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Relevant bibliographies by topics / Noncontact atomic force microscopy

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Academic literature on the topic 'Noncontact atomic force microscopy'

Author: Grafiati

Published: 4 June 2021

Last updated: 13 February 2022

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Journal articles on the topic "Noncontact atomic force microscopy"

1

Schwarz, Udo D. "Noncontact atomic force microscopy." Beilstein Journal of Nanotechnology 3 (February 29, 2012): 172–73. http://dx.doi.org/10.3762/bjnano.3.17.

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SASAHARA, Akira, Hiroshi UETSUKA, Taka-aki ISHIBASHI, and Hiroshi ONISHI. "Noncontact Atomic Force Microscopy. Noncontact Atomic Force Microscope Topography of Adsorbed Organic Molecules." Hyomen Kagaku 23, no. 3 (2002): 186–93. http://dx.doi.org/10.1380/jsssj.23.186.

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Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy II." Beilstein Journal of Nanotechnology 5 (March 12, 2014): 289–90. http://dx.doi.org/10.3762/bjnano.5.31.

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Baykara, Mehmet Z., and Udo D. Schwarz. "Noncontact atomic force microscopy III." Beilstein Journal of Nanotechnology 7 (June 30, 2016): 946–47. http://dx.doi.org/10.3762/bjnano.7.86.

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Müller, F., A.-D. Müller, M. Hietschold, and S. Kämmer. "Detecting electrical forces in noncontact atomic force microscopy." Measurement Science and Technology 9, no. 5 (1998): 734–38. http://dx.doi.org/10.1088/0957-0233/9/5/002.

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Pérez, Rubén, Ricardo García, and Udo Schwarz. "High-resolution noncontact atomic force microscopy." Nanotechnology 20, no. 26 (2009): 260201. http://dx.doi.org/10.1088/0957-4484/20/26/260201.

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Seo, Yongho, Hwansung Choe, and Wonho Jhe. "Atomic-resolution noncontact atomic force microscopy in air." Applied Physics Letters 83, no. 9 (2003): 1860–62. http://dx.doi.org/10.1063/1.1606493.

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Sugawara, Yasuhiro, Hitoshi Ueyama, Takayuki Uchihashi, et al. "True atomic resolution imaging with noncontact atomic force microscopy." Applied Surface Science 113-114 (April 1997): 364–70. http://dx.doi.org/10.1016/s0169-4332(96)00877-x.

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Sasaki, Naruo, and Masaru Tsukada. "Effect of Microscopic Nonconservative Process on Noncontact Atomic Force Microscopy." Japanese Journal of Applied Physics 39, Part 2, No. 12B (2000): L1334—L1337. http://dx.doi.org/10.1143/jjap.39.l1334.

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Zhong, Qigang, Xuechao Li, Haiming Zhang, and Lifeng Chi. "Noncontact atomic force microscopy: Bond imaging and beyond." Surface Science Reports 75, no. 4 (2020): 100509. http://dx.doi.org/10.1016/j.surfrep.2020.100509.

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Dissertations / Theses on the topic "Noncontact atomic force microscopy"

1

Grimble, Ralph Ashley. "Atomic force microscopy : atomic resolution imaging and force-distance spectroscopy." Thesis, University of Oxford, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.312277.

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Jeong, Younkoo. "HIGH SPEED ATOMIC FORCE MICROSCOPY." The Ohio State University, 2009. http://rave.ohiolink.edu/etdc/view?acc_num=osu1236701109.

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Carnally, Stewart Antoni Michael. "Carbon nanotube atomic force microscopy." Thesis, University of Nottingham, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.491631.

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This thesis concerns the manufacture of carbon nanotube atomic force microscope (NTAFM) probes and their employment in the high-resolution imaging of biological macromolecules. Attention was focused initially on synthesis of carbon nanotubes and the refinement of the growth processes to obtain nanotubes of controlled dimensions. These growth processes were subsequently used to grow nanotubes directly onto AFM tips, followed by attempts at controlling the dimensions of these directly-grown nanotubes. Individually fabricated NTAFM probes are also described, along with attempts to optimise the st

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Muys, James Johan. "Cellular Analysis by Atomic Force Microscopy." Thesis, University of Canterbury. Electrical and Computer Engineering, 2006. http://hdl.handle.net/10092/1158.

