-Hradilová, and J. Červená. "Neutron depth profiling study of lithium niobate optical waveguides." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 141, no. 1-4 (1998): 498–500. http://dx.doi.org/10.1016/s0168-583x(98)00160-8.

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42

Park, B. G., G. M. Sun, and H. D. Choi. "Development of cold neutron depth profiling system at HANARO." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 752 (July 2014): 20–26. http://dx.doi.org/10.1016/j.nima.2014.03.003.

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43

Lamaze, G. P., H. H. Chen-Mayer, D. A. Becker, et al. "Cold neutron depth profiling of lithium-ion battery materials." Journal of Power Sources 119-121 (June 2003): 680–85. http://dx.doi.org/10.1016/s0378-7753(03)00232-5.

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44

YONEZAWA, Chushiro. "Depth Profiling of Light Elements using Neutron Induced Reactions." Hyomen Kagaku 33, no. 5 (2012): 264–71. http://dx.doi.org/10.1380/jsssj.33.264.

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45

Lamaze, G. P., R. G. Downing, J. K. Langland, and S. T. Hwang. "The new cold neutron depth profiling instrument at NIST." Journal of Radioanalytical and Nuclear Chemistry Articles 160, no. 2 (1992): 315–25. http://dx.doi.org/10.1007/bf02037107.

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46

Ni, Xiaolong, Yuping He, and Howard Wang. "Expanding the metrology of Coulombic efficiency using neutron depth profiling." Radiation Effects and Defects in Solids 175, no. 3-4 (2020): 356–66. http://dx.doi.org/10.1080/10420150.2019.1701467.

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47

Winholtz, R. A., and A. D. Krawitz. "Methods for Depth Profiling Complete Stress Tensors Using Neutron Diffraction." Advances in X-ray Analysis 37 (1993): 253–64. http://dx.doi.org/10.1154/s0376030800015767.

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Neutron diffraction has proved to be a useful tool for measuring residual and applied stresses in materials. Aspects of experimental design and methods for the mapping of complete triaxial stress tensors in a large component are discussed in the context of a comprehensive set of stress measurements made within the interior of the circumferential weld on a 0.91 m diameter cylinder. The cylinder is a subscale model of the casings for the Advanced Solid Rocket Motor being designed for the space shuttle. The subscale model was fabricated in order to characterize the residual stresses created in th

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48

Kramer, Edward J. "Depth profiling methods that provide information complementary to neutron reflectivity." Physica B: Condensed Matter 173, no. 1-2 (1991): 189–98. http://dx.doi.org/10.1016/0921-4526(91)90048-j.

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49

Singh, Surendra, Saibal Basu, and M. Gupta. "Magnetic depth profiling of Fe/Au multilayer using neutron reflectometry." Pramana 71, no. 5 (2008): 1103–7. http://dx.doi.org/10.1007/s12043-008-0231-9.

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50

Vezhlev, E., A. Ioffe, S. Mattauch, et al. "A new neutron depth profiling spectrometer at the JCNS for a focused neutron beam." Radiation Effects and Defects in Solids 175, no. 3-4 (2020): 342–55. http://dx.doi.org/10.1080/10420150.2019.1701466.

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