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Exocytosis is a fundamental cellular process where membrane-bound secretory granules from within the cell fuse with the plasma membrane to form fusion pore openings through which they expel their contents. This mechanism occurs constitutively in all eukaryotic cells and is responsible for the regulation of numerous bodily functions. Despite intensive study on exocytosis the fusion pore is poorly understood. In this research micro-fabrication techniques were integrated with biology to facilitate the study of fusion pores from cells in the anterior pituitary using the atomic force microsc

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Konopinski, D. I. "Forensic applications of atomic force microscopy." Thesis, University College London (University of London), 2013. http://discovery.ucl.ac.uk/1402411/.

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The first project undertaken was to develop a currently non-existent forensic technique -- data recovery from damaged SIM cards. SIM cards hold data valuable to a forensic investigator within non-volatile EEPROM/flash memory arrays. This data has been proven to be able to withstand temperatures up to 500°C, surviving such scenarios as house fires or criminal evidence disposal. A successful forensically-sound sample extraction, mounting and backside processing methodology was developed to expose the underside of a microcontroller circuit's floating gate transistor tunnel oxide, allowing probing

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Vithayaveroj, Viriya. "Atomic force microscopy for sorption studies." Diss., Available online, Georgia Institute of Technology, 2004:, 2004. http://etd.gatech.edu/theses/available/etd-09282004-121825/unrestricted/vithayaveroj%5Fviriya%5F200412%5Fphd.pdf.

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Thesis (Ph. D.)--Civil and Environmental Engineering, Georgia Institute of Technology, 2005.<br>Dr. Rina Tannenbaum, Committee Member ; Dr. Michael Sacks, Committee Member ; Dr. Sotira Yiacoumi, Committee Chair ; Dr. Costas Tsouris, Committee Co-Chair ; Dr. Ching-Hua Huang, Committee Member. Vita. Includes bibliographical references.

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Acosta, Mejia Juan Camilo. "Atomic force microscopy based micro/nanomanipulation." Paris 6, 2011. http://www.theses.fr/2011PA066691.

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A l’échelle nanoscopique, un problème scientifique fondamental réside dans la difficulté de manipuler de façon interactive et répétable un nano-objet. Cette difficulté est un frein majeur pour des applications comme les nanotransistors, les nanosystèmes ou les futurs NEMS (Nano Electro Mechanical System). Ces dispositifs émergents sont ainsi ralentis dans leur cadre expérimental. Cette thèse s’inscrit dans la continuité des recherches développées au sein de l’équipe de microrobotique de l'ISIR. Elle se focalise sur l'exploitation de capteurs d'effort pour la manipulation contrôlée à plusieurs

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Sykulska-Lawrence, Hanna Maria. "Atomic force microscopy for Martian investigations." Thesis, Imperial College London, 2008. http://hdl.handle.net/10044/1/4396.

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The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows imaging of individual dust and soil particles at a higher spatial resolution than any other in-situ instrument. A fully functioning test-bed of the flight microscopy setup within an environmental chamber to simulate Mars conditions was assembled at Imperial College, enabling characterization of the mi

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Anderson, Evan V. "Atomic Force Microscopy: Lateral-Force Calibration and Force-Curve Analysis." Digital WPI, 2012. https://digitalcommons.wpi.edu/etd-theses/337.

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This thesis reflects two advances in atomic force microscopy. The first half is a new lateral force calibration procedure, which, in contrast to existing procedures, is independent of sample and cantilever shape, simple, direct, and quick. The second half is a high-throughput method for processing, fitting, and analyzing force curves taken on Pseudomonas aeruginosa bacteria in an effort to inspire better care for statistics and increase measurement precision.

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Cisneros, Armas David Alejandro. "Molecular assemblies observed by atomic force microscopy." Doctoral thesis, Saechsische Landesbibliothek- Staats- und Universitaetsbibliothek Dresden, 2007. http://nbn-resolving.de/urn:nbn:de:swb:14-1182777560689-53566.

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We use time-lapse AFM to visualize collagen fibrils self-assembly. A solution of acid-solubilized collagen was injected into the AFM fluid cell and fibril formation was observed in vitro. Single fibrils continuously grew and fused with each other until the supporting surface was completely covered by a nanoscopically well-defined collagen matrix. Laterally, the fibrils grew in steps of ~4 nm suggesting a two-step mechanism. In a first step, collagen molecules associated together. In the second step, these molecules rearranged into a structure called a microfibril. High-resolution AFM topograph

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Books on the topic "Noncontact atomic force microscopy"

1

Morita, S. Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2002.

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Morita, S., R. Wiesendanger, and E. Meyer, eds. Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2002. http://dx.doi.org/10.1007/978-3-642-56019-4.

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Morita, Seizo, Franz J. Giessibl, Ernst Meyer, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3.

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Morita, Seizo, Franz J. Giessibl, and Roland Wiesendanger, eds. Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6.

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Paul, West, ed. Atomic force microscopy. Oxford University Press, 2010.

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Santos, Nuno C., and Filomena A. Carvalho, eds. Atomic Force Microscopy. Springer New York, 2019. http://dx.doi.org/10.1007/978-1-4939-8894-5.

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Haugstad, Greg. Atomic Force Microscopy. John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118360668.

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Voigtländer, Bert. Atomic Force Microscopy. Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-030-13654-3.

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Braga, Pier Carlo, and Davide Ricci. Atomic Force Microscopy. Humana Press, 2003. http://dx.doi.org/10.1385/1592596479.

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Lanza, Mario, ed. Conductive Atomic Force Microscopy. Wiley-VCH Verlag GmbH & Co. KGaA, 2017. http://dx.doi.org/10.1002/9783527699773.

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Book chapters on the topic "Noncontact atomic force microscopy"

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Morita, S., and Y. Sugawara. "Noncontact Atomic Force Microscopy." In Optical and Electronic Process of Nano-Matters. Springer Netherlands, 2001. http://dx.doi.org/10.1007/978-94-017-2482-1_9.

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Sugawara, Yasuhiro. "Noncontact Atomic Force Microscopy." In Applied Scanning Probe Methods VI. Springer Berlin Heidelberg, 2007. http://dx.doi.org/10.1007/978-3-540-37319-3_8.

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Weymouth, Alfred John, and Franz J. Giessibl. "The Phantom Force." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_5.

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Schwarz, Alexander, Uwe Kaiser, Rene Schmidt, and Roland Wiesendanger. "Magnetic Exchange Force Microscopy." In Noncontact Atomic Force Microscopy. Springer Berlin Heidelberg, 2009. http://dx.doi.org/10.1007/978-3-642-01495-6_13.

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Pawlak, Rémy, Shigeki Kawai, Thilo Glatzel, and Ernst Meyer. "Single Molecule Force Spectroscopy." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_11.

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Baykara, Mehmet Z., and Udo D. Schwarz. "3D Force Field Spectroscopy." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_2.

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Schwarz, Alexander, and Stefan Heinze. "Magnetic Exchange Force Spectroscopy." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_7.

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Morita, Seizo. "Introduction." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_1.

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Schulz, Fabian, Sampsa Hämäläinen, and Peter Liljeroth. "Atomic-Scale Contrast Formation in AFM Images on Molecular Systems." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_10.

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Gross, Leo, Bruno Schuler, Fabian Mohn, Nikolaj Moll, Jascha Repp, and Gerhard Meyer. "Atomic Resolution on Molecules with Functionalized Tips." In Noncontact Atomic Force Microscopy. Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15588-3_12.

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Conference papers on the topic "Noncontact atomic force microscopy"

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Marchman, Herschel M. "Nanometer-scale dimensional metrology with noncontact atomic force microscopy." In SPIE's 1996 International Symposium on Microlithography, edited by Susan K. Jones. SPIE, 1996. http://dx.doi.org/10.1117/12.240110.

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Pishkenari, Hossein Nejat, and Ali Meghdari. "The Atomic-Scale Hysteresis in Non Contact Atomic Force Microscopy." In ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis. ASMEDC, 2010. http://dx.doi.org/10.1115/esda2010-24683.

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In this research, the hysteresis in the tip-sample interaction force in noncontact force microscopy (NC-AFM) is measured with the aid of atomistic dynamics simulations. The observed hystersis in the interaction force and displacement of the system atoms leads to the loss of energy during imaging of the sample surface. Using molecular dynamics simulations it is shown that the mechanism of the energy dissipation occurs due to bistabilities caused by atomic jumps of the surface and tip atoms in the contact region. The conducted simulations demonstrate that when a gold coated nano probe is brought

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Voda, Alina, and Gildas Besancon. "On noncontact Atomic Force Microscopy control for interaction force and surface reconstruction." In 2013 17th International Conference on System Theory, Control and Computing (ICSTCC). IEEE, 2013. http://dx.doi.org/10.1109/icstcc.2013.6689023.

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Gottlieb, O., A. Hoffman, W. Wu, R. Maimon, R. Edrei, and A. Shavit. "The Influence of Nonlinear Air Drag on Microbeam Response for Noncontact Atomic Force Microscopy." In ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2007. http://dx.doi.org/10.1115/detc2007-35225.

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In this paper we formulate and analyze a continuum model for the vibration of a noncontacting atomic force microscope (AFM) microbeam in air that consistently incorporates nonlinear geometric and inertia effects, localized atomic interaction, viscoelastic damping and quadratic drag. We investigate a controlled set of experiments that include both free vibration decay of a large Silicon beam and forced vibration response of an AFM Silicon microbeam mapping a Silicon sample for various initial interaction distances. Nonlinear frequency and damping backbone curves are obtained from free vibration

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Wright, C. Alan, and Santiago D. Solares. "Subatomic Resolution in Noncontact Atomic Force Microscopy: Electron Cloud Interactions or Harmonics Processing Artifacts?" In ASME 2012 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/detc2012-70397.

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In 2004 Hembacher et al. [Science 305, 380–383 (2004)] reported higher harmonics AFM images of a graphite surface acquired using a tungsten tip which revealed subatomic features. These features were interpreted as the signature of electron bonding lobes at the tip apex atom. We recently applied a computational method based on density functional theory to simulate the images of Hembacher et al. and found that features of subatomic size can indeed be observed under ideal conditions. However, a number of important questions remain open, the most significant of which concerns signal processing. He

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Wu, W., S. Pragai, and O. Gottlieb. "Nonlinear Multi-Mode Dynamics of a Microbeam for Noncontact Atomic Force Microscopy in Ultra-High Vacuum." In ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/detc2005-85742.

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We study the nonlinear multi-mode dynamics of a microbeam for noncontact atomic force microscopy in ultra-high vacuum. A boundary-value problem that includes a coupled linear thermo- and viscoelastic field with a localized nonlinear atomic interaction force, augmented by the linearized heat equation, is reduced to a modal dynamical system via Galerkin’s method. An equivalent linear thermoelastic quality factor is obtained and compared with a closed form solution. A numerically obtained escape curve defines valid operating parameters for low damping conditions. Primary, secondary and coupled in

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Jalili, Nader, Mohsen Dadfarnia, and Darren M. Dawson. "Distributed-Parameters Base Modeling and Vibration Analysis of Micro-Cantilevers Used in Atomic Force Microscopy." In ASME 2003 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. ASMEDC, 2003. http://dx.doi.org/10.1115/detc2003/vib-48502.

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The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of intermolecular forces with atomic-resolution characterization that can be employed in a broad spectrum of applications such as electronics, semi-conductors, materials, manufacturing, polymers, biological analysis, and biomaterials. The noncontact AFM offers unique advantages over other contemporary scanning probe techniques such as contact AFM and scanning tunneling microscopy. Current AFM imaging techniques are often based on a lumped-parameters model and ordinary differential equation (ODE) rep

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Mandel’, Arkadiy M., Vadim B. Oshurko, George I. Solomakho, Alexandr A. Shartz, and Kirill G. Solomakho. "Quantum Dissipative Mechanism of Noncontact Friction." In ASME 2016 Conference on Information Storage and Processing Systems. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/isps2016-9533.

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It is well known that two ideally confident surfaces should give the effect of superlubricity, e.g. should slide without friction. In principle, the superlubricity deals with absence of energy dissipation mechanism. If we consider interatomic interactions, we see that the number of atoms, which resist sliding is equal to the number of atoms that push slider. In the case of noncontact quantum friction interacting surfaces are divided by some spatial interval. This sliding can take place in probe (atomic force or scanning tunneling) microscopy. However, experiments usually show nonzero friction

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Connolly, Liam G., and Michael Cullinan. "Design of a Tip Based In-Line Metrology System for Roll-to-Roll Manufactured Flexible Electronic Devices." In ASME 2017 12th International Manufacturing Science and Engineering Conference collocated with the JSME/ASME 2017 6th International Conference on Materials and Processing. American Society of Mechanical Engineers, 2017. http://dx.doi.org/10.1115/msec2017-2972.

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The development of accurate, noncontact surface imaging is key to implementing an effective metrology strategy to manage defect detection in high volume flexible electronic device fabrication. This paper presents the design of a compound, double parallelogram flexure-hinge mechanism (DPFM) based nanopositioning system with stacked coarse-fine adjustment DPFMs. In concert with novel Atomic Force Microscope (AFM)-on-a-chip technology, this coupled, multi-flexure positioning system is proposed as a probe-based metrology device for roll-to-roll (R2R) electronics manufacturing and shown in Fig. 1 [

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Dongdong Zhang and Xiaoping Qian. "Scanning in atomic force microscopy." In 2009 IEEE International Conference on Robotics and Automation (ICRA). IEEE, 2009. http://dx.doi.org/10.1109/robot.2009.5152555.

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Reports on the topic "Noncontact atomic force microscopy"

1

Turner, Joseph A. Materials Characterization by Atomic Force Microscopy. Defense Technical Information Center, 2003. http://dx.doi.org/10.21236/ada414116.

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Snyder, Shelly R., and Henry S. White. Scanning Tunneling Microscopy, Atomic Force Microscopy, and Related Techniques. Defense Technical Information Center, 1992. http://dx.doi.org/10.21236/ada246852.

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Houston, J. E., and J. G. Fleming. Non-contact atomic-level interfacial force microscopy. Office of Scientific and Technical Information (OSTI), 1997. http://dx.doi.org/10.2172/453500.

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Crone, Joshua C., Santiago Solares, and Peter W. Chung. Simulated Frequency and Force Modulation Atomic Force Microscopy on Soft Samples. Defense Technical Information Center, 2007. http://dx.doi.org/10.21236/ada469876.

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Noy, A., J. J. De Yoreo, and A. J. Malkin. Carbon Nanotube Atomic Force Microscopy for Proteomics and Biological Forensics. Office of Scientific and Technical Information (OSTI), 2002. http://dx.doi.org/10.2172/15004647.

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Haydell, Jr, and Michael W. Direct Writing of Graphene-based Nanoelectronics via Atomic Force Microscopy. Defense Technical Information Center, 2012. http://dx.doi.org/10.21236/ada571834.

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Hough, P., and V. Elings. Methods for Study of Biological Structure by Atomic Force Microscopy. Office of Scientific and Technical Information (OSTI), 1998. http://dx.doi.org/10.2172/770449.

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Salapaka, Srinivasa M., and Petros G. Voulgaris. Fast Scanning and Fast Image Reconstruction in Atomic Force Microscopy. Defense Technical Information Center, 2009. http://dx.doi.org/10.21236/ada495364.

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Klabunde, Kenneth J., and Dong Park. Scanning Tunneling Microscopy/Atomic Force Microscopy for Study of Nanoscale Metal Oxide Particles (Destructive Adsorbents). Defense Technical Information Center, 1994. http://dx.doi.org/10.21236/ada281417.

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Hatch, Andrew G., Ralph C. Smith, and Tathagata De. Model Development and Control Design for High Speed Atomic Force Microscopy. Defense Technical Information Center, 2004. http://dx.doi.org/10.21236/ada444057.

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